CN110455837B - Femtosecond laser driven directional ultrafast X-ray framing imaging device and application - Google Patents

Femtosecond laser driven directional ultrafast X-ray framing imaging device and application Download PDF

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CN110455837B
CN110455837B CN201910841360.7A CN201910841360A CN110455837B CN 110455837 B CN110455837 B CN 110455837B CN 201910841360 A CN201910841360 A CN 201910841360A CN 110455837 B CN110455837 B CN 110455837B
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femtosecond laser
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CN110455837A (en
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王进光
陈黎明
李毅飞
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Institute of Physics of CAS
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Abstract

The invention provides a femtosecond laser driven directional ultrafast X-ray framing imaging device, which comprises: the high-power titanium gem femtosecond laser, a pumping beam line, an ultrafast event sample, n X-ray probe beam lines and an X-ray imaging plate also provide application thereof. The device generates an ultra-short X-ray sequence with the same time sequence by utilizing the interaction of time-sequenced femtosecond laser pulses and a gas target, the X-ray sequence irradiates ultra-fast events in sequence, transient image signals of the ultra-fast events are read, and single imaging recording of a non-repeatable ultra-fast process requiring sub-picosecond time resolution can be realized. The device uses a circumferentially symmetrical non-coaxial framing imaging design scheme, and the viewing angle difference of non-coaxial imaging is reduced to the maximum extent.

Description

Femtosecond laser driven directional ultrafast X-ray framing imaging device and application
Technical Field
The invention relates to the field of ultrafast X-ray imaging, in particular to a femtosecond laser driven directional ultrafast X-ray framing imaging device and application.
Background
In the research in the fields of physics, chemistry, and biology, it is often necessary to precisely image a certain process at very short time intervals to reveal the dynamic rules of the processes and control them. Different ultrafast processes have different time characteristics, so the requirements on time resolution are different, such as fracture and collision processes require sub-millisecond time resolution, excitation processes of explosion, shock wave and the like require sub-microsecond time resolution, protein folding processes and the like in organisms require nanosecond time resolution, and decay and migration of phonons in solids, phase-resolving time in liquid, molecular vibration relaxation and other processes require picosecond-level time resolution; the processes of molecular structure dynamics, primary reaction of photosynthesis and the like require femtosecond time resolution, and the motion of high-energy ions and heat-energy electrons, the motion of molecular valence electrons and the electron dynamics in an atom shell layer even need attosecond time resolution. These ultrafast processes are mainly classified into two types: one type is a cycle repeatability event and the other type is a single, non-repeatable event. The process of recurrent periodic events can be recorded by using a high-time-resolution pump-probe technique, only one time point is recorded for each imaging, and the whole process of the occurrence of the event is recorded for multiple times by adjusting the time delay between the pump and the probe. For a single time and a single time, an ultrafast framing imaging scheme can be adopted, at present, ultrafast framing imaging means for an X-ray wave band are limited, and the main limitation is from two aspects: on one hand, an ultrafast X-ray light source with time serialization is lacked, on the other hand, for coaxially transmitted framing images, the response speed of an imaging instrument limits the framing frequency, and currently, X-ray imaging equipment basically operates in a single-frame mode.
Disclosure of Invention
Therefore, the present invention is directed to overcome the defects in the prior art, and to provide a femtosecond laser driven directional ultrafast X-ray framing imaging apparatus and an application thereof.
To achieve the above object, a first aspect of the present invention provides a femtosecond laser driven directional ultrafast X-ray framing imaging apparatus, the apparatus comprising: the system comprises a high-power titanium gem femtosecond laser, a pumping beam line, an ultrafast event sample, n X-ray probe beam lines and an X-ray imaging plate;
wherein n is more than or equal to 3, preferably 6, and the n X-ray probe beam lines are used for generating n hard X-rays which are collimated and directionally propagated, and the propagation paths of the n X-rays are converged at one point in space and sequentially pass through the point at adjustable time intervals.
Apparatus according to the first aspect of the invention, wherein the pump beam line comprises a beam splitter and a focusing lens;
preferably, the beam splitter is a mirror, preferably a 45 degree mirror;
more preferably, the focal point of the focusing lens and the ultrafast event sample are located at a spatial intersection of the n X-rays.
