CN106885986B - Dynamic parameter extraction device and method for power converter switch - Google Patents
Dynamic parameter extraction device and method for power converter switch Download PDFInfo
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- CN106885986B CN106885986B CN201710235166.5A CN201710235166A CN106885986B CN 106885986 B CN106885986 B CN 106885986B CN 201710235166 A CN201710235166 A CN 201710235166A CN 106885986 B CN106885986 B CN 106885986B
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Abstract
The invention discloses a power converter switch dynamic parameter extraction device which comprises a hardware test platform, a data acquisition module, a controller, an upper computer and a data post-processing module. The invention also discloses a method for extracting the dynamic parameters of the power converter switch, which is used for testing by using the device for extracting the dynamic parameters of the power converter switch. The device has high degree of automation and easy operation, can rapidly and accurately extract the electric parameters of the power device switching transient process, is used for guiding the reliability design of the power converter, and is used for analyzing the change rule of related parameters in the power device decay process so as to evaluate the health condition of the power converter.
Description
Technical Field
The invention relates to a power converter switch dynamic parameter extraction device and an extraction method, and belongs to the field of application of power electronics in a power system.
Background
In the new energy conversion system, a key part affecting reliability is a power converter device, and a power device is not only a core element in the device, but also one of the weakest elements. Therefore, the design and operation maintenance of the power converter taking the reliability as the guide have important significance for ensuring the safe and stable operation of the new energy power generation system.
In the life cycle of a semiconductor device, the reliability of the semiconductor device is influenced by various internal and external factors, and multiple physical field couplings such as electricity, heat, machinery and the like exist, so that the failure of the semiconductor device can be electromagnetic transient failure or aging failure caused by the accumulation of thermal fatigue damage depending on time. Reliability oriented current transformer designs are aimed at reducing the probability of both failure modes.
Electromagnetic transient failure is mainly caused by high temperature and electric stress in the device, and the electric stress is related to the design of a converter loop, a driving loop and a radiator, so that the design stage of the converter needs to pay attention to whether parameters related to the electric stress (such as a turn-off voltage peak, an on reverse recovery current, a change rate of the voltage and the current, a junction temperature of a power device, a temperature of the radiator and the like) are in a safe and stable region of the system, and the electric heating parameters can be obtained through measurement and data post-processing.
The power device depends on aging failure of time, relevant electric heating parameters (such as saturation voltage drop vce, threshold voltage vgeth, thermal impedance Zth and the like) can be correspondingly changed in the degradation process, and in order to reduce irregular maintenance cost, shutdown loss and the like caused by the aging failure of the power converter, the change rule of relevant electric parameters in the aging process of the IGBT device needs to be deeply researched, and the relevant electric parameters of the power converter in the operation process are tested and analyzed.
Disclosure of Invention
The invention aims to overcome the defects of the prior art, and provides a dynamic parameter extraction device for a power converter switch, which has high automation degree and easy operation, can rapidly and accurately extract the electric parameters of the power device switch transient process, is used for guiding the reliability design of the power converter, and is used for analyzing the change rule of related parameters in the power device decay process so as to evaluate the health condition of the power converter.
Another object of the present invention is to provide a method for extracting a dynamic parameter of a switch of a power converter, which uses the device for extracting a dynamic parameter of a switch of a power converter to extract a dynamic parameter of a switch.
The technical scheme for achieving the purposes is as follows: the dynamic parameter extraction device of the power converter switch comprises a hardware test platform, a data acquisition module, a controller, an upper computer and a data post-processing module;
the hardware testing platform comprises a transformer, a rectifier, a capacitor, a charging resistor, a hardware testing platform, an energy discharging resistor, a laminated busbar, a power device and a heating plate; the transformer, the rectifier, the charging resistor and the relay are sequentially connected in series and then used as power input of the capacitor, the capacitor and the power device are respectively arranged on the laminated busbar, and the energy discharging resistor is connected with the capacitor in parallel;
the power device is fixed on the heating plate through heat conduction silicone grease, and the heating plate is connected with a temperature controller;
the data acquisition module comprises a data acquisition device and an oscilloscope, wherein the data acquisition device acquires current and voltage data and uploads the current and voltage data to the oscilloscope and the upper computer;
the controller is used for receiving the instruction of the upper computer and issuing a trigger pulse instruction and a locking instruction to the power device through the optical fiber;
the upper computer is used for controlling the instruction layer and transmitting the test conditions to the controller through the communication interface; transmitting the sampling conditions to the data collector and the oscilloscope through a communication interface;
the data post-processing module is used for finishing post-processing operation of current and voltage data and extracting switching dynamic parameters of the power device, wherein the switching dynamic parameters comprise switching time, on-current overshoot, off-voltage and switching loss.
