CN107024277A - The linear polarization analyzer and its polarization measurement method modulated based on potassium dideuterium phosphate - Google Patents
The linear polarization analyzer and its polarization measurement method modulated based on potassium dideuterium phosphate Download PDFInfo
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- CN107024277A CN107024277A CN201710230860.8A CN201710230860A CN107024277A CN 107024277 A CN107024277 A CN 107024277A CN 201710230860 A CN201710230860 A CN 201710230860A CN 107024277 A CN107024277 A CN 107024277A
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- 230000010287 polarization Effects 0.000 title claims abstract description 61
- GNSKLFRGEWLPPA-ZSJDYOACSA-M potassium;dideuterio phosphate Chemical compound [K+].[2H]OP([O-])(=O)O[2H] GNSKLFRGEWLPPA-ZSJDYOACSA-M 0.000 title claims abstract description 17
- 238000000691 measurement method Methods 0.000 title claims abstract description 8
- 230000003287 optical effect Effects 0.000 claims abstract description 13
- 239000013078 crystal Substances 0.000 claims abstract description 10
- 238000003384 imaging method Methods 0.000 claims abstract description 9
- 238000001514 detection method Methods 0.000 claims description 6
- 238000006243 chemical reaction Methods 0.000 claims description 5
- 230000001360 synchronised effect Effects 0.000 claims description 5
- 239000010445 mica Substances 0.000 claims description 3
- 229910052618 mica group Inorganic materials 0.000 claims description 3
- 239000010453 quartz Substances 0.000 claims description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 3
- 238000005259 measurement Methods 0.000 abstract description 17
- 230000008901 benefit Effects 0.000 abstract description 6
- 230000035945 sensitivity Effects 0.000 abstract description 5
- 239000011159 matrix material Substances 0.000 description 4
- 238000004458 analytical method Methods 0.000 description 3
- 238000000711 polarimetry Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 2
- ZLMJMSJWJFRBEC-UHFFFAOYSA-N Potassium Chemical compound [K] ZLMJMSJWJFRBEC-UHFFFAOYSA-N 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 229910052700 potassium Inorganic materials 0.000 description 1
- 239000011591 potassium Substances 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 238000009738 saturating Methods 0.000 description 1
- 239000000243 solution Substances 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J4/00—Measuring polarisation of light
- G01J4/04—Polarimeters using electric detection means
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J4/00—Measuring polarisation of light
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- Spectroscopy & Molecular Physics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
The polarization measurement method implemented the invention discloses a kind of linear polarization analyzer modulated based on potassium dideuterium phosphate and based on this linear polarization analyzer.Linear polarization analyzer includes first, second KD being arranged in order along same optical axis*P modulators, quarter wave plate, analyzer, imaging len and detector；Light intensity value is given computer by detector；Signal generator controls ac high-voltage modulator, by ac high-voltage modulator to first, second KD*The frequency plot of P modulators realizes modulation；Computer controls isochronous controller, and isochronous controller synchronizes control to signal generator and detector.The present invention uses two fixed KD*P modulators instead of traditional rotation plus KD*P modulation systems, incident beam, which is injected, just starts measurement, and measuring speed is fast, sensitivity is high, takes full advantage of KD*The high modulation frequency of P crystal.
Description
Technical field
It is applied to remote sensing polarization detection, based on potassium dideuterium phosphate (KD the present invention relates to one kind*P) the line that crystal modulation is realized
Polarization analysis device and the polarization measurement method realized based on this linear polarization analyzer, belong to remote sensing polarization technical field.
Background technology
Based on KD*The linear polarization analyzer of P crystal modulations is a kind of current typical polarimetry instrument, and it is mainly use
In the measurement of sun corona.Traditional KD*P-type linear polarization analyzer is main by a rotatable quarter wave plate, a KD*P is adjusted
Device processed and an analyzer composition.During measurement, two linear polarizations parameter Q and U of incident light are selected by rotating quarter wave plate, then
Pass through KD*P modulators and analyzer realize the modulation and demodulation of two linear polarization parameters.It can see from actual implement, on
The disadvantage for stating conventional polarization measuring method is that the acquisition of Stokes parameters (I, Q, U) needs operation quarter wave plate to revolve it
Turn, and the rotation of quarter wave plate is controlled by electric rotating machine, it is inclined that the response speed of electric rotating machine largely limits line
The measuring speed of vibration analysis device, therefore in actually measurement, the speed for obtaining one group of linear polarization Stokes parameter is slower, it is impossible to fill
Divide and utilize KD*The high modulation frequency (tens kHz) of P crystal, it is impossible to obtain fast-changing polarization signal and by atmospheric turbulance shadow
Sound is larger, reduces polarimetry sensitivity.
