CN106706272B - A kind of device and method measuring nonlinear crystal thermal focal length - Google Patents

A kind of device and method measuring nonlinear crystal thermal focal length Download PDF

Info

Publication number
CN106706272B
CN106706272B CN201710041976.7A CN201710041976A CN106706272B CN 106706272 B CN106706272 B CN 106706272B CN 201710041976 A CN201710041976 A CN 201710041976A CN 106706272 B CN106706272 B CN 106706272B
Authority
CN
China
Prior art keywords
frequency
nonlinear crystal
optical resonator
light
focal length
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201710041976.7A
Other languages
Chinese (zh)
Other versions
CN106706272A (en
Inventor
卢华东
魏娇
苏静
彭堃墀
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Taiyuan Shanda Yuguang Technological Co ltd
Original Assignee
Shanxi University
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shanxi University filed Critical Shanxi University
Priority to CN201710041976.7A priority Critical patent/CN106706272B/en
Publication of CN106706272A publication Critical patent/CN106706272A/en
Application granted granted Critical
Publication of CN106706272B publication Critical patent/CN106706272B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)

Abstract

The present invention provides a kind of device and method measuring nonlinear crystal thermal focal length, and device includes nonlinear crystal, optical resonator, single-frequency laser, power governor, beam splitter, photodetector, oscillograph, signal generator, high-voltage amplifier.The nonlinear crystal is placed at the minimum waist spot of optical resonator;The output light of single-frequency laser is injected into after power governor in optical resonator;Frequency doubled light and the fundamental frequency light separation that beam splitter exports optical resonator;Fundamental frequency light is injected into photodetector, and the transmission spectrum of optical resonator is obtained with oscillograph recording;Low frequency signal is generated by signal generator, is loaded on the piezoelectric ceramics for sticking in hysteroscope after high-voltage amplifier amplifies.The present invention obtains the offset of optical resonator resonant frequency according to the transmission spectrometry of record, and the thermal focal length of nonlinear crystal is calculated according to formula.The device and method are simple and convenient to operate, measurement result is accurate, have higher practical value.

