CN112345465A - Method for measuring thermal stress birefringence coefficient of laser crystal based on polarization cavity ring-down - Google Patents
Method for measuring thermal stress birefringence coefficient of laser crystal based on polarization cavity ring-down Download PDFInfo
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Abstract
The invention discloses a method for measuring the thermal stress birefringence coefficient of a laser crystal based on polarization cavity ring-down, which adopts laser irradiation to heat the laser crystal to generate temperature rise, and adopts the polarization cavity ring-down method to measure the thermal stress birefringence phase difference of the laser crystal at different temperatures, thereby obtaining the thermal stress birefringence coefficient of the laser crystal. The method utilizes the polarization cavity ring-down method to measure the high sensitivity and high precision of the stress birefringence, and can measure the very low thermal stress birefringence, the thermal stress birefringence coefficient and the two-dimensional spatial distribution of the laser crystal, thereby greatly improving the measurement precision of the low thermal stress birefringence coefficient and the spatial distribution of the laser crystal.
Description
Technical Field
The invention relates to the field of laser optical element detection, in particular to a method for measuring a thermal stress birefringence coefficient of a laser crystal.
Background
With the continuous development and wide application of laser technology, laser crystals serving as core elements of lasers are also rapidly developed, new laser crystals with better performance are continuously emerged, and the application of the laser technology in more and more fields is expanded. In order to obtain laser output with high output power, good beam quality, and stable and controllable polarization characteristics, a high-quality laser crystal is required. Defects in the laser crystal and the resulting nonuniformity of the characteristic distribution are the main limiting factors of the application of the laser crystal, which can cause unstable laser output power, deteriorated beam quality, reduced polarization degree and even abnormal operation of the laser. Therefore, accurately representing various characteristic parameters and distribution uniformity of the laser crystal has important significance for improving the quality of the laser crystal and further expanding the application field of the laser technology.
The thermal stress birefringence coefficient of the laser crystal is a main parameter for representing the optical properties of the birefringent laser crystal, is related to a plurality of factors in the growth and processing processes of the laser crystal, and the measurement of the thermal stress birefringence coefficient and the distribution thereof of the laser crystal can effectively evaluate the optical performance of the laser crystal, ensure the quality of the laser crystal and simultaneously improve the test data for improving the growth and preparation processes of the laser crystal.
The method for measuring the birefringence coefficient of the laser crystal mainly comprises a compensation method, a light intensity method, a polarization modulation method, a polarization interferometry and the like. The methods are mainly based on polarization-polarization analysis principle, the stress birefringence measurement sensitivity and precision are low, and the methods cannot be applied to real-time online measurement of laser crystals. Chinese patent application No. 201810203830.2, "laser crystal thermal stress birefringence coefficient measuring device and method", heats the laser crystal by laser irradiation, measures the thermal stress birefringence of the laser crystal by detecting the laser beam at the same time, obtains the thermal stress birefringence coefficient of the laser crystal, but the stress birefringence measurement is still realized by measuring the laser power based on the polarization-analysis principle, and the measurement precision is low.
Disclosure of Invention
The technical problem to be solved by the invention is as follows: the method overcomes the defects of low sensitivity and low precision of the prior polarization-polarization analysis principle-based measurement of the thermal stress birefringence coefficient of the laser crystal, and provides a method for accurately measuring the thermal stress birefringence optical path difference of the laser crystal under the irradiation of heating laser (and under the non-irradiation condition) by adopting a polarized cavity ring-down method, thereby realizing the high-precision measurement of the thermal stress birefringence coefficient of the laser crystal.
