CN106768310A - A kind of superlaser detector array sampling attenuating device - Google Patents
A kind of superlaser detector array sampling attenuating device Download PDFInfo
- Publication number
- CN106768310A CN106768310A CN201710045032.7A CN201710045032A CN106768310A CN 106768310 A CN106768310 A CN 106768310A CN 201710045032 A CN201710045032 A CN 201710045032A CN 106768310 A CN106768310 A CN 106768310A
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- Prior art keywords
- attenuator
- copper coin
- hole
- sampling
- fixed plate
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Links
- 238000005070 sampling Methods 0.000 title claims abstract description 53
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims abstract description 81
- 229910052802 copper Inorganic materials 0.000 claims abstract description 81
- 239000010949 copper Substances 0.000 claims abstract description 81
- 238000003825 pressing Methods 0.000 claims abstract description 18
- 239000000463 material Substances 0.000 claims description 12
- 239000004411 aluminium Substances 0.000 claims description 8
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 8
- 229910052782 aluminium Inorganic materials 0.000 claims description 8
- 238000007747 plating Methods 0.000 claims description 6
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 2
- 229910002804 graphite Inorganic materials 0.000 claims description 2
- 239000010439 graphite Substances 0.000 claims description 2
- 238000005259 measurement Methods 0.000 abstract description 9
- 238000001514 detection method Methods 0.000 abstract description 7
- 238000002310 reflectometry Methods 0.000 abstract description 3
- 238000000034 method Methods 0.000 description 4
- TVEXGJYMHHTVKP-UHFFFAOYSA-N 6-oxabicyclo[3.2.1]oct-3-en-7-one Chemical compound C1C2C(=O)OC1C=CC2 TVEXGJYMHHTVKP-UHFFFAOYSA-N 0.000 description 1
- 238000002679 ablation Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 239000007770 graphite material Substances 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
- G01J1/0418—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using attenuators
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Testing Of Coins (AREA)
Abstract
The invention provides a kind of superlaser detector array sampling attenuating device, the sampling attenuating device samples attenuator comprising several structure identicals arranged according to rule.Each sampling attenuator includes preceding copper coin, rear copper coin, attenuator fixed plate, attenuator and attenuator pressing plate.The front portion for sampling attenuator is provided with preceding copper coin, and rear copper coin is close to preceding copper coin, and attenuator fixed plate is close to rear copper coin, and attenuator is arranged in attenuator fixed plate, and attenuator pressing plate is close to attenuator.Laser beam is sampled using two spaces inclined hole on preceding copper coin in the present invention, it is possible to achieve the wide-angle detection to laser beam.Preceding copper coin is used for the non-sampling superlaser of diffusing reflection, with damage threshold higher.Decayed by the ball set between preceding copper coin, rear copper coin and attenuator thickness or reflectivity regulation decay multiplying power.The present invention solves the problems, such as high-energy-density and big detection angle in detector array measurement, measures significant for Distribution of laser intensity.
Description
Technical field
The invention belongs to laser parameter measurement technical field, and in particular to a kind of superlaser detector array is declined with sampling
Subtract device.
Background technology
Application of the laser in fields such as scientific research, industry, national defence is increasingly extensive, it is often necessary to which heavy caliber high power density is swashed
The optical parameter such as parameter related to intensity distribution such as power, intensity distribution, barycenter, shake is measured simultaneously.Current measurement intensity
The main method of distributed constant has ablation, scanning method, detector array method, imaging method etc..In installing space confined condition,
Using superlaser detector array as heavy caliber high power density laser parameter measurement important means.When laser power is close
Degree is high, and when requiring that measuring apparatus have wide-angle detection angle, existing detector array method because detection angle is limited can not
Meet use requirement.
The content of the invention
In order to overcome the sampling attenuating device in prior art used by laser array detector to be difficult to bear superlaser and
The deficiency of big detection angle scope, the present invention provides a kind of superlaser detector array sampling attenuating device, energy of the present invention
It is enough that direct measurement is carried out in the range of larger detection angle to high energy density laser.
The present invention is achieved by the following technical solution：
A kind of superlaser detector array of the invention sampling attenuating device, is characterized in, the sampling attenuating device is equal
Attenuator is sampled containing several structure identicals, sampling attenuator presses array arrangement.Each sampling attenuator include preceding copper coin, after
Copper coin, attenuator fixed plate, columned attenuator and attenuator pressing plate.
