CN106918603B - Spectrum detection method and system - Google Patents

Spectrum detection method and system Download PDF

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CN106918603B
CN106918603B CN201510993848.3A CN201510993848A CN106918603B CN 106918603 B CN106918603 B CN 106918603B CN 201510993848 A CN201510993848 A CN 201510993848A CN 106918603 B CN106918603 B CN 106918603B
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film
spectral
detected
data
spectrum
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CN106918603A (en
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张健
冯礼
秦庆旺
冯治国
卢继兵
韩英魁
魏智韬
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China Banknote Printing Technology Research Institute Co ltd
China Banknote Printing and Minting Group Co Ltd
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China Banknote Printing Technology Research Institute Co ltd
China Banknote Printing and Minting Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens

Abstract

The invention provides a spectrum detection method and a system, wherein the spectrum detection system consists of a light source, a light splitting device, a lens, an image collector and a control circuit, emitted light, reflected light or transmitted light of a narrow-band region of a film to be detected enters a light splitting component after being focused by the lens, after being split by the light splitting component, light with different wavelengths is spatially separated and projected to the image collector, the spectrum detection system comprises one or more groups of spectrum imaging devices, and the spectrum detection method comprises the following steps: collecting spectral data of the film to be detected according to the received detection command; determining spectral quality information of the spectral data; calculating the comprehensive defect value of the film to be detected through a preset defect value calculation formula according to the spectral quality information; and determining whether the comprehensive defect value meets a preset condition so as to determine whether the quality of the film to be detected is qualified. By the technical scheme, the reliability of the film quality detection result can be improved, and the efficiency and quality of film detection are further improved.

Description

Spectrum detection method and system
Technical Field
The invention relates to the technical field of quality detection, in particular to a spectrum detection method and a spectrum detection system.
Background
At present, the films on the market mainly comprise liquid crystal films, holographic dealuminized security threads, optically variable films, plastic films, paper, cloth, calligraphy and painting, and the like, and the films have inevitable defects in the production and manufacturing process, so that the quality detection by manpower wastes resources, is troublesome to operate, and has large detection result errors.
Therefore, a new technical scheme is needed, which can automatically detect the quality of the film.
Disclosure of Invention
The invention provides a new technical scheme based on the problems, and the technical scheme can automatically detect the quality of the film.
In view of the above, the present invention provides a spectrum detection method for a spectrum detection system, including: collecting the spectral data of the film to be detected according to the received detection command, wherein the detection command comprises a periodic collection command or a command for collecting according to a trigger signal; determining spectral quality information for the spectral data; according to the spectrum quality information, calculating the comprehensive defect value of the film to be detected through a preset defect value calculation formula, wherein the preset defect value calculation formula is as follows:
Figure BDA0000890265540000011
wherein i represents a width direction in which the spectral data is collected, j represents a length direction in which the spectral data is collected, and wnIn the range of [0,1]The n-th oriented image defect weight coefficient of the film to be detected is expressed, and the range of Blobn (i, j) is [0,255]The n-th image-oriented defect value of the film to be detected is represented, and TotolBlob (i, j) represents the comprehensive defect value of the film to be detected; and determining whether the comprehensive defect value meets a preset condition so as to determine whether the quality of the film to be detected is qualified.
In the technical scheme, when a detection command is received, periodic image acquisition can be carried out, data can also be acquired when a trigger signal is received at each time, the defect value of the detection position of the film is calculated by a preset defect value calculation formula, so that whether the quality of the film meets the requirement or not is judged according to the size of the defect value or whether the range of the defect value meets the preset condition or not, the film quality detection result is more accurate and comprehensive, and the quality and the efficiency of film detection are improved. The film in the technical scheme includes but is not limited to a liquid crystal film, a holographic dealumination security thread, an optically variable film, a plastic film, paper, cloth, calligraphy and painting and the like.
In the above technical solution, preferably, the spectrum detection system is composed of a light source, a light splitter, a lens, an image collector and a control circuit, wherein emitted light, reflected light or transmitted light of a narrow-band region of the film to be detected enters the light splitter component after being focused by the lens, and after being split by the light splitter component, lights with different wavelengths are spatially separated and projected to the image collector, wherein the image collector is a planar array grayscale camera; the spectral detection system may include one or more sets of spectral imaging devices.
In the technical scheme, the front end of the light splitting component is provided with an optical lens. Reflected light or transmitted light of a narrow-band region of the film to be detected enters the light splitting component after being focused by the lens, and light with different wavelengths after light splitting is spatially separated and projected to a collecting unit of the area array gray-scale camera. Each two-dimensional image acquired by the area array gray-scale camera corresponds to spectral information of a narrow-band region, the image transversely corresponds to the transverse direction of the film to be detected, each line represents information of the narrow-band region at the corresponding wavelength of the line, the image longitudinally corresponds to different spectral wavelengths, each column represents spectral expansion information of a sub-region of the narrow-band region, and the size of a pixel value of the image represents the intensity of a certain wavelength. The image collector may be an area-array grayscale camera, or may be other types of image collecting devices according to needs.
In the above technical solution, preferably, the acquiring the spectral data of the film to be detected specifically includes: collecting the spectral data of the whole breadth width of the film to be detected for multiple times by using an image collector so as to collect the full-width spectral data of the film to be detected; or using an image collector to collect the spectral data of partial breadth width of the film to be detected for multiple times, wherein the image collector is static or reciprocates in the width direction.
In the technical scheme, different image acquisition means can be adopted to acquire image data according to actual requirements, specifically, the full-width image data of the film can be acquired, and the image data of partial breadth width of the film can also be acquired, wherein in the acquisition process, the static film can be subjected to image data acquisition by moving the image data acquisition device, and the static image acquisition device can also be subjected to image data acquisition of the moving film. That is, typical methods of spectrum acquisition include two types: firstly, the film moves along the longitudinal direction, the spectrum acquisition system is fixed, or (when the width of the spectrum acquisition narrow band is smaller than the width of the film) the spectrum acquisition system moves in a reciprocating way; secondly, the film is fixed, and the spectrum acquisition system moves once or for a plurality of times along one direction to complete the spectrum information acquisition of the whole film. In addition, the system can collect the spectral information according to the actual situation and the requirement and according to a specific motion mode. According to the technical scheme, diversified image acquisition means can better meet the requirements of a user on the detection film, the reliability of the film quality detection result is improved, the detection efficiency is convenient to improve, and the detection cost is reduced.
