CN106706131A - Double-incident slit high-resolution imaging spectral system - Google Patents
Double-incident slit high-resolution imaging spectral system Download PDFInfo
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- CN106706131A CN106706131A CN201710037344.3A CN201710037344A CN106706131A CN 106706131 A CN106706131 A CN 106706131A CN 201710037344 A CN201710037344 A CN 201710037344A CN 106706131 A CN106706131 A CN 106706131A
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- 238000003384 imaging method Methods 0.000 title claims abstract description 35
- 230000003595 spectral effect Effects 0.000 title abstract description 19
- 238000012937 correction Methods 0.000 claims abstract description 12
- 238000001514 detection method Methods 0.000 claims abstract description 7
- 238000001228 spectrum Methods 0.000 claims description 28
- 230000003287 optical effect Effects 0.000 claims description 21
- 239000000463 material Substances 0.000 claims description 6
- 230000005855 radiation Effects 0.000 claims description 4
- 230000000007 visual effect Effects 0.000 claims description 4
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 3
- 230000005499 meniscus Effects 0.000 claims description 3
- 230000008901 benefit Effects 0.000 abstract description 5
- 230000004075 alteration Effects 0.000 abstract description 3
- 238000013461 design Methods 0.000 description 14
- 239000006185 dispersion Substances 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- 239000000835 fiber Substances 0.000 description 3
- 229910000838 Al alloy Inorganic materials 0.000 description 2
- 102100025490 Slit homolog 1 protein Human genes 0.000 description 2
- 101710123186 Slit homolog 1 protein Proteins 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 238000009738 saturating Methods 0.000 description 2
- 238000004611 spectroscopical analysis Methods 0.000 description 2
- 238000010183 spectrum analysis Methods 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 1
- 201000009310 astigmatism Diseases 0.000 description 1
- 238000001444 catalytic combustion detection Methods 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000000354 decomposition reaction Methods 0.000 description 1
- 230000004313 glare Effects 0.000 description 1
- 239000002241 glass-ceramic Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 239000013307 optical fiber Substances 0.000 description 1
- 238000005457 optimization Methods 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 238000011002 quantification Methods 0.000 description 1
- 230000011514 reflex Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/2823—Imaging spectrometer
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/021—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using plane or convex mirrors, parallel phase plates, or particular reflectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0297—Constructional arrangements for removing other types of optical noise or for performing calibration
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/04—Slit arrangements slit adjustment
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- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Spectrometry And Color Measurement (AREA)
Abstract
The present invention discloses a double-incident slit high-resolution imaging spectral system. The double-incident slit high-resolution imaging spectral system is composed of double incident slits, a beam splitting subsystem and a detection subsystem; the beam splitting subsystem includes a main reflector, a convex grating, a secondary reflector and a correction lens; and the detection subsystem includes a filter and a surface array detector. The system has the advantages of high resolution, short re-visiting time, lower cost and highly-integrated space system. A double-slit structure enables the system to obtain spectral information of two target areas simultaneously with observation performed for once, so that re-visiting time can be shortened; and the main reflector, the convex grating and the secondary reflector are designed to be concentric, and therefore, the aberration of the system can be reduced, and the resolution of the system can be improved.
Description
Technical field
The present invention relates to a kind of double slit incident imaging light spectra system, more particularly to one kind can be used for ground-based telescope system
System, the high-resolution of spaceborne, airborne optical spectrum imagers, it is high as matter, slit long, quick revisit time Optical System Design.
Technical background
Optical spectrum imagers grow up the eighties in 20th century on the basis of multispectral remote sensing imaging technique, can be with bloom
Spectral resolution obtains the super multispectral image of scenery and target, is had a wide range of applications in air, ocean and land are observed.Light
Spectrum imager is the combination of imaging technique and spectral technique, and continuous spectroscopic measurement pair is spatially carried out by continuous imaging
Target carries out " qualitative, quantitative, timing, positioning " analysis and dynamic process detection, while realizing acquisition object space information
The spectral information of target can be obtained.