The front portion of described sampling attenuator is provided with preceding copper coin, copper coin, attenuator after having been overlayed successively after preceding copper coin
Fixed plate, attenuator pressing plate.Attenuator fixed plate is close to rear copper coin, and attenuator is arranged in attenuator fixed plate, attenuator pressure
Plate is close to attenuator.
Inclined hole I, the inclined hole II of circle are provided with the preceding copper coin.The rear surface of preceding copper coin is provided with half ball I,
The preceding surface of copper coin is provided with half ball II afterwards, and half ball I on surface constitutes one with half ball II of rear copper coin after preceding copper coin
Individual ball.Copper coin is provided centrally with the through hole I of a circle afterwards, and attenuator fixed plate is provided centrally with through hole II, after through hole II
Circular hole is provided with, the front end of attenuator fixed plate is provided with one is used to place the round platform rank of attenuator.Attenuator pressing plate center sets
It is equipped with the through hole III of a circle.Attenuator fixed plate is affixed on rear copper coin, and attenuator is arranged in the circular hole of attenuator fixed plate.
Inclined hole I in the sampling attenuator is set to space symmetr structure with inclined hole II, and inclined hole I is with inclined hole II in a folder
Angle α, inclined hole I is stacked positioned at the preceding surface of preceding copper coin, its rear end respectively with the front end of inclined hole II, is stacked hole position in half ball I.
Described attenuator is arranged on the round platform rank of attenuator fixed plate, and left end is affixed on the logical of round platform rank, right-hand member and attenuator pressing plate
The left end of hole III is flushed.Half described ball I, half ball II, through hole I, through hole II, circular hole, through hole III are concentric setting.
Described preceding copper coin is used for superlaser beam sampler, and diffusing reflection is carried out to non-sampling laser.
Copper coin is used to transmit the heat of preceding copper coin afterwards, and preceding copper coin constitutes ball and carries out one to the laser beam after sampling together
Level decay, while output is through the laser after decay.
Attenuator fixed plate is used for fixed attenuation piece, while the laser beam after output attenuatoin.Attenuator is used to sample laser
Two grades of decay of beam, the decay multiplying power of sampling attenuator can be adjusted by the thickness or reflectivity that adjust attenuator.
Through hole I, through hole II in described sampling attenuator are that same diameter is set.
Described attenuator with diameter greater than through hole II, the diameter of through hole III.
Diameter of the ball with diameter greater than through hole I that half ball I and half ball II are constituted in the sampling attenuator.
The scope at described α angles is 5 °~30 °.
Preceding copper sheet material in the present invention is using the red copper or aluminium processed through surface gold-plating.Copper sheet material uses plated surface afterwards
The red copper or aluminium of gold, attenuator fixed plate material use nigrescence aluminium or graphite material.
It is described by rule arrangement refer to several sampling attenuating devices by square or other array arrangements, adjacent sampling declines
Subtract the distance between device and could be arranged to equal, may be alternatively provided as.
The beneficial effects of the invention are as follows, solve detector array measurement in high energy density laser direct measurement in,
Explorer response angle problem less than normal, effectively improves the angular response scope of detector array, can be to high energy density laser
Direct measurement is carried out in the range of larger detection angle, it is significant to light laser intensity distribution measurement.
Brief description of the drawings：
Fig. 1 is the structural representation that superlaser detector array of the invention samples attenuating device；
Fig. 2 is the structural representation of the sampling attenuator in superlaser detector array sampling attenuating device of the invention；
In figure, 1. before after copper coin 2. copper coin 3. attenuator fixed plate, 4. attenuator pressing plate, 5. attenuator, 6. inclined holes I 7. it is oblique
The through hole III of II 12. circular hole of hole II 8. half ball, I 9. half ball, II 10. through hole, I 11. through hole 13..
Specific embodiment：
The present invention is described in detail with specific embodiment below in conjunction with the accompanying drawings.
Embodiment 1
Fig. 1 is the structural representation that superlaser detector array of the invention samples attenuating device, and Fig. 2 is height of the invention
Can the structural representation that samples attenuator of the laser array detector in sampling attenuating device.It is of the invention in Fig. 1, Fig. 2
A kind of superlaser detector array sampling attenuating device, attenuator is sampled containing several structure identicals, samples attenuator
By array arrangement.Each sampling attenuator includes preceding copper coin 1, rear copper coin 2, attenuator fixed plate 3, the and of columned attenuator 5
Attenuator pressing plate 4.