In the above technical solution, preferably, in the process of collecting the spectral data of the film to be detected, the method further includes: the running speed of the image collector is reduced so as to improve the directional resolution ratio when the spectral data is collected; or increasing the exposure time of the image collector to improve the directional resolution when the spectral data is collected.
In the technical scheme, in the process of collecting the spectral data of the film to be detected, the accuracy of the film quality detection result is influenced by the collected direction resolution, specifically, the direction resolution and the operation speed of the image collector form a positive correlation relationship and an inverse correlation relationship with the exposure time of the image collector, and a user can reduce the operation speed of the image collector or increase the exposure time of the image collector according to actual conditions to obtain lower direction resolution, so that the collected data is more accurate, and the accuracy of the film detection quality is favorably improved.
In the above technical solution, preferably, the spectral quality information of the spectral data includes at least one of the following or a combination thereof: dominant wavelength, half-wave width, peak intensity, energy integral, dominant wavelength of a certain wavelength interval, half-wave width of a certain wavelength interval, peak intensity of a certain wavelength interval, energy integral of a certain wavelength interval, CIE XYZ value, CIE L of the spectral data*a*b*Value, CIE habAnd
Figure BDA0000890265540000031
a value; and the spectral detection method further comprises: determining qualified data space and unqualified data space of the spectrum data according to the spectrum quality information of the spectrum data, so as to set the preset condition for the comprehensive defect value according to the qualified data space and the unqualified data space; and calculating Blobn (i, j) of the spectrum data according to the spectrum quality information, the qualified data space and the unqualified data space.
In the technical scheme, the quality of the film is judged through various image data attributes, the diversified judgment basis can enable the film quality detection result to be more accurate and comprehensive, and meanwhile, when the defect value of the detection position of the film is calculated through a preset defect value calculation formula, a qualified data space and an unqualified data space can be divided according to the image data attributes, so that whether the defect value is located in the qualified data space or the unqualified data space can be further judged, and the film quality detection result is obtained. Through the technical scheme, the divided qualified data space and the divided unqualified data space can enable the judgment of the range of the defect value to be more accurate, so that the film quality detection result is more accurate and comprehensive, and the quality and the efficiency of film detection are improved. Wherein CIE is color system CIE XYZ, CIE L*a*b*、CIE hab、
Figure BDA0000890265540000042
Its different color space.
In the above technical solution, preferably, after determining whether the quality of the film to be detected is qualified, the method further includes: storing the quality detection result, and setting a defect mark for the film to be detected with unqualified quality so as to identify and process the film to be detected with the defect mark.
In the technical scheme, the quality detection result is stored, the defect mark is arranged on the film to be detected with unqualified quality, the film to be detected with the defect mark is identified and processed, a subsequent related processing system can directly classify and process defective products according to the identification, and the film detection efficiency is greatly improved.
The invention also provides a spectrum detection system, comprising: the device comprises a spectrum data acquisition unit, a spectrum data acquisition unit and a control unit, wherein the spectrum data acquisition unit acquires spectrum data of a film to be detected according to a received detection command, and the detection command comprises a periodic acquisition command or a command for acquiring according to a trigger signal; a spectral quality information determination unit that determines spectral quality information of the spectral data; the defect value calculation unit is used for calculating the comprehensive defect value of the film to be detected through a preset defect value calculation formula according to the spectral quality information, wherein the preset defect value calculation formula is as follows:
Figure BDA0000890265540000041
wherein i represents a width direction in which the spectral data is collected, j represents a length direction in which the spectral data is collected, and wnIn the range of [0,1]The n-th oriented image defect weight coefficient of the film to be detected is expressed, and the range of Blobn (i, j) is [0,255]The n-th image-oriented defect value of the film to be detected is represented, and TotolBlob (i, j) represents the comprehensive defect value of the film to be detected; and the quality judgment unit is used for determining whether the comprehensive defect value meets a preset condition so as to determine whether the quality of the film to be detected is qualified.
In the technical scheme, when a detection command is received, periodic image acquisition can be carried out, data can also be acquired when a trigger signal is received at each time, the defect value of the detection position of the film is calculated by a preset defect value calculation formula, so that whether the quality of the film meets the requirement or not is judged according to the size of the defect value or whether the range of the defect value meets the preset condition or not, the film quality detection result is more accurate and comprehensive, and the quality and the efficiency of film detection are improved. The film in the technical scheme includes but is not limited to a liquid crystal film, a holographic dealumination security thread, an optically variable film, a plastic film, paper, cloth, calligraphy and painting and the like.
In the above technical solution, preferably, the spectrum detection system is composed of a light source, a light splitter, a lens, an image collector and a control circuit, wherein emitted light, reflected light or transmitted light of a narrow-band region of the film to be detected enters the light splitter component after being focused by the lens, and after being split by the light splitter component, lights with different wavelengths are spatially separated and projected to the image collector, wherein the image collector is a planar array grayscale camera; the spectral detection system may include one or more sets of spectral imaging devices.
In the technical scheme, the front end of the light splitting component is provided with an optical lens. Reflected light or transmitted light of a narrow-band region of the film to be detected enters the light splitting component after being focused by the lens, and light with different wavelengths after light splitting is spatially separated and projected to a collecting unit of the area array gray-scale camera. Each two-dimensional image acquired by the area array gray-scale camera corresponds to spectral information of a narrow-band region, the image transversely corresponds to the transverse direction of the film to be detected, each line represents information of the narrow-band region at the corresponding wavelength of the line, the image longitudinally corresponds to different spectral wavelengths, each column represents spectral expansion information of a sub-region of the narrow-band region, and the size of a pixel value of the image represents the intensity of a certain wavelength. The image collector may be an area-array grayscale camera, or may be other types of image collecting devices according to needs.
In the above technical solution, preferably, the spectral data acquisition unit includes: the first acquisition unit is used for acquiring the spectral data of the whole breadth width of the film to be detected for multiple times by using an image acquisition device so as to acquire the full-width spectral data of the film to be detected; and/or a second acquisition unit which acquires the spectral data of partial breadth width of the film to be detected for multiple times by using an image acquisition device, wherein the image acquisition device is static or reciprocates in the width direction.
