CN106643528A - Metalized film thickness observation device - Google Patents
Metalized film thickness observation device Download PDFInfo
- Publication number
- CN106643528A CN106643528A CN201610855479.6A CN201610855479A CN106643528A CN 106643528 A CN106643528 A CN 106643528A CN 201610855479 A CN201610855479 A CN 201610855479A CN 106643528 A CN106643528 A CN 106643528A
- Authority
- CN
- China
- Prior art keywords
- laser
- metallized film
- reflection
- film thickness
- detection platform
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
- G01B11/0625—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection
Abstract
The invention relates to a metalized film thickness observation device which belongs to the technical field of a capacitor detecting device. The metalized film thickness observation device comprises a detecting platform. A metalized film is laid on the detecting platform. Two sides of the metalized film on the detecting platform are symmetrically provided with reflection devices. Each reflection device is provided with a wedge-shaped reflection trough. The reflection devices at two sides of the detecting platform are provided with a laser transmitting device and a laser receiving device which are arranged at diagonal positions. Laser which is transmitted from the laser transmitting device is obliquely transmitted to the surface of the metalized film and is reflected to the laser receiving device through a curved path after reflection by the wedge-shaped reflection trough. According to the metalized film thickness observation device, after the laser which is transmitted from the laser transmitting device to the metalized film is reflected by multiple times in the curved path, multi-point detection is performed on the metalized film; the laser receiving device receives a signal; if a film thickness abnormity occurs, a receiving signal position on the laser receiving device is changed, and the quality of a capacitor film is judged according to the receiving signal position.
Description
Technical field
The present invention relates to a kind of metallized film thickness finder, belongs to capacitor detection means technical field.
Background technology
At present capacitor is widely used in fields such as power electronics, communications service and rail transports, with scientific and technological level
Development, capacitor by its good electrical performance and high reliability, become the above-mentioned industry field of promotion update can not or
Scarce electronic component, wherein thin film capacitor have greatly promoted sending out for capacitor technology field due to small volume, safe
Exhibition.The general preparation method of thin film capacitor is by metallic film and poly- ethyl ester, polypropylene, polystyrene or poly- carbonic acid in prior art
The plastic sheetings such as ester are wound into the metallized film electrode of cylindrical shape from after the overlap of two ends, in being then placed into capacitor case,
Injection insulating oil and epoxy resin, then thin film capacitor is obtained after assembling.Wherein, metallized film meeting during evaporation
There are the defects such as coating became uneven, splashing point, snake, oxide layer, such defect film is easy after membrane electrode is wound into
Appearance loss is excessive, and product quality is difficult to control to, and capacitor blast is even caused when serious.
Wherein, capacitor thickness testing equipment can be divided into thickness measurement online equipment and the non-big class of thickness measurement online equipment two.This
If it is optimal that two class thickness-measuring equipments can be used cooperatively, but thickness measurement online deice detection device is complex, and
Using non-contact detection, easily occur that film surface planarization is bad and situation that data fluctuations that cause are larger, Er Fei
Line thickness-measuring equipment can provide contact measurement method, effectively compensate for this deficiency of thickness measurement online.But it is thin in capacitor
Film field, non-thickness measurement online equipment easily causes the damage of metallized film coating, therefore based on on-line thickness measurement.
The content of the invention
For this purpose, the invention provides a kind of metallized film thickness finder, concrete technical scheme is as follows：
A kind of metallized film thickness finder, including detection platform, are equipped with metallized film, institute in the detection platform
State and be symmetrically arranged with reflection unit positioned at metallized film both sides in detection platform, wedge shape reflection is offered on the reflection unit
Groove, the reflection unit diagonal positions of the detection platform both sides are provided with laser beam emitting device and laser receiver, described
Laser beam emitting device transmitting laser incline be injected into metallized film surface, through wedge reflective groove reflection after with zigzag path
Reflex on laser receiver.
Used as the improvement of above-mentioned technical proposal, the position in the detection platform near metallized film side is provided with side
Light lamp.
Used as the improvement of above-mentioned technical proposal, the detection platform bottom is provided with supporting leg.
As the improvement of above-mentioned technical proposal, film cutting apparatus are connected to after the detection platform, the film cutting apparatus include dragon
Door frame, is hung with drive mechanism on the portal frame, the drive mechanism lower section is provided with knife rest, and the knife rest lower section is fixed with
Cutter head.
