CN106855505A - A kind of hollow cathode test device and method of testing - Google Patents
A kind of hollow cathode test device and method of testing Download PDFInfo
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- CN106855505A CN106855505A CN201611244653.XA CN201611244653A CN106855505A CN 106855505 A CN106855505 A CN 106855505A CN 201611244653 A CN201611244653 A CN 201611244653A CN 106855505 A CN106855505 A CN 106855505A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/3103—Atomic absorption analysis
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N2021/3129—Determining multicomponents by multiwavelength light
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Abstract
The invention belongs to technical field of measurement and test.With deuterium lamp and halogen tungsten lamp as standard sources, respond, determine the radiation intensity and ambient noise of hollow cathode lamp by comparing hollow cathode lamp characteristic wavelength and background wavelength signals, change the build-up of luminance time for determining hollow cathode lamp according to the response signal of silicon photocell.Hollow cathode test device of the present invention, is made up of light-source system, monochromator system, detector and data handling system, it is characterised in that：N hollow cathode lamp source of installation on deuterium lamp standard sources (3) and halogen tungsten lamp standard sources (4), concentric space circumference is symmetrically installed in light-source system on cone pulley disk (2), n is between 2~8；Silicon photocell detector (9) is fixed on the space circumference of cone pulley disk offside and standard sources and hollow cathode lamp same distribution.The device is by the magnitude tracing of atomic absorption spectrophotometer standard hollow cathode lamp to standard sources, and device value stabilization is quick and easy to use, it is adaptable to the test of the technical parameter such as build-up of luminance time of hollow cathode lamp, radiation intensity and stability, ambient noise.
Description
Technical field
The invention belongs to technical field of measurement and test, it is related to the measuring technology of atomic absorption spectrophotometer measurement criteria, enters one
Step is related to atomic absorption spectrophotometer calibrating standard hollow cathode lamp test technology.
Background technology
According to JJG694-2009 atomic absorption spectrophotometer vertification regulations, the calibrating of the multiple parameters of instrument is with sky
Heart cathode modulation is standard, such as determines the wavelength indication of instrument, resolution ratio using mercury lamp, manganese lamp inspection；Instrument is determined using copper lamp inspection
Static baseline stability, the edge energy that carries out background to instrument using cadmium lamp, instrument is determined using arsenic lamp, caesium lamp inspection, but by
In not there is such device at present, the performance of hollow cathode lamp is difficult to evaluate, only with the atomic absorption spectrphotometry of assay approval
Meter carries out the detection of build-up of luminance and stability to hollow cathode lamp.
The performance of hollow cathode lamp is mainly reflected in the aspects such as build-up of luminance time, radiation intensity and stability, in manufacturing process
In, the design of electrode, the pressure and final purification process technique for enclosing gas directly affect the radiation intensity of hollow cathode lamp
And stability；In use, due to cathodic sputtering, cause negative electrode bore area coarse, the absorption of cathodic sputtering evaporant is carried
Gas declines nebulizer gas pressure in lamp, causes radiation intensity decline, bad stability, and aura does not collect medium phenomenon, or even can not send out
Project the resonance line of tested element.Used as measurement criteria, the performance of hollow cathode lamp directly affects tested atomic absorption spectrophotometry light
Spend the performance indications such as baseline stability, detection limit, repeatability, edge energy and the wavelength of meter.
The content of the invention
The present invention is difficult to the present situation evaluated for the performance of hollow cathode lamp, there is provided one kind test build-up of luminance time, radiation are strong
Degree and stability, the hollow cathode test device of ambient noise.
What the present invention was realized in：Principle, with deuterium lamp and halogen tungsten lamp as standard sources, standard sources are compared based on spectrum
Radiation be narrow bandpass monochromatic light through monochromator dispersion, rung by comparing hollow cathode lamp characteristic wavelength and background wavelength signals
The radiation intensity and ambient noise of hollow cathode lamp, should be determined, hollow cathode is determined according to the change of the response signal of silicon photocell
The build-up of luminance time of lamp.
