CN1105477A - Cathode ray tube and deflection aberration correcting method of the same - Google Patents

Cathode ray tube and deflection aberration correcting method of the same Download PDF

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CN1105477A
CN1105477A CN 94101800 CN94101800A CN1105477A CN 1105477 A CN1105477 A CN 1105477A CN 94101800 CN94101800 CN 94101800 CN 94101800 A CN94101800 A CN 94101800A CN 1105477 A CN1105477 A CN 1105477A
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deflection
ray tube
cathode ray
electron beam
electrode
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CN1149620C (en
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御园正义
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Hitachi Ltd
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Hitachi Ltd
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Abstract

The CRT features that its electronic gun structure has improved focus characteristics on whole screen and in all range of beam current, better resolution without focusing power supply and decrement of Mole phenomena in low-current range. The method for correcting deflection distortion of CRT features that a non-uniform electric field is created. The farther the symmetric axle from electric field, the less the distance between equipotential lines.

Description

Cathode ray tube and deflection aberration correcting method of the same
The present invention relates to cathode ray tube, more particularly, relate to a kind of cathode ray tube that is equipped with electron gun, this electron gun can improve focus characteristics in the whole current range of the whole zone of face and electron beam, thereby reach satisfied resolution, and relate to the deflection distortion bearing calibration of this cathode ray tube.
Comprise have a plurality of electrodes electron gun, deflector and face (promptly, screen with fluorescent film, as being called " fluorescent film " or abbreviating " screen " as) cathode ray tube in, following technology has been known in prior art, promptly not only will be in the central authorities of face but also will form satisfied reproduction image at the edge of face.
According to a kind of technology, bottom at the radome of the electron gun of the electron beam that adopts three word orders, be provided with two parallel plate electrodes up and down, the setting of this plate electrode is parallel to the yi word pattern across three electron beam paths, and points to a main lens (as being disclosed in Japanese patent publication No.52586/1992).
In the electron gun of the three electron-beam that adopts word order, electron beam before entering magnetic deflection field by moulding, this realizes by following measure, two parallel plate electrodes up and down are set, make it be parallel to yi word pattern across the three electron-beam path, and the antiphase region guiding face (as be disclosed in United States Patent (USP) 4086513 and Japanese patent publication No.7345/1985) of electron beam from main lens.
Between some electrode of electron gun, form electrostatic quadrupole lens,, on whole screen, make image evenly (as being disclosed in Japanese patent application No.61766/1976) so that its brightness can dynamically change with the deflection of electron beam.
Constitute the electrode zone of convergent lens (as second and third electrode) astigmatic lens (as being disclosed in Japanese patent publication No.18866/1978) is set.
First and second electrodes of yi word pattern tri-barrel electron gun have the electron beam aperture of vertical elongation, thereby make their difference of shape separately, and make the asperratio (as Japanese patent application No.64368/1976) of the asperratio of central electronic rifle less than the both sides electron gun.
The rotation non-sym lens is made of slit, it is arranged on the cathode side of the third electrode of I-shaped electron gun, so that rotating non-sym lens by at least one, electron beam is mapped on the face, in the rotation non-sym lens, electron gun axially on, for median bundle slit dark (as being disclosed in Japanese patent application No.81736/1985) than side bundle.
The desired focus characteristics of cathode ray tube is that the district does not have Moire fringe at low current to the resolution of the satisfaction of the All Ranges of screen and all current ranges of electron beam, and to the even resolution of the whole screen of all current ranges.Design can be satisfied the electron gun needs advanced techniques of these characteristics simultaneously.
In order to make cathode ray tube have above-mentioned several specific characters,, the electron gun with astigmatic lens and the combination of large aperture main lens must be set according to our investigation.
In above-mentioned prior art, for by adopting the electrode of in electron gun, setting up astigmatic lens and rotation non-sym lens, reach the resolution of the satisfaction in whole screen scope, need apply dynamic focus voltage at the convergence electrode of electron gun.But do not consider by being fixed on the inhomogeneous field in the magnetic deflection field, come the correction deflector distortion, thereby realize reappearing the satisfied resolution of image in whole screen scope.
Figure 83 is the end view that shows a kind of electron gun integral body, wherein according to the electron gun that is used for cathode ray tube, applies focus voltage to electrode G3 and G5 rifle, and anode voltage only is added in electrode G6, and Figure 84 is the phantom of the essential part of this electron gun.From negative electrode K one side, this electron gun is equipped with the first electrode 1(G1), the second electrode 2(G2), third electrode 3(G3), the 4th electrode 4(G4), the 5th electrode 5(G5) and the 6th electrode 6(G6).Attach and mention the 5th electrode 5(G5) form by two electrodes 51 and 52.
In these figure, according to the length of each electrode and the aperture of electron beam transmission hole, the influence that is imposed on electron beam by electric field is different.For example, the electron beam transmission hole of first electrode 1 of close negative electrode K is shaped in little current range exerts one's influence to the point-like of electron beam, and the electron beam transmission hole of second electrode 2 is shaped to is exerting one's influence to the point-like of electron beam to big current range from little current range.
In addition, in this electron gun, anode voltage is added in the 6th electrode 6, between the 5th electrode 5 and the 6th electrode 6, set up main lens, the 5th electrode 5 of formation main lens and the electron beam transmission hole of the 6th electrode are shaped in big current range the electron beam point-like are applied big influence, but it is in than the little current range of above-mentioned big current range, little to the influence of electron beam point-like.
In addition, the 4th electrode 4 of above-mentioned electron gun is in axial length, multiple with little electric current and big electric current, amplitude to optimum focusing voltage is exerted one's influence, and constantly the difference between each optimum focusing voltage is applied material impact at low and high electric current, but the influence that axial length applied of the 5th electrode 5 is much smaller than the influence of the 4th electrode 4.
Therefore, for each characteristic value to electron beam is optimized, must the electrode structure that can influence each characteristic be optimized.
On the other hand, in this case, reduce shadow mask spacing with the electron beam scanning direction quadrature of cathode ray tube, perhaps improve the density of electron beam scanning line, thereby improve the resolution that is orthogonal to the electron beam scanning direction, in the little current range of electron beam, be easy to generate optical interference between electron beam and the shadow mask especially.So, must reasonably handle More (Moire) contrast.Yet prior art fails to solve above-mentioned variety of issue.
The objective of the invention is to solve the problem of above-mentioned prior art, and provide cathode ray tube and the deflection distortion bearing calibration thereof that is equipped with electron gun, the structure of this electron gun can be in the whole zone of screen and in the whole current range of electron beam, improve focus characteristics, and need not to apply dynamic focus voltage, thereby reach satisfied resolution and reduce the interior Moire fringe of little current range.
For example, the schematic diagram of Figure 85 has shown essential part, is used for (a) having shown the fixed-focus electrical voltage system according to how applying the structure that focus voltage contrasts electron gun, (b) has shown the dynamic focus voltage system.
The electrode structure of the fixed-focus voltage type electron gun of Figure 85 (a) is with identical shown in Figure 83 and 84, and the parts with identical function are marked with identical label.
In the fixed-focus voltage-type electron gun of Figure 85 (a), the electrode 51 and 52 that constitutes the 5th electrode 5 is by the focus voltage V that feeds with common electric potential F1
On the other hand, in the dynamic focus voltage formula electron gun of Figure 85 (b), constitute the 5th electrode 5(G5) two the electrodes 51 and 52 different potential focus of being fed.Among, electrode 52 dynamic focus voltage dVf that fed.In addition, this dynamic focus voltage formula electron gun has the part that stretches into another electrode, and shown in 43, and its structure is more more complex than the electron gun of Figure 85 (a).Therefore, dynamic focus voltage formula electron gun has the high shortcoming of component costs, and time assembling also is inferior to be assembled into electron gun.
Figure 86 is the schematic diagram that indicates the potential focus of the electron gun that imposes on Figure 85.Figure 86 (a) is the schematic diagram of the focus voltage waveform of fixed-focus voltage-type electron gun, and Figure 86 (b) is the schematic diagram of the focus voltage waveform of dynamic focus voltage formula electron gun.
Among Figure 86 (b), used voltage comprises fixed-focus voltage Vf 1With another voltage, dynamic focus voltage Vf therein 2Be superimposed upon another fixed-focus voltage Vf 20On.Therefore, dynamic focus voltage formula electron gun shown in Figure 85 (b) need be provided with two dynamic focus voltage feed-in pins on the stem of cathode ray tube, and compare with the fixed-focus voltage-type electron gun of Figure 86 (a), need to pay close attention to more insulation with other stem pin.This makes it be necessary for the base of assembling in television receiver space structure is provided, produce following problem thus, promptly need the time cycle, be used for not only regulating the focus voltage of the fixed-focus power supply of two lines, but also will regulate the focus voltage of the television receiver on dynamic focus voltage generator and the assembly line.
Another object of the present invention is the problems referred to above that solve in the prior art, and provide a kind of cathode ray tube and deflection distortion bearing calibration thereof that is equipped with electron gun, the structure of this electron gun can be in the All Ranges of screen and in the whole current range of electron beam, even the dynamic focus voltage value is less, improve focus characteristics, thereby obtain satisfied resolution.
Another purpose of the present invention provides a kind of cathode ray tube and deflection distortion bearing calibration thereof, is used to reduce by the caused focus characteristics of the space charge repulsion that acts on the electron beam between cathode ray fluorescent surface and the electron gun main lens descend.
Because the maximum deflection angle (will abbreviate " deflection angle " or " deflection " as) of electron beam has come down to determine in the cathode ray tube, all are for the large scale of face, distance between face and the electron gun main focusing lens is big, has encouraged the decline of being scolded the caused focus characteristics of figure by the space charge that acts on this regional electron beam thus.
Therefore, have and be used to reduce the device that descends by the caused focus characteristics of space charge repulsion, just can obtain just like dwindling the such tiny electron beam of face size, thereby improve the resolution of cathode ray tube.
Further purpose of the present invention provides a kind of deflection distortion bearing calibration that can improve above-mentioned focus characteristics and shorten electron gun, the cathode ray tube that is equipped with this electron gun and this cathode ray tube of cathode ray tube length overall.
Another object of the present invention provides a kind of electron gun, even the deflection angle of cathode ray tube enlarges, image uniformity can not reduce yet in whole screen, equips the deflection distortion bearing calibration of cathode ray tube and this cathode ray tube of this electron gun.
Even deflection angle enlarges, the length overall of cathode ray tube also can shorten.Determined although the size of the thickness direction of existing television receiver is the length overall by cathode ray tube,, wished more that then it is vertically shorter if it is regarded as a kind of furniture.In addition, when a large amount of television receivers by when its producer transports there, the thickness of television receiver is short more favourable to conevying efficiency.
In above-mentioned prior art, to the axial length because of the shortening cathode ray tube, and at this position that is provided with electron beam deflecting magnetic field recurring structure of the neck of cathode ray tube, the inhibition that the temperature of generation rises does not add consideration.
In order to achieve the above object, the structure that has of the present invention is as limiting in appending claims.
Particularly,, provide a kind of cathode ray tube, comprised electron gun, deflector and face, wherein improved being,, come the correction deflector distortion by in magnetic deflection field, forming fixing inhomogeneous field with a plurality of electrodes according to the present invention.
Deflection distortion is proofreaied and correct and is characterised in that, by set up the fixedly inhomogeneous field with astigmatism in magnetic deflection field, according to deflection deflection distortion is proofreaied and correct.
In addition, above-mentioned fixedly inhomogeneous field is characterised in that, sets up the inhomogeneous field of astigmatism, and wherein electron beam is dispersed or assembled, thereby on the scan-line direction or the direction perpendicular to scan line of electron beam, comes the correction deflector distortion according to deflection.
And, the invention is characterized in, by in magnetic deflection field, setting up fixedly inhomogeneous field, deflection distortion is proofreaied and correct according to deflection with comatic aberration.
Above-mentioned fixedly inhomogeneous field is characterised in that, foundation has the inhomogeneous field of comatic aberration, electron beam is dispersed or assembled, and, deflection distortion is proofreaied and correct according to deflection on the scan-line direction of electron beam or on the direction perpendicular to scan line.
Cathode ray tube of the present invention with the structure that is limited by claims has reached following effect:
(1) generally speaking, in cathode ray tube, it is big that deflection distortion becomes sharp with the increase of deflection.According to the present invention, by in magnetic deflection field, setting up a kind of inhomogeneous field, can distort by correction deflector, when electron beam is deflected to its orbit transfer, can change dispersing or converging action of electron beam.
(2) Figure 66 shows the schematic diagram that concerns between amount of deflection (or deflection angle) and the deflection distortion amount, and Figure 67 shows the schematic diagram that concerns between amount of deflection and the deflection distortion amount.
Shown in Figure 66, along with the increase of deflection angle, deflection distortion strengthens.According to the present invention, by set up inhomogeneous field in magnetic deflection field, when electron beam was deflected to its orbit transfer, shown in Figure 67, the correction of deflection distortion increased according to deflection, thereby the deflection distortion that sharply increases with deflection is proofreaied and correct.
(3) as the inhomogeneous field of this class in magnetic deflection field, the electric field with astigmatism is effectively a kind of, and when electron beam was deflected to its orbit transfer, the convergence of electron beam or disperse function were suitably strengthened according to deflection.This astigmatism electric field is to set up by the electric field with two quadrature planes of symmetry.
From center, the closer to the position of symmetrical plane end, the convergence of electron beam or disperse function are just strong more.
If electron beam state that passes the electric field central authorities that set up by equipotential line and the electron beam state that passes away from electric field central authorities are compared, just can find, it is big to pass the electron beam that the discrete ratio away from the electron beam of electric field central authorities passes electric field central authorities, and the more close electric field end of whole rail.
In addition, the variation at electric field end track is bigger.This is that the interval of equipotential line is narrow more because along with distance electric field central authorities are far away more.
Generally speaking, in cathode ray tube, the distance from the electron gun main lens to the face is long in face central authorities at edge, face ratio, if the centre electron beam is suitably got together in the face, then at the edge, face that does not both have converging action and also do not have the effect of dispersing over convergence will appear.
According to the present invention, by set up stationary electric field in magnetic deflection field, to big deflection, the disperse function of electric field is also strong more, thereby the electron beam over convergence that can alleviate the edge, face comes the correction deflector distortion according to deflection, shown in Figure 67.
Also have in the situation of electron-beam convergence effect in magnetic deflection field,, in magnetic deflection field, set up stationary electric field with higher-strength trend according to the present invention.Therefore, at the deflection that increases, the increase of the disperse function that is applied by electric field can be greater than the increase of the converging action that is applied by magnetic deflection field, thereby deflection distortion is proofreaied and correct, and comprises because the structure of cathode ray tube and the electron beam over convergence phenomenon that causes at the edge, face.
(4) Figure 68 is the schematic diagram of reading beam focus state on fluorescent film 13.Reference number 3 expression third electrodes, label 4 expressions the 4th electrode, label 13 is fluorescent films, label 38 is main lenss.
Figure 69 shows the schematic diagram that is formed on the scan line on the faceplate part that constitutes cathode ray fluorescent surface (or screen).Reference number 14 presentation surface plate portions, label 60 expression track while scans.
The deflection of cathode ray tube is usually finished by the method for linear scan electron beam, shown in Figure 69.This linear scan track is called " scan line ".
Between the direction (X-X) and the direction (Y-Y) perpendicular to scan line of scan line, magnetic deflection field usually is different.And, before the strong influence of the effect of the fixedly inhomogeneous field of in magnetic deflection field, prepare setting up, utilize among above-mentioned a plurality of electron gun electrodes the effect of at least one, make the converging action of electron beam on scanning direction and its vertical direction different.
In addition, this weighting is different, and this depends on, according to the application of cathode ray tube, during the deflection distortion of the deflection distortion correction of scan-line direction or vertical direction proofreaied and correct which emphasized.Always not identical in order to overcome at the technical measures of the amount of scan-line direction and correction and scope, and cost is different.The present invention can adopt these different measures to overcome these problems.
(5) the electron beam electric field central authorities of passing through on a symmetrical plane of astigmatism electric field and to set up by equipotential line with converging action, pass through with electron beam and to pass position away from electric field central authorities, electron beam before the suffered converging action relatively of electron beam when they pass in this electric field after wants big, and the more close electric field of the whole rail of electron beam central authorities.In addition, the orbit transfer near electric field one side is bigger.This is that it is narrow more at interval because equipotential line is far away more from electric field central authorities.
When deflection distortion has disperse function to electron beam, by in magnetic deflection field, setting up stationary electric field, can proofread and correct deflection distortion according to deflection, shown in Figure 67, the converging action that is applied by this electric field can strengthen with deflection, thereby the over convergence of face edge electron beam is weakened.
Always not identical in order to overcome to the technical measures of the amount of the deflection distortion of scan-line direction and alignment and scope, but cost is different.The present invention can adopt these different measures to solve problem.
(6) in having the color cathode ray tube of the three electron-beam of word order in the horizontal direction, vertical deflection magnetic field shows as the tubbiness Distribution of Magnetic Field, and horizontal deflection magnetic field shows as the pincushion field distribution, shown in Figure 74, thereby has simplified the control circuit that three electron-beam is assembled on phosphor screen.
In the three electron-beam of yi word pattern, the both sides electron beam is subjected to different deflection distortions of measuring from vertical deflection magnetic field, and this depends on the amplitude of vertical deflection magnetic field and the direction of horizontal deflection.For example, the Distribution of Magnetic Field that magnetic deflection field is passed through is different in various situations, wherein, observes cathode ray tube from the face, and the electron beam on right side is by to left side, face and right side deflection in the yi word pattern, thereby the deflection distortion amount is different.In the right corner of face and the image quality at left comer place is different.
For this is suppressed,, assemble or disperse function should be different the right side of passing electron gun central authorities and those side electron beams of left side electron orbit.
In the present invention, effectively in magnetic deflection field, form the electric field that only has a symmetrical plane, promptly have the stationary electric field of comatic aberration.
On the plane of symmetry of comatic aberration distortion electric field with disperse function, have electron beam that passes the electric field central authorities that set up by equipotential line and the electron beam that passes away from the position of electric field central authorities, when passing when in electric field, advancing away from the electron beam at the position of electric field central authorities, its suffered dispersing, and the more close electric field end of its whole rail greater than the electron beam that passes electric field central authorities.In addition, at the side near the electric field end, the variation of track is bigger.This is that the spacing of equipotential line is narrow more because far away more apart from electric field central authorities distance.
When passing when advancing in electric field away from the electron beam at the position of electric field central authorities, dispersing that it has is bigger than the electron beam that passes electric field central authorities, and its whole rail is near the electric field end.And, change also greatly at track near electric field end one side.But the rate of change that passes the electron beam of electric field central authorities is lower than the electron beam that passes away from the position of electric field central authorities.This is that the degree that the equipotential line spacing narrows down is lower than the electron beam that passes electric field central authorities because far away apart from electric field central authorities.
As a result, shown in Figure 67, by in magnetic deflection field, setting up a kind of like this stationary electric field, can the correction deflector distortion, the disperse function that is applied by this electric field differently strengthens on yawing moment with the increase of deflection.
In situation that magnetic deflection field has an electron beam divergence and the deflection distortion situation different with yawing moment, to being positioned at the electron beam on the symmetrical plane, setting up stationary electric field in the magnetic deflection field with the trend shown in Figure 66, thus to increasing the converging action that can strengthen electric field with the different deflection of yawing moment, thereby the correction deflector distortion is shown in Figure 67.
(7) for by form fixedly inhomogeneous field in magnetic deflection field, improve the uniformity of the resolution on the whole face, the so deflection of the track of electron beam is even if so that also will pass the zone of different electric field strength in electric field.Thereby above-mentioned inhomogeneous field is limited by the position relation with magnetic deflection field.
Simultaneously, the effect of deflection distortion correction depends on the intensity of fixedly inhomogeneous field to be set up in the magnetic deflection field.This electric field is to utilize at least two potential differences between the electrode with different potentials to set up.This electric field strength is not monodrome, because being combination by the potential difference between structure, the position electrode different with above-mentioned at least two current potentials, it is determined, and be subjected to various restrictions, for example pass the actual (real) thickness of the electron beam of above-mentioned electric field, and above-mentioned actual electrical potential difference.
