CN106959166B - The measuring device and method of any repetition rate femtosecond laser time jitter - Google Patents
The measuring device and method of any repetition rate femtosecond laser time jitter Download PDFInfo
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- CN106959166B CN106959166B CN201710097721.2A CN201710097721A CN106959166B CN 106959166 B CN106959166 B CN 106959166B CN 201710097721 A CN201710097721 A CN 201710097721A CN 106959166 B CN106959166 B CN 106959166B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J11/00—Measuring the characteristics of individual optical pulses or of optical pulse trains
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Abstract
The present invention discloses a kind of measuring device for any repetition rate femtosecond laser time jitter.The device is based on the method that balance cross-correlation method is used to measure high repetition frequency (tens of megahertzs) laser dithering, pass through data collecting card collection voltages signal, and handled by software and extract error signal, so that the system is used successfully to the measurement of the time jitter of any repetitive frequency laser.The present invention successfully solves the problems, such as the measurement of any repetition rate femtosecond laser time jitter, have the characteristics that be simple and efficient with it is practical.
Description
Technical field
The present invention relates to ultra-fast optical field, non-linear optical field and digital processing fields, in particular to a kind of
The measuring device and method of any repetition rate femtosecond laser time jitter.
Background technique
In ultra-fast optical field and high power pulsed laser device field, it is high that coherently combined has been considered as the following raising
The effective ways of power pulsed laser peak power density.Femtosecond laser coherent close beam premise be between accurate control light beam when
Jitter, balance cross-correlation detection method are the effective ways of current femtosecond laser time jitter measurement, have precision height, measurement
The feature that optical path is simple and processing method is simple.But existing balance cross-correlation detection method is analog circuitry processes mode,
Suitable for high repetition frequency femtosecond laser (tens of MHz), it is not particularly suited for processing MHz or less femtosecond laser.However, in high power
Impulse laser unit field, the femtosecond laser of coherently combined are mostly low-repetition-frequency (KHz or less).It is low heavy it is therefore desirable to propose
The detection method of the time jitter signal of complex frequency (KHz or less) femtosecond laser.
Summary of the invention
The purpose of the present invention is to solve the measurements of low repetition frequency femtosecond laser (KHz or less) time jitter.The device
The method that original balance cross-correlation method is used to measure high repetition frequency (tens of megahertzs) laser dithering is improved, data are passed through
Capture card collection voltages signal, and handled by software and extract error signal, so that the system is used successfully to any repetition rate
The measurement of the time jitter of laser.The measurement that the present invention successfully solves any repetition rate femtosecond laser time jitter is asked
Topic, have the characteristics that be simple and efficient with it is practical.
In order to achieve the above-mentioned object of the invention, technical solution of the invention is as follows:
By data collecting card, electric signal obtained by balance photodetector in balance cross-correlation detection method is extracted,
The processing such as filtering, to obtain the time jitter information of laser.
A kind of measurement method for any repetition rate femtosecond laser time jitter, the specific steps are as follows:
Step 1 adjusts the second light beam, makes it by half wave plate, adjusts the first light beam and the second light beam, make first
Light beam and the second light beam reach room and time coincidence at Glan prism；
Step 2, the angle for adjusting two class frequency doubling nonlinear crystal, keep two class frequency-doubled effects most strong, generate first via frequency multiplication
Light；
Step 3 adjusts dichroic mirror, so that remaining fundamental frequency light is again passed by two class frequency doubling nonlinear crystal, and two classes times occur
Frequency effect generates the second road frequency doubled light；
Step 4 adjusts high reflective mirror and balances the angle of photodetector, makes the first via and the second road frequency doubled light in balance light
After response on electric explorer is equal, subtract voltage signal by balancing photodetector output phase, this subtracts each other voltage signal and includes
The time difference information of first light beam and the second light beam；
Step 5 is acquired and is conveyed by subtract each other voltage signal of the data collecting card to balance photodetector output
It is handled to signal processing module, the specific steps are as follows:
Firstly, selecting sampling configuration for N sampling；
Then, it is adopted according to the first light beam or the sample rate N of the first light beam repetition frequency setting capture card, i.e. sample rate N=
The sample frequency ÷ light beam repetition rate of truck；
Finally, the signal in each sampling period is filtered, maximum value, as surveyed error signal are chosen.
The measurement method for any Repetition-radted laser time jitter, which is characterized in that the photoelectricity is visited
The repetition rate of the bandwidth and the first light beam or the second light beam of surveying device matches.
The measurement method for any Repetition-radted laser time jitter, which is characterized in that the data are adopted
The frequency acquisition of truck and the bandwidth of photodetector match, i.e., the maximum sample frequency of data collecting card is greater than balance photoelectricity
It is more than the three times of detector bandwidth.
The measurement method for any Repetition-radted laser time jitter, the signal processing module acquire speed
Rate is identical as the repetition rate of the first light beam or the second light beam.
