CN106574902B - 用于检查本体的系统和方法 - Google Patents

用于检查本体的系统和方法 Download PDF

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Publication number
CN106574902B
CN106574902B CN201580041607.7A CN201580041607A CN106574902B CN 106574902 B CN106574902 B CN 106574902B CN 201580041607 A CN201580041607 A CN 201580041607A CN 106574902 B CN106574902 B CN 106574902B
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China
Prior art keywords
light
light source
target
end side
aperture
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CN201580041607.7A
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Chinese (zh)
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CN106574902A (zh
Inventor
S·J·格瑞格斯基
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Corning Inc
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Corning Inc
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/954—Inspecting the inner surface of hollow bodies, e.g. bores
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G01N21/95692—Patterns showing hole parts, e.g. honeycomb filtering structures

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  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
CN201580041607.7A 2014-05-28 2015-05-28 用于检查本体的系统和方法 Active CN106574902B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US14/288,790 US9448185B2 (en) 2014-05-28 2014-05-28 System and method for inspecting a body
US14/288,790 2014-05-28
PCT/US2015/032776 WO2015184032A1 (en) 2014-05-28 2015-05-28 System and method for inspecting a body

Publications (2)

Publication Number Publication Date
CN106574902A CN106574902A (zh) 2017-04-19
CN106574902B true CN106574902B (zh) 2020-04-14

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ID=53385967

Family Applications (1)

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CN201580041607.7A Active CN106574902B (zh) 2014-05-28 2015-05-28 用于检查本体的系统和方法

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Country Link
US (1) US9448185B2 (enExample)
EP (1) EP3149458B1 (enExample)
JP (1) JP6526061B2 (enExample)
CN (1) CN106574902B (enExample)
MX (1) MX374689B (enExample)
WO (1) WO2015184032A1 (enExample)
ZA (1) ZA201608151B (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016085737A1 (en) * 2014-11-25 2016-06-02 Corning Incorporated Apparatus and methods of inspecting ceramic honeycomb bodies
MX2019001242A (es) * 2016-07-29 2019-06-13 Corning Inc Aparatos y métodos para alinear, inspeccionar y fabricar cuerpos de panal de cerámica.
CN107290347B (zh) * 2017-07-12 2020-01-03 江苏阿瑞斯智能设备有限公司 蜂窝载体缺陷自动化检测方法
JP2019132708A (ja) * 2018-01-31 2019-08-08 池上通信機株式会社 中空柱状構造集合体の検査装置および検査システム

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3932859A (en) * 1974-03-07 1976-01-13 Anastasios Kyriakides Electronic dictionary with word length responsive decoder
JPS56107148A (en) 1980-01-31 1981-08-25 Toshiba Corp Clogging check device for monolithic object
JPS58155343A (ja) * 1982-03-12 1983-09-16 Katsuya Yamada ハニカム状物体の孔壁検査方法
JP2977583B2 (ja) 1990-06-08 1999-11-15 東洋インキ製造株式会社 網点の閾値発生方法
JPH05264459A (ja) 1992-03-23 1993-10-12 Sumitomo Metal Mining Co Ltd ハニカム体の目詰まり検査方法及び装置
JPH0643114A (ja) 1992-07-23 1994-02-18 Sumitomo Metal Mining Co Ltd ハニカム目詰まり検査装置
DE69414297T2 (de) 1993-03-31 1999-05-06 Ngk Insulators, Ltd., Nagoya, Aichi Verfahren und Vorrichtung zum Prüfen wabenförmiger Objekte mit mehreren Durchgangslöchern
JP2002243650A (ja) 2001-02-19 2002-08-28 Cataler Corp セル詰まりの検査方法およびセル詰まり検査装置
JP2003130799A (ja) 2001-10-26 2003-05-08 Ccs Inc 検査用照明装置
JP2003270158A (ja) 2002-03-12 2003-09-25 Denso Corp 貫通検査装置
JP3972749B2 (ja) * 2002-07-03 2007-09-05 住友金属鉱山株式会社 検査装置および貫通孔の検査方法
JP4001855B2 (ja) * 2003-10-28 2007-10-31 日本碍子株式会社 ハニカム構造体の隔壁表面の凹凸検査方法及び検査装置
JP4618532B2 (ja) * 2004-03-23 2011-01-26 日立金属株式会社 ハニカム体の検査装置
JP2005315742A (ja) * 2004-04-28 2005-11-10 Sony Corp 測定装置および測定方法
US7366340B1 (en) 2004-06-22 2008-04-29 Reflect Scientific (Dba) Miralogix Method and system for optically determining perpendicularity of end surface of part formed from parallel channels
US7701570B2 (en) * 2005-12-12 2010-04-20 Corning Incorporated Collimated light method and system for detecting defects in honeycombs
US8049878B2 (en) 2008-08-22 2011-11-01 Corning Incorporated Systems and methods for detecting defects in ceramic filter bodies
JP2010249798A (ja) 2009-03-23 2010-11-04 Ngk Insulators Ltd 目封止ハニカム構造体の検査装置及び目封止ハニカム構造体の検査方法
JP5401351B2 (ja) * 2009-03-23 2014-01-29 日本碍子株式会社 ハニカム構造体の検査方法
US8234909B2 (en) 2009-08-26 2012-08-07 Corning Incorporated Method and apparatus for inspecting ceramic wall flow filters
JP5984013B2 (ja) * 2011-12-27 2016-09-06 ウシオ電機株式会社 コヒーレント光源装置およびプロジェクタ
JP2013173243A (ja) 2012-02-23 2013-09-05 Sumitomo Chemical Co Ltd ハニカム構造体の検査方法、ハニカム構造体の製造方法、ハニカム構造体、封口用マスクの設計方法、及びハニカム構造体の検査プログラム
CN102735191B (zh) 2012-06-06 2015-01-21 南京柯瑞特种陶瓷股份有限公司 一种蜂窝陶瓷垂直度测定装置
DE102013101344B4 (de) * 2013-02-12 2024-11-07 HELLA GmbH & Co. KGaA Optisches System für eine Beleuchtungsvorrichtung für Fahrzeuge

Also Published As

Publication number Publication date
US9448185B2 (en) 2016-09-20
WO2015184032A1 (en) 2015-12-03
EP3149458B1 (en) 2020-10-28
MX2016015564A (es) 2017-07-04
JP6526061B2 (ja) 2019-06-05
JP2017518496A (ja) 2017-07-06
US20150346114A1 (en) 2015-12-03
MX374689B (es) 2025-03-06
ZA201608151B (en) 2022-05-25
EP3149458A1 (en) 2017-04-05
CN106574902A (zh) 2017-04-19

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