CN206671457U - A kind of mechanism for testing of cell piece - Google Patents

Abstract

The utility model provides a testing mechanism for battery slices, which can quickly test a large number of battery slices to ensure efficient testing. It includes probe cards arranged in the height direction of N layers. Probes corresponding to the arrangement array of cells are respectively arranged on the probe boards arranged in the height direction of N layers. The driving structure of the probe card includes two dimensions of the vertical direction and the horizontal direction. The probe card enters the corresponding tray under the drive of the driving structure of the probe card to detect each battery sheet and then returns, wherein N is a natural number greater than or equal to 2. The cell testing mechanism provided by the utility model can quickly detect a large number of cells to ensure efficient testing.

Description

A battery test mechanism

technical field

The utility model relates to the technical field of battery sheet detection, in particular to a battery sheet testing mechanism.

Background technique

Existing detection of battery slices, after arranging the single battery slices on the tray, the tray is transported to the corresponding product testing station along the conveyor belt, and the product testing station removes the tray and passes the testing machine to test each piece. The cells are tested, and the detected NG products are directly excluded to the NG product discharge production line, and the qualified products are placed in the qualified product production line for output. The space is huge and not utilized for subsequent organization and storage.

Contents of the invention

In view of the above problems, the utility model provides a testing mechanism for battery slices, which can quickly test a large number of battery slices to ensure efficient testing.

A test mechanism for a cell, characterized in that: it includes probe boards arranged in the height direction of N layers, and probes corresponding to the cell array are respectively arranged on the probe boards arranged in the height direction of the N layers, The probe card is externally connected to the probe card driving structure, and the probe card driving structure includes two dimensions of vertical direction and horizontal direction, and the probe card enters into the corresponding tray driven by the probe card driving structure Each cell is detected and returned, where N is a natural number greater than or equal to 2.

It is further characterized by:

The probe driving structure includes a vertical mounting plate, the back side of the probe board is embedded in the vertical mounting plate, and the back side of the vertical mounting plate is embedded in the vertical guide rail of the vertical plate, so The lower end of the vertical plate is supported on the second bottom plate, and the lower end of the second bottom plate is embedded in the front and rear guide rails arranged on the upper surface of the mounting base. The mounting base is fixed with a vertical jacking cylinder, and the vertical jacking The top of the lifting cylinder bears against the bottom of the vertical mounting plate, and is vertically connected to the mounting seat on the top of the servo press, and the servo motor is connected to the second bottom plate through a ball screw transmission mechanism arranged in the front and rear;

An array of probes is arranged on the lower end surface of each layer of the probe card, and the array of the probes is the same as the array of the cells arranged in the tray;

The probe board of each layer includes a positive probe board and a negative probe board, and the negative probe board is supported on the upper end of the positive probe board by a horizontal linear track, and the negative probe board can be relatively The positive probe board moves vertically to the vertical mounting plate, the horizontal linear track is arranged perpendicular to the vertical mounting plate, the negative probe board protrudes from the negative probe, and the positive probe There is a positive probe protruding under the board, and the positive probe board is provided with an avoidance hole corresponding to the position of the negative probe;

One side of the negative probe card is protruded with a cam follower, and the cam follower is provided with a positioning concave hole groove, and the positioning concave hole groove of the cam follower on each layer corresponds to a The cam follower fixing structure, the outer sides of all the cam follower fixing structures from top to bottom are fixed on one side of the linear guide rod, and the lower part of the linear guide rod is externally connected with a vertically lifting probe card locking shifter. Load structure jacking cylinder;

A probe card locking and transferring structure is arranged on the outer side of the linear guide rod, and the probe card locking and transferring mechanism includes a vertical support, and the vertical support is arranged from top to bottom toward the end surface of the linear guide rod There are several horizontal linear guide rails, the outer sides of the linear guide rods are clamped on several horizontal linear guide rails, the horizontal linear guide rails are arranged perpendicular to the vertical mounting plate, and the vertical bracket is provided with a motor Seat, the motor seat is provided with a horizontal drive servo motor, the output end of the horizontal drive servo motor is connected with a drive screw, and the linear guide rod is provided with a screw nut corresponding to the position of the drive screw. The driving screw is threadedly connected to the screw nut, and the horizontal driving servo motor drives the vertical bracket to move horizontally and vertically to the vertical mounting plate;

The bottom of the vertical bracket is fixedly connected to the upper output end of the lifting cylinder of the probe card locking and transferring structure, and the bottom of the lifting cylinder of the probe card locking and transferring structure is supported on the bottom of the vertical mounting plate Side convex bracket.

After adopting the technology of the utility model, the probe boards arranged in the height direction of N layers enter the corresponding tray under the drive of the probe board driving structure to detect each battery piece, and then return it, and analyze which coordinates are NG products, It can quickly test a large number of cells to ensure efficient testing.

