CN106950514A - Mechanism for testing and its light splitting machine and braider for testing the integrated modules of LED - Google Patents
Mechanism for testing and its light splitting machine and braider for testing the integrated modules of LED Download PDFInfo
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- CN106950514A CN106950514A CN201710250355.XA CN201710250355A CN106950514A CN 106950514 A CN106950514 A CN 106950514A CN 201710250355 A CN201710250355 A CN 201710250355A CN 106950514 A CN106950514 A CN 106950514A
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- 238000012360 testing method Methods 0.000 title claims abstract description 185
- 230000007246 mechanism Effects 0.000 title claims abstract description 105
- 239000000523 sample Substances 0.000 claims abstract description 66
- 239000011324 bead Substances 0.000 claims abstract description 46
- 238000001514 detection method Methods 0.000 description 9
- 238000005538 encapsulation Methods 0.000 description 5
- 239000011521 glass Substances 0.000 description 5
- 239000000463 material Substances 0.000 description 5
- 239000002184 metal Substances 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 4
- 239000002699 waste material Substances 0.000 description 4
- 230000005611 electricity Effects 0.000 description 3
- 238000004611 spectroscopical analysis Methods 0.000 description 3
- 238000005266 casting Methods 0.000 description 2
- 238000005520 cutting process Methods 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 238000012546 transfer Methods 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 239000012141 concentrate Substances 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000005034 decoration Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 230000004807 localization Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 238000004804 winding Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/44—Testing lamps
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/34—Sorting according to other particular properties
- B07C5/342—Sorting according to other particular properties according to optical properties, e.g. colour
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/34—Sorting according to other particular properties
- B07C5/344—Sorting according to other particular properties according to electric or electromagnetic properties
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65B—MACHINES, APPARATUS OR DEVICES FOR, OR METHODS OF, PACKAGING ARTICLES OR MATERIALS; UNPACKING
- B65B9/00—Enclosing successive articles, or quantities of material, e.g. liquids or semiliquids, in flat, folded, or tubular webs of flexible sheet material; Subdividing filled flexible tubes to form packages
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention provides a kind of mechanism for testing and its light splitting machine and braider for being used to test the integrated modules of LED, including rotating disk mechanism and at least two testing stations, the testing station is set around rotating disk mechanism side, the testing station is provided with least one set of probe groups in vertical direction, the probe groups are corresponding with all pins of the single led lamp bead on the integrated modules of LED to be measured, all pins for testing single led lamp bead, the quantity sum of the probe groups of all testing stations is equal to the quantity sum of the LED lamp bead of the integrated modules of LED to be measured.The present invention is detected, detected when different in a testing station by will set multiple testing stations respectively to the LED lamp bead on the integrated modules of LED, it is to avoid the problem of causing to be difficult to detect because LED lamp bead spacing is too small.
Description
Technical field
The present invention relates to mechanical field, more particularly to a kind of mechanism for testing for being used to test the integrated modules of LED and its
Light splitting machine and braider.
Background technology
Paster type light emitting type (SMD（surface mount device）LED) it is a kind of novel surface mounted type half
Conductor luminescent device, with small volume, angle of scattering is big, uniformity of luminance is good, high reliability, and glow color includes white light
Shades of colour inside, therefore, is widely used in display screen, liquid crystal panel backlight, decoration light and general illumination etc. various
On electronic product.
Color separation light-splitting processing must be carried out before being dispatched from the factory due to LED encapsulation, according to the parameter handle such as wavelength, brightness and operating voltage
LED is divided into many shelves（Bin）And classification, then the testing standard automatically according to setting LED is divided in different Bin manage.
And light splitting machine is exactly the parameters such as wavelength (color), light intensity, the Current Voltage size by sending light to LED progress category filter
Machine, its operation principle is to be responsible for feeding by circular vibration disk and parallel vibrating track, and LED is delivered into rotating disk by suction nozzle,
After measuring photoelectric characteristic via testing station, system can be according to the test result of measuring instrument, (mainly including wavelength (face
Color), light intensity, Current Voltage size classified) LED is delivered to by affiliated blanking box by feeding distribution mechanism.
