CN106841887A - A kind of mechanism for testing of cell piece - Google Patents
A kind of mechanism for testing of cell piece Download PDFInfo
- Publication number
- CN106841887A CN106841887A CN201710231160.0A CN201710231160A CN106841887A CN 106841887 A CN106841887 A CN 106841887A CN 201710231160 A CN201710231160 A CN 201710231160A CN 106841887 A CN106841887 A CN 106841887A
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- CN
- China
- Prior art keywords
- probe
- probe card
- plate
- cell piece
- testing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 21
- 239000000523 sample Substances 0.000 claims abstract description 125
- 238000001514 detection method Methods 0.000 description 5
- 230000005611 electricity Effects 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
- G01R31/013—Testing passive components
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
Abstract
The invention provides a kind of mechanism for testing of cell piece, it quickly can be detected large batch of cell piece, it is ensured that the efficient of test is carried out.It includes N layer heights direction arrangement probe card, the probe of array of being arranged corresponding to cell piece is respectively disposed with the probe card of N layer heights direction arrangement, the external probe card driving structure of probe card, the probe card driving structure includes vertical direction, two dimensions of horizontal direction, the probe card enters under the driving of the probe card driving structure and every cell piece is detected and then return in correspondence pallet, and wherein N is the natural number more than or equal to 2.
Description
Technical field
The present invention relates to the technical field of cell piece detection, specially a kind of mechanism for testing of cell piece.
Background technology
The detection of existing cell piece, after monolithic battery piece is arranged in pallet by it, pallet is sent to along conveyer belt
Corresponding product test station, product test station is detected to every piece of cell piece by test machine after pallet is removed, examined
The NG product measured directly are rejected to NG product discharge producing line, and certified products are placed on the output of certified products producing line, the machine of whole detection
Tool low degree, and because single pallet is detected successively, it causes that the space shared by detection is huge, and follow-up arrangement is not utilized
And storage.
The content of the invention
Regarding to the issue above, the invention provides a kind of mechanism for testing of cell piece, it can quickly by large batch of battery
Piece is detected, it is ensured that the efficient of test is carried out.
A kind of mechanism for testing of cell piece, it is characterised in that：It includes N layer heights direction arrangement probe card, N layer heights
The probe of array of being arranged corresponding to cell piece is respectively disposed with the probe card of direction arrangement, the external probe card of probe card drives
Dynamic structure, the probe card driving structure includes vertical direction, two dimensions of horizontal direction, and the probe card is in the probe card
Entered under the driving of driving structure correspondence pallet in every cell piece is detected and then return, wherein N be more than or equal to
2 natural number.
It is further characterized by：
The probe actuation structure includes vertical installing plate, and the dorsal part of the probe card is flush-mounted in vertical installing plate, institute
The dorsal part for stating vertical installing plate is flush-mounted in the vertical guide rails of riser, and the lower end of the riser is supported on the second base plate, described
The lower end of the second base plate is flush-mounted in the front and rear in arrangement guide rail of the mounting seat upper surface, the mounting seat be fixed with it is vertical to
Jacking cylinder, vertically to the bottom that the vertical installing plate is withstood at the top of jacking cylinder, vertically to connecting at the top of servo press
The mounting seat is connect, servomotor connects second base plate by front and back arrangement ball lead screw drive mechanism；
The probe of array, the arrangement array and the battery of the probe are placed with every layer of lower surface of the probe card
The array that piece is arranged in pallet is identical；
Every layer of probe card includes positive probe plate, negative probe plate, and the negative probe plate is by level to straight