In the technical scheme, different image acquisition means can be adopted to acquire image data according to actual requirements, specifically, the full-width image data of the film can be acquired, and the image data of partial breadth width of the film can also be acquired, wherein in the acquisition process, the static film can be subjected to image data acquisition by moving the image data acquisition device, and the static image acquisition device can also be subjected to image data acquisition of the moving film. That is, typical methods of spectrum acquisition include two types: firstly, the film moves along the longitudinal direction, the spectrum acquisition system is fixed, or (when the width of the spectrum acquisition narrow band is smaller than the width of the film) the spectrum acquisition system moves in a reciprocating way; secondly, the film is fixed, and the spectrum acquisition system moves once or for a plurality of times along one direction to complete the spectrum information acquisition of the whole film. In addition, the system can collect the spectral information according to the actual situation and the requirement and according to a specific motion mode. According to the technical scheme, diversified image acquisition means can better meet the requirements of a user on the detection film, the reliability of the film quality detection result is improved, the detection efficiency is convenient to improve, and the detection cost is reduced.
In the above technical solution, preferably, the method further includes: the operation speed adjusting unit is used for reducing the operation speed of the image collector in the process of collecting the spectral data of the film to be detected so as to improve the directional resolution ratio when the spectral data are collected; and/or the exposure time adjusting unit is used for increasing the exposure time of the image collector in the process of collecting the spectral data of the film to be detected so as to improve the directional resolution ratio when the spectral data is collected.
In the technical scheme, in the process of collecting the spectral data of the film to be detected, the accuracy of the film quality detection result is influenced by the collected direction resolution, specifically, the direction resolution is in positive correlation with the running speed of the image collector and is in inverse correlation with the exposure time of the image collector, and a user can reduce the running speed of the image collector or increase the exposure time of the image collector according to actual conditions so as to obtain higher direction resolution, so that the collected data is more accurate, and the accuracy of the film detection quality is favorably improved.
In the above technical solution, preferably, the spectral quality information of the spectral data includes at least one of the following or a combination thereof: dominant wavelength, half-wave width, peak intensity, energy integral, dominant wavelength of a certain wavelength interval, half-wave width of a certain wavelength interval, peak intensity of a certain wavelength interval, energy integral of a certain wavelength interval, CIE XYZ value, CIE L of the spectral data*a*b*Value, CIE habAnd
Figure BDA0000890265540000061
a value; and the spectral detection system further comprises: the data space determining unit is used for determining qualified data space and unqualified data space of the spectrum data according to the spectrum quality information of the spectrum data, so that the preset conditions are set for the comprehensive defect value according to the qualified data space and the unqualified data space; and a defect value determination unit which calculates Blobn (i, j) of the spectrum data according to the spectrum quality information, the qualified data space and the unqualified data space.
In the technical scheme, the quality of the film is judged through various image data attributes, the diversified judgment basis can enable the film quality detection result to be more accurate and comprehensive, and meanwhile, when the defect value of the detection position of the film is calculated through a preset defect value calculation formula, a qualified data space and an unqualified data space can be divided according to the image data attributes, so that whether the defect value is located in the qualified data space or the unqualified data space can be further judged, and the film quality detection result is obtained. By the technical scheme, dividedThe qualified data space and the unqualified data space can enable the range of the defect value to be judged more accurately, so that the film quality detection result is more accurate and comprehensive, and the quality and the efficiency of film detection are improved. CIE is a color system, CIE XYZ, CIE L*a*b*、CIE hab、
Figure BDA0000890265540000071
Its different color space.
In the above technical solution, preferably, the method further includes: the storage unit is used for storing a quality detection result after determining whether the quality of the film to be detected is qualified; and the marking unit is used for setting a defect mark for the film to be detected with unqualified quality so as to identify and process the film to be detected with the defect mark.
In the technical scheme, the quality detection result is stored, the defect mark is arranged on the film to be detected with unqualified quality, the film to be detected with the defect mark is identified and processed, a subsequent related processing system can directly classify and process the defective products according to the identification, and the efficiency of film detection is favorably improved.
Through the technical scheme, the automatic detection of the film quality can be realized, so that unnecessary human resource waste is avoided, the reliability of a film quality detection result is improved, and the efficiency and the quality of film detection are improved.
Drawings
FIG. 1 shows a schematic flow diagram of a method of spectral detection according to an embodiment of the present invention;
FIG. 2 shows a schematic block diagram of a spectral detection system according to an embodiment of the present invention;
FIG. 3 shows a schematic diagram of a spectral detection system according to another embodiment of the present invention;
FIG. 4 shows a schematic diagram of the spectral imaging system of FIG. 3;
FIG. 5 shows a linear light source configuration diagram of a spectral imaging system;
fig. 6 shows a schematic diagram of the imaging effect of the spectral imaging system.
Detailed Description
In order that the above objects, features and advantages of the present invention can be more clearly understood, a more particular description of the invention will be rendered by reference to the appended drawings. It should be noted that the embodiments and features of the embodiments of the present application may be combined with each other without conflict.
In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention, however, the present invention may be practiced in other ways than those specifically described herein, and therefore the scope of the present invention is not limited by the specific embodiments disclosed below.
FIG. 1 shows a schematic flow diagram of a method of spectral detection according to an embodiment of the present invention.
As shown in fig. 1, a spectrum detection method according to an embodiment of the present invention includes:
and 102, acquiring the spectral data of the film to be detected according to the received detection command, wherein the detection command comprises a periodic acquisition command or a command for acquiring according to a trigger signal.
And 104, determining spectral quality information of the spectral data.
Step 106, calculating the comprehensive defect value of the film to be detected through a preset defect value calculation formula according to the spectral quality information, wherein the preset defect value calculation formula is as follows:
Figure BDA0000890265540000081
wherein i represents a width direction when the spectrum data is collected, j represents a length direction when the spectrum data is collected, and wnIn the range of [0,1]The n-th image defect-oriented weight coefficient of the film to be detected is represented, and the range of Blobn (i, j) is [0,255]The n-th image defect value of the film to be detected is shown, and TotolBlob (i, j) shows the comprehensive defect value of the film to be detected.
And step 108, determining whether the comprehensive defect value meets a preset condition so as to determine whether the quality of the film to be detected is qualified.
In the technical scheme, when a detection command is received, periodic image acquisition can be carried out, data can also be acquired when a trigger signal is received at each time, the defect value of the detection position of the film is calculated by a preset defect value calculation formula, so that whether the quality of the film meets the requirement or not is judged according to the size of the defect value or whether the range of the defect value meets the preset condition or not, the film quality detection result is more accurate and comprehensive, and the quality and the efficiency of film detection are improved. Wherein, the film in the technical scheme includes but is not limited to liquid crystal film, holographic dealumination safety line, optically variable film, plastic film, paper, cloth, calligraphy and painting, etc.
