CN110987831A - COB (chip on Board) double-station testing method and device - Google Patents

COB (chip on Board) double-station testing method and device Download PDF

Info

Publication number
CN110987831A
CN110987831A CN201911407154.1A CN201911407154A CN110987831A CN 110987831 A CN110987831 A CN 110987831A CN 201911407154 A CN201911407154 A CN 201911407154A CN 110987831 A CN110987831 A CN 110987831A
Authority
CN
China
Prior art keywords
cob
cob material
test
shielded
detection position
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201911407154.1A
Other languages
Chinese (zh)
Inventor
段雄斌
雄亚俊
席松涛
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shenzhen Biaopu Semiconductor Technology Co ltd
Original Assignee
Shenzhen Biaopu Semiconductor Technology Co ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shenzhen Biaopu Semiconductor Technology Co ltd filed Critical Shenzhen Biaopu Semiconductor Technology Co ltd
Priority to CN201911407154.1A priority Critical patent/CN110987831A/en
Publication of CN110987831A publication Critical patent/CN110987831A/en
Pending legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N2021/0106—General arrangement of respective parts
    • G01N2021/0112—Apparatus in one mechanical, optical or electronic block

Abstract

A COB dual-station testing method and a COB dual-station testing device are provided, wherein the testing method comprises the following steps: moving the COB material to a first detection position, blocking a part of area of the COB material, lighting the unblocked part of the COB material, and testing the unblocked area of the COB material; after the test is completed, the COB material is moved to the second detection position, the partial area of the COB material tested by the first test structure is shielded, the part of the COB material which is not shielded is lightened, and the area of the COB material which is not shielded is tested. The invention adopts the double-station test, tests one part of area of the COB material for the first time, tests the other part of area of the COB material for the second time, and tests the whole COB material through two times, thereby having the advantages of no need of normally cleaning glass sheets, no occurrence of misjudgment and no influence on screening of the COB material.