Hollow cathode test device of the present invention, by light-source system, monochromator system, detector and data processing
System is constituted, it is characterised in that：Deuterium lamp standard sources 3 and halogen tungsten lamp standard light are symmetrically installed in light-source system on cone pulley disk 2
N hollow cathode lamp source is installed, n is between 2~8 on source 4, concentric space circumference；Silicon photocell detector 9 is fixed on
On the space circumference of cone pulley disk offside and standard sources and hollow cathode lamp same distribution.
The method of testing of hollow cathode lamp, comprises the following steps：
A：Rotation cone pulley disk 2 drives cone pulley disk 2, and hollow cathode lamp is opened successively, and line focus lens 13 focus on silicon
The PN junction of photocell 9, records the signal response u of hollow cathode lamph, until stabilization；
B：Standard sources is opened, after after stabilization, revolving wormgear turntable 1 drives cone pulley disk 2, deuterium lamp standard sources 3, halogen
Tungsten lamp standard sources 4 radiation (or through decayMonochromator entrance slit is focused on through monochromator condenser lens 12 afterwards), through color
CCD-detector photosurface is focused on after dissipating, the signal response of deuterium lamp standard sources and halogen tungsten lamp standard sources is recorded successivelyAnd
uλz；
C：, be placed in hollow cathode lamp in monochromator light path successively by revolving wormgear turntable 1, the radiation of hollow cathode lamp
(or through the T that decaysHMonochromator entrance slit is focused on through monochromator condenser lens 12 afterwards), record hollow cathode lamp characteristic wavelength
Signal responds uHAnd background signal response uz；
Calculate build-up of luminance time t, the radiation intensity J of hollow cathode lamp respectively by formula (1) (2) (3) (4)H, radiation intensity
Stability σ JrelAnd ambient noise Jz：
In formula：The t-- hollow cathode lamp build-up of luminance times；
uh-- signal response (silicon photocell detector) of hollow cathode lamp characteristic wavelength；
JH-- hollow cathode lamp radiation intensity；
Jλ-- at λ wavelength, the radiation intensity of standard sources；
λH-- hollow cathode lamp characteristic wavelength；
λZ-- hollow cathode lamp background wavelength；
ΔλH-- the deviation of hollow cathode lamp characteristic wavelength and standard sources assignment wavelength；
uH-- signal response (CCD-detector) of hollow cathode lamp characteristic wavelength；
uλ-- at λ wavelength, the signal response of the standard sources of atomic absorption standard device；
Tλ-- at λ wavelength, the attenuation coefficient of standard sources attenuator；
TH-- the attenuation coefficient of hollow cathode lamp attenuator；
σJrel-- the irradiation stability of hollow cathode lamp；
Jz-- hollow cathode lamp ambient noise；
uZ-- the background signal of hollow cathode lamp；
Hollow cathode test device of the present invention, by light-source system, monochromator system, detector and data processing
System is constituted, it is characterised in that：Deuterium lamp standard sources 3 and halogen tungsten lamp standard light are symmetrically installed in light-source system on cone pulley disk 2
Semiconductor laser and n hollow cathode lamp source are installed, n is between 2~8 on source 4, concentric space circumference；Silicon photoelectricity
Pool detector 9 is fixed on the space circumference of cone pulley disk offside and standard sources and hollow cathode lamp same distribution.
