CN106768310B - A kind of superlaser detector array sampling attenuating device - Google Patents
A kind of superlaser detector array sampling attenuating device Download PDFInfo
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- CN106768310B CN106768310B CN201710045032.7A CN201710045032A CN106768310B CN 106768310 B CN106768310 B CN 106768310B CN 201710045032 A CN201710045032 A CN 201710045032A CN 106768310 B CN106768310 B CN 106768310B
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- Prior art keywords
- attenuator
- copper coin
- hole
- sampling
- fixed plate
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- 238000005070 sampling Methods 0.000 title claims abstract description 61
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims abstract description 81
- 229910052802 copper Inorganic materials 0.000 claims abstract description 81
- 239000010949 copper Substances 0.000 claims abstract description 81
- 238000003825 pressing Methods 0.000 claims abstract description 18
- 239000000463 material Substances 0.000 claims description 12
- 239000004411 aluminium Substances 0.000 claims description 8
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 8
- 229910052782 aluminium Inorganic materials 0.000 claims description 8
- 238000007747 plating Methods 0.000 claims description 6
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 2
- 229910002804 graphite Inorganic materials 0.000 claims description 2
- 239000010439 graphite Substances 0.000 claims description 2
- 238000009434 installation Methods 0.000 claims 1
- 238000005259 measurement Methods 0.000 abstract description 9
- 238000001514 detection method Methods 0.000 abstract description 6
- 238000002310 reflectometry Methods 0.000 abstract description 3
- 238000000034 method Methods 0.000 description 4
- TVEXGJYMHHTVKP-UHFFFAOYSA-N 6-oxabicyclo[3.2.1]oct-3-en-7-one Chemical compound C1C2C(=O)OC1C=CC2 TVEXGJYMHHTVKP-UHFFFAOYSA-N 0.000 description 1
- 238000002679 ablation Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 239000007770 graphite material Substances 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
- G01J1/0418—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using attenuators
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Testing Of Coins (AREA)
Abstract
The invention provides a kind of superlaser detector array sampling attenuating device, the sampling attenuating device includes several structure identicals according to rule arrangement and samples attenuator.Each sampling attenuator includes preceding copper coin, rear copper coin, attenuator fixed plate, attenuator and attenuator pressing plate.The front portion of sampling attenuator is provided with preceding copper coin, and rear copper coin is close to preceding copper coin, and attenuator fixed plate is close to rear copper coin, and attenuator is arranged in attenuator fixed plate, and attenuator pressing plate is close to attenuator.Laser beam is sampled using two spaces inclined hole on preceding copper coin in the present invention, it is possible to achieve the wide-angle of laser beam is detected.Preceding copper coin is used for the non-sampling superlaser of diffusing reflection, has higher damage threshold.Pass through the ball decay set between preceding copper coin, rear copper coin and attenuator thickness or reflectivity regulation decay multiplying power.The present invention solves the problems, such as high-energy-density and big detection angle in detector array measurement, is measured for Distribution of laser intensity significant.
Description
Technical field
The invention belongs to laser parameter measurement technical field, and in particular to a kind of superlaser detector array is declined with sampling
Subtract device.
Background technology
Application of the laser in fields such as scientific research, industry, national defence is increasingly extensive, it is often necessary to which heavy caliber high power density is swashed
Optical parameter parameter related to intensity distribution such as power, intensity distribution, barycenter, shake measures simultaneously.Measurement intensity at present
The main method of distributed constant has ablation, scanning method, detector array method, imaging method etc..In installing space confined condition,
Using important means of the superlaser detector array as heavy caliber high power density laser parameter measurement.When laser power is close
Degree is high, and when requiring that measuring apparatus has wide-angle detection angle, existing detector array method because detection angle is limited can not
Meet requirement.
The content of the invention
In order to overcome the sampling attenuating device in prior art used in laser array detector to be difficult to bear superlaser and
The deficiency of big detection angle scope, the present invention provide a kind of superlaser detector array sampling attenuating device, energy of the present invention
It is enough that direct measurement is carried out in the range of larger detection angle to high energy density laser.
