CN106908829B - Time sequence diagnosis system for nanosecond and picosecond laser beam combined targeting - Google Patents
Time sequence diagnosis system for nanosecond and picosecond laser beam combined targeting Download PDFInfo
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- CN106908829B CN106908829B CN201710247059.4A CN201710247059A CN106908829B CN 106908829 B CN106908829 B CN 106908829B CN 201710247059 A CN201710247059 A CN 201710247059A CN 106908829 B CN106908829 B CN 106908829B
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Abstract
The invention discloses a time sequence diagnosis system for nanosecond and picosecond laser beam combined target shooting, which is used for performing time sequence precision diagnosis of combined target shooting by simultaneously adopting nanosecond laser beams and picosecond laser beams in a laser plasma experiment. The time sequence diagnosis system comprises an imaging slit plate, a hard X-ray shield, a photocathode slit plate, a photocathode and a stripe camera which are sequentially arranged along the horizontal direction. In the experiment, soft X-rays generated by nanosecond laser beam targeting are imaged by a slit plate and then irradiated to a partial area of a photocathode; the hard X-rays generated by picosecond laser beam targeting pass directly through the slit plate (not imaged) and illuminate the entire area of the photocathode. Two X-rays with overlapped original light source positions can be separated from space on an image recorded by the fringe camera, and further the diagnosis of the time sequence relation between the nanosecond laser beam and the picosecond laser beam is realized. The time sequence diagnosis system has ten picosecond time resolution, gives consideration to certain soft X-ray space resolution and has wide application prospect.
Description
Technical Field
The invention belongs to the field of laser fusion research and the field of X-ray detection, and particularly relates to a time sequence diagnosis system for nanosecond and picosecond laser beam combined targeting.
Background
With the rapid development of ultrashort pulse laser technology, more and more laser beams with various power densities are needed to be used for combined targeting in laser experimental research: such as nanosecond laser beams and picosecond laser beams, for combined targeting physics studies. One typical application is fast ignition physical research, which requires nanosecond laser beams to compress CD target pellets, and picosecond laser beams to generate epithermal electron beams to heat the compressed plasma or generate X-rays for density diagnosis. These experimental studies are urgently needed to ensure that picosecond laser beams are injected into a target point at the maximum compression time, and because the injection time window is only in the order of hundreds of picoseconds, the timing sequence between nanosecond laser beams and picosecond laser beams needs to be diagnosed with high time precision. In addition, in the experimental mode, normally, the nanosecond laser beam and the picosecond laser beam are overlapped in space, and the difficulty of time sequence diagnosis is further increased. Existing methods include time-diagnosis of picosecond laser beams using fast-response scintillator detectors or framing cameras. However, the typical time course of the scintillation light of the fast response type scintillator detector reaches the nanosecond order, so that the time sequence diagnosis time precision between the nanosecond laser beam and the picosecond laser beam is not enough. And the diagnostic accuracy of the framing camera is limited by the imaging exposure time and is also in the order of hundred picoseconds. The time resolution of the detector adopting XRD and the like as signal recording equipment can only reach hundreds of picoseconds at the highest.
Disclosure of Invention
The method aims to overcome the defect that the nanosecond laser beam and picosecond laser beam combined targeting time sequence diagnosis precision is insufficient in the prior art. The invention provides a time sequence diagnosis system for nanosecond and picosecond laser beam combined targeting.
The technical scheme of the invention is as follows:
the invention discloses a time sequence diagnosis system for nanosecond and picosecond laser beam combined target shooting, which is characterized by comprising an imaging slit plate, a filter, a hard X-ray shield, a photocathode slit and a stripe camera.
The imaging slit plate is provided with a vertical slit, and the rear end face of the imaging slit plate is adhered with a filter disc.
The hard X-ray shield is composed of two half cylinders which are arranged in parallel, and a gap is arranged between the planes of the two half cylinders and used for limiting the area of a high-energy X-ray irradiating light cathode generated by picosecond target shooting.
The photocathode slit plate is provided with a horizontal slit, and a photocathode is attached to the back of the slit.
The imaging slit plate, the hard X-ray shielding body, the photocathode slit plate and the stripe camera are sequentially arranged along the horizontal direction on the light path.