Braider is then mainly used in scattered wire type electronic component (such as electric capacity, diode, triode and inductance
Deng) braid, its basic framework is to be responsible for feeding by circular vibration disk vibrations track parallel with one group, then by special suction nozzle by electronics
Component is sequentially sent into testing station, and underproof electronic component is blown into waste material box again after judging via polarity, will be qualified
Electronic component is sequentially sent into winding and packed and finishes.For LED braids, be attached on corresponding electrical equipment in LED or
To realize industrialized produce in enormous quantities to before LED progress braid encapsulation, all should accordingly be tested LED, so that raw
The electronic product that output is come can be used normally.
Light splitting machine and braider are required for using mechanism for testing in actual applications to be detected to electronic component, tradition
Light splitting machine and braider mechanism for testing typically only have single testing station, own by probe from both sides or bottom to LED
Pin is tested simultaneously, but existing small space distance LED display screen is mainly sealed using the model such as 2121,1515,1010,0808
Device is filled, with the diminution of LED display pel spacing, the spacing between pin also constantly reduces, in particular with LED display
Development, it is existing single attachment the mode of production gradually to the integrated modules of LED mounting method change, such as COB（chip
On board）Integrated module etc..It is integrated with multiple LED lamp beads on the integrated modules of single LED, and the diameter of probe is minimum also about
0.15mm is wanted, when being integrated with multiple LED lamp beads on the integrated modules of LED, because the spacing between lamp bead is too small, how to LED collection
Pin progress test into module is become for problem.Especially for SMD LED, many of its pin concentrates on bottom, it is difficult to
Tested using traditional mechanism for testing.
Therefore, prior art has yet to be improved and developed.
The content of the invention
It is an object of the invention to provide a kind of mechanism for testing and its light splitting machine and braid for being used to test the integrated modules of LED
Machine, it is intended to solve the problem of existing mechanism for testing is difficult to detect the pin of the integrated modules of LED.
To solve the above problems, technical scheme is as follows：
A kind of mechanism for testing for being used to test the integrated modules of LED, including rotating disk mechanism and at least two testing stations, the testing station
Set around rotating disk mechanism side, the testing station is provided with least one set of probe groups in vertical direction, the probe groups with
All pins correspondence of single led lamp bead on the integrated modules of LED to be measured, all pins for testing single led lamp bead, institute
The quantity sum for having the probe groups of testing station is equal to the quantity sum of the LED lamp bead of the integrated modules of LED to be measured.
The described mechanism for testing for being used to test the integrated modules of LED, wherein, the testing station includes at least two groups probes
Group, the probe groups are corresponding with the position of the LED lamp bead in diagonal angle on the integrated modules of LED to be measured.
The described mechanism for testing for being used to test the integrated modules of LED, wherein, the testing station includes probe base, institute
Probe groups are stated to be vertically disposed in the probe base.
The described mechanism for testing for being used to test the integrated modules of LED, wherein, the testing station include the first fixed seat and with
The second fixed seat that first fixed seat is at right angles connected, the second fixed seat tail end is rotatably connected to oscillating deck, described
The oscillating deck other end is provided with fixed mount, and the probe groups are vertically disposed on fixed mount, and being additionally provided with the oscillating deck can
Drive device and resetting means that driving oscillating deck is swung up and down.
The described mechanism for testing for being used to test the integrated modules of LED, wherein, stating rotating disk mechanism includes disk carrier, described
Several fixed bits are surrounded with disk carrier, the fixed bit is the cruciformity of hollow out.
The described mechanism for testing for being used to test the integrated modules of LED, wherein, the rotating disk mechanism includes rotating disk, described turn
Disk surrounding lower surface is provided with several suction nozzles for capturing fixed electronic component.