The method of testing of hollow cathode lamp, comprises the following steps：Including step A and following step：
D：After after standard sources stabilization, revolving wormgear turntable 1 drives cone pulley disk 2, deuterium lamp standard sources 3, halogen tungsten lamp
The radiation of standard sources 4 focuses on the entrance slit of monochromator 7 through monochromator condenser lens 12 successively, records deuterium lamp standard sources
And the spectral response u of halogen tungsten lamp standard sourcesλ；
E：It is semiconductor laser radiation wavelength X to set monochromator wavelengthL, record deuterium lamp standard sources or halogen tungsten lamp standard
The signal response of light sourceStandard of closure light source, semiconductor laser is placed in light path and opened, after after laser stabilization,
Record the signal response u of semiconductor laser characteristic wavelengthL；
F:, be placed in hollow cathode lamp in monochromator light path successively by revolving wormgear turntable, the spoke of hollow cathode lamp to be measured
Penetrate (decay THMonochromator entrance slit is focused on through monochromator condenser lens 12 afterwards), the letter of hollow cathode lamp characteristic wavelength is recorded
Number response uHAnd background signal response uz；
Calculate build-up of luminance time t, the radiation intensity J of hollow cathode lamp respectively by formula (1) (5) (6) (7)H, radiation intensity
Stability σ JrelAnd ambient noise Jz
In formula：JH-- hollow cathode lamp radiation intensity；
uL-- the signal response of semiconductor laser characteristic wavelength；
ΔλL-- the deviation of semiconductor laser characteristic wavelength and standard sources assignment wavelength；
JL-- the radiation intensity of semiconductor laser
Hollow cathode test device of the present invention, by light-source system, monochromator system, detector and data processing
System is constituted, it is characterised in that：Deuterium lamp standard sources 3 and halogen tungsten lamp standard light are symmetrically installed in light-source system on cone pulley disk 2
Source 4, installs n hollow cathode lamp source on concentric space circumference, n is between 2~8；Silicon photocell detector 9 is fixed on
On the space circumference of cone pulley disk offside and standard sources and hollow cathode lamp same distribution；Integrating sphere is placed in light source with monochrome
Between device entrance slit, the incidence of the concentric radiation path of integrating sphere entrance port and hollow cathode lamp, exit portal and monochromator 7
Slit is concentric；Semiconductor laser is fixed on integration outer surface of ball, and launch window overlaps and not direct projection monochromator with inner surface
Entrance slit.
The method of testing of hollow cathode lamp, including step A, D, E and F, calculate hollow respectively by formula (1) (5) (6) (7)
The build-up of luminance time t of cathode modulation, radiation intensity JH, radiation intensity stability σ JrelAnd ambient noise Jz；
Hollow cathode test device of the present invention, by the amount of atomic absorption spectrophotometer standard hollow cathode lamp
Value is traced to the source to standard sources, and device value stabilization is quick and easy to use, it is adaptable to which the build-up of luminance time of hollow cathode lamp, radiation are strong
The test of the technical parameter such as degree and stability, ambient noise.
Brief description of the drawings
Fig. 1 atomic absorption spectrophotometer standard set-up structural representations of the present invention
Fig. 2 atomic absorption spectrophotometer standard set-up structural representations of the present invention
Fig. 3 atomic absorption spectrophotometer standard set-up structural representations of the present invention
Wherein：1- turbine turntables, 2- cone pulley disks, 3- deuterium lamp standard sources, 4- halogen tungsten lamp standard sources, 5- semiconductors
Laser, 6- integrating spheres, 7- monochromators, 8-CCD detectors, 9- silicon photocell detectors, 10- deuterium lamp condenser lenses, 11- halogen tungstens
Lamp condenser lens, 12- monochromator condenser lenses, 13- silicon photocell condenser lenses, 14- deuterium lamp standard sources attenuators, 15- halogen
Tungsten lamp standard sources attenuator, 16- hollow cathode lamp attenuators.
Specific embodiment
The content of the invention is further described with reference to embodiment, but not as the limitation to the content of the invention.
