CN111443101A - Direct comparison system for different crystal X-ray diffraction efficiencies - Google Patents
Direct comparison system for different crystal X-ray diffraction efficiencies Download PDFInfo
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- CN111443101A CN111443101A CN202010273067.8A CN202010273067A CN111443101A CN 111443101 A CN111443101 A CN 111443101A CN 202010273067 A CN202010273067 A CN 202010273067A CN 111443101 A CN111443101 A CN 111443101A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
Abstract
The invention provides a direct comparison system for different crystal X-ray diffraction efficiencies, which comprises a light source, an aiming joint, a cavity, an optical window, a plurality of paths of optical path systems containing different crystals and recording equipment, wherein each path of optical path system comprises a diaphragm and a crystal; the light window is arranged on the side surface of one end of the cavity, so that light rays can conveniently enter the cavity, and the light source and the aiming joint are positioned outside the cavity; the multi-path light path system and the recording equipment are arranged in the cavity. The direct comparison system for the X-ray diffraction efficiency of different crystals adopts the same light source, ensures the consistency of incident light spectrum signals of a multi-light path system, adopts the same recording equipment to respond, ensures the consistency of equipment response functions, can detect various different crystals simultaneously, improves the detection efficiency, and can save targeting resources by recording the detection result by the same recording equipment. Therefore, the invention can realize direct contrast detection of different crystal X-ray diffraction efficiencies, is not limited by complex application scenes, and has wide and important application prospects.
Description
Technical Field
The invention belongs to the field of X-ray detection, and particularly relates to a direct comparison system for different crystal X-ray diffraction efficiencies.
Background
In the relevant fields of inertial confinement fusion, high energy density physics, celestial body physics and the like, X-ray spectral emission is generated by interaction of laser and substances. The X-ray spectral emission comprises various physical processes such as excitation, de-excitation, recombination and the like caused by respective interaction between electrons and ions, between electrons and between ions. Through high-energy spectrum resolution measurement of physical processes such as plasma emission, X-ray pump fluorescence, X-ray Thomson scattering and the like, relevant line spectrum wavelength (energy) and intensity, characteristic line characteristics, line spectrum intensity ratio, line spectrum broadening, line spectrum movement and the like can be obtained, and material state parameters such as electron temperature, electron density, ionization degree, ionization distribution and the like of the plasma are further obtained. X-ray spectral diagnosis is a crucial problem in relevant experimental research. For various X-ray spectrum diagnostic devices, a light splitting element is a key part, a crystal is the most common light splitting element, and the diffraction efficiency is an important characteristic quantity of the diffraction capability of the crystal, so that measurement and comparison of the X-ray diffraction efficiency of different crystals are required.
At present, the system for measuring the X-ray diffraction efficiency of different crystals can only detect the diffraction efficiency of one crystal at a time, and the diffraction efficiency of different crystals needs to be measured for many times and then compared, and the measurement and comparison method has the following defects: 1. because the incident light of different crystals is a light source with different emission times, unpredictable differences exist between every emission time of the light source, the consistency of the incident light of different crystals is difficult to ensure, and natural defects exist on the test source head when the diffraction efficiency of different crystals is detected; 2. the recording device is used for recording detection results, and the efficiency of each response of the recording device is different, which causes large errors of the detection results of different crystal diffraction efficiencies; 3. in the traditional mode, only one crystal can be detected at a time, and target resources are consumed once every time measurement is carried out, so that the efficiency of the experimental method is low and the target resources are seriously wasted.
Disclosure of Invention
In view of the above, the present invention provides a direct comparison system for different crystal X-ray diffraction efficiencies with high precision, high efficiency and resource saving.
In order to achieve the purpose, the invention adopts the following technical scheme: a direct comparison system for different crystal X-ray diffraction efficiencies is characterized by comprising a light source, an aiming joint, a cavity, a multi-path light path system, a recording device and an optical window; the light window is arranged on the side surface of the cavity; the light source is arranged outside the cavity on one side close to the light window; the aiming joint is fixedly connected with the cavity outside the cavity; the multi-path light path systems are arranged in parallel in the cavity; the recording device is placed at one end, far away from the optical window, in the cavity.
