CN106997058B - A kind of scintillator performance testing device and its Concordance method - Google Patents
A kind of scintillator performance testing device and its Concordance method Download PDFInfo
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Abstract
The invention discloses a kind of scintillator performance testing device and its Concordance methods.The present apparatus includes detector array, temperature compensation system, preamplifier, multi-channel data acquisition plate and the testing cassete for placing scintillator to be measured；Wherein the scintillator placement location in testing cassete is corresponding with light-detecting device each in detector array；Preamplifier amplifies forming, difference output per signal all the way for export detector array；Multi-channel data acquisition plate is used to carry out analog-to-digital conversion to received multichannel differential analog signal, to the real-time peak-seeking of every railway digital signal and completes every railway digital signal integration later；The integration data of every road signal is finally transmitted to computer data acquisition system；And temperature-compensating correction, light output calibration of the output results and energy resolution are carried out by ad hoc approach to the obtained power spectrum of each photo detecting unit and corrected.The present apparatus more scintillators of independent test and can not interfere with each other simultaneously, improve measurement result precision.
Description
Technical Field
The invention belongs to the technical field of nuclear radiation detectors, and relates to a scintillator performance testing device and a consistency correction method thereof.
Background
Particles or radiation in the high-energy physical field cannot be observed directly, and can only be detected indirectly by conversion into human-known optical or electrical signals through interaction with matter. The nuclear radiation detector is a device for detecting high-energy particles or nuclear radiation events by using the principle, and is widely applied to the fields of nuclear physics experiments, nuclear safety, nuclear medicine, geological detection, industrial flaw detection and the like at present. As one of the most widely used nuclear radiation detectors, a scintillator detector generally consists of a scintillator, a photodetector, and an electronics section; the principle that the interaction of a scintillator and radiation particles generates fluorescence is utilized, the fluorescence is input to an optical detection device for photoelectric conversion and signal amplification, and finally, radiation case information is obtained by performing electronic processing on an electric signal. Therefore, when the scintillator detector is developed, the scintillator with excellent light output performance is measured and screened, and the first step of ensuring the working performance of the scintillator detector is realized. In some applications (such as nuclear medicine imaging devices), thousands of scintillators are required for one device, and thus, the performance test of the scintillators becomes a heavy task.
Regarding the performance test of the scintillator, the technical solutions at home and abroad mainly focus on measuring certain performance of a certain scintillator, for example, measuring the absolute light output of the scintillator by a single photoelectron method; the technical scheme has reliable measurement results and precise measurement method, but the measurement operation process is complicated and the structure of the measurement equipment is complex; the method has the advantages of limited use environment, low measurement efficiency and difficulty in measurement of the performance of a large batch of scintillators. A scintillator property measuring apparatus capable of performing a large number of scintillator properties at a time is disclosed in the national invention patent CN 102353976A. However, the light detecting device of the patent may be affected by some environmental factors (such as temperature and voltage) to cause instability of the measured result of the performance of the scintillator; meanwhile, when a large number of scintillators are measured at a time, because the scintillation light of one scintillator is detected by a plurality of light detection units, then the signals of the plurality of light detection units are added to obtain the signal amplitude corresponding to the light output of the scintillator, and the signals with partial full energy peaks are formed by depositing energy in two or more different scintillators after the gamma photons are subjected to Compton scattering, the accuracy of the full energy peak position is limited, generally, about +/-5 percent and preferably only +/-3 percent because the energy spectrum corresponding to one scintillator is influenced by the gain inconsistency of the light detection units and the Compton scattering in different scintillators, and in addition, the full energy peak energy of the energy spectrum of the measured scintillator is also inaccurate because of the gain inconsistency and the Compton scattering of each light detection unit, the energy resolution of the scintillator to gamma rays with certain energy cannot be truly reflected, so the device disclosed in patent CN102353976A does not integrate the functional module of energy resolution test.