The foundation of this electric field is to utilize poor between at least two current potentials, and comes the electrode of correction deflector distortion according to above-mentioned deflection, that is the electrode that is used to set up above-mentioned inhomogeneous field should be called " deflection distortion correcting electrode ".This deflection distortion correcting electrode can be provided with a plurality of and also its quantity unrestricted, perhaps its function can be born by the part of another electrode.
As known in the prior art, the required magnetic flux density of deflection depends on the voltage of face, and can come normalization by the root divided by face voltage.If adopt this value, the track of the electron beam in the above-mentioned inhomogeneous field can be understood, thereby improves the setting accuracy of electric field, and making suitable deflection distortion proofread and correct thus becomes possibility.
Required magnetic flux density also depends on the intensity of above-mentioned inhomogeneous field, thereby for high field, magnetic flux density can be less.The intensity of inhomogeneous field also depends on the position relation and the potential difference of the adjacent electrode different with current potential, and depends on the self structure of the deflection distortion correcting electrode of setting up inhomogeneous field.Along with the position relation of the adjacent electrode different with current potential is near more, electric field just is enhanced more, but its spacing is most zero from not contracting.
By improving the potential difference between the adjacent electrode different, can strengthen electric field with current potential.Yet, the rapid enhancing of electric field can cause electron beam so seriously to be out of shape under the influence of inhomogeneous field, even the track at zero deflection is advanced, promptly the face central authorities of directive cathode ray tube cause the resolution decline of face central authorities also to be can not ignore.Therefore, if consider to have the breakdown characteristics of the different electrode of current potential, then the potential difference of the adjacent electrode different with current potential is limited in actual maximum, is about poor between face current potential and the convergence current potential.
Can expect that if be used to set up the gap constriction of the deflection distortion correcting electrode of above-mentioned inhomogeneous field, electron beam can produce to be assembled or disperse, and changes even have small track.Yet if consider the thickness of electron beam, the gap actual upper bound restriction that inhomogeneous field is set up electrode is 0.5mm.According to the present invention, and this being taken in, is in 100 degree or the bigger situation in the maximum deflection angle of cathode ray tube, if above-mentioned normalized magnetic flux density is set at the root 0.007 milli tesla of the face voltage of every 1V, then can present effect.
Run through the axial situation of cathode ray tube at the electrode that is arranged in face one side, above-mentioned distance is the longest.
(8) if determined the maximum deflection angle of cathode ray tube, in fact just determined by the normalized peakflux density of the root of face voltage.Exist a kind ofly have the method for giving desired location in the zone of deciding level or higher peakflux density, wherein in magnetic deflection field, set up the said fixing inhomogeneous field.In the measurement of simplifying magnetic flux density, this method is more than getting well with magnetic flux density absolute value location.In a word, comparing with peakflux density is enough and practicality.Here, peakflux density changes with the shape of above-mentioned magnetic material, until the generation error, but can not produce practical problem.
In the maximum deflection angle of cathode ray tube is in 100 degree or the bigger situation, according to the present invention, if the above-mentioned inhomogeneous field of one side is set up the end of electrode in the face, the level set of magnetic flux density be peakflux density 25% or higher, consider restriction simultaneously to electrode and electric field relation, as illustrated in aforementioned operating state (7), can in the scope of no practical problem, present effect.
(9) closely corresponding to the position of distance magnetic material, this magnetic material is made the iron-core coil that is used to set up magnetic deflection field to magnetic flux density, and this is because it depends on the permeability of magnetic circuit.One of method that characterizes required magnetic flux density zone is that above-mentioned inhomogeneous field is set up the distance between electrode and the above-mentioned magnetic material.This method is practical, because under the situation that is provided with the iron-core coil that is used to set up magnetic deflection field, can omit the measurement of magnetic flux density.Here, the distribution of magnetic flux density has produced error, but does not have practical problem, becomes with the shape of magnetic material because of this it.
In the situation more than the maximum deflection angle of cathode ray tube is 100 degree, according to the present invention, if from the distance of the end of setting up electrode away from the inhomogeneous field of magnetic material end one side of face one side to the face within 40mm, consider restriction simultaneously to electrode and electric field relation, operating state (7) is illustrated as described above, can present effect in the scope of no practical problem.
In the above-mentioned axial situation that is arranged in the deflection distortion correcting electrode of face one side through cathode ray tube, above-mentioned distance is the longest.
(10) same, according to the present invention, in the cathode ray tube maximum deflection angle is 100 degree or littler situations, if a normalization magnetic flux density corresponding to aforementioned operating state (7) is set at the root 0.004 milli tesla of per 1 volt of face voltage, then can present effect.In actual fault-free scope, be effective corresponding to 20% or higher magnetic flux density of operating state (8).In actual fault-free scope, be effective corresponding to the 35mm or the littler distance of operating state (9).
(11) in cathode ray tube, if consider the overall structure of cathode ray tube and the structure of the electron gun that adopted, the feasibility of manufacturing and using, then the intensity of above-mentioned inhomogeneous field can not freely increase.
If consider the feasibility of use, according to the present invention, must be suitably thick at this regional electron beam, even if so that also can be effective in the quite low electric field of intensity.In cathode ray tube, generally speaking, electron beam is all got maximum gauge near main lens.Therefore, the position that is used to set up above-mentioned inhomogeneous field deflection distortion correcting electrode is limited by the distance of distance main lens.
And if be provided with the deflection distortion correcting electrode very closely with negative electrode one side away from the main lens position, then the converging action of main lens will make the astigmatism imbalance, thereby cause a kind of difficulty, and promptly electron beam partly impinges upon on some electrode of electron gun.
Here will consider to use and have condition, single electron beam or the electron beam of assembling by magnetic field that maximum deflection angle is 85 degree or littler cathode ray tube.In the present invention, distance between the end of setting up electrode near the above-mentioned inhomogeneous field of face one side and the anode of the CRT electrom gun of facing main lens, be effective when satisfying following condition, take from and the scan line vertical direction, from in the face of the electron gun anode of main lens towards the face, above-mentioned distance is that perhaps this distance is three times or the same little or 108mm or littler with this diameter of cathodic same aperture diameter in the face of five times or the same little or 180mm or littler with this diameter of the aperture diameter of the electron gun anode of convergence electrode.Through the axial situation of cathode ray tube, above-mentioned distance is the shortest at the electrode that is positioned at face one side.
(12) in order to make the present invention in above-mentioned inhomogeneous field zone effectively, the magnetic flux density of magnetic deflection field must be in an essential value.Above-mentioned deflection distortion correcting electrode can be manufactured with nonmagnetic substance.But if deflection distortion correcting electrode at least a portion is manufactured with magnetic material, then it has played and has improved the effect of the magnetic flux density of electric field region, rather than sets up the mechanism of magnetic deflection field, thereby has further improved the correction of deflection distortion.
(13) in the present invention, the deflection distortion correcting electrode structurally needs to be provided with near electron beam path.A kind of scheme that satisfies this requirement is characterized by, and an aperture structure that surrounds a part of electron beam path is set.As described in operating state (3), the astigmatism electric field has two symmetrical planes, and the comatic aberration electric field has a plane of symmetry.
Above-mentioned two class distortion electric fields can be set up by the structure in above-mentioned aperture.Generally speaking, the electrod assembly of CRT electrom gun is manufactured by the pressed metal sheet.Recently, the focus characteristics of cathode ray tube is significantly improved, thereby electrod assembly is had the requirement that improves precision, and above-mentioned deflection distortion correcting electrode needs high accuracy equally.In production in enormous quantities, have the global facility in aperture by compacting, can with high manufacturing accuracy with reasonably become original manufacturing deflection distortion correcting electrode.
In the deflection of cathode ray tube, usually to form scan line, as mentioned above.In the cathode ray tube of scan-type deflection, the shape of face is generally rectangular profile, and normally is parallel to rectangular edges and scans.For cathode ray tube is assembled into image display apparatus, with the vacuum casting that the face forms, its profile also is the rectangle that mates with the face usually.
Therefore, in the present invention,, then help constituting image if the structure of above-mentioned two class distortion correction electric fields is corresponding with scan line and face shape.Distortion electric field can be on both direction, and promptly in the direction identical with scan line with perpendicular to the direction of scan line, but this occupation mode with cathode ray tube is relevant, thereby can not determine singlely.
(14) in the present invention, the diameter in above-mentioned aperture and electric field strength to be set up and closely related at the electron beam orbit of corresponding site, and if it too conference reduce effect.If image display apparatus uses cathode ray tube, then its degree of depth is subjected to the restriction of the axial length of cathode ray tube, thereby can not freely shorten.
At this restriction, a kind of measure is the maximum deflection angle that increases cathode ray tube.The maximum deflection angle of implementing in this grade is 114 degree for the cathode ray tube of single electronic beam, is both this value for the cathode ray tube of yi word pattern three electron-beam.In the future, maximum deflection angle has the trend that becomes big, but its change has improved the peakflux density of magnetic deflection field greatly, so that in fact maximum deflection angle has been subjected to the restriction of cathode ray tube neck diameter.If the external diameter of neck maximum is about 40mm, then be suitable for, because this has saved the material of setting up the magnetic deflection field electric energy and setting up the used mechanical position of magnetic deflection field.
In general, the electrode maximum of electron gun footpath must be less than the internal diameter of cathode ray tube neck, and for mechanical strength, the prevention that insulation and X ray leak, neck must have several millimeters at least.In the present invention, operating state (7) is illustrated as described above, consider restriction to electrode and electrode, from scan-line direction or from the scan line vertical direction, by set up throat's optimum diameter that inhomogeneous field comes the electrode aperture of correction deflector distortion in magnetic deflection field can be 1.5 times or the same size with it in the face of the position of the convergence electrode of electron gun anode, when from the scan line vertical direction, promptly be 0.5 to 30mm.Like this, in the indicator of costs of excellence, can present the characteristic effect.
(15) in the present invention, inhomogeneous field also can be set up by such electrode structure, and wherein these electrodes are put relatively across electron beam path.
Figure 70 shows the schematic diagram of the structure example of deflection distortion correcting electrode.Among Figure 70: (a) be the position cutaway view of cylinder electrode; (b) be the front view of cylinder electrode; (c) be the end view of parallel plate electrode; (d) be the front view of parallel plate electrode; (e) be the top view of parallel plate electrode.
Figure 71 has shown the cylinder electrode of setting up inhomogeneous field and the setting of parallel plate electrode (being the deflection distortion correcting electrode).
In order to set up inhomogeneous field, for example, a cylinder electrode 67 as (a) of Figure 70 and (b) and two parallel plate electrodes 68, as Figure 70 (c), (d) with (e), is set up and presents with current potential, shown in Figure 71.Like this, between parallel plate electrode 68, set up inhomogeneous field.
These parallel plate electrodes 68 constitute the deflection distortion correcting electrode.By on the relative position of the remaining electrode of electron gun and parallel plate electrode 68, forming the part of the non-parallel or trough of belt mouth of part, the property combination of the application of cathode ray tube and remaining electrode is got up, can realize better deflection distortion correction.
Especially, in the situation of the multiple class small lot of being fabricated to of cathode ray tube, improved the production cost for preparing expensive compacting tool set.The compacting of adopting precision to be lower than the plate material of the forming method that whole bore components is suppressed reaches folding, can easily make parallel plate electrode.Therefore, even the production of multiple class small lot also need not expensive compacting tool set, reasonably cost is produced parts.
In the present invention, the optimum size scope at the above-mentioned relative position of electrode equals aperture diameter in fact, as described in operating state (14), does not still comprise the zero distance between two electrodes, because require relative structure.In addition, in the cathode ray tube of scanning line style deflection, relative direction can be easily corresponding to scan-line direction or vertical direction, as operating state (14).
(16) in above-mentioned deflection distortion correcting electrode, the fixedly inhomogeneous field of foundation strengthens its disperse function and comes the correction deflector distortion according to the increase of deflection, and its current potential must remain on the level more higher than those adjacent electrodes.
In the present invention, the current potential of above-mentioned electrode is transferred to the face current potential of cathode ray tube, satisfies above-mentioned needs.At this moment, the anode of face and electron gun need not to be in same current potential.
The current potential of electron gun anode must be higher than to the potential setting of electrode, the fixedly inhomogeneous field stronger can be set up than the potential difference between above-mentioned electrode and the electron gun anode.
Set up the method for potential difference between face and electron gun anode, one of illustration is in the present invention, makes the face current potential dividing potential drop of cathode ray tube with divider resistance.
If can then can improve the correction accuracy of deflection distortion better at the outside electron gun current potential that is different from the face current potential of regulating of cathode ray tube.
(17) in above-mentioned deflection distortion correcting electrode, the fixedly inhomogeneous field of foundation strengthens its disperse function and comes the correction deflector distortion according to the increase of deflection, and its current potential must remain on the level more higher than those adjacent electrodes.
In the present invention, make the current potential of above-mentioned electrode identical, satisfy above-mentioned needs with the current potential of the anode of electron gun.
Suitably set the position and the structure of deflection distortion correcting electrode, so the electric field energy of setting up arrives near the electrode, if with the effect combination of suitable magnetic deflection field, then can come the correction deflector distortion according to deflection.
The adjacent electrode of above-mentioned different potentials is assembly parts among the present invention, is used to set up the electric field by the aperture, rather than passes through electron beam transmission hole.Electric field releases by aperture rather than electron beam transmission hole, but also reinforced effects, and promptly the deflection distortion correcting electrode is according to the increase of deflection, strengthens it and disperses and do the correction deflector distortion.
(18) in the present invention, even the fixed potential of deflection distortion correcting element is different from the face and the electron gun anode current potential separately of cathode ray tube, also can come the correction deflector distortion according to the increase of deflection.
The correction that is used to improve the deflection distortion of electron beam divergence effect is necessary, for example, applies current potential between face current potential and anode potential, can finish deflection distortion greatly according to the change of deflection and proofread and correct.
The correction that is used to improve the deflection distortion of electron-beam convergence effect is necessary, within the anode of electron gun or near it, the electrode that current potential is lower than the electron gun anode potential is set, and improves converging action according to the increase of deflection, proofreaies and correct thereby finish deflection distortion.Among the present invention, the current potential that is lower than anode potential need not power source special, because can tell with a resistance another current potential from cathode ray tube, as described in operating state (17).
Among the present invention, by making such structure, the current potential that promptly wherein is lower than anode potential applies from the cathode ray tube outside, can make process conditions such as the fixed point of making cathode ray tube knock (spot knocking) and be simplified.
Among the present invention, need not any power source special, because the current potential lower than anode potential is the electron gun convergence electrode.
(19) among the present invention, when cathode ray tube is used for image display apparatus, and with a resistance from another current potential dividing potential drop of cathode ray tube, thereby produce the convergence electrode current potential of electron gun, as described in operating state (17), then this device can save the power supply that is used for convergence voltage, so that cost reduces.
(20) set up in magnetic deflection field when fixing inhomogeneous field, deflection distortion is proofreaied and correct, as described in (11) in working order,,, also will present effect even this electric field strength of expectation is quite low from actual purpose.For this reason, require electron beam suitable thickness to be arranged in this zone.
In general, in the cathode ray tube, the diameter of electron beam is bigger near main lens.The limited location of deflection distortion correcting electrode is in the distance of distance main lens.The limited location of deflection distortion correcting electrode is in the distance of distance magnetic deflection field, as described in operating state (7) to (10).Therefore, the limited location of main lens is in the distance of distance magnetic deflection field.
At cathode ray tube, in yi word pattern color picture tube or chromoscope, the magnetic deflection field of electron beam is generally non-homogeneous, regulates in order to simplify to assemble.Thereby in this case, the position is set up away from magnetic deflection field as much as possible in the location of main lens, so that the electron beam that suppresses to be caused by magnetic deflection field is out of shape, magnetic deflection field is set up the position and is provided with than the more close face of electron gun main lens usually.
(21) among the present invention, when fixing inhomogeneous field is based upon in the magnetic deflection field, come the correction deflector distortion, by setting up inhomogeneous field, calculate the electron beam distortion that causes by above-mentioned non-homogeneous magnetic deflection field simultaneously, might obtain magnetic deflection field and set up solution between position and the main lens.
Among the present invention, when the maximum deflection angle of cathode ray tube is 100 degree or when bigger, the end of magnetic material and electron gun anode surface are within the 60mm to the optimum distance between the convergence electrode one side, and this magnetic material is employed at the iron-core coil of setting up magnetic deflection field away from face one side.
(22) on the other hand, the distance between expectation gun cathode and the main lens is longer, so that by reducing the magnification ratio of electron gun image, reduce the bundle spot diameter on the face.
Therefore, have and these two the cathode-ray rates that act on corresponding excellent resolution, its axial length must increase.
But, according to the present invention, close face, the position of main convergent lens, do not change simultaneously distance from gun cathode to main lens, the image multiplication rate of electron gun can further reduce, thus the spot diameter that dwindled on the face electron beam, and shorten axial length.
(23) because along with close face, the position of main lens, the time cycle that the space charge repulsion continues in the electron beam shortens, the bundle spot diameter can further dwindle on the face.
(24) in order to finish and the identical content of operating state (21) to (23), according to the present invention, when the maximum deflection angle of cathode ray tube is 100 degree or when bigger, optimum distance between magnetic deflection field and the main lens is such state, the electron gun anode surface is contained in the position of main lens among the magnetic field, the magnetic flux density in this magnetic field for the peakflux density of carrying out deflection in scan-line direction or vertical direction 25% or bigger.
(25) in order to finish more accurately and the identical content of operating state (21) to (24), according to the present invention, when the maximum deflection angle of cathode ray tube is 100 degree or when bigger, optimum distance between magnetic deflection field and the main lens is such, root with value E removes value B, the merchant of gained has comprised every 1V anode voltage 0.004 milli tesla or higher part, if establish the voltage of cathode ray fluorescent surface here is the E volt, and in the part of electron gun anode surface to main lens, on scan-line direction or vertical direction, the magnetic flux density of carrying out the above-mentioned magnetic deflection field of deflection is a B tesla.
(26) in the present invention, when content identical with operating state (21) to (25), the maximum deflection angle of cathode ray tube is 85 degree or bigger and when spending less than 100, optimum distance between magnetic deflection field and the main lens is such, part corresponding to operating state (21) to (23) is 40mm or littler, part corresponding to operating state (24) is 15% or bigger, is 0.003 milli tesla or bigger corresponding to the part of operating state (25).
(27) in the present invention, when content identical with operating state (21) to (25), the maximum deflection angle of cathode ray tube is that 85 degree are when following, optimum distance between magnetic deflection field and the main lens is such, part corresponding to operating state (21) to (23) is 170mm or littler, part corresponding to operating state (24) is 5% or higher, is 0.0005 milli tesla or bigger corresponding to the part of operating state (25).
(28) from operating state (21) to (27), different with prior art according to the present invention, the optimum distance between magnetic deflection field and the electron gun main lens can shorten.Among the present invention, the optimum position between cathode ray tube neck and the electron gun main lens is to be provided with like this, compares with the end of the neck of face one side, and the electron gun anode surface is to the more close face 15mm of the face of main lens.
In the prior art, finish from cathode ray tube neck inwall down to the current potential of feeding to the electron gun anode away from magnetic deflection field the position of electron gun main lens.
Among the present invention, the position of electron gun main lens need not away from magnetic deflection field, but can not carry out from cathode ray tube neck inwall down to the current potential of feeding to the electron gun anode near the face.
Because highfield is the narrow space that is based upon cathode ray tube, voltage endurance stable is one of important technology of stabilised quality.Maximum field intensity is arranged near the electron gun main lens.Contiguous electric field also depends on and is used on the neck inwall that is applied to cathode ray tube to electron gun the feed graphite film of current potential or the foreign substance that is present in cathode ray tube and is caught by the neck inwall.
Among the present invention, can be set in position to electron gun main lens, thereby stablize voltage endurance forcefully than the more close face of neck.
(29) in the cathode ray tube, for various operating states, the negative electrode that plays the source of divergent bundle is usually heated by electric heater.The heat of this heater transmits by the cathode ray tube neck, thereby improves the temperature that magnetic deflection field is set up mechanism.If overheated, this mechanism then can cause trouble by inadequate insulation, because it some be that organic material is made.