Apparatus according to the first aspect of the present invention, wherein each X-ray probe beam line comprises a beam splitter, a retarder, a focusing means and an ultrasonic jet system;
preferably, the beam splitter is a mirror, preferably a 45 degree mirror.
The apparatus according to the first aspect of the present invention, wherein said X-ray probe beam line, said time delay is arranged behind a beam splitter;
preferably, the retarder consists of four 45-degree total reflection mirrors and an electric displacement table and is used for adjusting the optical path of the femtosecond laser pulse taken out by the beam splitter, wherein the two total reflection mirrors can move along with the electric displacement table.
The apparatus according to the first aspect of the present invention, wherein said focusing means is arranged after a retarder in said X-ray probe beam line;
preferably, the focusing device is an off-axis parabolic mirror;
more preferably, the off-axis parabolic mirror has an effective focal length of 500mm, a caliber of 3 inches, an off-axis angle of 30 degrees, and an aluminum substrate plated with a gold film; and/or the n off-axis parabolic mirrors are arranged in a circumferential array, and the extension lines of the emergent axes of all the off-axis parabolic mirrors intersect at one point in space, so that the generated directional X-rays intersect at the point.
The apparatus according to the first aspect of the invention, wherein the ultrasonic painting system is arranged at the focus of the femtosecond laser pulses.
Apparatus according to the first aspect of the invention, wherein the X-ray imaging plate is disposed downstream of the ultrafast event sample;
preferably, the distance between the X-ray imaging plate and the ultrafast time sample is 0.1-1 m, preferably 0.3-0.8 m, and most preferably 0.5 m.
The device according to the first aspect of the present invention, wherein the high power titanium sapphire femtosecond laser uses a chirped pulse amplification technology to generate a super laser pulse with a center wavelength of 800nm, a single pulse energy of 6J, a pulse width of 30fs, and a peak power of not less than 200 TW.
The second aspect of the invention provides a femtosecond laser driven directional ultrafast X-ray framing imaging system, which comprises the femtosecond laser driven directional X-ray framing imaging device of the first aspect.
The third aspect of the invention provides the application of the femtosecond laser driven directional ultrafast X-ray framing imaging device in the preparation of ultrafast process recording equipment; preferably, the ultrafast process is a single, non-repeatable event.
The invention relates to a system for carrying out transient imaging on an ultrafast event by utilizing picosecond-level time resolution micron-level space resolution ultrafast X-rays, aims to solve the technical bottleneck of ultrafast framing imaging of an X-ray wave band, provides a femtosecond laser-driven ultrafast X-ray framing imaging device, and aims to solve the problem that the prior art cannot carry out ultrafast framing imaging on non-periodically repeated transient events in the X-ray wave band.
In order to achieve the above object, the present invention provides a real-time ultrafast X-ray framing imaging apparatus, comprising: the high-power titanium gem femtosecond laser device comprises a pumping beam line, an ultrafast event sample, n (n is more than or equal to 3) X-ray probe beam lines and an X-ray imaging plate.
The high-power titanium sapphire femtosecond laser is used for generating femtosecond laser pulses required by a pumping beam line and a probe beam line, mainly adopts a chirped pulse amplification technology, and can generate super-strong laser pulses with the central wavelength of 800nm, the single pulse energy of about 6J, the pulse width of 30fs and the peak power of not less than 200TW, such as a Pulsar200 laser produced by Amplified in France.
The pumping beam line is mainly used for exciting an ultrafast event and comprises a beam splitter and a focusing lens. The beam splitter is a 2-inch 45-degree elliptical reflector used to extract 2-inch diameter femtosecond laser pulses in the main optical path. The ultrafast event is focused by femtosecond laser pulses and then acts on a sample to be tested to be excited, and the time evolution scale of the ultrafast event is nanosecond or picosecond magnitude. The focus of the focusing lens and the sample to be measured are positioned at the spatial intersection of the n X-rays.