Trajectory is supported on the upper end of the positive probe plate, the negative probe plate can relative to the positive probe plate do perpendicular to
The motion of vertical installing plate, the level is arranged to rectilinear orbit perpendicular to the vertical installing plate, under the negative probe plate
Convex to have negative probe, convex under the positive probe plate to have positive probe, positive probe plate corresponds to the position of the negative probe
It is provided with avoidance hole；
The side side of the negative probe plate is convex Cam Follower, and positioning inward recess is provided with the Cam Follower
Groove, the positioning indent hole slot correspondence of every layer of the Cam Follower has a Cam Follower fixed structure, top-down
It is installed in the side of linear guide on the outside of all of Cam Follower fixed structure, the bottom of the linear guide is circumscribed with vertical
The probe card locking transfer structure jacking cylinder of straight elevator；
Probe card locking transfer structure is disposed with the outside of the linear guide, the probe card locking transfer mechanism includes
Stand type support, the stand type support is led to straight line towards being disposed with some levels from top to bottom on the end face of the linear guide
Rail, is installed in some levels to line slideway on the outside of the linear guide, the level is to line slideway perpendicular to described
Vertical installing plate arrangement, is provided with motor cabinet in the stand type support, level is provided with the motor cabinet to driving servo electricity
Machine, to driving the output end of servomotor to be connected with drive screw, the linear guide corresponds to drive screw to the level
Position is provided with feed screw nut, and the drive screw is threadedly coupled the feed screw nut, and the level is driven to driving servomotor
Dynamic stand type support level is acted to vertical vertical installing plate；
The affixed probe card in bottom of the stand type support locks the upper output terminal of transfer structure jacking cylinder, described
The bottom supporting of probe card locking transfer structure jacking cylinder is in the convex support of bottom side of the vertical installing plate.
After technology of the invention, N layer heights direction arrangement probe card enters under the driving of probe card driving structure
Every cell piece is detected and then return in correspondence pallet, to obtain which coordinate be NG product for analysis, it can quickly will be greatly
The cell piece of batch is detected, it is ensured that the efficient of test is carried out.
Brief description of the drawings
Fig. 1 is three-dimensional figure structure schematic representation one of the invention；
Fig. 2 is main view figure structure schematic representation of the invention；
Fig. 3 is three-dimensional figure structure schematic representation two of the invention；
Fig. 4 is the three-dimensional figure structure schematic representation that probe card of the invention locks transfer structure；
Title in figure corresponding to sequence number is as follows：
It is probe card 1, positive probe plate 1-1, negative probe plate 1-2, probe 2, positive probe 2-1, negative probe 2-2, perpendicular
To installing plate 3, riser 4, vertical guide rails 5, the second base plate 6, mounting seat 7, it is front and rear to arrangement guide rail 8, it is vertical to jacking cylinder
9th, vertically to servo press 10, servomotor 11, front and back arrangement ball lead screw drive mechanism 12, cell piece 13, pallet 14, water
Put down to rectilinear orbit 15, avoid hole 16, Cam Follower 17, positioning indent hole slot 18, Cam Follower fixed structure 19, straight line
Guide rod 20, probe card locks transfer structure jacking cylinder 21, stand type support 22, level to line slideway 23, motor cabinet 24, level
To driving servomotor 25, drive screw 26, the convex support 28 of feed screw nut 27, bottom side.
Specific embodiment
A kind of mechanism for testing of cell piece, is shown in Fig. 1~Fig. 4：It includes N layer heights direction arrangement probe card 1, N floor heights
The probe 2 of array of being arranged corresponding to cell piece, the external probe card of probe card 1 are respectively disposed with the probe card 1 of degree direction arrangement
Driving structure, probe card driving structure includes vertical direction, two dimensions of horizontal direction, and probe card 1 is in probe card driving structure
Driving under enter into correspondence pallet in every cell piece is detected and then return.
