CN106918603A - Spectral method of detection and system - Google Patents
Spectral method of detection and system Download PDFInfo
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- CN106918603A CN106918603A CN201510993848.3A CN201510993848A CN106918603A CN 106918603 A CN106918603 A CN 106918603A CN 201510993848 A CN201510993848 A CN 201510993848A CN 106918603 A CN106918603 A CN 106918603A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
Abstract
The present invention proposes a kind of spectral method of detection and system, spectral detection system is made up of light source, light-splitting device, camera lens, image acquisition device and control circuit, one launching light of narrowband region, reflected light or transmitted light of film to be detected are by entering spectrum groupware after the lens focus, after spectrum groupware light splitting, the light of different wave length is spatially separated, image acquisition device is projected, spectral detection system includes one or more groups of optical spectrum imaging devices, and spectral method of detection includes：The spectroscopic data of film to be detected is gathered according to the sense command for receiving；Determine the spectral quality information of spectroscopic data；According to spectral quality information, the defect value of film to be detected is calculated by presetting defective value computing formula；Determine whether defect value meets pre-conditioned, so that whether the quality for determining film to be detected is qualified.By technical scheme, the reliability of film quality testing result can be lifted, and then lift the efficiency and quality of thin film testing.
Description
Technical field
The present invention relates to technical field of quality detection, in particular to a kind of spectral method of detection and
A kind of spectral detection system.
Background technology
At present, to generally include liquid crystal film, holographic dealuminzation safety line, light thinning for the film of in the market
Film, plastic sheeting, paper, cloth, calligraphy and painting etc., and these films are unavoidable during the manufacturing
Meeting existing defects, quality testing not only waste of resource, troublesome poeration, and detection knot are carried out by artificial
Fruit error is big.
Therefore a kind of new technical scheme is needed, quality testing can be carried out to film automatically.
The content of the invention
The present invention is based on above mentioned problem, it is proposed that a kind of new technical scheme, can be automatically to thin
Film carries out quality testing.
In view of this, the present invention proposes a kind of spectral method of detection, for spectral detection system, bag
Include：According to the sense command for receiving, the spectroscopic data of film to be detected is gathered, wherein, the inspection
Surveying order includes periodicity acquisition or the order being acquired according to trigger signal；Determine the light
The spectral quality information of modal data；According to the spectral quality information, calculate public by default defective value
Formula calculates the defect value of the film to be detected, and the default defective value computing formula is：
Wherein, i represents width when gathering the spectroscopic data, and j represents the collection spectrum number
According to length direction, wnScope be [0,1], represent that the n-th of the film to be detected lacks towards image
Weight coefficient is fallen into, the scope of Blobn (i, j) is [0,255], represents the n-th of the film to be detected
Towards image deflects value, TotolBlob (i, j) represents the defect of the film to be detected
Value；Determine whether the defect value meets pre-conditioned, for determining the film to be detected
Whether quality is qualified.
In the technical scheme, when sense command is received, periodic IMAQ can be carried out,
Data can also be acquired when trigger signal is received every time, calculate public by default defective value
Formula calculates the defective value of the test position of film, so as to according to the size of defective value defective value in other words
It is pre-conditioned whether residing scope meets, and judges whether film quality meets the requirements, so that
Film quality testing result is more accurate comprehensive, improves the quality and efficiency of thin film testing.Wherein,
Film described in the technical program includes but is not limited to liquid crystal film, holographic dealuminzation safety line, light and becomes
Film, plastic sheeting, paper, cloth, calligraphy and painting etc..
In the above-mentioned technical solutions, it is preferable that the spectral detection system by light source, light-splitting device,
Camera lens, image acquisition device and control circuit composition, a launching light for narrowband region of film to be detected,
Reflected light or transmitted light, by entering the spectrum groupware after the lens focus, through the light splitting group
After part light splitting, the light of different wave length is spatially separated, projects described image collector, wherein,
Described image collector is face battle array gray scale camera；The spectral detection system can include one or more groups of light
Spectrum imaging device.
In the technical scheme, there is optical lens spectrum groupware front end.One arrowband of film to be detected
The reflected light or transmitted light in region, by entering spectrum groupware, different wave length after light splitting after lens focus
Light it is spatially separated, project face battle array gray scale camera collecting unit.Face battle array gray scale camera collection
Each width two dimensional image one spectral information of narrowband region of correspondence for arriving, laterally correspondence is to be detected for image
The transverse direction of film, information of the narrowband region in the row corresponding wavelength is represented per a line, and image is longitudinally corresponding
Different spectral wavelengths, each row represent the spectral evolution information of one piece of subregion of narrowband region, image
Pixel value size represents the intensity of certain wavelength.Wherein, image acquisition device can be face battle array gray scale camera,
It can also be other kinds of image collecting device as needed in addition.
In the above-mentioned technical solutions, it is preferable that the spectroscopic data of the collection film to be detected, specifically
Including：Use the spectrum number of the whole breadth width of film to be detected described in image acquisition device multi collect
According to gather the full duration spectroscopic data of the film to be detected；Or repeatedly adopted using image acquisition device
Collect the spectroscopic data of the part breadth width of the film to be detected, wherein, described image collector exists
The width is static or carries out back and forth movement.
In the technical scheme, can be gathered using different IMAQ means according to the actual requirements
View data, specifically, can both gather the full width image data of film, it is also possible to gather film
Part breadth width view data, wherein, in gatherer process, can be by mobile image number
Image data acquiring is carried out to static film according to collector, it is also possible to allow the image acquisition device of static state
Image data acquiring is carried out to mobile film.That is, the typical method of spectra collection includes two
Kind：One be film along lengthwise movement, spectra collection system is maintained static, or (when spectra collection arrowband
Width be less than thin-film width when) spectra collection system transverse reciprocating movement；Two is that film is maintained static,
Spectra collection system moves one or many in one direction, completes the spectral information collection of entire film.
Additionally, system can gather spectral information according to actual conditions and needs by special exercise mode.Pass through
Technical scheme, diversified IMAQ means can more fit user to detection film
Demand, improve the reliability of film quality testing result, be easy to lifted detection efficiency, reduce inspection
Survey cost.
In the above-mentioned technical solutions, it is preferable that in the mistake of the spectroscopic data of the collection film to be detected
Cheng Zhong, also includes：The speed of service of described image collector is reduced, to lift the collection spectrum number
According to when directional resolution；Or the time for exposure of increase described image collector, it is described to lift collection
Directional resolution during spectroscopic data.
