CN107093599A - The encapsulating structure of multi-chip - Google Patents

The encapsulating structure of multi-chip Download PDF

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Publication number
CN107093599A
CN107093599A CN201710398633.6A CN201710398633A CN107093599A CN 107093599 A CN107093599 A CN 107093599A CN 201710398633 A CN201710398633 A CN 201710398633A CN 107093599 A CN107093599 A CN 107093599A
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CN
China
Prior art keywords
chip
substrate
window
encapsulating structure
gap
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
CN201710398633.6A
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Chinese (zh)
Inventor
金国庆
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Center for Advanced Packaging Co Ltd
Original Assignee
National Center for Advanced Packaging Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by National Center for Advanced Packaging Co Ltd filed Critical National Center for Advanced Packaging Co Ltd
Priority to CN201710398633.6A priority Critical patent/CN107093599A/en
Publication of CN107093599A publication Critical patent/CN107093599A/en
Withdrawn legal-status Critical Current

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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L25/00Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
    • H01L25/03Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
    • H01L25/04Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
    • H01L25/065Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L27/00
    • H01L25/0652Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L27/00 the devices being arranged next and on each other, i.e. mixed assemblies
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321Disposition
    • H01L2224/32135Disposition the layer connector connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
    • H01L2224/32145Disposition the layer connector connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being stacked
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48225Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/4824Connecting between the body and an opposite side of the item with respect to the body
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73201Location after the connecting process on the same surface
    • H01L2224/73215Layer and wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181Encapsulation

Abstract

The invention discloses a kind of encapsulating structure of multi-chip, including:Multiple chips;Substrate, window has been cut through for being provided for multiple chips on placement position, substrate;Multiple chip-stacked both sides in window;The weld pad of each chip is located in the drop shadow spread of window.By the invention it is possible to increase packaging density when carrying out three-dimensional stacked to each chip, improve chip-stacked stability.