The present invention is achieved by the following technical solution：
A kind of superlaser detector array of present invention sampling attenuating device, is characterized in, the sampling decay dress
Put and press array arrangement containing several structure identicals sampling attenuator, sampling attenuator.Each sampling attenuator includes preceding copper
Plate, rear copper coin, attenuator fixed plate, columned attenuator and attenuator pressing plate.
The front portion of described sampling attenuator is provided with preceding copper coin, copper coin, attenuator after having been overlayed successively after preceding copper coin
Fixed plate, attenuator pressing plate.Attenuator fixed plate is close to rear copper coin, and attenuator is arranged in attenuator fixed plate, attenuator pressure
Plate is close to attenuator.
Inclined hole I, the inclined hole II of circle are provided with the preceding copper coin.The rear surface of preceding copper coin is provided with half ball I,
The preceding surface of copper coin is provided with half ball II afterwards, and half ball I on surface and half ball II of rear copper coin form one after preceding copper coin
Individual ball.Copper coin is provided centrally with a circular through hole I afterwards, and attenuator fixed plate is provided centrally with through hole II, after through hole II
Circular hole is provided with, the front end of attenuator fixed plate is provided with a round platform rank for being used to place attenuator.Attenuator pressing plate center is set
It is equipped with a circular through hole III.Attenuator fixed plate is affixed on rear copper coin, and attenuator is arranged in the circular hole of attenuator fixed plate.
Inclined hole I in the sampling attenuator is arranged to space symmetr structure with inclined hole II, and inclined hole I is with inclined hole II in a folder
Angle α, the front end of inclined hole I and inclined hole II are stacked positioned at preceding surface, its rear end of preceding copper coin respectively, are stacked hole position in half ball I.
Described attenuator is arranged on the round platform rank of attenuator fixed plate, and left end is affixed on the logical of round platform rank, right-hand member and attenuator pressing plate
The left end of hole III flushes.Half described ball I, half ball II, through hole I, through hole II, circular hole, through hole III are concentric setting.
Described preceding copper coin is used for superlaser beam sampler, and diffusing reflection is carried out to non-sampling laser.
Copper coin is used for the heat of copper coin before transmitting afterwards, and preceding copper coin forms ball and carries out one to the laser beam after sampling together
Level decay, while export the laser after decay.
Attenuator fixed plate is used for fixed attenuation piece, while the laser beam after output attenuatoin.Attenuator is used to sample laser
The two level decay of beam, the decay multiplying power of sampling attenuator can be adjusted by the thickness or reflectivity that adjust attenuator.
Through hole I, through hole II in described sampling attenuator are to be set with diameter.
The diameter of described attenuator is more than through hole II, the diameter of through hole III.
The ball diameter that half ball I and half ball II are formed in the sampling attenuator is more than the diameter of through hole I.
The scope at described α angles is 5 °~30 °.
Preceding copper sheet material in the present invention uses the red copper handled through surface gold-plating or aluminium.Copper sheet material is plated using surface afterwards
The red copper or aluminium, attenuator fixed plate material of gold use nigrescence aluminium or graphite material.
Described refers to that several sampling attenuating devices decline by square or other array arrangements, adjacent sampling by rule arrangement
Subtract the distance between device and could be arranged to equal, may be alternatively provided as.
The invention has the advantages that solve in the high energy density laser direct measurement in detector array measurement,
Explorer response angle problem less than normal, the angular response scope of detector array is effectively improved, can be to high energy density laser
Direct measurement is carried out in the range of larger detection angle, it is significant to light laser intensity distribution measurement.
Brief description of the drawings：
Fig. 1 is that the superlaser detector array of the present invention samples the structural representation of attenuating device；
Fig. 2 is the structural representation that the superlaser detector array of the present invention samples the sampling attenuator in attenuating device
Figure；
In figure, the inclined hole I of 3. attenuator fixed plate of copper coin, 4. attenuator pressing plate, 5. attenuator 6. after copper coin 2. before 1.
7. the through hole III of II 12. circular hole of inclined hole II 8. half ball, I 9. half ball, II 10. through hole, I 11. through hole 13..
Embodiment：
The present invention is described in detail with specific embodiment below in conjunction with the accompanying drawings.
