CN2733412Y - Subpicosecond resolution X-ray diode imaging device - Google Patents
Subpicosecond resolution X-ray diode imaging device Download PDFInfo
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- CN2733412Y CN2733412Y CN 200420090646 CN200420090646U CN2733412Y CN 2733412 Y CN2733412 Y CN 2733412Y CN 200420090646 CN200420090646 CN 200420090646 CN 200420090646 U CN200420090646 U CN 200420090646U CN 2733412 Y CN2733412 Y CN 2733412Y
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Abstract
The utility model discloses a sub-picosecond resolution X-ray diode imaging device, comprising a picosecond krypton fluoride laser source. The utility model is characterized in that the laser output light path of the picosecond krypton fluoride laser source is provided with a beam divider; the beam divider divides the entering beam into a reflecting light beam A and a penetrating light beam B. The reflecting light path is provided with an optics delay line comprising 3 reflecting mirrors, a concave mirror lens and a sample. The light beam An is gathered by the concave mirror lens after passing through the optics delay line to work with the sample together; the penetrating light path is provided with a photocathode X ray diode and a concave reflecting grating; the light beam B enters into the catelectrode X ray diode by the reflection of the reflecting mirror to light on the catelectrode of the photocathode X ray diode to generate a photoelectron. The photoelectron is accelerated to beat on the anode by the anode voltage to generate an X ray; the X ray is focused and dispersed by the concave reflecting grating to light on the sample to detect the process of generating plasma of the light beam A so as to image; the detector receives the information to display on the computer.
Description
Technical field:
The relevant x-ray imaging technology of the utility model, particularly a kind of subpicosecond time resolution X-ray diode imaging device has a wide range of applications in fields such as material science, biological chemistries.
Background technology:
In in the past 5 years, owing to adopted new amplifying technique-chirped pulse to amplify (being CPA) and new wideband gain medium, as Ti:Sapphire and Cr:LiSAF, the ultra-short pulse laser of terawatt (TW) magnitude has been obtained breakthrough progress, and its peak power has reached 10
15W, average power reaches 10W, and pulsewidth has been compressed to 4.3fs, although the energy of laser is not very high, because extremely short pulse width and good focusing, its intensity can reach very high.In addition, the repetition frequency of laser pulse has also reached 100kHZ, estimates promptly to be expected to reach 10 soon
3The order of magnitude of kHZ, these progress make the generation of ultrashort X ray pulse become possibility.When femtosecond terawatt (TW) laser focusing was on the solid target, laser pulse and solid atomic interaction produced highdensity plasma, and these plasma emission go out the ultrashort pulse of hard X ray.
The X ray frequency spectrum of plasma emission comprises continuous spectrum and characteristic spectral line.Characteristic spectral line and solid target element are closely related.As making target, launch two characteristic spectral line K with solid copper
α 1, K
α 2The intensity of the strength ratio continuous spectrum of the characteristic spectral line of emission is high, and therefore in ultrafast x-ray imaging, the X ray that participates in surveying mainly is a characteristic spectral line.The pulsewidth of the ultrashort pulse that this mode produces in the scope of subpicosecond to nanosecond, depends on the character of the laser that is used to produce the X ray pulse, and its peak value of pulse brightness can be suitable with the x-ray source of synchrotron radiation, and peak strength exceeds several magnitude than it.And these X ray ultrashort pulses can be synchronous with other laser pulse, and its deviation only is several femtoseconds, and this just makes them be fit to be used for studying the ultrafast phenomena of subpicosecond.Femto-second laser pulse activates a ultrafast process, on different time delays, goes to survey this process with ultrashort X ray pulse then.Because the X ray ultrashort pulse of plasma generation with laser emission can be mated with the pumping laser pulsion phase on repetition frequency, this just allows to utilize all X ray ultrashort pulses, and promptly all X ray pulses have all participated in detection.And in the interpulse repetition frequency of the x-ray source of synchrotron radiation and pumping laser and do not match, both repetition frequencys are respectively the MHz order of magnitude and the kHz order of magnitude.Because both repetition frequency does not match, this x-ray source that has just limited synchrotron radiation only has 1/1000, even pulse still less is utilized, and this detection for ultrafast process is disadvantageous greatly.The mode that people have utilized femtosecond laser to produce the X ray ultrashort pulse of plasma emission is carried out the experimental study of ultrafast x-ray imaging.