Description

A kind of device and method measuring nonlinear crystal thermal focal length
Technical field
The present invention relates to laser technology fields, particularly belong to a kind of device for measuring nonlinear crystal thermal focal length And method.
Background technology
Single-frequency ultraviolet laser is widely used in biologic medical, laser printing, height as a kind of important laser light source The fields such as preparation of fine spectroscopy, non-classical optical state.The fluorescence spectra of existing gain media is generally in 600- The near-infrared of 1500nm is to middle infrared band, and frequency doubling technology provides effective approach to obtain shorter wavelength laser.But With the continuous deepening of research, it has been found that during frequency multiplication generates high power ultraviolet light, the fuel factor of nonlinear crystal It is very serious, seriously constrain further increasing for frequency multiplication luminous power.Thermal focal length is weigh fuel factor severity one A important indicator is needed to study the thermal characteristics of nonlinear crystal and accurately be surveyed to obtain the single-frequency ultraviolet laser of higher power The thermal focal length of crystal under fixed different injecting powers.
The method of traditional measurement thermal focal length is concentrated mainly on the measurement to gain media thermal focal length.Most generation Table has probe light method, average cell method.Probe light method is to allow a branch of directional light by the gain media with thermal lensing effect, The thermal focal length of the gain media is determined by measuring the focal position of collimated light beam.The advantages of this method is intuitive, but It needs to additionally introduce light beam, and measurement accuracy is very low, the severity of crystal thermal effect cannot be accurately reflected.Average cell method Be by survey export laser waist spot position and the size anti-thermal focal length for pushing away crystal again, calculating process is more complex, measures Precision is low.And during frequency multiplication, cause the factor of crystal thermal effect complex, including crystal is individually to the suction of fundamental frequency light It receives, individually to the absorption of the absorption of frequency doubled light and frequency multiplication photoinduction fundamental frequency light, can not be made a concrete analysis of with above method non-thread The thermal characteristics of property crystal, and can not accurately measure the thermal focal length of nonlinear crystal.
Invention content
In order to solve the limitation of existing method, the purpose of the present invention is to provide it is a kind of it is easy to operate, result is accurate The device and method for measuring nonlinear crystal thermal focal length.
A kind of device measuring nonlinear crystal thermal focal length provided by the invention, including nonlinear crystal, optics are humorous Shake chamber, single-frequency laser, power governor, beam splitter, photodetector, oscillograph, signal generator, high-voltage amplifier.Its It is characterized in that, the nonlinear crystal is placed at the minimum waist spot of optical resonator;The output light of single-frequency laser passes through work( It is injected into optical resonator after rate adjuster;Low-frequency sweep signal is generated by signal generator, after high-voltage amplifier amplifies It loads on the piezoelectric ceramics for sticking in hysteroscope;Frequency doubled light and the fundamental frequency light separation that beam splitter exports optical resonator;Fundamental frequency Light is injected into photodetector and is converted into electric signal, and the output signal of photodetector is input to oscillograph recording difference injection work( The transmission spectrum of optical resonator under rate.
The nonlinear crystal be birefringent phase matching LBO, BIBO, BBO or quasi-phase matched PPKTP, PPLN, PPSLT etc..
The optical resonator is standing-wave cavity or travelling-wave cavity.
The single-frequency laser is continuous single frequency tunable ti sapphire laser, continuous single-frequency 1064nm lasers or company Continuous single-frequency 1342nm lasers.
The power governor is made of the wave plates of λ/2 and polarization splitting prism.
The oscillograph is the digital oscilloscope that can store record data.
A kind of method measuring nonlinear crystal thermal focal length provided by the invention, principle are:In frequency multiplication of outer-cavity mistake Cheng Zhong needs to be locked in optical resonator in the frequency of the fundamental frequency light of injection to obtain stable frequency multiplication light output, when sweeping The chamber for retouching optical resonator is grown come when finding resonance point, the serious fuel factor of nonlinear crystal results in optical resonator resonance frequency The offset of rate shows as the broadening of resonant cavity transmission spectrum.And the offset of resonant frequency and the heat penetration of nonlinear crystal Mirror focal length has certain relationship, and the thermal lens that the size by measuring resonance frequency shift amount can obtain nonlinear crystal is burnt Away from.
During frequency multiplication, the factor of nonlinear crystal fuel factor is caused to include crystal individually to the absorption of fundamental frequency light, it is single Solely to the absorption of the absorption of frequency doubled light and frequency multiplication photoinduction fundamental frequency light.Due to nonlinear crystal individually to the absorption of fundamental frequency light very Weak, so only considering fuel factor caused by other two kinds of factors, thermal focal length is represented by:
Wherein, ω is waist spot radius of the basic frequency beam at nonlinear crystal center, and F is the fineness of optical resonator, λω For the wavelength of fundamental frequency light, Δ and Θ are respectively the mismatching angle of optical resonator caused by nonlinear crystal frequency multiplication photoinduction fundamental frequency light And the mismatching angle of optical resonator caused by frequency doubled light is absorbed, it is expressed as:
With