Light splitting pattern in spectrum imaging system has color dispersion-type and interference-type, and the dispersion element that color dispersion-type is used is main
Have：Dispersing prism, interferometric filter, plane balzed grating, etc..Prismatic decomposition optical spectrum imagers can form Spectral line bend；Interference point
Accuracy influence of the mechanics, thermal stability of light optical spectrum imagers on interference spectrum is larger, and in-orbit spectral calibration difficulty is big.
Therefore grating dispersion imaging spectrometer has remarkable advantage than the other types imaging spectrometer such as prism, wave filter, interference-type.Pass
The key constraints of system grating dispersion type imaging spectrometer are, when system aperture is big, to produce larger optical distortion, height
Veiling glare of diffraction time etc., has had a strong impact on spectral purity and has limited the accuracy of later data Processing Algorithm.Concave surface light
Grid are usually used in portable spectrometer because of compact, and convex grating spectrometer is big etc. because of its symmetrical structure, total-reflection type and image field
Advantage more application is in space flight high-resolution Hyperspectral imager.
D.Kwo proposes the convex grating imaging spectrograph based on the concentric beam-splitting structures of Offner first within 1987, and this is
System simple structure, easily realizes large aperture with convex grating as dispersion element.This design ensures that all third order aberrations are zero,
Only exist level V astigmatism.1999, M.P.Chrisp was improved system, significantly improved convex grating imaging spectrum
The image quality of instrument.Compared with traditional imaging spectrometer, the convex grating imaging spectrograph based on Offner structures has macropore
Footpath, low optical distortion, simple structure, the characteristic that is easily achieved miniaturization, reduce design difficulty and the rear end of imaging spectrometer
The complexity of data processing, improves the degree of accuracy of imaging spectral analysis.A kind of efficient push-broom type EO-1 hyperion of U.S. NRL exploitations
Imager PHILIS, spectrometer used is HyperSpecTMVM~15, wave band is 400~1000nm, and ground sample rate is 25m
And 130m, focal length is 180mm.Using Offner structures, from 1024 × 1024 back lighting type CCDs, light spectrum image-forming only make use of
1024 × 512 pixels, each pixel differentiates 1.13nm spectrum.
In push-scanning image spectrometer, in order to when realizing high-resolution under conditions of ensureing signal to noise ratio and quickly revisiting
Between, generally require larger system, and more expensive expense.And in imaging fiber spectrometer, ensureing that properties refer to
On the basis of mark is constant, expanding visual field will necessarily also increase the volume and expense of system.
Therefore, current each imaging spectrometer be difficult to and meanwhile meet high spectral resolution, it is high as matter, quick revisit time, compared with
Low cost and space system are highly integrated.
The content of the invention
High-resolution, height for telescopic system requirement is as matter, slit long, quick revisit time, and space system
In highly integrated application background, the present invention discloses a kind of double slit offner formula imaging spectrum systems, to solve above-mentioned correlation
Problem.
The present invention is achieved through the following technical solutions：
System includes that double entrance slits 1, concave reflection primary mirror 2, convex refractive grating 3, concave reflection secondary mirror 4, correction are saturating
Mirror 5, optical filter 6, planar array detector 7, it is characterised in that：The described different visual fields of the correspondence of double entrance slits 1 two, material is aluminium
Alloy 6061；Described concave reflection primary mirror 2, the face type of secondary mirror 3 are sphere；The face type of described convex refractive grating 3 is ball
Face, system stop is placed on grating；Described correction lens 5 are meniscus shaped lens, and material is vitreous silica；Described face battle array is visited
The pixel dimension 12um of device 7 is surveyed, pixel number is 6K × 6K.
System specific design is as follows：
1st, the design of entrance slit element
System entrance slit element is designed from double slit arranged side by side, and double slit size is identical, meets system index requirement.Between double slit
Every parameter detector, system spectrum resolution ratio and system dimension is considered, make light beam through double slit by after light splitting subsystem,
The spectrum of expansion is non-overlapping.