Probe actuation structure includes vertical installing plate 3, and the dorsal part of probe card 1 is flush-mounted in vertical installing plate 3, vertical to install
The dorsal part of plate 3 is flush-mounted in the vertical guide rails 5 of riser 4, and the lower end of riser 4 is supported on the second base plate 6, under the second base plate 6
End is flush-mounted in the front and rear in arrangement guide rail 8 of the upper surface of mounting seat 7, mounting seat 7 be fixed with it is vertical to jacking cylinder 9, vertically to
The bottom of vertical installing plate 3 is withstood at the top of jacking cylinder 9, connects mounting seat 7, servo electricity to the top of servo press 10 vertically
Machine 10 connects the second base plate 6 by front and back arrangement ball lead screw drive mechanism 12；
The array that the arrangement array of probe is arranged in pallet with cell piece is identical, and every layer of probe card 1 includes positive pole spy
Needle plate 1-1, negative probe plate 1-2, negative probe plate 1-2 are supported on positive probe plate 1-1's by level to rectilinear orbit 15
Upper end, negative probe plate 1-2 can do motion perpendicular to vertical installing plate 3 relative to positive probe plate 1-1, and level is to straight line rail
Road 15 arranges perpendicular to vertical installing plate 3, convex under negative probe plate 1-2 to have a negative probe 2-2, convex under positive probe plate 1-1 to have
The position that positive probe 2-1, positive probe plate 1-1 correspond to negative probe 2-2 is provided with avoidance hole 16；
The side side of negative probe plate 2-2 is convex Cam Follower 17, and positioning inward recess is provided with Cam Follower 17
Groove 18, the positioning indent hole slot 18 pairs of every layer of Cam Follower 17 should have a Cam Follower fixed structure 19, from upper and
Under the outside of all of Cam Follower fixed structure 19 be installed in the side of linear guide 20, outside the bottom of linear guide 20
It is connected to the probe card locking transfer structure jacking cylinder 21 of vertical straight elevator；
The outside of linear guide 20 is disposed with probe card locking transfer structure, and probe card locking transfer mechanism includes vertical branch
Frame 22, stand type support 22 towards some levels are disposed with the end face of linear guide 20 from top to bottom to line slideway 23, directly
The outside of line guide rod 20 is installed in some levels to line slideway 23, and level is to line slideway 23 perpendicular to vertical installing plate 3
Arrangement, is provided with motor cabinet 24 in stand type support 22, level is provided with motor cabinet 24 to servomotor 25 is driven, and level is to drive
The output end of dynamic servomotor 25 is connected with drive screw 26, and the position that linear guide 20 corresponds to drive screw 26 is provided with silk
Stem nut 27, the threaded connection feed screw nut 27 of drive screw 26, level drives the level of stand type support 22 to driving servomotor 25
Acted to perpendicular to vertical installing plate 3；
The upper output terminal of the affixed probe card locking transfer structure jacking cylinder 21 in bottom of stand type support 20, probe card lock
Determine the bottom side convex support 28 of the bottom supporting in vertical installing plate 3 of transfer structure jacking cylinder 21；
After the product tray 14 that N layer heights direction is arranged is transported to mechanism for testing by conveying mechanism, vertically to jacking cylinder 9
Retract, vertical installing plate 3 is carried out the movement of falling object so that probe 2 is contacted with the presence of cell piece 13 in pallet 14, afterwards
Servo press 10 is slow descending so that the cell piece 13 of the correspondence position in probe 2 on probe card 1 and pallet 14 closely connects
Touch, so as to carry out electric current and voltage tester to cell piece 13.
The position of wherein positive probe plate 1-1 is fixed, and negative probe plate 1-2 can be changed or position according to actual needs
Adjustment is, it is necessary to when changing negative probe plate 1-2, probe card locking transfer structure jacking cylinder 21 is vertical to jacking, and then causes
Stand type support 2 rises, and then drives Cam Follower fixed structure 19 to depart from the positioning inward recess of corresponding Cam Follower 17
Groove 18 so that negative probe plate 1-2 can be removed and be changed；After more finishing changing, probe card locking transfer structure jacking cylinder 21
Reset so that drive Cam Follower fixed structure 19 to be plugged in the positioning indent hole slot 18 of corresponding Cam Follower 17, it
Drive level to servomotor 25 is driven afterwards, drive drive screw 26 to rotate, and then drive negative probe plate 1-2 relative to positive pole
Probe card 1-1 carries out the adjustment on probe location, until negative probe 2-2, the position of positive probe 2-1 are adapted to corresponding battery
The detection of piece；
The value of N is 10 in specific embodiment.