The front portion of described sampling attenuator is provided with preceding copper coin 1, copper coin 2, decay after having been overlayed successively after preceding copper coin 1
Piece fixed plate 3, attenuator pressing plate 4；Attenuator fixed plate 3 is used for fixed attenuation piece 5, and receives the laser of the decay of copper coin 2 after.
Attenuator fixed plate 3 is close to rear copper coin 2, and attenuator 5 is arranged in attenuator fixed plate 3, and attenuator pressing plate 4 is close to
Attenuator 5.
The laser that attenuator 5 is used for after decaying to the copper coin 2 after is further decayed, by the thickness for adjusting attenuator 5
Degree or reflectivity can adjust the decay multiplying power of sampling attenuator.
Attenuator pressing plate 4 is used for fixed attenuation piece 5, while output is through the laser beam after decay.
Preceding copper coin 1 is provided with inclined hole I 6, the inclined hole II 7 of circle, and the rear surface of preceding copper coin 1 is provided with half ball I 8,
The preceding surface of copper coin 2 is provided with half ball II 9 afterwards；Half ball I 8 on the rear surface of preceding copper coin 1 and half ball II of rear copper coin 2
9 constitute a ball；Copper coin 2 is provided centrally with the through hole I 10 of a circle afterwards, and attenuator fixed plate 3 is provided centrally with through hole II
The 11st, circular hole 12 is set after through hole II 11；Attenuator pressing plate 4 is provided centrally with the through hole III 13 of a circle；Attenuator fixed plate
3 are affixed on rear copper coin 2, and attenuator 5 is arranged in the circular hole 12 of fixed plate 3；The front end of attenuator fixed plate 3 is provided with one to be used for
Place the round platform rank of attenuator.
Inclined hole I 6 in the sampling attenuator is set to space symmetr structure with inclined hole II 7, and inclined hole I 6 is in inclined hole II 7
One angle α, inclined hole I 6 is stacked positioned at the preceding surface of preceding copper coin 1, its rear end respectively with the front end of inclined hole II 7, is stacked hole position in half
In ball I 8；Attenuator 5 is arranged on the round platform rank of attenuator fixed plate 3, and the left end of attenuator 5 is affixed on round platform rank, right-hand member and declines
The left end of through hole III 3 for subtracting piece pressing plate 4 is flushed；Half ball I 8, half ball II 9, through hole I 10, through hole II 11, circular hole 12, through hole III
13 is concentric setting.
Through hole I 10, through hole II 11 in described sampling attenuator are that same diameter is set.
Described attenuator 5 with diameter greater than through hole II 11, the diameter of through hole III 13.
Diameter of the ball with diameter greater than through hole I 10 that half ball I 8 and half ball II 9 are constituted in the sampling attenuator.
In the present invention, attenuator 5 is set to cylindric or sheet；Sampling attenuator presses square or circular arrangement.
In the present embodiment, superlaser detector array sampling attenuating device of the invention declines comprising 999 samplings
Subtract the distance between device, square arrangement, adjacent samples attenuator equal, be disposed as 10mm, sampling attenuating device profile is side
Shape；Described α angles are 10 °；The material of preceding copper coin 1 is using the red copper processed through surface gold-plating.The material of copper coin 2 uses surface afterwards
Gold-plated aluminium, the material of attenuator fixed plate 3 uses nigrescence aluminium.
Preceding copper coin 1 is used for superlaser beam sampler, and diffusing reflection is carried out to non-sampling laser.
Copper coin 2 is used to transmit the heat of preceding copper coin 1 afterwards, and preceding copper coin 1 constitutes ball and the laser beam after sampling is entered together
Row one-level decays, while output is through the laser after decay.
Embodiment 2
The present embodiment is identical with the basic structure of embodiment 1, and difference is that the sampling attenuator number is 600, this
In embodiment, the spacing that adjacent samples attenuator is set, wherein, it is arranged on 400 sampling attenuators in centre position
It is 10mm that spacing is 5mm, be arranged on 200 sampling attenuator spacing of surrounding, and sampling attenuating device profile is cylinder.It is described
α angles be 23 °.
