CN107037275B - A kind of device measuring single charged particle charge-mass ratio - Google Patents

A kind of device measuring single charged particle charge-mass ratio Download PDF

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CN107037275B
CN107037275B CN201610943343.0A CN201610943343A CN107037275B CN 107037275 B CN107037275 B CN 107037275B CN 201610943343 A CN201610943343 A CN 201610943343A CN 107037275 B CN107037275 B CN 107037275B
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charged particle
electric field
mass ratio
uniform electric
charge
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CN107037275A (en
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富庆飞
杨立军
谢络
覃粒子
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Beihang University
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Beihang University
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/24Arrangements for measuring quantities of charge

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  • General Physics & Mathematics (AREA)
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Abstract

The present invention provides a kind of device for measuring single charged particle charge-mass ratio, the charge-mass ratio of single charged particle can be measured, structure is simple, easily operated, measurement object is all the device of the measurement charge-mass ratio of charged group's drop compared with the prior art, can obtain more accurate measurement result.Including uniform electric field generation device and grating range-measurement system, uniform electric field generation device is for making charged particle do uniformly accelerated motion in the uniform electric field that uniform electric field generation device generates, grating range-measurement system is for obtaining charged particle in the track that uniform electric field moves, the corresponding relationship of track and suffered external force based on uniformly accelerated motion, determines the charge-mass ratio of charged particle.

