CN106454335A - Infrared imaging delay testing device for photoelectric product - Google Patents
Infrared imaging delay testing device for photoelectric product Download PDFInfo
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- CN106454335A CN106454335A CN201611024617.2A CN201611024617A CN106454335A CN 106454335 A CN106454335 A CN 106454335A CN 201611024617 A CN201611024617 A CN 201611024617A CN 106454335 A CN106454335 A CN 106454335A
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- imaging
- photovoltaic
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- infrared
- target source
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N17/00—Diagnosis, testing or measuring for television systems or their details
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N17/00—Diagnosis, testing or measuring for television systems or their details
- H04N17/002—Diagnosis, testing or measuring for television systems or their details for television cameras
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/56—Cameras or camera modules comprising electronic image sensors; Control thereof provided with illuminating means
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N5/00—Details of television systems
- H04N5/30—Transforming light or analogous information into electric information
- H04N5/33—Transforming infrared radiation
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- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Health & Medical Sciences (AREA)
- Biomedical Technology (AREA)
- General Health & Medical Sciences (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
Abstract
The invention provides an infrared imaging delay testing device for a photoelectric product. The infrared imaging delay testing device comprises a target source, a hood, a high-precision synchronous clock, an imaging delay recording system and a tripod, wherein a tested photoelectric product is arranged right ahead the target source, and outputs an acquired image signal to the imaging delay recording system; the target source is composed of an intermediate infrared LED array and arranged in the hood; the high-precision synchronous clock is connected with the tested photoelectric product and the imaging delay recording system; the tested photoelectric product provides a trigger signal for the high-precision synchronous clock, and the high-precision synchronous clock records the imaging start time; the imaging delay recording system processes the image signal input by the tested photoelectric product and records the moment of acquiring a clear image according to the high-precision synchronous clock; the interval between the imaging start time and the moment of acquiring the clear image is calculated so as to obtain the imaging delay time of the tested photoelectric product. According to the testing device disclosed by the invention, the infrared imaging delay of the photoelectric product is rapidly measured at high precision.
Description
Technical field
The present invention relates to photovoltaic technical field of measurement and test, specially a kind of photovoltaic infrared imaging delayed test dress
Put.
Background technology
Takeoff and landing due to aircraft mainly to be completed to the observation of runway by pilot, is therefore running into bad weather
During condition, once pilot is unsighted, will result in aircraft and cannot smoothly take off or land, bring danger.
Equip infrared what comes into a driver's strengthening system for the current proposition of above-mentioned situation aboard, that is, by being arranged on aircraft forward
Infrared viewing camera to pilot provide one tunnel observe video, in order to assisting in flying person in takeoff and landing to runway situation
Observation.But because video image all has certain retardance in transmission, if postpone larger, pilot can be caused
Mistake is observed, therefore according to the requirement of security aspect, the retardance index of photovoltaic infrared imaging about 100 bold and unconstrained seconds,
And required precision reaches Millisecond, meet pilot reaction time requirement.Require for These parameters, still not supporting at present
Test device.
Content of the invention
For solving the problems, such as to lack the device that photovoltaic infrared imaging retardance index is tested in prior art,
The present invention proposes a kind of photovoltaic infrared imaging delayed test device.
The technical scheme is that:
A kind of described photovoltaic infrared imaging delayed test device it is characterised in that:Including target source, light shield, height
Accurate synchronization clock, imaging lag record system and tripod;
Tested photovoltaic is positioned over target source dead ahead, and the picture signal of tested photovoltaic output collection is to imaging
Postpone record system;
Described target source is made up of mid-infrared LED array, is placed in light shield;
High-precise synchronization clock is connected with tested photovoltaic and imaging lag record system respectively;Tested photovoltaic carries
For trigger to high-precise synchronization clock, high-precise synchronization clock log is imaged initial time;Imaging lag record system pair
The picture signal of tested photovoltaic input is processed, and obtains the moment understanding image according to high-precise synchronization clock log;
The interval being calculated as initial time and obtaining between the moment understanding image obtains the delayed imaging time of tested photovoltaic.