In the technical scheme, during the spectroscopic data of film to be detected is gathered, collect
The height of directional resolution influences the accuracy of film quality testing result, specifically, directional resolution
With the speed of service of image acquisition device into positive correlation and with time for exposure of image acquisition device into anti-phase
Relation, user can be adopted according to actual conditions by reducing the speed of service or increase image of image acquisition device
The time for exposure of storage, to obtain relatively low directional resolution so that the data for collecting are more accurate,
Be conducive to being lifted the accuracy of thin film testing quality.
In the above-mentioned technical solutions, it is preferable that the spectral quality information of the spectroscopic data includes following
At least one or its combination：The dominant wavelength of the spectroscopic data, half-wave are wide, peak strength, energy product
Point, the half-wave of the dominant wavelength of certain range of wavelengths, certain range of wavelengths is wide, certain range of wavelengths peak
Value intensity, the energy integral of certain range of wavelengths, CIE XYZ values, CIE L*a*b*Value, CIE hab
WithValue；And the spectral method of detection also includes：According to the spectrum of the spectroscopic data
Quality information, determines the qualified data space and unqualified data space of the spectroscopic data, for root
It is that defect value setting is described pre- according to the qualified data space and the unqualified data space
If condition；And according to the spectral quality information, the qualified data space and the number of non-compliances
According to space, the Blobn (i, j) of the spectroscopic data is calculated.
In the technical scheme, film quality is judged by various view data attributes, it is various
The judgment basis of change can cause that film quality testing result is more accurate comprehensive, while being lacked by default
When falling into the defective value of the test position that value computing formula calculates film, can be drawn according to view data attribute
Qualified data space and unqualified data space are separated, such that it is able to determine whether that defective value is to be located at
In qualified data space or in unqualified data space, film quality testing result is drawn.It is logical
The technical scheme is crossed, qualified data space and the unqualified data space of division can be caused to defective value
Scope judge more accurate so that film quality testing result more it is accurate comprehensively, carry
The quality and efficiency of thin film testing are risen.Wherein, CIE is color system, CIE XYZ, CIE
L*a*b*、CIE hab、It is its different color space.
In the above-mentioned technical solutions, it is preferable that the quality for determining the film to be detected whether
After qualified, also include：Storage quality measurements, and for off quality described to be detected thin
Film sets flaw labeling, for recognizing and processes the film described to be detected with the flaw labeling.
In the technical scheme, by storing quality measurements, and for off quality to be detected
Film sets flaw labeling, for recognizing and processes the film to be detected with flaw labeling so that after
Continuous associated processing system directly can carry out classification treatment according to mark to faulty goods, and then greatly promote
The efficiency of thin film testing.
The invention allows for a kind of spectral detection system, including：Spectrum data gathering unit, according to
The sense command for receiving, gathers the spectroscopic data of film to be detected, wherein, the sense command bag
Include periodicity acquisition or the order being acquired according to trigger signal；Spectral quality information determines single
Unit, determines the spectral quality information of the spectroscopic data；Defective value computing unit, according to the spectrum
Quality information, the defect value of the film to be detected is calculated by presetting defective value computing formula,
The default defective value computing formula is：
Wherein, i represents width when gathering the spectroscopic data, and j represents the collection spectrum number
According to length direction, wnScope be [0,1], represent that the n-th of the film to be detected lacks towards image
Weight coefficient is fallen into, the scope of Blobn (i, j) is [0,255], represents the n-th of the film to be detected
Towards image deflects value, TotolBlob (i, j) represents the defect of the film to be detected
Value；Quality judging unit, determines whether the defect value meets pre-conditioned, for determining institute
Whether the quality for stating film to be detected is qualified.
In the technical scheme, when sense command is received, periodic IMAQ can be carried out,
Data can also be acquired when trigger signal is received every time, calculate public by default defective value
Formula calculates the defective value of the test position of film, so as to according to the size of defective value defective value in other words
It is pre-conditioned whether residing scope meets, and judges whether film quality meets the requirements, so that
Film quality testing result is more accurate comprehensive, improves the quality and efficiency of thin film testing.Wherein,
Film described in the technical program includes but is not limited to liquid crystal film, holographic dealuminzation safety line, light and becomes
Film, plastic sheeting, paper, cloth, calligraphy and painting etc..
In the above-mentioned technical solutions, it is preferable that the spectral detection system by light source, light-splitting device,
Camera lens, image acquisition device and control circuit composition, a launching light for narrowband region of film to be detected,
Reflected light or transmitted light, by entering the spectrum groupware after the lens focus, through the light splitting group
After part light splitting, the light of different wave length is spatially separated, projects described image collector, wherein,
Described image collector is face battle array gray scale camera；The spectral detection system can include one or more groups of light
Spectrum imaging device.
In the technical scheme, there is optical lens spectrum groupware front end.One arrowband of film to be detected
The reflected light or transmitted light in region, by entering spectrum groupware, different wave length after light splitting after lens focus
Light it is spatially separated, project face battle array gray scale camera collecting unit.Face battle array gray scale camera collection
Each width two dimensional image one spectral information of narrowband region of correspondence for arriving, laterally correspondence is to be detected for image
The transverse direction of film, information of the narrowband region in the row corresponding wavelength is represented per a line, and image is longitudinally corresponding
Different spectral wavelengths, each row represent the spectral evolution information of one piece of subregion of narrowband region, image
Pixel value size represents the intensity of certain wavelength.Wherein, image acquisition device can be face battle array gray scale camera,
It can also be other kinds of image collecting device as needed in addition.
In the above-mentioned technical solutions, it is preferable that the spectrum data gathering unit includes：First collection
Unit, uses the spectrum number of the whole breadth width of film to be detected described in image acquisition device multi collect
According to gather the full duration spectroscopic data of the film to be detected；And/or second collecting unit, make
With the spectroscopic data of the part breadth width of film to be detected described in image acquisition device multi collect, wherein,
Described image collector is static in the width or carries out back and forth movement.
In the technical scheme, can be gathered using different IMAQ means according to the actual requirements
View data, specifically, can both gather the full width image data of film, it is also possible to gather film
Part breadth width view data, wherein, in gatherer process, can be by mobile image number
Image data acquiring is carried out to static film according to collector, it is also possible to allow the image acquisition device of static state
Image data acquiring is carried out to mobile film.That is, the typical method of spectra collection includes two
Kind：One be film along lengthwise movement, spectra collection system is maintained static, or (when spectra collection arrowband
Width be less than thin-film width when) spectra collection system transverse reciprocating movement；Two is that film is maintained static,
Spectra collection system moves one or many in one direction, completes the spectral information collection of entire film.