Wherein, αu、αsRespectively frequency multiplication photoinduction fundamental frequency light absorption coefficient and individually to the absorption coefficient of frequency doubled light, LCFor The length of nonlinear crystal, ΓeffFor the nonlinear system turn over number of crystal, P is optical resonance intracavitary fundamental frequency light power, KCIt is non- The thermal conductivity of linear crystal, dn/dT are the thermo-optical coeffecient of nonlinear crystal.For specific nonlinear crystal, to again The absorption coefficient of frequency lightsAnd non-linear transfer coefficient ΓeffIt is to determine, can be asked according to specific intracavitary fundamental frequency optical power value Obtain Θ.In addition, total mismatching angle Ψ=Δ+Θ of the optical resonator caused by this two parts fuel factor is expressed as:
Wherein, Δ ν=ν-ν0For the offset of optical resonator resonant frequency, ν0For no fuel factor when optical resonator Resonant frequency, ν be fuel factor in the presence of optical resonator resonant frequency, c be vacuum in light spread speed, L is resonance The geometrical length of chamber, n are the refractive index of nonlinear crystal.It is by formula 1-4 it is found that certain in optical resonance intracavitary fundamental frequency light power In the case of, the thermal lens that nonlinear crystal can be calculated in the offset Δ ν by measuring optical resonator resonant frequency is burnt Away from f, meanwhile, it can also calculate the absorption coefficient for acquiring nonlinear crystal frequency multiplication photoinduction fundamental frequency lightu, non-linear specifically to study The thermal characteristics of crystal provides effective way.
A kind of method measuring nonlinear crystal thermal focal length provided by the invention, includes the following steps:
(a) low-frequency sweep signal is generated by signal generator, is loaded on after high-voltage amplifier amplifies and sticks in hysteroscope On piezoelectric ceramics, the chamber for scanning optical resonator is long, with the transmission spectrum of oscillograph recording optical resonator;
(b) according to the transmission spectrum of the optical resonator of acquisition, its frequency offset Δ ν=ν-ν are measured0
(c) the total mismatching angle Ψ of optical resonator is obtained according to formula 4;
(d) according to nonlinear crystal to the absorption coefficient of frequency doubled lightsWith non-linear transfer coefficient Γeff, can be obtained by formula 3 Under certain intracavitary fundamental frequency luminous power, nonlinear crystal absorbs mismatching angle Θ caused by frequency doubled light;
(e) according to relational expression Δ=Ψ-Θ, the mismatching angle Δ caused by absorption fundamental frequency light is obtained;
(f) according to obtained mismatching angle Δ and Θ, by formula 4 and 2 can obtain simultaneously nonlinear crystal thermal focal length f and The absorption coefficient of its frequency multiplication photoinduction fundamental frequency lightu
The present invention has the following advantages compared with prior art:
1. the present invention is when the thermal focal length to nonlinear crystal measures, it is not necessary to which what analyzing crystal itself occurred answers Miscellaneous thermal process need to only monitor the variation of the transmission spectrum of optical resonator without other optical systems are introduced after resonant cavity, The thermal focal length of nonlinear crystal is can be obtained, the measurement method process is simple, as a result accurately.
2. the present invention is suitable for the measurement of the thermal focal length of arbitrary nonlinear crystal.
3. the measurement of present invention nonlinear crystal thermal focal length suitable for different cavity structures.
4. the heat that the present invention on the basis of measuring nonlinear crystal thermal focal length, can also analyze nonlinear crystal is special Property such as frequency multiplication photoinduction fundamental frequency light absorption coefficient, and then clearly causes fuel factor each section factor to nonlinear crystal fuel factor Contribution amount.
In short, the present invention can accurately measure the thermal focal length of nonlinear crystal, device is simple, easy to operate, simultaneously It can also specifically study the thermal characteristics of nonlinear crystal.
Description of the drawings
Fig. 1 is embodiment of the present invention one:" 8 " word ring resonator realizes nonlinear crystal heat during frequency multiplication light output The structural schematic diagram of focal length of lens measurement device.In figure:1- nonlinear crystals, 2- optical resonators, 3- single-frequency lasers, 4- work( Rate adjuster, 5- beam splitters, 6- photodetectors, 7- oscillographs, 8- signal generators, 9- high-voltage amplifiers, 10- frequency doubled lights, 11- fundamental frequency lights, the first plane mirrors of 12-, the second plane mirrors of 13-, 14- the first plano-concave mirrors, 15- the second plano-concave mirrors.
Fig. 2 is embodiment of the present invention two:Standing-wave cavity realizes nonlinear crystal thermal focal length during frequency multiplication light output The structural schematic diagram of measuring device.In figure:1- nonlinear crystals, 2- optical resonators, 3- single-frequency lasers, 4- power regulations Device, 5- beam splitters, 6- photodetectors, 7- oscillographs, 8- signal generators, 9- high-voltage amplifiers, 10- frequency doubled lights, 11- fundamental frequencies Light, 16- concave and convex lenses, 17- plano-concave mirrors.
Specific implementation mode
Invention is further explained below in conjunction with the accompanying drawings, but the present invention is not restricted to these case study on implementation.