Embodiment one
As shown in Figure 1：Atomic absorption spectrophotometer standard set-up is by light-source system, monochromator system, detector and number
Constituted according to processing system, light source is by 7SRA1100A turbines turntable 1, diameter 300mm cone pulleys disk 2, Nominal irradiation power
30w deuterium lamps standard sources 3,12V5w halogen tungsten lamps standard sources 4, deuterium lamp standard sources attenuator (T=70%, R=20mm) 14,
Halogen tungsten lamp standard sources attenuator (T=50%, R=20mm) 15, hollow cathode lamp attenuator (T=10~50%, R=20mm)
16 are constituted；Monochromator system is made up of FHR1000 monochromators 7, monochromator condenser lens (f=80mm, R=20mm) 12；Detection
Device system is gathered by Horiba SYN-1024X256-SP CCD-detectors 8, S1133-14 silicon photocells detector 9, silicon photocell
Focus lens (f=20mm, R=10mm) 13 are constituted.
Deuterium lamp standard sources 3, halogen tungsten lamp standard sources 4 and copper, cadmium, mercury, manganese, arsenic, cesium hollow cathode lamp are uniformly fixed on
On the space circumference of the diameter 180mm of cone pulley disk 2, cone pulley disk 2 is fixed on the surfaces of revolution of turbine turntable 1, and and turbine
The surfaces of revolution of turntable 1 is concentric；The entrance port of monochromator 7 is right against hollow cathode lamp radiation direction, and entrance slit be in
The axle center of cone pulley disk 2 is on the center of circle and standard sources, the space circumference of hollow cathode lamp same distribution；CCD-detector 8 hangs down
Disposed upright is on the emergent light focal plane of monochromator exit portal and photosurface in monochromator 7；Silicon photocell detector 9 is fixed on
On the space circumference of cone pulley disk offside and standard sources and hollow cathode lamp same distribution.
Turbine turntable drive cone pulley disc rotary to ad-hoc location when, deuterium lamp standard sources, halogen tungsten lamp standard sources and
Copper, cadmium, mercury, manganese, arsenic, the radiation of cesium hollow cathode lamp focus on monochromator entrance slit, sky through monochromator condenser lens successively
The radiation of heart cathode modulation focuses on the PN junction of silicon photocell through silicon photocell condenser lens.
Signal according to step A measurement hollow cathode lamps responds uh, the signal of measurement standard light source is distinguished according to step B, C
ResponseAnd uλz, hollow cathode lamp characteristic wavelength signal response uHAnd background signal response uZ, by formula (1) (2) (3) (4)
Build-up of luminance time t, the radiation intensity J of hollow cathode lamp are calculated respectivelyH, radiation intensity stability σ JrelAnd ambient noise Jz, such as table
Shown in 1.
The hollow cathode lamp test result of table 1
Embodiment two
As shown in Figure 2：Atomic absorption spectrophotometer standard set-up is by light-source system, monochromator system, detector and number
Constituted according to processing system, light source is by 7SRA1100A turbines turntable 1, diameter 300mm cone pulleys disk 2, Nominal irradiation power
30w deuterium lamps standard sources 3,12V5w halogen tungsten lamps standard sources 4, DL-4146-101S semiconductor lasers 5, deuterium lamp standard sources
Attenuator (T=70%, R=20mm) 14, halogen tungsten lamp standard sources attenuator (T=50%, R=20mm) 15, hollow cathode lamp
Attenuator (T=10~50%, R=20mm) 16 is constituted；Monochromator system is by FHR1000 monochromators 7, monochromator condenser lens (f
=80mm, R=20mm) 12 compositions；Detector system is by Horiba SYN-1024X256-SP CCD-detectors 8, S1133-14
Silicon photocell detector 9, silicon photocell condenser lens (f=20mm, R=10mm) 13 are constituted.