Description of drawings

Fig. 1 is a perspective view structural representation one of the utility model;

Fig. 2 is the structural representation of the front view of the utility model;

Fig. 3 is the perspective view structure schematic diagram two of the present utility model;

Fig. 4 is a perspective structural schematic diagram of the probe card locking and transferring structure of the present invention;

The names corresponding to the serial numbers in the figure are as follows:

Probe board 1, positive probe board 1-1, negative probe board 1-2, probe 2, positive probe 2-1, negative probe 2-2, vertical mounting plate 3, vertical plate 4, vertical Guide rail 5, second bottom plate 6, mounting seat 7, front and rear arrangement guide rail 8, vertical jacking cylinder 9, vertical servo press 10, servo motor 11, front and rear arrangement ball screw transmission mechanism 12, battery Sheet 13, tray 14, horizontal linear track 15, avoidance hole 16, cam follower 17, positioning inner concave hole groove 18, cam follower fixing structure 19, linear guide rod 20, probe plate locking and transferring structure top Cylinder 21, vertical support 22, horizontal linear guide rail 23, motor base 24, horizontal driving servo motor 25, driving screw mandrel 26, screw mandrel nut 27, bottom side convex bracket 28.

detailed description

A test mechanism for battery chips, see Figures 1 to 4: it includes probe cards 1 arranged in the height direction of N layers, and probe cards 1 arranged in the height direction of N layers are respectively arranged with The probe 2 of the array, the probe board 1 is externally connected to the probe board driving structure, the probe board driving structure includes two dimensions of vertical direction and horizontal direction, and the probe board 1 enters the corresponding tray driven by the probe board driving structure Each cell is tested and returned.

The probe drive structure includes a vertical mounting plate 3, the back side of the probe board 1 is embedded in the vertical mounting plate 3, the back side of the vertical mounting plate 3 is embedded in the vertical guide rail 5 of the vertical plate 4, and the vertical The lower end of the plate 4 is supported on the second base plate 6, and the lower end of the second base plate 6 is embedded in the front and rear guide rails 8 arranged on the upper surface of the mounting base 7. The mounting base 7 is fixed with a vertical jacking cylinder 9, which can be lifted vertically. The top of the cylinder 9 bears against the bottom of the vertical mounting plate 3, and is vertically connected to the mounting seat 7 on the top of the servo press 10, and the servo motor 10 is connected to the second bottom plate 6 through the ball screw transmission mechanism 12 arranged in the front and rear;

The array of probes is the same as the array of cells arranged in the tray. Each probe card 1 includes a positive probe card 1-1 and a negative probe card 1-2. The negative probe card 1-2 passes through The horizontal linear track 15 is supported on the upper end of the positive probe card 1-1, the negative probe card 1-2 can move perpendicular to the vertical mounting plate 3 relative to the positive probe card 1-1, and the horizontal linear track 15 Arranged perpendicular to the vertical mounting plate 3, the negative probe board 1-2 is protruded with the negative probe 2-2, the positive probe board 1-1 is protruded with the positive probe 2-1, and the positive probe board 1-1 An avoidance hole 16 is provided at a position corresponding to the negative electrode probe 2-2;

One side of the negative electrode probe card 2-2 is protruded with a cam follower 17, and the cam follower 17 is provided with a positioning inner concave hole groove 18, and the positioning inner concave hole groove 18 of the cam follower 17 of each layer corresponds to There is a cam follower fixing structure 19, and the outer sides of all the cam follower fixing structures 19 from top to bottom are fixed on one side of the linear guide rod 20, and the bottom of the linear guide rod 20 is externally connected with a probe for vertical lifting. Needle plate locking transfer structure jacking cylinder 21;

The outer side of the linear guide rod 20 is arranged with a probe board locking and transferring structure. The probe board locking and transferring mechanism includes a vertical support 22, and the end surface of the vertical support 22 facing the linear guide rod 20 is arranged from top to bottom. To the linear guide rail 23, the outer side of the linear guide rod 20 is clamped on several horizontal linear guide rails 23, the horizontal linear guide rail 23 is arranged perpendicular to the vertical mounting plate 3, and the vertical support 22 is provided with a motor seat 24, and the motor seat 24 A horizontal drive servo motor 25 is arranged on the top, and the output end of the horizontal drive servo motor 25 is connected with a drive screw 26. The position of the linear guide rod 20 corresponding to the drive screw 26 is provided with a screw nut 27, and the drive screw 26 is threaded. Connect the screw nut 27, and drive the servo motor 25 horizontally to drive the vertical bracket 22 to move horizontally and vertically to the vertical mounting plate 3;

The bottom of the vertical support 20 is fixedly connected to the upper output end of the jacking cylinder 21 of the probe card locking transfer structure, and the bottom of the jacking cylinder 21 of the probe card locking transfer structure is supported on the bottom side convex bracket 28 of the vertical mounting plate 3 ;

After the conveying mechanism transports the product trays 14 arranged in the height direction of N layers to the testing mechanism, it retracts vertically to the jacking cylinder 9 to make the vertical mounting plate 3 perform a free fall movement, so that the probe 2 and the battery chips in the tray 14 13 contacts, and then the servo press 10 slowly descends, so that the probes 2 on the probe card 1 are in close contact with the battery slices 13 at the corresponding positions in the tray 14, so that the battery slices 13 are tested for current and voltage.

