CN203981380U - The optical characteristic test device of a kind of OLED - Google Patents
The optical characteristic test device of a kind of OLED Download PDFInfo
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- CN203981380U CN203981380U CN201420426295.4U CN201420426295U CN203981380U CN 203981380 U CN203981380 U CN 203981380U CN 201420426295 U CN201420426295 U CN 201420426295U CN 203981380 U CN203981380 U CN 203981380U
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Abstract
The utility model discloses the optical characteristic test device of a kind of OLED, comprise cabinet and be positioned at jig platform, the three axle automatically testing platforms of described cabinet and control driving platform.It is the totally-enclosed system of multisystem integrated form, and except the required elementary mechanism for testing of conventionally test, required visual angle mechanism for testing and high low temperature test structure are tested in also integrated visual angle.Its elementary mechanism for testing, described high low temperature mechanism for testing, described visual angle mechanism for testing be arranged to change product test time only need change fixture.Save testing cost, and improved testing efficiency.Under the prerequisite that ensures compared with high measurement accuracy, preferably measures efficiency, realize the measurement of multiple optical parametric.
Description
Technical field
The utility model relates to oled light and learns fields of measurement, relates to specifically the optical characteristic test device of a kind of OLED.
Background technology
It is the flat panel display of future generation that is similar to and is better than LCD that OLED (Organic Light-Emitting Diode, Organic Light Emitting Diode) shows.OLED has very simple sandwich structure, between two-layer electrode, accompanies the organic material that one deck is very thin, and in the time having electric current to pass through, these organic materials will be luminous.Compared with showing with LCD, OLED has plurality of advantages: because OLED itself can be luminous, without backlight, therefore OLED display screen can do lighter and thinnerly, and visible angle is larger, and color is abundanter, and can significantly save electric energy.OLED shows by type of drive dividing of passive-matrix (PM-OLED) and active-matrix (AM-OLED).The Pixel Dimensions of OLED display screen can be accomplished tens precision to hundreds of micron, shows that resolution can reach >300PPI (number of pixels that per inch has).Based on these advantages, OLED has been widely used on the mobile electronic device such as MP3, mobile phone, and expands to gradually large scale demonstration field in PC display, notebook computer, televisor etc.
Compare with the fast development of OLED, the photoelectric properties testing apparatus of OLED is but very backward, and major part still rests on discrete instrument its photoelectric properties are tested respectively, finally obtains the performance parameter of OLED.This method of testing exists a lot of defects, is in particular in:
1, measuring process is loaded down with trivial details
What the photoelectric properties of OLED were main has forward voltage, voltage breakdown, reverse leakage current, optical efficiency, serviceable life and voltage-current characteristic, voltage (electric current) light characteristic, junction temperature light characteristic etc.Need the equipment such as constant voltage (constant current) power supply, digital watch, nitometer, temperature measuring set to measure respectively these parameters and family curve.The measurement of these parameters, owing to wanting multiple apparatus measures, cannot be carried out simultaneously, and measuring process is loaded down with trivial details, waste time and energy.
2, poor repeatability, the error measured are large
Because the forward volt-ampere characteristic of device, light characteristic, temperature characterisitic etc. are the important indicators of characterizing device performance, carrier transmission characteristics, the characteristics of luminescence and luminescence efficiency for research device under test are very important, thereby the characterisitic parameter of accurately measuring OLED device is very important.Different parameter measurements need to be completed by different instruments, and measuring condition and environment certainly exist difference, adds the existence of artificial subjective factor, the consistance of measurement data and poor repeatability.And current surveying instrument is most of adopts manual operation, not only measuring error is large, efficiency is low, and data acquisition amount and gather density and be greatly restricted, and cannot obtain gratifying measurement curve.
3, serviceable life and light-decay characteristic are difficult to directly measure
The temperature of the PN junction of OLED all has a significant impact for factors such as device serviceable life, output intensity, predominant wavelengths (color), particularly in high-power OLED device or its array component, the rising of PN junction temperature, will have a strong impact on performance, serviceable life and the reliability of OLED.Therefore junction temperature and junction temperature brightness decay characteristic how to measure quickly and accurately LED have become the necessary parameter of OLED reliability testing.What measure at present temperature, brightness measurement use is the instrument of two platform independent, when being difficult to carry out two parameters, measures, and this has brought difficulty to junction temperature brightness decay characteristic test.