Embodiment one:Fig. 1 show the present invention and is measured to nonlinear crystal thermal focal length in " 8 " word annular chamber Device, including nonlinear crystal 1, optical resonator 2, single-frequency laser 3, power governor 4, beam splitter 5, photodetector 6, oscillograph 7, signal generator 8, high-voltage amplifier 9.Tested nonlinear crystal is placed in purple by indium foil cladding by the weldering of vacuum indium It in copper temperature control furnace, is placed at the minimum waist spot of resonant cavity, to ensure that maximum transformation efficiency, temperature control furnace use thermoelectric cooler (TEC) it is controlled into trip temperature, temperature-controlled precision is 0.1 DEG C, to realize optimum phase matching;Optical resonator 2 is " 8 " word ring junction Structure is made of the first plane mirror 12, the second plane mirror 13, the first plano-concave mirror 14, the second plano-concave mirror 15, and the first plane mirror 12 is coated with To fundamental frequency light fractional transmission, to frequency doubled light high-reflecting film, the second plane mirror 13 is coated with to fundamental frequency light and the equal high-reflecting film of frequency doubled light, first Plano-concave mirror 14 is coated with to fundamental frequency light and the equal high-reflecting film of frequency doubled light, and the second plano-concave mirror 15 is coated with to fundamental frequency light height instead, to frequency doubled light height Permeable membrane;Single-frequency laser 3 generates the fundamental frequency light of specific wavelength, is injected into optical resonator 2 through power governor 4, beam splitter 5 will The fundamental frequency light 11 and frequency doubled light 10 that optical resonator 2 exports detach, and wherein fundamental frequency light 11 is injected into photodetector 6;Photoelectricity is visited The output signal for surveying device 6 is input to the transmission spectrum that oscillograph 7 records optical resonator 2;The low-frequency sweep that signal generator 8 exports Signal loads on after the amplification of high-voltage amplifier 9 and sticks on the piezoelectric ceramics of the first plano-concave mirror 14, scans optical resonator 2 Chamber it is long.
Embodiment two:Fig. 2 show the present invention to nonlinear crystal thermal focal length measures in standing-wave cavity dress It sets, including nonlinear crystal 1, optical resonator 2, single-frequency laser 3, power governor 4, beam splitter 5, photodetector 6, shows Wave device 7, signal generator 8, high-voltage amplifier 9.Tested nonlinear crystal is placed in red copper control by the thin cladding of indium by the weldering of vacuum indium It in warm stove, is placed at the minimum waist spot of resonant cavity, to ensure that maximum transformation efficiency, temperature control furnace use thermoelectric cooler (TEC) it is controlled into trip temperature, temperature-controlled precision is 0.1 DEG C, to realize optimum phase matching;Optical resonator 2 is standing wave cavity configuration, It is made of 16 peace concave mirror 17 of concave and convex lenses, concave and convex lenses 16, which are coated with to fundamental frequency light, to be had certain transmissivity and to the high reverse of frequency doubled light, put down Concave mirror 17 is coated with to fundamental frequency light height instead, to the high saturating mould of frequency doubled light;Single-frequency laser 3 generates the fundamental frequency light of specific wavelength, through power Adjuster 4 is injected into optical resonator 2, and beam splitter 5 detaches the fundamental frequency light 11 that optical resonator 2 exports and frequency doubled light 10, Middle fundamental frequency light 11 is injected into photodetector 6 and is converted into electric signal;The output signal of photodetector 6 is input to the note of oscillograph 7 Record the transmission spectrum of optical resonator 2;The low-frequency sweep signal that signal generator 8 exports loads on after the amplification of high-voltage amplifier 9 It sticks on the piezoelectric ceramics of plano-concave mirror 17, the chamber for scanning optical resonator 2 is long.
Tested nonlinear crystal 1 is MgO:PPSLT crystal, size are 0.8 × 2 × 10mm3, both ends of the surface are coated with 795nm And 397.5nm high-reflecting films, polarization cycle are 9.23 μm;Optical resonator 2 is " 8 " word loop configuration, and the first plane mirror 12 is pair 795nm light transmissions are 11%, to the high anti-Input coupling mirror of 397.5nm light, the second plane mirror 13 be to 795nm light and The high anti-plane mirror of 397.5nm light, the first plano-concave mirror 14 are to 795nm light and the high anti-plano-concave mirror of 397.5nm light, curvature Radius is 100mm, and the second plano-concave mirror 15 is high to 795nm light anti-, the high saturating plano-concave mirror of 397.5nm light, radius of curvature 100mm; Single-frequency laser 3 is the ti sapphire laser that output wavelength is 795nm;Power controller 4 is by half-wave plate and polarization splitting prism Composition;Photodetector 6 is for detecting 795nm light transmissions peak, and model S3399, oscillograph 7 is for monitoring that detector detects Signal, with record it is different injection pump powers under transmission spectrums.When the laser power in injection optics resonant cavity 2 is 1.957W When, record the transmission spectrum of optical resonator.It measures and obtains the offset of optical resonator resonant frequency and be
105MHz utilizes formula
Calculate the total mismatching angle Ψ of optical resonator be 19.1, wherein light velocity c be 3 × 108M/s, optical resonator chamber Long L is 534mm, the length L of nonlinear crystalCFor 10mm, the refractive index n of nonlinear crystal is 2.178, optics when no fuel factor The fineness F of resonant cavity is 50.According to crystal to the absorption coefficient 4.6%cm of frequency doubled light-1, in conjunction with formulaIt is 0.6 to calculate to absorb mismatching angle Θ caused by frequency doubled light, can be obtained by again using formula Δ=Ψ-Θ Mismatching angle Δ caused by frequency photoinduction fundamental frequency light absorption is 18.5, wherein PfFor 18.7mW, thermal conductivity KCFor 8.4W/mK, heat Backscatter extinction logarithmic ratio dn/dT is 2.6 × 10-5K-1, fundamental frequency light wavelength XωFor 795nm.Recycle formulaIt calculates The thermal focal length for obtaining nonlinear crystal is 2.8mm, and wherein waist spot radius ω is 42.18 μm, meanwhile, the Δ acquired can be utilized In conjunction with formulaObtain the 397.5nm photoinduction 795nm absorption coefficients of light be 5.36%/ cm.It is that can measure to obtain the thermal focal length of nonlinear crystal and nonlinear crystal under different injecting powers with same method The absorption coefficient of 397.5nm photoinduction 795nm light.

