CN106546900B - One kind realizing automated testing method by CodeOption - Google Patents

One kind realizing automated testing method by CodeOption Download PDF

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Publication number
CN106546900B
CN106546900B CN201610820732.4A CN201610820732A CN106546900B CN 106546900 B CN106546900 B CN 106546900B CN 201610820732 A CN201610820732 A CN 201610820732A CN 106546900 B CN106546900 B CN 106546900B
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China
Prior art keywords
codeoption
chip model
chip
testing method
automated testing
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CN106546900A (en
Inventor
罗青
陈元丰
刘勇
谢韶波
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Chipsea Technologies Shenzhen Co Ltd
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Chipsea Technologies Shenzhen Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834Automated test systems [ATE]; using microprocessors or computers

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Debugging And Monitoring (AREA)

Abstract

Automated testing method, the chip model and correlation CodeOption that this method passes through all supports of acquisition are realized by CodeOption the invention discloses a kind of;And compare CodeOption and right value, the ID in resultant content is replaced with into effective set content to realize.It obtains the chip model of all supports automatically through the invention, and the combination of all settings of every kind of chip model is set automatically, finally obtain Codeoption and to result statistics and analysis, chip is enabled to carry out rapidly automatic test by CodeOption.

Description

One kind realizing automated testing method by CodeOption
Technical field
The invention belongs to automatization testing technique fields, in particular to a kind of to pass through the automatic test side CodeOption Method.
Background technique
CodeOption is chip setting parameter value, which plays a very important role to the setting and operation of chip.It is public The chip model that department includes is many kinds of, and the parameter setting of every kind of chip model all has differences, and the configuration of every kind of model Combination may be up to thousands of kinds, if will be a huge engineering dependent on manually testing, and the standard of test result True rate can also have problem.Manual testing in the past, if being further added by chip model or modifying to software code, tester Huge resource retest need to be expended again.
Therefore, how to obtain and generate under different chip models and the combined situation of all settings of every kind of model Codeoption data, and statistics and analysis is as a result, the problem of becoming CodeOption automatic test urgent need to resolve.
Summary of the invention
Based on this, therefore primary mesh of the invention be to provide it is a kind of by CodeOption realization automatic test side Method, this method can obtain automatically to be generated under the chip model of all supports and the combined situation of all settings of every kind of model Codeoption data, and statistics and analysis result.
Another mesh of the invention it is to provide a kind of by CodeOption realization automated testing method, this method Rapidly automatic test can be carried out by CodeOption, and is realized easy.
To achieve the above object, the technical solution of the present invention is as follows:
One kind realizing automated testing method by CodeOption, it is characterised in that this method comprises the following steps:
The first step, the chip model and relevant information for obtaining all supports;
The relevant information includes: that every kind of chip model includes which kind choosing which kind setting and every kind of setting include Entry value.
Second step, change setting, obtain CodeOption;
Firstly, one chip model of selection, setting configuration combination, obtain the CodeOption of the combination;
Secondly, successively changing configuration combination to the chip model, the CodeOption of all various combinations is obtained, and export All CodeOption;
102,103 steps are carried out to other all chip models similarly to operate, and export all CodeOption.
Third step, test result analysis and statistics
CodeOption and right value are compared, statistical result is analyzed;
ID in resultant content is replaced with into effective set content.
In the first step, IDE interfaces windows control ID is obtained, then supported chip model is obtained by the ID.
The relevant information includes: the choosing that the setting options that every kind of chip model includes and every kind of setting options include Entry value.
The present invention by the above-mentioned means, obtain the chip model of all supports, and every kind of chip model is arranged automatically automatically The combination of all settings finally obtains Codeoption and to result statistics and analysis, chip is passed through CodeOption carries out rapidly automatic test.
Detailed description of the invention
Fig. 1 is the flow chart for the acquisition chip model that the present invention is implemented.
Fig. 2 is that the present invention implements to obtain the flow chart of CodeOption.
Fig. 3 is the flow chart of the present invention implemented test result analysis and statistics.
Specific embodiment
In order to make the objectives, technical solutions, and advantages of the present invention clearer, with reference to the accompanying drawings and embodiments, right The present invention is further elaborated.It should be appreciated that the specific embodiments described herein are merely illustrative of the present invention, and It is not used in the restriction present invention.
What the present invention was realized realizes automated testing method by CodeOption, includes the following steps:
The first step, the chip model and relevant information for obtaining all supports.The relevant information includes: every kind of chip model Which kind option value included comprising which kind setting and every kind of setting.
As shown in Figure 1, obtaining the chip model of all supports automatically first.IDE interfaces windows control ID is first obtained, then is led to It crosses the ID and obtains currently supported chip model.
Implement step are as follows:
S101, new construction select process into chip model.
S102, judge whether chip model is greater than 0;It is no to terminate.
S103, all chip models are obtained if it is greater than 0.
S104, engineering is created according to chip model, terminated.
Then the setting options of every kind of model are obtained;IDE set interface is entered back into, option is obtained and IDE interfaces windows is set The ID number and setting options of control, setting options include: the instruction cycle, crystal oscillator, reset pin, instruction cycle config option, The selection of P3.3 allocative abilities, BDRI_OP0 driving capability, LCD_OP, internal crystal oscillator and LVD.
Second step, change setting, obtain CodeOption.
Firstly, one chip model of selection, setting configuration combination, obtain the CodeOption of the combination.
Secondly, successively changing configuration combination to the chip model, the CodeOption of all various combinations is obtained, and export All CodeOption.
Then, above-mentioned operation is carried out to all chip models, and exports all CodeOption.
The process for obtaining CodeOption is as shown in Figure 2.Its specific step are as follows:
S201, selection chip model.
S202, the configuration combination for changing chip.
S203, the CodeOption for obtaining configuration combination.
S204, S202, S203 step are repeated, completes the setting of all configurations combination an of chip model, and acquisition pair All CodeOption answered.
S205, S202, S203 step are repeated, completes the setting of all configurations combination of all chip models, and acquisition pair All CodeOption answered.
The actual result of S206, all CodeOption of output.
Third step, test result analysis and statistics.
It is finally statistical result, and setting options ID is replaced with into effective content of text.It can quickly be carried out according to this The test of chip.The flow chart of realization is as shown in Figure 3.
S301, CodeOption actual result is obtained.
S302, by CodeOption, (it is expected that being exactly right value said before, right value is Chip scale with expected results Codeoption value specified in book) whether to be unanimously compared, it is to be recorded as success, is otherwise recorded as failure.
S303, all comparison results of statistics, export test report.
For example, as follows for chip CSU8RP3117B test statistics result:
Chip model CSU8RP3117B
Combine total number 336
Success (S) 336
Failure (F) 0
Finally, the ID in resultant content is replaced with effective set content.
Automatically the chip model of all supports is obtained, and the combination of all settings of every kind of chip model is set automatically, finally It obtains Codeoption and to result statistics and analysis, enables chip to pass through CodeOption and carry out rapidly automation and survey Examination.
The foregoing is merely illustrative of the preferred embodiments of the present invention, is not intended to limit the invention, all in essence of the invention Made any modifications, equivalent replacements, and improvements etc., should all be included in the protection scope of the present invention within mind and principle.