Disclosure of Invention
In view of the technical problems of the device disclosed in patent CN102353976A, the present invention aims to provide a scintillator performance testing device with stable performance and a consistency correction method thereof. The scintillator performance measuring device flexibly designs the array detector by using the basic optical detection device, independently reads and processes output signals of the discrete optical detection devices in the array detector, and can independently test a plurality of scintillators with various specifications at the same time without being influenced by optical crosstalk by combining the flexible application of the scintillator test box, so that accurate optical output measurement results and energy resolution measurement results of the scintillators can be given, and the test results are more accurate; the introduction of the temperature compensation technology ensures that the working performance of the measuring device is not influenced by the change of the environmental temperature, and the test result is more stable; uniformity of each measuring unit in the array detector on a light output measuring result and an energy resolution measuring result is realized by performing consistency correction on the array detector; adopt low pressure constant voltage power supply system, reduce the power ripple, this measuring device not only does not receive the unstable interference of commercial power, and the while operation is safe simple, switch on and off convenient and fast, has promoted scintillator test efficiency greatly.
The technical scheme is as follows:
the scintillator performance measuring device comprises a mechanical box body, a power supply system, an M x N array detector, a pre-amplification system, an M x N channel data acquisition board card, a temperature monitoring system and a scintillator test box. Wherein:
the mechanical box body is used for loading various parts;
the power supply system mainly comprises two adjustable voltage-stabilized power supplies which are connected with each component and the switch and supply power to each component;
the M x N array detector is formed by splicing M x N optical detection devices at certain intervals and is used for simultaneously and independently measuring M x N scintillators to be measured to obtain energy information of each scintillator to be measured;
the pre-amplification system performs independent amplification forming on M × N independent signals output by the M × N array detector, and differentially outputs the M × N independent signals to the M × N channel data acquisition board card;
and the M-N channel data acquisition board card receives M-N differential analog signals output by the front-end electronic system, performs analog-to-digital conversion, and then performs real-time peak searching on each digital signal and completes each digitized signal integration. Finally, transmitting the integral data of each path of signal to a computer data acquisition system; meanwhile, the data acquisition board card completes the temperature acquisition function of the detector and transmits a temperature signal to the computer data acquisition system;
the temperature monitoring system is used for monitoring the environmental temperature change and carrying out temperature compensation correction, so that the working stability of the measuring device in an unstable environment is improved;
the scintillator test box is used for loading a scintillator to be tested and is in compact contact with the array detector, so that the position of the scintillator to be tested is fixed;
and carrying out consistency correction on the light output result and the energy resolution consistency correction on the measuring units M x N to realize consistency among the measuring units.
Compared with the prior art, the invention has the beneficial effects that:
the measuring device can independently test M x N scintillators at the same time, avoids the crosstalk interference phenomenon among the scintillators to be tested, and has more accurate measuring result; under two measurement states of single measurement and simultaneous measurement of the scintillator and other scintillators, the difference of the light output measurement result is better than +/-1.0%, and the stability of the energy resolution measurement result is better than +/-0.5, so that the device disclosed by the invention patent CN102353976A is greatly improved;
in the measuring device, one light detection unit only detects light emitted by one scintillator, and the light emitted by one scintillator is also detected by one light detection unit; therefore, the test full-energy peak position precision of the scintillator to be tested is only related to the scintillator to be tested and the optical detection unit thereof and is not interfered by other optical detection units; meanwhile, the testing full-energy peak position precision of the tested scintillator is not influenced by the deposition energy of gamma rays scattered in other scintillators through Compton, and because the light detection unit corresponding to the tested scintillator can only detect the scintillation light emitted by the tested scintillator; therefore, the measuring device has high precision of testing the full-energy peak position of the scintillator, which is better than +/-1.0 percent, and is greatly improved compared with the device disclosed in the invention patent CN 102353976A.
The measuring device continuously measures the performance of the scintillator for a long time in the environment with temperature change, and the stability of the measuring result is good and better than +/-2 percent;
the consistency of M x N measuring units in the measuring device is better than +/-1.0 percent, so that when the measuring device is used, the calibration of the measuring result of the whole measuring device can be completed only by performing light output measurement calibration on one measuring unit;
the measuring device adopts the independent light detection unit to measure the independent scintillator, so that the energy resolution of the full energy peak of the measured energy spectrum can be effectively measured and calibrated, high-precision energy resolution test is provided for the scintillator, and the scintillator can be conveniently screened from two aspects of light output and energy resolution.