In the above technical solution, preferably, the spectrum detection system is composed of a light source, a light splitter, a lens, an image collector and a control circuit, wherein emitted light, reflected light or transmitted light of a narrow-band region of the film to be detected enters the light splitter component after being focused by the lens, and after being split by the light splitter component, lights with different wavelengths are spatially separated and projected to the image collector, wherein the image collector is a planar array grayscale camera; the spectral detection system may include one or more sets of spectral imaging devices.
In the technical scheme, the front end of the light splitting component is provided with an optical lens. Reflected light or transmitted light of a narrow-band region of the film to be detected enters the light splitting component after being focused by the lens, and light with different wavelengths after light splitting is spatially separated and projected to a collecting unit of the area array gray-scale camera. Each two-dimensional image acquired by the area array gray-scale camera corresponds to spectral information of a narrow-band region, the image transversely corresponds to the transverse direction of the film to be detected, each line represents information of the narrow-band region at the corresponding wavelength of the line, the image longitudinally corresponds to different spectral wavelengths, each column represents spectral expansion information of a sub-region of the narrow-band region, and the size of a pixel value of the image represents the intensity of a certain wavelength. The image collector may be an area-array grayscale camera, or may be other types of image collecting devices according to needs.
In the above technical solution, preferably, step 102 specifically includes: collecting the spectral data of the whole breadth width of the film to be detected for multiple times by using an image collector so as to collect the full-width spectral data of the film to be detected; or an image collector is used for collecting the spectral data of partial breadth width of the film to be detected for multiple times, wherein the image collector is static in the width direction or moves back and forth.
In the technical scheme, different image acquisition means can be adopted to acquire image data according to actual requirements, specifically, the full-width image data of the film can be acquired, and the image data of partial breadth width of the film can also be acquired, wherein in the acquisition process, the static film can be subjected to image data acquisition by moving the image data acquisition device, and the static image acquisition device can also be subjected to image data acquisition of the moving film. That is, typical methods of spectrum acquisition include two types: firstly, the film moves along the longitudinal direction, the spectrum acquisition system is fixed, or (when the width of the spectrum acquisition narrow band is smaller than the width of the film) the spectrum acquisition system moves in a reciprocating way; secondly, the film is fixed, and the spectrum acquisition system moves once or for a plurality of times along one direction to complete the spectrum information acquisition of the whole film. In addition, the system can collect the spectral information according to the actual situation and the requirement and according to a specific motion mode. According to the technical scheme, diversified image acquisition means can better meet the requirements of a user on the detection film, the reliability of the film quality detection result is improved, the detection efficiency is convenient to improve, and the detection cost is reduced.
In the above technical solution, preferably, in the process of collecting the spectral data of the film to be detected, the method further includes: the running speed of the image collector is reduced to improve the directional resolution when the spectral data is collected; or the exposure time of the image collector is increased so as to improve the directional resolution when the spectral data is collected.
In the technical scheme, in the process of collecting the spectral data of the film to be detected, the accuracy of the film quality detection result is influenced by the collected direction resolution, specifically, the direction resolution and the operation speed of the image collector form a positive correlation relationship and an inverse correlation relationship with the exposure time of the image collector, and a user can reduce the operation speed of the image collector or increase the exposure time of the image collector according to actual conditions to obtain lower direction resolution, so that the collected data is more accurate, and the accuracy of the film detection quality is favorably improved.
In the above technical solution, preferably, the spectral quality information of the spectral data includes at least one of the following or a combination thereof: dominant wavelength, half-wave width, peak intensity, energy integral, dominant wavelength in a certain wavelength region, half-wave width in a certain wavelength region, peak intensity in a certain wavelength region, energy integral in a certain wavelength region, CIE XYZ value, CIE L*a*b*Value, CIE habAnd
Figure BDA0000890265540000101
a value; and the spectral detection method further comprises: determining qualified data space and unqualified data space of the spectral data according to the spectral quality information of the spectral data, so as to set a preset condition for the comprehensive defect value according to the qualified data space and the unqualified data space; and calculating Blobn (i, j) of the spectral data according to the spectral quality information, the qualified data space and the unqualified data space.
In the technical scheme, the quality of the film is judged through various image data attributes, the diversified judgment basis can enable the film quality detection result to be more accurate and comprehensive, and meanwhile, when the defect value of the detection position of the film is calculated through a preset defect value calculation formula, a qualified data space and an unqualified data space can be divided according to the image data attributes, so that whether the defect value is located in the qualified data space or the unqualified data space can be further judged, and the film quality detection result is obtained. Through the technical scheme, the divided qualified data space and the divided unqualified data space can enable the judgment of the range of the defect value to be more accurate, so that the film quality detection result is more accurate and comprehensive, and the quality and the efficiency of film detection are improved. CIE is the color system CIE XYZ, CIE L*a*b*、CIE hab、
Figure BDA0000890265540000102
Its different color space.
In the above technical solution, after step 108, preferably, the method further includes: storing the quality detection result, and setting a defect mark for the film to be detected with unqualified quality for identifying and processing the film to be detected with the defect mark.
In the technical scheme, the quality detection result is stored, the defect mark is arranged on the film to be detected with unqualified quality, the film to be detected with the defect mark is identified and processed, a subsequent related processing system can directly classify and process defective products according to the identification, and the film detection efficiency is greatly improved.
FIG. 2 shows a schematic block diagram of a spectral detection system according to an embodiment of the present invention.
As shown in FIG. 2, a spectral detection system 200 according to one embodiment of the present invention includes: the spectral data acquisition unit 202 is used for acquiring spectral data of the film to be detected according to the received detection command, wherein the detection command comprises a periodic acquisition command or a command for acquiring according to a trigger signal; a spectral quality information determination unit 204 that determines spectral quality information of the spectral data; the defect value calculation unit 206 calculates a comprehensive defect value of the film to be detected according to the spectral quality information by using a preset defect value calculation formula, wherein the preset defect value calculation formula is as follows:
Figure BDA0000890265540000111
wherein i represents a width direction when the spectrum data is collected, j represents a length direction when the spectrum data is collected, and wnIn the range of [0,1]The n-th image defect-oriented weight coefficient of the film to be detected is represented, and the range of Blobn (i, j) is [0,255]Indicates the n-th image defect value of the film to be detected, and TotolBlob (i, j) indicates the comprehensive defect of the film to be detectedA sink value; the quality determination unit 208 determines whether the comprehensive defect value meets a preset condition for determining whether the quality of the film to be detected is qualified.