Description

The encapsulating structure of multi-chip
Technical field
The present invention relates to semiconductor applications, and in particular to a kind of encapsulating structure of multi-chip.
Background technology
Global terminal electronic product towards under compact, multi-functional, low-power consumption development trend, can constantly be integrated above-mentioned System in package (System in Package, SiP) technology of characteristic is gradually taken seriously.SiP has become important advanced Encapsulation and system integration technology, are the important technology routes of miniaturization of electronic products and multifunction, in microelectronics and electronics system The field of making has wide application market and development prospect.
The three-dimensional stacked major part of traditional chip is that chip is stacked in substrate front side, completes corresponding bonding wire plastic packaging work Skill, the weld pad (bonding wire pad) of chip is unilateral or polygon, it is however generally that, heap is not done in the weld pad region on chip It is folded, to be damaged when avoiding and stacking to bonding wire or short circuit.In the prior art, to it is chip-stacked when, to avoid pad zone Domain is stacked, and the chip area for being usually located at upper strata is less than lower layer chip area, and this can cause, when multilayer chiop is stacked, to be located at There is the situation of I/O interface lazy weight because area is too small in the chip on upper strata, also, because each layer die size differs so that In stacking process, unbalance stress between each layer chip is easily caused, causes the chip stacked unstable;In the prior art, it is Ensure the area of each chip, also each chip is tiled, however, which increase the area of plane of substrate.In addition, To each chip carry out it is three-dimensional stacked when can also produce bonding wire it is long, it is disorderly the problem of.
Therefore, packaging density how is increased, improving chip-stacked stability becomes urgent problem to be solved.
The content of the invention
Therefore, the technical problem to be solved in the present invention is how to increase packaging density, improves chip-stacked stability Energy.
Therefore, according in a first aspect, the embodiments of the invention provide a kind of encapsulating structure of multi-chip, including:Multiple cores Piece;Substrate, window has been cut through for being provided for multiple chips on placement position, substrate;Multiple chip-stacked both sides in window;Respectively The weld pad of individual chip is located in the drop shadow spread of window.
Alternatively, multiple chips are located at the same side of substrate.
Alternatively, the number of multiple chips is even number, and multiple chips are symmetrically distributed in the both sides of window.
Alternatively, the number of multiple chips is 2N+1, wherein, N is positive integer, and the 1st in multiple chips is to 2N Chip is symmetrically distributed in the both sides of window and forms the gap for being less than the window;The 2N+1 chip covers gap.
Alternatively, many root bead lines, each bonding wire is connected to each chip from substrate through window and each same layer chip gap Weld pad, each chip is connected with substrate signal respectively.
Alternatively, plastic packaging material, coats multiple chips and many root bead lines.
Technical solution of the present invention, has the following advantages that:
The encapsulating structure for the multi-chip that the present invention is provided, due to having cut through window on substrate, the weld pad of each chip is located at In the drop shadow spread of window so that the weld pad of each chip can carry out signal by the window and substrate and be connected;Due to multiple The chip-stacked both sides in window, relative in the prior art, list piles up the structure of stacked chips, side provided in an embodiment of the present invention Case adds chip package density, also, due to each chip-stacked both sides in window, uniform force when improving chip package Property, then improve chip-stacked stability.
As optional technical scheme, during due to each chip being connected with substrate signal with many root bead lines respectively, each Bonding wire is connected to the weld pad of each chip from substrate through window and each same layer chip gap, will be multiple using plastic packaging material during encapsulation Chip and many root bead lines are enveloped so that when carrying out three-dimensional stacked to each chip bonding wire be difficult to be weighed wounded, short circuit.
Brief description of the drawings
, below will be to specific in order to illustrate more clearly of the specific embodiment of the invention or technical scheme of the prior art The accompanying drawing used required in embodiment or description of the prior art is briefly described, it should be apparent that, in describing below Accompanying drawing is some embodiments of the present invention, for those of ordinary skill in the art, before creative work is not paid Put, other accompanying drawings can also be obtained according to these accompanying drawings.
Fig. 1 is a kind of encapsulating structure schematic diagram of multi-chip in the embodiment of the present invention;
Fig. 2 is the encapsulating structure schematic diagram of another multi-chip in the embodiment of the present invention.
Embodiment
Technical scheme is clearly and completely described below in conjunction with accompanying drawing, it is clear that described implementation Example is a part of embodiment of the invention, rather than whole embodiments.Based on the embodiment in the present invention, ordinary skill The every other embodiment that personnel are obtained under the premise of creative work is not made, belongs to the scope of protection of the invention.
In the description of the invention, it is necessary to explanation, term " " center ", " on ", " under ", "left", "right", " vertical ", The orientation or position relationship of the instruction such as " level ", " interior ", " outer " be based on orientation shown in the drawings or position relationship, merely to Be easy to the description present invention and simplify description, rather than indicate or imply signified device or element must have specific orientation, With specific azimuth configuration and operation, therefore it is not considered as limiting the invention.In addition, term " first ", " second ", " the 3rd " is only used for describing purpose, and it is not intended that indicating or implying relative importance.
In the description of the invention, it is necessary to illustrate, unless otherwise clearly defined and limited, term " installation ", " phase Even ", " connection " should be interpreted broadly, for example, it may be being fixedly connected or being detachably connected, or be integrally connected;Can To be mechanical connection or electrical connection;Can be joined directly together, can also be indirectly connected to by intermediary, can be with It is the connection of two element internals, can is wireless connection or wired connection.For one of ordinary skill in the art For, the concrete meaning of above-mentioned term in the present invention can be understood with concrete condition.