Additionally, system can gather spectral information according to actual conditions and needs by special exercise mode.Pass through
Technical scheme, diversified IMAQ means can more fit user to detection film
Demand, improve the reliability of film quality testing result, be easy to lifted detection efficiency, reduce inspection
Survey cost.
In the above-mentioned technical solutions, it is preferable that also include：Speed of service adjustment unit, adopts described
During collecting the spectroscopic data of film to be detected, the speed of service of described image collector is reduced, with
Lifting gathers the directional resolution during spectroscopic data；And/or time for exposure adjustment unit, in institute
During stating the spectroscopic data for gathering film to be detected, increase the time for exposure of described image collector,
To lift directional resolution when gathering the spectroscopic data.
In the technical scheme, during the spectroscopic data of film to be detected is gathered, collect
The height of directional resolution influences the accuracy of film quality testing result, specifically, directional resolution
Inverse correlation, Yong Huke when speed of service positive correlation with image acquisition device and the exposure with image acquisition device
During according to actual conditions by reducing the speed of service of image acquisition device or increasing the exposure of image acquisition device
Between, to obtain directional resolution higher so that the data for collecting are more accurate, be conducive to lifting thin
Film detects the accuracy of quality.
In the above-mentioned technical solutions, it is preferable that the spectral quality information of the spectroscopic data includes following
At least one or its combination：The dominant wavelength of the spectroscopic data, half-wave are wide, peak strength, energy product
Point, the half-wave of the dominant wavelength of certain range of wavelengths, certain range of wavelengths is wide, certain range of wavelengths peak
Value intensity, the energy integral of certain range of wavelengths, CIE XYZ values, CIE L*a*b*Value, CIE hab
WithValue；And the spectral detection system also includes：Data space determining unit, according to described
The spectral quality information of spectroscopic data, determines the qualified data space of the spectroscopic data and does not conform to
Lattice data space, for being described comprehensive according to the qualified data space and the unqualified data space
Close defective value and set described pre-conditioned；And defective value determining unit, believed according to the spectral quality
Breath, the qualified data space and the unqualified data space, calculate the spectroscopic data
Blobn (i, j).
In the technical scheme, film quality is judged by various view data attributes, it is various
The judgment basis of change can cause that film quality testing result is more accurate comprehensive, while being lacked by default
When falling into the defective value of the test position that value computing formula calculates film, can be drawn according to view data attribute
Qualified data space and unqualified data space are separated, such that it is able to determine whether that defective value is to be located at
In qualified data space or in unqualified data space, film quality testing result is drawn.It is logical
The technical scheme is crossed, qualified data space and the unqualified data space of division can be caused to defective value
Scope judge more accurate so that film quality testing result more it is accurate comprehensively, carry
The quality and efficiency of thin film testing are risen.CIE is color system, CIE XYZ, CIE L*a*b*、
CIE hab、It is its different color space.
In the above-mentioned technical solutions, it is preferable that also include：Memory cell, treats described in the determination
After detecting whether the quality of film is qualified, quality measurements are stored；And indexing unit, it is matter
Measure the underproof film to be detected and flaw labeling is set, for recognizing and process with the defect
The film described to be detected of mark.
In the technical scheme, by storing quality measurements, and for off quality to be detected
Film sets flaw labeling, for recognizing and processes the film to be detected with flaw labeling so that after
Continuous associated processing system directly can carry out classification treatment according to mark to faulty goods, and then be conducive to carrying
Rise the efficiency of thin film testing.
By above technical scheme, it is possible to achieve carry out automatic detection to film quality, so as to avoid
Unnecessary waste of human resource, while improving the reliability of film quality testing result, Jin Eryou
Beneficial to the efficiency and quality of lifting thin film testing.
Brief description of the drawings
Fig. 1 shows the schematic flow sheet of spectral method of detection according to an embodiment of the invention；
Fig. 2 shows the schematic block diagram of spectral detection system according to an embodiment of the invention；
Fig. 3 shows the structural representation of spectral detection system according to another embodiment of the invention；
Fig. 4 shows the schematic diagram of the spectrum imaging system in Fig. 3；
Fig. 5 shows the linear light sorurce structure chart of spectrum imaging system；
Fig. 6 shows the imaging effect schematic diagram of spectrum imaging system.
Specific embodiment
In order to be more clearly understood that the above objects, features and advantages of the present invention, with reference to attached
Figure and specific embodiment are further described in detail to the present invention.It should be noted that not
In the case of conflict, the feature in embodiments herein and embodiment can be mutually combined.
Many details are elaborated in the following description in order to fully understand the present invention, but,
The present invention can also be different from other modes described here to implement using other, therefore, the present invention
Protection domain do not limited by following public specific embodiment.
Fig. 1 shows the schematic flow sheet of spectral method of detection according to an embodiment of the invention.
As shown in figure 1, spectral method of detection according to an embodiment of the invention, including：
Step 102, according to the sense command for receiving, gathers the spectroscopic data of film to be detected, its
In, sense command includes periodicity acquisition or the order being acquired according to trigger signal.
Step 104, determines the spectral quality information of spectroscopic data.
Step 106, according to spectral quality information, calculates to be detected by default defective value computing formula
The defect value of film, presetting defective value computing formula is：
Wherein, i represents width when gathering spectroscopic data, and j represents the length of collection spectroscopic data
Direction, wnScope be [0,1], represent the n-th of film to be detected towards image deflects weight coefficient,
The scope of Blobn (i, j) is [0,255], represents the n-th of film to be detected towards image deflects value,
TotolBlob (i, j) represents the defect value of film to be detected.
Step 108, determines whether defect value meets pre-conditioned, for determining film to be detected
Quality it is whether qualified.
In the technical scheme, when sense command is received, periodic IMAQ can be carried out,
Data can also be acquired when trigger signal is received every time, calculate public by default defective value
Formula calculates the defective value of the test position of film, so as to according to the size of defective value defective value in other words
It is pre-conditioned whether residing scope meets, and judges whether film quality meets the requirements, so that
Film quality testing result is more accurate comprehensive, improves the quality and efficiency of thin film testing.Wherein,
Film in the technical program include but is not limited to liquid crystal film, holographic dealuminzation safety line, light-variation film,
Plastic sheeting, paper, cloth, calligraphy and painting etc..
In the above-mentioned technical solutions, it is preferable that the spectral detection system by light source, light-splitting device,
Camera lens, image acquisition device and control circuit composition, a launching light for narrowband region of film to be detected,
Reflected light or transmitted light, by entering the spectrum groupware after the lens focus, through the light splitting group
After part light splitting, the light of different wave length is spatially separated, projects described image collector, wherein,
Described image collector is face battle array gray scale camera；The spectral detection system can include one or more groups of light
Spectrum imaging device.