Embodiment 3
The present embodiment is identical with the basic structure of embodiment 1, and difference is that the sampling attenuator number is 700, this
In embodiment, the spacing that adjacent samples attenuator is set, wherein, it is arranged on 400 sampling attenuators in centre position
It is 10mm that spacing is 5mm, be arranged on 300 sampling attenuator spacing of surrounding, and sampling attenuating device profile is square；Described
α angles are 8 °；Preceding copper sheet material is using the red copper processed through surface gold-plating.Copper sheet material is decayed using the red copper of surface gold-plating afterwards
Piece fixed plate material uses graphite.
It should be noted last that, above example is only used to illustrate rather than limitation, although with reference to preferably implementation
Example the present invention has been described in detail, it will be understood by those within the art that, the present invention can be modified or
Person's equivalent, without departing from the spirit and scope of the present invention, it all should cover in the middle of privilege requirements scope of the invention.
Claims (6)
1. a kind of superlaser detector array is used and samples attenuating device, it is characterised in that：Described sampling attenuating device contains
Several structure identicals sample attenuator, and sampling attenuator presses array arrangement；Each sampling attenuator include preceding copper coin (1), after
Copper coin (2), attenuator fixed plate (3), columned attenuator (5) and attenuator pressing plate (4)；
Described preceding copper coin (1) carries out diffusing reflection for superlaser beam sampler to non-sampling laser；
Copper coin (2) is for transmitting the heat of preceding copper coin (1) afterwards；
Attenuator fixed plate (3), attenuator pressing plate (4) are for fixed attenuation piece (5)；
The front portion of described sampling attenuator is provided with preceding copper coin (1), has overlayed rear copper coin (2) successively after preceding copper coin (1), has declined
Subtract piece fixed plate (3), attenuator pressing plate (4)；
Inclined hole I (6), the inclined hole II (7) of circle are provided with described preceding copper coin (1)；It is provided with the rear surface of preceding copper coin (1)
Half ball I (8), the preceding surface of rear copper coin (2) is provided with half ball II (9), half ball I on the rear surface of preceding copper coin (1)
(8) half ball II (9) with rear copper coin (2) constitutes a ball；Copper coin (2) is provided centrally with the through hole I (10) of a circle afterwards,
Attenuator fixed plate (3) is provided centrally with through hole II (11), circular hole (12) is provided with after through hole II (11)；Attenuator pressing plate
(4) it is provided centrally with the through hole III (13) of a circle；Attenuator fixed plate (3) is affixed on rear copper coin (2), and attenuator (5) is installed
In the circular hole (12) of attenuator fixed plate (3)；The front end of attenuator fixed plate (3) is provided with one for placing attenuator (5)
Round platform rank；
Inclined hole I (6) in the sampling attenuator is set to space symmetr structure, inclined hole I (6) and inclined hole II with inclined hole II (7)
(7) in an angle α, inclined hole I (6) is stacked positioned at the preceding surface of preceding copper coin (1), its rear end respectively with the front end of inclined hole II (7), phase
Folded hole position is in half ball I (8)；Attenuator (5) is arranged on the round platform rank of attenuator fixed plate (3), the left end of attenuator (5)
Round platform rank, right-hand member is affixed on to be flushed with the left end of through hole III (13) of attenuator pressing plate (4)；Half described ball I (8), half ball II
(9), through hole I (10), through hole II (11), circular hole (12), through hole III (13) are concentric setting.
2. superlaser detector array according to claim 1 is used and samples attenuating device, it is characterised in that：Described α
The scope at angle is 5 °~30 °.
3. superlaser detector array according to claim 1 is used and samples attenuating device, it is characterised in that：Described takes
Diameter of the ball with diameter greater than through hole I (10) that half ball I (8) is constituted with half ball II (9) in sample attenuator.
4. superlaser detector array according to claim 1 is used and samples attenuating device, it is characterised in that：Described declines
Subtract piece (5) with diameter greater than through hole II (11), the diameter of through hole III (13).
5. superlaser detector array according to claim 1 is used and samples attenuating device, it is characterised in that：Described takes
Through hole I (10), through hole II (11) in sample attenuator are that same diameter is set.