Utility model content
The utility model aims to provide the optical characteristic test device that can measure the OLED of multiple optical parametric under a kind of prerequisite ensureing compared with high measurement accuracy, preferably measure efficiency.
For solving the problems of the technologies described above, the technical solution of the utility model is:
An optical characteristic test device of OLED, comprises cabinet and is positioned at jig platform, the three axle automatically testing platforms of described cabinet and controls driving platform.
Wherein said jig platform comprises brace table and is positioned at the elementary mechanism for testing on described brace table, high low temperature mechanism for testing, visual angle mechanism for testing and brightness adjustable light sources, described visual angle mechanism for testing comprises automatic rotation measurement jig and manual rotation measurement jig, described automatic rotation measurement jig is by servomotor control, and described brace table below is provided with slide rail.
Described jig platform top is provided with three axle automatically testing platforms, described three axle automatically testing platforms comprise 3 d-line movable base and tester, described 3 d-line movable base comprises the orthogonal X-axis rectilinear movement of place plane seat, Y-axis rectilinear movement seat, Z axis rectilinear movement seat, and described tester is arranged on described 3 d-line movable base by clamping device.
Described control drives platform and described jig platform and described three axle automatically testing platforms to be connected and to be positioned at the below of described jig platform, and described control drives platform to comprise industrial control host, height temperature control mechanism, signal generator and power supply unit.
Described high low temperature mechanism for testing comprises heat-conducting block, stationary fixture, high low temperature heating plate further, and described high low temperature heating plate is connected with described heat-conducting block, and described heat-conducting block is connected with described stationary fixture.
Described automatic rotation measurement jig comprises rotating base, mounting seat, clamping part further, described mounting seat is fixed on described rotating base, described clamping part is arranged in described mounting seat, and described rotating base and described mounting seat are plate-like structure.
The described Y-axis rectilinear movement seat plane at place and the plane parallel at described jig platform place further, the quantity of described Y-axis rectilinear movement seat is two.
Described stationary fixture is set on installing plate further, and described installing plate is provided with multiple installation portions, by described installation portion, described stationary fixture is fixed on described heat-conducting block.
Described elementary mechanism for testing comprises multiple measurement jigs further, and described in each, measurement jig is arranged on described brace table, and described brace table is provided with multiple installation portions, by described installation portion, multiple described measurement jigs is fixed on described brace table.
Also comprise further display and display frame, described display frame is fixedly connected with described cabinet, and described display is arranged on described display frame, and described display is connected with described tester.
Described cabinet below is provided with Shockproof castor further.
Also comprise further control panel, described control panel is provided with function button.
Described function button comprises one or more in warning instruction button, power switch button, power supply instruction button, reset button, industrial computer button, scram button, speed governing button, illuminated pushbutton switch, illuminated button further.
Adopt technique scheme, the utility model at least comprises following beneficial effect:
The optical characteristic test device of OLED described in the utility model, is the totally-enclosed system of multisystem integrated form, and except the required elementary mechanism for testing of conventionally test, required visual angle mechanism for testing and high low temperature test structure are tested in also integrated visual angle.Its elementary mechanism for testing, described high low temperature mechanism for testing, described visual angle mechanism for testing be arranged to change product test time only need change fixture.Save testing cost, and improved testing efficiency.Under the prerequisite that ensures compared with high measurement accuracy, preferably measures efficiency, realize the measurement of multiple optical parametric.
Brief description of the drawings
Fig. 1 is the front view of the optical characteristic test device of OLED described in the utility model;
Fig. 2 is the structural representation of the optical characteristic test device of OLED described in the utility model;
Fig. 3 is the structural representation of high low temperature mechanism for testing described in the utility model;
Fig. 4 is the structural representation of automatic rotation measurement jig described in the utility model.
Wherein: 1. jig platform, 2. three axle automatically testing platforms, 3. control and drive platform, 10. brace table, 11. automatic rotation measurement jigs, 12. manual rotation measurement jigs, 13. light sources, 14. heat-conducting blocks, 15. stationary fixtures, 16. high low temperature heating plates, 111. rotating base, 112. mounting seat, 113. clamping part, 21.X axle rectilinear movement seat, 22.Y axle rectilinear movement seat, 23.Z axle rectilinear movement seat, 24. testers, 31. industrial control host, 32. height temperature control mechanisms, 33. signal generators, 34. power supply units, 4. cabinet, 5. Shockproof castor, 6. control panel, 7. function button.