Produce the method for high-energy photon by the scattering between laser and Relativistic Electron, just proposed before 30 years, the scattering between laser pulse and Relativistic Electron produces the existing report of experiment of high-energy photon.Human experimental demonstrations such as R.W.Schoenlein the Thomson scatterings of 90 degree between the high Relativistic Electron of infrared terawatt (TW) femto-second laser pulse and accelerator, producing wavelength is that 0.4 , pulsewidth are that 300fs, energy are the X ray pulse of 30keV.
This experiment usefulness be linear accelerator, the energy of emission is the terawatt (TW) light pulse of the electron beam of 50MeV and the chirped pulse laser system of amplifying.Electron beam is turned to by bending magnet then indoor being focused of high vacuum interaction, carries out Thomson scattering, produces the X ray pulse.Terawatt (TW) laser by radius-of-curvature be the concave mirror focus of 75cm to a bit, its diameter is 30 μ m on the point of crossing.In this experiment, the waist diameter of Relativistic Electron bundle is 90 μ m, and the X ray pulsewidth that obtains is 300fs.The directivity of the X-ray beam that this mode produces is fine, and the angle of divergence only is 0.6 degree, and the photon number of each pulse is 5 * 10
4So far, we by the agency of three kinds of methods that ultrafast hard X ray pulse produces, i.e. laser plasma, synchrotron radiation and Thomson scattering.
Table 1 has been listed above-mentioned three kinds of ultrafast x-ray source performances relatively.
Table 1
| X-ray source | Photon energy keV | Photon number/pulse | Bandwidth | Repetition frequency Hz | Light source area mm 2 | Angle of divergence mrd | Duration of pulse ps |
| The ALS bending magnet | 0.001～10 | 1×10 8 (10 5) | (0.001) | 5×10 8 | 10 -2 | 1 | 30 |
| Laser plasma | 2.8 | 11×10 9 | 2×10 -4 | 20 | 10 -4 | 3000 | 0.3 |
| Thomson | 7～30 | 51×10 4 | 0.15 | 5 | 10 -2 | 10 | 0.3 |
For general laboratory, people select laser plasma to produce the X ray ultrashort pulse to carry out the research of ultrafast x-ray imaging usually.A wherein most important reason is to survey in the experiment in optical pumping-X ray, produces the same LASER Light Source of X ray ultrashort pulse, is easy to provide with the X ray impulsive synchronization, the strong ultrashort laser pulse of identical repetition frequency is arranged, and comes sample is carried out pumping.And synchrotron radiation light source, as noted earlier, it needs a series of complicated apparatus make X ray pulse and pump light impulsive synchronization, and this is difficult to reach for general laboratory, and present in the world Synchrotron Radiation is also very limited.
Thomson scattering needs a huge accelerator equally, and therefore, these devices do not have practicality.And laser plasma X-ray source, often continuous wave and characteristic spectrum are mixed in together, and monochromatic brightness is low again, and this just needs people to go to seek new ultrafast, superpower hard X ray source.Here x-ray imaging be meant: the time-resolved X-ray diffraction imaging, the time resolution X-ray phase contrast imaging, the time resolution X-ray tomography, the time resolution X-ray holographic imaging, time resolution X-ray makes contact to picture.For the purpose of call for Votes was convenient, be imaged as example with the time resolution X-ray contact here, because call for Votes is more convenient like this.If detector is moved a segment distance, just can carry out time resolution X-ray phase contrast or holographic imaging; If sample is moved, just can carry out chromatography research.