2nd, the design of light splitting subsystem
System beam splitter selects convex refractive grating, and convex grating is comprehensive preferably, and dispersion is linearly conducive to quantification
Using；Blaze wavelength selects that with explorer response, solar spectrum irradiancy matched design preferable detectivity can be obtained
Uniformity；Reflective structure is easier to realize focal plane stability and radiation spectrum stability, is suitable for space environment application.It is convex
Concave grating spectrometer because the advantages of its symmetrical structure, total-reflection type are big with image field more application in space flight high-resolution EO-1 hyperion into
As in system.
Light splitting subsystem uses Offner structures, the light splitting of the convex grating imaging spectrograph based on Offner concentric structures
Subsystem is made up of 3 optical elements：2 concave spherical mirrors and 1 convex grating.3 common centre ofs sphere of optical element, convex simultaneously
Concave grating is located between two spherical reflectors, is the key element of light splitting subsystem, is also limitation convex grating imaging spectrograph
The principal element of efficiency.The light beam being collected into via telescope or fibre bundle passes through double entrance slits and enters light splitting subsystem, warp
Concave surface primary mirror reflexes to convex blazed grating surface, after grating surface presses wavelength dispersion, is converged to via the reflection of concave surface secondary mirror
Detector.Thus, the one-dimensional presentation of the vertical raster groove that planar array detector gets is two the two of slit incident beam
Group spectral information, one-dimensional parallel to grating line is the fine striations similar to shape of slit；If fibre bundle is incident, then
One-dimensional parallel to grating line is the corresponding location dimension of different optical fiber.Additionally, in design optimization, introduce one piece it is aspherical
Meniscus shaped lens, for reducing system aberration, diaphragm is located on convex refractive grating.Design has large aperture, low optical in itself
Distortion, simple structure, the characteristic for being easily achieved miniaturization, reduce design difficulty and the Back end data treatment of imaging spectrometer
Complexity, improves the degree of accuracy of imaging spectral analysis.
The geometric parameter of light-splitting device also needs to consider the design of diffraction characteristic, depending on spectrum imaging system index.This
In patent, convex refractive grating diffration level is -1 grade, and raster size is determined with incisure density according to wave band, spectrum sample rate
It is fixed.
3rd, detection subsystem design
Detection subsystem includes filter plate and planar array detector two parts.Due to system service band be 200nm~
550nm, it is therefore desirable to which device one piece of mosaic filter plate eliminates 200nm~275nm at 400nm~550nm before the detectors
Second-order diffraction spectrum.In view of the expansion spectrum and resolution ratio of double slit, planar array detector pixel dimension 12um, pixel number is 6K
×6K。
As described above, a kind of double incidence high-resolution spectroscopy imaging systems of the invention, it includes double entrance slits
1st, concave reflection primary mirror 2, convex refractive grating 3, concave reflection secondary mirror 4, correction lens 5, optical filter 6, planar array detector 7.Come
Enter system through preposition telescope from the radiation of strip-type earth's surface target, by the spectral radiant energy after slit, via primary mirror
Convex refractive grating is reflexed to, by reflecting grating light splitting, the light of the different wave length of different slits is separated, then meeting is reflected through secondary mirror
Gather on planar array detector 7, realize accurate light spectrum image-forming.
The F/5 of described double slit incidence high-resolution spectroscopy imaging system, spectral resolution is 0.04nm；Operation wavelength is
200~550nm, volume is less than 70 × 400 × 1050mm3。
Compared with prior art, the advantage of the invention is that：Imaging spectrum system is meeting big visual field, high spectral resolution
On the premise of rate, high s/n ratio, it is highly integrated that double slit incidence can meet quick revisit time, lower cost and space system
Change；Convex grating imaging spectra system based on Offner structures can realize large aperture, low optical distortion, simple structure, easily
Minimized in realization.
Brief description of the drawings
Fig. 1 is the light path schematic diagram of the double slit Hyperspectral imager that the embodiment of the present invention is provided；
Fig. 2 is the double slit Hyperspectral imager component diagram that the embodiment of the present invention is provided；
Fig. 3 is the slit element structural representation of the double slit Hyperspectral imager that the embodiment of the present invention is provided；
Wherein：
1st, double entrance slits；
2nd, concave mirror；
3rd, convex refractive grating；
4th, concave reflection secondary mirror；
5th, lens are corrected；
6th, optical filter；
7th, planar array detector.