In order to achieve the purpose, the invention provides a method for measuring the thermal stress birefringence coefficient of a laser crystal based on cavity ring-down of a polarized light, which is characterized by comprising the following steps: heating the laser crystal by laser irradiation to generate temperature rise, and measuring the thermal stress birefringence phase difference of the laser crystal at different temperatures by adopting a polarized cavity ring-down method so as to obtain the thermal stress birefringence coefficient of the laser crystal; the device used by the measuring method mainly comprises a detection laser light source (1), an acousto-optic modulator (2), a diaphragm (3), a polarization polarizer (4), a first plano-concave high reflection cavity mirror (5), a laser crystal to be measured (6), a second plano-concave high reflection cavity mirror (7), a quarter wave plate (8), a polarization splitting prism (9), a first focusing lens (10), a first photoelectric detector (11), a second focusing lens (12), a second photoelectric detector (13), a signal acquisition processing computer (14), a threshold triggering circuit (15), a heating laser light source (16), a third focusing lens (17) and a laser power meter (18); laser beams output by a detection laser light source (1) are changed into linear polarized light by a polarization polarizer (4) and then enter a test ring-down cavity formed by a first plano-concave high reflection cavity mirror (5), a second plano-concave high reflection cavity mirror (7) and a vertically inserted detected laser crystal (6), a threshold trigger circuit (15), an acousto-optic modulator (2) and a diaphragm (3) are combined to form an optical switch to turn off detection laser beams entering the resonant cavity, generated cavity ring-down signals are decomposed into s-polarized light and p-polarized light by a quarter wave plate (8) and a polarization splitting prism (9) and then are respectively focused to a first photoelectric detector (11) and a second photoelectric detector (13) by a first focusing lens (10) and a second focusing lens (12) for detection, the s-polarized light and p-polarized cavity ring-down signals output by the photoelectric detectors (11) and (13) are collected by a computer (14) and data processing are carried out to obtain the stress of the detected laser crystal A birefringence phase difference; a heating laser light source (16) is adopted to irradiate the measured laser crystal through a third focusing lens (17) in a focusing manner to generate temperature rise in a detection laser measurement area, the thermal stress birefringence phase difference of the measured laser crystal under different temperature conditions is measured by changing the irradiation laser power monitored by a laser power meter (18) and the temperature of the irradiated area, and the thermal stress birefringence coefficient of the measured laser crystal is calculated.
The specific implementation steps are as follows:
(1) selecting proper detection laser wavelength according to the absorption spectrum curve of the laser crystal to be detected, and measuring the thermal stress birefringence optical path difference of the laser crystal to be detected by adopting a polarized cavity ring-down method at the detection laser wavelength;
(2) selecting proper heating laser wavelength according to an absorption spectrum curve of the laser crystal to be detected, adopting heating laser irradiation to realize temperature rise of a detected area of the laser crystal to be detected, calculating the temperature distribution of the detected area according to the heating laser power, the absorption rate of the laser crystal to be detected at the irradiation laser wavelength and the thermophysical characteristics of the laser crystal to be detected, and measuring the thermal stress birefringence optical path difference of the laser crystal to be detected under the temperature condition;
(3) changing the heating laser irradiation power, repeating the step (2), and measuring the thermal stress birefringence optical path difference of the laser crystal to be measured under different temperature conditions;
(4) and (4) calculating the thermal stress birefringence coefficient of the laser crystal to be measured according to the relation curve of the thermal stress birefringence optical path difference of the laser crystal to be measured and the temperature measured in the steps (1) to (3).
The laser crystal to be detected is of a lath or thin-sheet structure, two surfaces perpendicular to the detection laser beam are optical polishing planes and are parallel to each other, and the scattering loss of the detection beam generated by the two optical polishing planes is lower than 0.01%. .
The sum of the absorption of the laser crystal to be tested at the selected detection laser wavelength and the scattering loss of the two optical polishing planes is not higher than 1%.
The heating laser wavelength is the pump laser wavelength or the high absorption peak wavelength of the laser crystal to be detected, and the absorption rate of the laser crystal to be detected at the selected heating laser wavelength is not lower than 1%.
The detection laser light source is a continuous laser, TEM00And (4) outputting the power of the die by 0.1-100 mW.
The heating laser light source is a continuous or repeated frequency pulse laser, and the output power is adjustable from 0.1W to 1000W.
The light spot focused to the measured area of the laser crystal by the heating laser is determined according to the power of the heating laser, so that the laser damage to the measured laser crystal is avoided.
Step (3) in claim 2 may not be performed for a laser crystal having a linear thermal stress birefringence coefficient, which is determined from the measurements of steps (1) and (2).