The n X-ray probe beam lines are mainly used for generating n hard X-rays which are collimated and directionally propagated, and the propagation paths of the n X-rays are converged at a certain point in space and sequentially pass through the point at an adjustable time interval. Each X-ray probe beam line comprises a beam splitter, a delayer, a focusing device and an ultrasonic air injection system. The beam splitter is a 2-inch 45-degree elliptical reflector used to extract 2-inch diameter femtosecond laser pulses in the main optical path. The delayer is used for adjusting the optical path of the femtosecond laser pulse taken out by the beam splitter 2 and consists of four 45-degree total reflection mirrors and an electric displacement platform, wherein the two total reflection mirrors can move along with the electric displacement platform. The time delay device is arranged behind the beam splitter. The focusing device is used for focusing femtosecond laser pulses to 10-micron magnitude, so that the light intensity after focusing is larger than that of the femtosecond laser pulses, the focusing device mainly refers to off-axis parabolic mirrors, the effective focal length of each off-axis parabolic mirror is 500mm, the caliber of each off-axis parabolic mirror is 3 inches, the off-axis angle of each off-axis parabolic mirror is 30 degrees, an aluminum substrate is plated with a gold film, n off-axis parabolic mirrors are contained in n X-ray probe wire bundles and are distributed in a circumferential array mode, the extension lines of the emergent axes of all the off-axis parabolic mirrors intersect at one point in space, and the generated directional X rays can. The focusing device is placed behind the delayer. The ultrasonic jet system can produce a gas profile with sharp boundary before the laser pulse arrives, the gas profile interacts with femtosecond laser to generate a directional X-ray pulse which has a pulse width of femtosecond magnitude and photon energy of tens of KeV and can be imaged singly, and the generation principle of the X-ray pulse is as follows: the femtosecond laser pulse interacts with the low-density gas target, the laser drives a tail wave field to accelerate electrons, and meanwhile, the electron beam transversely oscillates and radiates X rays, and the process is called Betatron radiation. An ultrasonic gas jet system is placed at the focus of the femtosecond laser pulses.
The X-ray imaging plate is an IP plate (image plate) produced by the American general company, the X-ray imaging principle of the invention is absorption imaging, X-rays passing through an ultrafast event at different moments carry density distribution information of the ultrafast event at the moment, and the information can be recorded by the X-ray imaging plate. An X-ray imaging plate was placed 0.5m downstream of the sample.
The device of the present invention may have, but is not limited to, the following beneficial effects:
1. the ultra-short X-ray sequence with the same time sequence is generated by the interaction of the time-sequenced femtosecond laser pulse and the gas target, the ultra-fast event is irradiated by the X-ray sequence in sequence, the transient image signal of the ultra-fast event is read, and the single imaging record of the unrepeatable ultra-fast process requiring sub-picosecond time resolution can be realized.
2. And the view angle difference of non-coaxial imaging is reduced to the maximum extent by using a circumferentially symmetrical non-coaxial framing imaging design scheme.
Drawings
Embodiments of the invention are described in detail below with reference to the attached drawing figures, wherein:
fig. 1 shows a schematic diagram of a femtosecond laser driven directional X-ray framing imaging apparatus according to the present invention in embodiment 1.
Fig. 2 shows 7 femtosecond laser pulses intercepted by the beam splitter in experimental example 1.
Fig. 3 shows a 3D layout in experimental example 1.
Fig. 4 shows the imaging results recorded by the imaging plate in experimental example 1.
Description of reference numerals:
100. a high power titanium gem femtosecond laser; 201. a beam splitter 1; 202. femtosecond laser pulses 1; 203. a reflector 1; 204. a reflector 2; 205. a focusing lens; 206. an ultrafast event sample; 311/321 … … 3n1(n is more than or equal to 3), a beam splitter 2; 312/322/332/342/352/362 … … 3n2(n is more than or equal to 3), femtosecond laser pulse 2; 313/323 … … 3n3(n is more than or equal to 3) and a delayer; 314/324/334 … … 3n4(n is more than or equal to 3), femtosecond laser pulse 3; 315/325/335/345/355/365 … … 3n5(n is more than or equal to 3) and an off-axis parabolic mirror; 316/326 … … 3n6(n is more than or equal to 3) and a supersonic jet system; 317/327/337/347/357/367 … … 3n7(n is more than or equal to 3), a focus; 318/328/338/348/358/368 … … 3n8(n is more than or equal to 3), ultrafast X-ray; 400. an imaging plate.
Detailed Description
The invention is further illustrated by the following specific examples, which, however, are to be construed as merely illustrative, and not limitative of the remainder of the disclosure in any way whatsoever.
