CN109632113A - Contrast single-shot measuring device - Google Patents
Contrast single-shot measuring device Download PDFInfo
- Publication number
- CN109632113A CN109632113A CN201910011927.8A CN201910011927A CN109632113A CN 109632113 A CN109632113 A CN 109632113A CN 201910011927 A CN201910011927 A CN 201910011927A CN 109632113 A CN109632113 A CN 109632113A
- Authority
- CN
- China
- Prior art keywords
- light
- reflecting mirror
- contrast
- sampling
- incident
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005070 sampling Methods 0.000 claims abstract description 27
- 239000013078 crystal Substances 0.000 claims abstract description 13
- 238000000034 method Methods 0.000 claims abstract description 12
- 230000009021 linear effect Effects 0.000 claims abstract description 8
- 238000013519 translation Methods 0.000 claims abstract description 7
- 238000001914 filtration Methods 0.000 claims abstract description 6
- 230000003595 spectral effect Effects 0.000 claims abstract description 6
- 238000003384 imaging method Methods 0.000 claims abstract description 5
- 230000000694 effects Effects 0.000 claims description 10
- 230000003287 optical effect Effects 0.000 claims description 8
- 238000002156 mixing Methods 0.000 claims description 6
- 238000005388 cross polarization Methods 0.000 claims description 5
- 238000005259 measurement Methods 0.000 abstract description 9
- 230000002123 temporal effect Effects 0.000 abstract 1
- 230000003993 interaction Effects 0.000 description 4
- 230000003321 amplification Effects 0.000 description 2
- 238000003199 nucleic acid amplification method Methods 0.000 description 2
- 239000013307 optical fiber Substances 0.000 description 2
- 230000001133 acceleration Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000001427 coherent effect Effects 0.000 description 1
- 239000000571 coke Substances 0.000 description 1
- 239000003599 detergent Substances 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 230000004927 fusion Effects 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J11/00—Measuring the characteristics of individual optical pulses or of optical pulse trains
Abstract
A kind of contrast single-shot measuring device generates structure, the first reflecting mirror, the first beam expander, the first cylindrical focusing element, second order nonlinear crystal, the second reflecting mirror, the third reflecting mirror and the 4th reflecting mirror, the 5th reflecting mirror, the second beam expander, the second cylindrical focusing element, bar shaped attenuator, imaging len, spectral filtering piece and sCMOS camera being placed on translation stage including wedge-shaped beam splitting chip, high contrast sampling light.The present invention has compact-sized and economical and practical, and sampling light is obtained based on third-order non-linear process, contrast Gao Genggao, thus measurement result is more acurrate；Simultaneously as the acquisition device using sCMOS as cross-correlated signal light, the temporal resolution of measurement is higher.
Description
Technical field
The present invention relates to contrast fields of measurement, in high energy laser pulse, especially bat watt laser pulse representational field
There are important application prospect, specifically a kind of contrast single-shot measuring device.
Technical background
With the development of chirped pulse amplification technique and Studies of Optical Parametric Chirped Pulse Amplification, the peak value of laser pulse
Power is higher and higher, and in conjunction with Adaptable System, the focus strength of laser pulse can achieve 1021W/cm2More than, it is this high-strength
The laser pulse of degree is generated in particle acceleration, x-ray and there is important application in the fields such as inertial confinement fusion.With peak work
The promotion of rate, this parameter of the contrast of pulse become extremely important.Due to the presence of ASE, the small-pulse effect of pulse front edge may
It can shift to an earlier date and matter interaction forms plasma to influence main pulse and the interaction of substance.In order to preferably study
Influence of the laser pulse contrast to laser target interaction Physical Experiment it may first have to that laser pulse can accurately be measured
Contrast, thus contrast ration measurement very it is important.