The temperature of steps (2) and (3) in claim 2 can be measured by other methods, such as by thermal infrared imager.
And placing the laser crystal to be measured on a two-dimensional scanning translation table, and measuring the thermal stress birefringence coefficients at different positions to obtain the two-dimensional distribution of the thermal stress birefringence coefficients of the laser crystal to be measured.
Drawings
FIG. 1 is a schematic diagram of a device for measuring the thermal stress birefringence coefficient of a laser crystal based on cavity ring-down of a polarized light according to the present invention.
FIG. 2 is the absorption spectrum of the laser crystal to be tested
FIG. 3 is a diagram showing the s-polarized cavity ring-down signal and its theoretical fitting curve of the laser crystal under test under heating laser irradiation and non-irradiation.
FIG. 4 is a graph showing the measurement results of the thermal stress birefringence optical path difference between the laser crystal to be measured and the laser crystal not to be measured.
Detailed Description
The method for measuring the thermal stress birefringence coefficient of the laser crystal based on cavity ring-down of the polarized light provided by the invention is specifically described below with reference to fig. 1 to 4. It is to be understood, however, that the drawings are provided for a better understanding of the invention and are not to be construed as limiting the invention.
The laser crystal thermal stress birefringence coefficient measuring device based on polarized cavity ring-down shown in figure 1 is composed of a detection laser light source (1), an acousto-optic modulator (2), a diaphragm (3), a polarization polarizer (4), a first plano-concave high reflection cavity mirror (5), a laser crystal to be measured (6), a second plano-concave high reflection cavity mirror (7), a quarter wave plate (8), a polarization beam splitter prism (9), a first focusing lens (10), a first photoelectric detector (11), a second focusing lens (12), a second photoelectric detector (13), a signal acquisition processing computer (14), a threshold trigger circuit (15), a heating laser light source (16), a third focusing lens (17) and a laser power meter (18). Laser beams output by a detection laser light source (1) are changed into linear polarized light by a polarization polarizer (4) and then enter a test ring-down cavity formed by a first plano-concave high reflection cavity mirror (5), a second plano-concave high reflection cavity mirror (7) and a vertically inserted detected laser crystal (6), a threshold trigger circuit (15), an acousto-optic modulator (2) and a diaphragm (3) are combined to form an optical switch to turn off detection laser beams entering the resonant cavity, generated cavity ring-down signals are decomposed into s-polarized light and p-polarized light by a quarter wave plate (8) and a polarization splitting prism (9) and then are respectively focused to a first photoelectric detector (11) and a second photoelectric detector (13) by a first focusing lens (10) and a second focusing lens (12) for detection, the s-polarized light and p-polarized cavity ring-down signals output by the photoelectric detectors (11) and (13) are collected by a computer (14) and data processing are carried out to obtain the stress of the detected laser crystal A birefringence phase difference; a heating laser light source (16) is adopted to irradiate a laser crystal (6) to be detected in a focusing mode through a third focusing lens (17) to generate temperature rise in a detection laser measuring area, the irradiation laser power monitored by a laser power meter (18) and the temperature of the irradiated area are changed, the thermal stress birefringence phase difference of the laser crystal to be detected at different temperatures is measured, and the thermal stress birefringence coefficient of the laser crystal to be detected is calculated.
FIG. 2 is an absorption spectrum of the YAG laser crystal of the present invention. The wavelength of the laser for detection can be 632.8nm (wavelength of helium-neon laser) or 1064nm (wavelength of YAG solid laser) according to the absorption spectrum, and the wavelength of the common pump light of YAG laser can be 808nm for heating the laser.