Description

COB (chip on Board) double-station testing method and device
Technical Field
The invention relates to the technical field of testing of disc sorting and editing integrated machines, in particular to a COB (chip on Board) double-station testing method and device.
Background
At present, the disc sorting and weaving all-in-one machine adopts one-station test, a method of using a glass sheet and pressing four corners of a COB material is utilized, when the glass sheet is adopted, the glass sheet is particularly easy to pollute, lighting of an integrating sphere is influenced, the glass sheet needs to be cleaned by ordinary shutdown, the shutdown rate is high, and the productivity is seriously influenced. By adopting the method of pressing four corners of the COB material, the light-emitting part of the COB material is shielded frequently, so that misjudgment is caused to the spectral analysis of the COB material, and screening of the COB material is influenced.
Disclosure of Invention
The invention provides a COB double-station testing method and device, which can not cause misjudgment due to shielding and can not influence screening of COB materials.
The invention has a technical scheme that: the COB double-station testing method comprises the following steps:
moving the COB material to a first detection position, wherein a part of the area of the COB material is shielded, the non-shielded part of the COB material is lightened, and testing the non-shielded area of the COB material;
after the test is completed, the COB material is moved to a second detection position, the partial area of the COB material tested by the first test structure is shielded, the part of the COB material which is not shielded is lightened, and the area of the COB material which is not shielded is tested.
As an improvement to the present invention, the COB material moves the second inspection position from the first inspection position along a straight line.
As an improvement to the present invention, in the first inspection position and the second inspection position, the placement direction of the COB material is not changed, and the change in the position of the COB material is blocked.
As an improvement to the invention, the COB material moves along a curve from the first detection position to the second detection position.
As an improvement to the present invention, in the first and second inspection positions, the placement direction of the COB material is not changed, and the change in the position of the COB material is blocked; or the placing direction of the COB material is changed, and the position for shielding the COB material is not changed.
The other technical scheme of the invention is as follows: provided is a COB dual-station testing apparatus, including: the COB material detection device comprises a moving structure, a pressing structure, a first test structure and a second test structure, wherein the moving structure moves the COB material to a first detection position, the pressing structure shields a part of area of the COB material, the non-shielded part of the COB material is lightened, and the first test structure tests the area of the COB material, which is not shielded; after the test is completed, the moving structure moves the COB material to the second detection position, the pressing structure shields the partial area of the COB material tested by the first test structure, the portion of the COB material not shielded is lightened, and the second test structure tests the area of the COB material not shielded.
As an improvement to the present invention, the transport trajectory of the moving structure is a straight line, and the moving structure moves the COB material from the first detection position to the second detection position along a straight line.
As an improvement to the present invention, the transportation trajectory of the moving structure is an arc, and the moving structure moves the COB material from the first detection position to the second detection position along the arc.
As an improvement to the present invention, the moving structure is a disc rotating structure on which the COB materials are placed to move.
As an improvement to the present invention, a first test hole is disposed on the pressing structure, the first test hole is located at the first detection position, a surrounding structure of the first test hole blocks a partial region of the COB material, and another partial region of the COB material corresponds to the first test hole; the structural second test hole that is provided with of suppression, the second test hole is located on the second detects the position, the structure shelters from all around of second test hole another part region of COB material, a part region of COB material corresponds the second test hole.
The invention adopts the double-station test, tests one part of area of the COB material for the first time and tests the other part of area of the COB material for the second time, and completes the test of the whole COB material through two tests, thereby having the advantages of no need of normally cleaning glass sheets, no occurrence of misjudgment and no influence on screening of the COB material.
Drawings
Fig. 1 is a schematic plan view of a COB dual-station test apparatus according to the present invention.
Fig. 2 is an exploded view of fig. 1.
Fig. 3 is an enlarged schematic view of the first inspection position of fig. 1.
Fig. 4 is an enlarged schematic view of the second inspection position of fig. 1.
Fig. 5 is a flowchart illustrating a COB dual-station test method according to the present invention.
Wherein:
100. a COB material; 111. a disc; 112. a COB material fixing part; 120. pressing the structure; 121. a first test well; 122. a second test well; 130. a small base plate; 131. a guide piece; 141. a first test structure; 142. a second test structure; 151. a first detection position; 152. a second detection position.
Detailed Description
In the description of the present invention, it is to be understood that the terms "center", "upper", "lower", "front", "rear", "left", "right", and the like, indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience in describing the present invention and simplifying the description, but do not indicate or imply that the device or assembly referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first" and "second" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
In the description of the present invention, it should be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "connected," and "connected" are to be construed broadly, e.g., as meaning either a fixed connection, a removable connection, or an integral connection; can be mechanically or electrically connected; the two components can be directly connected or indirectly connected through an intermediate medium, and the two components can be communicated with each other. The specific meaning of the above terms in the present invention can be understood in specific cases to those skilled in the art.