Summary of the invention:
The technical problems to be solved in the utility model is at the existing shortcoming of above-mentioned technology formerly, and a kind of subpicosecond time resolution X-ray diode imaging device is provided.
Technical solution of the present utility model is as follows:
A kind of subpicosecond time resolution X-ray diode imaging device, comprise psec KrF LASER Light Source, it is characterized in that on the laser output light path of this psec KrF LASER Light Source, settling beam splitter, this beam splitter is divided into reflection A light beam and transmission B light beam with incident, on reflected light path, be provided with the optical delay line and concave reflection lens and the sample that constitute by 3 catoptrons, the A light beam is converged by the concave reflection lens behind optical delay line again and interacts with sample, and on transmitted light path, be provided with photocathode x-ray diode and concave reflection grating, B bundle light enters the negative electrode x-ray diode through mirror reflects and incides on the photocathode x-ray diode negative electrode, produce photoelectron, photoelectron is quickened to beat on anode by anode voltage, produce an X ray, focus on and chromatic dispersion through concave reflection grating, incide on the sample, detecting light beam A produces the process of plasma, carries out imaging then, be detected device and receive, show on computers.
Described psec KrF LASER Light Source is a krypton fluoride laser that radiation wavelength is 248nm, and pulsewidth is that 1.2～30 psecs, output energy are 0.8～8 millijoule, and about 1/10 energy is used for pump light negative electrode x-ray diode.
Described beam splitter is one 248nm reflection 90% is seen through 10% medium lamina membranacea that the host material of diaphragm is quartzy.
Described catoptron is gold-plated, as 248nm to be had 100% a reflectivity metal lamina membranacea.
Described photocathode x-ray diode is a diode that comprises four ingredients: photocathode material is an aluminium, and anode material is a tungsten, and sheathing material is quartzy, and it is 248nm thoroughly, pumping high vacuum sealing in the shell, and the plus high-pressure source can be added to 50～120kV.
Said concave surface focus reflection monocrystal is a monocrystal that can focus on and can chromatic dispersion, and for example aluminum single crystal etc. can be bought on the market.
Said optical delay line is by completely reflecting mirror 3,4, and 5 form.
Said concave mirror is one 248nm is focused on mirror with total reflection.
Said sample is the glass sample that is used for producing fast process, and for example, after being excited by picopulse, it can produce plasma, and we are exactly generation, the expansion of this plasma of research, the overall process of disappearance.
Said detector is to be used for surveying the photocathode x-ray diode through after the sample, contains the image that multidate information became of sample.
Said computing machine is to be used for showing image information received on the detector.
Technique effect of the present utility model:
The utility model adopts a krypton fluoride laser to carry out beam splitting, wherein a branch of effect light beam that is used for, produce a fast process, as incident to be measured, another bundle is used for producing the X ray pulse, as detecting light beam, and adjust with the light beam lag line between effect light beam and the detecting light beam, can survey fast process easily like this.Owing to apply a high voltage on the photocathode x-ray diode, can will get the hard X ray of 0.2 on the tungsten anode, this is difficult to obtain on laser plasma, and the X ray of outgoing also greatly improves its monochromaticity through a concave grating.
Compare with technology formerly, the utility model subpicosecond time resolution X-ray diode imaging device, owing to adopt the light beam light beam of do effect simultaneously and the pump beam of same laser instrument output,, take fast process with light beam lag line energy control lag, owing to adopt the tungsten anode, can obtain the hard X ray of 0.2 , this hard X ray penetration capacity is strong, after grating dispersion, monochromaticity is good again, can satisfy various imaging requirements.
Description of drawings:
Fig. 1 is the utility model subpicosecond time resolution X-ray diode imaging device schematic diagram.
