CN106461707B - 三维表面电位分布测量装置 - Google Patents

三维表面电位分布测量装置 Download PDF

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Publication number
CN106461707B
CN106461707B CN201480079588.2A CN201480079588A CN106461707B CN 106461707 B CN106461707 B CN 106461707B CN 201480079588 A CN201480079588 A CN 201480079588A CN 106461707 B CN106461707 B CN 106461707B
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CN
China
Prior art keywords
pockels
face
surface potential
electric field
crystallization
Prior art date
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CN201480079588.2A
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English (en)
Chinese (zh)
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CN106461707A (zh
Inventor
古川真阳
牛渡广大
吉满哲夫
坪井雄
坪井雄一
日高邦彦
熊田亚纪子
池田久利
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Mitsubishi Electric Industrial Systems Corp
The University of Tokyo
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Toshiba Mitsubishi Electric Industrial Systems Corp
The University of Tokyo
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/24—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
    • G01R15/241—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption
    • G01R15/242—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption based on the Pockels effect, i.e. linear electro-optic effect
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/12—Measuring electrostatic fields or voltage-potential
    • G01R29/14—Measuring field distribution
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/34—Testing dynamo-electric machines

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Circuit Breakers, Generators, And Electric Motors (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
CN201480079588.2A 2014-06-06 2014-06-06 三维表面电位分布测量装置 Active CN106461707B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2014/003053 WO2015186160A1 (ja) 2014-06-06 2014-06-06 ３次元表面電位分布計測装置

Publications (2)

Publication Number Publication Date
CN106461707A CN106461707A (zh) 2017-02-22
CN106461707B true CN106461707B (zh) 2019-03-05

Family

ID=54766265

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201480079588.2A Active CN106461707B (zh) 2014-06-06 2014-06-06 三维表面电位分布测量装置

Country Status (7)

Country Link
US (1) US10041980B2 (cg-RX-API-DMAC7.html)
EP (1) EP3153870B1 (cg-RX-API-DMAC7.html)
JP (1) JP6246349B2 (cg-RX-API-DMAC7.html)
CN (1) CN106461707B (cg-RX-API-DMAC7.html)
BR (1) BR112016027835B1 (cg-RX-API-DMAC7.html)
CA (1) CA2951382C (cg-RX-API-DMAC7.html)
WO (1) WO2015186160A1 (cg-RX-API-DMAC7.html)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
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US10812778B1 (en) 2015-11-09 2020-10-20 Cognex Corporation System and method for calibrating one or more 3D sensors mounted on a moving manipulator
US10757394B1 (en) * 2015-11-09 2020-08-25 Cognex Corporation System and method for calibrating a plurality of 3D sensors with respect to a motion conveyance
US11562502B2 (en) * 2015-11-09 2023-01-24 Cognex Corporation System and method for calibrating a plurality of 3D sensors with respect to a motion conveyance
US20180374239A1 (en) * 2015-11-09 2018-12-27 Cognex Corporation System and method for field calibration of a vision system imaging two opposite sides of a calibration object
EP3415933B1 (en) * 2016-02-08 2024-08-07 TMEIC Corporation Three-dimensional surface potential distribution measurement system
WO2018035313A1 (en) * 2016-08-17 2018-02-22 Micatu Inc. An optical pockels voltage sensor assembly device and methods of use thereof
CN109200468B (zh) * 2018-10-22 2023-09-05 中国科学院心理研究所 一种多通道电刺激场强空间分布测量装置
CN113009242B (zh) * 2021-02-25 2022-10-04 西安理工大学 一种阵列式磁通门表面电势分布及衰减的测量装置及方法
CN115877114B (zh) * 2023-02-20 2023-08-25 极限人工智能有限公司 一种电动地脚支撑测试设备及测试方法
CN121091003B (zh) * 2025-09-26 2026-05-26 珠海市玖晟电力科技有限公司 一种开关柜局部放电检测装置及方法

Citations (12)