Referring to fig. 1 to 4, fig. 1 to 4 disclose a COB dual-station testing apparatus, in the prior art, the testing apparatus only tests a COB material 100 once, and during the testing, the COB material 100 is lighted, a part of the COB material 100 is shielded, and the shielded part is not tested, thereby causing a misjudgment. In the present invention, the COB dual-station testing apparatus tests the COB material 100 twice, and during the two tests, the COB material 100 is lit up and tested from above the COB material. A portion of the area of the COB material 100 is tested for the first time and another portion of the COB material 100 is tested for the second time, and after the two tests are completed, all areas of the entire COB material 100 are tested.
In an embodiment, the COB dual-station testing apparatus includes a moving structure that moves COB material 100 to a first testing position 151, a pressing structure 120 that blocks a portion of the area of COB material 100, a first testing structure 141 that dots a tested portion of COB material 100, and a second testing structure 142 that tests the tested portion of COB material 100 where COB material 100 is not blocked; after the test is completed, the moving mechanism moves the COB material 100 to the second testing position 152, the pressing mechanism 120 blocks another partial area of the COB material 100, lights a portion of the COB material 100 that is not tested by the first testing mechanism 141, and the second testing mechanism 142 tests the partial area of the COB material 100 that is not tested by the first testing mechanism 141.
In the embodiment, the moving structure is a disc 111 rotating structure, and the COB material 100 is placed on the disc 111 rotating structure to move. The rotation structure of the disc 111 includes the disc 111 and a rotation structure (not shown), the disc 111 is mounted on a rotation end of the rotation structure, and the rotation structure drives the disc 111 to rotate. The disc 111 may be made of a metal material or a non-metal material, and what material is used for the disc 111 is not within the scope of the present invention.
The shape of disc 111 is circular, the shape of disc 111 can also be square, or the shape of disc 111 can also be other geometric shapes, which are not illustrated here. However, the shape of the disc 111 is preferably circular.
A COB material fixing portion 112 may be provided on the disc 111, and the COB material fixing portion 112 is used to fix the COB material 100. The number of the COB material fixing portions 112 is several, and the several COB material fixing portions 112 are uniformly arranged on the same circumference of the disc 111. As a modification, the COB material holders 112 are not uniformly arranged on the same circumference of the disc 111.
When the COB material 100 is transported on the disc 111, the COB material 100 is placed in the COB material holder 112, and the COB material holder 112 may be a recess, a groove, a notch, and the like. The shape of the COB material-fixing part 112 is substantially as large as the shape of the COB material 100, or the shape of the COB material-fixing part 112 is slightly larger than the shape of the COB material 100. The COB material 100 is within the protection range of the COB material fixing part 112 as long as the COB material 100 can be fixed to the disc 111 to move without detaching the COB material 100 from the disc 111. As an improvement of the structure of the disc 111, the COB material 100 may also be directly placed on the disc 111 during the transportation of the COB material 100 by the disc 111.
When the COB material 100 is transported on the disc 111, the transport trajectory of the moving structure is an arc, and the moving structure moves the COB material 100 along the arc from the first detecting position 151 to the second detecting position 152. The placement direction of the COB material 100 is changed and the position of the shielding COB material 100 is not changed.
It is within the scope of the present invention that the rotational structure be a motor, or other driving structure, as long as it is capable of rotating the disc 111.
In the embodiment, as an improvement of the moving structure, the transport locus of the moving structure is a straight line, and the moving structure moves the COB material 100 from the first inspection position 151 to the second inspection position 152 along the straight line. The moving structure is a linear motion guide (not shown) on which the COB materials 100 are placed for transportation. At the first and second inspection positions 151 and 152, the placement direction of the COB material 100 is not changed, and the position of the COB material 100 is blocked.
In the embodiment, the small bottom plate 130 is further included, and the surface of the small bottom plate 130 is a smooth and flat surface, which is not inclined or uneven. The small bottom plate 130 has a guide piece 131 on its surface, the guide piece 131 forms a receiving portion on the surface of the small bottom plate 130, and the disc 111 is located in the receiving portion, which is recessed. The small bottom plate 130 is made of a metal material, and the shape of the small bottom plate 130 can be selected according to needs. The shape of the receiving portion is substantially the same as the shape of the disc 111, or the shape of the receiving portion is not the same as the shape of the disc 111. When the shape of the disc 111 is circular, the shape of the receiving portion is also circular, and the specific shape can be selected according to actual needs.
In an embodiment, the pressing structure 120 is disposed on a surface of the guide piece 131, and the pressing structure 120 may be made of a metal material or a non-metal material. The pressing structure 120 is provided with a first test hole 121 and a second test hole 122, and the positions of the first test hole 121 and the second test hole 122 are protruded from the guide piece 131. That is, the first test hole 121 and the second test hole 122 correspond to the positions on the disc 111, the pressing structure 120 is in an eave shape, and the first test hole 121 and the second test hole 122 are disposed at the eave position of the pressing structure 120. The lower surface of the protruding portion of the press structure 120 is spaced from the upper surface of the disc 111 by a small distance, that is, at the positions of the first test hole 121 and the second test hole 122, the lower surface of the protruding portion of the press structure 120 is spaced from the surface of the COB material 100 by a distance of several micrometers, and specific data can be selected as needed.