In the technical scheme, when a detection command is received, periodic image acquisition can be carried out, data can also be acquired when a trigger signal is received at each time, the defect value of the detection position of the film is calculated by a preset defect value calculation formula, so that whether the quality of the film meets the requirement or not is judged according to the size of the defect value or whether the range of the defect value meets the preset condition or not, the film quality detection result is more accurate and comprehensive, and the quality and the efficiency of film detection are improved. Wherein, the film in the technical scheme includes but is not limited to liquid crystal film, holographic dealumination safety line, optically variable film, plastic film, paper, cloth, calligraphy and painting, etc.
In the above technical solution, preferably, the spectrum detection system 200 is composed of a light source, a light splitter, a lens, an image collector and a control circuit, wherein emitted light, reflected light or transmitted light of a narrow-band region of a film to be detected enters the light splitter component after being focused by the lens, and after being split by the light splitter component, lights with different wavelengths are spatially separated and projected to the image collector, wherein the image collector is a planar array grayscale camera; the spectral detection system may include one or more sets of spectral imaging devices.
In the technical scheme, the front end of the light splitting component is provided with an optical lens. Reflected light or transmitted light of a narrow-band region of the film to be detected enters the light splitting component after being focused by the lens, and light with different wavelengths after light splitting is spatially separated and projected to a collecting unit of the area array gray-scale camera. Each two-dimensional image acquired by the area array gray-scale camera corresponds to spectral information of a narrow-band region, the image transversely corresponds to the transverse direction of the film to be detected, each line represents information of the narrow-band region at the corresponding wavelength of the line, the image longitudinally corresponds to different spectral wavelengths, each column represents spectral expansion information of a sub-region of the narrow-band region, and the size of a pixel value of the image represents the intensity of a certain wavelength. The image collector may be an area-array grayscale camera, or may be other types of image collecting devices according to needs.
In the above technical solution, preferably, the spectral data acquisition unit 202 includes: the first acquisition unit 2022 acquires the spectral data of the whole width of the film to be detected by using the image acquisition device for multiple times to acquire the full-width spectral data of the film to be detected; and/or a second acquisition unit 2024 that acquires the spectral data of a portion of the width of the film to be inspected a plurality of times using an image acquirer that is stationary in the width direction or performs a reciprocating motion.
In the technical scheme, different image acquisition means can be adopted to acquire image data according to actual requirements, specifically, the full-width image data of the film can be acquired, and the image data of partial breadth width of the film can also be acquired, wherein in the acquisition process, the static film can be subjected to image data acquisition by moving the image data acquisition device, and the static image acquisition device can also be subjected to image data acquisition of the moving film. That is, typical methods of spectrum acquisition include two types: firstly, the film moves along the longitudinal direction, the spectrum acquisition system is fixed, or (when the width of the spectrum acquisition narrow band is smaller than the width of the film) the spectrum acquisition system moves in a reciprocating way; secondly, the film is fixed, and the spectrum acquisition system moves once or for a plurality of times along one direction to complete the spectrum information acquisition of the whole film. In addition, the system can collect the spectral information according to the actual situation and the requirement and according to a specific motion mode. According to the technical scheme, diversified image acquisition means can better meet the requirements of a user on the detection film, the reliability of the film quality detection result is improved, the detection efficiency is convenient to improve, and the detection cost is reduced.
In the above technical solution, preferably, the method further includes: the operation speed adjusting unit 210 reduces the operation speed of the image collector in the process of collecting the spectral data of the film to be detected, so as to improve the directional resolution when the spectral data is collected; and/or the exposure time adjusting unit 212, in the process of collecting the spectral data of the film to be detected, the exposure time of the image collector is increased to improve the directional resolution when the spectral data is collected.
In the technical scheme, in the process of collecting the spectral data of the film to be detected, the accuracy of the film quality detection result is influenced by the collected direction resolution, specifically, the direction resolution is in positive correlation with the running speed of the image collector and is in inverse correlation with the exposure time of the image collector, and a user can reduce the running speed of the image collector or increase the exposure time of the image collector according to actual conditions so as to obtain higher direction resolution, so that the collected data is more accurate, and the accuracy of the film detection quality is favorably improved.
In the above technical solution, preferably, the spectral quality information of the spectral data includes at least one of the following or a combination thereof: dominant wavelength, half-wave width, peak intensity, energy integral, dominant wavelength in a certain wavelength region, half-wave width in a certain wavelength region, peak intensity in a certain wavelength region, energy integral in a certain wavelength region, CIE XYZ value, CIE L*a*b*Value, CIE habAnd
Figure BDA0000890265540000131
a value; and the spectral detection system 200 further includes: the data space determining unit 214 determines qualified data space and unqualified data space of the spectrum data according to the spectrum quality information of the spectrum data, so as to set a preset condition for the comprehensive defect value according to the qualified data space and the unqualified data space; and a defect value determination unit 216 that calculates blob n (i, j) of the spectral data from the spectral quality information, the qualified data space, and the unqualified data space.
In the technical scheme, the quality of the film is judged through various image data attributes, the diversified judgment basis can enable the film quality detection result to be more accurate and comprehensive, and meanwhile, when the defect value of the detection position of the film is calculated through a preset defect value calculation formula, a qualified data space and an unqualified data space can be divided according to the image data attributes, so that whether the defect value is located in the qualified data space or the unqualified data space can be further judged, and the film quality detection result is obtained. Through which is passedAccording to the technical scheme, the divided qualified data space and the divided unqualified data space can enable the range of the defect value to be judged more accurately, so that the film quality detection result is more accurate and comprehensive, and the quality and the efficiency of film detection are improved. CIE is a color system, CIE XYZ, CIE L*a*b*、CIE hab、
Figure BDA0000890265540000132
Its different color space.
In the above technical solution, preferably, the method further includes: a storage unit 218 that stores a quality detection result after determining whether the quality of the film to be detected is acceptable; and a marking unit 220 for setting a defect mark for the film to be detected with unqualified quality for identifying and processing the film to be detected with the defect mark.
In the technical scheme, the quality detection result is stored, the defect mark is arranged on the film to be detected with unqualified quality, the film to be detected with the defect mark is identified and processed, a subsequent related processing system can directly classify and process the defective products according to the identification, and the efficiency of film detection is favorably improved.
FIG. 3 shows a schematic diagram of a spectral detection system according to another embodiment of the present invention.
As shown in fig. 3, a spectrum sensing system according to another embodiment of the present invention for sensing the quality of a liquid crystal film, a holographic dealuminated security thread, an optically variable film, a plastic film, paper, cloth, calligraphy and painting, etc., includes: the device comprises a roller, a motion control system, a spectrum acquisition and processing subsystem, a quality marking subsystem, an image analysis master station system and a post-process product processing system.