In the technical scheme, there is optical lens spectrum groupware front end.One arrowband of film to be detected
The reflected light or transmitted light in region, by entering spectrum groupware, different wave length after light splitting after lens focus
Light it is spatially separated, project face battle array gray scale camera collecting unit.Face battle array gray scale camera collection
Each width two dimensional image one spectral information of narrowband region of correspondence for arriving, laterally correspondence is to be detected for image
The transverse direction of film, information of the narrowband region in the row corresponding wavelength is represented per a line, and image is longitudinally corresponding
Different spectral wavelengths, each row represent the spectral evolution information of one piece of subregion of narrowband region, image
Pixel value size represents the intensity of certain wavelength.Wherein, image acquisition device can be face battle array gray scale camera,
It can also be other kinds of image collecting device as needed in addition.
In the above-mentioned technical solutions, it is preferable that step 102 is specifically included：It is many using image acquisition device
The spectroscopic data of the whole breadth width of secondary collection film to be detected, to gather the overall with of film to be detected
Degree spectroscopic data；Or the light of the part breadth width using image acquisition device multi collect film to be detected
Modal data, wherein, image acquisition device is static in width or carries out back and forth movement.
In the technical scheme, can be gathered using different IMAQ means according to the actual requirements
View data, specifically, can both gather the full width image data of film, it is also possible to gather film
Part breadth width view data, wherein, in gatherer process, can be by mobile image number
Image data acquiring is carried out to static film according to collector, it is also possible to allow the image acquisition device of static state
Image data acquiring is carried out to mobile film.That is, the typical method of spectra collection includes two
Kind：One be film along lengthwise movement, spectra collection system is maintained static, or (when spectra collection arrowband
Width be less than thin-film width when) spectra collection system transverse reciprocating movement；Two is that film is maintained static,
Spectra collection system moves one or many in one direction, completes the spectral information collection of entire film.
Additionally, system can gather spectral information according to actual conditions and needs by special exercise mode.Pass through
Technical scheme, diversified IMAQ means can more fit user to detection film
Demand, improve the reliability of film quality testing result, be easy to lifted detection efficiency, reduce inspection
Survey cost.
In the above-mentioned technical solutions, it is preferable that during the spectroscopic data of film to be detected is gathered,
Also include：The speed of service of image acquisition device is reduced, it is directionally resolved during collection spectroscopic data to be lifted
Rate；Or the time for exposure of increase image acquisition device, to lift directional resolution during collection spectroscopic data.
In the technical scheme, during the spectroscopic data of film to be detected is gathered, collect
The height of directional resolution influences the accuracy of film quality testing result, specifically, directional resolution
With the speed of service of image acquisition device into positive correlation and with time for exposure of image acquisition device into anti-phase
Relation, user can be adopted according to actual conditions by reducing the speed of service or increase image of image acquisition device
The time for exposure of storage, to obtain relatively low directional resolution so that the data for collecting are more accurate,
Be conducive to being lifted the accuracy of thin film testing quality.
In the above-mentioned technical solutions, it is preferable that the spectral quality information of spectroscopic data include it is following at least
One or a combination set of：The dominant wavelength of spectroscopic data, half-wave are wide, peak strength, energy integral, certain
The dominant wavelength of range of wavelengths, the half-wave of certain range of wavelengths are wide, certain range of wavelengths peak strength,
The energy integral of certain range of wavelengths, CIE XYZ values, CIE L*a*b*Value, CIE habWithValue；
And spectral method of detection also includes：Spectral quality information according to spectroscopic data, determines spectroscopic data
Qualified data space and unqualified data space, for according to qualified data space and number of non-compliances evidence
Space is that the setting of defect value is pre-conditioned；And according to spectral quality information, qualified data space
With unqualified data space, the Blobn (i, j) of spectroscopic data is calculated.
In the technical scheme, film quality is judged by various view data attributes, it is various
The judgment basis of change can cause that film quality testing result is more accurate comprehensive, while being lacked by default
When falling into the defective value of the test position that value computing formula calculates film, can be drawn according to view data attribute
Qualified data space and unqualified data space are separated, such that it is able to determine whether that defective value is to be located at
In qualified data space or in unqualified data space, film quality testing result is drawn.It is logical
The technical scheme is crossed, qualified data space and the unqualified data space of division can be caused to defective value
Scope judge more accurate so that film quality testing result more it is accurate comprehensively, carry
The quality and efficiency of thin film testing are risen.CIE is color system, CIE XYZ, CIE L*a*b*、
CIE hab、It is its different color space.
In the above-mentioned technical solutions, it is preferable that after step 108, also include：Storage quality inspection
Result is surveyed, and is that film to be detected off quality sets flaw labeling, for recognizing and process tool
The film to be detected of defective mark.
In the technical scheme, by storing quality measurements, and for off quality to be detected
Film sets flaw labeling, for recognizing and processes the film to be detected with flaw labeling so that after
Continuous associated processing system directly can carry out classification treatment according to mark to faulty goods, and then greatly promote
The efficiency of thin film testing.
Fig. 2 shows the schematic block diagram of spectral detection system according to an embodiment of the invention.
As shown in Fig. 2 spectral detection system according to an embodiment of the invention 200, including：
Spectrum data gathering unit 202, according to the sense command for receiving, gathers the spectrum of film to be detected
Data, wherein, sense command includes periodicity acquisition or the life being acquired according to trigger signal
Order；Spectral quality information determination unit 204, determines the spectral quality information of spectroscopic data；Defective value
Computing unit 206, according to spectral quality information, calculates to be detected by default defective value computing formula
The defect value of film, presetting defective value computing formula is：
Wherein, i represents width when gathering spectroscopic data, and j represents the length of collection spectroscopic data
Direction, wnScope be [0,1], represent the n-th of film to be detected towards image deflects weight coefficient,
The scope of Blobn (i, j) is [0,255], represents the n-th of film to be detected towards image deflects value,
TotolBlob (i, j) represents the defect value of film to be detected；Quality judging unit 208, really
Determine whether defect value meets pre-conditioned, so that whether the quality for determining film to be detected is qualified.
In the technical scheme, when sense command is received, periodic IMAQ can be carried out,
Data can also be acquired when trigger signal is received every time, calculate public by default defective value
Formula calculates the defective value of the test position of film, so as to according to the size of defective value defective value in other words
It is pre-conditioned whether residing scope meets, and judges whether film quality meets the requirements, so that
Film quality testing result is more accurate comprehensive, improves the quality and efficiency of thin film testing.Wherein,
Film in the technical program include but is not limited to liquid crystal film, holographic dealuminzation safety line, light-variation film,
Plastic sheeting, paper, cloth, calligraphy and painting etc..