Embodiment
Below in conjunction with drawings and Examples, the utility model is further illustrated.
As shown in Figures 1 to 4, for meeting the optical characteristic test device of a kind of OLED of the present utility model, comprise cabinet 4 and be positioned at jig platform 1, the three axle automatically testing platforms 2 of described cabinet 4 and control driving platform 3.Described jig platform 1 placing clamp, fixing OLED to be measured.Described three axle automatically testing platforms 2 complete optical characteristic test, and described control drives platform 3 to control the motion of described jig platform 1 and described three axle automatically testing platform 2 associated components.
Wherein said jig platform 1 comprises brace table 10 and is positioned at the elementary mechanism for testing on described brace table 10, high low temperature mechanism for testing, visual angle mechanism for testing and brightness adjustable light sources 13.Described elementary mechanism for testing is for carrying out the optic test under conventional environment to OLED to be measured, described high low temperature mechanism for testing is used for the optic test under the capable high temperature of OLED to be measured or low temperature environment, described visual angle mechanism for testing is for realizing comprehensive, the multi-angle test to OLED to be measured, and described brightness adjustable light sources 13 can be for providing necessary light emitting source 13 in test process.
Described visual angle mechanism for testing comprises automatic rotation measurement jig 11 and manual rotation measurement jig 12, and described automatic rotation measurement jig 11 is by servomotor control.Described automatic rotation measurement jig 11 can be realized horizontal 360-degree rotation and level ± 90, front and back degree Turnover testing.Described manual rotation measurement jig 12, by manually controlling, can be realized left and right horizontal ± 90 degree Turnover testing.Can realize comprehensive, multi-angle test to OLED to be measured, test result is more accurate.
Described brace table 10 left sides are described elementary mechanism for testing and/or described high low temperature mechanism for testing (need to use fixture to fix when test), and the right is visual angle mechanism for testing and/or described high low temperature mechanism for testing (need to use fixture to fix when test) and described brightness adjustable light sources 13.The position that is described high low temperature mechanism for testing place does not limit, and optic test under conventional environment and under high temperature or low temperature environment can all carry out on described high low temperature mechanism for testing.
Described brace table 10 belows are provided with slide rail, and described brace table 10 can manually pull out, and is convenient to place OLED to be measured, has reduced test man's fatigue strength.
Described jig platform 1 top is provided with three axle automatically testing platforms 2, described three axle automatically testing platforms 2 comprise 3 d-line movable base and tester 24, described 3 d-line movable base comprises the orthogonal X-axis rectilinear movement of place plane seat 21, Y-axis rectilinear movement seat 22, Z axis rectilinear movement seat 23, and described tester 24 is arranged on described 3 d-line movable base by clamping device.Described tester 24 can move along X-axis, Y-axis, three directions of Z axis, detects more flexible.Preferably its X-direction automated movement stroke is 800mm, and precision is 0.01mm; Y direction automated movement stroke is 400mm, and precision is 0.01mm; Z-direction automated movement stroke is 350mm, and precision is 0.01mm.Described X-axis adjusting seat, Y-axis adjusting seat and Z axis adjusting seat can drive by motor, also can provide other mechanisms to drive, due to its routine techniques means that are those skilled in the art, so locate to repeat no more.Described tester 24 is for obtaining every optical parametric of OLED to be measured.
Its test event is as follows:
1.OLED material behavior measure the item
(1) I-V-L curved measurement measurement data is containing the brightness of OLED, colourity, electric current, voltage, current density, luminance efficiency, luminous efficiency, luminous power efficiency, CRI colour rendering index, external quantum efficiency
(2) half-life measurement
(3) spectral measurement/manual measurement
2.OLED display screen optical characteristic measurement project
(1) YC uniformity measurement
(2) visible angle is measured
(3) red, green, blue colour gamut and contrast are measured
(4) Gamma curved measurement
(5) Cross-Talk measures
The measurement data of 3.I-V-L
The result of measuring comprises: brightness L (cd/m2), current efficiency (mA/cm2), luminescence efficiency, external quantum efficiency, chromaticity coordinates (x, y), colour temperature, colour rendering index CRI, luminescent spectrum.