Specific embodiment
A preferable embodiment of the invention is given with reference to figure, is mainly used as further describing spy of the invention
Point, rather than for limiting the scope of the present invention：
Fig. 1 is the light path schematic diagram of the double slit Hyperspectral imager of the specific embodiment of the invention.Referring to accompanying drawing 1, come from
Double strip-type radiation signals of target by being imaged in respectively on field stop double aperture slit 1 after the telescopic system of front end, through double
The emittance of slit 1 is reflexed on convex refractive grating 3 via concave mirror 2, and the light of different wave length is separated, different
The light of wavelength after convex refractive grating 3 is reflected, along on different angle reflection to concave reflection secondary mirror 4, via recessed
Face reflection secondary mirror 4 is reflected, and into correction lens 5, eventually passes through the diverse location that optical filter 6 converges to planar array detector 7, real
Existing spectral line is separated.It is shown in the picture of fine striations shape on planar array detector 7, wherein the expansion spectrum of seam 1 is located at detector
The latter half, the expansion spectrum of seam 2 is located at detector top half.As a result of Offner structures, system realizes magnifying power
It is 1:1 imaging.
Fig. 2 is above-mentioned spectrum imaging system component diagram.Referring to accompanying drawing 2, wherein light splitting subsystem is by concave reflection master
Mirror 2, convex refractive grating 3, concave reflection secondary mirror 4, correction lens 5 are constituted；Detection subsystem is by optical filter 6, planar array detector 7
Constitute.The grating constant of wherein convex refractive grating 3 is every millimeter of 190 lines pair.
Fig. 3 is double entrance slit component structure schematic diagrames in the spectrum imaging system that the specific embodiment of the invention is provided.
Referring to accompanying drawing 3, each slit sizes is at intervals of 35mm between 50mm × 125um, slit, and slit element material is used in this patent
Expect to be aluminium alloy 6061.
System operation wavelength is 200nm~550nm, and spectral region 350nm, numerical aperture NA is 0.1, and slit sizes are
At intervals of 35mm between 50mm × 125um, slit, spectral resolution reaches 0.04nm, detector pixel dimension 12um, and pixel number is
6K × 6K, system magnifying power is 1:1.Total system mirror surface is full spherical design, and material is zero expansion glass ceramic, and correction is saturating
Mirror material is vitreous silica.System disc of confusion RMS radiuses, less than 1/2 detector pixel dimension, are within 5um in full filed
System volume is 70 × 400 × 1050mm3。
System major optical parameter：
| Optical element | Radius of curvature (mm) | Diameter (mm) |
| Concave reflection primary mirror | 1006.5 | 232 |
| Convex refractive grating | 510.6 | 106 |
| Concave reflection secondary mirror | 987.9 | 288.6 |
| Correction lens | 497.1/547.7 | 160 |
System ensure that on the premise of high spectral resolution, height are met in service band as matter, while realizing quick weight
Visit time, lower cost and the highly integrated design of space system.
Claims (2)
1. a kind of double slit incidence high-resolution imaging spectroscopic system, including double entrance slits (1), concave reflection primary mirror (2), convex surface
Reflecting grating (3), concave reflection secondary mirror (4), correction lens (5), optical filter (6), wherein planar array detector (7), concave reflection
Primary mirror (2), convex refractive grating (3), concave reflection secondary mirror (4), correction lens (5) constitute light splitting subsystem；Optical filter (6),
Planar array detector (7) constitutes detection subsystem, it is characterised in that：
System stop is located on convex refractive grating (3), and the double strip-type radiation signals from target are by front end telescope system
Imaged in respectively after system on field stop double aperture slit (1), through double aperture slit emittance via concave mirror (2), reflection
Onto convex refractive grating (3), the light of different wave length is separated, the light of different wave length is reflected in convex refractive grating (3)
Afterwards, along on different angle reflection to concave reflection secondary mirror (4), reflected via concave reflection secondary mirror, into correction lens
(5) diverse location that optical filter (6) converges to planar array detector (7), is eventually passed through；
Described double entrance slits (1), the different visual fields of correspondence two；
Described concave reflection primary mirror (2), secondary mirror (4) face type are sphere；
The face type of described convex refractive grating (3) is sphere；
Described correction lens (5) are meniscus shaped lens, and material is vitreous silica.