After soft X-rays generated by nanosecond laser beam targeting are imaged by a slit, the soft X-rays pass through a filter and are irradiated to a partial area of a photocathode; hard X-rays generated by picosecond laser beam targeting penetrate through the slit plate and the filter disc and are irradiated to the whole area of the photocathode; photoelectron signals generated by the soft X-rays and the hard X-rays are recorded in the CCD after passing through a fringe camera focusing deflection system.
The radius of two half cylinders of hard X-ray shield is 20mm, and the thickness is 50mm.
The clearance range of the two semi-cylinders of the hard X-ray shield is 2mm-4 mm.
The slit plate is made of Mo, and the thickness of the slit plate ranges from 15 micrometers to 25 micrometers.
The slit plate is made of Cu, and the thickness of the slit plate ranges from 40 micrometers to 60 micrometers.
The photocathode is made of CsI or Au.
The time resolution of the streak camera in the present invention is 20ps or less.
In the invention, soft X-rays generated by nanosecond laser beams can not pass through the imaging slit plate and can only irradiate on partial area of the photocathode after slit imaging, thus having one-dimensional spatial resolution and time resolution effects; the hard X-ray generated by picosecond laser beam can pass through the imaging slit plate but can not pass through the photocathode slit plate, and can irradiate the whole area of the photocathode, so that the light-emitting area is far larger than the imaging area of the soft X-ray, and simultaneously, the stripe camera can still keep good time resolution on the hard X-ray due to the effect of the slit. By means of this diagnostic method, the two X-ray sources, which are originally spatially superposed on one another in the object space, can be spatially separated from one another in the image recorded by the strip camera, and the time-series information of the X-rays from the two sources is obtained in each case by time scanning.
The invention has the advantages that the time sequence precision diagnosis of combined targeting by simultaneously adopting nanosecond laser beams and picosecond laser beams in a laser plasma experiment can be realized, the system has ten picosecond-level time resolution, and certain soft X-ray spatial resolution is considered.
Drawings
FIG. 1 is a schematic diagram of a sequential diagnostic system for nanosecond and picosecond laser beam combined targeting according to the present invention;
in the figure, 1, target 2, imaging slit plate 3, imaging slit 4, filter 5, hard X-ray shield 6, photocathode slit plate 7, photocathode slit 8, photocathode 9, stripe camera.
Detailed Description
The present invention will be described in detail below with reference to the accompanying drawings and examples.
Example 1
Fig. 1 is a schematic structural diagram of a sequential diagnostic system for nanosecond and picosecond laser beam combined targeting according to the present invention, wherein a solid line arrow represents a nanosecond laser beam and a dotted line arrow represents a picosecond laser beam. In fig. 1, the time-series diagnostic system for nanosecond and picosecond laser beam combined targeting according to the present invention includes an imaging slit plate 2, a filter 4, a hard X-ray shield 5, a photocathode slit plate 6, a photocathode 8, and a streak camera 9.
The imaging slit plate 2 is provided with a vertical slit 3, and the rear end face of the imaging slit plate 2 is adhered with a filter 4.
The hard X-ray shield 5 consists of two half cylinders which are arranged in parallel, and a gap is arranged between the planes of the two half cylinders and is used for limiting the area of a high-energy X-ray irradiating light cathode 8 generated by picosecond target shooting;
the photocathode slit plate 6 is provided with a horizontal slit 7, and a photocathode 8 is attached to the back of the slit 7.
The imaging slit plate 2, the hard X-ray shielding body 5, the photocathode slit plate 6 and the stripe camera 9 are sequentially arranged along the horizontal direction on the light path;
soft X-rays generated by a nanosecond laser beam (solid arrow) targeting 1 are imaged through a slit 3 and then pass through a filter 4 to irradiate a partial area of a photocathode 8; hard X-rays generated by a picosecond laser beam (dotted arrow) targeting 1 pass through the slit plate 2 and the filter 4 and are irradiated to the whole area of the photocathode 8; photoelectron signals generated by the soft X-rays and the hard X-rays are recorded in the CCD after being focused on the deflection system by the fringe camera 9.