Deuterium lamp standard sources 3, halogen tungsten lamp standard sources, semiconductor laser 4 and copper, cadmium, mercury, manganese, arsenic, cesium hollow cathode
Lamp is uniformly fixed on the space circumference of the diameter 180mm of cone pulley disk 2, and cone pulley disk 2 is fixed on the surfaces of revolution of turbine turntable 1
On, and it is concentric with the surfaces of revolution of turbine turntable 1；The entrance port of monochromator 7 is right against hollow cathode lamp radiation direction, and incident
Slit is in the axle center of cone pulley disk 2 as the center of circle and standard sources, the space circumference of hollow cathode lamp same distribution radius
On；CCD-detector 8 is vertically arranged in monochromator exit portal and photosurface is on the emergent light focal plane of monochromator 7；Silicon photoelectricity
Pool detector 9 is fixed on the space circumference of cone pulley disk offside and standard sources and hollow cathode lamp same distribution.
When turbine turntable drives cone pulley disc rotary to ad-hoc location, deuterium lamp standard sources, halogen tungsten lamp standard sources, half
Conductor laser and copper, cadmium, mercury, manganese, arsenic, the radiation of cesium hollow cathode lamp focus on monochromator through monochromator condenser lens successively
Entrance slit, hollow cathode lamp radiation focus on the PN junction of silicon photocell through silicon photocell condenser lens.
Signal according to step A measurement hollow cathode lamps responds uh, the light of measurement standard light source is distinguished according to step D, E, F
Spectrum response uλ, standard sources signal responseThe signal response u of semiconductor laserLAnd hollow cathode lamp characteristic wavelength
Signal responds uHAnd background signal response uz, calculate build-up of luminance time t, the spoke of hollow cathode lamp respectively by formula (1) (5) (6) (7)
Penetrate intensity JH, radiation intensity stability σ JrelAnd ambient noise Jz, as shown in table 2.
The hollow cathode lamp test result of table 2
Embodiment three
As shown in Figure 3：Atomic absorption spectrophotometer standard set-up is by light-source system, monochromator system, detector and number
Constituted according to processing system, light-source system is by 7SRA1100A turbines turntable 1, diameter 300mm cone pulleys disk 2, Nominal irradiation power
30w deuterium lamps standard sources 3,12V5w halogen tungsten lamps standard sources 4, DL-4146-101S semiconductor lasers 5, integrating sphere (60mm)
6th, deuterium lamp condenser lens 10, halogen tungsten lamp condenser lens 11, deuterium lamp standard sources attenuator (T=70%, R=20mm) 14, halogen tungsten
Lamp standard sources attenuator (T=50%, R=20mm) 15, hollow cathode lamp attenuator (T=10~50%, R=20mm) 16 structures
Into；Monochromator system is made up of FHR1000 monochromators 7, monochromator condenser lens (f=80mm, R=20mm) 12；Detector system
System by Horiba SYN-1024X256-SP CCD-detectors 8, S1133-14 silicon photocells detector 9, silicon photocell focus on it is saturating
Mirror (f=20mm, R=10mm) 13, composition.
Deuterium lamp standard sources 3, halogen tungsten lamp standard sources 4 and copper, cadmium, mercury, manganese, arsenic, cesium hollow cathode lamp are uniformly distributed in
On the circumference of the diameter 180mm of cone pulley disk 2, cone pulley disk 2 is fixed on the surfaces of revolution of turbine turntable 1, and is rotated with turbine
The surfaces of revolution of platform 1 is concentric；Integrating sphere is placed between light source and monochromator, and integrating sphere entrance port is same with the input path of standard sources
The entrance slit in axle center, exit portal and monochromator 7 is concentric；Semiconductor laser is fixed on integration outer surface of ball, its emitter window
Mouth overlaps and not direct projection monochromator entrance slit with inner surface；The entrance port of monochromator 7 is right against hollow cathode lamp radiation side
To, and entrance slit is in the axle center of cone pulley disk 2 as the center of circle and standard sources, the space of hollow cathode lamp same distribution
On circumference；CCD-detector 8 is vertically arranged in monochromator exit portal and photosurface is on the emergent light focal plane of monochromator 7；Silicon
Photovoltaic detectors 9 is fixed on the space circumference of cone pulley disk offside and standard sources and hollow cathode lamp same distribution.Whirlpool
When wheel turntable drives cone pulley disc rotary to ad-hoc location, deuterium lamp standard sources, halogen tungsten lamp standard sources, semiconductor laser
And the radiation of copper, cadmium, mercury, manganese, arsenic, cesium hollow cathode lamp successively through monochromator condenser lens focus on monochromator entrance slit,
Hollow cathode lamp radiation focuses on the PN junction of silicon photocell through silicon photocell condenser lens.