As long as in addition, technical characteristic involved in invention described below different embodiments non-structure each other It can just be combined with each other into conflict.
In order to increase chip package density, improve chip-stacked stability, the present embodiment provides a kind of multi-chip Encapsulating structure, refer to Fig. 1 and Fig. 2, for the encapsulating structure schematic diagram of the multi-chip, in the present embodiment, the encapsulation of the multi-chip Structure includes:Multiple chips 102 and substrate 101, wherein:
Multiple chips 102 are used to realize various electrical functions, it is however generally that, it is disposed with respective electricity on each chip 102 Line structure.
Substrate 101 is used to provide to place for multiple chips 102 to have cut through window 106 on position, substrate 101;Multiple chips 102 It is stacked in the both sides of window 106;The weld pad 103 of each chip 102 is located in the drop shadow spread of window 106.In specific implementation, Multiple chips 102 are stacked in the same side of substrate 101, specifically, can be symmetrically distributed in the both sides of window 106, each chip 102 weld pad 103 is respectively facing window 106, also, each weld pad 103 should avoid being blocked by other chips, so that, it is Bonding wire is drawn from weld pad 103 to substrate 101 and provides passage.It refer to Fig. 2 in one embodiment, the number of multiple chips 102 Mesh can be even number, and the multiple chips 102 of the even number are symmetrically distributed in the both sides of window, during stacking, can be by position Fitted in the side of a pair of chips 102 of the superiors, so that, cover the gap formed between each layer chip.Fig. 2 be refer to another Plant in embodiment, the number of multiple chips 102 can also be odd number, i.e., the number of multiple chips is 2N+1, wherein, N is The 1st in positive integer, multiple chips is symmetrically distributed in the both sides of window to 2N chip and forms gap less than window, the 2N+1 chip covers gap.
In specific implementation process, one layer of chip 102 first can be attached in the both sides of window 106 of substrate 101, then successively The chip 102 of other layers of stacking., can be to the core on substrate 101 during chip 102 specifically is attached into substrate 101 Piece places position using glue or typography is drawn, and glue is drawn in substrate paster face.In the present embodiment, chip is placed and attached on position The glue of chip can be such as B stage glue, and the chip on to substrate 101 is placed and drawn on position after glue, can be passed through Precuring, it is in semi-cured state to make glue, then attaches chip on the substrate 101.In the process of specific stacked chips 102 In, to the upper surface of chip 102 of current layer can draw the processing of glue and precuring, then by positioned at the upper of current layer chip One layer of chip 102 is attached on the chip of current layer.In an alternate embodiment of the invention, chip bonding mould (Die can also be passed through Attach film, DAF) 105 come to being fixed between substrate and chip, the chip of different layers.It should be noted that working as core When piece 102 carries paste functionality, for example chip 102 is attached with printing glue (such as resitol), then to substrate with When being fixed between chip 102, the chip 102 of different layers, its own can be directly used without external attaching glue Stacking is fixed in the printing glue of attachment, simplifies packaging technology.
In an alternate embodiment of the invention, the number of plies that multiple chips 102 are stacked is at least two layers, the shape between the chip of same layer Into same layer chip gap;It is more than the same layer of the chip layer away from substrate 101 close to the same layer chip gap of the chip layer of substrate 101 Chip gap, so that the chip pad of the chip layer away from substrate 101 is located at the same layer chip chamber of the chip layer close to substrate 101 In the drop shadow spread of gap.Thus, it is possible to avoid the chip layer for being located at close substrate 101 from sheltering from the core for being located remotely from substrate 101 The chip pad 103 of lamella so that the passage that bonding wire is drawn from weld pad 103 to substrate 101 is more smoothly.
In an alternate embodiment of the invention, the encapsulating structure of the multi-chip also includes:Many root bead lines 104, each bonding wire 104 is from base Plate 101 is connected to the weld pad of each chip through window and each same layer chip gap, and each chip is believed with substrate 101 respectively Number connection.In the present embodiment, bonding wire 104 can be using techniques such as gold thread, copper cash or electrum lines.
In an alternate embodiment of the invention, the encapsulating structure of the multi-chip also includes:Plastic packaging material 107, plastic packaging material 107 coats multiple Chip and many root bead lines.It should be noted that in a particular embodiment, after the completion of each chip-stacked, bonding wire connection, passing through Plastic packaging material, which is encapsulated, should be noted weighing wounded for bonding wire during these components, plastic packaging, and short circuit etc. is bad.
The encapsulating structure for the multi-chip that the present embodiment is provided, due to having cut through window on substrate, the weld pad position of each chip In in the drop shadow spread of window so that the weld pad of each chip can carry out signal by the window and substrate and be connected;Due to many The individual chip-stacked both sides in window, relative in the prior art, the structure of single pile stacked chips is provided in an embodiment of the present invention Scheme adds chip package density, also, due to each chip-stacked both sides in window, stress is equal when improving chip package Even property, then improves chip-stacked stability.
When in an alternate embodiment of the invention, due to each chip being connected with substrate signal with many root bead lines respectively, each weldering Line is connected to the weld pad of each chip from substrate through window and each same layer chip gap, and plastic packaging material is used during encapsulation by multiple cores Piece and many root bead lines are enveloped so that when carrying out three-dimensional stacked to each chip bonding wire be difficult to be weighed wounded, short circuit.
Obviously, above-described embodiment is only intended to clearly illustrate example, and the not restriction to embodiment.It is right For those of ordinary skill in the art, can also make on the basis of the above description it is other it is various forms of change or Change.There is no necessity and possibility to exhaust all the enbodiments.And the obvious change thus extended out or Among changing still in the protection domain of the invention.

