CN206638829U - A kind of sequential diagnosis system practiced shooting for nanosecond and picosecond laser Shu Lianhe - Google Patents
A kind of sequential diagnosis system practiced shooting for nanosecond and picosecond laser Shu Lianhe Download PDFInfo
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- CN206638829U CN206638829U CN201720395276.3U CN201720395276U CN206638829U CN 206638829 U CN206638829 U CN 206638829U CN 201720395276 U CN201720395276 U CN 201720395276U CN 206638829 U CN206638829 U CN 206638829U
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- photocathode
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Abstract
The utility model discloses a kind of sequential diagnosis system practiced shooting for nanosecond and picosecond laser Shu Lianhe, for the time sequence precision diagnosis practiced shooting in laser-plasma experiments using nanosecond laser beam and picosecond laser Shu Jinhang joints simultaneously.Described sequential diagnosis system includes tactic imaging slit plate, hard X ray shield, photocathode slit plate, photocathode and streak camera in the horizontal direction.In an experiment, grenz ray caused by nanosecond laser beam target practice exposes to photocathode subregion after slit plate is imaged；Hard X ray is directly through slit plate caused by the target practice of picosecond laser beam（It is not imaged）Photocathode Zone Full is irradiated afterwards.Two kinds of X ray that originally light source position overlaps can be from spatially separately, and then realize the diagnosis to sequential relationship between nanosecond laser beam and picosecond laser beam on the image that streak camera records.Sequential diagnosis system of the present utility model has ten picosecond time-resolveds, and takes into account certain grenz ray spatial discrimination, has a extensive future.
Description
Technical field
The utility model belongs to laser-produced fusion research field and X-ray detection field, and in particular to one kind be used for nanosecond and
The sequential diagnosis system that picosecond laser Shu Lianhe practices shooting.
Background technology
With the rapid development of ultra-short pulse laser technology, more and more need to use in Laser Experiments research
The laser beam joint of multiple power density is practiced shooting：Such as nanosecond laser beam and picosecond laser Shu Jinhang joint target practice physical studies.One
Typically application is in fast ignition physical study, it is necessary to be compressed with nanosecond laser beam to CD pellets, together simultaneously to kind
When with picosecond laser beam produce hot electron beam plasma compression is heated or produced X ray enter line density diagnose.
These experimental studies are there is an urgent need to ensure that picosecond laser beam is injected into target spot at the maximum compression moment, and due to injection length window
Only hundred picosecond magnitudes, it is therefore desirable to which examining for high time precision is carried out to the sequential between nanosecond laser beam and picosecond laser beam
It is disconnected.In addition, in this experiment method, usual nanosecond laser beam and picosecond laser beam Shooting Point spatially overlap, also further
Add the difficulty of sequential diagnosis.Existing method includes scintillator detector or framing camera using fast-response type to skin
Second laser beam carries out time diagnosis.But the passage of scintillation light typical time process of fast-response type scintillator detector reaches nanosecond amount
Level, it is inadequate to thus be accordingly used in precision during to sequential diagnosis between nanosecond laser beam and picosecond laser beam.And framing camera is imaged
Time for exposure limits its diagnostic accuracy also in hundred picosecond magnitudes.Using detector a kind of XRD as signal recorder at that time
Between differentiate and only up to still reach hundred picosecond magnitudes.
The content of the invention
In order to overcome the shortcomings of that nanosecond and picosecond laser Shu Lianhe target practice sequential diagnosis precision are inadequate in prior art.This reality
With a kind of sequential diagnosis system practiced shooting for nanosecond and picosecond laser Shu Lianhe of new offer.
The technical solution of the utility model is as follows：
A kind of sequential diagnosis system practiced shooting for nanosecond and picosecond laser Shu Lianhe of the present utility model, is characterized in,
The diagnostic system includes imaging slit plate, filter disc, hard X ray shield, photocathode, photocathode slit and streak camera.
Vertical slit is provided with described imaging slit plate, the rear end face for being imaged slit plate posts filter disc.
Described hard X ray shield is made up of two semicylinders being placed in parallel, between two semicylinder planes
Provided with gap, for limiting the region of sigmatron irradiation photocathode caused by psec target practice.