The radius of two semi-cylinders of the hard X-ray shield 5 is 20mm, and the thickness is 50mm.
The clearance range of the two semi-cylinders of the hard X-ray shield 5 is 2mm-4 mm.
The slit plate 2 is made of Mo, and the thickness of the slit plate 2 ranges from 15 micrometers to 25 micrometers.
The slit plate 2 is made of Cu, and the thickness of the slit plate 2 ranges from 40 micrometers to 60 micrometers.
The photocathode 8 is made of CsI or Au.
The energy spectrum segments covered by X-rays generated by a common nanosecond laser beam and a picosecond laser beam are greatly different. Specifically, the soft X-ray generated by the nanosecond laser beam cannot pass through the imaging slit plate 2, but can be imaged only through the slit 3, so that the one-dimensional spatial resolution and time resolution effects are achieved; the hard X-rays generated by the picosecond laser beam can pass through the imaging slit plate 2, and the light emitting area on the photocathode 8 is much larger than the imaging area of the soft X-rays; meanwhile, due to the effect of the slit 7, the stripe camera can still keep better time resolution on the hard X-ray. In this way, the two X-ray sources, which are originally spatially coincident in the object space, can be spatially separated from one another in the image recorded by the strip camera, and their time-series information can be obtained in each case by time scanning the X-rays from the two sources.
In this embodiment, the slit plate 2 is made of Mo and has a thickness of 15 μm; the gap between the two semi-cylindrical planes of the hard X-ray shield 5 is 2mm; csI is adopted as the material of the photocathode 8.
Example 2
This example has the same structure as example 1 except that Cu is used as a slit plate material and has a thickness of 40 μm.
Example 3
The present example is the same as example 1 except that the slit plate 1 is made of Mo and has a thickness of 25 μm.
Example 4
The present example is the same as example 1 except that the slit plate 1 is made of Cu and has a thickness of 60 μm.
Example 5
This embodiment has the same structure as embodiment 1 except that the gap between the two semi-cylindrical planes of the hard X-ray shield 5 is 4mm.
Example 6
This example has the same structure as example 1, except that Au is used as the material of the photocathode.
The present invention is not limited to the above-described embodiments, and those skilled in the art will be able to make various modifications without creative efforts from the above-described conception, and fall within the scope of the present invention.
Claims (6)
1. A timing diagnostic system for nanosecond and picosecond laser beam combined targeting, characterized by: the diagnosis system comprises an imaging slit plate (2), a filter disc (4), a hard X-ray shield (5), a photocathode slit plate (6), a photocathode (8) and a stripe camera (9);
a vertical slit (3) is formed in the imaging slit plate (2), and a filter disc (4) is attached to the rear end face of the imaging slit plate (2);
the hard X-ray shield (5) is composed of two half cylinders which are placed in parallel, and a gap is arranged between the planes of the two half cylinders and used for limiting the area of a high-energy X-ray irradiating light cathode (8) generated by picosecond target shooting;
a horizontal slit (7) is formed in the photocathode slit plate (6), and a photocathode (8) is attached to the back of the slit (7);
the imaging slit plate (2), the hard X-ray shield (5), the photocathode slit plate (6) and the stripe camera (9) are sequentially arranged along the horizontal direction on the light path;
soft X-rays generated by nanosecond laser beam targeting (1) are imaged through a slit (3) and then pass through a filter disc (4) to irradiate a partial area of a photocathode (8); hard X-rays generated by picosecond laser beam targeting (1) penetrate through the slit plate (2) and the filter disc (4) and are irradiated to the whole area of the photocathode (8); photoelectron signals generated by the soft X-rays and the hard X-rays are recorded in the CCD after passing through a fringe camera (9) focusing deflection system.
2. The timing diagnostic system for nanosecond and picosecond laser beam combined targeting according to claim 1, wherein: the radius of the two semi-cylinders of the hard X-ray shield (5) is 20mm, and the thickness is 50mm.
3. The timing diagnostic system for nanosecond and picosecond laser beam combined targeting according to claim 1, wherein: the clearance range of the two semi-cylinders of the hard X-ray shield (5) is 2mm-4 mm.