The working stability of the measuring device is not interfered by the fluctuation of the mains supply, the operation is safe and simple, the startup and shutdown are convenient and fast, and the scintillator testing efficiency is greatly improved.
Drawings
FIG. 1 is a diagram of a scintillator test structure (for preventing optical cross talk);
FIG. 2 is a plan view of the layout of the array detector of the measuring device and the electronic system;
FIG. 3 is a diagram of a pre-amplification system layout;
FIG. 4 is a schematic diagram of a one-way readout technique;
FIG. 5 is a schematic structural diagram of a scintillator performance testing apparatus; wherein, 1 is a mechanical box body; 2-power supply system; 3-heat dissipation system; 4-preamplification system; 5-array detector; 6-M N channel data acquisition board; 7-scintillator test cartridge; 9-scintillator take-out box;
FIG. 6 is a schematic diagram of a scintillator test tool structure;
(a) a scintillator take-out box; (b) a scintillator test cell.
Detailed Description
Assuming that M is 8 and the photo detector is a silicon photomultiplier (SiPM), the following is a specific embodiment of the present measurement apparatus:
the mechanical box 1 carries all the components of the scintillator performance measuring apparatus and serves to protect from light.
The power supply system 2 is divided into two power supply modules. The first power supply module is an ultra-low ripple adjustable voltage-stabilized power supply and supplies power to the array detector and the preamplification system; and the power supply module II is a low-ripple switching power supply and supplies power to the data acquisition board card and the temperature monitoring system. The invention adopts the low ripple power supply module to reduce the system noise of the measuring device, and independently supplies power to the data acquisition card with larger noise interference, aiming at reducing the internal interference of the measuring device system. After the device is debugged, the adjustable voltage-stabilized power supply for supplying power to the array detector is set to be in a user-unadjustable state, so that the measuring device does not need to be recalibrated due to the change of the power supply voltage. The power supply system has no high-voltage power supply, so that the safety of the whole system is ensured, and excessive time is not needed to be spent for lifting high voltage in the use process of the measuring device.
The array detector 5 is composed of 64 silicon photomultiplier tubes (sipms) which are spliced into an 8 x 8 detector array at equal intervals d. A layer of thin high-light-transmittance material is pasted on the surface of the array detector to serve as an optical protective film. After the scintillator to be tested is put into the test box 7 with the hole slots 8 shown in fig. 6 and is shielded from light for a period of time, (as shown in fig. 1), the test box is turned over on the array detector 5, the scintillation light is detected by the SiPM through the optical light-transmitting sheet at the bottom of the test box, and the center positions of the hole slots of the test box are aligned with the SiPM of the array detector 5 one by one. The scintillator is coupled to the transparent sheet by air (refractive index n of the transparent sheet)Light-transmitting sheet1.46, refractive index of air nAir (a)1.0), the refraction angle theta in the light transmitting sheet is less than or equal to 43.23 degrees after the scintillation light enters the light transmitting sheet from the air due to the refraction of the light. Light thickness h1The length of the transverse divergent propagation during the internal transmission of the light-transmitting sheet is d1＝h1Tan (θ). The light-transmitting sheet is a part of the test box and is used for loading the scintillator and transmitting light; therefore, the light-transmitting sheet is not too thin in view of mechanical strength, and the thickness thereof should satisfy h1≥1mm。
The SiPM2 in fig. 1 is a test cell of scintillator B2, and the light output and light detection between scintillator B2 and SiPM2 are one-to-one in the absence of light crosstalk. The spacing d between sipms therefore satisfies: d is more than or equal to d1＝h1When tan (θ) ≧ 0.9mm, the SiPM2 will not detect the light emitted by the scintillators B1 and B3.
The optical protective film mainly plays a role of protecting the array detector and transmitting light, so the thickness h of the protective film2It may be as thin as possible so that the divergence of light during its passage through the protective film is negligible.