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JPS5735765A (en) * 1980-08-14 1982-02-26 Toshiba Corp Electric field intensity measuring device
JPH06102296A (ja) * 1992-09-21 1994-04-15 Nippon Steel Corp 電圧分布測定装置
JPH0792110A (ja) * 1993-09-20 1995-04-07 Nec Corp Ｓａｒ測定装置および測定方法
US5559442A (en) * 1992-02-24 1996-09-24 Mwb High Voltage Systems Gmbh Process and sensor for measuring electric voltages and/or electric field intensities
JP2000352597A (ja) * 1999-06-10 2000-12-19 Toshiba Corp 原子力発電プラントおよびその運転方法
JP2005140588A (ja) * 2003-11-05 2005-06-02 Toshiba Corp 光学式表面電位測定装置および測定方法
CN101393239A (zh) * 2008-10-20 2009-03-25 西南大学 物质表面性质参数分析系统
JP2011022007A (ja) * 2009-07-16 2011-02-03 Hitachi Ltd 回転電機の固定子コイルの非線形抵抗測定方法、および、非線形抵抗測定装置
CN202453298U (zh) * 2012-01-16 2012-09-26 无锡迈福光学科技有限公司 一种基于激光散射的表面微缺陷检测装置
CN102706951A (zh) * 2012-05-30 2012-10-03 神华集团有限责任公司 测定液液两相界面表面电位的方法
JP2013113637A (ja) * 2011-11-25 2013-06-10 Toshiba Mitsubishi-Electric Industrial System Corp 表面電位分布計測装置および表面電位分布計測方法
CN103454315A (zh) * 2013-09-16 2013-12-18 中国科学院空间科学与应用研究中心 一种测量航天器介质材料深层充电特征参数的装置及方法

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FI915818A0 (fi) * 1991-12-11 1991-12-11 Imatran Voima Oy Optisk rf-givare foer maetning av spaenning och elfaelt.
JP3501016B2 (ja) * 1999-06-10 2004-02-23 Ｊｆｅスチール株式会社 電動機固定子鉄心の動的磁気特性測定装置および測定方法
JP4635544B2 (ja) * 2004-09-29 2011-02-23 株式会社日立製作所 電界分布測定方法及び電界分布測定装置

Patent Citations (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5735765A (en) * 1980-08-14 1982-02-26 Toshiba Corp Electric field intensity measuring device
US5559442A (en) * 1992-02-24 1996-09-24 Mwb High Voltage Systems Gmbh Process and sensor for measuring electric voltages and/or electric field intensities
JPH06102296A (ja) * 1992-09-21 1994-04-15 Nippon Steel Corp 電圧分布測定装置
JPH0792110A (ja) * 1993-09-20 1995-04-07 Nec Corp Ｓａｒ測定装置および測定方法
JP2000352597A (ja) * 1999-06-10 2000-12-19 Toshiba Corp 原子力発電プラントおよびその運転方法
JP2005140588A (ja) * 2003-11-05 2005-06-02 Toshiba Corp 光学式表面電位測定装置および測定方法
CN101393239A (zh) * 2008-10-20 2009-03-25 西南大学 物质表面性质参数分析系统
JP2011022007A (ja) * 2009-07-16 2011-02-03 Hitachi Ltd 回転電機の固定子コイルの非線形抵抗測定方法、および、非線形抵抗測定装置
JP2013113637A (ja) * 2011-11-25 2013-06-10 Toshiba Mitsubishi-Electric Industrial System Corp 表面電位分布計測装置および表面電位分布計測方法
CN202453298U (zh) * 2012-01-16 2012-09-26 无锡迈福光学科技有限公司 一种基于激光散射的表面微缺陷检测装置
CN102706951A (zh) * 2012-05-30 2012-10-03 神华集团有限责任公司 测定液液两相界面表面电位的方法
CN103454315A (zh) * 2013-09-16 2013-12-18 中国科学院空间科学与应用研究中心 一种测量航天器介质材料深层充电特征参数的装置及方法

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
Oscillatory Waveform Caused by Piezoelectric Vibration of Pockels Crystal and its Effective Suppression;H. MATSUMOTO et al.;《IEEJ transactions on ele ctrical and electronic engineering》;20110131;第6卷(第1期);第1-6页 *
The Direct Potential Distribution Measurement of Propagating Surface Discharge by Using Pockels Effect;Akiko KUMADA et al.;《The Transactions of the Institute of Electrical Engineers of Japan A》;19980630;第118卷(第6期);第723-728页 *

Also Published As

Publication number Publication date
EP3153870B1 (en) 2019-09-25
EP3153870A4 (en) 2018-03-28
CA2951382A1 (en) 2015-12-10
CN106461707A (zh) 2017-02-22
JPWO2015186160A1 (ja) 2017-04-20
BR112016027835A2 (cg-RX-API-DMAC7.html) 2017-08-22
EP3153870A1 (en) 2017-04-12
WO2015186160A1 (ja) 2015-12-10
US10041980B2 (en) 2018-08-07
US20170160314A1 (en) 2017-06-08
CA2951382C (en) 2018-11-20
JP6246349B2 (ja) 2017-12-13
BR112016027835B1 (pt) 2022-01-25

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