Horizontal slit is provided with described photocathode slit plate, photocathode is posted at the back side of slit.
Described imaging slit plate, hard X ray shield, photocathode slit plate, streak camera are in light path successively along water
Square to arrangement.
Grenz ray exposes to the part of photocathode through filter disc after slit image caused by nanosecond laser beam target practice
Region；Hard X ray caused by the target practice of picosecond laser beam exposes to the Zone Full of photocathode through slit plate, filter disc；Grenz ray
With hard X ray caused by photoelectron signal be recorded in after streak camera focus deflection system in CCD.
The radius of described two semicylinders of hard X ray shield is 20mm, thickness 50mm.
The interstice coverage of described two semicylinders of hard X ray shield is 2mm ~ 4mm.
The material of described slit plate uses Mo, and the scope of slit plate thickness is 15 μm ~ 25 μm.
The material of described slit plate uses Cu, and the scope of slit plate thickness is 40 μm ~ 60 μm.
The material of described photocathode uses CsI or Au.
The temporal resolution of streak camera in the utility model is less than or equal to 20ps.
In the utility model, grenz ray can not can only pass through slit by being imaged slit plate as caused by nanosecond laser beam
It is irradiated to after imaging on photocathode subregion, therefore is differentiated and time resolution effect with the one-dimensional space；Picosecond laser beam produces
Raw hard X ray can pass through imaging slit plate, but cannot pass through photocathode slit plate, and it can irradiate whole areas of photocathode
Domain, therefore light-emitting zone is much larger than the imaging region of grenz ray, simultaneously because the effect of slit, streak camera to hard X ray still
Preferable time resolution can so be kept.By this diagnostic mode, two kinds of X ray that position overlaps on object space originally
Light source can be from spatially separately, and then pass through and carry out the time to the X ray in two kinds of sources on the image that streak camera records
Scanning obtains its timing information respectively.
The beneficial effects of the utility model can be realized in laser-plasma experiments while using nanosecond laser beam
The time sequence precision diagnosis practiced shooting with picosecond laser Shu Jinhang joints, system has ten picosecond time-resolveds, and takes into account certain
Grenz ray spatial discrimination.
Brief description of the drawings
Fig. 1 is a kind of structure of sequential diagnosis system practiced shooting for nanosecond and picosecond laser Shu Lianhe of the present utility model
Schematic diagram；
In figure, 1. targets 2. imaging slit plate 3. is imaged the time of 4. filter disc of slit, 5. hard X ray shield 6.
The streak camera of 7. photocathode slit of pole slit plate, 8. photocathode 9..
Embodiment
The utility model is described in detail with reference to the accompanying drawings and examples.
Embodiment 1
Fig. 1 is a kind of structure of sequential diagnosis system practiced shooting for nanosecond and picosecond laser Shu Lianhe of the present utility model
Schematic diagram, wherein, solid arrow represents nanosecond laser beam, and dotted arrow represents picosecond laser beam.In Fig. 1, the utility model
The sequential diagnosis system for being used for nanosecond and picosecond laser Shu Lianhe and practicing shooting, including imaging slit plate 2, filter disc 4, hard X ray screen
Cover body 5, photocathode slit plate 6, photocathode 8 and streak camera 9.
Vertical slit 3 is provided with described imaging slit plate 2, the rear end face of imaging slit plate 2 posts filter disc 4.
Described hard X ray shield 5 is made up of two semicylinders being placed in parallel, between two semicylinder planes
Provided with gap, for limiting the region of sigmatron irradiation photocathode 8 caused by psec target practice；
Horizontal slit 7 is provided with described photocathode slit plate 6, photocathode 8 is posted at the back side of slit 7.
Described imaging slit plate 2, hard X ray shield 5, photocathode slit plate 6, streak camera 9 in light path successively
Arrange in the horizontal direction；
Nanosecond laser beam（Solid arrow）Grenz ray caused by 1 practice shooting after the imaging of slit 3, is exposed to through filter disc 4
The subregion of photocathode 8；Picosecond laser beam（Dotted arrow）Hard X ray caused by 1 of practicing shooting is irradiated through slit plate 2, filter disc 4
To the Zone Full of photocathode 8；Photoelectron signal caused by grenz ray and hard X ray passes through the focus deflection system of streak camera 9
After be recorded in CCD.