Through the structural design, optical crosstalk is eliminated in the processes of optical transmission and detection: the light emitted by the scintillator B2 is detected only by the SiPM2, and the SiPM2 is also detected only by the scintillator B2.
Meanwhile, the scintillators are in one-to-one correspondence with the SiPMs in light transmission detection, and the SiPMs of the array detector are measured by using a single-path readout technology (as shown in FIG. 4), so that signal interference is avoided in the electronic processing and acquisition process of test signals.
In fig. 6, the size of the hole slot of the scintillator test box 7 is consistent with the size of the scintillator to be tested, and is mainly used for light isolation and light crosstalk prevention, and the size of the hole slot is adjusted to meet the scintillator tests of different specifications; the section size of the hole groove of the scintillator taking-out box is consistent with that of the scintillator, and the depth of the hole groove is smaller than the height of the measured scintillator. After the scintillator test is finished, the test box 7 and the taking-out box 9 are turned over up and down together, and the tested scintillator can be taken out easily on the premise of keeping the test number sequence.
After the debugging of the measuring device is finished, the power supply voltage of the array detector is set to be in a state that the power supply voltage cannot be adjusted by a user, so that the factory calibration state of the measuring device can be maintained for a long time, and frequent calibration of the measuring result is not needed.
The layout plan structure diagram of the array detector and the electronic system of the measuring device is shown in fig. 2, wherein a port 1 is used for signal transmission and position fixing between the array detector and the adapter plate; the port 2 is used for signal transmission and position fixing between the adapter plate and the signal processing plate; the port 3 is used for signal transmission between the signal processing board and the data acquisition board and is connected with the signal processing board through a signal wire; the central positions of the ports 2 on the adapter plate are aligned with the central positions of the ports 3 on the data acquisition plate one by one in spatial layout, and the layout plays a role in spatial transition in the process of converting the 4 multiplied by 16 output signals into the 1 multiplied by 64 received signals; as shown in fig. 3, inserting the four signal processing boards into the ports 2 at four different positions of the adapter board respectively will align the ports 3 of the four signal processing boards with the ports 3 of the data acquisition board one by one in space, thereby avoiding signal interference caused by excessive distortion of the signal lines between the signal processing boards and the data acquisition boards.
FIG. 3 is a diagram of a pre-amplification system layout; the four signal adapter plates are inserted in parallel in an aligned mode and correspond to the 4 multiplied by 16 signal output modes of the array detector one by one; the four signal processing boards are respectively inserted at different port positions of the four adapter boards and are in parallel staggered arrangement; the signal output ports of the signal processing board are aligned with the four signal input ports of the data acquisition board one by one in spatial relative positions.
As shown in FIG. 2, the preamplification system 4 independently amplifies and forms 64 paths of energy signals from the array detector and differentially outputs the energy signals to the data acquisition board 6, so that mutual interference in the signal processing process is avoided. The 64-channel preamplifier system consists of four 16-channel signal processing boards; 64 paths of energy signals of the 8 x 8 array detector are read out in a 4 x 16 mode, and a 64-channel data acquisition board differentially reads the signals in a 1 x 64 mode; in order to avoid interference to the signal transmission process caused by excessive bending and distortion of the signal line, the array detector is connected with the front-end amplification system through four signal adapter plates, and the structural layout is shown in fig. 2 and 3. Due to the introduction of the adapter plate, the spatial connection among the signal transmission ports is realized, and meanwhile, the preamplification system 4 is in staggered arrangement, so that the heat dissipation of an electronic system is facilitated.
The 64-channel data acquisition board 6 receives 64 paths of differential signals output by the pre-amplification system 4, digitalizes the signals and transmits the digital signals to the computer data acquisition system; and meanwhile, receiving and transmitting temperature information to a computer data acquisition system. And finally, the computer data acquisition system is used for sorting and analyzing the measurement information to generate a measurement report.
And carrying out temperature compensation correction, energy spectrum consistency correction, peak searching fitting, light output measurement result calibration and consistency correction on an energy resolution result on the measuring device in a computer data acquisition system.