Specific embodiment of the invention has been described in detail above, but content is only the preferable implementation of the invention
Example, it is impossible to be considered as the practical range for limiting the invention.All impartial changes made according to the invention application range
Change and improve etc., all should still belong within this patent covering scope.
Claims (7)
1. a kind of mechanism for testing of cell piece, it is characterised in that：It includes N layer heights direction arrangement probe card, N layer height sides
The probe of array of being arranged corresponding to cell piece is respectively disposed with probe card to arrangement, the external probe card of probe card drives
Structure, the probe card driving structure includes vertical direction, two dimensions of horizontal direction, and the probe card drives in the probe card
Entered under the driving of dynamic structure and every cell piece is detected and then return in correspondence pallet, wherein N is more than or equal to 2
Natural number.
2. a kind of mechanism for testing of cell piece as claimed in claim 1, it is characterised in that：The probe actuation structure is included
Vertical installing plate, the dorsal part of the probe card is flush-mounted in vertical installing plate, and the dorsal part of the vertical installing plate is flush-mounted in riser
In vertical guide rails, the lower end of the riser is supported on the second base plate, and the lower end of second base plate is flush-mounted in the mounting seat
Upper surface it is front and rear in arrangement guide rail, the mounting seat be fixed with it is vertical to jacking cylinder, vertically to the top of jacking cylinder
The bottom of the vertical installing plate is withstood, the mounting seat is connected to the top of servo press vertically, servomotor is before and after
Side's arrangement ball lead screw drive mechanism connects second base plate.
3. a kind of mechanism for testing of cell piece as claimed in claim 2, it is characterised in that：Every layer of lower surface of the probe card
The probe of array is inside placed with, the array that the arrangement array of the probe is arranged in pallet with the cell piece is identical.
4. the mechanism for testing of a kind of cell piece as described in claim 1 or 3, it is characterised in that：Every layer of probe card includes
There are positive probe plate, negative probe plate, the negative probe plate is supported on the positive probe plate by level to rectilinear orbit
Upper end, the negative probe plate can do motion perpendicular to vertical installing plate, the level relative to the positive probe plate
Arranged perpendicular to the vertical installing plate to rectilinear orbit, it is convex under the negative probe plate to have negative probe, the positive probe
Convex under plate to have positive probe, the position that positive probe plate corresponds to the negative probe is provided with avoidance hole.
5. a kind of mechanism for testing of cell piece as claimed in claim 4, it is characterised in that：The side side of the negative probe plate
It is convex to have Cam Follower, positioning indent hole slot, the positioning of every layer of the Cam Follower are provided with the Cam Follower
Indent hole slot correspondence has a Cam Follower fixed structure, the outside of top-down all of Cam Follower fixed structure
The side of linear guide is installed in, the bottom of the linear guide is circumscribed with the probe card locking transfer structure top of vertical straight elevator
Rise cylinder.
6. a kind of mechanism for testing of cell piece as claimed in claim 5, it is characterised in that：The outside arrangement of the linear guide
There is probe card to lock transfer structure, the probe card locking transfer mechanism includes stand type support, and the stand type support is described in
Some levels are disposed with the end face of linear guide from top to bottom to line slideway, if being installed on the outside of the linear guide
Dry root level to line slideway, to line slideway perpendicular to the vertical installing plate arrange, in the stand type support by the level
Motor cabinet is provided with, level is provided with the motor cabinet to servomotor is driven, the level is defeated to driving servomotor
Go out end and be connected with drive screw, the position that the linear guide corresponds to drive screw is provided with feed screw nut, the driving silk
Bar is threadedly coupled the feed screw nut.