Described control drives platform 3 and described jig platform 1 and described three axle automatically testing platforms 2 to be connected and to be positioned at the below of described jig platform 1, and described control drives platform 3 to comprise industrial control host 31, height temperature control mechanism 32, signal generator 33 and power supply unit 34.
Described high low temperature mechanism for testing comprises heat-conducting block 14, stationary fixture 15, high low temperature heating plate 16, and described high low temperature heating plate 16 is connected with described heat-conducting block 14, and described heat-conducting block 14 is connected with described stationary fixture 15.Described high low temperature mechanism for testing, by described high low temperature heating plate 16 heat supplies, is delivered to be measured OLED region from described high low temperature heating plate 16 through described stationary fixture 15 by heat energy by described heat-conducting block 14.Described high low temperature heating plate 16 is public heating plate, and described heat-conducting block 14 can design processing according to different product size with described stationary fixture 15, due to its routine techniques means that are those skilled in the art, so locate to repeat no more.Save like this testing cost, and improved testing efficiency, while changing product test, only need change described heat-conducting block 14 and described stationary fixture 15.
Described automatic rotation measurement jig 11 comprises rotating base 111, mounting seat 112, clamping part 113, described mounting seat 112 is fixed on described rotating base 111, described clamping part 113 is arranged in described mounting seat 112, and described rotating base 111 and described mounting seat 112 are plate-like structure.Described rotating part is used for realizing horizontal 360-degree rotation and the degree upset of level ± 90, front and back, and described installation portion is used for installing described clamping part 113, and described clamping part 113 need to clamp OLED to be measured.Described manual rotation measurement jig 12 can be identical from the structure of described automatic rotation measurement jig 11 also can be different, it is mainly the difference that arranges of type of drive.Due to its routine techniques means that are those skilled in the art, so locate to repeat no more.
The setting of described automatic rotation measurement jig 11 and described manual rotation measurement jig 12, by changing structure and the size of described clamping part 113, the multiple PCB wiring board that can compatible communicate by letter with OLED, be fixed by bolt with described brace table 10, while ensureing visual angle test, can not be subjected to displacement.Can test multiple OLED product by the device of the present embodiment, test products is extensive, and use-pattern is flexible.
The described Y-axis rectilinear movement seat plane at 22 places and the plane parallel at described jig platform 1 place, the quantity of described Y-axis rectilinear movement seat 22 is preferably two, and the quantity of described X-axis rectilinear movement seat 21 and described Z axis rectilinear movement seat 23 is preferably one.Because its motion in Y direction is more compared with the motion of other both directions, so arrange and can ensure the mobile demand of described tester 24 completely.
Described stationary fixture 15 is set on installing plate, and described installing plate is provided with multiple installation portions, by described installation portion, described stationary fixture 15 is fixed on described heat-conducting block 14.
Described elementary mechanism for testing comprises multiple measurement jigs, and described in each, measurement jig is arranged on described brace table 10, and described brace table 10 is provided with multiple installation portions, by described installation portion, multiple described measurement jigs is fixed on described brace table 10.Described measurement jig is conventional measurement jig, can design processing according to different product size, due to its routine techniques means that are those skilled in the art, so locate to repeat no more.
The present embodiment also comprises display and display frame, and described display frame is fixedly connected with described cabinet 4, and described display is arranged on described display frame, and described display is connected with described tester 24.By the setting of described display, tester can watch more intuitively test structure and carry out various test operations, operates simpler.
Preferably described tester 24 is spectrometer.The brightness of described spectrometer for measuring OLED, colourity, electric current, voltage, current density, luminance efficiency, luminous efficiency, spectrum, external quantum efficiency etc.Described spectrometer preferably uses USB2000+ spectrometer, and its optical resolution is 10.0nm FWHM, and between 3.8ms-10s, so can ensure to obtain higher measuring accuracy and shorter test period integral time.
