CN1621788A - Wide range deuterium lamp background correcting system - Google Patents
Wide range deuterium lamp background correcting system Download PDFInfo
- Publication number
- CN1621788A CN1621788A CN 200310108951 CN200310108951A CN1621788A CN 1621788 A CN1621788 A CN 1621788A CN 200310108951 CN200310108951 CN 200310108951 CN 200310108951 A CN200310108951 A CN 200310108951A CN 1621788 A CN1621788 A CN 1621788A
- Authority
- CN
- China
- Prior art keywords
- deuterium lamp
- lamp
- deuterium
- background correction
- hollow cathode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Landscapes
- Spectrometry And Color Measurement (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
The wide-range deuterium lamp background correcting system includes hollow cathode lamp, deuterium lamp, front lens, burner, back lens, monochromator, photomultiplier and signal detecting processor, as well as half-reflecting mirror, which is located in front of the front lens and driven with a stepped motor for compounding the deuterium lamp and the hollow cathode lamp. The deuterium lamp is pulse powered, and the signal detecting processor controls the stepped motor and the adjustable deuterium lamp pulse current automatically. Owing to the combination of the half-reflecting mirror and the current adjustable high strength deuterium lamp and the program controlled energy balance, the deuterium lamp background correction for atomic absorption spectrophotometer may be expanded to element Cs with longest wavelength of 852.1 nm. In addition, the system has long term high precision, high repeatability and fast correction speed.
Description
Technical field
The present invention relates to the background correction system of atomic absorption instrument, relate in particular to the deuterium lamp background correction device of wide region.
Background technology
As everyone knows, the background absorption that derives from molecule absorption and light scattering is a wide band absorption, and atomic absorption belongs to the arrowband absorption, and analysis result is with higher if background is not proofreaied and correct.Therefore, background correction has become the requisite ingredient of atomic absorption spectrophotometry, and the alignment technique that the most generally uses is the deuterium lamp method.Because this method used arbitrary source of different nature, certain limitation is arranged, thereby produced following shortcoming: the varying in size of 1 two light source hot spots, the energy distribution of hot spot itself is difference also; 2 are applicable to that the stronger wavelength coverage of deuterium lamp radiation carries out background correction, are generally 190～350nm, and more long wavelength's two-beam energy then can't balance.
Summary of the invention
The technical issues that need to address of the present invention are to provide a kind of wide region deuterium lamp background correction system, to overcome the prior art light spot energy defectives such as two-beam different and can't the balance longer wavelength that distribute.
Technical scheme of the present invention is as follows:
Comprise hollow cathode lamp, deuterium lamp, burner front lens, burner, burner rear lens, monochromator, photomultiplier and input processing section, also comprise and be positioned at the saturating anti-mirror that burner front lens front is used for compound deuterium lamp and hollow cathode lamp and is driven by step motor, described deuterium lamp adopts pulse power supply, automatic control step motor in described input processing section and adjustable deuterium lamp pulse current.
Above-mentioned anti-mirror is a high-precision quartz plate optical element, can be rounded, and alternate coaxial reflection horizon and the printing opacity space of being distributed with of its plate face.
Beneficial effect of the present invention is: because saturating anti-mirror and adjustable current high strength deuterium lamp combine, and energy equilibrium is by procedure auto-control, make the deuterium lamp background correction of atomic absorption spectrophotometer (AAS) can expand to the longest element caesium of wavelength that prior art can't be analyzed apace, it is the wavelength of 852.1nm, but and this system's long term maintenance high precision, repeatability is high, and correction rate is fast.
Description of drawings
Fig. 1 is a structural representation of the present invention;
Fig. 2 is the structural representation of the saturating anti-mirror of the present invention.
Embodiment
Below in conjunction with the drawings and specific embodiments the present invention is elaborated.
As Fig. 1, the present invention includes mirror 6 behind hollow cathode lamp 1, deuterium lamp 3, burner front lens 4, burner 5, the burner, monochromator 7 and photomultiplier 8, input processing section 9, also comprise and be positioned at the saturating anti-mirror 2 that burner front lens 4 fronts are used for compound deuterium lamp and hollow cathode lamp and are driven by step motor 10, described deuterium lamp 3 adopts pulse power supply, the automatic control step motor in described input processing section and adjustable deuterium lamp pulse current, the also electric current of may command hollow cathode lamp.