The spectrum detection system can automatically detect the quality of a film product and comprises two detection methods:
the method comprises the following steps: collecting the spectral image and the surface image of the film in operation, automatically detecting and judging the quality of the film through digital image processing, determining whether the product quality is qualified, obtaining a product detection conclusion in time, carrying out quality marking on line, or storing detection result data information, or transmitting the detection result data information to a subsequent process, and carrying out treatment such as integral invalidation, local invalidation, defect repair and the like according to the detection result in the subsequent process. Wherein, the detection result includes: whether the whole is qualified, the longitudinal position and the transverse position of the local defect, or the quality mark of a detection system, and the like.
The second method comprises the following steps: the detected object can be fixed on the flat plate or fixed at two ends, the image collector scans the detected object in motion to obtain image data for analysis and detection, and the specific processing method is the same as that of the method I.
In addition, the object detected by the spectrum detection system can be a whole film product, a plurality of film products or a cut strip product.
The spectrum detection system mainly comprises a motion control system, a roller and other motion components, at least one set of spectrum acquisition and processing subsystem and an image analysis master station system. And may also include other optical detection systems, quality marking subsystems that may be interfaced with post-process product handling systems.
The spectral image acquisition and processing subsystem may acquire images at a fixed frequency (or period) or via a trigger signal of the motion control system, the frequency (or period) of the trigger signal being proportional to the product running speed. Each acquisition and processing subsystem is analyzed and processed through an embedded circuit board or a computer. The film detection basic width of the spectrum detection system is 0.2m to 1m, and of course, a narrower film or a wider film after fine cutting can be detected, and the running speed is less than or equal to 150 m/min.
Fig. 4 shows a schematic diagram of the spectral imaging system of fig. 3.
As shown in fig. 4, the spectral imaging system can acquire spectral quality information of the thin film. The light emitted by the light source 1 has a wide frequency range and smooth spectral lines, the light source 1 can be one of a white light source, an ultraviolet light source and an infrared light source, or a combination of two or three of the white light source, the ultraviolet light source and the infrared light source, the maximum illumination area of the light source 1 is 1200mm x 30mm, the illuminance uniformity is greater than or equal to 95%, the focal length is 200mm, the focal length can be adjusted according to requirements, the total luminous flux is 68000lm, the peak luminous flux is 100000lm, the maximum power is 500W in a continuous working mode, the power of the light source can be dynamically and steplessly adjusted, the peak power is 3000W in a trigger working mode, and the shortest switching period of the trigger mode can reach 0.1 ms.
The Light Emitting part is formed by arranging a plurality of LEDs (Light Emitting diodes), and can be all white LEDs, or white LEDs and ultraviolet LEDs are alternately arranged, staggered or parallel arranged, or white LEDs and infrared LEDs are alternately arranged, staggered or parallel arranged, or ultraviolet LEDs, white LEDs and infrared LEDs are alternately arranged, staggered or parallel arranged. The linear light source structure is shown in fig. 5, the LED is fixed on the light source base plate, the columnar optical element covers the LED, and the emitted light is converged into high-intensity linear light, wherein, the incident light path can be provided with a depolarizer.
As shown in fig. 4, the spectroscopy assembly collects spectral data after reflection (or transmission) by the thin film. Under the imaging mode that the roller drives the film, the focusing surface of the optical system can be a suspended position after the film is separated from the roller, and can also be positioned on the roller. In the reflective imaging mode, the incident angle of the light source is 0 to 15 °,1 to 3 light sources can be used for illumination from different incident angles, and the reflective angle of the spectrum acquisition system is 0 to 15 °. Under the transmission imaging mode, the incident angle of the light source is-15 degrees to +15 degrees, 1 to 3 light sources can be used for irradiating from different incident angles, and the included angle between the light rays entering the spectrum light splitting and collecting system and the normal is-15 degrees to +15 degrees. The front end of the light splitting component is provided with a lens, the lens has good passing performance for all color lights, the light passing through the lens enters a slit of the light splitting device, the light with different wavelengths is uniformly spread by the light splitting device in space after passing through the slit, and the maximum spectral resolution after spreading can reach 1nm and the minimum spectral resolution is 20 nm. The area-array camera at the rear end collects spectral data, and the area-array camera has a continuous and smooth spectral response curve.
As shown in fig. 6, the camera for spectral imaging is an area-array digital camera, and each column of the camera corresponds to the spectrum expansion curve of a small film. The horizontal physical size of the shooting object is Width, the resolution of the camera is N pixels, the horizontal spatial resolution is Width/Npixel, the maximum system Width is 1m, the maximum Npixel is 2048, and the maximum horizontal spatial resolution is 0.49mm, and the lower resolution can be obtained by arranging adjacent N (2, 3, 4, …) pixels for combination. Under the normal working state of the system, the transverse spatial resolution is 0.49mm to 49 mm. Under special working conditions, 1 to 20 points can be selected arbitrarily, and the spectral characteristics of the film can be tracked, analyzed and detected. The maximum longitudinal pixel resolution of the area-array camera is 1088, and lower resolution can be obtained through pixel combination. Each column of the image is spread corresponding to the spectrum of a certain block of the shooting object, the spread spectrum can maximally contain the wavelength range of 300-1200 nm, and a part of the spectrum can be collected according to the requirement, such as the wavelength range of 380-780 nm. From the collected data, a certain number of points are selected, the wavelength resolution is 0.5-10 nm, generally not less than 40 points, and the points are used for spectrum calculation and detection. Under special working conditions, 1 to 40 points of spectral data can be selected for tracking, analyzing and detecting the spectral characteristics of the film.
The spectral imaging system can acquire the spectrum of the whole breadth width range, and the system frequently acquires spectral images while the product moves, so that the discontinuous or continuous full-width spectrum acquisition is realized; or the spectrum of partial breadth width range can be collected, and the system frequently collects the spectrum image while the product moves, thereby realizing the spectrum collection of the discontinuous or continuous partial width range; or the spectrum of partial breadth width range is collected, the spectrum imaging system moves back and forth in the width direction while the product moves, the system frequently collects spectrum images, and spectrum collection of multiple positions in the width direction and at intervals in the length direction is realized; or a plurality of sets of light splitting assemblies and cameras are used for collecting spectral images at different positions and respectively processing the spectral images or processing the spectral images after splicing the spectral images.
The exposure time of the spectral imaging system is Ex _ time, the system running speed is v, the travelling direction spectral resolution is v/Ex _ time, the maximum speed of the system is v 150m/min, the minimum exposure time of the system is Ex _ time 1ms, the corresponding travelling direction resolution is 2.5mm, and the travelling direction resolution can be improved by reducing the running speed or increasing the exposure time. And under the continuous exposure working state of the system, the spectral resolution in the advancing direction is 2.5mm to 100 mm.