Because the main lens of electron gun need not away from the magnetic deflection field location, but can be provided with near the face, according to the present invention, the distance between heater and this mechanism will shorten, thereby makes mechanism overheated.
Usually, the maximum Applicable temperature of this mechanism by the performance limitations of material therefor about 110 ℃.For the heat that transmits from neck, this mechanism must suppress, because it normally designs by 40 ℃ room temperature and himself heat distribution.
For fear of above-mentioned overheated, must save the power of heater.For temperature being remained on this scope, importantly the optimal power of heater being set a negative electrode among the present invention is 3 watts or lower.
(30) because when electron-beam point was positioned at face central authorities, it was not subjected to the influence of magnetic deflection field, so need not to resist the distortion from magnetic deflection field.As a result, the lensing of electron gun is rotational symmetric convergence line, so that the electron-beam point diameter on the face can further dwindle.
(31) according to the present invention, by in magnetic deflection field, setting up fixedly inhomogeneous field, come the correction deflector distortion, and by giving dynamic electric voltage to some feedthrough electrode of electron gun according to deflection, can realize more suitable electron-beam convergence effect in zone, whole face, thereby set up the high-resolution characteristic in zone, whole face.This can also reduce necessary dynamic electric voltage.
(32) among the present invention, in magnetic deflection field, set up fixedly inhomogeneous field, come the correction deflector distortion.In addition, at least one electric field that a plurality of electrostatic lens of being made up of a plurality of electrodes that constitute electron gun are set up, it is the rotation asymmetric electric field, form with this: an electrostatic lens, screen central authorities in the face in the big galvanic areas, are configured as common circle or rectangle to electron-beam point, and have such focus characteristics, the adequate focusing voltage that promptly acts on the electron beam of scanning direction is higher than the adequate focusing voltage of the vertical direction that acts on the scanning direction; Another electrostatic lens, at the face central part, in little galvanic areas, the scanning direction diameter and the perpendicular diameter of electron-beam point are cooperated with the scanning line density of shadow mask spacing and scanning direction and vertical direction, and have such focus characteristics, the adequate focusing voltage that promptly acts on the scanning direction is higher than the adequate focusing voltage that acts on vertical direction.By the lens that these rotation asymmetric electric fields constitute, be provided in the whole screen zone and whole current range of face the satisfied focus characteristics of no Moire fringe in the electron beam.
(33) incidentally, the connotation of used " rotating asymmetric " speech does not comprise by the represented content of the locus of points that is positioned at the equidistant place of pivot, as garden week among the present invention.For example, " rotate asymmetric " and restraint some right and wrong garden bundle point.
(34) among the present invention, as described in operating state (28), in magnetic deflection field, set up fixedly inhomogeneous field, come the correction deflector distortion, so that the main lens of electron gun can be than the magnetic deflection field in the more close cathode ray tube of prior art.
Because magnetic deflection field also runs through main lens into electron gun, must have such structure than the electrode of the more close face of main lens, wherein can not be subjected to the collision of electron beam.When electron gun had a plurality of electrodes and adopts the yi word pattern three electron-beam, optimal design of the present invention was such, and the shared single hole of three electron-beam passes through, and the radome that is used for three electron-beam does not exist to be cut apart.Simultaneously, inhomogeneous field comes the electrode of correction deflector distortion to be used for setting up fixedly in magnetic deflection field, it is provided with than the more close face, hole that is formed on the radome bottom, the hole that is formed on the radome bottom is to be used to make electron beam to pass, thereby the current potential of balanced radome and electron gun anode is to thereby the current potential correction deflector of inhomogeneous field electrode distorts in order to set up fixedly in magnetic deflection field, at convergence electrode or the electric field that is used to set up between the adjacent electrode of different potentials of electric field run through, can help to improve the resolution uniformity in zone, whole face.
(35) when the yi word pattern three electron-beam is used as the electron gun with a plurality of electrodes since with the identical reason of operating state (34), the aperture diameter that enlarges electron gun main lens is important.
In order in magnetic deflection field, to set up fixedly inhomogeneous field, thereby correction deflector distortion, according to the present invention, from direction perpendicular to yi word pattern, the electron gun anode surface is to the aperture diameter at the position of main lens, can be set at 0.5 times of the narrowest size in a plurality of apertures or the same with it big, one of adjacent beam in the yi word pattern three electron-beam will be by this hole, thereby help electric field to run through running through between the convergence electrode, promptly have between the different adjacent electrode of current potential, be used to set up electric field, thereby improved the resolution uniformity in whole zone, face.
(36) when the yi word pattern three electron-beam when having the electron gun of a plurality of electrodes, for with the identical reason of operating state (34), it is such that the present invention further helps the optimal design that electric field runs through, and the aperture structure of electron gun main lens comprises the shared electric field of three electron-beam.
(37) among the present invention, in order the yi word pattern three electron-beam to be can be used as have the electron gun of a plurality of electrodes, in magnetic deflection field, set up fixedly inhomogeneous field, the correction deflector distortion, the fixedly inhomogeneous field position of a counter electrode of central authorities in foundation and the three electron-beam, and with same two the corresponding positions of side electron beam, can provide different structures, regulate on the face balance of resolution between the three electron-beam.
In addition, fixedly inhomogeneous field is set up the electrode position corresponding with the both sides of three electron-beam, between central electron beam one side and opposition side of yi word pattern direction, can have different structures, reduces the commatic aberration that is caused by magnetic deflection field with this.
Although above effect to each technology of the present invention illustrates, but wherein two or more can make up and be used for cathode ray tube, improve the whole regional intrinsic resolution uniformity in face with this, with in the cathode current scope, the resolution of face central authorities, and shorten the axial length of cathode ray tube.
In addition, adopt above-mentioned cathode ray tube, a kind of image display apparatus can also be provided, can improve resolution in whole zone, in the cathode current scope, improve the resolution of face central authorities, and have the short degree of depth in the face.
Then, will improve the focus characteristics of cathode ray tube and the mechanism of resolution and describe adopting electron gun of the present invention.
Figure 72 is the generalized section that is equipped with the color cathode ray tube of shadow mask type of I-shaped electron gun.Among Figure 72: reference number 7 is represented neck, and label 8 is funnels, and label 9 is mounted in the electron gun of neck 7, and label 10 is electron beams, and label 11 is deflecting coils, and label 12 is shadow masks, and label 13 is the fluorescent films that form the face, and label 14 is panel (or screens).
In this cathode ray tube, shown in Figure 72, be directed to and pass shadow mask 12 by electron gun 9 electrons emitted bundles, be deflected coil 11 deflection horizontally and vertically simultaneously, make fluorescent film 13 send fluorescence.Being used as image at this fluorescent graphic in panel 14 one side observes.
Figure 73 is the schematic diagram of electron-beam point, and wherein Ping edge is caused luminously by electron-beam point, and this electron-beam point is round shape when the central part of screen.Among Figure 73: reference number 14 representative screens, label 15 is bundle points of screen central part, label 16 is bundle points of screen horizontal direction (being the X-X direction) end, label 17 is a halation, label 18 is bundle points of screen vertical direction (being the Y-Y direction) end, and label 19 is screen bundle points to end, angular direction (being the angular position).
In addition, Figure 74 is the distribution schematic diagram of the magnetic deflection field of cathode ray tube.Letter H represents the distribution of horizontal deflection magnetic field, and alphabetical V represents the distribution of vertical deflection magnetic field.
Regulate in order to simplify to assemble, color cathode ray tube in recent years uses pincushion formula non-uniform magnetic-field to distribute as horizontal deflection magnetic field H, uses barrel-shaped formula non-uniform magnetic-field to distribute as vertical deflection magnetic field V, shown in Figure 74.
The shape of the light launch point that is produced by electron beam 10 is not round in the edge of screen, partly cause is a Distribution of Magnetic Field, partly cause be electron beam 10 central authorities of (or screen) have different tracks with the edge in the face, partly cause is that electron beam 10 favours the edge that fluorescent film 13 strikes screen.
Shown in Figure 73, elongated by level and have halation 17 at the bundle point 16 of horizontal ends, although central point 15 is round.As a result, it is 16 extended that the bundle of horizontal ends is put, and caused soft edge by halation 17, so that resolution descends, and the diagram quality obviously worsens.
In addition, if electron beam 10 is low currents, its perpendicular diameter extremely reduces, and causes that the light by shadow mask 12 vertical intervals disturbs, and the moir phenomenon that occurs is damaged graphical quality thus.
On the other hand, when electron beam 10 was assembled (that is, in vertical direction) up and down, vertical deflection magnetic field caused vertical contraction shape, and the point 18 of phosphor screen vertical end is subjected to the impact of halation 17, damages graphical quality.
The electron-beam point 19 at phosphor screen bight place is as described point 16 horizontal extension, and as described point 18 vertical contractions.In addition, electron beam 10 rotations cause halation 17, and the diameter of light launch point itself is increased, and cause graphical quality badly damaged.
Figure 75 is the electron-optical system schematic diagram that is used to illustrate the electron gun of electron-beam point distortion.For ease of understanding, replace described system with optical system.
Among Figure 75, the screen assembly that the first half occurs is included in vertically in (Y-Y) direction, and the screen assembly of Lower Half appearance is included in level (X-X) direction.
Reference number 20 and 21 expression prefocus lenss; Numeral 22 expression prestage main lenss; Numeral 23 expression main lenss.These lens constitute the electron-optical system of pressing electron gun shown in Figure 72.In addition, the lens that numeral 24 expressions are established by vertical deflection magnetic field, the equivalent lens of numeral 25 expressions, it comprises lens of being established by horizontal deflection magnetic field and the lens that electron beam obviously extended in the horizontal direction with deflection, consequently makes the electron beam oblique fire to fluorescence membrane 13.
At first, electron beam 27 is launched by negative electrode K, and at distance negative electrode l 1The place sets up a crosspoint P at fluoroscopic vertical component between prefocus lens 20 and 21, assembled towards fluorescence membrane 13 by prestage main lens 22 and main lens 23 then.
Electron beam is mapped on the fluorescence membrane 13 by track 28 at the phosphor screen core that is deflected to 0.On the contrary, in fluoroscopic marginal portion, the effect of the lens 24 that caused by vertical deflection magnetic field makes the electron beam of vertical contraction pass track 29, forms a vertical contraction bundle point.In addition, because the distortion of the sphere of main lens 23, before electron beam arrived fluorescence membrane 13, electron beam partly focused on, shown in track 30.This too early focusing makes its halation 17 that has formed the halation 17 of bundle point 18 and formed bundle point 19 in fluoroscopic bight in fluoroscopic vertical end, as shown in Figure 73.
On the other hand, electron beam 31 is launched by negative electrode K, appear at electron beam in the phosphor screen horizontal component as the electron beam in the vertical component of the above 27, at vertical component by prefocus lens 20 and 21, prestage main lens 22 and main lens 23 are assembled, make it act as 0 phosphor screen core by track 32, and be mapped on the fluorescence membrane 13 in magnetic deflection field.
Even in the scope of magnetic deflection field is arranged, electron beam is diverged to along the some shape of the horizontal extension of track 33 by the disperse function of the lens 25 of horizontal deflection magnetic field foundation, but some halation are arranged in the horizontal direction.
But, because the distance between main lens 23 and the fluorescence membrane 13 is greater than the distance of phosphor screen central part office, even horizontal ends part 16 places in the Figure 73 that does not set up the vertical deflection effect, electron beam partly focused at vertical component before arriving fluorescence membrane 13.Thereby produced halation 17.
If, the phosphor screen core of electron-beam point in rotation symmetric lens system forms annular, the rotation symmetric lens system that is constituted makes the lens combination of electron gun become synergic system between horizontal direction and the vertical direction, electron-beam point shape in the phosphor screen marginal portion is distorted, and causes that graphical quality is badly damaged.
Figure 76 suppresses the device schematic diagram that graphical quality damages in the phosphor screen marginal portion shown in Figure 75.With part identical among Figure 75 with identical numerical reference.
Shown in Figure 76, the converging action of the main lens 23-1 in the phosphor screen vertical partly (Y-Y) is weaker than the converging action of the main lens 23 in the level part (X-X).Even consequently, the electron beam orbit of electron beam after passing the lens of being set up by vertical deflection magnetic field 24 be expressed as 29, this just can not cause with reference to the vertical deflation error of the described the sort of terminal of Figure 73, can not cause halation.Yet the track 28 of phosphor screen central part office drifts about on this direction, thereby strengthens the spot diameter of electron beam.
Figure 77 is when the lens combination that adopts shown in Figure 76, and the schematic diagram of the shape of electron-beam point on face 14 is described.Bundle in horizontal ends is put 16 places, and the bundle of vertical end is put the bundle in 18 places and bight and put 19 places, and promptly the halation at the bundle point place of phosphor screen marginal portion is suppressed, and the resolution at these part places is improved.
But because the bundle point 15 of phosphor screen core, its vertical point footpath dy is greater than level point footpath dx, and therefore, vertical resolution descends.
Because in the asymmetric electric field system of rotation, therefore the converging action difference of main lens 23 between phosphor screen vertical direction and horizontal direction, can not improve whole fluoroscopic resolution basically simultaneously with the asymmetric electric field system of rotation.
Figure 78 is the electron-optical system schematic diagram of electron gun, and this system does not constitute the lens strength of the asymmetric main lens 23 of rotation, but it has prefocus lens 21 lens strength of (X-X) increase in the horizontal direction.Make the intensity of horizontal prefocus lens 21-1 of the image usefulness of crossovers P be higher than the intensity of vertical prefocus lens, increase the incidence angle that electron beam 31 is mapped to prestage main lens 22, thereby increase the method for the beam diameter that passes main lens 23, the electron-beam point diameter of the fluorescence membrane 13 that is included in the horizontal aspect is reduced.But the electron beam orbit in the phosphor screen vertical direction is with identical shown in Figure 75, and therefore, it does not influence the inhibitory action to halation 28.
Figure 79 is an electron gun optical system schematic diagram, is to have increased the halation inhibitory action to structure shown in Figure 77 in this system.Set prestage main lens increased the lens strength of vertical direction (Y-Y), and shown in 22-1, the vertical electron beam orbit of main lens 23 is near optical axis, forms to have the focusing system of depth of focus, being difficult to that halation becomes discovered, thereby improved resolution.
Figure 80 is the schematic diagram of the electron-beam point shape on the explanation phosphor screen 14 when adopting the lens combination of structure shown in Figure 79.Can find, on whole phosphor screen, obtain the fabulous resolution of no halation, shown in bundle point 15,16,18 and 19.
The explanation of being done so far is at having higher electric current (promptly when electron beam, in the big current range) the electron beam configuration, yet, when electron beam has low current (in low current range), the track that electron beam passes through is the axle of close focusing system only, make the level and the difference between the vertical lens intensity of lens 21,22 with large aperture and 23 influenced very little.As showing in 34,35,36 and 37 places among Figure 80, the bundle point of phosphor screen core (at 34 places) is annular, and (at 35,36 places) bundle point level prolongs in the phosphor screen marginal portion, or the prolongation sideling of (at 37 places) bundle point, cause the moir phenomenon.Therefore, the increase resolution with bundle point trans D (or horizontal diameter) descends.
In order to address this is that, must to handle with lens, and lens position is become to make near the asymmetric axle that influences focusing system of the rotation of lens strength with little aperture.
Figure 81 is the electron gun optical system schematic diagram of explanation low current electron beam orbit.In this case, from negative electrode K to crosspoint P apart from l 2Than same among Figure 75 apart from l 1More near negative electrode K.
Figure 82 is the optical system schematic diagram of electron gun, and in this case, the lens strength of divergent lens side edge increases in perpendicular to fluoroscopic direction (Y-Y) in the prefocus lens.Increase the vertical intensity of the divergent lens comprise prefocus lens 20, make from negative electrode K to crosspoint P apart from l 3Be longer than described apart from l 2
Consequently, electron beam 27 enters the position of prefocus lens 21, as being included in the vertical component, situation shown in close Figure 81, thereby, lens 21,22-1 and 23 lensing are weakened, and a focusing system with big depth of focus is provided in perpendicular to fluoroscopic direction.
Yet the influence on each lens is not irrelevant fully to high current range and low current range, and therefore, the lensing of prefocus lens 20-1 as in the vertical direction that is included in Figure 82, has influence on the electron-beam point shape of high current range.Therefore, must come the balance whole system with the characteristic of single lens.Particularly, the application of target ray tube, the structure that how to constitute main lens is different, in other words, it is different that what index of image quality is improved preferably.Thereby the intensity of rotating asymmetric lens and some single lens is not unique.
With regard to the application of common cathode ray tube, as mentioned above,, provide lens for improving the resolution in the whole current range, be used for setting up in the high current range and the asymmetric electric field of rotation of the interior different piece of low current range.And the rotation of each lens is asymmetric to be limited in the variation of electric field strength.And, aspect the dependence lens component, increasing if rotate asymmetric electric field strength, beam shapes is extremely distorted, and causes that resolution descends.
Described so far method is to suppress because total method of the focus characteristics decline usefulness that the electron-beam point distortion causes.For this purpose, be example with the electron gun of reality, a example as focus voltage used in the stationary state, as mentioned above, another is as the example of the dynamic feed-in optical focus voltage of using by the position of the deflection angle on the phosphor screen of cathode ray tube.
These two kinds of electron guns have merits and demerits respectively.The electron gun that focus voltage is used in the stationary state have cost low and one present the simple power circuit that focus voltage is used, so its circuit cost is suitable.Though have these advantages, because astigmatic correction makes and can not obtain best focus state on each position on the cathode ray tube screen.Consequently, the bundle spot diameter is greater than the bundle spot diameter of best focus.
On the other hand, the electron gun of using by the position dynamic feed-in optical focus voltage of the deflection angle on the cathode ray tube screen can obtain fabulous focus characteristics on fluoroscopic each position.Though have this advantage, yet, the power circuit complexity that electron gun structure and feed-in focus voltage are used, and the setting focus voltage costs for a long time on the assembly line of television set or display terminal, and cost is improved.
The present invention plans to provide a kind of cathode ray tube, its used electron gun to have above-mentioned two kinds of structure electron guns advantage separately, and has overcome shortcoming, and has the 3rd advantage of the little axial length that above-mentioned two kinds of structures do not possess.