Preferably, each of the multiple optical path systems includes a diaphragm and a crystal, and the center of the light source is respectively aligned with the center of the diaphragm and the center of the crystal in each of the multiple optical path systems.
Preferably, the crystal of each optical path system in the multi-optical path system is different from the crystal of the other optical path system, and the crystal type in each optical path system is any one of a planar crystal, a tapered crystal, and a cylindrical crystal.
Preferably, the number of the optical paths of the multi-path optical path system is greater than or equal to 2.
Preferably, the recording device is an online recording device based on a large area array CMOS, and the recording surface of the online recording device is perpendicular to the crystal surface in each optical path system.
Preferably, the width of the limiting hole of the diaphragm in each path of optical path system is less than 20 microns.
Preferably, the light source is a planar target light source emitting by a line spectrum, and the wavelength of the X-ray generated by the light source and the lattice constant 2d of the crystal in each path of optical path system satisfy a bragg diffraction relationship.
Preferably, the display mode of the aiming section is that the light source image is displayed in a digitalized online manner, and the axis of the aiming section is aligned with the center of the light source.
Preferably, the cavity is made of aluminum material and is subjected to anti-oxidation treatment.
The invention has the beneficial effects that: incident light sources of different crystals are the same light source, so that the consistency of incident light spectrum signals of a multi-light path system is ensured, and unnecessary errors introduced at a test source are avoided; diffraction signals of different crystals in the multi-path optical path system are simultaneously responded by the same recording equipment, so that the consistency of response functions of the recording equipment is ensured; the system can detect various different crystals simultaneously, improves the detection efficiency, and can save the target resources by using the same recording equipment to record the detection results of various different crystals.
Drawings
FIG. 1 is a schematic diagram of a direct comparison system of X-ray diffraction efficiencies of different crystals according to the present invention;
in the figure, 1, a light source 2, an aiming joint 3, a cavity 4, a diaphragm I5, a diaphragm II 6, a planar crystal 7, a variable cone crystal 8, an optical path system I9, an optical path system II 10, a recording device 11 and an optical window.
Detailed Description
The invention is described in detail below with reference to the figures and specific embodiments.
Fig. 1 is a schematic diagram of a direct comparison system for different crystal X-ray diffraction efficiencies according to the present invention, and a direct comparison system for different crystal X-ray diffraction efficiencies is characterized in that the system includes a light source 1, an aiming joint 2, a cavity 3, a multi-path optical path system, a recording device 10, and an optical window 11; the light window 11 is arranged on the side face of one end of the cavity, so that light rays can enter the cavity conveniently; the light source 1 is arranged outside the cavity 3 at one side close to the light window 11; the aiming joint 2 is fixedly connected with the cavity 3 outside the cavity 3; the multi-path light path systems are arranged in parallel in the cavity; the recording device 10 is placed inside the cavity at an end remote from the optical window.
Each path of optical path system in the multi-path optical path system comprises a diaphragm and a crystal, and the center of the light source 1 is respectively on the same straight line with the center of the diaphragm and the center of the crystal in each path of optical path system.
The crystal type of each optical path system in the multi-path optical path system is different from the crystal type of the other optical path systems, and the crystal in each optical path system is any one of a plane crystal, a variable cone crystal and a cylindrical crystal.
The number of the light paths of the multi-path light path system is more than or equal to 2, and the size of the cavity 3 and the size of the target surface of the recording equipment 10 can be correspondingly adjusted along with the increase and decrease of the number of the light path systems.
The recording device 10 is an on-line recording device based on a large area array CMOS, and the recording surface thereof is perpendicular to the crystal surface in each optical path system.
The aiming joint 2 fixedly connected to the outside of the cavity 3 determines the reference of the X-ray diffraction system, and the cavity is used for shielding stray light and fragments generated by target shooting; during the experiment, firstly, the X-ray emitted by the light source 1 passes through the light window 11 on the cavity, then passes through the adjustable diaphragm in the open state in each path of light path system, and is incident to the crystal surface in the corresponding light path system, then the X-ray can be diffracted on the crystal surface, the crystal can reflect the X-ray with the same reflection angle as the incidence angle, and finally the reflected X-ray is incident to the surface of the recording device 10, so that the corresponding electronic components respond, thereby forming a digital signal, and then the diffraction efficiencies of the two crystals can be directly compared.