Signal according to step A measurement hollow cathode lamps responds uh, the light of measurement standard light source is distinguished according to step D, E, F
Spectrum response uλ, standard sources signal responseThe signal response u of semiconductor laserLAnd hollow cathode lamp characteristic wavelength
Signal responds uHAnd background signal response uz, calculate build-up of luminance time t, the spoke of hollow cathode lamp respectively by formula (1) (5) (6) (7)
Penetrate intensity JH, radiation intensity stability σ JrelAnd ambient noise Jz, as shown in table 3.
The hollow cathode lamp test result of table 3
Claims (5)
1. a kind of hollow cathode test device, is made up of light-source system, monochromator system, detector and data handling system,
It is characterized in that：Be symmetrically installed on cone pulley disk (2) in light-source system deuterium lamp standard sources (3) and halogen tungsten lamp standard sources (4),
N hollow cathode lamp source is installed, n is between 2~8 on concentric space circumference；Silicon photocell detector (9) is fixed on tower
On the space circumference of wheel disk offside and standard sources and hollow cathode lamp same distribution.
2. hollow cathode test device according to claim 1, it is characterised in that：Cone pulley disk (2) in light-source system
On be symmetrically installed on deuterium lamp standard sources (3) and halogen tungsten lamp standard sources (4), concentric space circumference semiconductor laser be installed
And n hollow cathode lamp source, n is between 2~8；Silicon photocell detector () 9 is fixed on cone pulley disk offside and standard
On the space circumference of light source and hollow cathode lamp same distribution.
3. hollow cathode test device according to claim 1, it is characterised in that：Cone pulley disk in light-source system
(2) deuterium lamp standard sources (3) and halogen tungsten lamp standard sources (4) are symmetrically installed on, n hollow the moon is installed on concentric space circumference
Pole lamp source, n is between 2~8；Silicon photocell detector (9) is fixed on cone pulley disk offside and standard sources and hollow the moon
On the space circumference of pole lamp same distribution；Integrating sphere is placed between light source and monochromator entrance slit, integrating sphere entrance port with it is empty
The radiation path of heart cathode modulation is concentric, the entrance slit of exit portal and monochromator (7) is concentric；Semiconductor laser is fixed on
Integration outer surface of ball, launch window overlaps and not direct projection monochromator entrance slit with inner surface.