Above-mentioned technical proposal passes through Laser emission of the laser beam emitting device to metallized film, in metallized film thickness just
Chang Shi, through the reflection of the wedge reflective groove of reflection unit, laser signal will be reflected to another detection on metallized film
Point, after multiple zigzag reflection, on metallized film after multiple spot detection, laser receiver is received to signal,
If exception occurs in thickness, the reception signal location on laser receiver can change, and produce corresponding alarm sounds, and
The quality of capacitor film is judged with this, with beneficial technique effect and significant practical value.
Description of the drawings
Fig. 1 is a kind of structural representation of metallized film thickness finder of the invention；
Fig. 2 is a kind of schematic diagram of the metallized film thickness finder of the invention in depression angle；
Fig. 3 is the laser refraction path schematic diagram in the present invention between reflection unit.
Specific embodiment
As shown in Figure 1, Figure 2, Figure 3 shows, the invention provides a kind of metallized film thickness finder, including detection platform
20, metallized film 10 is equipped with the detection platform 20, the both sides pair of metallized film 10 are located in the detection platform 20
Title is provided with reflection unit 41, offers wedge reflective groove 411 on the reflection unit 41, the both sides of the detection platform 20 it is anti-
The diagonal positions of injection device 41 are provided with laser beam emitting device 40 and laser receiver 42, and the laser beam emitting device 40 is launched
Laser incline be injected into the surface of metallized film 10, through wedge reflective groove 411 reflect after laser is reflexed to zigzag path
In reception device 42.The technical scheme is thin metallizing by Laser emission of the laser beam emitting device 40 to metallized film 10
When the thickness of film 10 is normal, through the reflection of the wedge reflective groove 411 of reflection unit 41, laser signal will be reflected to metallized film
Another test point on 10, after multiple zigzag reflection, on metallized film 10 after multiple spot detection, laser pick-off dress
Put 42 pairs of signals to receive, if exception occurs in thickness, the reception signal location on laser receiver 42 can change,
And corresponding alarm sounds are produced, and the quality of capacitor film is judged with this.
Further, the position in the detection platform 20 near the side of metallized film 10 is provided with side light lamp 30, should
Being designed to for side light lamp 30 is luminous when laser receiver 42 detects thickness exception, is specifically judged by Visual Observations Observations
The caliper defects of metallized film 10, the advantage of the technical scheme is, if fully relying on regarding for testing staff during on-line checking
Inspection, human cost input is larger, and adopts the device of the present invention, then can detect thickness exception in laser receiver 42
When, then aid in the inspection of testing staff, substantially reduce person works' amount.
Further, the bottom of the detection platform 20 is provided with supporting leg 21, and the purpose of the supporting leg 21 is to detection
Platform 20 and the metallized film 10 slided along detection platform 20 are supported.
Further, film cutting apparatus are connected to after the detection platform 20, the film cutting apparatus include portal frame 50, described
Drive mechanism 51 is hung with portal frame 50, the lower section of the drive mechanism 51 is provided with knife rest 52, and the lower section of the knife rest 52 is fixed
There is cutter head 53.The preferred version by setting up cutting means, after inspection finder checks defect, and handmarking, and
When defective film slitting is fallen, it is to avoid defect film flow into after road cutting winding link, improve product percent of pass.
Embodiments of the invention have been described in detail above, but the content is only presently preferred embodiments of the present invention,
The practical range for limiting the present invention is not to be regarded as, all impartial changes made according to the scope of the invention and improvement etc. all should
Still belong within covering scope of the present invention.
Claims (4)
1. a kind of metallized film thickness finder, it is characterised in that including detection platform（20）, the detection platform（20）
On be equipped with metallized film（10）, the detection platform（20）It is upper to be located at metallized film（10）Both sides are symmetrically arranged with reflection
Device（41）, the reflection unit（41）On offer wedge reflective groove（411）, the detection platform（20）The reflection dress of both sides
Put（41）Diagonal positions are provided with laser beam emitting device（40）And laser receiver（42）, the laser beam emitting device（40）
The laser of transmitting is inclined and is injected into metallized film（10）Surface, through wedge reflective groove（411）It is anti-with zigzag path after reflection
It is mapped to laser receiver（42）On.
2. a kind of metallized film thickness finder as claimed in claim 1, it is characterised in that the detection platform（20）
Upper close metallized film（10）The position of side is provided with side light lamp（30）.
3. a kind of metallized film thickness finder as claimed in claim 2, it is characterised in that the detection platform（20）
Bottom is provided with supporting leg（21）.