The first test well 121 is located at a first test position 151 and the second test well 122 is located at a second test position 152. The first test hole 121 and the second test hole 122 are separated by a predetermined distance, and the specific distance value can be selected according to actual needs. The shape of the first test hole 121 is different from that of the COB material 100, and the shape of the first test hole 121 may be selected as needed, and the shape thereof will not be explained here. When the COB material 100 is positioned directly under the first test hole 121, a partial area of the COB material 100 is positioned at the position of the first test hole 121, that is, a partial area of the COB material 100 is visible through the first test hole 121, and another partial area of the COB material 100 is blocked by the press structure 120 around the first test hole 121.
The shape of the second test hole 122 is different from that of the COB material 100, and the shape of the second test hole 122 may be selected as needed, and the shape thereof will not be explained here. When the COB material 100 is positioned directly under the second test hole 122, another partial area of the COB material 100 is positioned at the position of the second test hole 122, that is, another partial area of the COB material 100 is visible through the second test hole 122, and a partial area of the COB material 100 is blocked by the press structure 120 around the second test hole 122.
In this embodiment, the test device further includes a first test structure 141 and a second test structure 142, wherein the detection end of the first test structure 141 is located at the first test position, and the detection end of the second test structure 142 is located at the second test position. The first test structure 141 and the second test structure 142 have the same structure, and are both prior art, and the present invention does not modify the structure thereof, so the structure thereof will not be explained in detail herein.
The working principle of the invention is as follows:
the COB material 100 is placed in the COB material holder 112 of the disc 111, the disc 111 is driven to rotate by the rotating structure, the disc 111 moves the COB material 100 to the first testing position 151, the COB material 100 is located right under the first testing hole 121, the tested portion of the COB material 100 is lighted, a partial area of the COB material 100 is located at the first testing hole 121, and another partial area of the COB material 100 is blocked by the pressing structure 120 around the first testing hole 121, and the first testing structure 141 tests the partial area of the COB material 100.
After the test is completed, the rotating structure drives the disc 111 to rotate, and the disc 111 moves the COB material 100 to the second detecting position 152. The COB material 100 is positioned right under the second test hole 122, the portion of the COB material 100 that is not detected is illuminated, another partial area of the COB material 100 is positioned at the second test hole 122, and the partial area of the COB material 100 is blocked by the press structure 120 around the second test hole 122, and the second test structure 142 tests another partial area of the COB material 100.
In the present invention, when testing the COB material, the COB material needs to be lit up. That is, the COB material is lit up once at the first inspection position 151 and once again at the second inspection position 152, and is lit up twice throughout the test. During testing, the first test structure 141 and the second test structure 142 both use an integrating sphere to detect the optical parameters of the lighted COB material, and after the integrating sphere detection is completed, the relevant detection data is sent to the control center for analysis.
The invention also provides a COB double-station testing method, please refer to fig. 3, which includes the following steps:
s10, moving the COB material to a first detection position, wherein a part of the COB material is shielded, the non-shielded part of the COB material is lightened, and testing the non-shielded area of the COB material;
s20, after the test is completed, the COB material is moved to a second detection position, the partial area of the COB material tested by the first test structure is shielded, the part of the COB material which is not shielded is lightened, and the region of the COB material which is not shielded is tested.
In the second detection position, another partial region of the COB material is blocked, while a partial region of the COB material is not blocked. And testing a part of area of the COB material for the first time and another part of area of the COB material for the second time, wherein the first test and the second test are combined to complete the test of the whole area of the COB material.
COB material removes the second along the straight line from first detection position and detects the position, on first detection position and second detection position, COB material's the orientation of placing does not change, shelters from COB material's position change.
Alternatively, the COB material moves from the first inspection position to the second inspection position along the curve. In the first detection position and the second detection position, the placing direction of the COB material is not changed, and the change of the position of the COB material is shielded; or the placing direction of the COB material is changed, and the position of the COB material which is shielded is not changed.
Regardless of how the COB material is placed, it is within the scope of the present invention that the entire area of the COB material is tested as long as the first test and the second test are combined.
The invention adopts the double-station test, tests one part of area of the COB material for the first time and tests the other part of area of the COB material for the second time, and completes the test of the whole COB material through two tests, thereby having the advantages of no need of normally cleaning glass sheets, no occurrence of misjudgment and no influence on screening of the COB material.
It should be noted that the detailed explanation of the above embodiments is only for the purpose of explaining the present invention so as to better explain the present invention, but the descriptions should not be construed as limiting the present invention for any reason, and particularly, the features described in the different embodiments may be arbitrarily combined with each other to constitute other embodiments, and the features should be understood as being applicable to any one embodiment and not limited to only the described embodiments except for the explicit contrary description.