Description

A kind of device measuring single charged particle charge-mass ratio
Technical field
The present invention relates to charge-mass ratio field of measuring technique, especially a kind of device for measuring single charged particle charge-mass ratio.
Background technique
Electrification water mist has important application prospect, essence therein in the fire prevention of the important places such as Aeronautics and Astronautics, naval vessel It is exactly the mutual complexing action of charged droplet and flame, studies the interaction of single charged droplet and flame, for recognizes lotus Electric Mechanism of Water Mist Fire Extinction improves electrification fine mist fire-fighting effect, and the functionization of electrification Water Mist Fire Extinguishing Technique is promoted to have weight Want meaning.And charge-mass ratio is to measure the important indicator of charged droplet, therefore the accurate measurement of the charge-mass ratio of single charged droplet is One critical issue.
Researchers at home and abroad had many research with regard to the measuring device of charge-mass ratio, according to principle, can substantially be divided into Two kinds: one is Faraday cup methods, measure droplet carrying capacity using electrostatic induction principle, while measuring droplet matter using balance Amount, to obtain droplet charge-mass ratio, such as application No. is 201310359398.3, a kind of entitled " charged droplets lotus easy to assemble Matter is than real-time measurement apparatus " it is namely based on Faraday cup method;Another is netted goal method, utilizes measurement micro-current and receipts Collection deposition droplet measures the principle of flow to study charge-mass ratio, for example application No. is 201420831496.2, entitled " one kind is quiet Electric injector droplet charge-mass ratio detection device ".But the charge-mass ratio measuring device obtained based on the above principles, measurement object are all lotuses Electric group's drop, for the lesser drop of band charged droplet, especially carrying capacity, the above method is difficult to obtain accurately measurement knot Fruit.
Summary of the invention
It is an object of the invention to provide a kind of devices for measuring single charged particle charge-mass ratio, for single electrification Grain proposes a kind of measuring device that can measure single small charged particle charge-mass ratio.
The technical scheme is that
1. a kind of device for measuring single charged particle charge-mass ratio, which is characterized in that including uniform electric field generation device with And grating range-measurement system, the uniform electric field generation device are used to that charged particle to be made to generate in uniform electric field generation device even strong Uniformly accelerated motion is done in electric field, the grating range-measurement system is for obtaining charged particle in the track that uniform electric field moves;It is described Grating range-measurement system, which generates, has optical axis array at regular intervals, when charged particle moves in uniform electric field, by electrification Grain measures charged particle and passes through t at the time of i+1 root optical axis by being denoted as 0 at the time of the 1st optical axisi(i=1,2,3...) with And charged particle passes through t at the time of+1 optical axis of jthj(j=1,2,3...)
By formula:
The charge-mass ratio of you can get it single charged particle: where q is the electricity of single charged particle, and m is single electrification The quality of grain, E are the electric field strength of uniform electric field, d0For the distance between adjacent two optical axises.
2. the uniform electric field generation device include high voltage direct current generator, electrostatic voltmeter, two be parallel to each other it is flat Plate electrode;The output end of the high voltage direct current generator is connected by conducting wire with a plate electrode, another plate electrode Ground connection, to generate uniform electric field;The electrostatic voltmeter is in parallel with high pressure generator.
3. the uniform electric field direction and gravity direction that described two plate electrodes being parallel to each other generate are perpendicular, the band Electric Particle free falling bodies instill uniform electric field.
4. described two plate electrodes being parallel to each other are copper plate, the lateral surface of each copper plate successively inlays polytetrafluoro Ethylene and insulation organic glass.
5. the distance between described two copper plates D >=5cm.
6. diameter≤5%D of the charged particle, with guarantee charged particle electrically charged generation electric field to uniform electric field Influence can ignore.
7. the grating range-measurement system includes transmitter, light receiving device, computer or controller, synchrotimer, the hair Emitter and light receiving device are placed in parallel, and generate equidistant optical axis array between the transmitter and light receiving device, the light receiving device with Computer is connected, and computer/controller is connected with synchrotimer.
8. the transmitter is laser emitter, the equidistant laser beam axis array of generation is perpendicular to the uniform electric field The uniform electric field direction that generation device generates, the charged particle can pass through laser.
9. the optical axis of the optical axis array is away from d0It can be adjusted according to the diameter of charged particle, the optical axis is away from d0With The relationship of charged particle diameter is: diameter≤10%d of charged particle0
10. the charged particle is charged drop, the electrolyte drop of dielectric drop or conduction including insulation.
Technical effect of the invention:
A kind of device measuring single charged particle charge-mass ratio proposed by the present invention, can measure the lotus of single charged particle Matter ratio, structure is simple, easily operated, and measurement object is all the device of the measurement charge-mass ratio of charged group's drop compared with the prior art, It can obtain more accurate measurement result.
Detailed description of the invention
Fig. 1 is the device measuring principle schematic diagram of the single charged particle charge-mass ratio of measurement of the invention.
Fig. 2 is the Installation practice structural schematic diagram of the single charged particle charge-mass ratio of measurement of the invention.
Fig. 3 is plate electrode structures schematic diagram.
Appended drawing reference lists as follows: 1- high voltage direct current generator, 2- electrostatic voltmeter, 3- plate electrode, 4- transmitter, 5- Light receiving device, 6- computer, 7- synchrotimer, 33- copper plate, 32- polyfluortetraethylene plate, 31- insulation poly (methyl methacrylate) plate.
Specific embodiment