Claims (5)

1. a kind of device measuring nonlinear crystal thermal focal length, including nonlinear crystal (1), optical resonator (2), single-frequency Laser (3), power governor (4), beam splitter (5), photodetector (6), oscillograph (7), signal generator (8), high pressure Amplifier (9);It is characterized in that, the nonlinear crystal (1) is placed in by the weldering of vacuum indium in red copper temperature control furnace by indium foil cladding, It is placed at the minimum waist spot of resonant cavity, to ensure that maximum transformation efficiency, temperature control furnace carry out temperature using thermoelectric cooler (TEC) Degree control, temperature-controlled precision is 0.1 DEG C, to realize optimum phase matching;The output light of single-frequency laser (3) passes through power governor (4) it is injected into after in optical resonator (2);The frequency doubled light (10) and fundamental frequency light that beam splitter (5) exports optical resonator (2) (11) it detaches;Fundamental frequency light (11) is injected into photodetector (6) and is converted into electric signal, the electric signal of photodetector (6) output It is input to oscillograph (7), to record the transmission spectrum of optical resonator (2) under different injecting powers;What signal generator (8) generated Low-frequency sweep signal loads on after high-voltage amplifier (9) amplification on the piezoelectric ceramics for sticking in hysteroscope.
2. a kind of device measuring nonlinear crystal thermal focal length according to claim 1, which is characterized in that described Nonlinear crystal (1) is LBO, BIBO or BBO of birefringent phase matching;Or for quasi-phase matched PPKTP, PPLN or PPSLT。
3. a kind of device measuring nonlinear crystal thermal focal length according to claim 1, which is characterized in that described Optical resonator (2) is standing-wave cavity or travelling-wave cavity.
4. a kind of device measuring nonlinear crystal thermal focal length according to claim 1, which is characterized in that described Single-frequency laser (3) is continuous single frequency tunable ti sapphire laser, continuous single-frequency 1064nm lasers or continuous single-frequency 1342nm lasers.
5. a kind of method measuring nonlinear crystal thermal focal length, which is characterized in that non-using measurement described in claim 1 The device of linear crystal thermal focal length, includes the following steps:
(a) low-frequency sweep signal is generated by signal generator (8), is loaded on after high-voltage amplifier (9) amplification and sticks in hysteroscope (14) on piezoelectric ceramics, the chamber of scanning optical resonator (2) is long, with the transmission of oscillograph (7) record optical resonator (2) Spectrum;
(b) according to the transmission spectrum of the optical resonator of acquisition (2), the frequency offset Δ v=v-v of its relatively cool chamber is measured0, Wherein, v0For no fuel factor when optical resonator (2) resonant frequency, v be fuel factor in the presence of optical resonator (2) it is humorous Vibration frequency;
(c) according to formula
Obtain the total mismatching angle Ψ of optical resonator (2), wherein c is the spread speed of light in vacuum, and L is optical resonator (2) Geometrical length, n be nonlinear crystal (1) refractive index, LCFor the length of nonlinear crystal (1), F is in the presence of no effect The fineness of optical resonator (2);
(d) according to nonlinear crystal (1) to the absorption coefficient of frequency doubled lights, and utilize the relationship between mismatching angle and absorbed power Formula
Show that nonlinear crystal (1) absorbs the mismatching angle Θ of resonant cavity caused by frequency doubled light, wherein ΓeffFor nonlinear crystal (1) non-linear transfer coefficient, P are the fundamental frequency luminous power in optical resonator (2), λωFor the wavelength of fundamental frequency light, KCIt is non-thread Property crystal (1) thermal conductivity, dn/dT be nonlinear crystal (1) thermo-optical coeffecient;
(e) according to relational expression Δ=Ψ-Θ, mismatching angle Δ caused by being absorbed by frequency multiplication photoinduction fundamental frequency light is obtained;
(f) according to obtained mismatching angle Δ and Θ, thermal focal length expression formula is utilized
The expression formula of cavity detuning caused by being absorbed with frequency multiplication photoinduction fundamental frequency light
Obtain the thermal focal length f and frequency multiplication photoinduction fundamental frequency light absorption coefficient of nonlinear crystal (1)u, wherein ω is fundamental frequency light Waist spot radius of the beam at nonlinear crystal (1) center.
CN201710041976.7A 2017-01-20 2017-01-20 A kind of device and method measuring nonlinear crystal thermal focal length Active CN106706272B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201710041976.7A CN106706272B (en) 2017-01-20 2017-01-20 A kind of device and method measuring nonlinear crystal thermal focal length

