CN106556756B - 一种贴片式电容与电阻的多位老化装置 - Google Patents
一种贴片式电容与电阻的多位老化装置 Download PDFInfo
- Publication number
- CN106556756B CN106556756B CN201610911704.3A CN201610911704A CN106556756B CN 106556756 B CN106556756 B CN 106556756B CN 201610911704 A CN201610911704 A CN 201610911704A CN 106556756 B CN106556756 B CN 106556756B
- Authority
- CN
- China
- Prior art keywords
- pcb board
- hole
- resistance
- rectangular
- testing capacitance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/003—Environmental or reliability tests
Landscapes
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
Abstract
Description
Claims (2)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201610911704.3A CN106556756B (zh) | 2016-10-20 | 2016-10-20 | 一种贴片式电容与电阻的多位老化装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201610911704.3A CN106556756B (zh) | 2016-10-20 | 2016-10-20 | 一种贴片式电容与电阻的多位老化装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN106556756A CN106556756A (zh) | 2017-04-05 |
CN106556756B true CN106556756B (zh) | 2019-06-21 |
Family
ID=58443299
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201610911704.3A Active CN106556756B (zh) | 2016-10-20 | 2016-10-20 | 一种贴片式电容与电阻的多位老化装置 |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN106556756B (zh) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110174532B (zh) * | 2019-05-28 | 2022-03-08 | 江苏伊施德创新科技有限公司 | 一种电容载盒以及使用该载盒进行电容测试和老化的方法 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW449847B (en) * | 1999-03-12 | 2001-08-11 | Oki Electric Ind Co Ltd | Semiconductor device testing device |
CN102866318A (zh) * | 2012-09-26 | 2013-01-09 | 贵州航天计量测试技术研究所 | 一种片式封装分立器件测试装置 |
CN103529329A (zh) * | 2013-10-24 | 2014-01-22 | 华东光电集成器件研究所 | 一种片式电容器多位老化装置 |
CN104914278A (zh) * | 2015-06-17 | 2015-09-16 | 江苏伊施德创新科技有限公司 | 用于单层电容的测试夹具 |
CN205620437U (zh) * | 2016-04-29 | 2016-10-05 | 济南市半导体元件实验所 | 二极管功率老化﹑反偏试验通用夹具 |
-
2016
- 2016-10-20 CN CN201610911704.3A patent/CN106556756B/zh active Active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW449847B (en) * | 1999-03-12 | 2001-08-11 | Oki Electric Ind Co Ltd | Semiconductor device testing device |
CN102866318A (zh) * | 2012-09-26 | 2013-01-09 | 贵州航天计量测试技术研究所 | 一种片式封装分立器件测试装置 |
CN103529329A (zh) * | 2013-10-24 | 2014-01-22 | 华东光电集成器件研究所 | 一种片式电容器多位老化装置 |
CN104914278A (zh) * | 2015-06-17 | 2015-09-16 | 江苏伊施德创新科技有限公司 | 用于单层电容的测试夹具 |
CN205620437U (zh) * | 2016-04-29 | 2016-10-05 | 济南市半导体元件实验所 | 二极管功率老化﹑反偏试验通用夹具 |
Also Published As
Publication number | Publication date |
---|---|
CN106556756A (zh) | 2017-04-05 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN106556756B (zh) | 一种贴片式电容与电阻的多位老化装置 | |
CN206563784U (zh) | 一种贴片电容老化测试器及装置 | |
CN103529329B (zh) | 一种片式电容器多位老化装置 | |
CN202256409U (zh) | 一种探针卡和使用它的多芯片测试系统 | |
CN105277863B (zh) | 一种功率放大器老化装置 | |
CN110087382A (zh) | 电路基板 | |
CN201903617U (zh) | 耐高压测试装置 | |
CN102121961A (zh) | 耐高压测试装置及采用该装置的耐高压测试方法 | |
CN203658494U (zh) | 一种片式钽电容独立限流老练板 | |
CN105527584A (zh) | 一种电源模块测试设备 | |
CN109683077A (zh) | 晶圆级多点测试结构 | |
CN201824632U (zh) | 丝印刮刀放置架 | |
CN109243343B (zh) | 一种电子纸用tft玻璃基板检测方法及装置 | |
CN103592471B (zh) | 一种电容测试夹具 | |
CN209280834U (zh) | 用于片式电容器老炼试验的工装 | |
CN102478592A (zh) | 垂直式弹性探针结构 | |
CN219142974U (zh) | 一种陶瓷电容器电性能老化测试治具及批量摇料排布装置 | |
CN100582798C (zh) | 包含各向异性导电膜的用于测试功率模块的测试装置 | |
CN202854239U (zh) | 一种用于130mm功率器件的结电容测试电路及装置 | |
CN220473650U (zh) | 一种适用于sot23-3封装芯片老炼试验的老炼板 | |
CN208143186U (zh) | 弱光型非晶硅太阳能电池工作电压测试治具 | |
CN109738772A (zh) | 一种用于高压电容器耐压测试的装置 | |
CN204405705U (zh) | 用于芯片测试的装置及其承托座 | |
CN204809045U (zh) | 一种自动化电容器压装机 | |
CN202903894U (zh) | 一种用于62mm功率器件的结电容测试电路及装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant | ||
CP01 | Change in the name or title of a patent holder | ||
CP01 | Change in the name or title of a patent holder |
Address after: No. 10, Caiyuan Road, Bengbu Economic Development Zone, Anhui 233042 (within 214 Research Institute) Patentee after: Anhui North Microelectronics Research Institute Group Co.,Ltd. Address before: No. 10, Caiyuan Road, Bengbu Economic Development Zone, Anhui 233042 (within 214 Research Institute) Patentee before: NORTH ELECTRON RESEARCH INSTITUTE ANHUI Co.,Ltd. |
|
CP02 | Change in the address of a patent holder | ||
CP02 | Change in the address of a patent holder |
Address after: No. 2016, Tanghe Road, Bengbu, Anhui 233042 Patentee after: Anhui North Microelectronics Research Institute Group Co.,Ltd. Address before: No. 10, Caiyuan Road, Bengbu Economic Development Zone, Anhui 233042 (within 214 Research Institute) Patentee before: Anhui North Microelectronics Research Institute Group Co.,Ltd. |