Fig. 1 is the schematic diagram by first embodiment of the deflection distortion bearing calibration of cathode ray tube of the present invention;
Fig. 2 is the schematic diagram by second embodiment of the deflection distortion bearing calibration of cathode ray tube of the present invention;
Fig. 3 is the schematic diagram by the 4th embodiment of the deflection distortion bearing calibration of cathode ray tube of the present invention
Fig. 4 is the schematic diagram by the 5th embodiment of the deflection distortion bearing calibration of cathode ray tube of the present invention
Fig. 5 is the first embodiment sectional view of explanation by cathode ray tube of the present invention;
Fig. 6 is the major part sectional view of explanation by the operating state of cathode ray tube of the present invention;
Fig. 7 is the sectional view that is similar to the major part of Fig. 6, but it has saved the deflection distortion correcting electrode, so that with prior art relatively, the working condition of setting up electrode by deflection distortion correcting electrode or inhomogeneous field in the cathode ray tube of the embodiment of the invention is described;
Fig. 8 is that deflection angle is the illustrative graph figure of the distribution example of magnetic deflection field on axle of 100 degree or bigger cathode ray tube;
Fig. 9 is corresponding to Fig. 8, and the expression magnetic deflection field sets up the key diagram of the position relation of mechanism;
Figure 10 is that deflection angle is 100 degree or less than the illustrative graph figure of the distribution example of magnetic deflection field on axle of the cathode ray tubes of 100 degree;
Figure 11 is corresponding to Figure 10, and the expression magnetic deflection field is set up the key diagram of the position relation of mechanism;
Figure 12 is the perspective view of an example of deflection distortion correcting electrode structure, is used for setting up one and is fixed on magnetic deflection field non-uniform electric field of the present invention;
Figure 13 is by the sectional view of the major part of an example of the electron gun that uses in the cathode ray tube of the present invention;
Figure 14 is the explanation schematic diagram by an example of the electron gun structure that uses in the cathode ray tube of the present invention;
Figure 15 is by the explanation schematic diagram of an example of the electron gun structure that uses in the cathode ray tube of the present invention;
Figure 16 is the major part schematic diagram of explanation deflection distortion correcting electrode structure, and wherein, the present invention is used to adopt the color cathode ray tube of three electron beams by the in-line arrangement;
Figure 17 is the major part schematic diagram of explanation by another example of cathode ray tube of the present invention, and wherein the deflection distortion correcting electrode is used to adopt the color cathode ray tube of three electron beams by the in-line arrangement;
Figure 18 is the major part schematic diagram of another example of explanation deflection distortion correcting electrode structure, and wherein the present invention is applied to adopt the color cathode ray tube of three electron beams by the yi word pattern arrangement;
Figure 19 is the schematic diagram that is similar to Figure 18, but shown major part is another example in order to explanation deflection distortion correcting electrode structure, and wherein the present invention is used to adopt the color cathode ray tube of three electron beams by the in-line arrangement;
Figure 20 is the key diagram of an example that the electron gun structure of deflection distortion correcting electrode is housed;
Figure 21 is the key diagram of another example of the deflection distortion correcting electrode structure in the electron gun that uses in the cathode ray tube of the present invention;
Figure 22 is the key diagram of another example of the deflection distortion correcting electrode structure in the electron gun that uses in the cathode ray tube of the present invention;
Figure 23 is the key diagram of another the other example of deflection distortion correcting electrode structure in the electron gun that uses in the cathode ray tube of the present invention;
Figure 24 is the key diagram of the another example of the deflection distortion correcting electrode structure in the electron gun that uses in the cathode ray tube of the present invention;
Figure 25 is the key diagram of another example of the deflection distortion correcting electrode structure in the electron gun that uses in the cathode ray tube of the present invention;
Figure 26 is the key diagram of another example of the deflection distortion correcting electrode structure in the electron gun that uses in the cathode ray tube of the present invention;
Figure 27 is the key diagram of another example of the deflection distortion correcting electrode structure in the electron gun that uses in the cathode ray tube of the present invention;
Figure 28 is the key diagram of another example of the deflection distortion correcting electrode structure in the electron gun that uses in the cathode ray tube of the present invention;
Figure 29 is the key diagram of space charge to the repulsive interaction of the electron beam between main lens and the fluorescence membrane;
Figure 30 is electron-beam point size on the fluorescence membrane and the graph of relation between the distance between main lens and the fluorescence lens;
Figure 31 is the sectional view of explanation by the size example of an embodiment of cathode ray tube of the present invention;
Figure 32 is and sectional view by the embodiment size example of cathode ray tube of the present invention prior art cathode ray tube relatively;
Figure 33 is the schematic diagram by the major part of an embodiment of cathode ray tube of the present invention;
Figure 34 is the schematic diagram by the major part of another embodiment of cathode ray tube of the present invention;
Figure 35 is the length L of neck in the deflecting coil position and the graph of relation between the jugular temperature T;
Figure 36 is the example end view of explanation by the detailed structure of the electron gun that uses in the cathode ray tube of the present invention;
Figure 37 is the end view of expression by the part disconnection of the major part of the detailed structure of the electron gun that uses in the cathode ray tube of the present invention;
Figure 38 is the explanation schematic diagram of various examples of special construction of deflection distortion correcting electrode that is arranged in the magnetic field of deflecting coil, and when being deflected in the magnetic field of electron beam at deflecting coil, this deflection distortion correcting electrode controlling electron beam is by the convergence situation of deflection angle;
Figure 39 is the explanation schematic diagram of various embodiment of special construction of deflection distortion correcting electrode that is arranged in the magnetic field of deflecting coil, when being deflected in the magnetic field of electron beam at deflecting coil, this deflection distortion correcting electrode controlling electron beam is by the convergence situation of deflection angle;
Figure 40 is the explanation schematic diagram of various examples of special construction of deflection distortion correcting electrode that is arranged in the magnetic field of deflecting coil, and when being deflected in the magnetic field of electron beam at deflecting coil, this deflection distortion correcting electrode controlling electron beam is by the convergence situation of deflection angle;
Figure 41 is the explanation schematic diagram of various examples of special construction of deflection distortion correcting electrode that is arranged in the magnetic field of deflecting coil, when being deflected in the magnetic field of electron beam at deflecting coil, this deflection distortion correcting electrode is used for the convergence situation of controlling electron beam by deflection angle;
Figure 42 is the explanation schematic diagram of various examples of special construction of deflection distortion correcting electrode that is arranged in the magnetic field of deflecting coil, and when being deflected in the magnetic field of electron beam at deflecting coil, this deflection distortion correcting electrode controlling electron beam is by the convergence situation of deflection angle;
Figure 43 is the explanation schematic diagram of the various examples of deflection distortion correcting electrode structure, in this case, the deflection distortion correcting electrode is for the fixedly non-uniform electric field in the magnetic field that is based upon deflecting coil, and when producing deflection by coil magnetic field, for the deflection distortion according to deflection angle correcting electronic bundle, it is not connected with anode but supplies with an electromotive force lower than anode electromotive force;
Figure 44 is the explanation schematic diagram of various examples of the structure of deflection distortion correcting electrode, in this case, the deflection distortion correcting electrode is in order to set up fixing non-uniform electric field in the magnetic field of deflecting coil, and for when electron beam during by the magnetic core logical circuit deflection of deflecting coil, by the deflection distortion of deflection angle correcting electronic bundle, be not connected but supply with the electromotive force lower than anode electromotive force with anode;
Figure 45 is the explanation schematic diagram of the various examples of deflection distortion correcting electrode structure, in this case, the deflection distortion correcting electrode is for the non-uniform electric field in the magnetic field of setting up fixing not deflecting coil, and for when electron beam during by the magnetic core logical circuit deflection of deflecting coil, by the deflection distortion of deflection angle correcting electronic bundle, be not connected but supply with the electromotive force lower than anode electromotive force with anode;
Figure 46 is the explanation schematic diagram of the various examples of deflection distortion correcting electrode structure, in this case, the deflection distortion correcting electrode is in order to set up the non-uniform electric field in the magnetic field that is fixed on deflecting coil, and for when electron beam during by the magnetic core logical circuit deflection of deflecting coil, by the deflection distortion of deflection angle correcting electronic bundle, be not connected but supply with the electromotive force lower than anode electromotive force with anode;
Figure 47 is the explanation schematic diagram of the various examples of deflection distortion correcting electrode structure, in this case, the deflection distortion correcting electrode is in order to set up the non-uniform electric field in the magnetic field that is fixed on deflecting coil, and for when electron beam during by the magnetic core logical circuit deflection of deflecting coil, by the deflection distortion of deflection angle correcting electronic bundle, be not connected but supply with the electromotive force lower than anode electromotive force with anode;
Figure 48 is the explanation schematic diagram of the various examples of deflection distortion correcting electrode structure, in this case, the deflection distortion correcting electrode is in order to set up the non-uniform electric field in the magnetic field that is fixed on deflecting coil, and for when electron beam during by the magnetic core logical circuit deflection of deflecting coil, by the deflection distortion of deflection angle correcting electronic bundle, be not connected but supply with the electromotive force lower than anode electromotive force with anode;
Figure 49 is the explanation schematic diagram of the various examples of deflection distortion correcting electrode structure, in this case, the deflection distortion correcting electrode is in order to set up the non-uniform electric field in the magnetic field that is fixed on deflecting coil, and for when electron beam during by the magnetic core logical circuit deflection of deflecting coil, by the deflection distortion of deflection angle correcting electronic bundle, be not connected but supply with the electromotive force lower than anode electromotive force with anode;
Figure 50 is the explanation schematic diagram of the various examples of deflection distortion correcting electrode structure, in this case, the deflection distortion correcting electrode is in order to set up the non-uniform electric field in the magnetic field that is fixed on deflecting coil, and for when electron beam during by the magnetic core logical circuit deflection of deflecting coil, by the deflection distortion of deflection angle correcting electronic bundle, be not connected but supply with the electromotive force lower than anode electromotive force with anode;
Figure 51 is the sectional view of explanation by an example of the basic structure of the electron gun of electrode structure of the present invention;
Figure 52 is the sectional view of explanation by an example of the basic structure of the electron gun of electrode structure of the present invention;
Figure 53 is the sectional view of explanation by an example of the basic structure of the electron gun of electrode structure of the present invention;
Figure 54 is the sectional view of explanation by an example of the basic structure of the electron gun of electrode structure of the present invention;
Figure 55 is the sectional view of explanation by an example of the basic structure of the electron gun of electrode structure of the present invention;
Figure 56 is the sectional view of explanation by an example of the basic structure of the electron gun of electrode structure of the present invention;
Figure 57 is the schematic diagram of explanation by another electron gun structure of the present invention;
Figure 58 is the detailed structure explanation schematic diagram of second electrode shown in Figure 57;
Figure 59 is the detailed structure explanation schematic diagram of third electrode shown in Figure 57;
Figure 60 is the detailed structure explanation schematic diagram of the 4th electrode shown in Figure 57;
Figure 61 is the sectional view of the major part of the used electron gun structure of the explanation color cathode ray tube that adopts three electron beams to become in-line to arrange;
Figure 62 is the schematic diagram of an electrode structure that comprises the main lens of electron gun;
Figure 63 is the schematic diagram of another electrode structure that comprises the main lens of electron gun;
Figure 64 is the explanation schematic diagram of another example of the deflection distortion correcting electrode in cathode ray tube of the present invention;
Figure 65 is the example size key diagram relatively of example size and the image apparatus of the cathode ray tube that adopts prior art that adopts the image display apparatus of cathode ray tube of the present invention;
Figure 66 is the curve chart that concerns between explanation amount of deflection and the deflection distortion amount;
Figure 67 is the curve chart that concerns between explanation amount of deflection and the deflection distortion amount;
Figure 68 is the schematic diagram of the focusing situation of explanation electron beam on fluorescence membrane;
Figure 69 is the key diagram that forms the scan line that constitutes in the planar section of cathode ray fluorescent surface;
Figure 70 is the example key diagram that forms the deflection distortion correcting electrode structure that fixing non-uniform electric field uses;
Figure 71 is an allocation plan of setting up garden cylindrical electrode that fixing non-uniform electric field uses and parallel plate electrode;
Figure 72 is the sectional view that the shadow mask type color cathode ray tube of in line gun is installed;
Figure 73 is the explanation schematic diagram that the electron-beam point in the phosphor screen marginal portion that the fluorescence of garden annular electron beam point causes is arranged at the phosphor screen core;
Figure 74 is the configuration diagram of the magnetic deflection field of cathode ray tube;
Figure 75 is the electron-optical system diagrammatic sketch of the electron gun of explanation electron-beam point distortion usefulness;
Figure 76 is the device diagrammatic sketch of damage usefulness that suppresses the image quality of the phosphor screen marginal portion shown in Figure 75;
Figure 77 is the diagrammatic sketch that the electron-beam point shape on the face of adopting the lens combination shown in Figure 76 is described;
Figure 78 is the electron-optical system diagrammatic sketch of electron gun, and it is asymmetric that it is provided with the rotation that is formed by its main lens intensity, but its prefocus lens intensity in a horizontal direction (X-X) be increased;
Figure 79 is the electron-optical system schematic diagram of electron gun, among this figure is to add the corona inhibitory action on the structure shown in Figure 77;
Figure 80 is the electron-beam point shape key diagram on the phosphor screen of lens combination when having adopted structure shown in Figure 79;
Figure 81 is the schematic diagram that is illustrated as the electron gun optical system that the electron beam orbit of low current uses;
Figure 82 shows that the lens strength on divergent lens one side in the prefocus lens is increased the electron gun optical system diagrammatic sketch of situation in vertical (Y-Y) direction of phosphor screen;
Figure 83 is the end view of general structure of the electron gun of explanation cathode-ray tube;
Figure 84 is the part sectioned view of the major part of electron beam shown in Figure 83;
Figure 85 is the sectional view of the major part that compares in order to the electron gun structure relevant with how supplying with focus voltage; With
Figure 86 is a curve chart of supplying with the focusing electromotive force of the electron gun shown in Figure 85.
Describe invention in detail below in conjunction with inventive embodiment and referring to relevant accompanying drawing.
The deviation distortion that increases cathode ray tube along with deflection is increased sharply, as described referring to Figure 66.
The present invention plans to make a suitable electron-beam convergence and is used for improving the resolution uniformity on the face, its method is that when electron beam was deflected, its track can change, the convergence and the emission effect of electron beam are changed, thereby set up a non-uniform electric field that is arranged in magnetic deflection field.
The present invention also attempts to proofread and correct the deflection distortion of increasing sharply with deflection, shown in Figure 66, the method that adopts is, when electron beam is deflected, its orbit transfer makes it proofread and correct with the deflection distortion of deflection and quickens, and forms a non-uniform electric field that is positioned at magnetic deflection field, make and on whole face, might cause suitable electron-beam convergence effect, as described referring to Figure 67.This just might improve in the resolution uniformity on the whole face.
Electric field with astigmatism be arranged in magnetic deflection field, the non-uniform electric field that the convergence of electron beam or disperse function are suitably quickened with deflection is effective equally.
Electric field with astigmatism is to be made of the electric field with two quadrature symmetrical planes.Have more than big distance convergence or disperse function increase to the symmetrical plane end with the center.
Fig. 1 is the figure that illustrates by first embodiment of the deflection distortion bearing calibration of cathode ray tube of the present invention, and has demonstrated an example of astigmatism Electric Field Distribution, and electron beam wherein has disperse function on a plane of symmetry.
Reference number 61 expression equipotential lines among Fig. 1, the electron beam at electric field center is passed in numeral 62 expressions, and the electron beam away from the electric field core is passed in numeral 63 expressions.Therefore, Fig. 1 electron beam 62 of having drawn the center of passing the electric field of setting up by equipotential line 61 and the contrast situation of passing away from the electron beam 63 of the part at electric field center.
Say on the whole, pass away from the diversity of the electron beam 63 of electric field core and leap the diversity that the most electron beam 62 in the electric field has and reach the electric field end greater than passing the electric field core.Change greatly by electric field end track more nearby in addition.
This is because from the long distance of electric field symmetry axis Z-Z, the interval between the equipotential line 61 narrows down.When such non-uniform electric field is based upon in the magnetic deflection field, during the orbit transfer of the electron beam that is deflected, electron beam can quicken its disperse function according to this deflection, with the correction deflector distortion, strengthens the convergence of electron beam in this case.
In cathode ray tube, for example, the distance from the electron beam main lens to the face in face edge always than fluorescent surface center director, shown in Figure 68.If electron beam is assembled by the best in fluorescent surface center, even without the converging action of magnetic deflection field, also over convergence can appear at the edge of face.
In the present embodiment, disperse function increases with the increase of the deflection of stationary electric field foundation.As shown in Figure 1, in magnetic deflection field, can finish deflection distortion and proofread and correct, shown in Figure 67.
Fig. 2 has drawn by second embodiment of cathode ray tube deflection distortion bearing calibration of the present invention, has demonstrated an example of astigmatism electric field, and electron beam wherein has converging action on a symmetrical plane.
The situation and the situation of passing that have compared the electron beam 62 that passes the electric field center of setting up by equipotential line 61 among Fig. 2 away from the electron beam 63 at electric field center.
The electron beam 63 that passes apart from electric field center certain distance part need have bigger convergence than the electron beam 62 that passes the electric field center, when it advances in electric field, and its whole rail trend electric field center.And relatively the track of locating near one side of electric field end changes force greatly.This is because the spacing of working as between the big more equipotential line 61 in the symmetry axis Z-Z place of electric field is narrow more.
Consider the such non-uniform electric field of formation in magnetic deflection field, deflection beam is to its orbit transfer.Then, according to deflection, but the accelerated electron beam converging action, with the correction deflector distortion, in this case, deflection distortion has strengthened dispersing of electron beam.
Can make the deflection of cathode ray tube often effective with the electron beam lines scan method, shown in Figure 69.This linear scan track 60 is called " scan line ".Magnetic deflection field in scan-line direction usually is different with the magnetic deflection field in vertical direction.
The fixedly non-uniform electric field that forms in the magnetic deflection field plays electron beam before the significant role, is acted in the scan-line direction and usually be different in vertical direction by at least one electron-beam convergence that causes in described a plurality of electron gun electrodes.
And according to the application of cathode ray tube, the weighting between deflection distortion that scan-line direction is emphasized and the deflection distortion of being emphasized in the direction perpendicular to scan line is different.For correction deflector distorts to improve the uniformity of the resolution on the whole face, therefore, the amount of the constant aberration electric field that forms in the magnetic deflection field is uneven.Understand fully and tackle the content that the situation of each relevant art content need be proofreaied and correct, to the characteristic of improving image display device with realize that low cost is very important, according to orientation and calibration substance and correction quantity corresponding to scan-line direction, required cost is always not identical.
The 3rd embodiment according to the deflection distortion bearing calibration of cathode ray tube of the present invention sets up non-uniform electric field, as depicted in figs. 1 and 2, influences the deflection distortion in scan-line direction and the direction vertical with scan line in magnetic deflection field.
In the color cathode ray tube, three electron beams that have in-line to arrange in the horizontal direction, with the vertical deflection magnetic field is example, the employing barrel field distributes, otherwise, be example with the horizontal deflection magnetic field, the Distribution of Magnetic Field that adopts pincushion to form, shown in Figure 74, so that simplify the circuit of the density of three electron beams of control on the face.
Three electron beams that become in-line to arrange, the electron beam on both sides with the size of vertical deflection magnetic field and the deflection distortion of receiving different amounts with the vertical deflection magnetic field of horizontal deflection directional correlation.For example, the Distribution of Magnetic Field of two magnetic deflection fields of being passed between two kinds of situations is different, sees cathode ray tube from the face, and the right electron beam of in-line row's electron beam is to change towards the left side of face and right avertence, so the size of deflection distortion is also different.Image quality difference on the left and right corner of face.With regard to the deflection distortion of the both sides electron beam of this situation was proofreaied and correct, it was effective forming the intelligent image difference electric field that is fixed in the magnetic deflection field.There is the electric field of intelligent image difference to have only a symmetrical plane.
Fig. 3 shows the 4th embodiment according to the deflection distortion bearing calibration of cathode ray tube of the present invention, and shows an example of the intelligent image difference electric field that the electron beam divergence effect is arranged on symmetrical plane.
Among Fig. 3, there is the electron beam 63-2 of the part of certain distance to compare with passing apart from the electric field center to the electron beam 62 that passes the electric field center of setting up by equipotential line 61.This comparison shows that, pass the electron beam 63-2 that the certain distance part is arranged apart from the electric field center, when electron beam 63-2 advanced in electric field, the emittance of electron beam 63-2 was greater than passing electric field center and its whole tracks divergence near the electron beam 62 of electric field end.And, change higher at track near place, electric field end.This be because from the spacing of the equipotential line 61 of the longer distance of symmetry axis Z-Z become narrower.
Pass the electron beam 63-3 apart from electric field center certain distance part, when it advanced in electric field, the divergence that electron beam 63-3 has was also as electron beam 63-2, and greater than the divergence of electron beam 62, and its whole tracks are near the end of electric field.And, also higher near the variation of the track on the side of electric field end, but rate of change is lower than the track rate of change of electron beam 63-2.
This is because even in the long distance of distance symmetry axis Z-Z, the spacing between the equipotential line 61 do not become so narrow yet.When this non-uniform electric field is based upon in the magnetic deflection field when electron beam produced deflection, change same track simultaneously, different to the acceleration of the emission effect of electron beam with yawing moment.Therefore, it is that distortion changes the correction of being done with yawing moment to converging action situation deflect that the deflection distortion of being done is proofreaied and correct.In fact, because deflection distortion proofreaies and correct with the structure of the cathode-ray tube structure that comprises maximum deflection angle, the magnetic deflection field generator that made up, it is relevant to set up the electrode that non-uniform electric field uses, the electron gun structure except that non-uniform electric field is set up electrode, the drive condition of cathode ray tube, the application of cathode ray tube or the like factor, therefore, the deflection distortion correction is inconsistent.