FIG. 3 is a diagram showing the s-polarized cavity ring-down signal and its theoretical fitting curve of the laser crystal under test under heating laser irradiation and non-irradiation. Using a nonlinear multi-parameter fitting method to make the s-polarized cavity ring-down signal or the p-polarized cavity ring-down signal according to a formula
Fitting is carried out to obtain the polarization state oscillation frequency omega caused by thermal stress birefringence, and the thermal stress birefringence optical path difference OPD can be expressed as
The fitting method comprises the following steps of obtaining fitting parameters, wherein the fitting parameters comprise six, A is amplitude, tau is ring-down time, m is a modulation coefficient, omega is modulation angular frequency, phi is an initial phase, and B is direct current bias; wherein, lambda is the detection laser wavelength, c is the vacuum light speed, and t is the time variable; l is the cavity length of the resonant cavity, and the L is the L0Calculating (n-1) d; wherein L is0For not inserting the measured stimulusWhen the laser crystal is used, the cavity length of the cavity is ring down, and n and d are respectively the refractive index and the thickness of the laser crystal to be detected.
FIG. 4 shows the measurement results of the thermal stress birefringence optical path difference of the laser crystal under test when the laser crystal is irradiated and not irradiated with the heating laser. The thermal stress birefringence optical path difference of the YAG laser crystal to be measured under the condition of no heating laser irradiation is 0.132nm, the thermal stress birefringence optical path difference of the YAG laser crystal to be measured under the condition of 808nm laser irradiation of 0.71W is 0.071nm, the temperature rise of the measuring point is 1.0K, the caused thermal stress birefringence optical path difference variation is 0.061nm, and therefore the thermal stress birefringence coefficient of the YAG laser crystal to be measured can be calculated.
In a word, the invention provides a method for measuring the thermal stress birefringence coefficient of the laser crystal based on the ring-down of the polarized light cavity, which can greatly improve the thermal stress birefringence coefficient of the laser crystal compared with the existing measuring method, and particularly improve the measuring precision of the thermal stress birefringence coefficient which is very small.
Claims (11)
1. A laser crystal thermal stress birefringence coefficient measuring method based on polarization cavity ring-down adopts laser irradiation to heat a laser crystal to generate temperature rise, and adopts a polarization cavity ring-down method to measure the thermal stress birefringence phase difference of the laser crystal at different temperatures, so as to obtain the thermal stress birefringence coefficient of the laser crystal; the device used by the measuring method mainly comprises a detection laser light source (1), an acousto-optic modulator (2), a diaphragm (3), a polarization polarizer (4), a first plano-concave high reflection cavity mirror (5), a laser crystal to be measured (6), a second plano-concave high reflection cavity mirror (7), a quarter wave plate (8), a polarization splitting prism (9), a first focusing lens (10), a first photoelectric detector (11), a second focusing lens (12), a second photoelectric detector (13), a signal acquisition processing computer (14), a threshold triggering circuit (15), a heating laser light source (16), a third focusing lens (17) and a laser power meter (18); the laser beam output by the detection laser source (1) is changed into linearly polarized light by the polarization polarizer (4) and then enters a test ring-down cavity consisting of a first plano-concave high reflection cavity mirror (5), a second plano-concave high reflection cavity mirror (7) and a laser crystal (6) to be tested which is vertically inserted, the threshold trigger circuit (15), the acousto-optic modulator (2) and the diaphragm (3) are combined to form an optical switch to cut off a detection laser beam incident to the resonant optical cavity, a generated cavity ring-down signal is decomposed into s-polarized light and p-polarized light through a quarter-wave plate (8) and a polarization beam splitter prism (9) and then focused to a first photoelectric detector (11) and a second photoelectric detector (13) by a first focusing lens (10) and a second focusing lens (12) respectively for detection, polarization cavity ring-down signals output by the photoelectric detectors (11) and (13) are collected by a computer (14) and subjected to data processing to obtain the stress birefringence phase difference of the laser crystal to be detected; a heating laser light source (16) is adopted to irradiate the measured laser crystal through a third focusing lens (17) in a focusing manner to generate temperature rise in a detection laser measurement area, the thermal stress birefringence phase difference of the measured laser crystal at different temperatures is measured by changing the irradiation laser power monitored by a laser power meter (18) and the temperature of the irradiated area, and the thermal stress birefringence coefficient of the measured laser crystal is calculated.