The content of the invention
It is an object of the invention to provide a kind of linear polarization analyzer and inclined based on this line modulated based on potassium dideuterium phosphate
The polarization measurement method that vibration analysis device is implemented, it uses two fixed KD*P modulators instead of traditional rotation plus KD*P is adjusted
Mode processed, incident beam, which is injected, just starts measurement, and measuring speed is fast, sensitivity is high, takes full advantage of KD*The high modulation of P crystal
Frequency.
To achieve these goals, present invention employs following technical scheme：
A kind of linear polarization analyzer modulated based on potassium dideuterium phosphate, it is characterised in that：It is included along same optical axis successively
First KD of arrangement*P modulators, the 2nd KD*P modulators, quarter wave plate, analyzer, imaging len and detector；Detector will be visited
Survey the light intensity value obtained and be conveyed to the calculating that computer carries out linear polarization Stokes parameters；Signal generator is modulated to ac high-voltage
The operation of device is controlled, by ac high-voltage modulator to the first KD*P modulators, the 2nd KD*Frequency, the phase of P modulators
Realize modulation；Operation of the computer to isochronous controller is controlled, and isochronous controller is carried out to signal generator and detector
Synchronization Control, so that first, second KD*Frequency, phase-modulation and detector of the P modulators under ac high-voltage modulator function
Optical detection synchronously complete.
The signal generator modulates the first KD by the ac high-voltage modulator with frequency multiplication relation*P modulators
With the 2nd KD*P modulators, the first KD*P modulators, the 2nd KD*The phase delay of P modulators is with ± 90 ° of changes
Change and be modulated.
The optical axis is defined as z-axis, and the perpendicular vertical with z-axis is x/y plane, in the horizontal plane the axle vertical with z-axis
Line is defined as x-axis, and the axis vertical with x-axis is defined as y-axis, wherein：It is the analyzer, the 2nd KD*P modulators, described
The phase retardation of first KD*P modulator threes is in the first quartile that is defined in x/y plane, wherein, the analyzer
The azimuth of fast axle is 0 degree, and the azimuth of the first KD*P modulator fast axles is the side of the 2nd KD*P modulator fast axles
Three times of parallactic angle, the azimuth of the quarter wave plate fast axle is identical with the azimuth of the first KD*P modulator fast axles.
It is preferred that the 2nd KD*P modulators fast axle, the first KD*P modulators fast axle are relative to the analyzer
The angle of fast axle is respectively 22.5 degree, 67.5 degree.
First KD*P modulators, the 2nd KD*P modulators include KDs of the z to cutting*P crystal.
The quarter wave plate be mica or quartz, the analyzer be the dichroism polarizer or the birefringence polarizer, it is described
Detector is photodiode or photomultiplier or ccd image sensor.
A kind of polarization measurement method based on the linear polarization analyzer realization modulated based on potassium dideuterium phosphate, it is special
Levy and be, it includes step：
1) the first KD is adjusted*P modulators, the 2nd KD*P modulators, the quarter wave plate and the analyzer
Azimuth；
2) high voltage and rate-adaptive pacemaker of the ac high-voltage modulator are set；
3) set the signal generator and modulate the first KD*P modulators and the 2nd KD*Times between P modulators
Frequency relation, setting modulates the first KD with ± 90 ° of conversion*P modulators, the 2nd KD*The phase delay of P modulators；
3) signal generator and the detector described in the isochronous controller Synchronization Control, realize the first KD*P is adjusted
Device processed, the 2nd KD*The modulation of P modulators is synchronous between the light signal collection of the detector；
4) the modulation light state of 4 linear independences of representative of the detector based on reception calculates 4 light intensity values, and will
4 light intensity values send the computer to, wherein, 4 light intensity values are designated as I respectively1、I2、I3、I4；
5) computer passes through following formula 1) -4) calculate linear polarization Stokes parameters：
I=(I1+I2+I3+I4)/4 1)
Q=(I1-I2)/2 2)
U=(I3-I4)/2 3)
Sin=[I Q U]T 4)
In above formula：SinFor Stokes parameters, I is total light intensity, Q be horizontal linear polarization component and perpendicular linear polarization component it
Difference, U is the difference of 45 degree of linear polarization components and 135 degree of linear polarization components.