In the above-mentioned technical solutions, it is preferable that the spectral detection system 200 is by light source, optical splitter
Part, camera lens, image acquisition device and control circuit composition, a hair for narrowband region of film to be detected
Light, reflected light or transmitted light are penetrated, by entering the spectrum groupware after the lens focus, through described
After spectrum groupware light splitting, the light of different wave length is spatially separated, projects described image collector,
Wherein, described image collector is face battle array gray scale camera；The spectral detection system can comprising one group or
Multigroup optical spectrum imaging device.
In the technical scheme, there is optical lens spectrum groupware front end.One arrowband of film to be detected
The reflected light or transmitted light in region, by entering spectrum groupware, different wave length after light splitting after lens focus
Light it is spatially separated, project face battle array gray scale camera collecting unit.Face battle array gray scale camera collection
Each width two dimensional image one spectral information of narrowband region of correspondence for arriving, laterally correspondence is to be detected for image
The transverse direction of film, information of the narrowband region in the row corresponding wavelength is represented per a line, and image is longitudinally corresponding
Different spectral wavelengths, each row represent the spectral evolution information of one piece of subregion of narrowband region, image
Pixel value size represents the intensity of certain wavelength.Wherein, image acquisition device can be face battle array gray scale camera,
It can also be other kinds of image collecting device as needed in addition.
In the above-mentioned technical solutions, it is preferable that spectrum data gathering unit 202 includes：First collection
Unit 2022, uses the spectrum of the whole breadth width of image acquisition device multi collect film to be detected
Data, to gather the full duration spectroscopic data of film to be detected；And/or second collecting unit 2024,
Using the spectroscopic data of the part breadth width of image acquisition device multi collect film to be detected, wherein,
Image acquisition device is static in width or carries out back and forth movement.
In the technical scheme, can be gathered using different IMAQ means according to the actual requirements
View data, specifically, can both gather the full width image data of film, it is also possible to gather film
Part breadth width view data, wherein, in gatherer process, can be by mobile image number
Image data acquiring is carried out to static film according to collector, it is also possible to allow the image acquisition device of static state
Image data acquiring is carried out to mobile film.That is, the typical method of spectra collection includes two
Kind：One be film along lengthwise movement, spectra collection system is maintained static, or (when spectra collection arrowband
Width be less than thin-film width when) spectra collection system transverse reciprocating movement；Two is that film is maintained static,
Spectra collection system moves one or many in one direction, completes the spectral information collection of entire film.
Additionally, system can gather spectral information according to actual conditions and needs by special exercise mode.Pass through
Technical scheme, diversified IMAQ means can more fit user to detection film
Demand, improve the reliability of film quality testing result, be easy to lifted detection efficiency, reduce inspection
Survey cost.
In the above-mentioned technical solutions, it is preferable that also include：Speed of service adjustment unit 210, is adopting
During collecting the spectroscopic data of film to be detected, the speed of service of image acquisition device is reduced, to be lifted
Directional resolution during collection spectroscopic data；And/or time for exposure adjustment unit 212, it is to be checked gathering
During surveying the spectroscopic data of film, increase the time for exposure of image acquisition device, to lift collection light
Directional resolution during modal data.
In the technical scheme, during the spectroscopic data of film to be detected is gathered, collect
The height of directional resolution influences the accuracy of film quality testing result, specifically, directional resolution
Inverse correlation, Yong Huke when speed of service positive correlation with image acquisition device and the exposure with image acquisition device
During according to actual conditions by reducing the speed of service of image acquisition device or increasing the exposure of image acquisition device
Between, to obtain directional resolution higher so that the data for collecting are more accurate, be conducive to lifting thin
Film detects the accuracy of quality.
In the above-mentioned technical solutions, it is preferable that the spectral quality information of spectroscopic data include it is following at least
One or a combination set of：The dominant wavelength of spectroscopic data, half-wave are wide, peak strength, energy integral, certain
The dominant wavelength of range of wavelengths, the half-wave of certain range of wavelengths are wide, certain range of wavelengths peak strength,
The energy integral of certain range of wavelengths, CIE XYZ values, CIE L*a*b*Value, CIE habWithValue；
And spectral detection system 200 also includes：Data space determining unit 214, according to spectroscopic data
Spectral quality information, determines the qualified data space and unqualified data space of spectroscopic data, for root
It is that the setting of defect value is pre-conditioned according to qualified data space and unqualified data space；And defect
Value determining unit 216, according to spectral quality information, qualified data space and unqualified data space,
Calculate the Blobn (i, j) of spectroscopic data.
In the technical scheme, film quality is judged by various view data attributes, it is various
The judgment basis of change can cause that film quality testing result is more accurate comprehensive, while being lacked by default
When falling into the defective value of the test position that value computing formula calculates film, can be drawn according to view data attribute
Qualified data space and unqualified data space are separated, such that it is able to determine whether that defective value is to be located at
In qualified data space or in unqualified data space, film quality testing result is drawn.It is logical
The technical scheme is crossed, qualified data space and the unqualified data space of division can be caused to defective value
Scope judge more accurate so that film quality testing result more it is accurate comprehensively, carry
The quality and efficiency of thin film testing are risen.CIE is color system, CIE XYZ, CIE L*a*b*、
CIE hab、It is its different color space.
In the above-mentioned technical solutions, it is preferable that also include：Memory cell 218, it is determined that to be detected
After whether the quality of film is qualified, quality measurements are stored；And indexing unit 220, it is matter
Measure underproof film to be detected and flaw labeling is set, for recognizing and process treating with flaw labeling
Detection film.
In the technical scheme, by storing quality measurements, and for off quality to be detected
Film sets flaw labeling, for recognizing and processes the film to be detected with flaw labeling so that after
Continuous associated processing system directly can carry out classification treatment according to mark to faulty goods, and then be conducive to carrying
Rise the efficiency of thin film testing.
Fig. 3 shows the structural representation of spectral detection system according to another embodiment of the invention.
As shown in figure 3, spectral detection system according to another embodiment of the invention, for detecting
Liquid crystal film, holographic dealuminzation safety line, light-variation film, plastic sheeting, paper, cloth, calligraphy and painting etc.
Quality, including：Roller, kinetic control system, spectra collection and processing subsystem, quality status stamp
Subsystem, graphical analysis main station system and rear process product processing system.