The measurement method for any Repetition-radted laser time jitter, which is characterized in that by adjusting first
The intensity of light beam and the second light beam makes the intensity for subtracting each other voltage signal be greater than the strong of balance photodetector noise signal
Degree.
Compared with prior art, the beneficial effects of the present invention are:
1) it solves balance photo-detection method at present and is not used to asking for MHz or less femtosecond laser time jitter measurement
Topic, the present apparatus can be used for the measurement of any repetition rate femtosecond laser time jitter；
2) have signal-to-noise ratio adjustable, the distortionless feature of signal；
3) have the characteristics that convenient experimental operation, be simple and efficient with it is practical.
Detailed description of the invention
Fig. 1 is the structural schematic diagram of the measuring device of any repetition rate femtosecond laser time jitter of the invention
Fig. 2 is data signal sampling and processing flow chart
Specific embodiment
The present invention will be described in detail with reference to the accompanying drawings and examples.
The purpose of the present invention is to solve the measurements of low repetition frequency femtosecond laser (KHz or less) time jitter.The device
The method that original balance cross-correlation method is used to measure high repetition frequency (tens of megahertzs) laser dithering is improved, data are passed through
Capture card collection voltages signal, and handled by software and extract error signal, so that the system is used successfully to any repetition rate
The measurement of the time jitter of laser.The measurement that the present invention successfully solves any repetition rate femtosecond laser time jitter is asked
Topic, have the characteristics that be simple and efficient with it is practical.
A kind of measuring device for any repetition rate femtosecond laser time jitter, the specific steps are as follows:
Step 1 adjusts the second light beam 2, makes it by half wave plate 3, adjusts the first light beam 1 and the second light beam 2, make
First light beam 1 and the second light beam 2 reach room and time coincidence at Glan prism 4；
Step 2, the angle for adjusting two class frequency doubling nonlinear crystal 6, keep two class frequency-doubled effects most strong, generate first via frequency multiplication
Light；
Step 3 adjusts dichroic mirror 7, so that remaining fundamental frequency light is again passed by two class frequency doubling nonlinear crystal 6, and two classes occur
Frequency-doubled effect generates the second road frequency doubled light；
Step 4 adjusts high reflective mirror 8 and balances the angle of photodetector 9, is balancing the first via and the second road frequency doubled light
After response on photodetector is equal, subtract voltage signal by balancing 9 output phase of photodetector, this subtracts each other voltage signal packet
Time difference information containing the first light beam 1 and the second light beam 2；
Step 5 is acquired and defeated by the voltage signal that subtracts each other that 10 pairs of balance photodetectors 9 of data collecting card export
It send to signal processing module 11 and is handled, the specific steps are as follows:
Firstly, selecting sampling configuration for N sampling；
Then, according to the first light beam 1 or the sample rate N, i.e. sample rate N=of 2 repetition frequency of the first light beam setting capture card
The sample frequency ÷ light beam repetition rate of capture card；
Finally, the signal in each sampling period is filtered, maximum value, as surveyed error signal are chosen.
It is 1000Hz with light beam repetition rate, balance photodetector bandwidth is 0.1MHz, noise 2.0mV, and data adopt
It is 2MHz that truck, which acquires speed, then program processing speed is that every 1ms acquires 2000 data from balance photodetector, and mentions
The maximum value in 2000 data points is taken, which is the data for including time jitter information.
Finally it should be noted that the above examples are only used to illustrate the technical scheme of the present invention and are not limiting.Although ginseng
It is described the invention in detail according to embodiment, those skilled in the art should understand that, to technical side of the invention
Case is modified or replaced equivalently, and without departure from the spirit and scope of technical solution of the present invention, should all be covered in the present invention
Scope of the claims in.