The described mechanism for testing for being used to test the integrated modules of LED, wherein, also including the first detent mechanism, described first
Detent mechanism is arranged on before the testing station, in the lateral location of rotating disk mechanism.
The described mechanism for testing for being used to test the integrated modules of LED, wherein, also including the second detent mechanism, described second
Detent mechanism is arranged on behind the testing station, in the lateral location of rotating disk mechanism.
A kind of light splitting machine, includes the mechanism for testing as described above for being used to test the integrated modules of LED.
A kind of braider, includes the mechanism for testing as described above for being used to test the integrated modules of LED.
Beneficial effects of the present invention include：The present invention provide it is a kind of be used for test the integrated modules of LED mechanism for testing and
Its light splitting machine and braider are detected, no respectively by that will set multiple testing stations to the LED lamp bead on the integrated modules of LED
Detected simultaneously in a testing station, it is to avoid the problem of causing because LED lamp bead spacing is too small to be difficult to detect；In addition,
At least two groups probe groups are set on testing station, and every group of probe groups are corresponding with the LED lamp bead in diagonal angle on the integrated modules of LED,
Using the longer principle of diagonal distance, the spacing between probe groups is added, pin spacing is too small between LED lamp bead is solved
Meanwhile, the quantity of testing station is reduced, production cost has been saved；On the other hand, by the hollow out fixed bit on rotating disk mechanism, solution
Determined traditional glass or metal rotary disk leaded light it is uneven, cause the problem of spectroscopy data difference is big.
Brief description of the drawings
A kind of structural representation for mechanism for testing that Fig. 1 provides for the present invention.
A kind of test position schematic diagram for integrated modules of tetrad LED that Fig. 2 provides for the present invention.
A kind of test position schematic diagram for the integrated modules of six disjunctors LED that Fig. 3 provides for the present invention.
The test position schematic diagram for the integrated modules of another six disjunctors LED that Fig. 4 provides for the present invention.
A kind of structural representation for testing station that Fig. 5 provides for the present invention.
Fig. 6 is structural representation when traditional disk carrier does not load electronic component.
Structural representation when Fig. 7 is traditional disk carrier loading electronic component.
Fig. 8 does not load structural representation during electronic component for the disk carrier that the present invention is provided.
Fig. 9 loads structural representation during electronic component for the disk carrier that the present invention is provided.
A kind of plan structure sketch for light splitting machine that Figure 10 provides for the present invention.
A kind of plan structure sketch for braider that Figure 11 provides for the present invention.
Description of reference numerals：1st, feeding vibration disk；2nd, directly shake track；3rd, rotating disk；301st, suction nozzle；302nd, anti-material casting back-up ring；
4th, the first detent mechanism；5th, the first testing station；501st, the first probe groups；5011st, the first probe groups test point；502nd, first fix
Seat；503rd, the second fixed seat；504th, oscillating deck；505th, rotating shaft；506th, fixed mount；507th, drive device；508th, resetting means；6、
Second testing station；6011st, the second probe groups test point；7011st, the 3rd probe groups test point；8011st, the 4th probe groups test point；
7th, the second detent mechanism；8th, mechanism is carried；9th, envelope band mechanism；10th, control unit；11st, waste material collection device；12nd, Image detection
Mechanism；13rd, belt tightening mechanism；14th, sorting mechanism；15th, the integrated modules of tetrad RGB-LED；1501st, lamp bead pin；16th, six disjunctor
The integrated modules of RGB-LED；1601st, LED lamp bead pin；17th, disk carrier；1701st, position is tested；18th, electronic component to be measured；
19th, XY axles cutting agency.
Embodiment
To make the objects, technical solutions and advantages of the present invention clearer, clear and definite, develop simultaneously embodiment pair referring to the drawings
The present invention is further described.