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201710041976.7A CN106706272B (en) 2017-01-20 2017-01-20 A kind of device and method measuring nonlinear crystal thermal focal length

Publications (2)

Publication Number Publication Date
CN106706272A CN106706272A (en) 2017-05-24
CN106706272B true CN106706272B (en) 2018-10-26

Family

ID=58910021

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201710041976.7A Active CN106706272B (en) 2017-01-20 2017-01-20 A kind of device and method measuring nonlinear crystal thermal focal length

Country Status (1)

Country Link
CN (1) CN106706272B (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108469335B (en) * 2018-03-26 2020-03-24 中国科学技术大学 Method for measuring frequency doubling efficiency of frequency doubling cavity
CN109323852B (en) * 2018-11-13 2020-09-08 清华大学 Laser frequency doubling crystal frequency conversion efficiency measurement system and performance characterization method
CN110865053B (en) * 2019-12-02 2020-11-03 山西大学 Device and method for measuring energy transmission up-conversion heat transfer load in laser gain crystal
CN112130395B (en) * 2020-09-25 2021-10-22 山西大学 Integral optical resonant cavity for frequency conversion
CN115128001B (en) * 2022-06-20 2024-04-12 中国科学院上海光学精密机械研究所 Wavelength coded probe light generating device

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5046070A (en) * 1990-05-22 1991-09-03 Coherent, Inc. Longitudinally laser pumped laser with compensation for thermal lens effects
CN101666706A (en) * 2009-09-07 2010-03-10 浙江大学 Device for measuring thermal lens focal length of end-pumped solid-state laser and method
CN102889981A (en) * 2012-10-15 2013-01-23 中国科学院上海光学精密机械研究所 Device and method for measuring thermal focus of side pumped laser crystal
CN103499431A (en) * 2013-09-02 2014-01-08 长春理工大学 Method and device for measuring dynamic thermal focal distance of solid laser crystal
CN105547656A (en) * 2016-02-02 2016-05-04 潍坊学院 Method and device for online measurement of laser crystal thermal lens focal length in real time
CN105954010A (en) * 2016-05-17 2016-09-21 山西大学 Measurement method of nonlinear crystal thermal lens focal length
CN106018285A (en) * 2016-05-17 2016-10-12 山西大学 Method for measuring absorption coefficient of nonlinear crystal