Preferably described cabinet 4 belows are provided with Shockproof castor 5; can move comparatively easily described cabinet 4 by described Shockproof castor 5; while drops to vibrations minimum in the time of mobile described cabinet 4, has effectively protected whole device, makes whole device have greatly dirigibility and security.
The present embodiment also comprises control panel 6, and described control panel 6 is arranged on described cabinet 4, and described control panel 6 is provided with function button 7.Preferably described function button 7 comprises one or more in warning instruction button, power switch button, power supply instruction button, reset button, industrial computer button, scram button, speed governing button, illuminated pushbutton switch, illuminated button.
The optical characteristic test device of LED described in the present embodiment, is the totally-enclosed system of multisystem integrated form, and except the required elementary mechanism for testing of conventionally test, required visual angle mechanism for testing and high low temperature test structure are tested in also integrated visual angle.Its elementary mechanism for testing, described high low temperature mechanism for testing, described visual angle mechanism for testing be arranged to change product test time only need change fixture.Save testing cost, and improved testing efficiency.Under the prerequisite that ensures compared with high measurement accuracy, preferably measures efficiency, realize the measurement of multiple optical parametric.
Above an embodiment of the present utility model is had been described in detail, but the preferred embodiment that described content is only created for the utility model can not be considered to for limiting practical range of the present utility model.All any equivalent variations of doing according to the utility model application range, all should be still within patent covering scope of the present utility model.
Claims (10)
1. an optical characteristic test device of OLED, is characterized in that, comprises cabinet and be positioned at jig platform, the three axle automatically testing platforms of described cabinet and control driving platform;
Wherein said jig platform comprises brace table and is positioned at the elementary mechanism for testing on described brace table, high low temperature mechanism for testing, visual angle mechanism for testing and brightness adjustable light sources, described visual angle mechanism for testing comprises automatic rotation measurement jig and manual rotation measurement jig, described automatic rotation measurement jig is by servomotor control, and described brace table below is provided with slide rail;
Described jig platform top is provided with three axle automatically testing platforms, described three axle automatically testing platforms comprise 3 d-line movable base and tester, described 3 d-line movable base comprises the orthogonal X-axis rectilinear movement of place plane seat, Y-axis rectilinear movement seat, Z axis rectilinear movement seat, and described tester is arranged on described 3 d-line movable base by clamping device;
Described control drives platform and described jig platform and described three axle automatically testing platforms to be connected and to be positioned at the below of described jig platform, and described control drives platform to comprise industrial control host, height temperature control mechanism, signal generator and power supply unit.
2. the optical characteristic test device of OLED as claimed in claim 1, it is characterized in that: described high low temperature mechanism for testing comprises heat-conducting block, stationary fixture, high low temperature heating plate, described high low temperature heating plate is connected with described heat-conducting block, and described heat-conducting block is connected with described stationary fixture.
3. the optical characteristic test device of OLED as claimed in claim 2, it is characterized in that: described automatic rotation measurement jig comprises rotating base, mounting seat, clamping part, described mounting seat is fixed on described rotating base, described clamping part is arranged in described mounting seat, and described rotating base and described mounting seat are plate-like structure.
4. the optical characteristic test device of OLED as claimed in claim 3, is characterized in that: the described Y-axis rectilinear movement seat plane at place and the plane parallel at described jig platform place, the quantity of described Y-axis rectilinear movement seat is two.
5. the optical characteristic test device of the OLED as described in as arbitrary in claim 2-4, it is characterized in that: described stationary fixture is set on installing plate, described installing plate is provided with multiple installation portions, by described installation portion, described stationary fixture is fixed on described heat-conducting block.
6. the optical characteristic test device of OLED as claimed in claim 5, it is characterized in that: described elementary mechanism for testing comprises multiple measurement jigs, described in each, measurement jig is arranged on described brace table, described brace table is provided with multiple installation portions, by described installation portion, multiple described measurement jigs is fixed on described brace table.
7. the optical characteristic test device of OLED as claimed in claim 6, it is characterized in that: also comprise display and display frame, described display frame is fixedly connected with described cabinet, and described display is arranged on described display frame, and described display is connected with described tester.
8. the optical characteristic test device of OLED as claimed in claim 7, is characterized in that: described cabinet below is provided with Shockproof castor.
9. the optical characteristic test device of OLED as claimed in claim 7 or 8, is characterized in that: also comprise control panel, described control panel is provided with function button.