Embodiment:
See also Fig. 1 earlier, Fig. 1 is the schematic diagram of the utility model subpicosecond time resolution X-ray diode imaging device embodiment, as seen from the figure, the utility model subpicosecond time resolution X-ray diode imaging device, comprise psec KrF LASER Light Source 1, it is characterized in that on the laser output light path of this psec KrF LASER Light Source 1, settling beam splitter 2, this beam splitter 2 is divided into reflection A light beam and transmission B light beam with incident, on reflected light path, be provided with by 3 catoptrons 3,4,5 optical delay line and concave reflection lens 7 and the samples 10 that constitute, the A light beam is converged with sample 10 by concave reflection lens 7 behind optical delay line again and interacts, and on transmitted light path, be provided with catoptron 6, photocathode x-ray diode 8, concave reflection grating 9, B bundle light enters negative electrode x-ray diode 8 through catoptron 6 reflections and incides on the photocathode x-ray diode negative electrode, produce photoelectron, photoelectron is quickened to beat on anode by anode voltage, produce an X ray, focus on and chromatic dispersion through concave reflection grating 9, incide on the sample 10, detecting light beam A produces the process of plasma, carry out imaging then, be detected device 11 and receive, be presented on the computing machine 12.
Said psec KrF LASER Light Source 1 is that a radiation wavelength is that 248nm, pulsewidth are that 1.5ps, output energy are the laser aid of 1mJ.
Said beam splitter 2 be one to 248nm reflection 90%, see through 10% medium lamina membranacea, the femto second titanium precious stone laser pulse of incident is divided into the A bundle for it and B restraints.
Said total reflection medium film plate 3,4,5,6 is the medium lamina membranaceas to the 248nm100% total reflection, and wherein total reflection medium film plate 3,4,5 is formed an optical delay line, in order to adjust the relative optical delay of A bundle and B interfascicular.
Said concave mirror 7 is catoptrons of A being restrainted the physical process that light focuses on and reflex on the sample 10, generation is to be studied.
Said photocathode x-ray diode 8 is devices that are used for producing X ray, and it is made up of four parts:
Said concave surface focus reflection monocrystal 9 is aluminium monocrystalline, is pressed into radius-of-curvature and is 2 meters concave reflection monocrystalline, and existing focusing, reflection have the function of chromatic dispersion again.
Said sample 10 is the glass samples that are used for producing fast process.
Said detector 11 is CCD charge-coupled devices, and it can be to 0.2 spectrum sensitive.
Said computing machine 12 is the devices that are used for storing and showing the image that obtains on the detector.
The principle of work and the basic process of time resolution photocathode x-ray diode of the present utility model are as follows:
The utility model adopts krypton fluoride laser 1 an emitted laser bundle through beam splitter 2 beam splitting, wherein A light beam (account for total intensity 9/10) is used for the effect light beam, radiation produces the fast process of laser and matter interaction, as dynamic event to be measured on sample to be studied 10.Another B light beam is used for producing photoelectron, produce the X ray pulse as detecting light beam, survey above-mentioned dynamic event, and the delay between two light beams realizes by the light beam lag line, therefore, can realize the synchronous and delay between two light beams easily,, just can measure Different Dynamic transient buildup constantly and change by adjusting lag line.
Owing to adopt photoelectron, its monochromaticity can be controlled by the live width of control KrF laser, guaranteed the monochromatic brightness of X ray, because the anode in the photocathode x-ray diode adopts tungsten, the characteristic X-ray of emission can be in the interval running of 0.2 , and this is that laser plasma is far inaccessiable.
After noting first X ray and making contact to the photo of picture, postpone 10ps, repeat above-mentioned experiment, take one again, continuous like this is a step with 10ps, repeats, and photographs till above-mentioned dynamic event finishes always.Its time resolution is 10ps, and spatial resolution also can reach the 20nm magnitude.