The temperature monitoring system 3 is composed of a heat dissipation system, a temperature sensor and a temperature compensation algorithm. The working principle of the temperature monitoring system is as follows: the heat dissipation system (composed of an air inlet, an air outlet and a heat dissipation fan) is used for dissipating heat of the electronic system of the measuring device; monitoring the real-time working temperature of the array detector by a temperature sensor, transmitting temperature information to a data acquisition board, and finally receiving the temperature information by a computer data acquisition system; observation measuring letterThe temperature variation relationship is known and the following temperature compensation correction is made according to the measurement result: eCorrect＝EMeasure(1+fTΔ T) (wherein ECorrect-correcting the subsequent measurement information; eMeasure-correcting previous measurement information; f. ofT-the coefficient of variation of the measurement information with temperature; Δ T-temperature change). Considering the difference of 64 SiPMs in the array detector and the single-path readout technology, the temperature change coefficient of each measurement unit is different, so that the 64 measurement units are respectively subjected to temperature compensation correction. After temperature compensation and correction, the measurement result of the scintillator by the measuring device is not influenced by the change of the ambient temperature and the heat of an electronic system in the device.
Slight differences between measurement cells will result in some differences in the light output measurements taken by the same scintillator on each measurement cell. And on the basis of finishing the temperature compensation correction, carrying out the consistency correction of the light output measurement result on the measuring device. The correction process is as follows: in dark environment, each measuring unit (each measuring unit comprises a silicon photomultiplier and a signal processing circuit in a pre-amplification system for processing signals acquired by the silicon photomultiplier and a multi-channel data acquisition board) of the array detector is used in combination with a radioactive source to measure the same scintillator, and the measurement peak position P of each measuring unit is recordedmeasure-iMeasuring the mean value of the peak positionsObtained from equation (1):
consistency correction factor AiFrom equation (2):
accordingly, the measurement energy spectrum of the measuring device is corrected as shown in formula (3):
EPOutPut-i＝EPmeasure-i·Ai........................................(3)
among them, EPmeasure-iEnergy spectral data before consistency correction, EPOutPut-i-consistency corrected spectral data. The consistency correction shown in the formula (3) is carried out on each data in the energy spectrum of each measuring unit, so that the consistency (P) of the peak position measuring result is satisfiedOutPut-i＝Pmeasure-i·Ai) While keeping the energy resolution measurement unaffected.
After the correction, the same scintillator is measured by using any unit, and the peak position measurement result P is obtainedOutPut-iCoincidence, and light output measurement (Ph)OutPut-i＝g·POutPut-i) The same is true.
Energy resolution ER of scintillator detector is determined by intrinsic energy resolution D of detectorERAnd the intrinsic energy resolution S of the scintillatorERIs composed of two parts, i.e.Thus, the energy resolution measurement of the scintillator in the present device is determined by the intrinsic energy resolution U of the measurement unitERAnd the intrinsic energy resolution S of the scintillatorERIs composed of two parts, i.e.The difference of 64 sipms in the array detector and the difference of 64 independent readout channels cause the difference of the intrinsic energy resolution of 64 measurement units in the measurement device, and therefore, the energy resolution measurement results of the same scintillator at different positions of the device are inconsistent. Aiming at the problem, the device carries out consistency correction on the intrinsic energy resolution of 64 measuring units, eliminates the difference of the measuring units to the energy resolution of the scintillatorThe effect of the rate measurement results. The correction method comprises the following steps:
under the irradiation of radioactive source, 64 measuring units are used to respectively test the same scintillator, and corresponding energy resolution ratio measured value ER is recordedmeasure-i(i ═ 1,2, …,64), and ERmeasure-iThe relation (4) is satisfied and the relation (5) is derived to be established.
Then the intrinsic energy resolution difference of 64 measurement units of the present measurement apparatus can be expressed by the relation (6):
in order to eliminate the influence of the intrinsic energy resolution difference of each measuring unit on the energy resolution measurement result of the same scintillator, the energy resolution measurement output result is corrected as shown in a relation (7):
after the peak position consistency correction and the energy resolution result consistency correction, any unit of the array detector is used for measuring the same scintillator, and the peak position measurement result, the light output measurement result and the energy resolution measurement result are consistent.