Fig. 4 shows the 5th embodiment by the deflection distortion bearing calibration of cathode ray tube of the present invention, and shows an example of the intelligent image difference electric field that the electron-beam convergence effect is arranged on symmetrical plane.Among the figure state of the electron beam 62 that passes the electric field center of being set up by equipotential line 61 is compared with passing apart from the electron beam 63-4 of electric field center certain distance part and the state of 63-5.
The convergence that electron beam 63-4 is had is higher than the convergence of electron beam 62, and when it advances in electric field, and its whole rail is near the electric field center.And, change higher at the track of locating near one side of electric field end.This be because apart from the spacing between the equipotential line of the big distance of the symmetry axis Z-Z of electric field become narrower.Pass electron beam 63-5 apart from electric field center certain distance part also as electron beam 63-4, the convergence that has is greater than the convergence of electron beam 62, and when it advances in electric field, and its whole rail is near the center of electric field end.And, change higher at the track of locating near one side of electric field end; But rate of change is lower than the track rate of change of electron beam 63-4.This be because, so little even the spacing between the equipotential line 61 of distance electric field symmetry axis Z-Z a distance also can not become.
When such non-uniform electric field is based upon in the magnetic deflection field deflection beam, and when changing same track, the acceleration meeting of electron-beam convergence effect is different because of yawing moment.Therefore, formed deflection distortion correction is to disperse function situation deflect distortion different deflection distortions corrections of being done with yawing moment.In fact, because deflection distortion and the structure that includes the cathode ray tube of maximum deflection angle, with the structure of the deflection magnetic field generating device that made up, set up the electrode that non-uniform electric field is used, except that setting up non-uniform electric field with the electron gun structure the electrode, the drive condition of cathode ray tube, the application of cathode ray tube or the like factor is relevant, and therefore, it is inconsistent that deflection distortion is proofreaied and correct.
In the color cathode ray tube, three electron beams that have in-line to arrange in the horizontal direction, with the vertical deflection magnetic field is example, the employing barrel field distributes, on the contrary, be example with the horizontal deflection magnetic field, the Distribution of Magnetic Field that adopts pincushion to form, shown in Figure 74, so that simplify the circuit of the density of three electron beams of control on the face.
In this color cathode ray tube, the in-line orientation, promptly described horizontal direction is a scan-line direction.In three electron beams that in-line is arranged, the electron beam of two sides is to accept the deflection distortion of different amounts with the size of vertical deflection magnetic field and the vertical deflection magnetic field relevant with the direction of horizontal deflection.For example, the Distribution of Magnetic Field difference of passing through magnetic deflection field between two kinds of situations, when when cathode ray tube is seen in the face, the electron beam on in-line the right is towards a left side and the right deflection of face, thereby, the varying in size of deflection distortion.In another embodiment of the present invention, formed intelligent shape distortion electric field, shown in Fig. 3 or 4, as the electron beam of two sides of three electron beams arranging corresponding to in-line, be fixed on the inhomogeneous field in the magnetic deflection field, correction deflector distortion in described scan-line direction.In fact, because deflection distortion is proofreaied and correct and the structure that includes the cathode ray tube of maximum deflection angle, the structure of the deflection magnetic field generating device that combines with institute, with set up the electrode that non-uniform electric field is used, with the electron gun structure except that non-uniform electric field is set up electrode, the drive condition of cathode ray tube, application of cathode ray tube or the like factor is relevant, therefore, the deflection distortion correction is inconsistent.
Fig. 5 is the sectional view of explanation by first embodiment of cathode ray tube of the present invention.Reference number 1 is meant first electrode (G1) of electron beam; Numeral 2 is meant second electrode (G2); Numeral 3 focusing electrodes that are meant in third electrode (G3) or the present embodiment.Numeral 4 anodes that are meant in the 4th electrode (G4) or the present embodiment.Numeral 7 is meant the neck of the cathode ray tube that holds electron gun; Numeral 8 is meant funnel part; Numeral 14 is meant the screen board part.These three unit constructions constitute the vacuum bubbles of cathode ray tube.
And reference number 10 is meant an electron beam of electron gun emission.This electron beam 10 passes the aperture of shadow mask 12 and incides on the fluorescence membrane 13 on the inner surface that is formed on screen board 14, and fluorescence membrane 13 is fluoresced, and to realize the demonstration on the cathode ray tube screen, numeral 11 is meant the deflecting coil of deflection beam 10 usefulness.This deflecting coil 11 is set up a magnetic field synchronously with vision signal, and in order to controlling electron beam, and controlling electron beam 10 incides the position on the fluorescence membrane 13.
By the way, reference number 38 is meant the main lens of electron gun, from negative electrode K electrons emitted bundle 10, passes first electrode (G1), 1, the second electrode (G2) 2, and third electrode (G3) 3 back electric fields by main lens 38 make it to focus on face 13.
And, reference number 39 is meant an electrode that is arranged in the magnetic field of deflecting coil 11, this electrode is used to set up a non-uniform electric field, when the magnetic field that this electron beam 10 is deflected coil 11 makes its deflection by deflection angle, with the deflection distortion of non-uniform electric field correcting electronic bundle 10.
In the present embodiment, deflection distortion correcting electrode 39 electrically and mechanically is fixed on the anode 4, and electrode 39 comprises two parts, i.e. the upper and lower, when it is included on the vertical direction of electron beam 10, to set up a non-uniform electric field that dispersing of electron beam 10 worked.Attach and say one, numeral 40 is meant that electron gun electrodes is connected the lead-in wire of usefulness with the pin (not shown).
Among Fig. 5, while the gap between two elements of the deflection distortion correcting electrode of locating 39 of fluorescence membrane 13 is a bit larger tham it in gap that anode 4 is located.In fact, the angle of dispersing is because the combination of the installation site of two elements, towards the development length of fluorescence membrane 13, the distribution of magnetic deflection field, pass the diameter of two electron beams between the element, the decision of the maximum deflection angle of cathode ray tube or the like factor, the angle of therefore, dispersing is inconsistent.
In the present embodiment, as shown in, provided the main lens 38 of electron gun, when residing position than the more close fluorescence membrane 13 in the installation site of the deflecting coil in the magnetic deflection field of deflecting coil 11 11, but, when if main lens 38 is in the magnetic field range of deflecting coil, the restriction of position shown in the position of main lens 38 will not be subjected to.
Fig. 6 is the sectional view by the major part of cathode ray tube of the present invention, in order to the work of explanation by cathode ray tube of the present invention.Fig. 6 describes the example of effect of the deflection distortion correcting electrode 39 in the magnetic field that is arranged in deflecting coil shown in Figure 5 11 in detail, electrode 39 is used to set up a non-uniform electric field, when this electron beam 10 is deflected by deflection angle by the magnetic field of deflecting coil 11, the deflection distortion of non-uniform electric field correcting electronic bundle 10.
In this example, non-uniform electric field is also dispersed electron beam 10 and is worked.Indicate with identical reference number with the part that has identical function among Fig. 1.In addition, numeral 38 is meant main lens; Numeral 41 refers to the partial electrode of the part of formation the 4th electric field (G4) 4; Character L 2Refer to the distance between main lens and the deflection center.
On the other hand, Fig. 7 is the sectional view that is similar to major part shown in Figure 6, and still, Fig. 7 has saved deflection distortion correcting electrode 39, be used for illustrating by the deflection distortion correcting electrode 39 or the non-uniform electric field of the cathode ray tube of embodiments of the invention and set up electrode, compared with the prior art.
Among Fig. 6 and Fig. 7, having passed the electron beam 10 of third electrode (G3) 3 is assembled by main lens 38, lens 38 are formed between third electrode (G3) 3 and the 4th electrode (G4) 4, if electron beam 10 is not deflected the magnetic deflection field deflection (at fluoroscopic core) that coil 11 is set up, electron beam 10 will be allowed to straight line and pass main lens, and the diameter that is focused on the fluorescence membrane 13 up to electron beam is D 2Electron-beam point.
Here, to illustrate qualitatively at electron beam 10 under the situation of fluorescence membrane 13 top deflections, how the track of electron beam 10 changes (as shown in Figure 6) and electron beam 10 as why not changes (as shown in Figure 7) with deflection distortion correcting electrode 30 with deflection distortion correcting electrode 30.
Among Fig. 7, the existence of deflection distortion correcting electrode 39 is whether to the not influence of outside track of the bottom of electron beam 10, but the bottom outer ring track of electron beam 10 moves on, as 10 DShown in.Yet because deflection distortion correcting electrode 39 is inoperative, the outside track on top continues to advance, as 10 UShown in, and before reaching fluorescence membrane 13 with the outer garden circular orbit 10 of bottom DIntersect.Consequently, forming diameter on fluorescence membrane 13 is D 2Point, as shown in Figure 7.
Otherwise if deflection distortion correcting electrode 39 works, as shown in Figure 6, under the attraction force acts of deflection distortion correcting electrode 39, the rail portion of electron beam is positioned at the top, moves on, as 10 U' indicated.On the other hand, because the little influence of deflection distortion correcting electrode 39 when the rail portion of electron beam is positioned at bottom, continues, as among Fig. 6 10 DIndicated, and before arriving fluorescent film, track 10 DNot with track 10 U' intersect and reach fluorescence membrane 13.As a result, on fluorescence membrane 13, form diameter less than described diameter D 2Diameter be D 3The point.This is because formed described non-uniform electric field, shown in Figure 71.
The locational diameter of each of fluorescence membrane 13 is D 3The distribution of electron-beam point can be optimized, its method is, the installation site of two elements of combination deflection distortion correcting electrode 39, prolong towards fluorescence membrane 13, the distribution of magnetic deflection field is passed two beam diameters between the element, maximum deflection angle of cathode ray tube or the like, thereby, reduce the electron-beam point diameter D of phosphor screen core 1Difference can on whole phosphor screen, obtain uniform resolution.
As a result, press present embodiment, can be following synchronously with deflection angle, (or phosphor screen) control focus state on fluorescence membrane need not synchronously to supply with any dynamic electronic position to any electrode of electron gun with electron beam deflection angle.Therefore, may be provided on the whole phosphor screen and have uniformity, suitable cathode ray tube on price.In fact, because depending on, these conditions comprise maximum deflection angle, the structure of the deflection magnetic field generating device that is made up, set up the electrode that non-uniform electric field is used, electron gun structure except that non-uniform electric field is set up electrode, the drive condition of cathode ray tube, the cathode-ray tube structure of application of cathode ray tube or the like factor, therefore, these conditions are inconsistent.
In order to improve the whole uniformity of fluorescence membrane, by form a fixing non-uniform electric field in magnetic deflection field, electron beam is passed at electron beam orbit also can deflection in the electric field of different electric field strength.Therefore, described non-uniform electric field is subjected to the position relation restriction of magnetic deflection field.
Fig. 8 has the illustrative graph figure that deflection angle is the distribution example of magnetic deflection field on axle of 100 degree or bigger cathode ray tube;
Among Fig. 8, the right is the place, one side that is near the face, and the left side is the place, one side that is in away from the face.On the other hand, Fig. 9 is the key diagram corresponding to Fig. 8, and it shows the position relation that magnetic deflection field is set up mechanism.Letter A represents the position of getting with respect to the Measuring Time in magnetic field; Letter b H is the position with maximum field density that is illustrated in the magnetic field 64 that scan-line direction deflection uses; Letter b V is illustrated in the position with peakflux density in the magnetic field of using perpendicular to the direction deflection of scan line 65; Letter C represents to constitute the end of the magnetic material that the coil magnetic core uses, and described coil is used to set up magnetic deflection field, is positioned at the place, one side away from cathode ray fluorescent surface;
When described distance is maximum, on one side the electrode that the face is located axially having complicated at cathode ray tube.
Figure 10 be have deflection angle be 100 the degree or littler cathode ray tubes, an example curve figure of the distribution of magnetic deflection field on axle.
Among Figure 10, the right is the place, one side that is near the face, and the left side is positioned at the place, one side of leaving the face.On the other hand, Figure 11 is corresponding to the key diagram of Figure 10 and shows the position relation that magnetic deflection field is set up mechanism.Letter A represents the position of being got with respect to the magnetic-field measurement time, letter b H represents in the scan-line direction deflection with the position with peakflux density in magnetic field 64, and letter b V represents to have with magnetic field 65 perpendicular to deflection in the scan-line direction position of peakflux density; Letter C represents to constitute the end of coil magnetic core with magnetic material, and described coil is used to set up magnetic deflection field, is positioned at one side of the face certain distance that leaves cathode ray tube.
Figure 12 is the perspective view that is fixed on the deflection distortion correcting electrode structure that the non-uniform electric field in the magnetic deflection field uses by foundation of the present invention.Deflection distortion correcting electrode 39 among Figure 12 is by constituting at a distance of the metallic plate of two foldings of F each other of opposing parallel.Among Figure 12, D partly is positioned at the one side near the face of cathode ray tube, and E portion is in the one side near the face, thereby if do not set up magnetic deflection field herein, the center of two relative parts can allow the electron beam conduction by herein.
Deflection distortion correcting electrode 39 is to be provided with sideling like that, make relative parts G can be parallel to scan line, and with color cathode ray tube in the anode of electron gun in fact welded together, the outer neck of the neck of color cathode ray tube is 29mm, maximum deflection angle is 108 degree, and the face is of a size of 59cm.
With magnetic deflection field shown in Figure 8 and cathode ray tube combination, the position of 108mm is provided with the D one side line line end of Figure 12 in Z axle shown in Figure 8, and anode voltage 30KV can obtain gratifying result.Set D shown in Figure 12 on one side the magnetic flux density of the position of lead end be 0.0086 milli tesla/ 1 The volt anode voltage.This value is about 33% of peakflux density.Set up the coil distance that magnetic deflection field uses and be about 30mm away from the face from the magnetic core end.Because these conditions depend on the structure of cathode ray tube, it comprises maximum deflection angle, the structure of the deflection magnetic field generating device that is made up, set up the non-uniform electric field electrode, except that inhomogeneous electric figured stone is set up electron gun structure the electrode, the drive condition of cathode ray tube, application of cathode ray tube or the like factor, therefore, these conditions are inconsistent.
On the other hand, it is identical with afore-mentioned that foundation shown in Figure 12 is fixed on the use of deflection distortion correcting electrode in cathode ray tube that the non-uniform electric field in the magnetic deflection field uses, the anodic bonding of the electron gun in it and the color cathode ray tube together, the neck external diameter of color cathode ray tube is 29mm, maximum deflection angle is 90 degree, and the face is of a size of 48cm.
With magnetic deflection field shown in Figure 10 and cathode ray tube combination, the set positions of 70mm D one side lead end shown in Figure 12 in Z axle shown in Figure 10, the anode voltage of employing 30KV can obtain gratifying result.Among Figure 12 the magnetic flux density of the position of D one side lead end be defined as 0.01 the milli tesla/
Figure 941018008_IMG2
The volt anode voltage.This value is the about 50% of peakflux density, and the coil distance of setting up magnetic deflection field is about 13mm from end winding from the face.Because depending on, these conditions comprise maximum deflection angle, the structure of the deflection magnetic field generating device that is made up, be used to set up the electrode of non-uniform electric field, electron gun structure except that non-uniform electric field is set up electrode, the cathode-ray tube structure of the drive condition of cathode ray tube, the application of cathode ray tube or the like factor, therefore, these conditions are inconsistent.
Figure 13 is the sectional view by the major part of an example of the electron gun that uses in the cathode ray tube of the present invention.Cross main lens 38 and arranged an anode 6 in cathode ray tube, anode 6 is positioned near the position of face and a focusing electrode 5, and electrode 5 is positioned at the position of leaving the face.
Among Figure 13, set up the position be fixed on the deflection distortion correcting electrode 39 that the non-uniform electric field in the magnetic deflection field uses, than the more close face of surperficial 6a of the anode 6 of the electron gun relative with main lens 38.
Figure 14 is the sectional view by the major part of an example of the electron gun of using in the cathode ray tube of the present invention.Cross main lens 38, arranged an anode 6 in electron gun, anode 6 is positioned at position and the focusing electrode 5 near the face, and electrode 5 is positioned at the position than anode 6 more close negative electrode K.
Among Figure 14, set up and to be fixed on deflection distortion correcting electrode that the non-uniform electric field in the magnetic deflection field uses and to be positioned at 39 and two positions of 39-2.Wherein, the position 39-2 of deflection distortion correcting electrode faces toward the more close negative electrode of surperficial 6a of main lens 38 than the anode 6 of electron gun.
Figure 15 is the sectional view by the major part of an example of the electron gun that uses in the cathode ray tube of the present invention, and cathode ray tube is an example with a kind of projection cathode ray tube, and the maximum deflection angle that it has is 85 degree or littler.
Among Figure 15, electromagnetism convergence coil 74 is positioned at the outside of neck, than anode 4 more close faces 13.And the surperficial 4a that faces the end of main lens and deflection distortion correcting electrode 39 at distance anode 4 is the L place, is positioned near 13 about 180mm places in the face, is used for setting up the non-uniform electric field that is fixed on magnetic deflection field.The surperficial 4a that faces the anode 4 of main lens 38 is that bore dia is the Cylinder of 30mm.
In the structure of Figure 15, the current potential of fluorescence membrane is formed on resistance film 75 and resistor 76 dividing potential drops on the neck inner surface, to produce the voltage of a feed-in anode 4.Because depending on, condition comprises maximum deflection angle, the structure of the deflection magnetic field generating device that is made up, set up the electrode that non-uniform electric field is used, electron gun structure except that non-uniform electric field is set up electrode, the cathode-ray tube structure of the drive condition of cathode ray tube, the application of cathode ray tube or the like factor, therefore condition is inconsistent accurately.
In the deflection distortion correcting electrode shown in Figure 14, in the face of the surperficial 6a of the electron gun anode 6 of main lens 38 is 100mm to the distance of negative electrode.The surperficial 6a that faces the anode 6 of main lens 38 is that the diameter in garden is the Cylinder of 20mm.Because depending on, these sizes comprise maximum deflection angle, the structure of the deflection magnetic field generating device of institute's combination, set up the electrode that non-uniform electric field is used, except that non-uniform electric field is set up with the electron gun structure the electrode, the cathode-ray tube structure of the drive condition of cathode ray tube, the application of cathode ray tube or the like factor, therefore, these sizes are inconsistent.
Figure 16 is the major part schematic diagram that an example of explanation deflection distortion correcting electrode structure is used, and among the figure, the present invention is used to adopt in-line to arrange the color cathode ray tube of three electron beams.Among Figure 16, (a) expression cross section (b) expression front view.
Among Figure 16, the electron beam 10 deflection magnetic lines of force in the reference number 77 expression in-line orientations.With the part of magnetic material 39-1, be used for setting up the non-uniform electric field that is fixed on magnetic deflection field as deflection distortion correcting electrode 39.The magnetic line of force 77 accumulates near the electron beam 10, promotes the deflecting action of appropriate section.
Figure 17 is the major part diagrammatic sketch that explanation is used by another example of the structure of cathode ray tube of the present invention, and among the figure, the deflection distortion correcting electrode is used for adopting in-line to arrange the color cathode ray tube of three electron beams.Figure 17 (a) represents cross-sectional view, and Fig. 7 (b) expression front view.
Among Figure 17,, do not assemble so the magnetic line of force occurs because described magnetic material 39-1 is being arranged in deflection distortion correcting electrode 39.Comprise maximum deflection angle owing to promote the direction of deflection to depend on, the structure of the deflection magnetic field generating device that is made up, set up the electrode that non-uniform electric field is used, the cathode-ray tube structure of the application of the electron gun structure except that non-uniform electric field is set up electrode, the drive condition of cathode ray tube, cathode ray tube or the like factor, therefore, promote that the direction of deflection is inconsistent.
Figure 18 is the major part diagrammatic sketch that another example of explanation deflection distortion correcting electrode structure is used, and among the figure, the present invention is applied to adopt the color cathode ray tube of three electron beams that in-line arranges.Figure 18 (a) represents cross-sectional view, and Figure 18 (b) expression front view.