The embodiment of the present invention is illustrated below in conjunction with attached drawing, but is not intended to limit the scope of the invention.
A kind of device measuring single charged particle charge-mass ratio, including uniform electric field generation device and grating ranging system System, the uniform electric field generation device is for making charged particle do even add in the uniform electric field that uniform electric field generation device generates Speed movement, the grating range-measurement system is for obtaining charged particle in the track that uniform electric field moves;The grating range-measurement system It generates and has optical axis array at regular intervals, when charged particle moves in uniform electric field, charged particle is passed through into the 1st light It is denoted as 0 at the time of axis, measures charged particle and passes through t at the time of i+1 root optical axisi(i=1,2,3...) and charged particle is logical T at the time of crossing+1 optical axis of jthj(j=1,2,3...)
By formula:
The charge-mass ratio of you can get it single charged particle: where q is the electricity of single charged particle, and m is single electrification The quality of grain, E are the electric field strength of uniform electric field, d0For the distance between adjacent two optical axises.
As shown in Figure 1, being measuring principle schematic diagram of the invention.Assuming that the single charged particle is charged drop, band Electro-hydraulic drop enters in the uniform electric field generated by two electrode plates being placed in parallel, under gravity and electric field force collective effect, Motion profile is a parabola;Since gravity and electric field force are orthogonal, then the movement of charged drop can be decomposed into vertically The acceleration of direction uniformly accelrated rectilinear motion (gravity) and horizontal direction moves along a straight line (electric field force effect);Utilize level side To motion profile can find out electric field force suffered by charged drop, to obtain charge-mass ratio.If the voltage difference between two-plate It is U, the horizontal space between two-plate is D, E0The intensity of the uniform electric field formed between two-plate, what grating range-measurement system generated The optical axis of optical axis array is away from for d0, by charged drop by being denoted as 0, t at the time of the 1st optical axisiIt (i=1,2,3...) is electrification At the time of drop passes through i+1 root optical axis, tjAt the time of (j=1,2,3...) is that charged drop passes through+1 optical axis of jth, it is assumed that Droplets amount is q, quality m, the then acceleration of drop horizontal direction are as follows:
For uniform electric field, obtained by the relationship of electric field force and acceleration:
Above-mentioned two equations simultaneousness then obtains the charge-mass ratio of charged single drop are as follows:
In formula, d0, U, D directly can accurately be arranged, t at the time of need to only measuring charged drop by i+1 root optical axisi(i =1,2,3...) and charged drop pass through+1 optical axis of jth at the time of tj(j=1,2,3...).
As shown in Fig. 2, for the Installation practice structural schematic diagram of the single charged particle charge-mass ratio of measurement of the invention.
The measuring device of the embodiment of the present invention is mainly made of uniform electric field generation device, grating range-measurement system two parts. Wherein uniform electric field generation device includes: 1, two electrostatic voltmeter 2, high voltage direct current generator plate electrode being parallel to each other 3; The output end of high voltage direct current generator 1 is connected by conducting wire with a plate electrode, another plate electrode ground connection makes two Uniform electric field is generated between the plate electrode 3 being parallel to each other;The output end of electrostatic voltmeter 2 is also in parallel with high pressure generator, connects Ground connector ground connection;Conducting wire is all made of the high-voltage shielding line of 40kV.Grating range-measurement system includes: transmitter 4, light receiving device 5, computer (or controller) 6, synchrotimer 7, transmitter 4 and light receiving device 5 are placed in parallel, between transmitter 4 and light receiving device 5 between generation etc. Away from optical axis array, light receiving device 5 is connected with computer 6, and computer 6 is connected with synchrotimer 7.In the present embodiment, plate electricity Pole 3 is made of two pieces of parallel copper plates 33, as shown in figure 3, being plate electrode structures schematic diagram, each copper plate lateral surface Inlaid polytetrafluoroethylsliders plate 32 and insulation poly (methyl methacrylate) plate 31;The distance between two copper plates D can be adjusted suitably, this implementation In example, the distance between two copper plates D >=5cm is designed.Apply the high-pressure electrostatic of U between two pieces of copper plates, formation one is even Strong electrical field.When measurement, the uniform electric field direction that plate electrode generates is perpendicular with gravity direction, charged drop freely falling body drop Enter uniform electric field.The charged drop can be the dielectric (such as ultrapure water) of insulation, be also possible to conductive electrolyte (if not With the NaCl solution of concentration).The transmitter 4 of the present embodiment is laser emitter, and the equidistant laser beam axis array of generation hangs down Directly in the uniform electric field direction that uniform electric field generation device generates, the charged drop for instilling uniform electric field can pass through laser beam axis The laser light curtain that array is formed.Charged drop blocks the laser light curtain of the sending of transmitter 4, and light receiving device 5 does not receive optical signal, leads to It crosses computer (or controller) 6 and this reaction is fed back into synchrotimer 7, so that obtaining charged drop passes through every optical axis Time.In addition, diameter≤5%D of charged drop, with guarantee charged particle electrically charged generation electric field to the shadow of uniform electric field Sound can be ignored;The optical axis of optical axis array is away from d0Can be adjusted according to the diameter of charged particle, in the present embodiment, optical axis away from d0Relationship with charged particle diameter is: diameter≤10%d of charged particle0
It is hereby stated that described above facilitate those skilled in the art understand that the invention, but not limit the present invention The protection scope of creation.Any equivalent replacement described above, modification are improved without disengaging the invention substantive content And/or delete numerous conform to the principle of simplicity and the implementation that carries out, each fall within the protection scope of the invention.