The spectral detection system can be with automatic detection film product quality, and comprising two kinds of detection methods：
Method one：The spectrum picture and surface image of operating film are gathered, at digital picture
Reason carries out Automatic quality inspection judgement to them, determines whether product quality is qualified, and product is obtained in time
Test result, to carry out quality status stamp online, or testing result data message is stored, or will
Testing result data information transfer give rear operation, subsequent handling according to testing result carry out overall calcellation,
The treatment such as local calcellation, defect mending.Wherein, testing result includes：It is overall whether qualified, local
Quality status stamp of the lengthwise position of defect and lateral attitude or detecting system etc..
Method two：Detected object can be fixed on flat board or two ends and fix, and image acquisition device is in fortune
Scanning Detction object in dynamic, obtains view data, is analyzed detection, its specific processing method and side
It is identical described in method one.
In addition, the object of spectral detection system detection can be view picture film product, or many
Width film product, can also be the ribbon product of incision.
The spectral detection system is mainly comprising moving parts such as kinetic control system and roller, at least a set of
Spectra collection processing subsystem, graphical analysis main station system.And other optical detections can also be included
System, quality status stamp subsystem, the quality status stamp subsystem can be connected with rear process product processing system.
Spectral image is gathered can gather image with processing subsystem according to fixed frequency (or cycle), or logical
Cross the trigger signal collection image of kinetic control system, the frequency (or cycle) and product of trigger signal
The speed of service is proportionally related.Each collection is entered with processing subsystem by embedded circuit board or computer
Row analysis and treatment.This be the basic breadth of thin film testing of spectral detection system for 0.2m to 1m, when
So, also can detect subdivision cut after narrower film or broader film, the speed of service be less than or
Equal to 150m/min.
Fig. 4 shows the schematic diagram of the spectrum imaging system in Fig. 3.
As shown in figure 4, spectrum imaging system can gather the spectral quality information of film.Light source 1 is sent out
The light penetrated has frequency range wider, and spectral line is smoothed, and light source 1 can be white light source, ultraviolet light
One in source, infrared light supply three, or two, the combination of three, the highest luminance of light source 1
Area is 1200mm*30mm, and uniformity of illuminance is more than or equal to 95%, and focal length is 200mm, burnt
Away from that can adjust as needed, total thang-kng amount is 68000lm, and peak value thang-kng amount is 100000lm, continuously
Power is 500W to the maximum under mode of operation, light source power can dynamically, step-less adjustment, trigger Working mould
Peak power is 3000W under formula, and the switch periods for triggering pattern are most short up to 0.1ms.
Luminous component uses multiple LED (Light Emitting Diode, light emitting diode) arrangement group
Into all being alternately arranged with ultraviolet LED, be staggered using white light LEDs, or white light LEDs
Or it is arranged in parallel, or white light LEDs are alternately arranged with infrared LED, are staggered or arranged in parallel,
Or ultraviolet LED, white light LEDs and infrared LED are alternately arranged, are staggered or arranged in parallel.Line
As shown in figure 5, LED is fixed in light source bottom plate, prismatic optical element is covered property light-source structure
On LED, the light for sending is set to pool the linear light of high intensity, wherein, input path can be equipped with depolarized
Device.
As shown in figure 4, spectrum groupware collection is by the spectrum after film reflector (can also be transmission)
Data.Under the imaging mode that roller drives film, the focusing surface of optical system can be that film departs from
Hanging position after roller, it is also possible on roller.Under catoptric imaging pattern, light source incidence angle is
0 to 15 °, it is possible to use 1 to 3 light source irradiates from incidence angles degree, spectra collection system
Angle of reflection is 0 to 15 °.Under transmission imaging pattern, light source incidence angle is -15 ° to+15 °, can be with
Using 1 to 3 light source from incidence angles degree irradiate, into spectrum acquisition system light with
Normal angle is -15 ° to+15 °.Spectrum groupware front end is equipped with a camera lens, and the camera lens is to white light
All have it is good the slit of light-splitting device is entered by the light after camera lens by property, by after slit,
The light of the different wave length device that is split spatially uniformly is launched, the spectral resolution highest after expansion
Up to 1nm, minimum 20nm.The area array cameras collection spectroscopic data of rear end, area array cameras have
The spectral response curve of continuously smooth.
As shown in fig. 6, the camera of light spectrum image-forming is a digital camera for face battle array, each row of camera
The spectral evolution curve of one fritter film of correspondence.Reference object transverse direction physical size is Width, camera
Resolution ratio is N pixels, then transverse spatial resolution is Width/Npixel, and system Width is to the maximum
1m, Npixel are 2048 to the maximum, and transverse spatial resolution is 0.49mm to the maximum, also can be by setting
The individual pixel of adjacent n (=2,3,4 ...) is merged, and obtains relatively low resolution ratio.System is normal
Under working condition, transverse spatial resolution is 0.49mm to 49mm.Under particular job state,
1 to 20 point, tracking, analysis, the spectral characteristic of detection film can arbitrarily be selected.Area array cameras
Longitudinal pixel resolution is 1088 to the maximum, also can obtain more low resolution by potting gum.Image
Each row a certain piece of reference object of correspondence spectral evolution, the spectrum maximum of expansion can comprising 300 to
1200nm wave-length coverages, also dependent on needing to gather a part of spectrum, such as 380 to 780nm ripples
Scope long.From the data for collecting, choose a number of point, wavelength resolution be 0.5 to
10nm, is typically no less than 40 points, is calculated for spectrum and detected.Under particular job state,
1 to 40 spectroscopic data of point, the spectral characteristic for tracking, analyzing, detecting film may be selected.
Spectrum imaging system can gather the spectrum of whole breadth width range, in product motion simultaneously,
System frequently gathers spectrum picture, realizes interruption or continuous full duration spectra collection；Or can adopt
Collect the spectrum of part breadth width range, in product motion simultaneously, system frequently gathers spectrum picture,
Realize the spectra collection of interruption or continuous partial width；Or collecting part breadth width range
Spectrum, product motion simultaneously, spectrum imaging system is reciprocated in width, and system is frequent
Collection spectrum picture, realizes width multiposition, the spectra collection of length direction interval location；Or
Person gathers the spectrum picture of diverse location using many set spectrum groupware and cameras, processes respectively or enters
Reprocessed after the splicing of row spectrum picture.
The spectrum imaging system time for exposure is Ex_time, and system running speed is v, direct of travel light
Spectral resolution is v/Ex_time, and system maximal rate is v=150m/min, system minimum exposure time
It is Ex_time=1ms, now corresponding direct of travel resolution ratio is 2.5mm, can be also transported by reducing
Scanning frequency degree is lifting direct of travel resolution ratio, or the increase time for exposure is lifting direct of travel resolution ratio.