It is an advantage of the invention that：
1st, linear polarization analyzer of the present invention is rational in infrastructure, practicality, uses two fixed KD*P modulators instead of tradition
Rotation add KD*P modulation systems, in the absence of the part for needing to rotate, incident beam just starts measurement, measuring speed after injecting
It hurry up, modulating speed is fast, measurement sensitivity is high, takes full advantage of KD*The high modulation frequency of P crystal.
2nd, stable and reliable operation of the present invention, convenient and simple for operation, directly measurement can be completed by computer, without people
Work participates in cumbersome operation, and measurement accuracy is high, and measurement efficiency is high.
Brief description of the drawings
Fig. 1 is the principle of compositionality figure of linear polarization analyzer of the present invention.
Fig. 2 is the azimuthal coordinates figure that the present invention is defined.
Fig. 3 is analyzer, the first KD*P modulators, the 2nd KD*P modulators and quarter wave plate put azimuth explanation figure.
Embodiment
As shown in figure 1, the present invention is based on potassium dideuterium phosphate (KD*P) the linear polarization analyzer of modulation is included along same optical axis
The first KD being arranged in order*P modulators 11, the 2nd KD*P modulators 12, quarter wave plate 13, analyzer 14, imaging len 15 and spy
Survey device 16；The light intensity value for detecting acquisition is conveyed to the calculating that computer 17 carries out linear polarization Stokes parameters by detector 16；Letter
Number operation of the generator 19 to ac high-voltage modulator 18 is controlled, and passes through 18 couple of the first KD of ac high-voltage modulator*P is modulated
Device 11, the 2nd KD*Frequency, the phase of P modulators 12 realize modulation；Operation of the computer 17 to isochronous controller 10 is controlled
System, isochronous controller 10 synchronizes control to signal generator 19 and detector 16, so that first, second KD*P modulators
11st, 12 frequencies under the effect of ac high-voltage modulator 18, phase-modulation and detector 16 optical detection it is same within the same time
Step is completed.
As schemed, computer 17 sends measurement instruction to isochronous controller 10, then the synchronous control signal of isochronous controller 10
Generator 19 and detector 16 work, so that first, second KD*P modulators 11,12 are realized frequency by ac high-voltage modulator 18
Realize that the two actions of optical detection are synchronous with phase adjusted and detector 16 to perform.Then, the incident beam of injection is passed sequentially through
First, second KD*Received, detect by detector 16 after P modulators 11,12, quarter wave plate 13, analyzer 14 and imaging len 15
The light intensity value result that device 16 is obtained after being processed to is sent to computer 17 and is further processed, to ask for linear polarization
Stokes parameters.
When actually implementing, signal generator 19 modulates the first KD by ac high-voltage modulator 18 with frequency multiplication relation*P is adjusted
The KD of device 11 and the 2nd processed*P modulators 12, for example preferably, the 2nd KD*The frequency of P modulators 12 is twice of the first KD*P is modulated
The frequency of device 11, even the first KD*The frequency of P modulators 11 is f, then the 2nd KD*The frequency of P modulators 12 is 2f.First KD*P
Modulator 11, the 2nd KD*The phase delay of P modulators 12 is modulated with ± 90 ° of conversion, that is, sets the first KD*P modulators 11,
2nd KD*The phase delay of P modulators 12 is 90 °, ac high-voltage modulation under respectively [90 ° 90 °], [90 ° -90 °], [-
90 ° 90 °], convert between [- 90 ° -90 °], so that implementing phase is modulated.
When actually implementing, the phase delay of quarter wave plate 13 may be set to 90 °.
In the present invention, optical axis is defined as z-axis, and the perpendicular vertical with z-axis is x/y plane, in the horizontal plane with z-axis
Vertical axis is defined as x-axis, and the axis vertical with x-axis is defined as y-axis, wherein：The fast axle of analyzer 14, the 2nd KD*P modulators
First quartile that 12 fast axles, the azimuth of the fast axle three of the first KD*P modulators 11 are in defining in x/y plane (or say same
In quadrant) in, wherein, the azimuth of the fast axle of analyzer 14 is 0 degree, the i.e. azimuth of the fast axle of analyzer 14 along x-axis direction
Set, the azimuth of the fast axle of the first KD*P modulators 11 is the azimuth of the fast axle of the 2nd KD*P modulators 12 of three times, quarter wave plate
The azimuth of 13 fast axles is identical with the azimuth of the fast axle of the first KD*P modulators 11.