The power converter switch dynamic parameter extraction device, wherein the controller adopts a DSP controller; the upper computer adopts a LabVIEW upper computer; the data post-processing module adopts a data post-processing GUI (Graphical User Interface, GUI for short, also called graphic user interface) interface.
The power converter switch dynamic parameter extraction device is characterized in that alternating current is sequentially boosted by the transformer, uncontrollably rectified by the rectifier, then is connected in series with the charging resistor and the relay to be used as power input of the capacitor, the capacitor and the power device are respectively arranged on the laminated busbar, the energy release resistor is connected with the capacitor in parallel to release energy of the capacitor; the heating plate is controlled by the temperature controller to be maintained at a set temperature.
The power converter switch dynamic parameter extraction device, the data acquisition device comprises a current probe and a current probe, wherein:
the current probe collects collector current data and uploads the collector current data to the oscilloscope and the upper computer;
the voltage probe collects collector-emitter voltage data, diode voltage data, gate driving voltage data and auxiliary voltage data, and all collected voltage data are uploaded to the oscilloscope and the upper computer.
The method for extracting the dynamic parameters of the switch of the power converter comprises the following steps of:
s1, mounting a test module to the laminated busbar, clamping a test probe on a terminal to be tested, checking a test loop, and ensuring that a control line and a power line are isolated from a heating plate;
s2, checking whether a short circuit point exists on a connecting line of the hardware test platform, and then checking whether a communication line, a driving power supply line and a computer of the DSP controller are correctly connected with an oscilloscope;
s3, opening a LabVIEW upper computer in the computer, then closing an auxiliary power supply main switch of the hardware test platform, and sequentially closing an oscilloscope, a controller and a driving power supply switch;
s4, adjusting the temperature controller to a temperature point to be tested, and closing a temperature power switch of the temperature controller;
s5, operating a LabVIEW main interface, inputting test information, clicking to start a test, and entering an oscilloscope and a parameter setting interface;
s6, setting a test temperature, a test voltage and a test current in a test condition input field, and then setting sampling conditions in an oscilloscope setting field;
s7, after the main power air switch is closed, double pulse testing is automatically completed, and oscilloscope data are automatically transmitted to a computer;
and S8, operating a data post-processing GUI interface of the MATLAB, automatically importing the acquired current and voltage data, and calculating the switching dynamic parameters of the power device.
The power converter switch dynamic parameter extraction device and the power converter switch dynamic parameter extraction method can measure the dynamic parameters of the switching process of a power device system, extract the electric parameters capable of reflecting the health condition of the power device, and further evaluate the reliability of the system, so as to solve the problem that the existing engineering technology cannot reflect the running health condition of the power device due to insufficient parameter extraction, ensure the reliable and stable running of the whole power converter system, and also guide the reliability design of the converter.
Compared with the prior art, the power converter switch dynamic parameter extraction device and the power converter switch dynamic parameter extraction method have the beneficial effects that:
1. the extraction device provided by the invention has the advantages of high automation degree, simplicity, easiness in operation and friendly interface, and the power devices are arranged on the laminated busbar terminals, so that the switching dynamic parameters of a plurality of power devices can be measured;
2. the extraction device provided by the invention can further extract the electric parameters capable of reflecting the health condition of the power device on the basis of the measurement of the dynamic parameters of the switch, and can be used for reliability evaluation;
3. the extraction device provided by the invention extracts the parasitic parameters of the converter loop in an integral form of the variable of the electric parameter at a certain stage in the switching process, and has higher accuracy compared with the prior art;
4. the extraction device provided by the invention can be used for simply and easily extracting the dynamic parameters related to the temperature, and can be used for junction temperature evaluation of the power device.