Among Figure 18, deflection distortion correcting electrode 39 is porose 78, and its shape should be able to be surrounded electron beam 10.In general, the colorful cathode ray tube in-line is arranged three electron beams, as shown, the scan-line direction that it had is parallel with the in-line orientation of electron beam, therefore, be used for setting up the hole 78 of the deflection distortion correcting electrode 39 of the inhomogeneous electrode that is fixed on magnetic deflection field, as shown, corresponding to scan-line direction.Condition depends on and comprises maximum deflection angle accurately, the structure of the deflection magnetic field generating device that is made up, set up the electrode that non-uniform electric field is used, electron gun structure except that non-uniform electric field is set up electrode, the drive condition of cathode ray tube, the cathode-ray tube structure of the application of cathode ray tube or the like factor, therefore, accurately condition is not consistent.
Figure 19 and Figure 18 are similar, and shown is the major part that another example of explanation deflection distortion correcting electrode structure is used, among the figure, in the color cathode ray tube that the present invention is applied to adopt in-line to arrange three electron beams.Figure 19 (a) represents cross-sectional view, and Figure 19 (b) expression front view.
Among Figure 19, deflection distortion correcting electrode 39 is porose 78, and its shape should be able to be surrounded electron beam 10.In general, adopt in-line to arrange the color cathode ray tube of three-beam electron-beam, as shown in the figure, the scan-line direction that is had is parallel with the orientation of electron beam in-line, therefore, foundation is fixed on the hole 78 of the deflection distortion correcting electrode 39 that the non-uniform electric field in the magnetic deflection field uses, and is as directed, corresponding to the scanning direction.Among Figure 19, be inconsistent at bore dia perpendicular to the hole in the scan-line direction 78, and, in the size L minimum of partly locating in the face of each electron beam.In this embodiment, even in electron beam deflection in the in-line direction, its deflection distortion is proofreaied and correct and is also changed with deflection.In fact, the L size is decided to be 3mm, and deflection distortion correcting electrode 39 is attached on the electron gun, as shown in figure 20.Set in the scan-line direction and the bore dia in the vertical scan line direction,, can obtain gratifying result in the face of the bore dia of the anode surface of the electron gun anode of main lens is 8mm.Because condition depends on and comprises maximum deflection angle accurately, the structure of the deflection magnetic field generating device that is made up, set up the electrode that non-uniform electric field is used, electron gun structure except that non-uniform electric field is set up electrode, the cathode-ray tube structure of the drive condition of cathode ray tube, the application of cathode ray tube or the like factor, therefore, accurately condition is inconsistent.For example, about the size of L, being positioned at the L value that is not in the face of electron beam 10 places can be 0.
Figure 16 in 17 and 18, sets up and is fixed on two deflection distortion correcting electrodes 39 that the non-uniform electric field in the magnetic deflection field is used, and its each electrode all is positioned to across electron beam 10 and toward each other.
In Figure 16, only be to give prominence at direction A in the face of electron beam 10 front end 39-2 relatively partly.On the contrary, in Figure 17, this same section is evenly outstanding.These outstanding materials that not only depend on deflection distortion correcting electrode 39, and, with regard to nonmagnetic substance, also can exist.
In general, as above-mentioned shown in the drawings, the scan-line direction that three electron beams are the color cathode ray tube of in-line is parallel to the in-line direction, thereby, the relative part and the scan-line direction of deflection distortion correcting electrode 39 are consistent, and above-mentioned electrode 39 is used for setting up a fixing inhomogeneous field in magnetic deflection field as shown in the figure.
Figure 20 is a schematic diagram, and the example of a kind of structure of expression electron gun has wherein been installed the deflection distortion correcting electrode.In Figure 17, deflection distortion correcting electrode 39 is attached on the electron gun, and as shown in figure 19, on the direction perpendicular to scan line, the distance L between the outstanding opposed end 39-2 is set at 3mm.At this moment, on direction, be set at 8mm, can reach satisfied effect like this towards the aperture of the electron gun anode of main lens perpendicular to scan line.Concrete condition is different, because these conditions depend on: the cathode-ray tube structure of the structure of the magnetic deflection field generation unit that comprise maximum deflection angle, combines, the electrode of setting up inhomogeneous field, the electron gun structure except that the electrode of setting up inhomogeneous field, the drive condition of cathode ray tube, application of cathode ray tube or the like.
Figure 21 is a schematic diagram, and expression is used for the another kind of structure example of deflection distortion correcting electrode of the electron gun of cathode ray tube of the present invention.In Figure 21, deflection distortion correcting electrode 39 is used for producing fixing inhomogeneous field in magnetic deflection field, and this electrode 39 is connected with the face of cathode ray tube, thereby it is identical with the current potential of face.
The anode 6 of electron gun produces the current potential of face in the cathode ray tube of dividing potential drop by divider resistance 69 and 70.Guide to the outside of cathode ray tube with an end of anode 6 unconnected resistance 70, and ground connection, for example connect the earth, perhaps be connected with another power supply.
Figure 22 is a schematic diagram, still represents the example of another kind of structure of the deflection distortion correcting electrode of the above-mentioned electron gun that is used for cathode ray tube of the present invention.
In this structure, the feed of Figure 22 A passes through a variable resistor ground connection, thereby just can regulate anode voltage in the outside of cathode ray tube.
Yet the voltage supply method among above-mentioned each figure is different.
Figure 23 is a schematic diagram, and expression is used for another structure example of deflection distortion correcting electrode of the electron gun of cathode ray tube of the present invention.
Among Figure 23, be used in magnetic deflection field producing fixedly that the deflection distortion correcting electrode 39 of inhomogeneous field is connected with the face of cathode ray tube, and its current potential is identical with the current potential of face.The anode 6 of electron gun produces the current potential of face in the cathode ray tube by divider resistance 69 and 70 dividing potential drops.Resistance 70 is connected with convergence electrode 5 in the cathode ray tube, and in installing to image display apparatus the time, can regulate with convergence voltage.
Figure 24 is a schematic diagram, and expression is used for another structure example of deflection distortion correcting electrode of the electron gun of cathode ray tube of the present invention.
Among Figure 24, deflection distortion correcting electrode 39 is used for producing fixing inhomogeneous field in magnetic deflection field, and the current potential of being supplied with is identical with the anode of electron gun 6.Because this annexation, therefore, do not need to comprise the special voltage source of deflection distortion correcting electrode 39, and, can be reduced to the low limit of electricity for the consideration of each electrode voltage endurance, thereby simplify the assembly of electron gun.Therefore, can provide a rational cathode ray tube of cost.
Figure 25 is a schematic diagram, and expression is used for another structure example of deflection distortion correcting electrode of the electron gun of cathode ray tube of the present invention.
Among Figure 25, deflection distortion correcting electrode 39 is used for producing fixing inhomogeneous field in magnetic deflection field, the current potential of being supplied with is identical with the anode of electron gun 6, and on the anode 6 except electron beam transmission hole is arranged, also have aperture 71, thereby, be different from the electric field that produces between the electrode of anode 6 at anode 6 and current potential and can pass hole 71, near deflection distortion correcting electrode 39, to control above-mentioned inhomogeneous field.
Because therefore this structure, does not need to comprise the special voltage source of deflection distortion correcting electrode 39, and, can be reduced to bottom line for the consideration of each electrode voltage endurance, thereby simplify the assembling of electron gun, therefore, can provide a rational cathode ray tube of cost.
Figure 26 is a schematic diagram, and expression is used for another structure example of deflection distortion correcting electrode of the electron gun of cathode ray tube of the present invention.Among Figure 26, (a) be schematic diagram, the structure of expression electron gun (b) is the front view of deflection distortion correcting electrode.
In Figure 26, deflection distortion correcting electrode 39 is used in magnetic deflection field producing fixing inhomogeneous field, and the current potential of being supplied with is different from the current potential of the face of the anode 6 of electron gun and cathode ray tube.Because this structure, thereby, can set the current potential of deflection distortion correcting electrode 39 arbitrarily, make the application of electron gun more flexible, bigger to the selection degree of freedom of the cathode ray tube that uses this electron gun.
Figure 27 is a schematic diagram, and expression is used for another structure example of deflection distortion correcting electrode of the electron gun of cathode ray tube of the present invention.Among Figure 27, (a) be schematic diagram, the structure of expression electron gun (b) is the front view of deflection distortion correcting electrode.
In Figure 27, deflection distortion correcting electrode 39 is used for producing fixing inhomogeneous field in magnetic deflection field, and this electrode 39 is arranged on the anode 6 of electron gun, and the current potential of being supplied with is lower than the current potential of anode 6.
In addition, in Figure 27, described lower current potential equals the current potential of convergence electrode 5.
Further, in Figure 27, make the current potential dividing potential drop of being supplied with on the anode 6 in the cathode ray tube, thus convergence electrode 5 is supplied with current potentials by resistance 79 and 80.
Also have, in Figure 27, in order in magnetic deflection field, to form the fixedly current potential of the deflection distortion correcting electrode 39 of inhomogeneous field, can regulate in the outside of cathode ray tube by following method, promptly, that end that is not connected on the convergence electrode 5 of resistance 80 is connected with another power supply of cathode-ray tube outside, perhaps with described that end through a variable resistance after ground connection.Therefore, when cathode ray tube is used for image display apparatus, can save the power supply that convergence voltage is provided, thereby reduce production cost.
Figure 28 is a schematic diagram, and expression is used for another structure example of deflection distortion correcting electrode of the electron gun of cathode ray tube of the present invention.Among Figure 28, (a) be schematic diagram, the structure of expression electron gun (b) is the front view of deflection distortion correcting electrode, (c) is the vertical view of deflection distortion correcting electrode.
In Figure 28, deflection distortion correcting electrode 39 is used for producing fixing inhomogeneous field in magnetic deflection field, and this electrode 39 is arranged in the anode 6 of electron gun, and the current potential of being supplied with is lower than the current potential of anode 6.
And, by resistance 81 and 82, make the current potential dividing potential drop of being supplied with on the anode in the cathode ray tube, produce above-mentioned lower current potential thus.
In addition, in Figure 28, can regulate in the outside of cathode ray tube by following method in magnetic deflection field, forming fixedly the current potential of the deflection distortion correcting electrode 39 of inhomogeneous field, promptly, that end that is not connected on the deflection distortion correcting electrode 39 of resistance 82 is connected with another power supply of cathode-ray tube outside, perhaps with described that end through a variable resistance after ground connection.The current potential of deflection distortion correcting electrode 39 can be adjusted to the current potential near anode 6 at an easy rate.
Figure 29 is a schematic diagram, and how the repulsive force of representation space electric charge influences the electron beam 10 between main lens 38 and the fluorescent film 13.Label L2 represents the distance between main lens 38 and the fluorescent film 13.
In Figure 29, when electron beam 10 is the 4th electrode away from anode 4() time, the current potential of getting anode on every side of electron beam, thus electric field has disappeared basically.In this state, electron beam 10 is before arriving fluorescent film 13, because the caused track variation of the repulsive force effect of space charge increase, so under the converging action of main lens 38, its diameter D 4Be minimum; When electron beam during near fluorescent film 13, its diameter increases to some extent; When arriving fluorescent film 13, its diameter is D 1
Figure 30 is a curve chart, distance between expression main lens and the fluorescent film and the relation between the electron-beam point size on the fluorescent film.When condition one timing that drives cathode ray tube, the distance L between main lens 38 and the fluorescent film 13 is depended in then foregoing effect 2, and diameter D 1Along with distance L 2Increase and increase, as shown in figure 30.
The cathode ray tube used with color television set is example, in case determined maximum deflection angle, distance L then 2Just the phosphor screen size along with cathode ray tube increases and increases.When the phosphor screen size of cathode ray tube increased, the diameter of the electron-beam point on the fluorescent film 13 also increased, and therefore, no matter how many fluoroscopic sizes increases, resolution does not have great raising.
Figure 31 is a schematic cross-sectional view, represents the size of an embodiment of cathode ray tube of the present invention, and Figure 32 is the schematic cross-sectional view of the cathode ray tube of prior art, is used for comparing with an embodiment size of cathode ray tube of the present invention.Represent same part with reference number identical among Fig. 5.
The type of the electron gun that Figure 31 and two cathode ray tubes of 32 are used is identical.Therefore, the distance L from cathode-ray pipe end or stem to main lens 38 3Be identical.
Yet, in the cathode ray tube of prior art shown in Figure 32, the main lens 38 of electron gun must leave the magnetic deflection field district that is produced by deflecting coil 11, be subjected to the interference of magnetic deflection field with the electron beam of avoiding passing main lens 38, thereby, electron gun is arranged on from deflecting coil 11 moves back position to neck 7.Like this, the distance L between main lens 38 and the fluorescent film 13 2Just can not be less than the distance between deflecting coil 11 and the fluorescent film 13.
For the resolution at the fluorescent film center of improving cathode ray tube, in actual production process, be to adopt the way that strengthens the main lens aperture always.Hole diameter enlargement can make by the corresponding increase of the beam diameter of main lens 38.Because it is disturbed in magnetic deflection field to pass the electron beam of main lens 38, to just bigger than major diameter, therefore, the aperture of main lens is big more, and electron gun just must be far away more from the distance of magnetic deflection field.
On the contrary, in structure of the present invention shown in Figure 31, owing to be provided with deflection distortion correcting electrode 39, it produces fixing inhomogeneous field in magnetic deflection field, wishes that simultaneously the electron beam that passes main lens 38 is interfered in magnetic deflection field, therefore, and distance L 2Can be less than the distance between deflecting coil 11 and the fluorescent film 13.According to the abovementioned embodiments of the present invention, thereby, the main lens of cathode ray tube and the distance between the fluorescent film can be less than the above-mentioned distances of the cathode ray tube of prior art, and even increase the phosphor screen size of cathode ray tube, the repulsive force influence of space charge also can reduce, this is because the main lens compatible cause bigger with the aperture, like this, just reduced the diameter of the electron-beam point on the fluorescent film 13, thereby a high-resolution cathode ray tube is provided.
Since suppress the reduction of its focus characteristics when being difficult to shorten electron gun in the past, therefore, the total length L of cathode ray tube 4Shortening just be restricted and quite the difficulty.On the contrary, in an embodiment of the present invention,, make the total length L of cathode ray tube by shortening the distance between main lens 38 and the fluorescent film 13 4Compared with prior art, shortened widely, and from the negative electrode of electron gun to the main lens each several part without any variation, as shown in figure 31.
In one embodiment of the invention, be fixed to parts shown in Figure 12 on the anode 6 of electron gun as the deflection distortion correcting electrode, the deflection distortion correcting electrode is used for producing fixing inhomogeneous field in magnetic deflection field, as shown in figure 13, the electron gun of above-mentioned formation is applied in the color cathode ray tube, and three electron beams of this color cathode ray tube are in-line, and its neck external diameter is 29mm, maximum deflection angle is 108 degree, and the quadrature diameter of fluorescent film is 59cm.In the direction vertical, towards the aperture L of the face 6a of the electron gun anode 6 of main lens with scan line 2Be 8mm.Use cathode ray tube to have magnetic deflection field shown in Figure 8, the face 6a towards main lens anode 6 on the Z of same figure axle is arranged on the position of 85mm, and the anode voltage with 30KV drives cathode ray tube, so just can reach gratifying effect.That part of density of line of magnetic force be 0.017 the milli tesla/
Figure 941018008_IMG2
The volt anode voltage, this is approximately 66% of maximum magnetic flux lines of force density.That part of position is away from fluorescent film, and distance produces the about 20mm of core ends of the coil of magnetic deflection field.Adopt prior art to confirm equally, be presented on the Z axle on about 100mm or the residing position of the anode surface towards main lens, observe the influence that magnetic deflection field is disturbed electron beam less than 100mm place, and the decline of the resolution of fluorescent film periphery.
In an embodiment of the present invention, parts shown in Figure 12 are fixed to as the deflection distortion correcting electrode on the anode 6 of electron gun, the deflection distortion correcting electrode is used for producing fixing inhomogeneous field in magnetic deflection field, as shown in figure 13.The electron gun of above-mentioned formation is applied in the color cathode ray tube, and three electron beams of this color cathode ray tube are in-line, and its neck external diameter is 29mm, and maximum deflection angle is 90 degree, and the quadrature diameter of fluorescent film is 48cm.In the direction vertical, towards the aperture L of the face 6a of the electron gun anode 6 of main lens with scan line 2Be 8mm.Make cathode ray tube have magnetic deflection field shown in Figure 10, the face 6a towards main lens anode 6 on the Z of same figure axle is arranged on the position of 70mm, and the anode voltage with 30KV drives cathode ray tube, so just can reach gratifying effect.That part of density of line of magnetic force be 0.01 the milli tesla/
Figure 941018008_IMG2
The volt anode voltage, this is approximately 55% of maximum magnetic flux lines of force density.That part of position is away from fluorescent film, and distance produces the about 13mm of core ends of the coil of magnetic deflection field.Adopt prior art to confirm equally, be presented on the Z axle on about 82mm or the residing position of the anode surface towards main lens, observe the interference of magnetic deflection field electron beam less than 82mm place, and the reduction of the definition of fluorescent film periphery.
In an embodiment of the present invention, as the deflection distortion correcting electrode, welding is fixed on the anode of electron gun with parts shown in Figure 12, and the deflection distortion correcting electrode is used for producing fixing inhomogeneous field in magnetic deflection field, as shown in figure 15.The cathode ray tube of above-mentioned formation has a projection tube, and except the main lens of electron gun, has also used electromagnetism convergence coil 74, and the maximum deflection angle of above-mentioned projection tube is 75 degree.Also in the figure, utilize the resistance 76 installed in the resistive film 75 that applies on the inwall of neck 7 and the cathode ray tube that the voltage of face is carried out dividing potential drop, give the anode service voltage of electron gun thus.From the distance towards the end of that side of fluorescent film towards the end face 4a of main lens to electrode 39 of electron gun anode 4 is 180mm.
Figure 33 is a schematic diagram, represents the essential part of a kind of cathode ray tube example of the present invention.Wherein be provided with deflection distortion correcting electrode 39, be used in magnetic deflection field, producing fixing inhomogeneous field, thus, can suppress the influence of magnetic deflection field, surface from anode 6 towards main lens, make main lens 38 more approach fluorescent film 13 on one side when being positioned at fluorescent film, promptly more approach phosphor screen film 13 than the end 7-1 of neck 7.
, voltage produces a highfield because thereby being added in the electron gun that makes cathode ray tube on the narrow electrode gap, therefore, require a high-level design technology, so that have stable voltage endurance, and, need high-level design technology equally for control of quality in extensive manufacture process.Rule of thumb, ceiling voltage is near main lens 38.The charge affects of the electric field neck inwall around the main lens 38 also is subjected to the influence of the small dust that adhered on the electron gun electrodes in the cathode ray tube.In the present embodiment, can avoid these shortcomings, because main lens 38 is not towards neck 7.
The power supply of electron gun anode 6 inwall from neck 7 is transferred on the inwall of funnel part 8, can prevents that like this voltage endurance from becoming bad, this change is bad also may to be because graphite film separates caused with the inwall of neck 7.
Figure 34 is a schematic diagram, represents the essential part of a kind of cathode ray tube example of the present invention.Wherein be provided with deflection distortion correcting electrode 39, be used in magnetic deflection field, producing fixing inhomogeneous field, therefore, can suppress the influence of magnetic deflection field, thereby the face 6a towards main lens of anode 6 is risen, main lens 38 more approaches fluorescent film 13 than the end 7-1 of neck 7 when being in fluorescent film one side, promptly more approaches the face.Therefore, be used for adding the heat that the heater H of the negative electrode K of thermionic electron guns produced and be delivered to deflecting coil 11 together with the heats that deflecting coil 11 itself is produced by neck 7, make deflecting coil 11 overheated.
Figure 35 is an example graph, the length L of expression neck and the relation between the temperature T on the residing neck location of deflecting coil.Temperature T descends along with the increase of length L.In the prior art, the heating power of a negative electrode with 2 watts heated, also heated neck simultaneously.Shorten at neck under the situation of 40mm, the temperature at deflecting coil place approximately raises 15 ℃.Return to the state near original temperature, then the used heater power of negative electrode should be 1.5 watts or littler.
In the display unit of color television set or terminal, in general, the degree of depth of casing depends on the total length L of cathode ray tube 4Especially in recent years color television set, the phosphor screen size of its cathode ray tube is increasing, when television set is placed in the normal room, just must consider the degree of depth of casing.Particularly under television set and other furniture situation placed side by side, depth dimensions all can become a problem for many tens millimeters.Therefore, we can say that aspect the serviceability and effect with combinations of furniture the time, the depth dimensions that shortens casing has very significant effect.