Embodiment 1
Fig. 1 is that the superlaser detector array of the present invention samples the structural representation of attenuating device, and Fig. 2 is the present invention
Superlaser detector array with sampling attenuating device in sampling attenuator structural representation.In Fig. 1, Fig. 2, this hair
A kind of bright superlaser detector array sampling attenuating device, samples attenuator, sampling declines containing several structure identicals
Subtract device by array arrangement.Each sampling attenuator includes preceding copper coin 1, rear copper coin 2, attenuator fixed plate 3, columned attenuator
5 and attenuator pressing plate 4.
The front portion of described sampling attenuator is provided with preceding copper coin 1, copper coin 2, decay after having been overlayed successively after preceding copper coin 1
Piece fixed plate 3, attenuator pressing plate 4；Attenuator fixed plate 3 is used for fixed attenuation piece 5, and receives the laser that copper coin 2 is decayed after.
Attenuator fixed plate 3 is close to rear copper coin 2, and attenuator 5 is arranged in attenuator fixed plate 3, and attenuator pressing plate 4 is close to
Attenuator 5.
Attenuator 5 is used to further decay to the laser after copper coin 2 is decayed after, by the thickness for adjusting attenuator 5
Degree or reflectivity can adjust the decay multiplying power of sampling attenuator.
Attenuator pressing plate 4 is used for fixed attenuation piece 5, while exports the laser beam after decay.
Preceding copper coin 1 is provided with the inclined hole I 6 of circle, inclined hole II 7, and the rear surface of preceding copper coin 1 is provided with half ball I 8,
The preceding surface of copper coin 2 is provided with half ball II 9 afterwards；Half ball I 8 and half ball II of rear copper coin 2 on the rear surface of preceding copper coin 1
9 form a ball；Copper coin 2 is provided centrally with a circular through hole I 10 afterwards, and attenuator fixed plate 3 is provided centrally with through hole II
The 11st, circular hole 12 is set after through hole II 11；Attenuator pressing plate 4 is provided centrally with a circular through hole III 13；Attenuator fixed plate
3 are affixed on rear copper coin 2, and attenuator 5 is arranged in the circular hole 12 of fixed plate 3；The front end of attenuator fixed plate 3 is provided with one and is used for
Place the round platform rank of attenuator.
Inclined hole I 6 in the sampling attenuator is arranged to space symmetr structure with inclined hole II 7, and inclined hole I 6 is in inclined hole II 7
One angle α, the front end of inclined hole I 6 and inclined hole II 7 are stacked positioned at preceding surface, its rear end of preceding copper coin 1 respectively, are stacked hole position in half
In ball I 8；Attenuator 5 is arranged on the round platform rank of attenuator fixed plate 3, and the left end of attenuator 5 is affixed on round platform rank, right-hand member with declining
The left end of through hole III 3 for subtracting piece pressing plate 4 flushes；Half ball I 8, half ball II 9, through hole I 10, through hole II 11, circular hole 12, through hole III
13 be concentric setting.
Through hole I 10, through hole II 11 in described sampling attenuator are to be set with diameter.
The diameter of described attenuator 5 is more than through hole II 11, the diameter of through hole III 13.
The ball diameter that half ball I 8 and half ball II 9 are formed in the sampling attenuator is more than the diameter of through hole I 10.
In the present invention, attenuator 5 is arranged to cylindric or sheet；Sampling attenuator presses square or circular arrangement.
In the present embodiment, superlaser detector array of the invention sampling attenuating device declines comprising 999 samplings
It is equal to subtract the distance between device, square arrangement, adjacent samples attenuator, is disposed as 10mm, sampling attenuating device profile is side
Shape；Described α angles are 10 °；The material of preceding copper coin 1 uses the red copper handled through surface gold-plating.The material of copper coin 2 uses surface afterwards
Gold-plated aluminium, the material of attenuator fixed plate 3 use nigrescence aluminium.
Preceding copper coin 1 is used for superlaser beam sampler, and diffusing reflection is carried out to non-sampling laser.
Copper coin 2 is used for the heat of copper coin 1 before transmitting afterwards, and preceding copper coin 1 forms ball and the laser beam after sampling is entered together
Row one-level decays, while exports the laser after decay.