4. The timing diagnostic system for nanosecond and picosecond laser beam combined targeting according to claim 1, wherein: the slit plate (2) is made of Mo, and the thickness of the slit plate (2) ranges from 15 micrometers to 25 micrometers.
5. The timing diagnostic system for nanosecond and picosecond laser beam combined targeting according to claim 1, wherein: the slit plate (2) is made of Cu, and the thickness of the slit plate (2) ranges from 40 micrometers to 60 micrometers.
6. The timing diagnostic system for nanosecond and picosecond laser beam combined targeting according to claim 1, wherein: the material of the photocathode (8) adopts CsI or Au.
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| CN107703712B (en) * | 2017-11-13 | 2023-11-14 | 中国工程物理研究院激光聚变研究中心 | Hard X-ray stripe camera and method for detecting hard X-ray energy section thereof |
| CN108013891B (en) * | 2018-01-26 | 2023-08-04 | 中国工程物理研究院激光聚变研究中心 | X-ray diagnostic device |
| CN109459779B (en) * | 2019-01-08 | 2023-08-18 | 中国工程物理研究院激光聚变研究中心 | Laser implosion diagnosis system |
| CN111307843B (en) * | 2020-03-09 | 2022-05-27 | 中国工程物理研究院激光聚变研究中心 | Metal material dynamic response diagnosis device and method |
| CN111595258B (en) * | 2020-05-01 | 2021-09-14 | 中国工程物理研究院激光聚变研究中心 | Regional morphology measuring device and method for implosion target pellet |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH11149000A (en) * | 1997-11-14 | 1999-06-02 | Toyota Max:Kk | Energy measurement device of laser plasma soft x-ray |
| CN1564081A (en) * | 2004-04-06 | 2005-01-12 | 中国科学院上海光学精密机械研究所 | Time-resolved photocathode X-ray diode imaging device |
| CN2733412Y (en) * | 2004-09-29 | 2005-10-12 | 中国科学院上海光学精密机械研究所 | Subpicosecond time resolution X-ray diode imaging device |
| CN106199677A (en) * | 2016-08-30 | 2016-12-07 | 中国工程物理研究院激光聚变研究中心 | A kind of X-ray spectrum is measured and frame imaging system |
| CN106526654A (en) * | 2017-01-09 | 2017-03-22 | 中国工程物理研究院激光聚变研究中心 | Temporal-spatial resolution radiant flux diagnosis system |
| CN206638829U (en) * | 2017-04-17 | 2017-11-14 | 中国工程物理研究院激光聚变研究中心 | A kind of sequential diagnosis system practiced shooting for nanosecond and picosecond laser Shu Lianhe |
-
2017
- 2017-04-17 CN CN201710247059.4A patent/CN106908829B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH11149000A (en) * | 1997-11-14 | 1999-06-02 | Toyota Max:Kk | Energy measurement device of laser plasma soft x-ray |
| CN1564081A (en) * | 2004-04-06 | 2005-01-12 | 中国科学院上海光学精密机械研究所 | Time-resolved photocathode X-ray diode imaging device |
| CN2733412Y (en) * | 2004-09-29 | 2005-10-12 | 中国科学院上海光学精密机械研究所 | Subpicosecond time resolution X-ray diode imaging device |
| CN106199677A (en) * | 2016-08-30 | 2016-12-07 | 中国工程物理研究院激光聚变研究中心 | A kind of X-ray spectrum is measured and frame imaging system |
| CN106526654A (en) * | 2017-01-09 | 2017-03-22 | 中国工程物理研究院激光聚变研究中心 | Temporal-spatial resolution radiant flux diagnosis system |
| CN206638829U (en) * | 2017-04-17 | 2017-11-14 | 中国工程物理研究院激光聚变研究中心 | A kind of sequential diagnosis system practiced shooting for nanosecond and picosecond laser Shu Lianhe |
Non-Patent Citations (1)
| Title |
|---|
| 姚伟博 ; 郭建明 ; 张永民 ; 汤俊萍 ; 程亮 ; 徐启福.纳秒级时间分辨光谱诊断系统及其辐射防护.光谱学与光谱分析.第34卷(第6期),全文. * |
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