Mechanism for testing provided by the present invention for testing the integrated modules of LED, including rotating disk mechanism and at least two tests
Stand, the testing station is set around rotating disk mechanism side, the testing station is provided with least one set of probe groups in vertical direction,
The probe groups are corresponding with all pins of the single led lamp bead on the integrated modules of LED to be measured, for testing single led lamp bead
All pins, the quantity sums of the probe groups of all testing stations be equal to the LED lamp bead of the integrated modules of LED to be measured quantity it
With.For example, when being integrated with four LED lamp beads on the integrated modules of the LED of test, the quantity of testing station can be 2-4, probe
The sum of group is 4, corresponding respectively with four LED lamp beads, and all testing stations coordinate, and the survey to the integrated modules of LED is completed jointly
Examination.By setting multiple testing stations, it is to avoid because LED lamp bead spacing is too small, cause the problem of probe is difficult to put.
Referring to Fig. 1, a kind of embodiment for being used to test the mechanism for testing of the integrated modules of LED provided for the present invention, at this
In embodiment, be integrated with four lamp beads on the integrated module of LED to be tested, the mechanism for testing of the present embodiment include rotating disk mechanism and
Two testing stations, two testing stations are respectively the first testing station 5 and the second testing station 6, the first testing station 5 and the second testing station 6
Set around the rotating disk mechanism side, the first testing station 5 is provided with two group of first probe groups in vertical direction（Do not show in figure
Go out）, the second testing station 6 is provided with two group of second probe groups in vertical direction（Not shown in figure）, first probe groups
The LED lamp bead that position and the integrated modules of LED to be measured are in diagonal angle is corresponding, the position of second probe groups and two other not
The correspondence of the LED lamp bead in diagonal angle tested by the first probe groups.
It is a kind of test of tetrad LED encapsulation modules referring to Fig. 2 more easily to understand the test position of probe groups
Position view, the lamp bead of the integrated modules of the LED is RGB-LED lamp beads in the present embodiment, and totally four pins, are respectively positioned on lamp
Pearl bottom, the side of lamp bead four is without pin.In the present embodiment, two testing stations are divided into be tested, are possessed on each testing station
Two groups of probe groups, wherein "×" represent the first probe groups test point 5011, and "○" represents the second probe groups test point 6011.First
What the probe groups test point 6011 of probe groups test point 5011 and second was tested is all the lamp bead pin of diagonal angle, and both coordinate, altogether
With the detection completed to all lamp bead pins 1501 of the integrated modules of tetrad RGB-LED 15.
Referring to Fig. 3, the present invention is a kind of test position schematic diagram of six disjunctors LED encapsulation modules, in the present embodiment institute
The lamp bead for stating the integrated modules of LED is RGB-LED lamp beads, and totally four pins, are respectively positioned on lamp bead bottom, and the side of lamp bead four is without pin, altogether
It is divided into three testing stations to be tested, wherein "×" represents the first probe groups test point 5011, "○" represents the survey of the second probe groups
Pilot 6011, it is middle it is unmarked be the 3rd probe groups test point 7011 test position.
, can be with as shown in figure 4, being divided into four testing station progress for the test position of six disjunctor LED encapsulation modules
Test, wherein "×" represent the first probe groups test point 5011, and "○" represents the second probe groups test point 6011, middle unmarked
The test position for the 3rd probe groups test point 7011, " " represents the test position of the 4th probe groups test point 8011.
In summary, the present invention can be according to the LED lamp bead quantity on the integrated modules of LED and the number of Adjusting Shape testing station
The quantity of amount and probe groups, makes all testing stations complete the test to the integrated modules of LED jointly, this is for the integrated modules of LED
LED lamp bead quantity and module shape the present invention and be not limited.
In actual applications, referring to Fig. 1, it is preferable that rotating disk mechanism includes rotating disk 3 and the suction nozzle being circumferentially positioned on rotating disk
301, electronic component is held by suction nozzle 301, and the station conversion that rotating disk realizes electronic component is rotated, by electronics member
Device is transported on each station successively.The rotation direction of rotating disk 3 is not limited, in the present embodiment, and rotating disk 3 is clockwise
Rotation.Preferably, the number of suction nozzle 301 is 6-16, can facilitate the setting functional station at each suction nozzle 301, in this implementation
In example, the number of suction nozzle 301 is 12.Preferably, fly to prevent that material from throwing, anti-material casting back-up ring is set around rotating disk 3（In figure
It is not shown）.