At present for the laser system of high repetition frequency, three rank cross-correlation instrument of scan-type is common device, and
Commercialization, but three rank cross-correlation instrument of scan-type generally requires many hundreds or even thousands of hair laser pulses and could complete once to survey
Amount, very time-consuming, and for current high energy laser device, usually all it is the low-repetition-frequency state that operates in, uses
Three rank cross-correlation instrument of scan-type is more unrealistic, thus must have the contrast measuring device of single shot mode；In addition to this, second order
The sampling light pulse detergent power that non-linear process obtains is limited, may will affect measurement accuracy, it is necessary to further increase.
For single-shot contrast measuring device, the sampling light that a contrast is higher than light to be measured is first had to, it is existing frequently-used
Method be to be generated based on optical parametric amplifier, but result in device to become very complicated in this way；Although frequency multiplication can also obtain
The sampling of high contrast is closed, but such that cross-correlated signal light be in ultraviolet wave-length coverage, is unfavorable for cross-correlation and is believed
The acquisition of number light；After obtaining high contrast sampling light, samples light and light to be measured and intersecting phase interaction with wide-angle in frequency crystal
With intensity distribution of the cross-correlated signal light obtained in space can characterize the contrast information of light to be measured, mutual for this
The acquisition of coherent signal luminous intensity needs the two-dimensional array using high dynamic range, and common method at this stage is using optical fiber array
Column acquisition cross-correlated signal light, is transmitted to photomultiplier tube and receives analytic intensity information, since the bore of optical fiber is relatively large, this
The resolution ratio for allowing for data acquisition is smaller.
Summary of the invention
In order to enable the sampling light of contrast single-shot measuring device is easier to obtain and contrast is high, cross-correlated signal light
Acquisition is more simple and resolution ratio is higher, obtains cross-correlated signal light using third-order non-linear process, then uses pixel
Member only has the sCMOS of micron dimension to carry out data acquisition, and entire single-shot contrast measuring device is simple and compact, high resolution,
Dynamic range is high.
The technical solution of the invention patent is as follows:
A kind of contrast single-shot measuring device, composition include: wedge-shaped beam splitting chip, high contrast sampling light generate structure,
First reflecting mirror, the first cylindrical focusing element, second order nonlinear crystal, the second reflecting mirror, is placed on translation stage the first beam expander
Third reflecting mirror and the 4th reflecting mirror, the 5th reflecting mirror, the second beam expander, the second cylindrical focusing element, bar shaped attenuator, at
As lens, spectral filtering piece and sCMOS camera.
Incident light is after wedge-shaped beam splitting chip, and incident light is divided into reflected light and transmitted light, in the light of the transmitted light
Road sets gradually high contrast sampling light and generates structure, the first reflecting mirror, the first beam expander, the first cylindrical focusing element, institute
Transmitted light is stated finally to be incident in one piece of second order nonlinear crystal through the first cylindrical focusing element focusing；The high comparison
Degree sampling light generates structure can be based on third-order non-linears mistakes such as self-diffraction effect, the generation of cross polarization wave and cascade four-wave mixings
The sampling light of journey generation high-energy high contrast；The second reflecting mirror is set gradually in the optical path of the reflected light, is placed in translation
The 5th reflecting mirror of third reflecting mirror and the 4th reflecting mirror on platform, the second beam expander, the second cylindrical focusing element are then also incident
It is overlapped into the second order nonlinear crystal and with the reflected light, the third reflecting mirror and the 4th reflecting mirror are located at described put down
Time delay line is constituted in moving stage；When the incident light and the transmitted light are overlapped on time and space, it is based on second order
With frequency effect cross-correlated signal light can be generated in the second order nonlinear crystal；The cross-correlated signal light passes sequentially through bar shaped
Attenuator, imaging len and spectral filtering piece are ultimately incident upon a sCMOS camera.
The high contrast sampling light, which generates structure, can be generated and be cascaded four based on self-diffraction effect, cross polarization wave
The sampling light of the third-order non-linears process such as wave mixing generation high-energy high contrast.
The sampling light be based on third-order non-linear process obtain, such as self-diffraction effect, cross polarization wave generate and
Four-wave mixing is cascaded, it is the cube of light to be measured that sampling optical contrast ratio is very high.