Drawings
FIG. 1 is a block diagram of a power converter switch dynamic parameter extraction device of the present invention;
fig. 2a is a test circuit diagram of a hardware test platform of the power converter switch dynamic parameter extraction device;
fig. 2b is a test timing diagram of a hardware test platform of the power converter switch dynamic parameter extraction device;
FIG. 3a is a graph showing the relationship between IGBT turn-off loss and current and temperature;
FIG. 3b is a plot of IGBT turn-on loss versus current and temperature;
FIG. 4a is a graph showing the relationship between IGBT turn-off time and current and temperature;
fig. 4b is a graph of IGBT turn-on time versus current and temperature.
Detailed Description
In order to enable those skilled in the art to better understand the technical scheme of the present invention, the following detailed description is provided with reference to the accompanying drawings:
referring to fig. 1, an embodiment of the invention provides a dynamic parameter extraction device for a power converter switch, which comprises a hardware test platform 1, a data acquisition module 2, a controller 3, an upper computer 4 and a data post-processing module 5. The controller 3 adopts a DSP controller; the upper computer 4 adopts a LabVIEW upper computer; the data post-processing module 5 employs a data post-processing GUI interface.
The hardware test platform 1 comprises a transformer, a rectifier, a capacitor, a charging resistor, a hardware test platform, an energy discharging resistor, a laminated busbar, a power device and a heating plate; the transformer, the rectifier, the charging resistor and the relay are sequentially connected in series and then used as power input of the capacitor, the capacitor and the power device are respectively arranged on the laminated busbar, and the energy release resistor is connected with the capacitor in parallel; the power device is fixed on the heating plate through heat conduction silicone grease, and the heating plate is connected with a temperature controller.
The data acquisition module 2 comprises a data acquisition device and an oscilloscope, wherein the data acquisition device acquires current and voltage data and uploads the current and voltage data to the oscilloscope and the LabVIEW upper computer 4;
the controller 3 is used for receiving the instruction of the LabVIEW upper computer 4 and issuing a trigger pulse instruction and a locking instruction to the power device through the optical fiber; the LabVIEW upper computer 4 is used for transmitting test conditions to the controller through a communication interface as a control instruction layer; transmitting the sampling conditions to the data collector and the oscilloscope through a communication interface; and the data post-processing module 5 is used for finishing post-processing operation of the current and voltage data and extracting the switching dynamic parameters of the power device, including switching time, on-current overshoot, off-voltage and switching loss.
The alternating current is sequentially boosted by the transformer, subjected to uncontrollable rectification by the rectifier, connected in series with the charging resistor and the relay to serve as power input of the capacitor, the capacitor and the power device are respectively arranged on the laminated busbar, the energy discharging resistor is connected with the capacitor in parallel, and energy of the capacitor is released; the heating plate is controlled by a temperature controller to be maintained at a set temperature.
The data acquisition device comprises a current probe and a current probe, wherein the current probe acquires collector current data i c And collecting the collector current data i c Uploading to the oscilloscope and the upper computer; the voltage probe collects collector-emitter voltage data V ce Diode voltage data V D Gate drive voltage data V ge And auxiliary voltage data V eE And uploading all collected voltage data to the oscilloscope and the upper computer.
Referring to fig. 2a and 2b, a hardware testing platform 1, which adopts a typical double pulse testing circuit to test the switching dynamic waveform of a power device, wherein the test object is a lower tube IGBT and an upper tube diode, includes the steps of:
(1)0～t 1 : at time t=0, the IGBT to be tested is turned on, the bus charges the inductor L through the IGBT, and the inductor current I L Linearly rise to t 1 Moment inductor current I L Rising to a specified test value I 1 ；
(2)t 1 ～t 2 ：t 1 At moment, the IGBT to be tested is turned off, the waveforms of turn-off parameters such as turn-off voltage and current of the IGBT can be captured, and the inductance current I L Freewheeling by upper diode until t 2 The IGBT is turned on again at the moment;
(3)t 2 ～t 3 ：t 2 at the moment, the IGBT is conducted again, and the on parameter waveforms of the IGBT such as the on voltage, the current and the like can be captured. When the load inductance is sufficiently large, it can be considered that the IGBT is turned on at this time 2 Equal to t 1 Current value I turned off at the moment 1 The method comprises the steps of carrying out a first treatment on the surface of the At this stage, the load current I L Continue to rise until t 3 At the moment when the current is I 3 ；
(4)t 3 After that: t is t 3 At the moment, IGBT is turned off again, and inductance current I L Freewheeling is performed through the upper diode D until the current drops to zero, and the single double pulse test period is ended.