Claims (10)

1. A COB double-station testing method is characterized by comprising the following steps:
moving the COB material to a first detection position, wherein a part of the area of the COB material is shielded, the non-shielded part of the COB material is lightened, and testing the non-shielded area of the COB material;
after the test is completed, the COB material is moved to a second detection position, the partial area of the COB material tested by the first test structure is shielded, the part of the COB material which is not shielded is lightened, and the area of the COB material which is not shielded is tested.
2. The COB dual-station testing method of claim 1, wherein: the COB material moves the second inspection position from the first inspection position along a straight line.
3. The COB dual-station test method of claim 2, characterized in that: on the first detection position with on the second detection position, COB material's the direction of placing does not change, shelters from COB material's position change.
4. The COB dual-station testing method of claim 1, wherein: the COB material moves the second detection position from the first detection position along a curve.
5. The COB dual-station testing method of claim 4, wherein: in the first detection position and the second detection position, the placing direction of the COB material is not changed, and the change of the position of the COB material is shielded; or the placing direction of the COB material is changed, and the position for shielding the COB material is not changed.
6. A COB dual-station testing device, comprising: the COB material detection device comprises a moving structure, a pressing structure, a first test structure and a second test structure, wherein the moving structure moves the COB material to a first detection position, the pressing structure shields a part of area of the COB material, the non-shielded part of the COB material is lightened, and the first test structure tests the area of the COB material, which is not shielded; after the test is completed, the moving structure moves the COB material to the second detection position, the pressing structure shields the partial area of the COB material tested by the first test structure, the portion of the COB material not shielded is lightened, and the second test structure tests the area of the COB material not shielded.
7. The COB dual-station testing apparatus of claim 6, wherein: the moving structure has a linear transportation track, and moves the COB material from the first detection position to the second detection position along a straight line.
8. The COB dual-station testing apparatus of claim 6, wherein: the moving structure moves the COB material from the first detection position to the second detection position along an arc.
9. The COB dual-station testing apparatus of claim 8, wherein: the moving structure is a disc rotating structure on which the COB materials are placed to move.
10. The COB dual-station testing apparatus of claim 6, wherein: a first test hole is formed in the pressing structure and located at the first detection position, a part of area of the COB material is shielded by the surrounding structure of the first test hole, and the other part of area of the COB material corresponds to the first test hole; the structural second test hole that is provided with of suppression, the second test hole is located on the second detects the position, the structure shelters from all around of second test hole another part region of COB material, a part region of COB material corresponds the second test hole.
CN201911407154.1A 2019-12-31 2019-12-31 COB (chip on Board) double-station testing method and device Pending CN110987831A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201911407154.1A CN110987831A (en) 2019-12-31 2019-12-31 COB (chip on Board) double-station testing method and device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201911407154.1A CN110987831A (en) 2019-12-31 2019-12-31 COB (chip on Board) double-station testing method and device

Publications (1)

Publication Number Publication Date
CN110987831A true CN110987831A (en) 2020-04-10

Family

ID=70079545

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201911407154.1A Pending CN110987831A (en) 2019-12-31 2019-12-31 COB (chip on Board) double-station testing method and device

Country Status (1)

Country Link
CN (1) CN110987831A (en)