In other words, the present invention is using the three-dimensional system of coordinate shown in Fig. 2：
The direction of propagation of incident beam is defined as z-axis forward direction, i.e. the first KD*P modulators 11, the 2nd KD*P modulators 12,1/
4 wave plates 13, analyzer 14, imaging len 15 and detector 16 are coaxially disposed with z-axis (optical axis), vertical with z-axis in the horizontal plane
Axis be defined as x-axis, x-axis forward direction may be defined as towards paper, and being defined as y-axis, i.e. xy with z-axis, x-axis vertical axis puts down
Face is vertical with z-axis, and y-axis forward direction may be defined as upward, and then the first quartile of x/y plane is just limited.
Show that the fast axle of analyzer 14, the fast axle of the 2nd KD*P modulators 12, the first KD*P modulators 11 are fast in such as Fig. 3, figure
The azimuth of axle and the fast axle of quarter wave plate 13 in the x/y plane first quartile of definition is set.
Preferably, the fast axle of the 2nd KD*P modulators 12, the fast axle of the first KD*P modulators 11 are relative to the fast axle of analyzer 14
Angle is respectively 22.5 degree (referring to shown in Fig. 3 chain lines), 67.5 degree (referring to shown in dotted line in Fig. 3).
In the present invention, the fast direction of light vector spread speed is defined as fast axle, and the direction vertical with fast axle is defined as slowly
Axle, fast axle, slow axis are optical concept known in the art.
In actual design, the first KD*P modulators 11, the 2nd KD*P modulators 12 include KDs of the z to cutting*P is brilliant
Body (potassium dideuterium-hydrogen phosphate crystal).
Quarter wave plate 13 is using mica or quartz or the wave plate of other materials.
Analyzer 14 uses the dichroism polarizer or the birefringence polarizer.
The lens known to of imaging len 15.
Detector 16 uses photodiode or photomultiplier or ccd image sensor, in practice preferred ccd image
Sensor.
The linear polarization analyzer modulated based on the invention described above potassium dideuterium phosphate, the invention also provides a kind of polarimetry
Method, it includes step：
1) the first KD is adjusted*P modulators 11, the 2nd KD*The azimuth of P modulators 12, quarter wave plate 13 and analyzer 14；
2) high voltage of setting ac high-voltage modulator 18 and frequency f outputs, high voltage range are controlled in 700v-
Between 2000v, it is 900v for example to choose output voltage, and frequency range is controlled between 10Hz-75Hz, for example, choose output frequency
F is 30Hz；
3) setting signal generator 19 modulates the first KD*The KD of P modulators 11 and the 2nd*Frequency multiplication between P modulators 12 is closed
System, setting modulates the first KD*P modulators 11, the 2nd KD with ± 90 ° of conversion*The phase delay of P modulators 12；
3) computer 17 sends measurement instruction, and isochronous controller 10 sends pulse signal, synchronous control signal generator 19
With detector 16, the first KD is realized*P modulators 11, the 2nd KD*The modulation of P modulators 12 and the light signal collection of detector 16 it
Between synchronization；
4) incident beam passes sequentially through first, second KD*P modulators 11,12, quarter wave plate 13, analyzer 14 and imaging are saturating
Received after mirror 15 by detector 16, the modulation light state of 4 linear independences of the representative based on reception of detector 16 calculates 4 light
Intensity values, and send this 4 light intensity values to computer 17, wherein, 4 light intensity values are designated as I respectively1、I2、I3、I4；
5) computer 17 is by following formula 1) -4) calculate and can describe the linear polarization of incident beam polarization state and luminous intensity comprehensively
Stokes parameters (Stokes' parameter)：
I=(I1+I2+I3+I4)/4 1)
Q=(I1-I2)/2 2)
U=(I3-I4)/2 3)
Sin=[I Q U]T 4)
In above formula：SinFor Stokes parameters, I is total light intensity, Q be horizontal linear polarization component and perpendicular linear polarization component it
Difference, U is the difference of 45 degree of linear polarization components and 135 degree of linear polarization components, formula 4) in T represent transposed matrix.
The implementation principle of polarization measurement method of the present invention is：
Set the Stokes parameters S of incident beaminFor [I Q U]T, modulating frequency is set as f, adjustment ac high-voltage modulation
The output voltage of device 18, the phase delay for making first, second KD*P modulators 11,12 is 90 °.Then, computer 17 is by same
The Synchronization Control detector 16 of controller 10 and signal generator 19 are walked, signal generator 19 is adjusted with f and the frequency multiplication relations of 2f two respectively
Make first, second KD*P modulators 11,12.