So according to foregoing embodiments of the invention, the total length of cathode ray tube can shorten, make the casing depth dimensions of color television set be shorter than existing television set widely, and that focus characteristics can not become is bad.Thereby the sales volume of this television set will increase.
In general, color television set, whole cathode ray tube and parts such as funnel part, its volume is far longer than for example volume of semiconductor element of electronic component, thereby their freight is much bigger.Especially transport to when external when product is long-distance, high like this freight just can not be ignored.According to the abovementioned embodiments of the present invention, the total length of the cathode ray tube of color television set is shorter, and the degree of depth of its casing is also shorter, so that save freight.
The existing concrete structure that illustrates in greater detail embodiments of the invention.
Figure 36 is an end view, represents the example of a kind of concrete structure of electron gun used in the cathode ray tube of the present invention; Figure 37 is that the structure of Figure 36 is removed the later end view of a part, represents the essential part of above-mentioned electron gun.Represent same part with reference number identical in Figure 83 and 84.
In Figure 36 and 37, at i.e. the 6th electrode of negative electrode K and anode 6() between settled five electrodes, promptly first electrode 1, second electrode 2, third electrode 3, the 4th electrode 4 and the 5th electrode 5(are made up of electrode 51 and 52), wherein, the current potential that third electrode and the 5th electrode 5 are supplied with is a potential focus, and the current potential that second electrode 2 and the 4th electrode 4 are supplied with is the panel current potential.In addition, the current potential that first electrode 1 is supplied with is a screen potential, and first electrode 1 usually is electrically connected with the earth.
By the way, Figure 36 represents that three electron beams are the monolithic devices electron gun of in-line, and this figure is perpendicular to the end view of in-line direction; Figure 37 represents main lens and peripheral part thereof of Figure 36, and this figure is the end view of in-line direction.
In the cathode ray tube of electron gun with said structure, deflection distortion correcting electrode 39 produces fixing inhomogeneous field in the magnetic field that deflecting coil produced, when in the magnetic field that deflecting coil 11 is produced, deflecting with convenient electron beam 10, according to the deflection distortion that deflection angle is proofreaied and correct this electron beam 10, the size of electrode 39 is decided to be: length L 5Compare length L 6Short, here, L 5Be three electron beams by the time do not have the length of the part of deflection, L in in-line direction (scan-line direction) 6Be three electron beams by the time in the in-line direction length of the part of deflection, L are arranged 5And L 6Extension all towards face.
And deflection distortion correcting electrode 39 is connected with anode 6, and fixed thereon.This structure can reach following operating state:
When electron gun is installed in the cathode ray tube by mode shown in Figure 5, make electron beam 10 only when the direction perpendicular to in-line deflects, its operating state is with described similar with reference to Fig. 6.Yet under the situation that the in-line direction also deflects simultaneously, electron beam 10 is by having longer length L 6The part of deflection distortion correcting electrode 39, thereby, as illustrated, strengthened the effect of deflection distortion correcting electrode 39 with reference to Fig. 6.Therefore, can suppress the halation in the bundle point 19 of phosphor screen corner part effectively, for example, for shown in Figure 73 like that.
Comprise three width of cloth projection views (Figure 38,39 and 40) or four width of cloth projection views (Figure 41 and 42) among Figure 38,39,40,41 and 42, the example of representing the concrete structure of various deflection distortion correcting electrodes, said deflection distortion correcting electrode is positioned at the magnetic field that deflecting coil produces, when electron beam deflects in the magnetic field that deflecting coil produces, this deflection distortion correcting electrode comes the deflection distortion of correcting electronic bundle according to deflection angle, for example, when anode was supplied to current potential, the deflection distortion correcting electrode 39 shown in Figure 36 and 37 distorted with regard to correction deflector.In Figure 38,39,40,41 and 42, be following view (a), consider direction perpendicular to in-line; (b) be front view, the direction shown in the arrow A from (a); (c) be end view, the direction shown in the arrow B from (a); (d) be rearview, the direction shown in the arrow C from (a).In addition, the label letter e among the figure is represented the electron beam that do not deflect.
Deflection distortion correcting electrode 39 shown in Figure 38 is made up of the first dull and stereotyped 39-1 and the second dull and stereotyped 39-2, and these two flat boards are parallel to each other, and stretch out to the direction of fluorescent film 13 from the 6th electrode 6.On these dull and stereotyped 39-1 and the 39-2 trapezoidal cut 390 is arranged all, three electron beams are passed through wherein, the position of trapezoidal cut 390 is so definite, so that when three electron beams do not deflect, they can be by the center of otch 390, and when along to the direction measuring length of fluorescent film 13 time, the bottom is L to the length of otch 390 from it 5, the length of flat-panel component is L 6
Deflection distortion correcting electrode 39 shown in Figure 39 is made up of the first dull and stereotyped 39-3 and the second dull and stereotyped 39-4, and its shape is to shown in Figure 38 similar, and still, they are assembled gradually along the direction of fluorescent film 13.
Deflection distortion correcting electrode 39 shown in Figure 40 is made up of the first dull and stereotyped 39-5 and the second dull and stereotyped 39-6, and they are parallel to each other, and stretches out to the direction of fluorescent film 13 from the 6th electrode 6.On these dull and stereotyped 39-5 and the 39-6 semi-circular cut-out 391 is arranged all, three electron beams are passed through wherein, the position of otch 391 is so definite, so that when three electron beams did not deflect, they can be by the center of otch 391.And when along to the direction measuring length of fluorescent film 13 time, 391 length is L from central side to otch 5, the length of flat-panel component is L 6
Especially, propagate when the in-line direction deflects,, play the length L of otch 390 and 391 from central side towards the direction of fluorescent film 13 when three electron beams 5Length L less than flat-panel component 6
Deflection distortion correcting electrode 39 shown in Figure 41 is made up of the first dull and stereotyped 39-7 and the second dull and stereotyped 39-8, and they are crooked, separate gradually towards the direction of fluorescent film 13.
Deflection distortion correcting electrode 39 shown in Figure 42 is made up of the first dull and stereotyped 39-7 and the second dull and stereotyped 39-10, and they stretch out to the direction of fluorescent film 13 from the 6th electrode 6, and they are crooked, separates gradually towards the direction of fluorescent film 13.Half elliptic otch 392 is all arranged on these flat-panel components 39-9 and the 39-10, and its position is so definite, so that when three electron beams during without any deflection, make them pass its center.And when towards the direction measuring length of fluorescent film 13,392 length is L from the center side to otch 5, the length of flat-panel component is L 6, that is to say, when three electron beams are propagated and when the in-line direction deflected, this length was so to distribute to stretch to face.
By the way, the arrangement between two flat-panel components should not be defined as above-mentioned parallel and not parallel in a kind of, they can certainly be partly not parallel in the in-line direction.
Figure 43,44,45,46,47,48, respectively comprise three width of cloth projection view (Figure 43 in 49 and 50,44,45 and 50) or four width of cloth projection view (Figure 46,47,48 and 49), the various structure examples of expression deflection distortion correcting electrode when emplace, this deflection distortion correcting electrode is used for setting up fixing non-uniform magnetic-field in the magnetic field that deflecting coil produces, and when electron beam deflects in the magnetic field that deflecting coil produces, come the deflection distortion of correcting electronic bundle according to deflection angle, the arrangement situation of deflection distortion correcting electrode is shown in Figure 36 and 37, but be not connected with anode, the current potential of being supplied with is lower than the current potential of anode.
In Figure 43,44,45,46,47,48,49 and 50, be following view (a), from direction projection perpendicular to in-line; (b) be front view, the direction projection shown in the arrow A from (a); (c) be end view, the direction projection shown in the arrow B from (a); (d) be rearview, the direction projection shown in the arrow C from (a).In addition, the label letter e among the figure is represented the electron beam that do not deflect.
Deflection distortion correcting electrode 39 shown in Figure 43 is that first flat board 39 '-11 and the second dull and stereotyped 39-12 form by two flat boards, and they are parallel to each other, and stretch out to the direction of fluorescent film 13 from the 6th electrode 6.Projection 393 is all arranged on these flat-panel components 39-11 and the 39-12, three electron beams are passed through, and projection stretches out to the direction of fluorescent film 13, and is as directed, its position is so definite, so that can be by the centre of projection 393 when three electron beam E do not deflect.And on the direction of fluorescent film 13, it is L that the maximum of projection is protruded length 5, successively decrease in its length of in-line direction.
Deflection distortion correcting electrode 39 shown in Figure 44 ' by two flat boards promptly the first dull and stereotyped 39-13 and the second dull and stereotyped 39-14 forms, they stretch out to the direction of fluorescent film 13 from the 6th electrode 6, and separation gradually.These dull and stereotyped 39-13 and 39-14 have projection 393, three electron beams are passed through, this projection 393 is similar to projection shown in Figure 43 393, and the direction to fluorescent film 13 is stretched out, its position is so definite, so that when three electron beam E do not deflect, can be by the centre of projection 393.And on the direction of fluorescent film 13, it is L that the maximum of projection 393 is protruded length 5, and successively decrease in its length of in-line direction.
Deflection distortion correcting electrode 39 shown in Figure 45 ' by two flat boards promptly the first dull and stereotyped 39-15 and the second dull and stereotyped 39-16 forms, its individual being parallel to each other is stretched out to the direction of fluorescent film 13 from the 6th electrode 6.Semicircle projection 394 is all arranged on these dull and stereotyped 39-15 and the 39-16, three electron beams are passed through, projection 394 stretches out to the direction of fluorescent film 13, as shown in the figure, its position is so definite, so that when three electron beam E do not deflect, can be by the centre of projection 394.And on the direction of fluorescent film 13, it is L that the maximum of projection 394 is protruded length 5
Deflection distortion correcting electrode 39 shown in Figure 46 ' by two flat boards promptly the first dull and stereotyped 39-17 and the second dull and stereotyped 39-18 form, they are parallel to each other, and stretch out to the direction of fluorescent film 13 from the 6th electrode 6.Projection 393 and recess 395 are all arranged on these dull and stereotyped 39-17 and the 39-18, three electron beams are passed through, projection 393 stretches out to the direction of fluorescent film 13, as shown in the figure, recess 395 is recessed to the direction of fluorescent film 13 from the side of the 6th electrode 6, their position is so definite, so that when three electron beam E do not deflect, can be by the centre of projection 394 and recess 395.And on the direction of fluorescent film 13, it is L that the maximum of projection 393 is protruded length 5, successively decrease in its length of in-line direction.
Deflection distortion correcting electrode 39 shown in Figure 47 ' by two flat boards promptly the first dull and stereotyped 39-19 and the second dull and stereotyped 39-20 forms, they stretch out to the direction of fluorescent film 13 from the 6th electrode 6, and separation gradually.On these dull and stereotyped 39-19 and the 39-20 projection 393 is arranged all, three electron beams are passed through, this projection 393 is similar to projection shown in Figure 46 393, and the direction to fluorescent film 13 is stretched out, dull and stereotyped 39-19 and 39-20 go up also has relief part, this relief part falls in, it surrounds the electron beam E of in-line direction respectively, recess 395 is recessed to the direction of fluorescent film 13 from the side of the 6th electrode 6, their position is so definite, so that when electron beam E does not deflect, can be by the centre of recess 395 and projection 393.And on the direction of fluorescent film 13, it is L that the maximum of projection 393 is protruded length 5, successively decrease in its length of in-line direction.
Deflection distortion correcting electrode 39 shown in Figure 48 ' by two flat boards promptly the first dull and stereotyped 39-21 and the second dull and stereotyped 39-22 form, they are parallel to each other, and stretch out to the direction of fluorescent film 13 from the 6th electrode 6.These flat-panel components 39-21 and 39-22 go up existing projection 394 recessed 396 again, projection 394 is with shown in Figure 45 the same, direction to fluorescent film 13 is stretched out, three electron beams are passed through, recess 396 is recessed to the direction of fluorescent film 13 from the side of the 6th anode 6, and longer than projection 394, and their position is so definite, so that when electron beam E does not deflect, can be by the centre of recess 396 and projection 394.And on the direction of fluorescent film 13, it is L that the maximum of projection 394 is protruded length 5
Deflection distortion correcting electrode 39 shown in Figure 49 ' by two flat boards promptly the first dull and stereotyped 39-23 and the second flat plate 39-24 forms, they are that aspectant position concerns, and stretch out to the direction of fluorescent film 13 from the 6th electrode 6.These dull and stereotyped 39-23 had both comprised two parallel plate part 39-23-1 and 39-24-1 with 39-24, comprise two warpage part 39-23-2 and 39-24-2 again, the electron beam part can be passed through in the middle of the residing position of plate part 39-23-1 and 39-24-1 will make, on the direction of fluorescent film 13, two warpage part 39-23-2 separate gradually with 39-24-2, so that corresponding with the propagation position of side electron beam.In the side of the 6th electrode 6, the gap between two plate parts is corresponding to the position of middle electron beam transmitting site with should equate in the position of side electron beam transmitting site.
Deflection distortion correcting electrode 39 shown in Figure 50 ' by two flat boards promptly the first dull and stereotyped 39-25 and the second dull and stereotyped 39-26 form, they are parallel to each other, and stretch out to the direction of fluorescent film 13 from the 6th electrode 6.These dull and stereotyped 39-25 and 39-26 go up existing part 39-25-1 and 39-26-1, part 39-25-2 and 39-26-2 are arranged again, electron beam can pass through in the middle of the residing position of part 39-25-1 and 39-26-1 will make, on the direction of fluorescent film 13, the length of this part is L 5, part 39-25-2 and 39-26-2 stretch out to the direction of fluorescent film 13 with aspectant position relation, so that corresponding to have length be L 5The propagation position of side electron beam when considering near middle electron beam, and electric arc guided into maximum to protrude length be L 5The neighboring when considering away from middle electron beam.
When using the deflection distortion correcting electrode when the in-line direction deflects electron beam, the deflection distortion of side electron beam can be distorted by commatic aberration according to deflection angle and proofread and correct.
As illustrated in each embodiment of deflection distortion correcting electrode, on the direction of fluorescent film, the length L that the part of being propagated when not having deflection in the in-line direction as three electron beam E is extended 5Length greater than the part extension of when the in-line direction produces deflection, being propagated as three electron beam E.
Since this structure, therefore, when the electron beam E by the deflection distortion correcting electrode deflects, deflection more when its track ratio does not produce deflection, thus according to the variation of deflection angle, the expansion of bundle point and the halation that are produced on face just can be suppressed.
Form two flat boards of deflection distortion correcting electrode, shown in Figure 43 to 50, except the gap of top appointment, can do various improvement, for example, be arranged in parallel the not parallel arrangement of not parallel arrangement and part.
In addition, the deflection distortion correcting electrode is set up fixing inhomogeneous field in the magnetic field that deflecting coil produced, when electron beam deflects in the magnetic field that deflecting coil produced, come the deflection distortion of correcting electronic bundle according to deflection angle, this deflection distortion correcting electrode is not connected with anode, and the current potential of being supplied with is lower than the current potential of anode, shown in Figure 43 to 50, the mode of supplying with current potential can be for example needed voltage to be supplied on the pin of stem stem.Yet, if a resistance is set in cathode ray tube, one end of this resistance is connected with anode, and the lower electrode of the other end and another current potential or be connected with the earth, so that can obtain suitable voltage from the position, intermediate portion, the same with prior art so, outside said structure, to the electron gun power supply, so just can supply with desired voltage.
Figure 51,52,53,54,55 and 56 is profiles, represents the basic structure of the electron gun of various electrode structures of the present invention.In these figure, label letter K represents negative electrode, label G1 represents first electrode, label G2 represents second electrode, and label G3 represents third electrode, and label G4 represents the 4th electrode, label G5 represents the 5th electrode, label G6 represents the 6th electrode, and label Vf represents focus voltage, and label Eb represents anode voltage.
Specifically, Figure 51 represents BPF type electron gun, Figure 52 represents the UPF electron gun, Figure 53 represents the same with BPF type electron gun and has the electron gun of long focusing electrode, Figure 54 represents the same with UPF type electron gun and has the electron gun of long focusing electrode, Figure 55 represents focus voltage is supplied with electrode G3 and G5 and anode voltage is supplied with the electron gun of electrode G4 and 6, and Figure 56 represents electron gun that first focus voltage is supplied with electrode G3 and G5, second focus voltage is supplied with electrode G4 and anode voltage supplied with electrode G6.
In the main lens electrode of above-mentioned various types of electron guns partly is arranged on the magnetic deflection field that deflecting coil produced by cathode ray tube, so that when electron beam is deflected in the magnetic field that deflecting coil produced, the deflection distortion correcting electrode is set, its structure is with identical with reference to the described structure of Figure 36 to 48, so that according to deflection angle is the deflection distortion of correcting electronic bundle, so just can reach effect of the presently claimed invention.
In addition, the present invention can also combine with the electron gun of other type outside the above-mentioned type certainly.
Figure 57 is a schematic diagram, represents the structure of another kind of electron gun of the present invention.In Figure 57, the label identical with above-mentioned explanation represented same part.Label 1a and 1b are illustrated in the first electrode 1(G1 between negative electrode (K) and second electrode (G2)) the side, label 2a and 2b are illustrated in the side of second electrode (G2) between first electrode (G1) and the third electrode (G3), label 3a and 3b are illustrated in the third electrode (G3) between second electrode (G2) and the 4th electrode (G4) and the side of the 4th electrode (G4) between the 5th electrode (G5), label 5a and 5b are illustrated in the side of the 5th electrode (G5) between the 4th electrode (G4) and the 6th electrode (G6), label 6a represents the side of the 6th electrode (G6), as the entrance and exit of each electron beam in the 5th electrode (G5).
As shown in the figure, first electrode (G1) of the electron gun of Gou Chenging connects the earth like this, and second electrode (G2) and the 4th electrode (G4) are gone up and supplied with an inhibition voltage Ec 2, third electrode (G3) and the 5th electrode (G5) are gone up and are supplied with a focus voltage Vf.
Figure 58 is a schematic diagram, the concrete structure of second electrode shown in expression Figure 57.In Figure 58: label 2c represents electron beam transmission hole, label 2d represents a groove, and this groove is round the outlet 2b of electron beam transmission hole 2c, so that its long axle is parallel to in-line direction (X-X), letter w 1 and W2 represent the long limit of groove 2d and the size of minor face, and alphabetical D represents the degree of depth of groove 2d.
Figure 59 is a schematic diagram, the concrete structure of the third electrode shown in expression Figure 57.In Figure 59, (a) be the perspective view of expression electron beam inlet side, (b) be cutaway view along A-A line in (a).
In Figure 59, alphabetical 3c represents electron beam transmission hole, and alphabetical 3d represents groove, and these grooves are positioned at the electron beam inlet limit and respectively round each electron beam transmission hole of third electrode 3, so that its long axle (Y-Y) is perpendicular to the in-line direction.
Figure 60 is a schematic diagram, the concrete structure of the 4th electrode shown in expression Figure 57.Among Figure 60, alphabetical 4c represents electron beam transmission hole, and label 4d represents groove, and these grooves are positioned at the electron beam outlet limit, and respectively round each electron beam transmission hole of third electrode 3, so that its long axle (Y-Y) is perpendicular to the in-line direction.
As mentioned above, the electrode surface shown in the part of hatching among Figure 58 is combined with near the electron beam transmission hole shown in Figure 58,59 and 60 non-round structure electrode, make such electron beam realize astigmatic correction, thereby improved focus characteristics.
Have the cathode ray tube of above-mentioned electron gun in the neck location of prior art, its whole fluoroscopic focusing uniformity significantly improves.If increase astigmatic correction to increase whole fluoroscopic focusing uniformity, so at fluoroscopic center, the diameter of electron-beam point just increases, thereby resolution is reduced.In this case, as in the present invention, in the magnetic field of deflecting coil, main lens is set, and above-mentioned deflection distortion correcting electrode is set, so that make the electron beam deflecting, thisly just can improve focus characteristics with the magnetic field of deflecting coil.
Figure 61 is a profile, the essential part of the structure of expression electron gun, and this electron gun is the electron gun that three electron beams are the color cathode ray tube of in-line arrangement.