For the sCMOS camera as data acquisition device, pixel element size is small, the high resolution of DATA REASONING.
Compared with prior art, the beneficial effects of the present invention are:
The present apparatus obtains sampling light using third-order non-linear process, and it is the cube of incident light that contrast is higher, is avoided that
The generation of cross-correlation procedure measurement error, and device is simpler compact；
The present apparatus acquires the intensity of cross-correlated signal light using sCMOS, and resolution ratio is more high.
Detailed description of the invention
Fig. 1 is the index path of contrast single-shot measuring device of the present invention
Fig. 2 is the figure on sCMOS camera of contrast single-shot measuring device of the present invention cross-correlated signal light obtained
Piece
Fig. 3 is contrast single-shot measuring device contrast measurement result of the present invention
Specific embodiment
Following further describes the present invention with reference to the drawings, but should not be limited the scope of the invention with this.
As shown in Figure 1, the 800nm being emitted by Ti:Sapphire laser amplifier, 1KHz, 40fs laser pulse, by one piece be arranged on main optical path
Wedge-shaped beam splitting chip, incident light are divided into reflected light and transmitted light, are incident on sampling light generating device in the transmitted light, at this
It is the sampling light for the 830nm that the effect based on cascade four-wave mixing obtains central wavelength in specific example, it is micro- that energy is greater than 100
Coke, the sampling light continue through the first cylinder of the first reflecting mirror and two times of beam expanders and a focal length 200mm
Reflecting mirror, focusing are incident in the second order nonlinear crystal BBO of one piece of thickness 1.5mm；The reflected light successively passes through second,
Three, four, five reflecting mirrors, the two or two times of beam expander, then second focal length 200mm cylindrical mirror be also incident on the second order
It is overlapped in nonlinear crystal BBO and with the sampling light, the third, four reflecting mirrors composition time on a translation stage prolongs
Slow line；The incident light and the sampling light are adjusted when being overlapped on time and space, based on second order and frequency effect described
Cross-correlated signal light can be generated in second order nonlinear crystal BBO；The cross-correlated signal light passes sequentially through bar shaped attenuator, 4f
Imaging len, the spectral filtering piece of cutoff frequency 700nm are ultimately incident upon a sCMOS camera, and the picture on camera is shown
As shown in Fig. 2, the pictorial information of acquisition is summed the intensity value of each pixel in vertical direction, and remove ambient noise, so that it may
To recover the contrast information of light to be measured, the result recovered is shown as shown in phantom in Figure 3, for confirmatory measurement result
Accuracy, we have used commercial three rank cross-correlation instrument of scan-type to measure the contrast of light to be measured simultaneously, such as solid line in Fig. 3
It is shown, it is seen that two groups of measurement results meet fine in regular hour window, it was demonstrated that our single-shot measuring device
Accuracy.
Claims (3)
1. a kind of contrast single-shot measuring device is characterized in that its composition includes: wedge-shaped beam splitting chip (1), high contrast sampling light
Generate structure (2), the first reflecting mirror (3), the first beam expander (4), the first cylindrical focusing element (5), second order nonlinear crystal
(6), the second reflecting mirror (7), the third reflecting mirror (8) and the 4th reflecting mirror (9), the 5th reflecting mirror that are placed on translation stage (10)
(11), the second beam expander (12), the second cylindrical focusing element (13), bar shaped attenuator (14), imaging len (15), spectral filtering
Piece (16) and sCMOS camera (17)
Incident light is after wedge-shaped beam splitting chip (1), and incident light is divided into reflected light and transmitted light, in the optical path of the transmitted light
On set gradually high contrast sampling light generate structure (2), the first reflecting mirror (3), the first beam expander (4), the first cylindrical focusing
Element (5), the transmitted light finally focus through the first cylindrical focusing element (5) and are incident on one piece of second order nonlinear crystal
(6) in；The high contrast sampling light, which generates structure, can be generated and be cascaded four waves based on self-diffraction effect, cross polarization wave
The third-order non-linears processes such as mixing generate the sampling light of high-energy high contrast；Is set gradually in the optical path of the reflected light
Two-mirror (7), the third reflecting mirror (8) being placed on translation stage (10) and the 4th reflecting mirror (9), the 5th reflecting mirror (11), the
Two beam expanders (12), the second cylindrical focusing element (13), be then also incident in the second order nonlinear crystal (6) and with it is described
Reflected light coincidence, the third reflecting mirror (8) and the 4th reflecting mirror (9), which are located on the translation stage (10), constitutes time delay
Line；It, can be described two based on second order and frequency effect when the incident light and the transmitted light are overlapped on time and space
Rank nonlinear crystal (6) generates cross-correlated signal light；The cross-correlated signal light passes sequentially through bar shaped attenuator (14), imaging
Lens (15) and spectral filtering piece (16) are ultimately incident upon a sCMOS camera (17).