Then, when incident beam is injected, adjusted via first, second KD*P modulators 11,12, quarter wave plate 13, analyzer 14
After system, by being received after imaging len 15 by detector 16.
Theoretical according to the Mueller matrixes (mueller matrix) of polarization optics, the light intensity I that detector 16 is received can be expressed as down
Formula 5)：
I=[1 0 0] MAR(-θ1)M1/4R(θ1)R(-θ2)MKD*P2R(θ2)R(-θ1)MKD*P1R(θ1)[I Q U]T 5)
Formula 5) in：
R(θ1)、R(-θ1)、R(θ2)、R(-θ2) it is respectively spin matrix, MA、M1/4、MKD*P2、MKD*P1Respectively analyzer
14th, quarter wave plate 13, the 2nd KD*P modulators 12, the first KD*The Mueller matrixes of P modulators 11, and above-mentioned matrix uses following formula
Represent：
Wherein：θ1For azimuth of the fast axle in x/y plane of the first KD*P modulators 11 and quarter wave plate 13, θ2For second
Azimuth of the fast axle of KD*P modulators 12 in x/y plane, such as θ1=67.5 °, θ2=22.5 °；δ1、δ2And δ1/4Respectively
The phase delay of first KD*P modulators 11, the 2nd KD*P modulators 12 and quarter wave plate 13.
It is calculated as below in detector 16：
A) δ is worked as1=90 °, δ2=90 °, δ1/4At=90 °, the light intensity value I that detector 16 is obtained1=I+Q；
B) δ is worked as1=90 °, δ2=-90 °, δ1/4At=90 °, the light intensity value I that detector 16 is obtained2=I-Q；
C) δ is worked as1=-90 °, δ2=90 °, δ1/4At=90 °, the light intensity value I that detector 16 is obtained3=I+U；
D) δ is worked as1=-90 °, δ2=-90 °, δ1/4At=90 °, the light intensity value I that detector 16 is obtained4=I-U；
Then, in computer 17, Stokes parameters SinCalculated and obtained by following formula：
I=(I1+I2+I3+I4)/4 1)
Q=(I1-I2)/2 2)
U=(I3-I4)/2 3)
Sin=[I Q U]T 4)
It is an advantage of the invention that：
1st, linear polarization analyzer of the present invention is rational in infrastructure, practicality, uses two fixed KD*P modulators instead of tradition
Rotation KD*P modulation systems, in the absence of the part for needing to rotate, incident beam just starts measurement after injecting, and measuring speed is fast,
Modulating speed is fast, and measurement sensitivity is high, takes full advantage of KD*The high modulation frequency of P crystal.
2nd, stable and reliable operation of the present invention, convenient and simple for operation, directly measurement can be completed by computer, without people
Work participates in cumbersome operation, and measurement accuracy is high, and measurement efficiency is high.
The technical principle described above for being present pre-ferred embodiments and its being used, comes for those skilled in the art
Say, without departing from the spirit and scope of the present invention, any equivalent transformation based on the basis of technical solution of the present invention,
Simple replacement etc. is obvious to be changed, and is belonged within the scope of the present invention.
Claims (8)
1. a kind of linear polarization analyzer modulated based on potassium dideuterium phosphate, it is characterised in that：It includes arranging successively along same optical axis
First KD of row*P modulators, the 2nd KD*P modulators, quarter wave plate, analyzer, imaging len and detector；Detector will be detected
The light intensity value of acquisition is conveyed to the calculating that computer carries out linear polarization Stokes parameters；Signal generator is to ac high-voltage modulator
Operation be controlled, by ac high-voltage modulator to the first KD*P modulators, the 2nd KD*Frequency, the phase of P modulators are real
Now modulate；Operation of the computer to isochronous controller is controlled, and isochronous controller carries out same to signal generator and detector
Step control, so that first, second KD*Frequency of the P modulators under ac high-voltage modulator function, phase-modulation and detector
Optical detection is synchronously completed.
2. the linear polarization analyzer as claimed in claim 1 modulated based on potassium dideuterium phosphate, it is characterised in that：
The signal generator modulates the first KD by the ac high-voltage modulator with frequency multiplication relation*P modulators and described
2nd KD*P modulators, the first KD*P modulators, the 2nd KD*The phase delay of P modulators is carried out with ± 90 ° of conversion
Modulation.