Further preferred version, a kind of described photovoltaic infrared imaging delayed test device it is characterised in that:In red
Outer LED array is cold light source device.
Further preferred version, a kind of described photovoltaic infrared imaging delayed test device it is characterised in that:Shading
Cover internal coat has spuious Xanthophyll cycle coating.
Beneficial effect
Advantages of the present invention:Achieve and photovoltaic infrared imaging is postponed to carry out quick, high-acruracy survey.Due to tradition
Infrared target source cannot realize quickly opening and close, especially close when with heat residual, therefore cannot be to photovoltaic
Infrared imaging carries out system-level measurement.Mid-infrared LED array is combined by the present invention with high-precise synchronization clock, has built one
Cover portable photovoltaic infrared imaging delayed test device, under the various environment such as achievable laboratory, outfield, imaging is prolonged
The quick test of index late.
The additional aspect of the present invention and advantage will be set forth in part in the description, and partly will become from the following description
Obtain substantially, or recognized by the practice of the present invention.
Brief description
The above-mentioned and/or additional aspect of the present invention and advantage will become from reference to the description to embodiment for the accompanying drawings below
Substantially and easy to understand, wherein:
Fig. 1 is present configuration composition figure:
In Fig. 1:1st, target source;2nd, light shield;3rd, tripod;4th, high-precise synchronization clock;5th, imaging lag record system.
Specific embodiment
Embodiments of the invention are described below in detail, described embodiment is exemplary it is intended to be used for explaining the present invention, and
It is not considered as limiting the invention.
As shown in figure 1, the invention provides a kind of photovoltaic infrared imaging delayed test device, comprising target source, screening
Light shield, high-precise synchronization clock, imaging lag record system and tripod.
Tested photovoltaic is positioned over target source dead ahead, and tested photovoltaic is connected with imaging lag record system,
The picture signal of tested photovoltaic output collection is to imaging lag record system.
Described target source is made up of mid-infrared LED array, is placed in light shield, and when reducing test, external stray light is to survey
The impact of test result, in order to increase light shield effect further, has spuious Xanthophyll cycle coating in light shield internal coat.
Photovoltaic infrared imaging delayed test refers to that test starts to be integrated to by light-metering from tested photovoltaic detector
Electric output of products understands the time interval till image.So using high-precise synchronization clock respectively with tested photovoltaic and becoming
Connect as postponing record system, when tested photovoltaic detector starts integration, tested photovoltaic provide trigger to
High-precise synchronization clock, high-precise synchronization clock log is imaged initial time;And imaging lag record system is produced to tested photoelectricity
The picture signal of product input is processed, and obtains, also according to high-precise synchronization clock log, the moment understanding image, is calculated as
As initial time with the interval that obtains between the moment understanding image just can obtain the delayed imaging time of tested photovoltaic.
In addition, the mid-infrared LED array that the present invention adopts is cold light source device, there is not heat residual when closed.Due to
Long-time, multicycle duplicate measurements need to be carried out, target source the operation such as completes to open, closes in each cycle domestic demand, such as during test
Fruit adopts ordinary light source, after a period of time has passed caused heat residual, can lead to the test product cannot correct resolution target
Source is in opens or closed mode, therefore needs from cold light source device.
Although embodiments of the invention have been shown and described above it is to be understood that above-described embodiment is example
Property it is impossible to be interpreted as limitation of the present invention, those of ordinary skill in the art is in the principle without departing from the present invention and objective
In the case of above-described embodiment can be changed within the scope of the invention, change, replace and modification.