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN204679247U (en) * 2015-04-17 2015-09-30 深圳市炫硕光电科技有限公司 Chip on board light splitting detects machine and adjustable probe device thereof
CN105116354A (en) * 2015-09-06 2015-12-02 深圳市源磊科技有限公司 Online testing apparatus and online testing method for LED encapsulation
CN106644405A (en) * 2016-12-01 2017-05-10 深圳市标谱半导体科技有限公司 Spectrophotometric equipment for testing tiny electronic components
CN106950514A (en) * 2017-04-17 2017-07-14 山东晶泰星光电科技有限公司 Mechanism for testing and its light splitting machine and braider for testing the integrated modules of LED
CN207300546U (en) * 2017-09-29 2018-05-01 东莞商铌孚自动化设备科技有限公司 A kind of light source filtration apparatus of the bright test of LED COB microdots
CN109342019A (en) * 2018-10-23 2019-02-15 广州硅能照明有限公司 Clamp for testing light spot of COB-LED light source and method for testing light spot of COB-LED light source
CN109724779A (en) * 2017-10-31 2019-05-07 深圳市炫硕智造技术有限公司 COB-LED lamp inspection examining system and detection method
CN211627351U (en) * 2019-12-31 2020-10-02 深圳市标谱半导体科技有限公司 COB double-station testing device

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN204679247U (en) * 2015-04-17 2015-09-30 深圳市炫硕光电科技有限公司 Chip on board light splitting detects machine and adjustable probe device thereof
CN105116354A (en) * 2015-09-06 2015-12-02 深圳市源磊科技有限公司 Online testing apparatus and online testing method for LED encapsulation
CN106644405A (en) * 2016-12-01 2017-05-10 深圳市标谱半导体科技有限公司 Spectrophotometric equipment for testing tiny electronic components
CN106950514A (en) * 2017-04-17 2017-07-14 山东晶泰星光电科技有限公司 Mechanism for testing and its light splitting machine and braider for testing the integrated modules of LED
CN207300546U (en) * 2017-09-29 2018-05-01 东莞商铌孚自动化设备科技有限公司 A kind of light source filtration apparatus of the bright test of LED COB microdots
CN109724779A (en) * 2017-10-31 2019-05-07 深圳市炫硕智造技术有限公司 COB-LED lamp inspection examining system and detection method
CN109342019A (en) * 2018-10-23 2019-02-15 广州硅能照明有限公司 Clamp for testing light spot of COB-LED light source and method for testing light spot of COB-LED light source
CN211627351U (en) * 2019-12-31 2020-10-02 深圳市标谱半导体科技有限公司 COB double-station testing device

Similar Documents

Publication Publication Date Title
US4028728A (en) Method of and video system for identifying different light-reflective surface areas on articles
CN106950514B (en) Testing mechanism for testing LED integrated module, light splitting machine and braider thereof
CN104483617A (en) Online flip LED chip detection device
CN105548217A (en) Appearance inspection device and method of film coating product
CN103038603A (en) Apparatus and method for three dimensional inspection of wafer saw marks
CN211627351U (en) COB double-station testing device
CN102934541B (en) Component mounting method and component mounter
CN105772413A (en) ICT rotary disc testing system
CN209764746U (en) Appearance detection equipment
CN110987831A (en) COB (chip on Board) double-station testing method and device
WO2018179048A1 (en) Surface mounting machine
CN111752020A (en) Detection device
JP4563847B2 (en) Board inspection equipment
JP4534080B2 (en) Work inspection device
CN213779454U (en) Shading mechanism and detection device
KR100490455B1 (en) Appearance examining apparatus
CN219590215U (en) Circular knife defect detection device
CN112798611A (en) Double-station circuit board visual detection system
JP2006258632A (en) Substrate inspection device
CN101686637A (en) Method and device for distinguishing the type of the suction nozzle of a surface mounting machine
CN209721938U (en) Cutter for substrate
CN206824218U (en) Photo resistance detects sorting equipment
CN112198171A (en) Appearance inspection machine capable of avoiding shielding light source
JP4443953B2 (en) LED chip optical characteristic measuring device
CN104502828A (en) Flip LED (light emitting diode) chip on-line detecting method

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
CB03 Change of inventor or designer information

Inventor after: Duan Xiongbin

Inventor after: Xiong Yajun

Inventor after: Xi Songtao

Inventor before: Duan Xiongbin

Inventor before: Xiongyajun

Inventor before: Xi Songtao

CB03 Change of inventor or designer information
RJ01 Rejection of invention patent application after publication

Application publication date: 20200410

RJ01 Rejection of invention patent application after publication