The direction rotated along rotating disk 3, correspondence suction nozzle 301 position is disposed with the first testing station 5 and second and surveyed
Examination station 6, it is preferable that referring to Fig. 1, before the place station of the first testing station 5, the first localization machine is additionally provided with the side of rotating disk 3
Structure 4, the position for correcting electronic component to be measured.Further, behind the second testing station 6, rotating disk 3 is additionally provided with side
Second detent mechanism 7, is further ensured that the accuracy of positions of electronic parts.
In actual applications, the testing station includes probe base, and the probe groups are vertically disposed at the probe
In fixed seat.This testing station it is simple in construction, it is convenient that multiple testing stations are set around rotating disk mechanism.
Referring to Fig. 5, the structural representation of the one of which embodiment of the testing station provided for the present invention, in the present embodiment
In, the testing station includes the first fixed seat 502 and the second fixed seat 503 being at right angles connected with the first fixed seat 502, second
The tail end of fixed seat 503 is rotatably connected to oscillating deck 504, it is preferable that the second fixed seat 503 and oscillating deck 504 are real by rotating shaft 505
Now rotate connection.The other end of oscillating deck 504 is provided with fixed mount 506, and fixed mount 506 is provided with two group of first probe groups 501,
In the present embodiment, the pin of electronic component to be measured totally four, be square arrangement, so the quantity of the first probe 501 is two,
In diagonal distribution, it is respectively used to test two pins that the electronic component is located at diagonal angle.Because cornerwise length is big
In the square length of side, by testing the design of diagonal pin, the spacing of probe is increased, consequently facilitating to small pitch electronic member device
The detection of part.The drive device 507 that oscillating deck 504 can be driven to swing up and down and resetting means are additionally provided with oscillating deck 504
508.Preferably, drive device 507 is cylinder or motor, and resetting means 508 includes a spring, when being detected, and driving is driven
Dynamic device 507, reduces the distance between the first fixed seat 502 and oscillating deck 504, so that the first probe 501 is close to electricity to be measured
The pin of sub- component is tested, after being completed, and loosens drive device 507, in the presence of resetting means 508, is recovered
Original position, once test so as to be realized.In the present embodiment, the measurement direction of the first probe 501 enters for contact pin from bottom to top
Row detection.In actual applications, the measurement direction of the first probe 501 can also be detected for contact pin from top to down, phase
Answer, now the bottom-up of electronic component to be measured is placed on rotating disk 3.
In actual production, the larger electronic component of some volumes is adapted to be carried out with the suction nozzle 301 of embodiment described in Fig. 1
It is fixed, but in face of the electronic component of some small volumes, be fixed using suction nozzle 301 then relatively difficult.In practical application
In, referring to Fig. 6-Fig. 7, disk carrier 17 can be used to be fixed, traditional disk carrier 17 is usually using glass or metal system
Into as shown in fig. 7, electronic component to be measured 18 is placed on disk carrier 17, electricity to be measured is carried out by rotating circular disk carrier 17
The station transfer of sub- component 18.It is easily dirty but traditional disk carrier 17 is made using glass or metal, and guide-lighting meeting
It is uneven, spectroscopy data difference can be caused big.