2. The method for measuring the thermal stress birefringence coefficient of the laser crystal based on the ring-down of the polarized cavity as claimed in claim 1, is characterized by comprising the following steps:
(1) selecting proper detection laser wavelength according to the absorption spectrum curve of the laser crystal to be detected, and measuring the thermal stress birefringence optical path difference of the laser crystal to be detected by adopting a polarized cavity ring-down method at the detection laser wavelength;
(2) selecting proper heating laser wavelength according to an absorption spectrum curve of the laser crystal to be detected, adopting heating laser irradiation to realize temperature rise of a detected area of the laser crystal to be detected, calculating the temperature distribution of the detected area according to the heating laser power, the absorption rate of the laser crystal to be detected at the irradiation laser wavelength and the thermophysical characteristics of the laser crystal to be detected, and measuring the thermal stress birefringence optical path difference of the laser crystal to be detected under the temperature condition;
(3) changing the heating laser irradiation power, repeating the step (2), and measuring the thermal stress birefringence optical path difference of the laser crystal to be measured under different temperature conditions;
(4) and (4) calculating the thermal stress birefringence coefficient of the laser crystal to be measured according to the relation curve of the thermal stress birefringence optical path difference of the laser crystal to be measured and the temperature measured in the steps (1) to (3).
3. The method for measuring the thermal stress birefringence coefficient of the laser crystal based on the ring-down of the polarized cavity as claimed in claim 1, wherein: the detected laser crystal is in a lath or thin-sheet structure, two surfaces perpendicular to the detection laser beam are optical polishing planes and are parallel to each other, and the scattering loss of the detection beam generated by the two optical polishing planes is lower than 0.01%.
4. The method for measuring the thermal stress birefringence coefficient of the laser crystal based on the ring-down of the polarized cavity as claimed in claim 1, wherein: the sum of the absorption rate of the tested laser crystal at the selected detection laser wavelength and the scattering loss of the two optical polishing planes is not higher than 1%.
5. The method for measuring the thermal stress birefringence coefficient of the laser crystal based on the ring-down of the polarized cavity as claimed in claim 1, wherein: the selected heating laser wavelength is the pump laser wavelength or the high absorption peak wavelength of the laser crystal to be detected, and the absorption rate of the laser crystal to be detected at the selected heating laser wavelength is not lower than 1%.
6. The method for measuring the thermal stress birefringence coefficient of the laser crystal based on the ring-down of the polarized cavity as claimed in claim 1, wherein: the detection laser light source is a continuous laser, TEM00And (4) outputting the power of the die by 0.1-100 mW.
7. The method for measuring the thermal stress birefringence coefficient of the laser crystal based on the ring-down of the polarized cavity as claimed in claim 1, wherein: the heating laser light source is a continuous or repeated frequency pulse laser, and the output power is adjustable from 0.1W to 1000W.
8. The method for measuring the thermal stress birefringence coefficient of the laser crystal based on the ring-down of the polarized cavity as claimed in claim 1, wherein: the light spot focused to the measured area of the laser crystal by the heating laser is determined according to the power of the heating laser, so that the laser damage to the measured laser crystal is avoided.
9. The method for measuring the thermal stress birefringence coefficient of the laser crystal based on the ring-down of the polarized cavity as claimed in claim 1, wherein: step (3) in claim 2 may not be performed for a laser crystal having a linear thermal stress birefringence coefficient, which is determined from the measurements of steps (1) and (2).
10. The method for measuring the thermal stress birefringence coefficient of the laser crystal based on the ring-down of the polarized cavity as claimed in claim 1, wherein: the temperature of steps (2) and (3) in claim 2 can be measured by other methods, such as by thermal infrared imager.
11. The method for measuring the thermal stress birefringence coefficient of the laser crystal based on the ring-down of the polarized cavity as claimed in claim 1, wherein: and placing the laser crystal to be measured on a two-dimensional scanning translation table, and measuring the thermal stress birefringence coefficients at different positions to obtain the two-dimensional distribution of the thermal stress birefringence coefficients of the laser crystal to be measured.
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| CN113820051A (en) * | 2021-08-19 | 2021-12-21 | 南京大学 | Complementary interference stress measuring device for material |
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