But for improving the two-beam matching capacity, the adjustable current scope is from 50mA～600mA.
Described deuterium lamp is selected synthetic quartz Window-type high-energy deuterium lamp for use, improves 20% than plain edition deuterium lamp energy.
As Fig. 2; described anti-mirror is the saturating anti-mirror of circular rotation; its black part is divided into the reflection horizon that the aluminium film adds the ultraviolet protection film; remainder is for seeing through the space of light; know by figure; the distribution of the width in reflection horizon and printing opacity space on disk and non-homogeneous, but gradual change from narrow to wide, this mainly is because the hollow cathode lamp of different radiation intensity requires the deuterium lamp radiation intensity to be adjusted accordingly.
At first, the programmed control deuterium lamp lighting of input processing section, making its current value is its peak value 600mA, because dutycycle adopted 1: 4, so average current and little, the deuterium lamp ripple shell temperature during than general 300mA direct current supply is also low; Then with saturating anti-mirror initialization; Because the hollow cathode lamp luminous intensity differs greatly, the two-beam energy always have can not balance the moment, at this moment, the energy signal that hollow cathode lamp and deuterium lamp are got in programmed control compares; If the deuterium lamp energy greater than the hollow cathode lamp energy, is then regulated the deuterium lamp electric current and made it reduce to minimum current 50mA, cause the deuterium lamp energy less than the hollow cathode lamp energy; If the deuterium lamp energy is less than the hollow cathode lamp energy, programmed control starts the step motor of anti-mirror, whenever the energy that carries out a two-beam that makes a move compares, in the process of walking, saturating anti-mirror rotates, the reflection horizon of different in width and printing opacity space can produce the hollow cathode light of different-energy, like this till both complete equipilibriums.When deuterium lamp energy during less than the hollow cathode lamp energy, under the constant situation of spectral bandwidth and lamp current, radiation delivery (transmission and reflection) by decaying the hollow cathode lamp high-energy and improving low-yield deuterium lamp bundle makes luminous energy be fully utilized, and has improved signal to noise ratio (S/N ratio).The energy proportion that saturating anti-mirror is adjusted is from 1: 4 to 4: 1, promptly sees through energy from 1 continuously to 4, and reflection then from 4 to 1 changes continuously, and in addition, the step pitch of step motor is very thin, can be flux matched quite accurate.Whole trimming process only needs 1 fen clock time by programmed control.
Claims (5)
1. wide region deuterium lamp background correction system, comprise hollow cathode lamp, deuterium lamp, burner front lens, burner, burner rear lens, monochromator, photomultiplier and input processing section, also comprise and be positioned at the saturating anti-mirror that burner front lens front is used for compound deuterium lamp and hollow cathode lamp and is driven by step motor, described deuterium lamp adopts pulse power supply, automatic control step motor in described input processing section and adjustable deuterium lamp pulse current.
2. wide region deuterium lamp background correction as claimed in claim 1 system is characterized in that described anti-mirror is an original shape high-precision quartz plate optical element, alternate coaxial reflection horizon and the printing opacity space of being distributed with on the plate.
3. wide region deuterium lamp background correction as claimed in claim 2 system is characterized in that described reflection horizon adds the ultraviolet protection film for the aluminium film.
4. wide region deuterium lamp background correction as claimed in claim 1 or 2 system is characterized in that described deuterium lamp is a synthetic quartz Window-type high-energy deuterium lamp.