It is the embodiment of another rotating disk mechanism provided by the present invention, it is adaptable to the electricity of small volume referring to Fig. 8-Fig. 9
Sub- component.In the present embodiment, referring to Fig. 8, the rotating disk mechanism is included on disk carrier 17, disk carrier 17 around setting
There are several fixed bits 1701, fixed bit 1701 is the cruciformity of hollow out.Preferably, the present embodiment is applied to square electronic member
Device is put.Referring to Fig. 8, electronic component 18 to be measured is placed on each fixed bit 1701, passes through rotating circular disk carrier 17
Realize the transfer of station.The material of disk carrier 17 can be glass, metal or ceramics, pass through the setting of hollow out, it is to avoid circle
The problem of disk carrier fixed bit 1701 is easily dirty, meanwhile, the fixed bit 1701 that test light is directed through hollow out carries out optics survey
Examination, it also avoid influence of the disk carrier 17 to test light itself.Preferably, electronic component 18 to be measured is placed in fixation
On position 1701, the center section of electronic component 18 can be surveyed by pressing, realize the fixation to electronic component 18 to be measured.Enter one
Step ground, the quantity of fixed bit 1701 is 6-16, in the present embodiment, and the number of fixed bit 1701 is 12.
Referring to Figure 10, present invention also offers a kind of light splitting machine with above-mentioned mechanism for testing, the light splitting machine includes sending
Material vibrating disk 1, straight shake track 2, the mechanism for testing, sorting mechanism 14 and XY axles cutting agency 19, feeding vibration disk 1 with it is straight
The track 2 that shakes is connected, and the mechanism for testing is connected with the straight track 2 that shakes, and the mechanism for testing is consistent with the structure of above-mentioned mechanism for testing,
In the present embodiment, the mechanism for testing includes rotating disk 3, the first detent mechanism 4, the first testing station 5 and the second testing station 6,
Suction nozzle 301 is surrounded with rotating disk 3, the quantity of suction nozzle 301 is 16, and sorting mechanism 14 is set around rotating disk 3, XY axle blankings
Mechanism 19 is arranged on after sorting mechanism 14, on the side of rotating disk 3.
It is that, present invention also offers a kind of braider with above-mentioned mechanism for testing, the braider includes referring to Figure 11
Feeding vibration disk 1, the straight track 2 that shakes, the mechanism for testing, carrier band mechanism 8, envelope band mechanism 9, control unit 10, garbage collection dress
Put 11, Image detection mechanism 12 and belt tightening mechanism 13, control unit 10 respectively with feeding vibration disk 1, the straight track 2 that shakes, described
Mechanism for testing, carrier band mechanism 8, envelope band mechanism 9, waste material collection device 11, Image detection mechanism 12 and belt tightening mechanism 13 are electrically connected
Connect.The mechanism for testing in the present embodiment include rotating disk 3, the first detent mechanism 4, the first testing station 5, the second testing station 6 with
And second detent mechanism 7, suction nozzle 301 is surrounded with rotating disk 3, and the quantity of suction nozzle 301 is 12.Electronic component is by feeding
Vibrating disk 1 enters rotating disk 3 by the straight track 2 that shakes, and is held by suction nozzle 301, rotating disk 3 is rotated, the electronic component is turned successively
The first detent mechanism 4, the first testing station 5, the second testing station 6, the second detent mechanism 7 and Image detection mechanism 12 are moved to, no
Satisfactory electronic component enters waste material collection device 11, and qualified electronic component sequentially enters carrier band mechanism 8 and envelope
Band mechanism 9 carries out braid, finally carries out take-up by belt tightening mechanism 13, completes braid work.
A kind of mechanism for testing and its light splitting machine and braider for being used to test the integrated modules of LED that the present invention is provided is by inciting somebody to action
Multiple testing stations are set, the LED lamp bead on the integrated modules of LED is detected respectively, are carried out when different in a testing station
Detection, it is to avoid the problem of causing because LED lamp bead spacing is too small to be difficult to detection；In addition, setting at least two groups spies on testing station
Pin group, every group of probe groups are corresponding with the LED lamp bead in diagonal angle on the integrated modules of LED, utilize the longer original of diagonal distance
Reason, adds the spacing between probe groups, while pin spacing is too small between solving LED lamp bead, reduces the number of testing station
Amount, has saved production cost；On the other hand, by the hollow out fixed bit on rotating disk mechanism, solve traditional glass or metal turns
Disk leaded light is uneven, causes the problem of spectroscopy data difference is big.