10. the optical characteristic test device of OLED as claimed in claim 9, is characterized in that: described function button comprises one or more in warning instruction button, power switch button, power supply instruction button, reset button, industrial computer button, scram button, speed governing button, illuminated pushbutton switch, illuminated button.
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| CN201420426295.4U CN203981380U (en) | 2014-07-30 | 2014-07-30 | The optical characteristic test device of a kind of OLED |
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| CN105158944A (en) * | 2015-10-19 | 2015-12-16 | 北京京东方茶谷电子有限公司 | Lighting jig |
| CN106053020A (en) * | 2016-06-07 | 2016-10-26 | 北京安达维尔民用航空技术有限公司 | Optical detection device |
| CN107462404A (en) * | 2017-09-22 | 2017-12-12 | 颜斐 | Flat-panel monitor reflection/diffusing reflection and environment optical contrast ratio test device |
| CN107702897A (en) * | 2017-09-22 | 2018-02-16 | 颜斐 | The optical characteristics automatic measurement board of flat-panel monitor under high and low temperature environment |
| CN107942545A (en) * | 2017-11-02 | 2018-04-20 | 深圳同兴达科技股份有限公司 | Transmission measurement instrument and test method in LCD display modules face |
| CN108227255A (en) * | 2018-01-29 | 2018-06-29 | 昆山龙腾光电有限公司 | The visual angle measuring method of liquid crystal display device |
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| CN108760241A (en) * | 2018-07-11 | 2018-11-06 | 武汉精测电子集团股份有限公司 | A kind of display panel various visual angles detection device |
| CN108986722A (en) * | 2018-06-27 | 2018-12-11 | 英业达(重庆)有限公司 | Screen device and method are surveyed in a kind of automation |
| CN110044584A (en) * | 2019-05-20 | 2019-07-23 | 南京视倍安智能科技有限公司 | A kind of OLED screen face optical detection apparatus |
| CN113380165A (en) * | 2021-06-10 | 2021-09-10 | Oppo广东移动通信有限公司 | Display device detection method, device, system and storage medium |
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| CN105158944A (en) * | 2015-10-19 | 2015-12-16 | 北京京东方茶谷电子有限公司 | Lighting jig |
| CN106053020A (en) * | 2016-06-07 | 2016-10-26 | 北京安达维尔民用航空技术有限公司 | Optical detection device |
| CN107462404B (en) * | 2017-09-22 | 2023-11-24 | 苏州弗士达科学仪器有限公司 | Device for testing reflection/diffuse reflection and ambient light contrast of flat panel display |
| CN107462404A (en) * | 2017-09-22 | 2017-12-12 | 颜斐 | Flat-panel monitor reflection/diffusing reflection and environment optical contrast ratio test device |
| CN107702897A (en) * | 2017-09-22 | 2018-02-16 | 颜斐 | The optical characteristics automatic measurement board of flat-panel monitor under high and low temperature environment |
| CN107942545A (en) * | 2017-11-02 | 2018-04-20 | 深圳同兴达科技股份有限公司 | Transmission measurement instrument and test method in LCD display modules face |
| CN108227255A (en) * | 2018-01-29 | 2018-06-29 | 昆山龙腾光电有限公司 | The visual angle measuring method of liquid crystal display device |
| CN108680343A (en) * | 2018-05-22 | 2018-10-19 | 歌尔股份有限公司 | A kind of flexible screen detection method and detection device |
| CN108986722A (en) * | 2018-06-27 | 2018-12-11 | 英业达(重庆)有限公司 | Screen device and method are surveyed in a kind of automation |
| CN108760241A (en) * | 2018-07-11 | 2018-11-06 | 武汉精测电子集团股份有限公司 | A kind of display panel various visual angles detection device |
| CN110044584A (en) * | 2019-05-20 | 2019-07-23 | 南京视倍安智能科技有限公司 | A kind of OLED screen face optical detection apparatus |
| CN113380165A (en) * | 2021-06-10 | 2021-09-10 | Oppo广东移动通信有限公司 | Display device detection method, device, system and storage medium |
| CN113418678A (en) * | 2021-06-10 | 2021-09-21 | Oppo广东移动通信有限公司 | Display detection device and system |
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