Claims (5)
1, a kind of subpicosecond time resolution X-ray diode imaging device, comprise psec KrF LASER Light Source (1), it is characterized in that on the laser output light path of this psec KrF LASER Light Source (1), settling beam splitter (2), this beam splitter (2) is divided into reflection A light beam and transmission B light beam with incident, on reflected light path, be provided with by 3 catoptrons (3,4,5) optical delay line of Gou Chenging and concave reflection lens (7) and sample (10), the A light beam is converged by concave reflection lens (7) behind optical delay line again and interacts with sample (10), and on transmitted light path, be provided with, photocathode x-ray diode (8), concave reflection grating (9), B bundle light enters negative electrode x-ray diode (8) through catoptron (6) reflection and incides on the photocathode x-ray diode negative electrode, produce photoelectron, photoelectron is quickened to beat on anode by anode voltage, produce an X ray, focus on and chromatic dispersion through concave reflection grating (9), incide on the sample (10), detecting light beam A produces the process of plasma, carry out imaging then, be detected device (11) and receive, be presented on the computing machine (12).
2, subpicosecond time resolution X-ray diode imaging device according to claim 1, it is characterized in that described psec KrF LASER Light Source (1) is a krypton fluoride laser that radiation wavelength is 248nm, pulsewidth is that 1.2～30 psecs, output energy are 0.8～8 millijoule, and about 1/10 energy is used for pump light negative electrode x-ray diode.
3, subpicosecond time resolution X-ray diode imaging device according to claim 1 is characterized in that described beam splitter (2) is one 248nm reflection 90% is seen through 10% medium lamina membranacea, and the host material of diaphragm is quartzy.
4, subpicosecond time resolution X-ray diode imaging device according to claim 1 is characterized in that described catoptron is gold-plated, as 248nm to be had 100% a reflectivity metal lamina membranacea.
5, subpicosecond time resolution X-ray diode imaging device according to claim 1, it is characterized in that described photocathode x-ray diode (8) is a diode that comprises four ingredients: photocathode material is an aluminium, anode material is a tungsten, sheathing material is quartzy, it is 248nm thoroughly, pumping high vacuum sealing in the shell, the plus high-pressure source can be added to 50～120kV.
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| CN 200420090646 CN2733412Y (en) | 2004-09-29 | 2004-09-29 | Subpicosecond resolution X-ray diode imaging device |
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| CN 200420090646 CN2733412Y (en) | 2004-09-29 | 2004-09-29 | Subpicosecond resolution X-ray diode imaging device |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103230281A (en) * | 2013-05-02 | 2013-08-07 | 陈黎明 | Laser-driving X-ray medical imaging device and imaging method thereof |
| CN104913853A (en) * | 2014-03-12 | 2015-09-16 | 中国科学院光电研究院 | Method and system for measuring ultra-intense ultra-short laser prepulses |
| CN106908829A (en) * | 2017-04-17 | 2017-06-30 | 中国工程物理研究院激光聚变研究中心 | A kind of sequential diagnosis system practiced shooting for nanosecond and picosecond laser Shu Lianhe |
-
2004
- 2004-09-29 CN CN 200420090646 patent/CN2733412Y/en not_active Expired - Fee Related
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103230281A (en) * | 2013-05-02 | 2013-08-07 | 陈黎明 | Laser-driving X-ray medical imaging device and imaging method thereof |
| CN104913853A (en) * | 2014-03-12 | 2015-09-16 | 中国科学院光电研究院 | Method and system for measuring ultra-intense ultra-short laser prepulses |
| CN104913853B (en) * | 2014-03-12 | 2018-08-14 | 中国科学院光电研究院 | Method and system for measuring ultra-short intense laser prepulsing |
| CN106908829A (en) * | 2017-04-17 | 2017-06-30 | 中国工程物理研究院激光聚变研究中心 | A kind of sequential diagnosis system practiced shooting for nanosecond and picosecond laser Shu Lianhe |
| CN106908829B (en) * | 2017-04-17 | 2023-04-18 | 中国工程物理研究院激光聚变研究中心 | Time sequence diagnosis system for nanosecond and picosecond laser beam combined targeting |
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