4. the method for testing of the hollow cathode test device described in claim 1, comprises the following steps：
A：Rotation cone pulley disk (2) drives cone pulley disk (2), and hollow cathode lamp is opened successively, and line focus lens (13) are focused on
The PN junction of silicon photocell () 9, records the signal response u of hollow cathode lamph, until stabilization；
B：Standard sources is opened, after stable, revolving wormgear turntable (1) driving cone pulley disk (2), deuterium lamp standard sources (3),
Halogen tungsten lamp standard sources (4) radiation (or through decayTo focus on monochromator incidence through monochromator condenser lens (12) narrow afterwards)
Seam, focuses on CCD-detector photosurface after dispersion, and the signal that deuterium lamp standard sources and halogen tungsten lamp standard sources are recorded successively rings
ShouldAnd uλz；
C：, be placed in hollow cathode lamp in monochromator light path successively by revolving wormgear turntable (1), the radiation of hollow cathode lamp or warp
Decay THMonochromator entrance slit is focused on by monochromator condenser lens (12), the signal of hollow cathode lamp characteristic wavelength is recorded
Response uHAnd background signal response uz；
Calculate build-up of luminance time t, the radiation intensity J of hollow cathode lamp respectively by formula (1) (2) (3) (4)H, radiation intensity stabilization
Property σ JrelAnd ambient noise Jz：
In formula：The t-- hollow cathode lamp build-up of luminance times；
uh-- the signal response of hollow cathode lamp characteristic wavelength, silicon photocell detector；
JH-- hollow cathode lamp radiation intensity；
Jλ-- at λ wavelength, the radiation intensity of standard sources；
λH-- hollow cathode lamp characteristic wavelength；
λZ-- hollow cathode lamp background wavelength；
ΔλH-- the deviation of hollow cathode lamp characteristic wavelength and standard sources assignment wavelength；
uH-- the signal response of hollow cathode lamp characteristic wavelength, CCD-detector；
uλ-- at λ wavelength, the signal response of the standard sources of atomic absorption standard device；
Tλ-- at λ wavelength, the attenuation coefficient of standard sources attenuator；
TH-- the attenuation coefficient of hollow cathode lamp attenuator；
σJrel-- the irradiation stability of hollow cathode lamp；
Jz-- hollow cathode lamp ambient noise；
uZ-- the background signal of hollow cathode lamp.
5. the method for testing of the hollow cathode test device described in Claims 2 or 3 any one, comprises the following steps：Bag
Include step A and following step：
D：After after standard sources stabilization, revolving wormgear turntable (1) drives cone pulley disk (2), deuterium lamp standard sources (3), halogen tungsten
The radiation of lamp standard sources (4) focuses on the entrance slit of monochromator (7) through monochromator condenser lens (12) successively, records deuterium lamp
The spectral response u of standard sources and halogen tungsten lamp standard sourcesλ；
E：It is semiconductor laser radiation wavelength X to set monochromator wavelengthL, record deuterium lamp standard sources or halogen tungsten lamp standard sources
Signal responseStandard of closure light source, semiconductor laser is placed in light path and opened, and after after laser stabilization, is recorded
The signal response u of semiconductor laser characteristic wavelengthL；
F:, be placed in hollow cathode lamp in monochromator light path successively by revolving wormgear turntable, and the radiation of hollow cathode lamp to be measured declines
Subtract THMonochromator entrance slit is focused on by monochromator condenser lens (12), the signal for recording hollow cathode lamp characteristic wavelength rings
Answer uHAnd background signal response uz；
Calculate build-up of luminance time t, the radiation intensity J of hollow cathode lamp respectively by formula (1) (5) (6) (7)H, radiation intensity stabilization
Property σ JrelAnd ambient noise Jz；