Figure 62 and 63 is schematic diagrames, and expression comprises the electrode structure of the main lens of electron gun, and wherein (a) is front view, (b) is the partial side view of expression essential part.
Electron gun shown in Figure 61 is with shown in the mode of profile, wherein show the essential part of electron gun structure, this electron gun is the electron gun that three electron beams are the color cathode ray tube of in-line arrangement, wherein, be oppositely arranged in aspectant mode by anode, constitute main electrode 38 shape shown in the convergence electrode shown in Figure 62 and Figure 63.
In the main lens that electrode constituted of above-mentioned shape, equipotential line 61 passes the hole 6a of anode and the hole 5b of convergence electrode, thereby sets up one by the shared big electron lens of above-mentioned three electron beams, shown in Figure 61.If the electron beam transmission hole of radome 81 bottom surfaces has enough apertures, so, the electric field that sees through the hole 6a of negative electrode will arrive hole 83 near, rather than arrival radome 81 and 82.
Figure 64 is a schematic diagram, represents the example of the another kind of deflection distortion correcting electrode in the cathode ray tube of the present invention, wherein, (a) is front view, (b) is the cross-sectional view of an expression part.Figure 64 represents that three electron beams are the cathode ray tube that in-line is arranged, wherein, be provided with electrode 39, so that in magnetic deflection field, form fixing inhomogeneous field, thereby according to the distortion of deflection angle correction deflector, face is more approached than the bottom surface of radome 81 in the position of electrode 39.
The single bundle transmission hole of electron beam transmission hole on the bottom surface of radome 81 being made three electron beams is shared, just can improve near the electric field strength of above-mentioned deflection distortion correcting electrode 39.
Being in the example of electron gun electrodes part of a kind of cathode ray tube that in-line arranges at three electron beams, shown in Figure 61, arranging and be installed with one group of electrode, electron beam transmission hole is all arranged in these electrodes, is L so that make mutual spacing 8Each electron beam pass electron gun.The electrode main lens of electron gun is made up of the electrode shown in above-mentioned Figure 62 and 63.
In order to improve the resolution on the fluorescent film, the diameter of main lens must increase, but is subjected to above-mentioned electron beam spacing L 8Restriction.On the other hand, increase the aperture of main lens, especially increase, just can impel the bottom surface of field penetration to the radome shown in Figure 64 81 towards the aperture (at scan-line direction) of the anode 6 of main lens.In the present embodiment, the aperture of above-mentioned anode 6 (at scan-line direction) impels the bottom surface of field penetration to the radome shown in Figure 64 81 thus for 0.5 times of the shortest adjacent spacing of the electron beam transmission hole that forms on above-mentioned one group of electrode or bigger.
In an embodiment of the present invention, adopt the deflection distortion correcting electrode of the shape shown in Figure 64, its position than the bottom surface of the single hole radome shown in Figure 61 more near the face, constitute the combination of electrodes of main lens among Figure 61, and, in these parts, be 1.4 times of shortest spacing of the adjacent electron beam transmission hole or bigger towards the aperture (at scan-line direction) of the anode 6 of main lens, these electron beam transmission holes are formed in above-mentioned one group of electrode.
As foregoing, according to embodiments of the invention, a kind of cathode ray tube can be provided, wherein the electron gun of being installed can improve focus characteristics in whole phosphor screen zone and in the whole electron beam current scope, and do not supply with any dynamic focus voltage, thereby reached gratifying resolution, and in low current range, reduced moore phenomenon.
Figure 65 is a schematic diagram, is used for the size of two kinds of image display apparatus of comparison, and wherein a kind of image display apparatus has adopted cathode ray tube of the present invention, and another kind of image display apparatus has adopted the cathode ray tube of prior art.In Figure 65, (a) and (b) front view and the end view of the image display apparatus of cathode ray tube of the present invention used in expression, and (c) and (d), the front view and the end view of image display apparatus of the cathode ray tube of prior art used in expression.
In Figure 65, according to image display apparatus of the present invention (shown in figure (b)), the degree of depth L of its casing 83 7(shown in figure (d)) than prior art is little, thereby can save placement space.
Degree of depth L 7The reason that can dwindle be because, in magnetic deflection field, set up fixing inhomogeneous field, so that come the correction deflector distortion according to the deflection angle of electron beam, thereby the electron gun main lens that makes cathode ray tube is more near deflecting coil, so that the length L of cathode ray tube 84 4Can shorten.
As foregoing, according to embodiments of the invention, a kind of cathode ray tube can be provided, wherein the electron gun of being installed can improve focus characteristics in whole phosphor screen zone and in the whole electron beam current scope, and do not supply with any dynamic focus voltage, thereby reach gratifying resolution, and in low current range, reduced moore phenomenon, and have the shell degree of depth that has shortened.
As foregoing, according to embodiments of the invention, a kind of cathode ray tube can be provided, wherein, in magnetic deflection field, set up fixing inhomogeneous field, be used for when the deflection track of electron beam changes, according to the deflection distortion of deflection angle correcting electronic bundle, thus, make cathode ray tube in the scope of whole fluorescent film (or screen) and in the scope of whole electron beam current, suitable electron-beam convergence effect can be reached, and resolution can be improved significantly.
Especially, set up fixing inhomogeneous field, this electric field changes along with the deflection angle difference the corrective action of electron beam deflecting distortion, thus, the electron beam that utilization changes track because of deflection in above-mentioned electric field just can distort by correction deflector, therefore, even in position, also can reach suitable electron-beam convergence effect away from the face center.
On the other hand, the electrode of setting up inhomogeneous field has the effect of electron beam deflecting distortion correction, this corrective action changes along with the difference of deflection angle, the voltage of being supplied with on the part of described electrode (being the deflection distortion correcting electrode) can be identical with the current potential of another electrode of cathode ray tube, perhaps also can be different with its voltage.Supplying with under the different voltage condition, for example, the resistance of high value can be set in cathode ray tube, the one end is connected with fluorescent film, and the other end is connected with earth potential, for example, obtains desired voltage from its middle suitable position.
And, in electron gun, the beam diameter the best part be positioned at main convergent lens near, and electron beam deflecting magnetic field is normally heterogeneous, so that the adjusting of assembling in yi word pattern color picture tube or chromoscope.At this moment, main convergent lens is preferably as much as possible away from the magnetic deflection field generation unit, so that suppress because of the interference of magnetic deflection field to electron beam, and face is more approached than the main convergent lens of electron gun usually in the position of magnetic deflection field generation unit.On the other hand, the length between the negative electrode of electron gun and the main convergent lens can be longer, so that make the bundle spot diameter on the face less, this realizes by the image multiplication rate that reduces electron gun.Therefore, resolution is high and take into account the cathode ray tube of above-mentioned two essential effects, and its axial length has increased.Yet, according to the present invention, face can relatively be approached in the position of main convergent lens, and the length between the negative electrode of electron gun and the main convergent lens remains unchanged, so that the image multiplication rate of electron gun can reduce further, thereby reduced the diameter of electron-beam point on the face, and shortened the axial length of cathode ray tube.
Owing to shortened axial length, therefore, the time cycle of the space charge repulsion in the electron beam has been shortened relatively near fluorescent film in the position of main lens, thereby the diameter of bundle point can further reduce on the face.In this state, the electron beam proximity in main convergent lens or enter the magnetic deflection field generation unit is so that it distorts because of magnetic deflection field easily.Yet although this unfavorable conditions, above-mentioned distortion is inhibited according to aforementioned deflection angle by the deflection distortion corrective action.
In order further to reduce the bundle spot diameter of face center, relevant production part makes great efforts to enlarge the aperture of main convergent lens always.The aperture increase can cause that electron beam its diameter by main convergent lens the time increases.In this state, the easier influence that is subjected to magnetic deflection field of the electron beam in the main convergent lens, and also main convergent lens must be farther from magnetic deflection field, so that the axial length of cathode ray tube is longer.The main convergent lens that the aperture has enlarged in this case,, utilizes above-mentioned deflection distortion corrective action,, can shorten axial length, so that can be brought into play its characteristic fully according to the deflection situation still according to the present invention.
And when electron-beam point is positioned at fluoroscopic center, it will can not be subjected to the influence of magnetic deflection field.Like this, tackle the distortion that produces because of magnetic deflection field,, can make electron gun produce lensing, thereby reduce the diameter of electron-beam point on the phosphor screen further so that utilize the symmetrical convergence yoke of rotation with regard to not needing counter measure.
On the other hand, if dynamic focus voltage is added on the convergence electrode of electron gun, so, on whole phosphor screen, more can reach suitable electron-beam convergence effect, so that can reach gratifying resolution character on the whole phosphor screen.Yet needed dynamic focus voltage can descend with fixedly inhomogeneous field of the present invention, and wherein, when the electron beam deflecting produced the variation of deflection track, the deflection distortion of electron beam was proofreaied and correct and changed according to deflection angle.
And according to the present invention, fixing inhomogeneous field is based upon in the magnetic deflection field, is used for correction deflector distortion.In addition, the one group of electrode that constitutes electron gun has been formed one group of electrostatic lens, and at least one is the symmetrical electric field of rotation by this group electric field that electrostatic lens produced; Form two electrostatic lens, an electrostatic lens makes the electron-beam point in face centre be circle or square in high Current Zone, and this electrostatic lens has such focus characteristics, is higher than the suitable focus voltage that acts on the electron beam scanning direction so that act on the suitable focus voltage of electron beam scanning direction; Another electrostatic lens makes in the low current district, the electron-beam point in face centre is at the diameter of scanning direction and the diameter of vertical direction, be suitable for the pitch of shadow mask and the scanning line density of scanning direction and vertical direction, and this electrostatic lens has such focus characteristics, is higher than the suitable focus voltage that acts on vertical direction so that act on the suitable focus voltage of scanning direction.The lens that formed by those rotational symmetric electric fields can make cathode ray tube have gratifying focus characteristics, and in whole face scope and in the whole current range, electron beam moore phenomenon can not occur.
According to the present invention, further, the axial length of cathode ray tube can shorten, and reducing the casing degree of depth of image display apparatus, thereby can save the placement space of this sampling device.Shortened the degree of depth of casing and just made a world of difference, and this point is noticeable to improving sales volume with prior art.And the casing that the degree of depth has shortened has very high conevying efficiency, thereby can correspondingly save the freight of image display apparatus.
In addition, the axial length shortening according to cathode ray tube of the present invention can improve conevying efficiency, the saving freight equally.

Claims (36)

1, a kind of bearing calibration of cathode ray tube deflection distortion, described cathode ray tube comprise electron gun, arrangement for deflecting and a face with one group of electrode,
It is characterized in that, in magnetic deflection field, set up the deflection distortion that a fixing inhomogeneous field comes the correcting electronic bundle.
2, a kind of bearing calibration of cathode ray tube deflection distortion, described cathode ray tube comprise electron gun, arrangement for deflecting and a face with one group of electrode,
It is characterized in that, in magnetic deflection field, set up a fixing inhomogeneous field, so that come the correction deflector distortion according to the deflection of electron beam.
3, a kind of bearing calibration of cathode ray tube deflection distortion, described cathode ray tube comprise electron gun, arrangement for deflecting and a face with one group of electrode,
It is characterized in that, in a magnetic deflection field with astigmatism, set up a fixing inhomogeneous field, so that come the correction deflector distortion according to the deflection of electron beam.
4, the bearing calibration of cathode ray tube deflection distortion according to claim 3 is characterized in that, described fixedly inhomogeneous field has astigmatism, and it will make said electron beam divergence.
5, the bearing calibration of cathode ray tube deflection distortion according to claim 3, it is characterized in that, described fixedly inhomogeneous field has astigmatism, and it will make said electron beam divergence, comes the correction deflector distortion according to described electron beam in the deflection perpendicular to scan-line direction.
6, the bearing calibration of cathode ray tube deflection distortion according to claim 3, it is characterized in that, described fixedly inhomogeneous field has astigmatism, and it will make said electron beam divergence, comes correction deflector slightly to become according to described electron beam in the deflection of scan-line direction.
7, the bearing calibration of cathode ray tube deflection distortion according to claim 3 is characterized in that, described fixedly inhomogeneous field has astigmatism, and it will make said electron-beam convergence.
8, the bearing calibration of cathode ray tube deflection distortion according to claim 3, it is characterized in that, described fixedly inhomogeneous field has astigmatism, and it will make said electron-beam convergence, comes the correction deflector distortion according to described electron beam in the deflection perpendicular to scan-line direction.
9, the bearing calibration of cathode ray tube deflection distortion according to claim 3, it is characterized in that, described fixedly inhomogeneous field has astigmatism, and it will make said electron-beam convergence, comes the correction deflector distortion according to described electron beam in the deflection of scan-line direction.
10, a kind of bearing calibration of cathode ray tube deflection distortion, described cathode ray tube comprise electron gun, arrangement for deflecting and a face with one group of electrode,
It is characterized in that, in a magnetic deflection field with commatic aberration (coma), set up a fixing inhomogeneous field, so that come the correction deflector distortion according to the deflection of electron beam.
11, the bearing calibration of cathode ray tube deflection distortion according to claim 10 is characterized in that, described fixedly inhomogeneous field has commatic aberration (coma aberration), and it will make said electron beam divergence.
12, the bearing calibration of cathode ray tube deflection distortion according to claim 10, it is characterized in that, described fixedly inhomogeneous field has commatic aberration, and it will make said electron beam divergence, comes the correction deflector distortion according to described electron beam in the deflection perpendicular to scan-line direction.
13, the bearing calibration of cathode ray tube deflection distortion according to claim 10, it is characterized in that, described fixedly inhomogeneous field has commatic aberration, and it will make said electron beam divergence, comes the correction deflector distortion according to described electron beam in the deflection of scan-line direction.
14, the bearing calibration of cathode ray tube deflection distortion according to claim 10 is characterized in that, described fixedly inhomogeneous field has commatic aberration, and it will make said electron-beam convergence.
15, the bearing calibration of cathode ray tube deflection distortion according to claim 10, it is characterized in that, described fixedly inhomogeneous field has commatic aberration, and it will make said electron-beam convergence, comes the correction deflector distortion according to described electron beam in the deflection perpendicular to scan-line direction.
16, the bearing calibration of cathode ray tube deflection distortion according to claim 10, it is characterized in that, described fixedly inhomogeneous field has commatic aberration, and it will make said electron-beam convergence, comes the correction deflector distortion according to described electron beam in the deflection of scan-line direction.
17, a kind of cathode ray tube comprises: electron gun with one group of electrode, be used for producing arrangement for deflecting and a face of magnetic deflection field,
It is characterized in that, be provided with a deflection distortion correcting electrode, be used in described magnetic deflection field, setting up a fixing inhomogeneous field, so that the correction deflector distortion.
18, a kind of cathode ray tube comprises: electron gun with one group of electrode, be used for producing arrangement for deflecting and a face of magnetic deflection field,
It is characterized in that, be provided with a deflection distortion correcting electrode, be used in described magnetic deflection field, setting up a fixing inhomogeneous field, so that come the correction deflector distortion according to the deflection of electron beam.
19, cathode ray tube according to claim 18 is characterized in that, described deflection distortion correcting electrode have one with the deflection of described electron beam different and different astigmatism.
20, cathode ray tube according to claim 18 is characterized in that, described deflection distortion correcting electrode have one with the deflection of described electron beam different and different astigmatism, it can make described electron beam divergence.
21, cathode ray tube according to claim 18 is characterized in that, described deflection distortion correcting electrode have one with described electron beam perpendicular to the deflection of scan-line direction different and different astigmatism, it can make described electron beam divergence.
22, cathode ray tube according to claim 18 is characterized in that, described deflection distortion correcting electrode have one with described electron beam at the different and different astigmatism of the deflection of scan-line direction, it can make described electron beam divergence.
23, cathode ray tube according to claim 18 is characterized in that, described deflection distortion correcting electrode have one with the deflection of described electron beam different and different astigmatism, it can make described electron-beam convergence.
24, cathode ray tube according to claim 18 is characterized in that, described deflection distortion correcting electrode have one with described electron beam perpendicular to the different and different astigmatism of the deflection of scan-line direction, it can make described electron-beam convergence.
25, cathode ray tube according to claim 18 is characterized in that, described deflection distortion correcting electrode have one with described electron beam at the different and different astigmatism of the deflection of scan-line direction, it can make described electron-beam convergence.
26, cathode ray tube according to claim 18 is characterized in that, described deflection distortion correcting electrode have one with the deflection of described electron beam different and different commatic aberration (coma aberration).
27, cathode ray tube according to claim 18 is characterized in that, described deflection distortion correcting electrode have one with the deflection of described electron beam different and different commatic aberration, it can make described electron beam divergence.
28, cathode ray tube according to claim 18 is characterized in that, described deflection distortion correcting electrode have one with described electron beam perpendicular to the different and different commatic aberration of the deflection of scan-line direction, it can make described electron beam divergence.
29, cathode ray tube according to claim 18 is characterized in that, described deflection distortion correcting electrode have one with described electron beam at the different and different commatic aberration of the deflection of scan-line direction, it can make described electron beam divergence.
30, cathode ray tube according to claim 18 is characterized in that, described deflection distortion correcting electrode have one with the deflection of described electron beam different and different commatic aberration, it can make described electron-beam convergence.
31, cathode ray tube according to claim 18 is characterized in that, described deflection distortion correcting electrode have one with described electron beam perpendicular to the different and different commatic aberration of the deflection of scan-line direction, it can make described electron-beam convergence.
32, cathode ray tube according to claim 18 is characterized in that, described deflection distortion correcting electrode have one with described electron beam at the different and different commatic aberration of the deflection of scan-line direction, it can make described electron-beam convergence.
33, a kind of image display apparatus comprises: cathode ray tube with electron gun, be used for setting up arrangement for deflecting and a face of magnetic deflection field, described electron gun has one group of electrode;
It is characterized in that, be provided with a deflection distortion correcting electrode, come the correction deflector distortion so that in described magnetic deflection field, set up a fixing inhomogeneous field.
34, a kind of image display apparatus comprises: cathode ray tube with electron gun, be used for setting up arrangement for deflecting and a face of magnetic deflection field, described electron gun has one group of electrode:
It is characterized in that, be provided with a deflection distortion correcting electrode, be used in described magnetic deflection field, setting up a fixing inhomogeneous field, so that come the correction deflector distortion according to the deflection of electron beam.
35, image display apparatus according to claim 34 is characterized in that, described deflection distortion correcting electrode have one with the deflection of described electron beam different and different astigmatism.
36, image display apparatus according to claim 34 is characterized in that, described deflection distortion correcting electrode have one with the deflection of described electron beam different and different commatic aberration.
CNB941018008A 1994-01-14 1994-01-14 Cathode ray tube and deflection aberration correcting method of the same Expired - Fee Related CN1149620C (en)

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CNB941018008A CN1149620C (en) 1994-01-14 1994-01-14 Cathode ray tube and deflection aberration correcting method of the same

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Application Number Priority Date Filing Date Title
CNB941018008A CN1149620C (en) 1994-01-14 1994-01-14 Cathode ray tube and deflection aberration correcting method of the same

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CN1149620C CN1149620C (en) 2004-05-12

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107037275A (en) * 2016-10-26 2017-08-11 北京航空航天大学 A kind of device for measuring single charged particle charge-mass ratio
CN108590994A (en) * 2018-04-25 2018-09-28 哈尔滨工业大学 A kind of permanent magnetism hall thruster outer magnetic pole structure changing Cathod magnetic field distribution
CN113065494A (en) * 2021-04-13 2021-07-02 清华大学 Vortex electronic mode identification system, method and device and electronic equipment

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107037275A (en) * 2016-10-26 2017-08-11 北京航空航天大学 A kind of device for measuring single charged particle charge-mass ratio
CN107037275B (en) * 2016-10-26 2019-08-16 北京航空航天大学 A kind of device measuring single charged particle charge-mass ratio
CN108590994A (en) * 2018-04-25 2018-09-28 哈尔滨工业大学 A kind of permanent magnetism hall thruster outer magnetic pole structure changing Cathod magnetic field distribution
CN113065494A (en) * 2021-04-13 2021-07-02 清华大学 Vortex electronic mode identification system, method and device and electronic equipment

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