4. a kind of metallized film thickness finder as claimed in claim 3, it is characterised in that the detection platform（20）
After be connected to film cutting apparatus, the film cutting apparatus include portal frame（50）, the portal frame（50）On be hung with drive mechanism（51）,
The drive mechanism（51）Lower section is provided with knife rest（52）, the knife rest（52）Lower section is fixed with cutter head（53）.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610855479.6A CN106643528A (en) | 2016-09-28 | 2016-09-28 | Metalized film thickness observation device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610855479.6A CN106643528A (en) | 2016-09-28 | 2016-09-28 | Metalized film thickness observation device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN106643528A true CN106643528A (en) | 2017-05-10 |
Family
ID=58854970
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610855479.6A Pending CN106643528A (en) | 2016-09-28 | 2016-09-28 | Metalized film thickness observation device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106643528A (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107917671A (en) * | 2017-12-29 | 2018-04-17 | 宁国市裕华电器有限公司 | A kind of capacitor film thickness error detection method |
| CN108592804A (en) * | 2017-12-29 | 2018-09-28 | 宁国市裕华电器有限公司 | A kind of Film Thickness Detection System based on laser reflection |
| CN108827167A (en) * | 2018-06-08 | 2018-11-16 | 芜湖市亿仑电子有限公司 | A kind of thickness detector of capacitor metalized film |
| CN117109488A (en) * | 2023-10-23 | 2023-11-24 | 北京华力兴科技发展有限责任公司 | High-precision X-ray thickness gauge |
| CN117109492A (en) * | 2023-10-23 | 2023-11-24 | 北京华力兴科技发展有限责任公司 | High-precision X-ray testing method |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0566114A (en) * | 1991-09-06 | 1993-03-19 | Hitachi Ltd | Thickness measuring device for transparent material |
| CN103115575A (en) * | 2013-01-16 | 2013-05-22 | 河北工业大学 | SiO2 film thickness measuring method |
| CN103415757A (en) * | 2010-12-20 | 2013-11-27 | 霍尼韦尔阿斯卡公司 | Single-sided infrared sensor for thickness or weight measurement of products containing a reflective layer |
| CN103673903A (en) * | 2013-12-23 | 2014-03-26 | 清华大学 | Film thickness measurement device |
| CN204262592U (en) * | 2014-09-26 | 2015-04-15 | 武汉拓普银光电技术有限公司 | Automatically the laser cutting machine of cover layer can be cut |
-
2016
- 2016-09-28 CN CN201610855479.6A patent/CN106643528A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0566114A (en) * | 1991-09-06 | 1993-03-19 | Hitachi Ltd | Thickness measuring device for transparent material |
| CN103415757A (en) * | 2010-12-20 | 2013-11-27 | 霍尼韦尔阿斯卡公司 | Single-sided infrared sensor for thickness or weight measurement of products containing a reflective layer |
| CN103115575A (en) * | 2013-01-16 | 2013-05-22 | 河北工业大学 | SiO2 film thickness measuring method |
| CN103673903A (en) * | 2013-12-23 | 2014-03-26 | 清华大学 | Film thickness measurement device |
| CN204262592U (en) * | 2014-09-26 | 2015-04-15 | 武汉拓普银光电技术有限公司 | Automatically the laser cutting machine of cover layer can be cut |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107917671A (en) * | 2017-12-29 | 2018-04-17 | 宁国市裕华电器有限公司 | A kind of capacitor film thickness error detection method |
| CN108592804A (en) * | 2017-12-29 | 2018-09-28 | 宁国市裕华电器有限公司 | A kind of Film Thickness Detection System based on laser reflection |
| CN108827167A (en) * | 2018-06-08 | 2018-11-16 | 芜湖市亿仑电子有限公司 | A kind of thickness detector of capacitor metalized film |
| CN117109488A (en) * | 2023-10-23 | 2023-11-24 | 北京华力兴科技发展有限责任公司 | High-precision X-ray thickness gauge |
| CN117109492A (en) * | 2023-10-23 | 2023-11-24 | 北京华力兴科技发展有限责任公司 | High-precision X-ray testing method |
| CN117109488B (en) * | 2023-10-23 | 2024-01-23 | 北京华力兴科技发展有限责任公司 | High-precision X-ray thickness gauge |
| CN117109492B (en) * | 2023-10-23 | 2024-01-23 | 北京华力兴科技发展有限责任公司 | High-precision X-ray testing method |
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| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20170510 |
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| RJ01 | Rejection of invention patent application after publication |