This section generally describes the materials used in the testing of the present invention, as well as the testing methods. Although many materials and methods of operation are known in the art for the purpose of carrying out the invention, the invention is nevertheless described herein in as detail as possible. It will be apparent to those skilled in the art that the materials and methods of operation used in the present invention are well within the skill of the art, provided that they are not specifically illustrated.
The reagents and instrumentation used in the following examples are as follows:
materials:
imaging plate, available from general company, usa.
The instrument comprises the following steps:
high power titanium sapphire femtosecond laser, available from Amplite, France, model number Pulsar 200.
Example 1
This embodiment is used to illustrate the structure of the femtosecond laser driven directional ultrafast X-ray frame imaging apparatus according to the present invention.
The invention mainly utilizes the interaction of time-sequenced femtosecond laser pulses and a gas target to generate an ultra-short X-ray pulse string with the same time sequence, the X-ray pulse string sequentially irradiates an ultra-fast event, reads a transient image signal of the ultra-fast event, and then an imaging plate records image information.
Fig. 1 shows a schematic diagram of the present invention. A real-time ultrafast X-ray framing imaging apparatus, comprising: a high power titanium sapphire femtosecond laser 100; a pump beam line, the pump beam line comprising: a beam splitter 201, mirrors 203, 204, a focusing lens 205, an ultrafast event sample 206; n (n is more than or equal to 3) X-ray probe beam lines, wherein each X-ray probe beam line comprises: a beam splitter 3n1, a delayer 3n3, an off-axis parabolic mirror 3n5 and an ultrasonic air injection system 3n 6; x-ray imaging plate 400.
The ultrastrong femtosecond laser pulse generated by the high-power titanium sapphire femtosecond laser 100 is firstly divided into a femtosecond laser pulse 202 with the diameter of 2 inches by a beam splitter 201, the femtosecond laser pulse 202 is transmitted by a reflecting mirror 203 and a reflecting mirror 204 and then focused on a sample through a lens 205 to excite an ultrafast event 206, and the focal point of the lens 205 and the sample are located at the spatial intersection of n beams of X rays. Then, the ultrastrong femtosecond laser pulse generated by the high-power titanium sapphire femtosecond laser 100 is sequentially split into n femtosecond laser pulses 312/322 … 3n2 with the diameter of 2 inches by the beam splitter 311/321 … 3n1, the femtosecond laser pulses 312/322 … 3n2 are sent to the corresponding delayers 313/323 … 3n3, the time delay between every two pulses is adjusted according to actual requirements, a non-coaxial transmission femtosecond laser pulse sequence with a certain time interval is formed, and the femtosecond laser pulse sequence comprises n femtosecond laser pulses 314/324 … 3n 4. Then the femtosecond laser pulses 314/324 … 3n4 are focused by the corresponding off-axis parabolic mirrors 315/325 … 3n5, respectively, interact with the gas sprayed out by the supersonic jet system 316/326 … 3n6 at the focus 317/327 … 3n7 to generate ultrafast X-rays 318/328 … 3n8, and then sequentially pass through the ultrafast event 206 and are imaged on the imaging plate 400.
Test example 1
The test example is used for explaining the detection process of the over-time by the femtosecond laser driven directional ultrafast X-ray framing imaging device.
The inventors will detect ultrafast events with 6 (n-6) X-ray probes at 1ps intervals.
First, it is necessary to generate 7 beams of 2 inch diameter femtosecond laser pulses through a beam splitter, 1 beam as a pump to excite ultrafast events, and another 6 beams to interact with gas to generate X-rays. As shown in fig. 2, the beam splitting is mainly to use a 2-inch 45-degree elliptical reflector as the beam splitter 201/311/321/331/341/351/361 to cut 7 2-inch femtosecond laser pulses 202/312/322/332/342/352/362 from the super-intense femtosecond laser pulses generated by the high-power titanium-sapphire femtosecond laser 100. The femtosecond laser pulses 202 pass through mirrors and are focused by a lens 205 onto the sample to excite ultrafast events 206. The femtosecond laser pulses 312/322/332/342/352/362 pass through respective corresponding delays 313/323/333/343/353/363, and then the time delays between the 7 beam pulses are adjusted using the delays 313/323/333/343/353/363. The femtosecond laser pulses 202/312/322/332/342/352/362 were sequenced through at the junction 206 with time intervals of 1ps each. The femtosecond laser pulses with the adjusted time intervals are incident to the corresponding off-axis parabolic mirrors 315/325/335/345/355/365 for focusing, the off-axis parabolic mirrors are aluminum substrates plated with gold films, the off-axis angle is 30 degrees, the effective focal length is 500mm, the off-axis parabolic mirrors are distributed in a circumferential array with the diameter of 1m, and a plane formed by an incident axis and an emergent axis passes through the circle center of the circumferential array, so that all laser axes intersect at one point in the emergent direction of the off-axis parabolic mirrors at 1m, namely, the ultrafast event sample 206 is located.