The known method does not provide for a consistency correction of the measuring device, so that the light output at each position of the measuring device needs to be calibrated, butAnd the calibration coefficients at each position are inconsistent. On the basis that the measuring device completes temperature compensation correction and consistency correction, the whole measuring device can be calibrated only by calibrating a certain measuring unit of the array detector. The calibration process is as follows: under the irradiation of a certain energy radioactive source, a scintillator (standard scintillator) with known light output is placed on an array detector through a test fixture for measurement, and a totipotent peak position address P0 of the radioactive source is obtained; assuming that the light output of the standard scintillator is 6000ph/MeV, under the irradiation of the same radioactive source, the light output corresponding to the measurement peak position channel address Px is
In summary, the above description is only a preferred embodiment of the present invention, and is not intended to limit the scope of the present invention. Any modification, equivalent replacement, or improvement made without departing from the spirit and principle of the present invention shall fall within the protection scope of the present invention.
Claims (10)
1. A performance testing device for scintillators is characterized by comprising M x N array detectors, a temperature monitoring system, a preamplification system, a multi-channel data acquisition board and a testing box for placing scintillators to be tested; wherein:
the M x N array detector comprises M x N light detection devices;
the scintillator placing positions in the test box correspond to the optical detection devices in the M x N array detectors one by one and are used for independently measuring at most M x N scintillators to be tested;
the preamplification system is used for amplifying, forming and differentially outputting each path of signal output by the M x N array detector to the multi-channel data acquisition board;
the multi-channel data acquisition board is used for carrying out analog-to-digital conversion on the received differential signals, then carrying out real-time peak searching on each path of digital signals and completing the integration of each path of digital signals; and finally, transmitting the integral data of each path of signal to a computer data acquisition system.
2. The scintillator performance testing apparatus of claim 1, wherein a transparent optical protective film is attached to the surface of the M x N array detector, a transparent sheet is disposed between the optical protective film and the testing box, and the transparent sheet is made of a high-transparency material for loading the scintillator and transmitting light; the spacing d between the light detecting devices satisfiesTheta is the angle of refraction of light after entering the light-transmitting sheet from air, and nAir (a)Is the refractive index of air, nLight-transmitting sheetRefractive index of the transparent sheet, h1Is the thickness of the light transmitting sheet.
3. The scintillator performance testing apparatus of claim 1, wherein the light detection device comprises a single channel photomultiplier tube, a photodiode, an avalanche type photodiode, a silicon photomultiplier tube.
4. The scintillator performance testing apparatus of claim 1 or 2, wherein the preamplification system comprises a plurality of multi-channel signal processing boards; the M-N array detector is connected with a multi-channel signal processing board through an adapter plate instead of signal wires, and each multi-channel signal processing board is connected with a data acquisition board through signal wires.
5. The scintillator performance testing apparatus of claim 4, wherein the plurality of switch boards are aligned in parallel, and the output ports of the plurality of switch boards are staggered such that the plurality of signal processing boards are arranged in parallel, and the output ports of the plurality of signal processing boards arranged in parallel and staggered are aligned with the input ports of the data acquisition board one by one.
6. The scintillator performance testing apparatus of claim 1, including a temperature monitoring system for monitoring the real-time operating temperature of each photodetector in the M x N array detector and transmitting temperature information to the computer data acquisition system via the data acquisition board, and for each photodetector in the M x N array detector according to the formula ECorrect＝EMeasure(1+fTΔ T) temperature compensation correction; wherein E isCorrectTo corrected measurement information; eMeasureTo correct previous measurement information; f. ofTThe coefficient of variation of the measurement information with the temperature; and delta T is a temperature change value.
7. The scintillator performance test apparatus of claim 5, wherein a power supply system of the scintillator performance test apparatus comprises a first power supply module and a second power supply module; the first power supply module is an ultra-low ripple adjustable voltage-stabilized power supply and supplies power to the M x N array detector and the preamplification system; and the power supply module II is a low-ripple switching power supply and supplies power to the multi-channel data acquisition board and the temperature monitoring system.