Under system continuous exposure working condition, direct of travel spectral resolution is 2.5mm to 100mm.
System can be with interval exposure, and interval time is Ex_skip, and the time range is 0s to 10s.
In addition, spectral detection scope is 200nm to 1000nm, according to the feature of detection object, bag
Containing two kinds of detection methods of unimodal spectrum and multimodal spectrum：
(1) unimodal spectrum
System automatically analyze obtain film each laterally the dominant wavelength of thin block, half-wave be wide, spectral intensity
(reflectivity), subsection integral energy, the dominant wavelength of certain range of wavelengths, the half of certain range of wavelengths
Ripple is wide, the energy product of the peak strength of certain range of wavelengths, certain range of wavelengths grades spectral target,
Whether detection spectrum is qualified, and (parameter format of table 1 is same as shown in table 1 for spectral detection logic relation picture
When be applied to choose wavelength gamut, certain range of wavelengths).Meanwhile, calculate each index and exceed ginseng
The value of number scope, obtains defective value.
Table 1
| Measured value | Parameter area | Individual event test result |
| Dominant wavelength/nm | [Peak_low,Peak_high] | It is qualified/unqualified |
| Half-wave is wide/nm | [Wave_min,Wave_max] | It is qualified/unqualified |
| Intensity | [Strength_min,Strength_max] | It is qualified/unqualified |
| Subsection integral energy | 1st section of energy [Ei_min, Ei_max] (i=1 ..., n) | It is qualified/unqualified |
Wherein, Peak_low and Peak_high are respectively dominant wavelength low value threshold value and dominant wavelength high level threshold
Value；Wave_min and Wave_max are respectively half-wave low value threshold value wide and half-wave high level threshold value wide；
Strength_min and Strength_max are respectively intensity low value threshold value and intensity high level threshold value；
Ei_min and Ei_max are respectively energy integral low value and energy integral high level.
The scope of each index can manually set, or by the spectral image data of analysis product from
Dynamic generation.The spectral information for referring to network analysis certain amount qualified products is automatically generated, its spectrum is obtained
Data space 1；The spectral information of certain amount substandard product is analyzed, its spectroscopic data space is obtained
2；Calculate the segmentation boundary line in spectroscopic data space 1 and spectroscopic data space 2, it is as qualified with do not conform to
The detection threshold value of lattice.Except qualified/unqualified determination methods shown in table 1, unqualified degree can be with
Multiple grades are subdivided into, " qualified/unqualified " of " individual event test result " can be subdivided into table 1
" qualified/slight unqualified/general unqualified/serious unqualified ".
For the product comprising several, the width and width of the first width original position, each width can be manually specified
Between distance etc., system carries out spectral detection according to specified parameter.Or system automatically analyzes the effective portion of comparing
The spectrum and the spectrum of compartment for dividing, obtain the first width original position, the width of each width and width spacing
From etc. data.
Additionally, also spectroscopic data can be converted into CIE XYZ values, CIE L*a*b*Value, CIE habWithValue, according to the qualified data area of automatic study generation, or the qualified data model being manually specified
Enclose, qualified/unqualified detection is carried out in dependent color spaces (coordinate system).
(2) multimodal spectrum
Multiple unimodal spectrum can be obtained by decoupling, each unimodal foregoing unimodal spectrum of spectral reference
Method is analyzed detection, energy integral, centre wavelength, the main ripple of com-parison and analysis each unimodal spectrum
The parameter indexs such as intensity long, carry out comprehensive analysis.
In addition, during reflected image detection is carried out, can be by reflected image color low value high
The Indexs measures such as scope, low value image template high, figure line number, figure line integrity degree, figure line similarity
Whether reflected image is qualified.The scope of each index can manually set, or by analyzing qualified product
The spectral image data of product is automatically generated.
During transmission image detection is carried out, can by transmission image color low value scope high,
The Indexs measure reflectograms such as low value image template high, figure line number, figure line integrity degree, figure line similarity
Seem no qualified.The scope of each index can manually set, or by analyzing the light of qualified products
Spectrum view data is automatically generated.
Graphical analysis main website collect spectra collection processing subsystem, reflected image collection with processing subsystem,
They are transformed into consistent image resolution ratio by transmission image acquisition and the detection information of processing subsystem,
Picture position alignment is carried out, and picture position is aligned with physical location, obtain the testing result of product
Information.The defect value of certain picture position (i, j), is the fusion of multiple images defect numerical value,
As shown in formula (1).
Wherein, i represents width when gathering view data, and j represents the length of collection view data
Direction, wnScope be [0,1], represent n-th at each position towards view data defect weight system
Number, the scope of Blobn (i, j) is [0,255], represents n-th at each position towards view data
Defective value, wherein, 0 represents no defect, and 255 represent the defect of most serious.
TotolBlob (i, j) represents the defect value at each position.
Specifically, each can be calculated compared to the scaling of artwork by imaging parameters, defect map
The lateral resolution of defect point is bx mm/pixel, then i-th point of corresponding lateral attitude is i*bx
mm.Figure cycle, gait of march are adopted by direct of travel, defect map can compared to the scaling of artwork
The longitudinal frame for being calculated each defect point is by mm/pixel, then j-th point of corresponding horizontal stroke
It is j*bx mm to position.When one or more detections are unqualified, position (i, j) is to be judged to not
It is qualified.
Alternatively, it is also possible to divide specifications parameter according to the transverse direction and longitudinal direction of view data and product, will scheme
Image position and subdivision unit are matched, and i (width position) is corresponded into the subdivision such as width, root
Unit, the subdivision units such as section are corresponded to by j (direct of travel position).Analysis main website judges certain position
Put product it is unqualified when, relevant information is carried out into display storage；Or quality status stamp subsystem is notified, hold
Row flaw labeling；Or quality information is passed into rear process product processing system, subsequently to faulty goods
Processed.
Technical scheme is described in detail above in association with accompanying drawing, by technical scheme,
Can realize carrying out automatic detection to film quality, so as to avoid unnecessary waste of human resource,
The reliability of film quality testing result is improved simultaneously, and then is conducive to being lifted the efficiency of thin film testing
And quality.
The preferred embodiments of the present invention are the foregoing is only, is not intended to limit the invention, for
For those skilled in the art, the present invention can have various modifications and variations.It is all in essence of the invention
Within god and principle, any modification, equivalent substitution and improvements made etc. should be included in the present invention
Protection domain within.