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4572074B2 (en) * 2002-02-13 2010-10-27 独立行政法人理化学研究所 Wavelength converter

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5046070A (en) * 1990-05-22 1991-09-03 Coherent, Inc. Longitudinally laser pumped laser with compensation for thermal lens effects
CN101666706A (en) * 2009-09-07 2010-03-10 浙江大学 Device for measuring thermal lens focal length of end-pumped solid-state laser and method
CN102889981A (en) * 2012-10-15 2013-01-23 中国科学院上海光学精密机械研究所 Device and method for measuring thermal focus of side pumped laser crystal
CN103499431A (en) * 2013-09-02 2014-01-08 长春理工大学 Method and device for measuring dynamic thermal focal distance of solid laser crystal
CN105547656A (en) * 2016-02-02 2016-05-04 潍坊学院 Method and device for online measurement of laser crystal thermal lens focal length in real time
CN105954010A (en) * 2016-05-17 2016-09-21 山西大学 Measurement method of nonlinear crystal thermal lens focal length
CN106018285A (en) * 2016-05-17 2016-10-12 山西大学 Method for measuring absorption coefficient of nonlinear crystal

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
一种利用像散腔测量热透镜焦距的方法;郑耀辉 等;《中国激光》;20110930;第38卷(第9期);第1-6页 *

Also Published As

Publication number Publication date
CN106706272A (en) 2017-05-24

Similar Documents

Publication Publication Date Title
CN106706272B (en) A kind of device and method measuring nonlinear crystal thermal focal length
CN100468044C (en) Tester and method for residual stress of seniconductor material
Sussman Tunable light scattering from transverse optical modes in lithium niobate
CN104964932B (en) A kind of integral system and application for measuring Terahertz normal transmission spectrum and reflectance spectrum
CN105973573A (en) Measuring method for linear losses inside cavity of all-solid-state laser
CN105954010B (en) A kind of measuring method of nonlinear crystal thermal focal length
CN107655599B (en) Method for measuring micro stress of optical element
CN106018285A (en) Method for measuring absorption coefficient of nonlinear crystal
CN106768873A (en) A kind of method and device for measuring high-fineness fineness of cavity
Lin et al. Opto-acoustic phenomena in whispering gallery mode resonators
CN102608043B (en) Method for measuring concentration of trace gas molecules based on laser loop photonic crystal gas chamber
US20210164850A1 (en) Device and method for measuring thermal load caused by energy transfer upconversion in laser gain crystal
CN105953929A (en) Single-pulse width and energy measurement device
CN105157956A (en) Measuring device for thermal characteristics of laser head
CN110132892B (en) Method for measuring nonlinear refractive index by thermal halo effect
CN101482502B (en) Single-pulse measurement method for nonlinear refraction of materials
US7551267B2 (en) Systems and methods for measuring ultra-short light pulses
Djadaojee et al. Stimulated brillouin gain spectroscopy of superfluid helium-4
CN202002885U (en) Device for measuring optical nonlinearity of material by using dual transient phase object (T-PO) technology
CN112345465A (en) Method for measuring thermal stress birefringence coefficient of laser crystal based on polarization cavity ring-down
CN104964929A (en) Method for obtaining material thermo-optical coefficient through measuring light spot radius change
CN108918457A (en) The device and method that THz wave modulates laser spectral intensity measurement electro-optic coefficient
CN108449132B (en) Method for measuring wavelength tuning quantity of high-precision tunable optical filter
Paugstadt et al. Method for temporally and spatially resolved thermal-lensing measurements
CN201331494Y (en) Single pulse measuring material non-linearity refracted device

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant
TR01 Transfer of patent right
TR01 Transfer of patent right

Effective date of registration: 20230526

Address after: 030006 No. C618, 6th floor, No. 402, South Central Street, Taiyuan Xuefu Park, Shanxi comprehensive reform demonstration zone, Taiyuan City, Shanxi Province

Patentee after: TAIYUAN SHANDA YUGUANG TECHNOLOGICAL Co.,Ltd.

Address before: 030006, No. 92, Hollywood Road, Xiaodian District, Shanxi, Taiyuan

Patentee before: SHANXI University