CN109387287A - A kind of thermal infrared imager imaging Time delay measurement device and measurement method - Google Patents
A kind of thermal infrared imager imaging Time delay measurement device and measurement method Download PDFInfo
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- CN109387287A CN109387287A CN201811322039.XA CN201811322039A CN109387287A CN 109387287 A CN109387287 A CN 109387287A CN 201811322039 A CN201811322039 A CN 201811322039A CN 109387287 A CN109387287 A CN 109387287A
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- time
- thermal infrared
- infrared imager
- image
- imaging
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- 238000005259 measurement Methods 0.000 title claims abstract description 23
- 238000003384 imaging method Methods 0.000 title claims abstract description 21
- 238000000691 measurement method Methods 0.000 title abstract description 5
- 238000000034 method Methods 0.000 claims abstract description 9
- 238000012360 testing method Methods 0.000 claims abstract description 6
- 230000010354 integration Effects 0.000 claims description 3
- 230000003111 delayed effect Effects 0.000 claims description 2
- 238000001931 thermography Methods 0.000 claims 1
- 230000009286 beneficial effect Effects 0.000 description 2
- 241001269238 Data Species 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000004297 night vision Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J2005/0077—Imaging
Abstract
The present invention relates to a kind of thermal infrared imager imaging Time delay measurement device and measurement methods, by highly sensitive, high response speed infraluminescence LED light source as image object source target plate, by the integrated signal for receiving thermal infrared imager, the bright infraluminescence LED light source in control point, record is integrated to the time interval until tested thermal infrared imager output correspondence image since tested thermal infrared imager detector, it realizes to test product imaging and the precise measurement for the treatment of process time, in the case where guaranteeing measurement accuracy, and there are preferable engineering practicability and using flexible.
Description
Technical field
The invention belongs to infrared image assessment technique field, it is related to a kind of thermal infrared imager imaging Time delay measurement device and survey
Amount method.
Background technique
Due to forward-looking infrared low-light night vision system be mainly used for aircraft night or it is bad it is meteorological under take off, land and low latitude
When flight, big visual field, high-resolution infrared image are provided, realizes assisting navigation.If image delay is larger, pilot will lead to
The image observed and practical forward image are inconsistent, be easy to cause illusion, influence flight safety.To solve thermal infrared imager
Imaging delay can not precise measurement the problem of, design a kind of thermal infrared imager imaging Time delay measurement device, complete to infrared heat
As the precise measurement of instrument imaging delay.
Summary of the invention
Technical problems to be solved
In order to avoid the shortcomings of the prior art, the present invention propose a kind of thermal infrared imager imaging Time delay measurement device and
Measurement method, solve the problems, such as thermal infrared imager imaging delay can not precise measurement, complete to thermal infrared imager be imaged be delayed
Precise measurement.
Technical solution
A kind of thermal infrared imager imaging Time delay measurement device, it is characterised in that the infrared mesh including infraluminescence LED array
Target plate, control recorder and control computer；The infrared target target plate of infraluminescence LED array and control recorder and tested
Thermal infrared imager connection, control recorder are connect by Ethernet cable with control computer.
The infraluminescence LED array lights the response time less than 0.01ms.
It is a kind of using thermal infrared imager described in claim 1 imaging Time delay measurement device to test infrared detector imaging prolong
The method of slow time, it is characterised in that steps are as follows:
Step 1: thermal infrared imager issues the time of integration, when the infrared target target plate of infraluminescence LED array receives integral
Between starting LED array light；The integrated signal that recorder receives thermal infrared imager output is controlled, to the figure of thermal infrared imager output
As being acquired and demarcating to image output time, time T this moment is recorded0；
And the image of acquisition is transferred to control computer by Ethernet together with image output time information package；
Step 2: when there is infrared target target plate to light for appearance in the image that control recorder receives thermal infrared imager output
It is T at the time of recording the image when image of LED array1；
Step 3: calculating the poor △ T=T of finish time and initial time1-T0, when obtaining the imaging lag of infrared detector
Between △ T.
Beneficial effect
A kind of thermal infrared imager imaging Time delay measurement device proposed by the present invention and measurement method, by highly sensitive, high
Response speed infraluminescence LED light source is as image object source target plate, by receiving the integrated signal of thermal infrared imager, control point
Bright infraluminescence LED light source, record are integrated to tested thermal infrared imager output since tested thermal infrared imager detector and correspond to
Time interval until image is realized to test product imaging and the precise measurement for the treatment of process time, is guaranteeing measurement accuracy
In the case where, and have preferable engineering practicability and using flexible.
The present invention has the advantage that is with beneficial effect: using highly sensitive, high response speed infraluminescence LED light source as
Image object source target plate, by receiving the integrated signal of thermal infrared imager, the bright infraluminescence LED light source in control point is recorded from quilt
It surveys thermal infrared imager detector to start to be integrated to the time interval until tested thermal infrared imager exports correspondence image, realize to quilt
Surveying product imaging and the precise measurement for the treatment of process time, the device has preferable engineering in the case where guaranteeing measurement accuracy
Practicability and using flexible.
Detailed description of the invention
Fig. 1 is theory of constitution block diagram of the invention.
Specific embodiment
Now in conjunction with embodiment, attached drawing, the invention will be further described:
Time delay measurement device is imaged in thermal infrared imager, infrared target target plate, control record including infraluminescence LED array
Instrument and control computer；To light infraluminescence LED of the response time less than 0.01ms as infrared target target plate, and control note
Record instrument is electrically connected with tested thermal infrared imager, and control recorder is connect by Ethernet cable with control computer.Using Gao Xiang
Answer speed infraluminescence LED array as infrared target target plate, so as to accurately control the light-emitting LED luminous moment.