The femtosecond laser pulses will interact with the gas ejected by supersonic jet system 316/326/336/346/356/366 at focal point 317/327/337/347/357/367 to generate ultrafast X-rays 318/328/338/348/358/368, which in turn pass through ultrafast event sample 206 before being imaged on imaging plate 400. The evolution process of the ultrafast events recorded on the imaging plate 400 is shown in fig. 4.
Although the present invention has been described to a certain extent, it is apparent that appropriate changes in the respective conditions may be made without departing from the spirit and scope of the present invention. It is to be understood that the invention is not limited to the described embodiments, but is to be accorded the scope consistent with the claims, including equivalents of each element described.

Claims (65)

1. A femtosecond laser driven directional ultrafast X-ray framing imaging apparatus, the apparatus comprising: the system comprises a high-power titanium gem femtosecond laser, a pumping beam line, an ultrafast event sample, n X-ray probe beam lines and an X-ray imaging plate;
the n is more than or equal to 3, the n X-ray probe beam lines are used for generating n hard X-rays which are collimated and directionally propagated, and the propagation paths of the n X-rays are converged at one point in the space and sequentially pass through the point at an adjustable time interval.
2. The apparatus of claim 1, wherein n is 6.
3. The apparatus of claim 1 or 2, wherein the pump beam line comprises a beam splitter and a focusing lens.
4. The apparatus of claim 3, wherein the beam splitter is a mirror.
5. The apparatus of claim 4, wherein the beam splitter is a 45 degree mirror.
6. The apparatus of claim 4 or 5, wherein the focal point of the focusing lens and the ultrafast event sample are located at a spatial intersection of the n X-rays.
7. The apparatus of claim 3, wherein each of said X-ray probe beam lines comprises a beam splitter, a retarder, a focusing device, and an ultrasonic jet system.
8. The apparatus of claim 4 or 5, wherein each of said X-ray probe beam lines comprises a beam splitter, a retarder, a focusing device and an ultrasonic jet system.
9. The apparatus of claim 6, wherein each of said X-ray probe beam lines comprises a beam splitter, a retarder, a focusing device, and an ultrasonic jet system.
10. The apparatus of claim 7, wherein the beam splitter is a mirror.
11. The apparatus of claim 8, wherein the beam splitter is a mirror.
12. The apparatus of claim 9, wherein the beam splitter is a mirror.
13. The apparatus of any one of claims 10 to 12, wherein the beam splitter is a 45 degree mirror.
14. The apparatus according to any of claims 7 and 9 to 12, wherein the delay is arranged after the beam splitter in the X-ray probe beam line.
15. The apparatus of claim 8, wherein the delay is positioned after the beam splitter in the X-ray probe beam line.
16. The apparatus of claim 13, wherein the delay is positioned after the beam splitter in the X-ray probe beam line.
17. The apparatus of claim 14, wherein the delay device comprises four total reflection mirrors of 45 degrees and an electric displacement stage for adjusting the optical path of the femtosecond laser pulse extracted by the beam splitter, wherein the two total reflection mirrors are movable with the electric displacement stage.
18. The apparatus of claim 15 or 16, wherein the delay device comprises four total reflection mirrors of 45 degrees and an electric displacement stage for adjusting the optical path of the femtosecond laser pulse extracted by the beam splitter, wherein the two total reflection mirrors are movable with the electric displacement stage.
19. The apparatus of any of claims 7, 9 to 12, 15 to 17, wherein the focusing means is disposed after a retarder in the X-ray probe beam line.