The method of testing of hollow cathode lamp, including step A, D, E and F, hollow cathode is calculated by formula (1) (5) (6) (7) respectively
The build-up of luminance time t of lamp, radiation intensity JH, radiation intensity stability σ JrelAnd ambient noise Jz；
In formula：JH-- hollow cathode lamp radiation intensity；
uL-- the signal response of semiconductor laser characteristic wavelength；
ΔλL-- the deviation of semiconductor laser characteristic wavelength and standard sources assignment wavelength；
JL-- the radiation intensity of semiconductor laser
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107121393A (en) * | 2017-06-29 | 2017-09-01 | 上海化工研究院有限公司 | A kind of reciprocating chain hollow cathode lamp for Atomic Absorption Spectrometer is combined the unit |
| CN111175025A (en) * | 2020-03-26 | 2020-05-19 | 交通运输部北海航海保障中心烟台航标处 | Intelligent detection method and device for lamplight quality of beacon light |
Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB1441068A (en) * | 1973-05-30 | 1976-06-30 | Beckmann Instr Gmbh | Illumination system for a sepctrophotometer |
| CN1621788A (en) * | 2003-11-28 | 2005-06-01 | 上海天美科学仪器有限公司 | Wide range deuterium lamp background correcting system |
| CN1699970A (en) * | 2005-07-01 | 2005-11-23 | 北京博晖创新光电技术股份有限公司 | Atom absorption method and apparatus for multi-element simultaneous determination |
| CN201637671U (en) * | 2009-11-10 | 2010-11-17 | 北京博晖创新光电技术股分有限公司 | Multi-sample multi-element simultaneously measured tungsten boat atomic absorption analyzer |
| CN103337447A (en) * | 2013-06-05 | 2013-10-02 | 无锡市金义博仪器科技有限公司 | A hollow cathode lamp apparatus |
| CN203745181U (en) * | 2014-03-20 | 2014-07-30 | 中国人民解放军总装备部卫生防疫队 | Hollow cathode lamp verification device |
| CN104316176A (en) * | 2014-10-13 | 2015-01-28 | 中国电子科技集团公司第四十一研究所 | Ultraviolet-visual-near infrared dual-light-source common light path and output method thereof |
| CN105977776A (en) * | 2016-06-22 | 2016-09-28 | 中国科学院光电研究院 | Absolute wavelength calibration and adjustment device and method |
| CN206270238U (en) * | 2016-12-29 | 2017-06-20 | 山东非金属材料研究所 | A kind of hollow cathode test device |
-
2016
- 2016-12-29 CN CN201611244653.XA patent/CN106855505B/en active Active
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB1441068A (en) * | 1973-05-30 | 1976-06-30 | Beckmann Instr Gmbh | Illumination system for a sepctrophotometer |
| CN1621788A (en) * | 2003-11-28 | 2005-06-01 | 上海天美科学仪器有限公司 | Wide range deuterium lamp background correcting system |
| CN1699970A (en) * | 2005-07-01 | 2005-11-23 | 北京博晖创新光电技术股份有限公司 | Atom absorption method and apparatus for multi-element simultaneous determination |
| CN201637671U (en) * | 2009-11-10 | 2010-11-17 | 北京博晖创新光电技术股分有限公司 | Multi-sample multi-element simultaneously measured tungsten boat atomic absorption analyzer |
| CN103337447A (en) * | 2013-06-05 | 2013-10-02 | 无锡市金义博仪器科技有限公司 | A hollow cathode lamp apparatus |
| CN203745181U (en) * | 2014-03-20 | 2014-07-30 | 中国人民解放军总装备部卫生防疫队 | Hollow cathode lamp verification device |
| CN104316176A (en) * | 2014-10-13 | 2015-01-28 | 中国电子科技集团公司第四十一研究所 | Ultraviolet-visual-near infrared dual-light-source common light path and output method thereof |
| CN105977776A (en) * | 2016-06-22 | 2016-09-28 | 中国科学院光电研究院 | Absolute wavelength calibration and adjustment device and method |
| CN206270238U (en) * | 2016-12-29 | 2017-06-20 | 山东非金属材料研究所 | A kind of hollow cathode test device |
Non-Patent Citations (1)
| Title |
|---|
| 冯素玲;李晶;李全民;: "原子吸收分析中的氘灯背景校正技术原理" * |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107121393A (en) * | 2017-06-29 | 2017-09-01 | 上海化工研究院有限公司 | A kind of reciprocating chain hollow cathode lamp for Atomic Absorption Spectrometer is combined the unit |
| CN107121393B (en) * | 2017-06-29 | 2020-05-05 | 上海化工研究院有限公司 | Reciprocating chain type hollow cathode lamp combination device for atomic absorption spectrometer |
| CN111175025A (en) * | 2020-03-26 | 2020-05-19 | 交通运输部北海航海保障中心烟台航标处 | Intelligent detection method and device for lamplight quality of beacon light |
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