3. the linear polarization analyzer as claimed in claim 1 modulated based on potassium dideuterium phosphate, it is characterised in that：
The phase delay of the quarter wave plate is 90 °.
4. the linear polarization analyzer as claimed in claim 1 modulated based on potassium dideuterium phosphate, it is characterised in that：
The optical axis is defined as z-axis, and the perpendicular vertical with z-axis is x/y plane, and the axis vertical with z-axis is determined in the horizontal plane
Justice is x-axis, and the axis vertical with x-axis is defined as y-axis, wherein：The analyzer, the 2nd KD*P modulators, described first
The phase retardation of KD*P modulator threes is in the first quartile that is defined in x/y plane, wherein, the analyzer fast axle
Azimuth be 0 degree, the azimuth of the first KD*P modulator fast axles is the azimuth of the 2nd KD*P modulator fast axles
Three times, the azimuth of the quarter wave plate fast axle is identical with the azimuth of the first KD*P modulator fast axles.
5. the linear polarization analyzer as claimed in claim 4 modulated based on potassium dideuterium phosphate, it is characterised in that：
The angle point of the 2nd KD*P modulators fast axle, the first KD*P modulators fast axle relative to the analyzer fast axle
Wei not be 22.5 degree, 67.5 degree.
6. the linear polarization analyzer as claimed in claim 1 modulated based on potassium dideuterium phosphate, it is characterised in that：
First KD*P modulators, the 2nd KD*P modulators include KDs of the z to cutting*P crystal.
7. the linear polarization analyzer as claimed in claim 1 modulated based on potassium dideuterium phosphate, it is characterised in that：
The quarter wave plate is mica or quartz, and the analyzer is the dichroism polarizer or the birefringence polarizer, the detection
Device is photodiode or photomultiplier or ccd image sensor.
8. it is a kind of based on being realized based on the linear polarization analyzer that potassium dideuterium phosphate is modulated any one of claim 1 to 7
Polarization measurement method, it is characterised in that it include step：
1) the first KD is adjusted*P modulators, the 2nd KD*The orientation of P modulators, the quarter wave plate and the analyzer
Angle；
2) high voltage and rate-adaptive pacemaker of the ac high-voltage modulator are set；
3) set the signal generator and modulate the first KD*P modulators and the 2nd KD*Frequency multiplication between P modulators is closed
System, setting modulates the first KD with ± 90 ° of conversion*P modulators, the 2nd KD*The phase delay of P modulators；
3) signal generator and the detector described in the isochronous controller Synchronization Control, realize the first KD*P modulators,
2nd KD*The modulation of P modulators is synchronous between the light signal collection of the detector；
4) the modulation light state of 4 linear independences of representative of the detector based on reception calculates 4 light intensity values, and by 4
Light intensity value sends the computer to, wherein, 4 light intensity values are designated as I respectively1、I2、I3、I4；
5) computer passes through following formula 1) -4) calculate linear polarization Stokes parameters：
I=(I1+I2+I3+I4)/4 1)
Q=(I1-I2)/2 2)
U=(I3-I4)/2 3)
Sin=[I Q U]T 4)
In above formula：SinFor Stokes parameters, I is total light intensity, and Q is the difference of horizontal linear polarization component and perpendicular linear polarization component, and U is
The difference of 45 degree of linear polarization components and 135 degree of linear polarization components.
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| CN1811357A (en) * | 2005-01-21 | 2006-08-02 | 北海道Tlo株式会社 | Spectroscopic polarimetry |
| US20070030551A1 (en) * | 2005-08-02 | 2007-02-08 | National University Corporation Hokkaido University | Imaging polarimetry |
| US20100201969A1 (en) * | 2006-02-13 | 2010-08-12 | Yingyin Kevin Zou | Polarization Imaging Apparatus with Auto-Calibration |
| CN201149541Y (en) * | 2007-12-07 | 2008-11-12 | 大恒新纪元科技股份有限公司北京光电技术研究所 | Optical phase defer precision measurement system |
| WO2015006788A1 (en) * | 2013-07-16 | 2015-01-22 | "Yerevan State University" State Non-Commercial Organization | The method for registration of changes of polarization state of monochromatic light radiation |
| CN104535192A (en) * | 2015-01-09 | 2015-04-22 | 北京理工大学 | Stokes polarization meter error calibration and compensation method based on wave plate rotating method |
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