2. a kind of double slit incidence high-resolution imaging spectroscopic system according to claim 1, it is characterised in that：Described spy
Survey in subsystem, filter plate (6) is one piece of horse come the second-order diffraction spectrum that eliminates 200nm~275nm at 400nm~550nm
Match gram filter plate；The pixel dimension of planar array detector (7) is 12um, and pixel number is 6K × 6K.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201710037344.3A CN106706131A (en) | 2017-01-19 | 2017-01-19 | Double-incident slit high-resolution imaging spectral system |
| CN201710565845.9A CN107144350A (en) | 2017-01-19 | 2017-07-12 | A kind of pair of entrance slit high-resolution imaging spectroscopic system |
| CN201720842963.5U CN207280591U (en) | 2017-01-19 | 2017-07-12 | Double entrance slit high-resolution imaging spectroscopic systems |
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| CN201710037344.3A CN106706131A (en) | 2017-01-19 | 2017-01-19 | Double-incident slit high-resolution imaging spectral system |
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| CN201720842963.5U Active CN207280591U (en) | 2017-01-19 | 2017-07-12 | Double entrance slit high-resolution imaging spectroscopic systems |
| CN201710565845.9A Pending CN107144350A (en) | 2017-01-19 | 2017-07-12 | A kind of pair of entrance slit high-resolution imaging spectroscopic system |
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| CN201710565845.9A Pending CN107144350A (en) | 2017-01-19 | 2017-07-12 | A kind of pair of entrance slit high-resolution imaging spectroscopic system |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108398186A (en) * | 2018-02-07 | 2018-08-14 | 中国科学院光电研究院 | Free form surface Offner convex grating spectrum imaging systems |
| CN110672206A (en) * | 2019-09-30 | 2020-01-10 | 中国海洋大学 | Double-slit curved prism chromatic dispersion ultra-large field of view spectrometer optical system |
| CN113701882A (en) * | 2021-08-31 | 2021-11-26 | 中国科学院长春光学精密机械与物理研究所 | Spectrometer optical system and design method thereof |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108106729B (en) * | 2017-12-01 | 2019-09-10 | 中国科学院长春光学精密机械与物理研究所 | A kind of total CCD spectrometer of double grating |
| CN109724931B (en) * | 2019-03-06 | 2023-04-07 | 台州市维谱智能科技有限公司 | Real-time calibration spectrum sensing system and spectrum processing method thereof |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101545807A (en) * | 2009-05-08 | 2009-09-30 | 中国科学院上海技术物理研究所 | Multi-slit convex grating imaging spectrograph |
| CN104792414A (en) * | 2015-04-03 | 2015-07-22 | 中国科学院空间科学与应用研究中心 | Convex grating Offner structure double-slit multispectral system |
| CN105092031B (en) * | 2015-06-02 | 2017-08-25 | 中国科学院上海技术物理研究所 | A kind of infrared high spectrum imaging system with cold stop |
| CN106525237A (en) * | 2016-10-24 | 2017-03-22 | 中国科学院国家空间科学中心 | Multi-slit multispectral system of crossed Czerny-Turner structure |
-
2017
- 2017-01-19 CN CN201710037344.3A patent/CN106706131A/en active Pending
- 2017-07-12 CN CN201720842963.5U patent/CN207280591U/en active Active
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108398186A (en) * | 2018-02-07 | 2018-08-14 | 中国科学院光电研究院 | Free form surface Offner convex grating spectrum imaging systems |
| CN110672206A (en) * | 2019-09-30 | 2020-01-10 | 中国海洋大学 | Double-slit curved prism chromatic dispersion ultra-large field of view spectrometer optical system |
| CN113701882A (en) * | 2021-08-31 | 2021-11-26 | 中国科学院长春光学精密机械与物理研究所 | Spectrometer optical system and design method thereof |
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| CN207280591U (en) | 2018-04-27 |
| CN107144350A (en) | 2017-09-08 |
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Application publication date: 20170524 |