The system may interval exposures for an interval time of Ex skip, which may range from 0s to 10 s.
In addition, the spectrum detection range is 200nm to 1000nm, and two detection methods of a unimodal spectrum and a multimodal spectrum are included according to the characteristics of the detection object:
(one) single peak spectrum
The system automatically analyzes spectral indexes such as dominant wavelength, half-wave width, spectral intensity (reflectivity), segmented integral energy, dominant wavelength of a certain wavelength interval, half-wave width of a certain wavelength interval, peak intensity of a certain wavelength interval, energy integral of a certain wavelength interval and the like of each transverse fine block of the film, detects whether the spectrum is qualified, and a spectrum detection logical relation chart is shown in table 1 (the parameter format of table 1 is simultaneously suitable for selecting the whole range of the wavelength and a certain wavelength interval). And meanwhile, calculating the value of each index exceeding the parameter range to obtain a defect value.
TABLE 1
Measured value Parameter range Single item detection conclusion
Dominant wavelength/nm [Peak_low,Peak_high] Pass/fail
Half wave width/nm [Wave_min,Wave_max] Pass/fail
Strength of [Strength_min,Strength_max] Pass/fail
Segmented integral energy Energy of segment 1 [ Ei _ min, Ei _ max](i＝1，...，n) Pass/fail
Wherein, Peak _ low and Peak _ high are a main wavelength low threshold and a main wavelength high threshold respectively; wave _ min and Wave _ max are respectively a half-Wave width low threshold and a half-Wave width high threshold; strength _ min and Strength _ max are respectively a Strength low value threshold and a Strength high value threshold; ei _ min and Ei _ max are energy-integrated low and high values, respectively.
The range of each index may be set manually or automatically generated by analyzing spectral image data of a product. The automatic generation refers to that a system analyzes the spectrum information of a certain number of qualified products to obtain a spectrum data space 1; analyzing the spectrum information of a certain number of unqualified products to obtain a spectrum data space 2; and calculating a partition boundary between the spectral data space 1 and the spectral data space 2, namely a qualified detection threshold and a unqualified detection threshold. In addition to the pass/fail determination methods shown in table 1, the degree of fail can be subdivided into a plurality of grades, and the pass/fail of the "single detection conclusion" in table 1 can be subdivided into pass/slight fail/general fail/severe fail.
For a product containing multiple webs, the initial position of the first web, the width of each web, the distance between webs and the like can be manually specified, and the system performs spectrum detection according to specified parameters. Or the system automatically analyzes and compares the spectrum of the effective part and the spectrum of the interval part to obtain the data of the first initial position, the width of each web, the distance between webs and the like.
In addition, the spectral data can be converted into CIE XYZ value and CIE L*a*b*Value, CIE habAnd
Figure BDA0000890265540000171
and (4) performing qualified/unqualified detection in a relevant color space (coordinate system) according to a qualified data range generated by automatic learning or a qualified data range designated manually.
(II) multimodal Spectroscopy
A plurality of single-peak spectrums can be obtained through decoupling, each single-peak spectrum is analyzed and detected by referring to the single-peak spectrum method, parameter indexes such as energy integration, central wavelength, dominant wavelength intensity and the like of each single-peak spectrum are analyzed and compared, and comprehensive analysis is carried out.
In addition, in the process of detecting the reflection image, whether the reflection image is qualified or not can be detected through indexes such as the color high-low value range of the reflection image, the high-low value image template, the number of the patterns, the integrity degree of the patterns, the similarity degree of the patterns and the like. The range of each index may be set manually or automatically generated by analyzing spectral image data of a qualified product.
In the process of detecting the transmission image, whether the reflection image is qualified or not can be detected through indexes such as the color high-low value range of the transmission image, the high-low value image template, the number of the patterns, the integrity degree of the patterns, the similarity degree of the patterns and the like. The range of each index may be set manually or automatically generated by analyzing spectral image data of a qualified product.
The image analysis master station collects the detection information of the spectrum acquisition and processing subsystem, the reflection image acquisition and processing subsystem and the transmission image acquisition and processing subsystem, converts the detection information into consistent image resolution, aligns the image positions and aligns the image positions with the physical positions to obtain the detection result information of the product. The integrated defect value of a certain image position (i, j) is the fusion of a plurality of image defect values, as shown in formula (1).
Figure BDA0000890265540000181
Wherein, i tableShowing the width direction when the image data is acquired, j showing the length direction of the acquired image data, wnIn the range of [0,1]The n-th oriented image data defect weight coefficient at each position is expressed, and the range of Blobn (i, j) is [0,255%]And indicates the n-th oriented image data defect value at each position, where 0 indicates no defect and 255 indicates the most serious defect. TotolBlob (i, j) represents the integrated defect value at each location.
Specifically, the transverse resolution of each defect point is bx mm/pixel by calculating the scaling of the imaging parameter and the defect map compared with the original image, and then the transverse position corresponding to the ith point is i × bx mm. And calculating the longitudinal resolution of each defect point to be by mm/pixel according to the drawing period in the advancing direction, the advancing speed and the scaling of the defect map compared with the original image, wherein the transverse position corresponding to the jth point is j x bx mm. When one or more detection items are unqualified, the position (i, j) is judged to be unqualified.
Further, it is also possible to match the image position with the dividing means based on the image data and the horizontal and vertical division specification parameters of the product, to correspond i (widthwise position) to the dividing means such as the width and the root, and to correspond j (traveling position) to the dividing means such as the segment. When the analysis master station judges that a product at a certain position is unqualified, relevant information is displayed and stored; or informing the quality marking subsystem to execute defect marking; or the quality information is transmitted to a product processing system of the post-process, and the defective product is processed subsequently.
The technical scheme of the invention is described in detail in the above with reference to the attached drawings, and by the technical scheme of the invention, the automatic detection of the film quality can be realized, so that unnecessary waste of human resources is avoided, and meanwhile, the reliability of the film quality detection result is improved, thereby being beneficial to improving the efficiency and quality of film detection.