Claims (10)

1. a kind of device for measuring single charged particle charge-mass ratio, which is characterized in that including uniform electric field generation device and light Grid range-measurement system, the uniform electric field that the uniform electric field generation device is used to that charged particle to be made to generate in uniform electric field generation device In do uniformly accelerated motion, the grating range-measurement system is for obtaining charged particle in the track that uniform electric field moves;The grating Range-measurement system generates tool optical axis array at regular intervals and leads to charged particle when charged particle moves in uniform electric field It is denoted as 0 at the time of crossing the 1st optical axis, charged particle is measured and passes through t at the time of i+1 root optical axisiAnd charged particle passes through jth T at the time of+1 optical axisj
By formula:
The charge-mass ratio of you can get it single charged particle: where q is the electricity of single charged particle, and m is single charged particle Quality, E are the electric field strength of uniform electric field, d0For the distance between adjacent two optical axises.
2. the device of the single charged particle charge-mass ratio of measurement according to claim 1, which is characterized in that the uniform electric field Generation device includes high voltage direct current generator, electrostatic voltmeter, two plate electrodes being parallel to each other;The high direct voltage occurs The output end of device is connected by conducting wire with a plate electrode, another plate electrode ground connection, to generate uniform electric field;Institute It is in parallel with high pressure generator to state electrostatic voltmeter.
3. the device of the single charged particle charge-mass ratio of measurement according to claim 2, which is characterized in that described two mutual The uniform electric field direction and gravity direction that parallel plate electrode generates are perpendicular, and the charged particle freely falling body instills even strong Electric field.
4. the device of the single charged particle charge-mass ratio of measurement according to claim 3, which is characterized in that described two mutual Parallel plate electrode be copper plate, the outside of each copper plate successively inlaid polytetrafluoroethylsliders and insulation organic glass.
5. the device of the single charged particle charge-mass ratio of measurement according to claim 4, which is characterized in that described two red coppers The distance between plate D >=5cm.
6. the device of the single charged particle charge-mass ratio of measurement according to claim 5, which is characterized in that the charged particle Diameter≤5%D, with guarantee charged particle influence of the electric field to uniform electric field of electrically charged generation can ignore.
7. the device of the single charged particle charge-mass ratio of measurement according to claim 1, which is characterized in that the grating ranging System includes transmitter, light receiving device, computer or controller, synchrotimer, and the transmitter and light receiving device are placed in parallel, institute It states and generates equidistant optical axis array between transmitter and light receiving device, the light receiving device is connected with computer or controller, calculates Machine or controller are connected with synchrotimer.
8. the device of the single charged particle charge-mass ratio of measurement according to claim 7, which is characterized in that the transmitter is Laser emitter, the uniform electric field that the equidistant laser beam axis array of generation is generated perpendicular to the uniform electric field generation device Direction, the charged particle can pass through laser.
9. the device of the single charged particle charge-mass ratio of measurement according to claim 7 or 8, which is characterized in that the optical axis The optical axis of array is away from d0It can be adjusted according to the diameter of charged particle, the optical axis is away from d0With the relationship of charged particle diameter It is: diameter≤10%d of charged particle0
10. the device of the single charged particle charge-mass ratio of measurement according to claim 1, which is characterized in that the electrification Grain is charged drop, the electrolyte drop of dielectric drop or conduction including insulation.
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EP0359681B1 (en) * 1988-09-15 1995-11-08 The Board Of Trustees Of The University Of Arkansas Characterization of particles by modulated dynamic light scattering
CN1105477A (en) * 1994-01-14 1995-07-19 株式会社日立制作所 Cathode ray tube and deflection aberration correcting method of the same
JPH11174845A (en) * 1997-12-17 1999-07-02 Sharp Corp Developing device
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