5. wide region deuterium lamp background correction as claimed in claim 4 system is characterized in that described adjustable current scope from 50mA～600mA, and dutycycle is 1: 4.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2003101089512A CN100357719C (en) | 2003-11-28 | 2003-11-28 | Wide range deuterium lamp background correcting system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2003101089512A CN100357719C (en) | 2003-11-28 | 2003-11-28 | Wide range deuterium lamp background correcting system |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1621788A true CN1621788A (en) | 2005-06-01 |
| CN100357719C CN100357719C (en) | 2007-12-26 |
Family
ID=34758781
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB2003101089512A Expired - Fee Related CN100357719C (en) | 2003-11-28 | 2003-11-28 | Wide range deuterium lamp background correcting system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN100357719C (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101408503B (en) * | 2007-10-11 | 2011-01-05 | 上海光谱仪器有限公司 | Method for automatically detecting and dynamically substracting stray light of spectrometer and spectrometer |
| US8184286B2 (en) | 2006-12-18 | 2012-05-22 | Shimadzu Corporation | Atomic absorption spectrophotometer |
| CN104390700A (en) * | 2014-10-24 | 2015-03-04 | 上海光谱仪器有限公司 | Time-sharing method detection circuit for pulse xenon lamp atom absorption background correction |
| CN106855505A (en) * | 2016-12-29 | 2017-06-16 | 山东非金属材料研究所 | A kind of hollow cathode test device and method of testing |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1029030C (en) * | 1990-12-30 | 1995-06-21 | 中国科学院金属研究所 | Microcomputer atomic absorption spectrophotometer |
| JP3508722B2 (en) * | 2000-12-25 | 2004-03-22 | 株式会社島津製作所 | Atomic absorption photometer |
| CN2588366Y (en) * | 2002-12-30 | 2003-11-26 | 武进田 | Background-taking off tungsten lamp combined modulation test controller for atom absorbing spectral photometer |
-
2003
- 2003-11-28 CN CNB2003101089512A patent/CN100357719C/en not_active Expired - Fee Related
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8184286B2 (en) | 2006-12-18 | 2012-05-22 | Shimadzu Corporation | Atomic absorption spectrophotometer |
| CN101548173B (en) * | 2006-12-18 | 2013-07-31 | 株式会社岛津制作所 | Atomic absorption spectrophotometer |
| CN101408503B (en) * | 2007-10-11 | 2011-01-05 | 上海光谱仪器有限公司 | Method for automatically detecting and dynamically substracting stray light of spectrometer and spectrometer |
| CN104390700A (en) * | 2014-10-24 | 2015-03-04 | 上海光谱仪器有限公司 | Time-sharing method detection circuit for pulse xenon lamp atom absorption background correction |
| CN104390700B (en) * | 2014-10-24 | 2016-11-16 | 上海光谱仪器有限公司 | A kind of time-sharing approach testing circuit of xenon flash lamp Background Correction of Atomic Absorption Spectrometry |
| CN106855505A (en) * | 2016-12-29 | 2017-06-16 | 山东非金属材料研究所 | A kind of hollow cathode test device and method of testing |
| CN106855505B (en) * | 2016-12-29 | 2023-07-21 | 山东非金属材料研究所 | Hollow cathode lamp testing device and testing method |
Also Published As
| Publication number | Publication date |
|---|---|
| CN100357719C (en) | 2007-12-26 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US5144190A (en) | Light source having desired color temperature and chromaticity | |
| EP0513343B1 (en) | Apparatus and method for precisely exposing radiation sensitive materials | |
| CN105388610A (en) | Light attenuation device capable of continuously adjusting light intensity | |
| JP2014053098A (en) | Solar simulator | |
| CN105589302A (en) | Ultraviolet light exposure system capable of emitting light in parallel and exposure machine | |
| CN100357719C (en) | Wide range deuterium lamp background correcting system | |
| CN207742116U (en) | A kind of recombination laser formula fluorescence imaging light source | |
| US20040252257A1 (en) | Dual-screen Liquid crystal display | |
| CN101718407A (en) | Adjustment light source device | |
| CN205245084U (en) | Light intensity automatically regulated ware | |
| CN108918419B (en) | Low-irradiance fine adjustment device for solar simulator | |
| CN114302537B (en) | Output irradiation intensity control method for all-weather solar simulator | |
| JPS55138620A (en) | Photometric device | |
| CN108650739B (en) | Separated wave band background light simulator for performance detection of laser radar | |
| CN207439908U (en) | Adjustable LED lamp and halogen lamp combined light source | |
| CN208041755U (en) | The concentration structure and light-source system of linear light source | |
| Linderman et al. | Illumination in motion picture production | |
| CN207213958U (en) | A kind of laser searchlighting optical texture | |
| CN2158085Y (en) | Fluorescent diagnostic meter for tumor | |
| Jakubowski et al. | Metrological requirements for measurements of circadian radiation | |
| US6768127B1 (en) | Device and method for wavelength dependent light outcoupling | |
| CN221124990U (en) | Mechanical slit light source device based on infrared deflection operation | |
| EP1482240B1 (en) | Device for adjusting light intensity for discharge lamp projectors | |
| CN218630516U (en) | Novel exposure lamp structure | |
| Davis | The carbon arc image furnace |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20071226 Termination date: 20141128 |
|
| EXPY | Termination of patent right or utility model |