The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims (10)

1. A spectrum detection method is used for a spectrum detection system and is characterized in that the spectrum detection system consists of a light source, a light splitting device, a lens, an image collector and a control circuit, wherein emitted light, reflected light or transmitted light of a narrow-band region of a film to be detected enters the light splitting device after being focused by the lens, and after being split by the light splitting device, lights with different wavelengths are spatially separated and projected to the image collector, wherein the image collector is a planar array gray camera; the spectral detection system may include one or more sets of spectral imaging devices; the spectral imaging device comprises the light source, the light splitter, the lens and the image collector; and the spectral detection method comprises:
collecting the spectral data of the film to be detected according to the received detection command, wherein the detection command comprises a periodic collection command or a command for collecting according to a trigger signal;
determining spectral quality information for the spectral data;
according to the spectrum quality information, calculating the comprehensive defect value of the film to be detected through a preset defect value calculation formula, wherein the preset defect value calculation formula is as follows:
Figure FDA0002824952540000011
wherein i represents a width direction in which the spectral data is collected, j represents a length direction in which the spectral data is collected, and wnIn the range of [0,1]The n-th oriented image defect weight coefficient of the film to be detected is expressed, and the range of Blobn (i, j) is [0,255]The n-th image-oriented defect value of the film to be detected is represented, and TotolBlob (i, j) represents the comprehensive defect value of the film to be detected;
and determining whether the comprehensive defect value meets a preset condition so as to determine whether the quality of the film to be detected is qualified.
2. The method for spectrum detection according to claim 1, wherein the collecting of the spectrum data of the film to be detected specifically comprises:
collecting the spectral data of the whole breadth width of the film to be detected for multiple times by using an image collector so as to collect the full-width spectral data of the film to be detected; or
And acquiring the spectral data of partial breadth width of the film to be detected for multiple times by using an image acquisition unit, wherein the image acquisition unit is static in the width direction or moves back and forth.
3. The method for spectrum detection according to claim 2, further comprising, during the step of collecting the spectrum data of the film to be detected:
the running speed of the image collector is reduced so as to improve the directional resolution ratio when the spectral data is collected; or
And increasing the exposure time of the image collector to improve the directional resolution when the spectral data is collected.
4. The method of claim 3, wherein the spectral quality information of the spectral data comprises at least one or a combination of:
dominant wavelength, half-wave width, peak intensity, energy integral, dominant wavelength of a certain wavelength interval, half-wave width of a certain wavelength interval, peak intensity of a certain wavelength interval, energy integral of a certain wavelength interval, CIE XYZ value, CIE L of the spectral data*a*b*Value, CIE habAnd
Figure FDA0002824952540000021
a value; and
the spectral detection method further comprises:
determining qualified data space and unqualified data space of the spectrum data according to the spectrum quality information of the spectrum data, so as to set the preset condition for the comprehensive defect value according to the qualified data space and the unqualified data space; and
and calculating Blobn (i, j) of the spectrum data according to the spectrum quality information, the qualified data space and the unqualified data space.
5. The spectroscopic detection method of any one of claims 1 to 4, further comprising, after said determining whether the quality of the film to be detected is acceptable:
storing the quality detection result, and setting a defect mark for the film to be detected with unqualified quality so as to identify and process the film to be detected with the defect mark.
6. A spectrum detection system is characterized by comprising a light source, a light splitting device, a lens, an image collector and a control circuit, wherein emitted light, reflected light or transmitted light of a narrow-band region of a film to be detected enters the light splitting device after being focused by the lens, and after being split by the light splitting device, light with different wavelengths is spatially separated and projected to the image collector, wherein the image collector is a planar array gray camera; the spectral detection system may include one or more sets of spectral imaging devices; the spectral imaging device comprises the light source, the light splitter, the lens and the image collector; and
the spectral detection system further comprises:
the device comprises a spectrum data acquisition unit, a spectrum data acquisition unit and a control unit, wherein the spectrum data acquisition unit acquires spectrum data of a film to be detected according to a received detection command, and the detection command comprises a periodic acquisition command or a command for acquiring according to a trigger signal;
a spectral quality information determination unit that determines spectral quality information of the spectral data;
the defect value calculation unit is used for calculating the comprehensive defect value of the film to be detected through a preset defect value calculation formula according to the spectral quality information, wherein the preset defect value calculation formula is as follows:
Figure FDA0002824952540000031
wherein i represents a width direction in which the spectral data is collected, j represents a length direction in which the spectral data is collected, and wnIn the range of [0,1]The n-th oriented image defect weight coefficient of the film to be detected is expressed, and the range of Blobn (i, j) is [0,255]The n-th image-oriented defect value of the film to be detected is represented, and TotolBlob (i, j) represents the comprehensive defect value of the film to be detected;
and the quality judgment unit is used for determining whether the comprehensive defect value meets a preset condition so as to determine whether the quality of the film to be detected is qualified.
7. The spectroscopic detection system of claim 6 wherein the spectroscopic data acquisition unit comprises:
the first acquisition unit is used for acquiring the spectral data of the whole breadth width of the film to be detected for multiple times by using an image acquisition device so as to acquire the full-width spectral data of the film to be detected; and/or
And the second acquisition unit acquires the spectral data of partial breadth width of the film to be detected for multiple times by using an image acquisition device, wherein the image acquisition device is static in the width direction or moves back and forth.
8. The spectral detection system of claim 7, further comprising:
the operation speed adjusting unit is used for reducing the operation speed of the image collector in the process of collecting the spectral data of the film to be detected so as to improve the directional resolution ratio when the spectral data are collected; and/or
And the exposure time adjusting unit is used for increasing the exposure time of the image collector in the process of collecting the spectral data of the film to be detected so as to improve the directional resolution ratio when the spectral data is collected.
9. The spectral detection system of claim 8, wherein the spectral quality information of the spectral data comprises at least one of, or a combination of:
dominant wavelength, half-wave width, peak intensity, energy integral, dominant wavelength of a certain wavelength interval, half-wave width of a certain wavelength interval, peak intensity of a certain wavelength interval, energy integral of a certain wavelength interval, CIE XYZ value, CIE L of the spectral data*a*b*Value, CIE habAnd
Figure FDA0002824952540000041
a value; and
the spectral detection system further comprises:
the data space determining unit is used for determining qualified data space and unqualified data space of the spectrum data according to the spectrum quality information of the spectrum data, so that the preset conditions are set for the comprehensive defect value according to the qualified data space and the unqualified data space; and
and the defect value determining unit is used for calculating the Blobn (i, j) of the spectrum data according to the spectrum quality information, the qualified data space and the unqualified data space.
10. The spectroscopic detection system of any one of claims 6 to 9, further comprising:
the storage unit is used for storing a quality detection result after determining whether the quality of the film to be detected is qualified; and
and the marking unit is used for setting a defect mark for the film to be detected with unqualified quality so as to identify and process the film to be detected with the defect mark.
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