It should be appreciated that the application of the present invention is not limited to above-mentioned citing, for those of ordinary skills, can
To be improved or converted according to the above description, all these modifications and variations should all belong to the guarantor of appended claims of the present invention
Protect scope.
Claims (10)
1. a kind of mechanism for testing for being used to test the integrated modules of LED, it is characterised in that tested including rotating disk mechanism and at least two
Stand, the testing station is set around rotating disk mechanism side, the testing station is provided with least one set of probe groups in vertical direction,
The probe groups are corresponding with all pins of the single led lamp bead on the integrated modules of LED to be measured, for testing single led lamp bead
All pins, the quantity sums of the probe groups of all testing stations be equal to the LED lamp bead of the integrated modules of LED to be measured quantity it
With.
2. the mechanism for testing according to claim 1 for being used to test the integrated modules of LED, it is characterised in that the testing station
Including at least two groups probe groups, the position pair of the probe groups and the LED lamp bead in diagonal angle on the integrated modules of LED to be measured
Should.
3. the mechanism for testing according to claim 1 for being used to test the integrated modules of LED, it is characterised in that the testing station
Including probe base, the probe groups are vertically disposed in the probe base.
4. the mechanism for testing according to claim 1 for being used to test the integrated modules of LED, it is characterised in that the testing station
The second fixed seat being at right angles connected including the first fixed seat and with first fixed seat, the second fixed seat tail end is rotated
Oscillating deck is connected with, the oscillating deck other end is provided with fixed mount, and the probe groups are vertically disposed on fixed mount, described
The drive device that oscillating deck can be driven to swing up and down and resetting means are additionally provided with oscillating deck.
5. the mechanism for testing according to claim 1 for being used to test the integrated modules of LED, it is characterised in that the disk machine
Structure includes being surrounded with several fixed bits on disk carrier, the disk carrier, and the fixed bit is the cross of hollow out
Shape.
6. the mechanism for testing according to claim 1 for being used to test the integrated modules of LED, it is characterised in that the disk machine
Structure includes rotating disk, and the rotating disk surrounding lower surface is provided with several suction nozzles for capturing fixed electronic component.
7. the mechanism for testing according to claim 1 for being used to test the integrated modules of LED, it is characterised in that also including first
Detent mechanism, first detent mechanism is arranged on before the testing station, in the lateral location of rotating disk mechanism.
8. the mechanism for testing according to claim 7 for being used to test the integrated modules of LED, it is characterised in that also including second
Detent mechanism, second detent mechanism is arranged on behind the testing station, in the lateral location of rotating disk mechanism.
9. a kind of light splitting machine, it is characterised in that test the integrated modules of LED including being used for described in claim 1 to 8 any one
Mechanism for testing.
10. a kind of braider, it is characterised in that test the integrated moulds of LED including being used for described in claim 1 to 8 any one
The mechanism for testing of group.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710250355.XA CN106950514B (en) | 2017-04-17 | 2017-04-17 | Testing mechanism for testing LED integrated module, light splitting machine and braider thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710250355.XA CN106950514B (en) | 2017-04-17 | 2017-04-17 | Testing mechanism for testing LED integrated module, light splitting machine and braider thereof |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN106950514A true CN106950514A (en) | 2017-07-14 |
| CN106950514B CN106950514B (en) | 2023-12-01 |
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Family Applications (1)
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| CN111136016A (en) * | 2018-11-06 | 2020-05-12 | 大族激光科技产业集团股份有限公司 | Light splitting and braiding integrated LED detection method and device |
| CN113030630A (en) * | 2021-02-26 | 2021-06-25 | 路迎肖 | LED production is with emitting diode detection device |
| CN113751342A (en) * | 2021-08-31 | 2021-12-07 | 中国绿色照明有限公司 | Screening plastic packaging strip forming device for light-emitting diodes |
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| CN113751342A (en) * | 2021-08-31 | 2021-12-07 | 中国绿色照明有限公司 | Screening plastic packaging strip forming device for light-emitting diodes |
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