Embodiment 2
The present embodiment is identical with the basic structure of embodiment 1, and difference is that the sampling attenuator number is 600
It is individual, in the present embodiment, the spacing of adjacent samples attenuator setting, wherein, it is arranged on 400 sampling decay in centre position
200 sampling attenuator spacing that the spacing of device is 5mm, is arranged on surrounding are 10mm, and sampling attenuating device profile is cylinder.
Described α angles are 23 °.
Embodiment 3
The present embodiment is identical with the basic structure of embodiment 1, and difference is that the sampling attenuator number is 700
It is individual, in the present embodiment, the spacing of adjacent samples attenuator setting, wherein, it is arranged on 400 sampling decay in centre position
300 sampling attenuator spacing that the spacing of device is 5mm, is arranged on surrounding are 10mm, and sampling attenuating device profile is square；Institute
The α angles stated are 8 °；Preceding copper sheet material uses the red copper handled through surface gold-plating.Copper sheet material uses the red copper of surface gold-plating afterwards,
Attenuator fixed plate material uses graphite.
It should be noted last that above example only limits to illustrate rather than, although implementing with reference to preferable
Example the present invention is described in detail, it will be understood by those within the art that, the present invention can be modified or
Person's equivalent substitution, without departing from the spirit and scope of the present invention, it all should cover among the privilege requirements scope of the present invention.
Claims (6)
- A kind of 1. superlaser detector array sampling attenuating device, it is characterised in that：Described sampling attenuating device contains Several structure identicals sample attenuator, and sampling attenuator presses array arrangement；Each sampling attenuator include preceding copper coin (1), after Copper coin (2), attenuator fixed plate (3), columned attenuator (5) and attenuator pressing plate (4)；Described preceding copper coin (1) is used for superlaser beam sampler, and diffusing reflection is carried out to non-sampling laser；Copper coin (2) is used for the heat for transmitting preceding copper coin (1) afterwards；Attenuator fixed plate (3), attenuator pressing plate (4) are used for fixed attenuation piece (5)；The front portion of described sampling attenuator is provided with preceding copper coin (1), has overlayed rear copper coin (2) successively after preceding copper coin (1), has declined Subtract piece fixed plate (3), attenuator pressing plate (4)；Inclined hole I (6), the inclined hole II (7) of circle are provided with described preceding copper coin (1)；It is provided with the rear surface of preceding copper coin (1) Half ball I (8), the preceding surface of rear copper coin (2) are provided with half ball II (9), half ball I on the rear surface of preceding copper coin (1) (8) half ball II (9) with rear copper coin (2) forms a ball；Copper coin (2) is provided centrally with a circular through hole I (10) afterwards, Attenuator fixed plate (3) is provided centrally with through hole II (11), circular hole (12) is provided with after through hole II (11)；Attenuator pressing plate (4) it is provided centrally with a circular through hole III (13)；Attenuator fixed plate (3) is affixed on rear copper coin (2), attenuator (5) installation In the circular hole (12) of attenuator fixed plate (3)；The front end of attenuator fixed plate (3) is provided with one and is used to place attenuator (5) Round platform rank；Inclined hole I (6) in the sampling attenuator is arranged to space symmetr structure, inclined hole I (6) and inclined hole II with inclined hole II (7) (7) it is in an angle α, the front end of inclined hole I (6) and inclined hole II (7) is stacked positioned at preceding surface, its rear end of preceding copper coin (1) respectively, phase Folded hole position is in half ball I (8)；Attenuator (5) is arranged on the round platform rank of attenuator fixed plate (3), the left end of attenuator (5) It is affixed on round platform rank, right-hand member flushes with through hole III (13) left end of attenuator pressing plate (4)；Described half ball I (8), half ball II (9), through hole I (10), through hole II (11), circular hole (12) and through hole III (13) are concentric setting.
- 2. superlaser detector array according to claim 1 sampling attenuating device, it is characterised in that：Described α The scope at angle is 5 °~30 °.
- 3. superlaser detector array according to claim 1 sampling attenuating device, it is characterised in that：Described takes Half ball I (8) is more than the diameter of through hole I (10) with the ball diameter that half ball II (9) is formed in sample attenuator.