Claims (6)
1. a kind of measurement method of any repetition rate femtosecond laser time jitter, which is characterized in that utilize any repetition rate
The measuring device of femtosecond laser time jitter, the measuring device include the first light beam (1), the second light beam (2), half wave plate
(3), Glan prism (4), the first dichroic mirror (5), two class frequency doubling nonlinear crystal (6), the second dichroic mirror (7), high reflective mirror (8),
Balance photodetector (9), data collecting card (10) and signal processing module (11)；
First light beam (1) is that the two beam directions of propagation are orthogonal, polarization direction is identical, repetition frequency with the second light beam (2)
The identical fundamental frequency light to be measured of rate, the second light beam (2) is after half wave plate (3) transmit, with the first light beam (1) in Glan rib
Beam is closed at mirror (4), the light after closing beam injects two class frequency doubling nonlinear crystal (6), and produce after the first dichroic mirror (5) transmission
Raw first via frequency doubled light, the first via frequency doubled light are incident in balance photodetector (9) through the second dichroic mirror (7), remaining
Fundamental frequency light injects two class frequency doubling nonlinear crystal (6) after the second dichroic mirror (7) are reflected, and generates the second road frequency doubled light, this second
Road frequency doubled light successively after the first dichroic mirror (5) and high reflective mirror (8) reflection, is incident in balance photodetector (9)；Described
The output end of balance photodetector (9) is connected with the input terminal of data collecting card (10), the output of the data collecting card (10)
End is connected with the input terminal of signal processing module (11), which includes the following steps:
Step 1 adjusts the second light beam (2), makes it by half wave plate (3), adjusts the first light beam (1) and the second light beam
(2), the first light beam (1) and the second light beam (2) is made to reach room and time coincidence at Glan prism (4)；
Step 2, the angle for adjusting two class frequency doubling nonlinear crystal (6), keep two class frequency-doubled effects most strong, generate first via frequency multiplication
Light；
Step 3 adjusts the second dichroic mirror (7), so that remaining fundamental frequency light is again passed by two class frequency doubling nonlinear crystal (6), and occur
Two class frequency-doubled effects generate the second road frequency doubled light；
Step 4 adjusts high reflective mirror (8) and balances the angle of photodetector (9), is balancing the first via and the second road frequency doubled light
After response on photodetector is equal, subtract voltage signal by balancing photodetector (9) output phase, this subtracts each other voltage signal
Time difference information comprising the first light beam (1) and the second light beam (2)；
Step 5 is acquired and defeated by the voltage signal that subtracts each other of data collecting card (10) to balance photodetector (9) output
It send to signal processing module (11) and is handled, the specific steps are as follows:
Firstly, selecting sampling configuration for N sampling；
Then, according to the first light beam (1) or the sample rate N, i.e. sample rate N=of the first light beam (2) repetition frequency setting capture card
The sample frequency ÷ light beam repetition rate of capture card；
Finally, the signal in each sampling period is filtered, maximum value, as surveyed error signal are chosen.
2. the measurement method of any repetition rate femtosecond laser time jitter according to claim 1, which is characterized in that institute
The bandwidth for the balance photodetector (9) stated and the repetition rate of the first light beam (1) or the second light beam (2) match.
3. the measurement method of any repetition rate femtosecond laser time jitter according to claim 1, which is characterized in that institute
The frequency acquisition for the data collecting card (10) stated and the bandwidth for balancing photodetector (9) match, i.e., data collecting card is most
Big sample frequency is to balance the three times of photodetector bandwidth or more.
4. the measurement method of any repetition rate femtosecond laser time jitter according to claim 1, at the signal
It is identical as the repetition rate of the first light beam (1) or the second light beam (2) to manage module (11) acquisition rate.
5. the measurement method of any repetition rate femtosecond laser time jitter according to claim 1, which is characterized in that logical
The intensity for overregulating the first light beam (1) and the second light beam (2) makes the intensity for subtracting each other voltage signal be greater than balance photoelectricity and visits
Survey the intensity of device (9) noise signal.
6. the measurement method of any repetition rate femtosecond laser time jitter according to claim 1, which is characterized in that institute
The first dichroic mirror (5) stated is that fundamental frequency light is high thoroughly, frequency doubled light is high instead, the dichroic mirror that incident angle is 45 °, the second dichroic mirror (7)
For high anti-, the high dichroic mirror saturating, incident angle is 0 ° of frequency doubled light of fundamental frequency light.
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| CN109489838B (en) * | 2018-10-25 | 2020-01-31 | 北京无线电计量测试研究所 | high-precision pulse time domain jitter characteristic measuring method |
| CN110954224B (en) * | 2019-11-26 | 2023-06-02 | 北京无线电计量测试研究所 | Time jitter spectrum measuring device and method |
| CN114459621A (en) * | 2022-02-10 | 2022-05-10 | 中国空间技术研究院 | Superconducting X-ray detector time jitter calibration system and method |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005252145A (en) * | 2004-03-08 | 2005-09-15 | Nippon Telegr & Teleph Corp <Ntt> | Optical pulse pair generator and terahertz electromagnetic wave generator |
| CN102680099A (en) * | 2012-05-04 | 2012-09-19 | 北京航空航天大学 | Method and system for generating and detecting terahenz pulse |
| CN105911793A (en) * | 2016-06-28 | 2016-08-31 | 山东大学 | Cascaded optical frequency converter based on monolithic phosphate crystal and application of cascaded optical frequency converter |
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Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005252145A (en) * | 2004-03-08 | 2005-09-15 | Nippon Telegr & Teleph Corp <Ntt> | Optical pulse pair generator and terahertz electromagnetic wave generator |
| CN102680099A (en) * | 2012-05-04 | 2012-09-19 | 北京航空航天大学 | Method and system for generating and detecting terahenz pulse |
| CN105911793A (en) * | 2016-06-28 | 2016-08-31 | 山东大学 | Cascaded optical frequency converter based on monolithic phosphate crystal and application of cascaded optical frequency converter |
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