The diaphragm in each path of optical path system is prepared by tantalum sheets, the thickness is 20 micrometers, and the width of each limiting hole is smaller than 20 micrometers.
The light source 1 is a plane target light source emitting line spectrum, which is common in the research of laser plasma interaction, and the wavelength of the X-ray generated by the light source 1 and the lattice constant 2d of the crystal in each path of light path system respectively satisfy the Bragg diffraction relationship.
The display mode of the aiming section 2 is light source image digital on-line display, which is convenient for the real-time aiming, adjustment and resetting of the whole system, and the aiming section is provided with an automatic light barrier which can protect the lens and the CCD of the aiming section, and the axis of the aiming section and the center of the light source 1 are on the same straight line.
The cavity 3 is made of aluminum material and is subjected to anti-oxidation treatment.
Example 1
The invention is successfully applied to the Shenguang III prototype large-scale laser device. In this embodiment, the light source 1 is an X-ray source laser intensity 200J × 4 generated by striking a titanium planar target with four beams of laser, the focal spot size is 250 micrometers, the size of the titanium planar target is 2000 × 2000 micrometers, the thickness is 100 micrometers, and the generated line spectra of titanium-like H and He-like are 4.97keV and 4.75keV, respectively; the aiming joint 2 is provided with an automatic light blocking sheet, and can realize the protection function of a lens and a CCD; the size of the cavity 3 is 40 × 20 cm, and the thickness of the aluminum material on the side surface and the top surface is 0.5 cm; the two limiting aperture diaphragms I4 and II5 are tantalum sheets with the thickness of 20 microns, and the width of the limiting aperture is less than 20 microns; the crystal is selected from a planar crystal 6 and a tapered crystal 7, wherein the planar crystal 6 is SiO2A material having a lattice constant 2d of 0.4246 nm; the variable cone crystal 7 adopts SiO2The material has a lattice constant 2d of 0.4246nm and a curvature radius of 9.4-12.4 cm; the diaphragm I4 and the plane crystal 6 form an optical path system II9, and the diaphragm II5 and the tapered crystal 7 form an optical path system I8; the recording device 10 is a large area array CMOS with a size of 5 x 10 cm and has an on-line recording function.
Firstly, off-line calibration (refer to fig. 1), wherein under an off-line condition, a diaphragm I4, a diaphragm II5, a planar crystal 6, a tapered crystal 7, a recording device 10, a sighting node 2 and the like are arranged at corresponding positions of a cavity, off-line light path simulation and collimation are carried out, the relative position of a target and the diagnosis device is recorded by adopting a simulation target, and the relative position is stored in a sighting node 2 system; then, on-line aiming is carried out, the direct comparison system for the X-ray diffraction efficiency of different crystals is placed in an experimental light path, and collimation and calibration are carried out on the system and a targeting system by utilizing the light source coordinate position recorded in the off-line aiming process, so that the position of a light source 1 is positioned at the position of an initial simulation target pill; recording signals, and recording time-integrated X-ray diffraction signals of different crystal pairs by adopting a large-area array online CMOS recording device 10; and finally, data processing, namely calibrating the wavelength position by combining a Fresnel formula according to the relation between the spectral wavelength and the distance to obtain H-like and He-like line spectrum diffraction distribution information of different crystals to titanium, and finally directly comparing diffraction line spectrum signals corresponding to different crystals.
In the embodiment, one recording device is used for recording X-ray images of the planar crystal and the tapered crystal diffraction, the X-ray diffraction signal obtained by the tapered crystal optical path system is far stronger than that obtained by the planar crystal optical path system through comparison, the direct contrast value of different crystal X-ray diffraction efficiencies is directly obtained through the test, and meanwhile, the two crystal diffraction spectrum images are recorded on the same recording target surface, so that the consistency of the response function of the recording device is ensured, and half of target practice resources are saved.