Claims (7)

1. a kind of encapsulating structure of multi-chip, it is characterised in that including:
Multiple chips;
Substrate, window has been cut through for being provided for the multiple chip on placement position, the substrate;
The multiple chip-stacked both sides in the window;The weld pad of each chip is located in the drop shadow spread of the window.
2. the encapsulating structure of multi-chip as claimed in claim 1, it is characterised in that the multiple chip is located at the same of the substrate Side.
3. the encapsulating structure of multi-chip as claimed in claim 1, it is characterised in that the number of the multiple chip is even number, The multiple chip is symmetrically distributed in the both sides of the window.
4. the encapsulating structure of multi-chip as claimed in claim 1, it is characterised in that the number of the multiple chip is 2N+1 It is individual, wherein, N is positive integer, and the 1st in the multiple chip to 2N chip is symmetrically distributed in the both sides of the window and shape Into the gap less than the window;The 2N+1 chip covers the gap.
5. the encapsulating structure of the multi-chip as described in claim 1-4 any one, it is characterised in that the multiple chip-stacked The number of plies be at least two layers, same layer chip gap is formed between the chip of same layer;Close to the substrate chip layer it is same Layer chip gap is more than the same layer chip gap of the chip layer away from the substrate, so that the core of the chip layer away from the substrate Piece weld pad is located in the drop shadow spread in the same layer chip gap of the chip layer of the substrate.
6. the encapsulating structure of multi-chip as claimed in claim 5, it is characterised in that also include:
Many root bead lines, each bonding wire is connected to the weldering of each chip from the substrate through the window and each same layer chip gap Pad, each chip is connected with the substrate signal respectively.
7. the encapsulating structure of multi-chip as claimed in claim 6, it is characterised in that also include:
Plastic packaging material, coats the multiple chip and many root bead lines.
CN201710398633.6A 2017-05-31 2017-05-31 The encapsulating structure of multi-chip Withdrawn CN107093599A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
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Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201710398633.6A CN107093599A (en) 2017-05-31 2017-05-31 The encapsulating structure of multi-chip

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Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20070088177A (en) * 2006-02-24 2007-08-29 삼성테크윈 주식회사 Semiconductor package and method of manufacturing the same
US20090134504A1 (en) * 2007-11-28 2009-05-28 Walton Advanced Engineering, Inc. Semiconductor package and packaging method for balancing top and bottom mold flows from window
US20100295166A1 (en) * 2009-05-21 2010-11-25 Samsung Electronics Co., Ltd. Semiconductor package
CN103887274A (en) * 2012-12-20 2014-06-25 三星电子株式会社 Semiconductor package

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20070088177A (en) * 2006-02-24 2007-08-29 삼성테크윈 주식회사 Semiconductor package and method of manufacturing the same
US20090134504A1 (en) * 2007-11-28 2009-05-28 Walton Advanced Engineering, Inc. Semiconductor package and packaging method for balancing top and bottom mold flows from window
US20100295166A1 (en) * 2009-05-21 2010-11-25 Samsung Electronics Co., Ltd. Semiconductor package
CN103887274A (en) * 2012-12-20 2014-06-25 三星电子株式会社 Semiconductor package

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