CN106625244B - 铜cmp在线测量点实时定位方法及系统 - Google Patents
铜cmp在线测量点实时定位方法及系统 Download PDFInfo
- Publication number
- CN106625244B CN106625244B CN201610867097.5A CN201610867097A CN106625244B CN 106625244 B CN106625244 B CN 106625244B CN 201610867097 A CN201610867097 A CN 201610867097A CN 106625244 B CN106625244 B CN 106625244B
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- China
- Prior art keywords
- wafer
- eddy current
- sensor probe
- current sensor
- center
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Links
- 238000000034 method Methods 0.000 title claims abstract description 62
- 238000005259 measurement Methods 0.000 title claims abstract description 39
- 238000005498 polishing Methods 0.000 claims abstract description 140
- 239000000523 sample Substances 0.000 claims abstract description 87
- 229910052802 copper Inorganic materials 0.000 claims abstract description 34
- 239000010949 copper Substances 0.000 claims abstract description 34
- 238000004364 calculation method Methods 0.000 claims description 23
- 238000010586 diagram Methods 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 238000012545 processing Methods 0.000 description 3
- 239000000126 substance Substances 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 238000003486 chemical etching Methods 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 230000002195 synergetic effect Effects 0.000 description 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B49/00—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
- B24B49/02—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation according to the instantaneous size and required size of the workpiece acted upon, the measuring or gauging being continuous or intermittent
- B24B49/04—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation according to the instantaneous size and required size of the workpiece acted upon, the measuring or gauging being continuous or intermittent involving measurement of the workpiece at the place of grinding during grinding operation
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Abstract
Description
Claims (8)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201610867097.5A CN106625244B (zh) | 2016-09-29 | 2016-09-29 | 铜cmp在线测量点实时定位方法及系统 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201610867097.5A CN106625244B (zh) | 2016-09-29 | 2016-09-29 | 铜cmp在线测量点实时定位方法及系统 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN106625244A CN106625244A (zh) | 2017-05-10 |
CN106625244B true CN106625244B (zh) | 2018-11-02 |
Family
ID=58854751
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201610867097.5A Expired - Fee Related CN106625244B (zh) | 2016-09-29 | 2016-09-29 | 铜cmp在线测量点实时定位方法及系统 |
Country Status (1)
Country | Link |
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CN (1) | CN106625244B (zh) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109159019B (zh) * | 2018-09-28 | 2020-06-02 | 大连理工大学 | 一种楔形基片研磨装置及其工作方法 |
CN115446669A (zh) * | 2021-06-09 | 2022-12-09 | 北京烁科精微电子装备有限公司 | 一种传感器与晶圆相对轨迹追踪方法 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB0322362D0 (en) * | 2003-09-24 | 2003-10-22 | Renishaw Plc | Measuring methods for use on machine tools |
CN100415446C (zh) * | 2006-07-21 | 2008-09-03 | 上海大学 | 跟踪式在线测量圆度误差和机床主轴误差的方法 |
CN103050427A (zh) * | 2012-12-27 | 2013-04-17 | 上海交通大学 | 一种晶圆预对准方法 |
CN104637850A (zh) * | 2013-11-08 | 2015-05-20 | 沈阳芯源微电子设备有限公司 | 一种晶圆动态对中方法 |
CN103677832A (zh) * | 2013-12-13 | 2014-03-26 | 清华大学 | 晶圆铜膜厚度的绘图方法及系统 |
-
2016
- 2016-09-29 CN CN201610867097.5A patent/CN106625244B/zh not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
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CN106625244A (zh) | 2017-05-10 |
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Effective date of registration: 20171013 Address after: 100084 Beijing City, Haidian District Tsinghua Yuan Applicant after: TSINGHUA University Applicant after: HWATSING TECHNOLOGY Co.,Ltd. Address before: 300350, Tianjin City, Jinnan District Science and Technology Park, Hai Hing Road, No. 9, building No. 8 Applicant before: HWATSING TECHNOLOGY Co.,Ltd. Applicant before: Tsinghua University |
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CP01 | Change in the name or title of a patent holder | ||
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Address after: 100084 Beijing City, Haidian District Tsinghua Yuan Co-patentee after: Huahaiqingke Co.,Ltd. Patentee after: TSINGHUA University Address before: 100084 Beijing City, Haidian District Tsinghua Yuan Co-patentee before: HWATSING TECHNOLOGY Co.,Ltd. Patentee before: TSINGHUA University |
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CF01 | Termination of patent right due to non-payment of annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20181102 Termination date: 20210929 |