20. The apparatus of claim 8, wherein said focusing means is disposed after a retarder in said X-ray probe beam line.
21. The apparatus of claim 13, wherein said focusing means is disposed after a retarder in said X-ray probe beam line.
22. The apparatus of claim 14, wherein said focusing means is disposed after a retarder in said X-ray probe beam line.
23. The apparatus of claim 18, wherein said focusing means is disposed after a retarder in said X-ray probe beam line.
24. The apparatus of claim 19, wherein the focusing means is an off-axis parabolic mirror.
25. The apparatus of any one of claims 20 to 24, wherein the focusing means is an off-axis parabolic mirror.
26. The apparatus of claim 24, wherein the off-axis parabolic mirror has an effective focal length of 500mm, a 3 inch aperture, an off-axis angle of 30 degrees, an aluminum substrate plated with gold; and/or the n off-axis parabolic mirrors are arranged in a circumferential array, and the extension lines of the emergent axes of all the off-axis parabolic mirrors intersect at one point in space, so that the generated directional X-rays intersect at the point.
27. The apparatus of claim 25, wherein the off-axis parabolic mirror has an effective focal length of 500mm, a 3 inch aperture, an off-axis angle of 30 degrees, an aluminum substrate plated with gold; and/or the n off-axis parabolic mirrors are arranged in a circumferential array, and the extension lines of the emergent axes of all the off-axis parabolic mirrors intersect at one point in space, so that the generated directional X-rays intersect at the point.
28. The apparatus of any one of claims 7, 9 to 12, 15 to 17, 20 to 24, 26 to 27, wherein the ultrasonic jet system is disposed at a focal point of a femtosecond laser pulse.
29. The apparatus of claim 8, wherein the ultrasonic gas jet system is disposed at a focal point of a femtosecond laser pulse.
30. The apparatus of claim 13, wherein the ultrasonic gas jet system is disposed at a focal point of a femtosecond laser pulse.
31. The apparatus of claim 14, wherein the ultrasonic gas jet system is disposed at a focal point of a femtosecond laser pulse.
32. The apparatus of claim 18, wherein the ultrasonic gas jet system is disposed at a focal point of a femtosecond laser pulse.
33. The apparatus of claim 19, wherein the ultrasonic gas jet system is disposed at a focal point of a femtosecond laser pulse.
34. The apparatus of claim 25, wherein the ultrasonic gas jet system is disposed at a focal point of a femtosecond laser pulse.
35. The apparatus of any one of claims 1-2, 4-5, 7, 9-12, 15-17, 20-24, 26-27, 29-34, wherein the X-ray imaging plate is disposed downstream of the ultrafast event sample.
36. The apparatus of claim 3, wherein the X-ray imaging plate is disposed downstream of the ultrafast event sample.
37. The apparatus of claim 6, wherein the X-ray imaging plate is disposed downstream of the ultrafast event sample.
38. The apparatus of claim 8, wherein the X-ray imaging plate is disposed downstream of the ultrafast event sample.
39. The apparatus of claim 13, wherein the X-ray imaging plate is disposed downstream of the ultrafast event sample.
40. The apparatus of claim 14, wherein the X-ray imaging plate is disposed downstream of the ultrafast event sample.
41. The apparatus of claim 18, wherein the X-ray imaging plate is disposed downstream of the ultrafast event sample.
42. The apparatus of claim 19, wherein the X-ray imaging plate is disposed downstream of the ultrafast event sample.
43. The apparatus of claim 25, wherein the X-ray imaging plate is disposed downstream of the ultrafast event sample.
44. The apparatus of claim 28, wherein the X-ray imaging plate is disposed downstream of the ultrafast event sample.
45. The apparatus of claim 35, wherein the distance between the X-ray imaging plate and the ultrafast event sample is 0.1-1 m.
46. The apparatus of any one of claims 36 to 44, wherein the distance between the X-ray imaging plate and the ultrafast event sample is 0.1-1 m.
47. The apparatus of claim 45, wherein the distance between the X-ray imaging plate and the ultrafast event sample is 0.3-0.8 m.
48. The apparatus of claim 46, wherein the distance between the X-ray imaging plate and the ultrafast event sample is 0.3-0.8 m.