Example 2
The structure of this example is the same as that of example 1, except that the experimental site is an X-ray diffraction laboratory, the light source 1 is a titanium X-ray tube, the applied voltage is 10kV, the generated titanium line spectra are K α and K β line spectra, and the energy points are 4.511keV and 4.933keV, respectively.
It will be appreciated by those of ordinary skill in the art that the embodiments described herein are intended to assist the reader in understanding the principles of the invention and are to be construed as being without limitation to such specifically recited embodiments and examples. Those skilled in the art can make various other specific changes and combinations based on the teachings of the present invention without departing from the spirit of the invention, and these changes and combinations are within the scope of the invention.
Claims (10)
1. A direct comparison system for different crystal X-ray diffraction efficiencies is characterized by comprising a light source (1), an aiming joint (2), a cavity (3), a multi-path light path system, a recording device (10) and an optical window (11); the optical window (11) is arranged on the side face of the cavity (3), the light source (1) is arranged outside the cavity (3) close to one side of the optical window (11), the aiming joint (2) is fixedly connected with the cavity (3) outside the cavity (3), the multi-light-path system is arranged in parallel inside the cavity, and the recording equipment (10) is arranged at one end, far away from the optical window, inside the cavity.
2. The direct comparison system for different crystal X-ray diffraction efficiencies of claim 1, wherein each of the multiple optical path systems comprises a diaphragm and a crystal, and the center of the light source (1) is aligned with the center of the diaphragm and the center of the crystal in each optical path system.
3. The direct comparison system for different crystal X-ray diffraction efficiencies of claim 2, wherein the crystal type in each optical path system is different from the crystal type in the other optical path systems, and the crystal in each optical path system is any one of a planar crystal, a tapered crystal, and a cylindrical crystal.
4. The direct comparison system for different crystal X-ray diffraction efficiencies of claim 1, wherein the number of optical paths of the multi-path optical system is greater than or equal to 2.
5. The direct comparison system for different crystal X-ray diffraction efficiencies of claim 2, wherein the recording device (10) is an on-line recording device based on a large area array CMOS, and the recording surface is perpendicular to the crystal surface in each optical path system.
6. The direct comparison system for different crystal X-ray diffraction efficiencies of claim 2, wherein the aperture stop in each optical path system has a limiting aperture width of less than 20 microns.
7. The direct comparison system for different crystal X-ray diffraction efficiencies of claim 1, wherein the light source (1) is a planar target light source emitting in a line spectrum.
8. The direct comparison system for different crystal X-ray diffraction efficiencies of claim 2, wherein the wavelength of the X-ray generated by the light source (1) and the lattice constant 2d of the crystal in each optical path system respectively satisfy bragg diffraction relationship.
9. The direct comparison system for different crystal X-ray diffraction efficiencies of claim 1, wherein the aiming segment (2) is displayed in a way that the light source image is displayed in a digitalized online way, and the axis of the aiming segment is aligned with the center of the light source (1).
10. The direct comparison system for different crystal X-ray diffraction efficiencies of claim 1, wherein the cavity (3) is made of aluminum material and is subjected to oxidation-preventing treatment.
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN113030139A (en) * | 2021-05-31 | 2021-06-25 | 中国工程物理研究院激光聚变研究中心 | Novel crystal and compact imaging device |
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| CN108254391A (en) * | 2018-01-29 | 2018-07-06 | 中国工程物理研究院激光聚变研究中心 | Flexure crystal detection method and device |
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| CN103389315A (en) * | 2013-08-14 | 2013-11-13 | 中国工程物理研究院流体物理研究所 | Transient X-ray diffraction experiment method and special positioning bracket thereof |
| CN106707327A (en) * | 2017-01-11 | 2017-05-24 | 中国工程物理研究院激光聚变研究中心 | X-ray imaging device aiming device and adjustment and calibration method and application method thereof |
| CN108254391A (en) * | 2018-01-29 | 2018-07-06 | 中国工程物理研究院激光聚变研究中心 | Flexure crystal detection method and device |
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| CN113030139A (en) * | 2021-05-31 | 2021-06-25 | 中国工程物理研究院激光聚变研究中心 | Novel crystal and compact imaging device |
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