Steps are as follows for specific implementation method:
Step 1: control recorder receives the integrated signal of thermal infrared imager output, while the integral of thermal infrared imager output
Signal powers on infrared target target plate；The image that control recorder exports thermal infrared imager is acquired and exports to image
Moment is demarcated, and time T this moment is recorded0, the image of acquisition is passed together with image output time information package by Ethernet
It is defeated by control computer；
Step 2: when the image of control recorder acquisition thermal infrared imager output, obtaining infrared comprising infrared target target plate
When the light-emitting LED image output lighted, recording the moment is finish time T1；
Step 3: calculating the poor △ T=T of finish time and initial time1-T0It can obtain the imaging lag of infrared detector
Time.Various test datas obtained when testing are transferred to control computer, computer is by can be with figure after data processing
The output and display of change.
Claims (3)
1. Time delay measurement device is imaged in a kind of thermal infrared imager, it is characterised in that the infrared target including infraluminescence LED array
Target plate, control recorder and control computer；The infrared target target plate of infraluminescence LED array and control recorder be tested it is red
Outer thermal imaging system connection, control recorder are connect by Ethernet cable with control computer.
2. Time delay measurement device is imaged in thermal infrared imager according to claim 1, it is characterised in that: the infraluminescence LED
Array lights the response time less than 0.01ms.
3. a kind of imaging lag using the imaging Time delay measurement device to test infrared detector of thermal infrared imager described in claim 1
The method of time, it is characterised in that steps are as follows:
Step 1: thermal infrared imager issues the time of integration, and the infrared target target plate of infraluminescence LED array receives the time of integration and opens
Dynamic LED array is lighted；Control recorder receive thermal infrared imager output integrated signal, to thermal infrared imager output image into
Row is acquired and is demarcated to image output time, records time T this moment0；
And the image of acquisition is transferred to control computer by Ethernet together with image output time information package；
Step 2: when there is infrared target target plate to light LED times for appearance in the image that control recorder receives thermal infrared imager output
It is T at the time of recording the image when image of column1；
Step 3: calculating the poor △ T=T of finish time and initial time1-T0, obtain the delayed imaging time △ of infrared detector
T。
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811322039.XA CN109387287A (en) | 2018-11-08 | 2018-11-08 | A kind of thermal infrared imager imaging Time delay measurement device and measurement method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811322039.XA CN109387287A (en) | 2018-11-08 | 2018-11-08 | A kind of thermal infrared imager imaging Time delay measurement device and measurement method |
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| Publication Number | Publication Date |
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| CN109387287A true CN109387287A (en) | 2019-02-26 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201811322039.XA Pending CN109387287A (en) | 2018-11-08 | 2018-11-08 | A kind of thermal infrared imager imaging Time delay measurement device and measurement method |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110267031A (en) * | 2019-05-16 | 2019-09-20 | 中国科学院西安光学精密机械研究所 | A kind of camera output delay time test method and system |
| CN110412382A (en) * | 2019-08-07 | 2019-11-05 | 中国核动力研究设计院 | A kind of S-VDU response time self-operated measuring unit based on image procossing |
| CN110933397A (en) * | 2019-10-19 | 2020-03-27 | 中国航空工业集团公司洛阳电光设备研究所 | High-precision imaging delay testing device and method |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN105466573A (en) * | 2015-12-05 | 2016-04-06 | 中国航空工业集团公司洛阳电光设备研究所 | A medium-long wave two-waveband thermal infrared imager |
| CN106454335A (en) * | 2016-11-20 | 2017-02-22 | 中国航空工业集团公司洛阳电光设备研究所 | Infrared imaging delay testing device for photoelectric product |
| CN107748011A (en) * | 2017-09-20 | 2018-03-02 | 南京航空航天大学 | The test system and method for testing of medium-wave infrared detector image-forming time delay |
-
2018
- 2018-11-08 CN CN201811322039.XA patent/CN109387287A/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105466573A (en) * | 2015-12-05 | 2016-04-06 | 中国航空工业集团公司洛阳电光设备研究所 | A medium-long wave two-waveband thermal infrared imager |
| CN106454335A (en) * | 2016-11-20 | 2017-02-22 | 中国航空工业集团公司洛阳电光设备研究所 | Infrared imaging delay testing device for photoelectric product |
| CN107748011A (en) * | 2017-09-20 | 2018-03-02 | 南京航空航天大学 | The test system and method for testing of medium-wave infrared detector image-forming time delay |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110267031A (en) * | 2019-05-16 | 2019-09-20 | 中国科学院西安光学精密机械研究所 | A kind of camera output delay time test method and system |
| CN110412382A (en) * | 2019-08-07 | 2019-11-05 | 中国核动力研究设计院 | A kind of S-VDU response time self-operated measuring unit based on image procossing |
| CN110412382B (en) * | 2019-08-07 | 2021-07-20 | 中核控制系统工程有限公司 | S-VDU response time automatic measuring device based on image processing |
| CN110933397A (en) * | 2019-10-19 | 2020-03-27 | 中国航空工业集团公司洛阳电光设备研究所 | High-precision imaging delay testing device and method |
| CN110933397B (en) * | 2019-10-19 | 2021-05-18 | 中国航空工业集团公司洛阳电光设备研究所 | High-precision imaging delay testing device and method |
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