49. The apparatus of claim 47 wherein the X-ray imaging plate is 0.5m from the ultrafast event sample.
50. The apparatus of claim 48 wherein the X-ray imaging plate is 0.5m from the ultrafast event sample.
51. The apparatus according to any one of claims 1 to 2, 4 to 5, 7, 9 to 12, 15 to 17, 20 to 24, 26 to 27, 29 to 34, 36 to 45, and 47 to 50, wherein the high power titanium sapphire femtosecond laser employs a chirped pulse amplification technique to generate ultrastrong laser pulses with a center wavelength of 800nm, a single pulse energy of 6J, a pulse width of 30fs, and a peak power of not less than 200 TW.
52. The apparatus of claim 3, wherein the high power titanium sapphire femtosecond laser uses a chirped pulse amplification technique to generate ultrastrong laser pulses with a center wavelength of 800nm, a single pulse energy of 6J, a pulse width of 30fs, and a peak power of not less than 200 TW.
53. The device of claim 6, wherein the high power titanium sapphire femtosecond laser uses a chirped pulse amplification technology to generate super-strong laser pulses with a center wavelength of 800nm, a single pulse energy of 6J, a pulse width of 30fs, and a peak power of not less than 200 TW.
54. The apparatus of claim 8, wherein the high power titanium sapphire femtosecond laser uses chirped pulse amplification technology to generate ultrastrong laser pulses with a center wavelength of 800nm, a single pulse energy of 6J, a pulse width of 30fs, and a peak power of not less than 200 TW.
55. The apparatus of claim 13, wherein the high power titanium sapphire femtosecond laser uses chirped pulse amplification technology to generate ultrastrong laser pulses with a center wavelength of 800nm, a single pulse energy of 6J, a pulse width of 30fs, and a peak power of not less than 200 TW.
56. The apparatus of claim 14, wherein the high power titanium sapphire femtosecond laser employs chirped pulse amplification technology to generate ultrastrong laser pulses with a center wavelength of 800nm, a single pulse energy of 6J, a pulse width of 30fs, and a peak power of not less than 200 TW.
57. The apparatus of claim 18, wherein the high power titanium sapphire femtosecond laser employs chirped pulse amplification technology to generate ultrastrong laser pulses with a center wavelength of 800nm, a single pulse energy of 6J, a pulse width of 30fs, and a peak power of not less than 200 TW.
58. The apparatus of claim 19, wherein the high power titanium sapphire femtosecond laser employs chirped pulse amplification technology to generate ultrastrong laser pulses with a center wavelength of 800nm, a single pulse energy of 6J, a pulse width of 30fs, and a peak power of not less than 200 TW.
59. The apparatus of claim 25, wherein the high power titanium sapphire femtosecond laser uses chirped pulse amplification technology to generate ultrastrong laser pulses with a center wavelength of 800nm, a single pulse energy of 6J, a pulse width of 30fs, and a peak power of not less than 200 TW.
60. The apparatus of claim 28, wherein the high power titanium sapphire femtosecond laser uses chirped pulse amplification technology to generate ultrastrong laser pulses with a center wavelength of 800nm, a single pulse energy of 6J, a pulse width of 30fs, and a peak power of not less than 200 TW.
61. The apparatus of claim 35, wherein the high power titanium sapphire femtosecond laser uses chirped pulse amplification technology to generate ultrastrong laser pulses with a center wavelength of 800nm, a single pulse energy of 6J, a pulse width of 30fs, and a peak power of not less than 200 TW.
62. The apparatus of claim 46, wherein the high power titanium sapphire femtosecond laser uses chirped pulse amplification technology to generate ultrastrong laser pulses with a center wavelength of 800nm, a single pulse energy of 6J, a pulse width of 30fs, and a peak power of not less than 200 TW.
63. A femtosecond laser driven directional ultrafast X-ray framing imaging system, comprising the femtosecond laser driven directional X-ray framing imaging apparatus according to any one of claims 1 to 62.
64. Use of the femtosecond laser driven directional ultrafast X-ray frame imaging apparatus as set forth in any one of claims 1 to 62 for preparing an ultrafast process recording device.
65. The use of claim 64, wherein the ultrafast process is a single, non-repeatable event.
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