Among them, the position of the positive probe card 1-1 is fixed, and the negative probe card 1-2 can be replaced or adjusted according to actual needs. When the negative probe card 1-2 needs to be replaced, the probe card locks the transfer structure and lifts the cylinder 21 is lifted vertically, so that the vertical support 2 rises, and then drives the cam follower fixing structure 19 to break away from the positioning concave hole 18 of the corresponding cam follower 17, so that the negative electrode probe card 1-2 can be taken out Replacement; after the replacement, the probe board locking transfer structure jacking cylinder 21 is reset, so that the drive cam follower fixing structure 19 is inserted into the positioning concave hole 18 of the corresponding cam follower 17, and then drives the horizontal To drive the servo motor 25, drive the driving screw 26 to rotate, and then drive the negative probe board 1-2 to adjust the position of the probe relative to the positive probe board 1-1 until the negative probe 2-2 and the positive probe The position of 2-1 is suitable for the detection of the corresponding cell;

In the specific embodiment, the value of N is 10.

The specific embodiments of the utility model have been described in detail above, but the content is only a preferred embodiment of the utility model creation, and cannot be considered as limiting the implementation scope of the utility model creation. All equal changes and improvements made according to the application scope of the utility model should still belong to the scope of the patent.

Claims (7)

1. A kind of 1. mechanism for testing of cell piece, it is characterised in that：It includes N layer heights direction arrangement probe card, N layer height sides The probe corresponding to cell piece arrangement array, the external probe card driving of probe card are respectively disposed with to the probe card of arrangement Structure, the probe card driving structure include two vertical direction, horizontal direction dimensions, and the probe card drives in the probe card Entered under the driving of dynamic structure in corresponding pallet and every cell piece is detected and then retracted, wherein N is more than or equal to 2 Natural number.
2. A kind of 2. mechanism for testing of cell piece as claimed in claim 1, it is characterised in that：The probe actuation structure includes Vertical installing plate, the dorsal part of the probe card are flush-mounted in vertical installing plate, and the dorsal part of the vertical installing plate is flush-mounted in riser In vertical guide rails, the lower end of the riser is supported on the second bottom plate, and the lower end of second bottom plate is flush-mounted in the mounting seat Upper surface it is front and rear to arrangement guide rail in, the mounting seat is fixed with vertically to jacking cylinder, vertically to the top of jacking cylinder The bottom of the vertical installing plate is withstood, connects the mounting seat to the top of servo press vertically, servomotor passes through front and rear Side's arrangement ball lead screw drive mechanism connects second bottom plate.
3. A kind of 3. mechanism for testing of cell piece as claimed in claim 2, it is characterised in that：The lower surface of every layer of probe card The probe of array is inside placed with, the array that the arrangement array of the probe is arranged in the cell piece in pallet is identical.
4. A kind of 4. mechanism for testing of cell piece as described in claim 1 or 3, it is characterised in that：Every layer of probe card includes There are positive probe plate, negative probe plate, the negative probe plate is supported on the positive probe plate by level to rectilinear orbit Upper end, the negative probe plate can do the motion perpendicular to vertical installing plate, the level relative to the positive probe plate Arranged to rectilinear orbit perpendicular to the vertical installing plate, it is convex under the negative probe plate to have negative probe, the positive probe Convex under plate to have positive probe, the position that positive probe plate corresponds to the negative probe is provided with avoid holes.
5. A kind of 5. mechanism for testing of cell piece as claimed in claim 4, it is characterised in that：The side side of the negative probe plate It is convex to have Cam Follower, positioning indent hole slot, the positioning of every layer of the Cam Follower are provided with the Cam Follower Indent hole slot is corresponding with a Cam Follower fixed structure, the outside of top-down all Cam Follower fixed structures The side of linear guide is installed in, the bottom of the linear guide is circumscribed with the probe card locking transfer structure top of vertical straight elevator Rise cylinder.
6. A kind of 6. mechanism for testing of cell piece as claimed in claim 5, it is characterised in that：The outside arrangement of the linear guide There is probe card to lock transfer structure, the probe card locking transfer mechanism includes stand type support, and the stand type support is described in Some levels are disposed with the end face of linear guide from top to bottom to line slideway, if being installed on the outside of the linear guide Dry root level is to line slideway, and the level is arranged to line slideway perpendicular to the vertical installing plate, in the stand type support Motor cabinet is provided with, is provided with the motor cabinet horizontal defeated to driving servomotor to driving servomotor, the level Go out end and be connected with drive screw, the position that the linear guide corresponds to drive screw is provided with feed screw nut, the driving silk Bar is threadedly coupled the feed screw nut.
7. A kind of 7. mechanism for testing of cell piece as claimed in claim 6, it is characterised in that：The bottom of the stand type support is affixed The upper output terminal of the probe card locking transfer structure jacking cylinder, the bottom of the probe card locking transfer structure jacking cylinder Portion is supported on the convex support of bottom side of the vertical installing plate.