The radius of described 5 two semicylinders of hard X ray shield is 20mm, thickness 50mm.
The interstice coverage of described 5 two semicylinders of hard X ray shield is 2mm ~ 4mm.
The described material of slit plate 2 uses Mo, and the scope of the thickness of slit plate 2 is 15 μm ~ 25 μm.
The described material of slit plate 2 uses Cu, and the scope of the thickness of slit plate 2 is 40 μm ~ 60 μm.
The described material of photocathode 8 uses CsI or Au.
The energy spectral coverage that X ray caused by general nanosecond laser beam and picosecond laser beam covers has larger difference.Specifically
For, grenz ray can only can not be imaged, therefore have by being imaged slit plate 2 by slit 3 as caused by nanosecond laser beam
The one-dimensional space is differentiated and time resolution effect；Hard X ray caused by picosecond laser beam can pass through imaging slit plate 2, in time
Light-emitting zone on pole 8 is much larger than the imaging region of grenz ray；Simultaneously because the effect of slit 7, streak camera is to hard X ray
It is maintained to preferable time resolution.In this way, two kinds of X ray light that position overlaps on object space originally
Source can be from spatially being separated on the image that streak camera records, and then is passed through and carried out the time to the X ray in two kinds of sources
Scanning obtains its timing information respectively.
In the present embodiment, the material of slit plate 2 uses Mo, and thickness is 15 μm；Two semicylinders of hard X ray shield 5
Gap between plane is 2mm；The material of photocathode 8 uses CsI.
Embodiment 2
The present embodiment is identical with the structure of embodiment 1, except that slit plate material uses Cu, thickness is 40 μm.
Embodiment 3
The present embodiment is identical with the structure of embodiment 1, except that the material of slit plate 1 uses Mo, thickness is 25 μm.
Embodiment 4
The present embodiment is identical with the structure of embodiment 1, except that the material of slit plate 1 uses Cu, thickness is 60 μm.
Embodiment 5
The present embodiment is identical with the structure of embodiment 1, except that two semicylinders of hard X ray shield 5 are put down
Gap between face is 4mm.
Embodiment 6
The present embodiment is identical with the structure of embodiment 1, except that the material of photocathode uses Au.
The utility model is not limited to above-mentioned embodiment, and person of ordinary skill in the field visualizes from above-mentioned
Hair, without performing creative labour, made a variety of conversion, all falls within the scope of protection of the utility model.
Claims (5)
- A kind of 1. sequential diagnosis system practiced shooting for nanosecond and picosecond laser Shu Lianhe, it is characterised in that：The diagnostic system Including being imaged slit plate（2）, filter disc（4）, hard X ray shield（5）, photocathode slit plate（6）, photocathode（8）With striped phase Machine（9）；Described imaging slit plate（2）On be provided with vertical slit（3）, it is imaged slit plate（2）Rear end face post filter disc（4）；Described hard X ray shield（5）It is made up of two semicylinders being placed in parallel, is set between two semicylinder planes There is gap, for limiting sigmatron irradiation photocathode caused by psec target practice（8）Region；Described photocathode slit plate（6）On be provided with horizontal slit（7）, in slit（7）The back side post photocathode（8）；Described imaging slit plate（2）, hard X ray shield（5）, photocathode slit plate（6）, streak camera（9）In light path Arrange successively in the horizontal；Nanosecond laser beam is practiced shooting（1）Caused grenz ray passes through slit（3）After imaging, through filter disc（4）Expose to photocathode （8）Subregion；Picosecond laser beam is practiced shooting（1）Caused hard X ray passes through slit plate（2）, filter disc（4）Expose to photocathode （8）Zone Full；Photoelectron signal caused by grenz ray and hard X ray passes through streak camera（9）Focus deflection system postscript Record is in CCD.
- 2. a kind of sequential diagnosis system practiced shooting for nanosecond and picosecond laser Shu Lianhe according to claim 1, it is special Sign is：Described hard X ray shield（5）The radius of two semicylinders is 20mm, thickness 50mm.