Claims (3)
1. a kind of photovoltaic infrared imaging delayed test device it is characterised in that:Including target source, light shield, in high precision with
Step clock, imaging lag record system and tripod;
Tested photovoltaic is positioned over target source dead ahead, and the picture signal of tested photovoltaic output collection is to imaging lag
Record system;
Described target source is made up of mid-infrared LED array, is placed in light shield;
High-precise synchronization clock is connected with tested photovoltaic and imaging lag record system respectively;Tested photovoltaic provides to be touched
Signal to high-precise synchronization clock, high-precise synchronization clock log is imaged initial time;Imaging lag record system is to tested
The picture signal of photovoltaic input is processed, and obtains the moment understanding image according to high-precise synchronization clock log;Calculate
The interval being imaged between the moment that initial time and acquisition understand image obtains the delayed imaging time of tested photovoltaic.
2. according to claim 1 a kind of photovoltaic infrared imaging delayed test device it is characterised in that:Mid-infrared LED
Array is cold light source device.
3. according to claim 1 a kind of photovoltaic infrared imaging delayed test device it is characterised in that:Inside light shield
It is coated with spuious Xanthophyll cycle coating.
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CN201611024617.2A CN106454335B (en) | 2016-11-20 | 2016-11-20 | A kind of photovoltaic infrared imaging delayed test device |
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Cited By (7)
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---|---|---|---|---|
CN107748011A (en) * | 2017-09-20 | 2018-03-02 | 南京航空航天大学 | The test system and method for testing of medium-wave infrared detector image-forming time delay |
CN108388103A (en) * | 2018-02-08 | 2018-08-10 | 南京航空航天大学 | Aircraft cockpit window screen projects delay test system and method |
WO2018177105A1 (en) * | 2017-03-31 | 2018-10-04 | 腾讯科技(深圳)有限公司 | Method and device for testing camera delay, and storage medium |
CN109387287A (en) * | 2018-11-08 | 2019-02-26 | 中国航空工业集团公司洛阳电光设备研究所 | A kind of thermal infrared imager imaging Time delay measurement device and measurement method |
CN109489940A (en) * | 2018-11-02 | 2019-03-19 | 中国科学院西安光学精密机械研究所 | A kind of measurement method of optical imaging system accurate delay |
CN110617970A (en) * | 2018-06-19 | 2019-12-27 | 上海汽车集团股份有限公司 | Parking response time testing system and method |
CN114051134A (en) * | 2021-11-30 | 2022-02-15 | 西安瑞峰光电技术有限公司 | Camera Link interface camera output delay measuring method and system |
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Cited By (9)
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---|---|---|---|---|
WO2018177105A1 (en) * | 2017-03-31 | 2018-10-04 | 腾讯科技(深圳)有限公司 | Method and device for testing camera delay, and storage medium |
CN107748011A (en) * | 2017-09-20 | 2018-03-02 | 南京航空航天大学 | The test system and method for testing of medium-wave infrared detector image-forming time delay |
CN107748011B (en) * | 2017-09-20 | 2019-08-16 | 南京航空航天大学 | The test macro and test method of medium-wave infrared detector image-forming delay time |
CN108388103A (en) * | 2018-02-08 | 2018-08-10 | 南京航空航天大学 | Aircraft cockpit window screen projects delay test system and method |
CN110617970A (en) * | 2018-06-19 | 2019-12-27 | 上海汽车集团股份有限公司 | Parking response time testing system and method |
CN110617970B (en) * | 2018-06-19 | 2021-08-17 | 上海汽车集团股份有限公司 | Parking response time testing system and method |
CN109489940A (en) * | 2018-11-02 | 2019-03-19 | 中国科学院西安光学精密机械研究所 | A kind of measurement method of optical imaging system accurate delay |
CN109387287A (en) * | 2018-11-08 | 2019-02-26 | 中国航空工业集团公司洛阳电光设备研究所 | A kind of thermal infrared imager imaging Time delay measurement device and measurement method |
CN114051134A (en) * | 2021-11-30 | 2022-02-15 | 西安瑞峰光电技术有限公司 | Camera Link interface camera output delay measuring method and system |
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