The switching time sequences of the upper bridge arm power device and the lower bridge arm power device related in the steps (1) - (4) are sent out by the DSP digital controller, and a control instruction is sourced from an upper computer;
collector currents i of upper and lower arm power devices involved in the steps (1) - (4) above c Collector-emitter voltage V ce Diode voltage V D And gate drive voltage V ge The isoelectric parameters are obtained by a voltage and current probe and automatically uploaded to an oscilloscope and an upper computer;
and (3) uploading the switching dynamic electric parameter data related in the steps (1) - (4) to an upper computer, and then carrying out data post-processing through GUI interface operation, wherein switching dynamic parameters including switching time, switching-on current overshoot, switching-off voltage spike, switching loss of a power device, saturation voltage drop under high current, switching Miller platform voltage and the like are extracted.
The IGBT device to be tested is an Infineon FF400R33KF2C module, and in the embodiment, the relevant parameters of the hardware test platform are shown in table 1:
| parameters (parameters) | Value taking |
| DC bus voltage | 2000V |
| DC side capacitor | 15000μF |
| Double pulse experimental current | ≤3600A |
| Filtering inductance | 320μH |
| Test temperature T j Range | Room temperature to 125 DEG C |
TABLE 1
The test procedure was carried out strictly according to the test procedure described below.
A power converter switch dynamic parameter extraction method comprises the following steps:
s1, mounting a test module to the laminated busbar, clamping a test probe on a terminal to be tested, checking a test loop, and ensuring that a control line and a power line are isolated from a heating plate;
s2, checking whether a short circuit point exists on a connecting line of the hardware test platform, and then checking whether a communication line, a driving power supply line and a computer of the controller are correctly connected with an oscilloscope;
s3, opening an upper computer in the computer, then closing an auxiliary power supply main switch of the hardware test platform, and sequentially closing an oscilloscope, a controller and a driving power supply switch;
s4, adjusting the temperature controller to a temperature point to be tested, and closing a temperature power switch of the temperature controller;
s5, operating a LabVIEW main interface, inputting test information, clicking to start a test, and entering an oscilloscope and a parameter setting interface;
s6, setting a test temperature, a test voltage, a test current and the like in a test condition input field, and then setting sampling conditions in an oscilloscope setting field;
s7, after the main power air switch is closed, double pulse testing is automatically completed, and oscilloscope data are automatically transmitted to a computer;
and S8, operating a data post-processing module of MATLAB, automatically importing the acquired current and voltage data and calculating the switching dynamic parameters of the power device.
Referring to fig. 3a, fig. 3b, fig. 4a, and fig. 4b, which are graphs of IGBT switching loss, switching time, current, and temperature, it can be known from the trend of variation that, as the load current level increases, the switching loss of the device to be tested increases continuously, and the switching loss of the device to be tested has a positive temperature coefficient, and the higher the junction temperature of the device is, the larger the loss is; under different junction temperatures, the trend of the turn-on time of the device along with the change of the load current level is consistent, the larger the load current is, the longer the turn-on time is, and the turn-on time of the device to be tested has a positive temperature coefficient. The device can also extract other temperature-dependent switching dynamics, but for reasons of space, not all are listed.
In summary, the device and the method for extracting the dynamic parameters of the power converter switch have high automation degree and easy operation, can rapidly and accurately extract the electric parameters of the power device switch transient process, are used for guiding the reliability design of the power converter, and are used for analyzing the change rule of the related parameters in the power device decay process so as to evaluate the health condition of the power converter.
It will be appreciated by persons skilled in the art that the above embodiments are provided for illustration only and not for limitation of the invention, and that variations and modifications of the above described embodiments are intended to fall within the scope of the claims of the invention as long as they fall within the true spirit of the invention.