2. contrast single-shot measuring device according to claim 1 is characterized in that used sampling light is based on three ranks
Non-linear process obtains, and if self-diffraction effect, cross polarization wave generate and cascade four-wave mixing, sampling optical contrast ratio is very high, is
The cube of light to be measured.
3. contrast single-shot measuring device according to claim 1 is characterized in that sCMOS camera is used to acquire as data
Device, pixel element size is small, the high resolution of DATA REASONING.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910011927.8A CN109632113A (en) | 2019-01-07 | 2019-01-07 | Contrast single-shot measuring device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910011927.8A CN109632113A (en) | 2019-01-07 | 2019-01-07 | Contrast single-shot measuring device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN109632113A true CN109632113A (en) | 2019-04-16 |
Family
ID=66058132
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201910011927.8A Pending CN109632113A (en) | 2019-01-07 | 2019-01-07 | Contrast single-shot measuring device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN109632113A (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110514308A (en) * | 2019-08-28 | 2019-11-29 | 中国科学院上海光学精密机械研究所 | Low noise cross-correlation instrument for laser pulse contrast measurement |
| CN110530533A (en) * | 2019-08-27 | 2019-12-03 | 中国科学院上海光学精密机械研究所 | Quadravalence autocorrelation function analyzer for laser pulse contrast measurement |
| CN111220285A (en) * | 2020-01-20 | 2020-06-02 | 中国科学院上海光学精密机械研究所 | Time-spectrum coding laser pulse time domain contrast single shot measuring device and method |
| CN113049119A (en) * | 2021-03-08 | 2021-06-29 | 中国科学院上海光学精密机械研究所 | Contrast single-shot measuring instrument for obtaining sampling light based on cross polarized wave generation |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101034012A (en) * | 2007-02-13 | 2007-09-12 | 中国科学院上海光学精密机械研究所 | Third order correlation measuring instrument |
| WO2018029615A1 (en) * | 2016-08-10 | 2018-02-15 | Sphere Ultrafast Photonics, S.A. | Ultrashort laser pulse characterization and compression method |
| CN207487831U (en) * | 2017-12-11 | 2018-06-12 | 中国工程物理研究院激光聚变研究中心 | Single ultrashort laser pulse width of measuring device |
| CN109100029A (en) * | 2018-09-05 | 2018-12-28 | 中国科学院上海光学精密机械研究所 | Femto-second laser pulse Time And Space Parameters single-shot measuring device |
-
2019
- 2019-01-07 CN CN201910011927.8A patent/CN109632113A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101034012A (en) * | 2007-02-13 | 2007-09-12 | 中国科学院上海光学精密机械研究所 | Third order correlation measuring instrument |
| WO2018029615A1 (en) * | 2016-08-10 | 2018-02-15 | Sphere Ultrafast Photonics, S.A. | Ultrashort laser pulse characterization and compression method |
| CN207487831U (en) * | 2017-12-11 | 2018-06-12 | 中国工程物理研究院激光聚变研究中心 | Single ultrashort laser pulse width of measuring device |
| CN109100029A (en) * | 2018-09-05 | 2018-12-28 | 中国科学院上海光学精密机械研究所 | Femto-second laser pulse Time And Space Parameters single-shot measuring device |
Non-Patent Citations (1)
| Title |
|---|
| PENG WANG, ET AL.: "Generation of high-energy clean multicolored ultrashort pulses and their application in single-shot temporal contrast measurement", 《ARXIV:1901.00281》 * |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110530533A (en) * | 2019-08-27 | 2019-12-03 | 中国科学院上海光学精密机械研究所 | Quadravalence autocorrelation function analyzer for laser pulse contrast measurement |