- 4. superlaser detector array according to claim 1 sampling attenuating device, it is characterised in that：Described declines The diameter for subtracting piece (5) is more than the diameter of through hole II (11) and through hole III (13).
- 5. superlaser detector array according to claim 1 sampling attenuating device, it is characterised in that：Described takes Through hole I (10), through hole II (11) in sample attenuator are to be set with diameter.
- 6. superlaser detector array according to claim 1 sampling attenuating device, it is characterised in that：Before described The material of copper coin (1) uses the red copper handled through surface gold-plating or aluminium；Afterwards the material of copper coin (2) using surface gold-plating red copper or Aluminium, the material of attenuator fixed plate (3) use nigrescence aluminium or graphite.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710045032.7A CN106768310B (en) | 2017-01-22 | 2017-01-22 | A kind of superlaser detector array sampling attenuating device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710045032.7A CN106768310B (en) | 2017-01-22 | 2017-01-22 | A kind of superlaser detector array sampling attenuating device |
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| Publication Number | Publication Date |
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| CN106768310A CN106768310A (en) | 2017-05-31 |
| CN106768310B true CN106768310B (en) | 2018-04-10 |
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| CN201710045032.7A Expired - Fee Related CN106768310B (en) | 2017-01-22 | 2017-01-22 | A kind of superlaser detector array sampling attenuating device |
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Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109579984B (en) * | 2018-12-27 | 2021-04-02 | 西北核技术研究所 | Laser beam homogenization attenuator |
| CN110544861A (en) * | 2019-09-18 | 2019-12-06 | 北京理工大学 | Laser attenuation protection device |
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|---|---|---|---|---|
| US5514871A (en) * | 1994-01-13 | 1996-05-07 | Trojan Technologies | Optical radiation sensor device |
| CN102384783A (en) * | 2011-08-15 | 2012-03-21 | 西北核技术研究所 | High-energy laser semi-integrating-sphere array attenuator |
| CN102410875A (en) * | 2011-08-15 | 2012-04-11 | 西北核技术研究所 | Array attenuator for high-energy laser and manufacturing method thereof |
| CN102706446A (en) * | 2012-05-18 | 2012-10-03 | 中国工程物理研究院应用电子学研究所 | Large-angle used sampling attenuation device of array detector |
| CN103644967A (en) * | 2013-11-29 | 2014-03-19 | 西北核技术研究所 | High-energy laser homogenizing cavity attenuator |
| CN104133302A (en) * | 2014-07-24 | 2014-11-05 | 中国工程物理研究院应用电子学研究所 | Intense laser sampling attenuator |
| CN206410783U (en) * | 2017-01-22 | 2017-08-15 | 中国工程物理研究院应用电子学研究所 | A kind of superlaser detector array sampling attenuating device |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5877500A (en) * | 1997-03-13 | 1999-03-02 | Optiscan Biomedical Corporation | Multichannel infrared detector with optical concentrators for each channel |
-
2017
- 2017-01-22 CN CN201710045032.7A patent/CN106768310B/en not_active Expired - Fee Related
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5514871A (en) * | 1994-01-13 | 1996-05-07 | Trojan Technologies | Optical radiation sensor device |
| CN102384783A (en) * | 2011-08-15 | 2012-03-21 | 西北核技术研究所 | High-energy laser semi-integrating-sphere array attenuator |
| CN102410875A (en) * | 2011-08-15 | 2012-04-11 | 西北核技术研究所 | Array attenuator for high-energy laser and manufacturing method thereof |
| CN102706446A (en) * | 2012-05-18 | 2012-10-03 | 中国工程物理研究院应用电子学研究所 | Large-angle used sampling attenuation device of array detector |
| CN103644967A (en) * | 2013-11-29 | 2014-03-19 | 西北核技术研究所 | High-energy laser homogenizing cavity attenuator |
| CN104133302A (en) * | 2014-07-24 | 2014-11-05 | 中国工程物理研究院应用电子学研究所 | Intense laser sampling attenuator |
| CN206410783U (en) * | 2017-01-22 | 2017-08-15 | 中国工程物理研究院应用电子学研究所 | A kind of superlaser detector array sampling attenuating device |
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Granted publication date: 20180410 Termination date: 20190122 |