- 3. a kind of sequential diagnosis system practiced shooting for nanosecond and picosecond laser Shu Lianhe according to claim 1, it is special Sign is：Described hard X ray shield（5）The interstice coverage of two semicylinders is 2mm ~ 4mm.
- 4. a kind of sequential diagnosis system practiced shooting for nanosecond and picosecond laser Shu Lianhe according to claim 1, it is special Sign is：Described slit plate（2）The scope of thickness is 15 μm ~ 25 μm.
- 5. a kind of sequential diagnosis system practiced shooting for nanosecond and picosecond laser Shu Lianhe according to claim 1, it is special Sign is：Described slit plate（2）The scope of thickness is 40 μm ~ 60 μm.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201720395276.3U CN206638829U (en) | 2017-04-17 | 2017-04-17 | A kind of sequential diagnosis system practiced shooting for nanosecond and picosecond laser Shu Lianhe |
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106908829A (en) * | 2017-04-17 | 2017-06-30 | 中国工程物理研究院激光聚变研究中心 | A kind of sequential diagnosis system practiced shooting for nanosecond and picosecond laser Shu Lianhe |
| CN108398712A (en) * | 2018-02-08 | 2018-08-14 | 中国工程物理研究院上海激光等离子体研究所 | Circular cone item crystalline substance spectrometer and its installation and adjustment method |
| CN109060597A (en) * | 2018-08-28 | 2018-12-21 | 中国工程物理研究院激光聚变研究中心 | A kind of metal impact shattering process density diagnostic method and system |
| CN109115808A (en) * | 2018-08-28 | 2019-01-01 | 中国工程物理研究院激光聚变研究中心 | A kind of dual-energy imaging method and system |
| CN109459779A (en) * | 2019-01-08 | 2019-03-12 | 中国工程物理研究院激光聚变研究中心 | A kind of laser implosion diagnostic system |
| CN112013728A (en) * | 2020-08-10 | 2020-12-01 | 西安近代化学研究所 | Experimental method for transient process of fragment cloud generated by high-speed jet collision on target plate |
-
2017
- 2017-04-17 CN CN201720395276.3U patent/CN206638829U/en not_active Withdrawn - After Issue
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106908829A (en) * | 2017-04-17 | 2017-06-30 | 中国工程物理研究院激光聚变研究中心 | A kind of sequential diagnosis system practiced shooting for nanosecond and picosecond laser Shu Lianhe |
| CN106908829B (en) * | 2017-04-17 | 2023-04-18 | 中国工程物理研究院激光聚变研究中心 | Time sequence diagnosis system for nanosecond and picosecond laser beam combined targeting |
| CN108398712A (en) * | 2018-02-08 | 2018-08-14 | 中国工程物理研究院上海激光等离子体研究所 | Circular cone item crystalline substance spectrometer and its installation and adjustment method |
| CN109060597A (en) * | 2018-08-28 | 2018-12-21 | 中国工程物理研究院激光聚变研究中心 | A kind of metal impact shattering process density diagnostic method and system |
| CN109115808A (en) * | 2018-08-28 | 2019-01-01 | 中国工程物理研究院激光聚变研究中心 | A kind of dual-energy imaging method and system |
| CN109115808B (en) * | 2018-08-28 | 2021-04-30 | 中国工程物理研究院激光聚变研究中心 | Dual-energy imaging method and system |
| CN109459779A (en) * | 2019-01-08 | 2019-03-12 | 中国工程物理研究院激光聚变研究中心 | A kind of laser implosion diagnostic system |
| CN109459779B (en) * | 2019-01-08 | 2023-08-18 | 中国工程物理研究院激光聚变研究中心 | Laser implosion diagnosis system |
| CN112013728A (en) * | 2020-08-10 | 2020-12-01 | 西安近代化学研究所 | Experimental method for transient process of fragment cloud generated by high-speed jet collision on target plate |
| CN112013728B (en) * | 2020-08-10 | 2022-08-19 | 西安近代化学研究所 | Experimental method for transient process of fragment cloud generated by high-speed jet collision on target plate |
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Granted publication date: 20171114 Effective date of abandoning: 20230418 |
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| AV01 | Patent right actively abandoned |
Granted publication date: 20171114 Effective date of abandoning: 20230418 |
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| AV01 | Patent right actively abandoned |