8. The scintillator performance test apparatus of claim 1 or 2, wherein M × N wells for inserting the scintillator to be tested are provided in the test case, and the center of each well corresponds to each photodetector in the M × N array detector; the test box also comprises a scintillator taking-out box matched with the test box; a plurality of hole grooves are formed in the scintillator taking-out box, the cross section size of each hole groove is consistent with that of the scintillator to be detected, and the depth of each hole groove is smaller than the height of the scintillator to be detected.
9. An energy resolution correction method based on the scintillator performance test device of claim 1, comprising the steps of:
1) in a dark environment, the same scintillator is measured using each measuring cell in combination with a radioactive source, and the corresponding energy-resolved measurement ER is recordedmeasure-i(ii) a Each measuring unit comprises an optical detection device in the M x N array detector and a signal processing circuit connected with the optical detection device;
2) energy-resolved measured value ER from individual measuring cellsmeasure-iCalculating to obtain an average value of the squares of the energy-resolved measurement values
3) When any measuring unit i is used for measuring the same scintillator, the energy resolution measurement output result is output according to a formulaCorrecting and outputting energy resolution measurement result EROutPut-i；
Wherein,UER-ifor measuring the energy-resolving influence value, S, of the cell iERIs the intrinsic energy resolution of the scintillator;resolving the influence value U for each measurement unitER-iThe average of the squares of (a).
10. A method for correcting a light output result based on the scintillator performance testing apparatus of claim 1, comprising the steps of:
1) in dark environment, each measuring unit is used for measuring the same scintillator in combination with a radioactive source, and corresponding totipotent peak position measuring result P is recordedmeasure-i(ii) a Each measuring unit comprises an optical detection device in the M x N array detector and a signal processing circuit connected with the optical detection device;
2) according to the full energy peak measured value P of each measuring unitmeasure-iCalculating to obtain the average value of the full energy peak measurementWherein K ═ M × N;
3) when any measuring unit i is used for measuring the same scintillator, the measuring unit i can measure all-spectrum data of each path according to a formula EPOutPut-i＝EPmeasure-i·AiThe correction is carried out, and the measurement result of the full energy peak is POutPut-i＝Pmeasure-i·AiFinally obtaining the light output measurement result of PhOutPut-i＝g·POutPut-i(ii) a Wherein,g is the light output correction factor.
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| CN107861147A (en) * | 2017-12-26 | 2018-03-30 | 同方威视技术股份有限公司 | Scintillator sensitivity measuring apparatus and measuring method |
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| CN109490940B (en) * | 2018-12-14 | 2020-04-28 | 江苏赛诺格兰医疗科技有限公司 | Method for testing light-emitting decay time of scintillator array |
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Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004354271A (en) * | 2003-05-30 | 2004-12-16 | Tohken Co Ltd | Radiation detector |
| US7329874B2 (en) * | 2003-09-24 | 2008-02-12 | Radiation Monitoring Devices, Inc. | Lu1-xI3:Cex-a scintillator for gamma-ray spectroscopy and time-of-flight pet |
| CN102353976A (en) * | 2011-07-13 | 2012-02-15 | 中国科学院高能物理研究所 | Device for measuring performance of scintillator |
| CN204556841U (en) * | 2015-05-14 | 2015-08-12 | 中国电子科技集团公司第二十六研究所 | A kind of batch testing fixture of scintillator crystal bar |
-
2016
- 2016-01-22 CN CN201610044913.2A patent/CN106997058B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004354271A (en) * | 2003-05-30 | 2004-12-16 | Tohken Co Ltd | Radiation detector |
| US7329874B2 (en) * | 2003-09-24 | 2008-02-12 | Radiation Monitoring Devices, Inc. | Lu1-xI3:Cex-a scintillator for gamma-ray spectroscopy and time-of-flight pet |
| CN102353976A (en) * | 2011-07-13 | 2012-02-15 | 中国科学院高能物理研究所 | Device for measuring performance of scintillator |
| CN204556841U (en) * | 2015-05-14 | 2015-08-12 | 中国电子科技集团公司第二十六研究所 | A kind of batch testing fixture of scintillator crystal bar |
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