Claims (10)
1. a kind of spectral method of detection, for spectral detection system, it is characterised in that the spectrum
Detecting system is made up of light source, light-splitting device, camera lens, image acquisition device and control circuit, to be detected
One launching light of narrowband region, reflected light or transmitted light of film, it is laggard by the lens focus
Enter the spectrum groupware, through the spectrum groupware light splitting after, the light of different wave length is spatially separated,
Described image collector is projected, wherein, described image collector is face battle array gray scale camera；The light
Spectrum detecting system can include one or more groups of optical spectrum imaging devices；And the spectral method of detection includes：
According to the sense command for receiving, the spectroscopic data of film to be detected is gathered, wherein, the inspection
Surveying order includes periodicity acquisition or the order being acquired according to trigger signal；
Determine the spectral quality information of the spectroscopic data；
According to the spectral quality information, calculate described to be detected thin by default defective value computing formula
The defect value of film, the default defective value computing formula is：
Wherein, i represents width when gathering the spectroscopic data, and j represents the collection spectrum number
According to length direction, wnScope be [0,1], represent that the n-th of the film to be detected lacks towards image
Weight coefficient is fallen into, the scope of Blobn (i, j) is [0,255], represents the n-th of the film to be detected
Towards image deflects value, TotolBlob (i, j) represents the defect of the film to be detected
Value；
Determine whether the defect value meets pre-conditioned, for determining the film to be detected
Whether quality is qualified.
2. spectral method of detection according to claim 1, it is characterised in that the collection is treated
The spectroscopic data of film is detected, is specifically included：
Using the spectroscopic data of the whole breadth width of film to be detected described in image acquisition device multi collect,
To gather the full duration spectroscopic data of the film to be detected；Or
Using the spectroscopic data of the part breadth width of film to be detected described in image acquisition device multi collect,
Wherein, described image collector is static in the width or carries out back and forth movement.
3. spectral method of detection according to claim 2, it is characterised in that in the collection
During the spectroscopic data of film to be detected, also include：
The speed of service of described image collector is reduced, to lift direction when gathering the spectroscopic data
Resolution ratio；Or
Increase the time for exposure of described image collector, described in when gathering the spectroscopic data to be lifted
Directional resolution.
4. spectral method of detection according to claim 3, it is characterised in that the spectrum number
According to spectral quality information include at least one of or its combination：
The dominant wavelength of the spectroscopic data, half-wave are wide, peak strength, energy integral, certain wavelength zone
Between dominant wavelength, certain range of wavelengths half-wave is wide, certain range of wavelengths peak strength, certain ripple
Interval energy integral, CIE XYZ values, CIE L long*a*b*Value, CIE habWithValue；And
The spectral method of detection also includes：
According to the spectral quality information of the spectroscopic data, the passing number of the spectroscopic data is determined
According to space and unqualified data space, for according to the qualified data space and the number of non-compliances evidence
Space is that defect value setting is described pre-conditioned；And
According to the spectral quality information, the qualified data space and the unqualified data space,
Calculate the Blobn (i, j) of the spectroscopic data.
5. spectral method of detection according to any one of claim 1 to 4, it is characterised in that
After whether the quality for determining the film to be detected is qualified, also include：
Storage quality measurements, and for film described to be detected off quality sets flaw labeling,
For recognizing and process the film described to be detected with the flaw labeling.
6. a kind of spectral detection system, it is characterised in that the spectral detection system by light source, point
Optical device, camera lens, image acquisition device and control circuit composition, a narrowband region of film to be detected
Launching light, reflected light or transmitted light, by entering the spectrum groupware, warp after the lens focus
After the spectrum groupware light splitting, the light of different wave length is spatially separated, projects described image collection
Device, wherein, described image collector is face battle array gray scale camera；The spectral detection system can include one
Group or multigroup optical spectrum imaging device；And
The spectral detection system also includes：
Spectrum data gathering unit, according to the sense command for receiving, gathers the spectrum of film to be detected
Data, wherein, the sense command includes periodicity acquisition or is acquired according to trigger signal
Order；
Spectral quality information determination unit, determines the spectral quality information of the spectroscopic data；
Defective value computing unit, according to the spectral quality information, by default defective value computing formula
The defect value of the film to be detected is calculated, the default defective value computing formula is：
Wherein, i represents width when gathering the spectroscopic data, and j represents the collection spectrum number
According to length direction, wnScope be [0,1], represent that the n-th of the film to be detected lacks towards image
Weight coefficient is fallen into, the scope of Blobn (i, j) is [0,255], represents the n-th of the film to be detected
Towards image deflects value, TotolBlob (i, j) represents the defect of the film to be detected
Value；
Quality judging unit, determines whether the defect value meets pre-conditioned, for determining institute
Whether the quality for stating film to be detected is qualified.
7. spectral detection system according to claim 6, it is characterised in that the spectrum number
Include according to collecting unit：
First collecting unit, uses the whole breadth of film to be detected described in image acquisition device multi collect
The spectroscopic data of width, to gather the full duration spectroscopic data of the film to be detected；And/or
Second collecting unit, uses the part breadth of film to be detected described in image acquisition device multi collect
The spectroscopic data of width, wherein, described image collector is static in the width or is come and gone
Motion.
8. spectral detection system according to claim 7, it is characterised in that also include：
Speed of service adjustment unit, during the spectroscopic data of the collection film to be detected, drop
The speed of service of low described image collector, to lift directional resolution when gathering the spectroscopic data；
And/or
Time for exposure adjustment unit, during the spectroscopic data of the collection film to be detected, increases
The time for exposure of big described image collector, the direction point when gathering the spectroscopic data to be lifted
Resolution.
9. spectral detection system according to claim 8, it is characterised in that the spectrum number
According to spectral quality information include at least one of or its combination：
The dominant wavelength of the spectroscopic data, half-wave are wide, peak strength, energy integral, certain wavelength zone
Between dominant wavelength, certain range of wavelengths half-wave is wide, certain range of wavelengths peak strength, certain ripple
Interval energy integral, CIE XYZ values, CIE L long*a*b*Value, CIE habWithValue；And
The spectral detection system also includes：
Data space determining unit, according to the spectral quality information of the spectroscopic data, determines institute
The qualified data space and unqualified data space of spectroscopic data are stated, for empty according to the qualified data
Between with the unqualified data space be the defect value set it is described pre-conditioned；And
Defective value determining unit, according to the spectral quality information, the qualified data space and described
Unqualified data space, calculates the Blobn (i, j) of the spectroscopic data.
10. the spectral detection system according to any one of claim 6 to 9, it is characterised in that
Also include：
Memory cell, after whether the quality for determining the film to be detected is qualified, stores matter
Amount testing result；And
Indexing unit, is that film described to be detected off quality sets flaw labeling, for identification
And process the film described to be detected with the flaw labeling.
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