| CN110514308A (en) * | 2019-08-28 | 2019-11-29 | 中国科学院上海光学精密机械研究所 | Low noise cross-correlation instrument for laser pulse contrast measurement |
| CN111220285A (en) * | 2020-01-20 | 2020-06-02 | 中国科学院上海光学精密机械研究所 | Time-spectrum coding laser pulse time domain contrast single shot measuring device and method |
| CN113049119A (en) * | 2021-03-08 | 2021-06-29 | 中国科学院上海光学精密机械研究所 | Contrast single-shot measuring instrument for obtaining sampling light based on cross polarized wave generation |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN109632113A (en) | Contrast single-shot measuring device | |
| US5754292A (en) | Method and apparatus for measuring the intensity and phase of an ultrashort light pulse | |
| US6504612B2 (en) | Electromagnetic wave analyzer | |
| CN104697649B (en) | Single-shot laser pulse detection device | |
| CN102426062B (en) | Quasi-phase-matching-based laser pulse high-fidelity signal-to-noise ratio single measurement device | |
| Faccio et al. | A trillion frames per second: the techniques and applications of light-in-flight photography | |
| CN102175334B (en) | Pulse signal noise ratio (SNR) single shot measurement device based on anharmonic wave long wavelength sampling light | |
| CN107421910B (en) | Terahertz strong field system of ultrashort pulse pump based on wave surface inclination method | |
| CN107063480B (en) | Based on four-wave mixing scan-type ultrashort laser pulse time domain contrast measuring instrument | |
| CN103063315A (en) | Once signal to noise ratio measuring method and device based on chirp pulse feature | |
| Wang et al. | Single-shot fourth-order autocorrelator | |
| CN111443062A (en) | Ultrafast detection device and method for transient refractive index of semiconductor material | |
| CN109540304A (en) | A kind of ultrashort laser pulse measuring device based on frequency resolved optical gating | |
| JP5165278B2 (en) | Beam measuring apparatus, beam measuring method, and pump / probe measuring method using the same | |
| Ma et al. | Single-shot cross-correlator for pulse-contrast characterization of high peak-power lasers | |
| CN112782135A (en) | Femtosecond angle resolution spectral imaging method based on transient Kerr effect | |
| CN109900359B (en) | High dynamic range signal-to-noise ratio measuring device of ultrashort pulse | |
| CN110530533A (en) | Quadravalence autocorrelation function analyzer for laser pulse contrast measurement | |
| CN100554942C (en) | Eliminate the nonlinear refraction character measuring method of non-linear absorption influence | |
| CN203216616U (en) | Single-time signal-to-noise ratio measurement device based on chirped pulse character | |
| Grachev et al. | An open-source 3d-printed terahertz pulse time-domain holographic detection module for broadband beam inspection | |
| CN104697648B (en) | Single-shot laser pulse detection device based on optical fiber transmission framework | |
| CN220399276U (en) | Single-shot terahertz time-domain spectrometer | |
| CN111413709A (en) | Target imaging method and device based on spiral spectrum | |
| Hornung et al. | Synchronized off-harmonic probe laser with highly variable pulse duration for laser–plasma interaction experiments |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20190416 |
|
| RJ01 | Rejection of invention patent application after publication |