6. superlaser detector array according to claim 1 is used and samples attenuating device, it is characterised in that：Before described
The material of copper coin (1) is using the red copper or aluminium processed through surface gold-plating；Afterwards the material of copper coin (2) using surface gold-plating red copper or
Aluminium, the material of attenuator fixed plate (3) uses nigrescence aluminium or graphite.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710045032.7A CN106768310B (en) | 2017-01-22 | 2017-01-22 | A kind of superlaser detector array sampling attenuating device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710045032.7A CN106768310B (en) | 2017-01-22 | 2017-01-22 | A kind of superlaser detector array sampling attenuating device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN106768310A true CN106768310A (en) | 2017-05-31 |
| CN106768310B CN106768310B (en) | 2018-04-10 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
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| CN201710045032.7A Expired - Fee Related CN106768310B (en) | 2017-01-22 | 2017-01-22 | A kind of superlaser detector array sampling attenuating device |
Country Status (1)
| Country | Link |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109579984A (en) * | 2018-12-27 | 2019-04-05 | 西北核技术研究所 | A kind of laser beam homogenizes attenuator |
| CN110544861A (en) * | 2019-09-18 | 2019-12-06 | 北京理工大学 | Laser attenuation protection device |
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|---|---|---|---|---|
| US5514871A (en) * | 1994-01-13 | 1996-05-07 | Trojan Technologies | Optical radiation sensor device |
| WO1998040710A1 (en) * | 1997-03-13 | 1998-09-17 | Optiscan Biomedical Corporation | Multichannel infrared detector with optical concentrators for each channel |
| CN102384783A (en) * | 2011-08-15 | 2012-03-21 | 西北核技术研究所 | High-energy laser semi-integrating-sphere array attenuator |
| CN102410875A (en) * | 2011-08-15 | 2012-04-11 | 西北核技术研究所 | Array attenuator of high-energy laser and manufacturing method thereof |
| CN102706446A (en) * | 2012-05-18 | 2012-10-03 | 中国工程物理研究院应用电子学研究所 | Large-angle used sampling attenuation device of array detector |
| CN103644967A (en) * | 2013-11-29 | 2014-03-19 | 西北核技术研究所 | High-energy laser homogenizing cavity attenuator |
| CN104133302A (en) * | 2014-07-24 | 2014-11-05 | 中国工程物理研究院应用电子学研究所 | Intense laser sampling attenuator |
| CN206410783U (en) * | 2017-01-22 | 2017-08-15 | 中国工程物理研究院应用电子学研究所 | A kind of superlaser detector array sampling attenuating device |
-
2017
- 2017-01-22 CN CN201710045032.7A patent/CN106768310B/en not_active Expired - Fee Related
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5514871A (en) * | 1994-01-13 | 1996-05-07 | Trojan Technologies | Optical radiation sensor device |
| WO1998040710A1 (en) * | 1997-03-13 | 1998-09-17 | Optiscan Biomedical Corporation | Multichannel infrared detector with optical concentrators for each channel |
| CN102384783A (en) * | 2011-08-15 | 2012-03-21 | 西北核技术研究所 | High-energy laser semi-integrating-sphere array attenuator |
| CN102410875A (en) * | 2011-08-15 | 2012-04-11 | 西北核技术研究所 | Array attenuator of high-energy laser and manufacturing method thereof |
| CN102706446A (en) * | 2012-05-18 | 2012-10-03 | 中国工程物理研究院应用电子学研究所 | Large-angle used sampling attenuation device of array detector |
| CN103644967A (en) * | 2013-11-29 | 2014-03-19 | 西北核技术研究所 | High-energy laser homogenizing cavity attenuator |
| CN104133302A (en) * | 2014-07-24 | 2014-11-05 | 中国工程物理研究院应用电子学研究所 | Intense laser sampling attenuator |
| CN206410783U (en) * | 2017-01-22 | 2017-08-15 | 中国工程物理研究院应用电子学研究所 | A kind of superlaser detector array sampling attenuating device |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109579984A (en) * | 2018-12-27 | 2019-04-05 | 西北核技术研究所 | A kind of laser beam homogenizes attenuator |
| CN110544861A (en) * | 2019-09-18 | 2019-12-06 | 北京理工大学 | Laser attenuation protection device |
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| Publication number | Publication date |
|---|---|
| CN106768310B (en) | 2018-04-10 |
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Granted publication date: 20180410 Termination date: 20190122 |