Claims (5)
1. The power converter switch dynamic parameter extraction device is characterized by comprising a hardware test platform, a data acquisition module, a controller, an upper computer and a data post-processing module;
the hardware test platform comprises a transformer, a rectifier, a capacitor, a charging resistor, a relay, an energy release resistor, a laminated busbar, a power device and a heating plate; the transformer, the rectifier, the charging resistor and the relay are sequentially connected in series and then used as power input of the capacitor, the capacitor and the power device are respectively arranged on the laminated busbar, and the energy discharging resistor is connected with the capacitor in parallel;
the power device is fixed on the heating plate through heat conduction silicone grease, and the heating plate is connected with a temperature controller;
the data acquisition module comprises a data acquisition device and an oscilloscope, wherein the data acquisition device acquires current and voltage data and uploads the current and voltage data to the oscilloscope and the upper computer;
the controller is used for receiving the instruction of the upper computer and issuing a trigger pulse instruction and a locking instruction to the power device through the optical fiber;
the upper computer is used for controlling the instruction layer and transmitting the test conditions to the controller through the communication interface; transmitting the sampling conditions to the data collector and the oscilloscope through a communication interface;
the data post-processing module is used for finishing post-processing operation of current and voltage data and extracting switching dynamic parameters of the power device, wherein the switching dynamic parameters comprise switching time, on-current overshoot, off-voltage and switching loss.
2. The power converter switching dynamic parameter extraction device of claim 1, wherein said controller employs a DSP controller; the upper computer adopts a LabVIEW upper computer; the data post-processing module adopts a data post-processing GUI interface.
3. The power converter switch dynamic parameter extraction device according to claim 1, wherein alternating current is sequentially boosted by the transformer, uncontrollably rectified by the rectifier, and then connected in series with the charging resistor and the relay to be used as power input of the capacitor, the capacitor and the power device are respectively arranged on the laminated busbar, the energy release resistor is connected in parallel with the capacitor to release energy of the capacitor; the heating plate is controlled by the temperature controller to be maintained at a set temperature.
4. The power converter switching dynamic parameter extraction device of claim 1, wherein the data collector comprises a current probe and a current probe, wherein:
the current probe collects collector current data and uploads the collector current data to the oscilloscope and the upper computer;
the voltage probe collects collector-emitter voltage data, diode voltage data, gate driving voltage data and auxiliary voltage data, and all collected voltage data are uploaded to the oscilloscope and the upper computer.
5. A method for extracting a dynamic parameter of a power converter switch, which is characterized by comprising the following steps of:
s1, mounting a test module to the laminated busbar, clamping a test probe on a terminal to be tested, checking a test loop, and ensuring that a control line and a power line are isolated from a heating plate;
s2, checking whether a short circuit point exists on a connecting line of the hardware test platform, and then checking whether a communication line, a driving power supply line and a computer of the DSP controller are correctly connected with an oscilloscope;
s3, opening a LabVIEW upper computer in the computer, then closing an auxiliary power supply main switch of the hardware test platform, and sequentially closing an oscilloscope, a controller and a driving power supply switch;
s4, adjusting the temperature controller to a temperature point to be tested, and closing a temperature power switch of the temperature controller;
s5, operating a LabVIEW main interface, inputting test information, clicking to start a test, and entering an oscilloscope and a parameter setting interface;
s6, setting a test temperature, a test voltage and a test current in a test condition input field, and then setting sampling conditions in an oscilloscope setting field;
s7, after the main power air switch is closed, double pulse testing is automatically completed, and oscilloscope data are automatically transmitted to a computer;
and S8, operating a data post-processing GUI interface of the MATLAB, automatically importing the acquired current and voltage data, and calculating the switching dynamic parameters of the power device.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN108107333B (en) * | 2017-11-20 | 2020-01-14 | 重庆大学 | IGBT thermosensitive inductive parameter extraction device |
| CN109459675B (en) * | 2018-11-16 | 2021-09-03 | 国网江苏省电力有限公司盐城供电分公司 | Application characteristic test platform for SiC power device |
| CN111308232B (en) * | 2018-12-12 | 2022-08-19 | 中车株洲电力机车研究所有限公司 | System and method for measuring stray parameters of current loop of high-power current conversion module |
| CN113917303A (en) * | 2021-10-08 | 2022-01-11 | 浙江大学 | Dynamic characteristic test circuit, test platform and test method for high-voltage device |
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