7. a kind of mechanism for testing of cell piece as claimed in claim 6, it is characterised in that：The bottom of the stand type support is affixed
The probe card locks the upper output terminal of transfer structure jacking cylinder, and the probe card locks the bottom of transfer structure jacking cylinder
Portion is supported on the convex support of bottom side of the vertical installing plate.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710231160.0A CN106841887B (en) | 2017-04-10 | 2017-04-10 | Test mechanism for battery piece |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710231160.0A CN106841887B (en) | 2017-04-10 | 2017-04-10 | Test mechanism for battery piece |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN106841887A true CN106841887A (en) | 2017-06-13 |
| CN106841887B CN106841887B (en) | 2023-12-19 |
Family
ID=59147420
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710231160.0A Active CN106841887B (en) | 2017-04-10 | 2017-04-10 | Test mechanism for battery piece |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106841887B (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107422217A (en) * | 2017-09-15 | 2017-12-01 | 苏州迈为科技股份有限公司 | A kind of cell slice test mechanism |
| CN112198342A (en) * | 2020-10-10 | 2021-01-08 | 歌尔科技有限公司 | Battery testing device |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010078576A (en) * | 2008-09-29 | 2010-04-08 | Sumitomo Heavy Ind Ltd | Inspection device of battery cell |
| CN101786086A (en) * | 2010-04-09 | 2010-07-28 | 广州市番禺江侨电子设备厂 | Battery automatic detection separation equipment |
| CN201607521U (en) * | 2009-12-01 | 2010-10-13 | 深圳市精实机电科技有限公司 | Probe bed assembly for battery detection and detecting device applying probe bed assembly |
| CN105070951A (en) * | 2015-09-07 | 2015-11-18 | 浙江杭可科技有限公司 | Formatting and grading equipment for square lithium-ion batteries |
| CN105206876A (en) * | 2015-09-07 | 2015-12-30 | 浙江杭可科技有限公司 | Automatic preformation equipment for cylindrical lithium ion battery |
| CN206671457U (en) * | 2017-04-10 | 2017-11-24 | 苏州菱欧自动化科技股份有限公司 | A kind of mechanism for testing of cell piece |
-
2017
- 2017-04-10 CN CN201710231160.0A patent/CN106841887B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010078576A (en) * | 2008-09-29 | 2010-04-08 | Sumitomo Heavy Ind Ltd | Inspection device of battery cell |
| CN201607521U (en) * | 2009-12-01 | 2010-10-13 | 深圳市精实机电科技有限公司 | Probe bed assembly for battery detection and detecting device applying probe bed assembly |
| CN101786086A (en) * | 2010-04-09 | 2010-07-28 | 广州市番禺江侨电子设备厂 | Battery automatic detection separation equipment |
| CN105070951A (en) * | 2015-09-07 | 2015-11-18 | 浙江杭可科技有限公司 | Formatting and grading equipment for square lithium-ion batteries |
| CN105206876A (en) * | 2015-09-07 | 2015-12-30 | 浙江杭可科技有限公司 | Automatic preformation equipment for cylindrical lithium ion battery |
| CN206671457U (en) * | 2017-04-10 | 2017-11-24 | 苏州菱欧自动化科技股份有限公司 | A kind of mechanism for testing of cell piece |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107422217A (en) * | 2017-09-15 | 2017-12-01 | 苏州迈为科技股份有限公司 | A kind of cell slice test mechanism |
| CN112198342A (en) * | 2020-10-10 | 2021-01-08 | 歌尔科技有限公司 | Battery testing device |
| CN112198342B (en) * | 2020-10-10 | 2022-06-03 | 歌尔科技有限公司 | Battery testing device |
Also Published As
| Publication number | Publication date |
|---|---|
| CN106841887B (en) | 2023-12-19 |
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| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| CB02 | Change of applicant information |
Address after: 215000 building 4 and 5, No. 4, South Dongwu Road, Wuzhong Economic Development Zone, Suzhou City, Jiangsu Province Applicant after: SUZHOU SETTEN LINGOU INTELLIGENT TECHNOLOGY Co.,Ltd. Address before: 215124 88 West Sheng street, Wuzhong District, nine, Jiangsu, Suzhou Province Applicant before: SUZHOU LINGOU AUTOMATION TECHNOLOGY Co.,Ltd. |
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