Claims (3)

1. one kind realizes automated testing method by CodeOption, it is characterised in that this method comprises the following steps:
The first step, the chip model and relevant information for obtaining all supports;
Second step, change setting, obtain CodeOption;
First, a chip model is selected, setting configuration combination obtains the CodeOption of the combination;
Secondly, configuration combination successively is changed to the chip model, obtains the CodeOption of all various combinations, and export all CodeOption;
Above-mentioned steps are carried out to other all chip models similarly to operate, and export all CodeOption;
Third step, test result analysis and statistics;
CodeOption and right value are compared, statistical result is analyzed;
ID in resultant content is replaced with into effective set content.
2. realizing automated testing method by CodeOption as described in claim 1, it is characterised in that the first step In, IDE interfaces windows control ID is obtained, then supported chip model is obtained by the ID.
3. realizing automated testing method by CodeOption as described in claim 1, it is characterised in that the related letter Breath includes: the option value that the setting options that every kind of chip model includes and every kind of setting options include.
CN201610820732.4A 2016-09-13 2016-09-13 One kind realizing automated testing method by CodeOption Active CN106546900B (en)

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Application Number Priority Date Filing Date Title
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CN106546900B true CN106546900B (en) 2019-04-16

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Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107390111A (en) * 2017-06-22 2017-11-24 芯海科技(深圳)股份有限公司 A kind of ICNewProject automated testing methods

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001074819A (en) * 1999-09-03 2001-03-23 Toshiba Corp Microcontroller, multi-chip package type semiconductor device, and its test device and test method
CN101640615A (en) * 2009-09-08 2010-02-03 杭州华三通信技术有限公司 Method and equipment for detecting POS port code disturbing configuration
CN101808343A (en) * 2009-02-13 2010-08-18 上海摩波彼克半导体有限公司 Automated test circuit structure and method of SIM (Subscriber Identity Module)/USIM(Universal Subscriber Identity Module) controller in ARM digital baseband chip
CN201600928U (en) * 2009-05-08 2010-10-06 黄建军 Chip test system and automatic test vector generator ATPG
CN101907682A (en) * 2009-06-02 2010-12-08 上海摩波彼克半导体有限公司 Automatic test circuit structure of digital baseband chip Gptimer module, test platform and method
CN201751855U (en) * 2009-12-23 2011-02-23 中兴通讯股份有限公司 Testing device and testing control device of transmission chip
CN104268078A (en) * 2014-09-23 2015-01-07 北京控制工程研究所 Automatic chip validation method based on parameterized IP test case set
CN104639400A (en) * 2015-02-13 2015-05-20 盛科网络(苏州)有限公司 Automatic detection method and device of network packet processing chip
CN105676106A (en) * 2015-12-31 2016-06-15 东信和平科技股份有限公司 Non-contact intelligent card chip model automatic detection system and method

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001074819A (en) * 1999-09-03 2001-03-23 Toshiba Corp Microcontroller, multi-chip package type semiconductor device, and its test device and test method
CN101808343A (en) * 2009-02-13 2010-08-18 上海摩波彼克半导体有限公司 Automated test circuit structure and method of SIM (Subscriber Identity Module)/USIM(Universal Subscriber Identity Module) controller in ARM digital baseband chip
CN201600928U (en) * 2009-05-08 2010-10-06 黄建军 Chip test system and automatic test vector generator ATPG
CN101907682A (en) * 2009-06-02 2010-12-08 上海摩波彼克半导体有限公司 Automatic test circuit structure of digital baseband chip Gptimer module, test platform and method
CN101640615A (en) * 2009-09-08 2010-02-03 杭州华三通信技术有限公司 Method and equipment for detecting POS port code disturbing configuration
CN201751855U (en) * 2009-12-23 2011-02-23 中兴通讯股份有限公司 Testing device and testing control device of transmission chip
CN104268078A (en) * 2014-09-23 2015-01-07 北京控制工程研究所 Automatic chip validation method based on parameterized IP test case set
CN104639400A (en) * 2015-02-13 2015-05-20 盛科网络(苏州)有限公司 Automatic detection method and device of network packet processing chip
CN105676106A (en) * 2015-12-31 2016-06-15 东信和平科技股份有限公司 Non-contact intelligent card chip model automatic detection system and method

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