CN106443093A - Matrix switcher based testing instrument multiplexing device - Google Patents

Matrix switcher based testing instrument multiplexing device Download PDF

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Publication number
CN106443093A
CN106443093A CN201610820758.9A CN201610820758A CN106443093A CN 106443093 A CN106443093 A CN 106443093A CN 201610820758 A CN201610820758 A CN 201610820758A CN 106443093 A CN106443093 A CN 106443093A
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CN
China
Prior art keywords
module
test instrumentation
control module
testing instrument
matrix
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Pending
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CN201610820758.9A
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Chinese (zh)
Inventor
熊文骏
蒋伟
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Shenzhen Mitec Telecom Equipment Co Ltd
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Shenzhen Mitec Telecom Equipment Co Ltd
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Priority to CN201610820758.9A priority Critical patent/CN106443093A/en
Publication of CN106443093A publication Critical patent/CN106443093A/en
Pending legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/20Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments

Abstract

The invention discloses a matrix switcher based testing instrument multiplexing device comprising a matrix switcher, a testing instrument, a control module and multiple debugging stations. The testing instrument multiplexing device is provided with the matrix switcher functioning in expanding two input ports to multiple input ports, and multiple to-be-debugged products are connected with the testing instrument. Under control of the control module, the time-division multiplexing principle is adopted, a total signal is divided into multiple channels for signal transmission according to a debugging station request signal and corresponding to-be-debugged product performance signals, the signal of each channel is divided into a plurality of time interval signals according to the time division order, the control module controls by quick switching, and each debugging station connected into the device seams using the testing instrument exclusively. Therefore, one testing instrument achieves the using effect of multiple testing instruments. The multiplexing device is simple in structure and convenient to use, using efficiency of the testing instrument is improved greatly, and instrument investment cost is lowered.

Description

Test instrumentation multiplexer based on matrix switch
Technical field
The present invention relates to communication technical field is and in particular to a kind of test instrumentation multiplexer based on matrix switch.
Background technology
In frequency microwave field, mainly using instrument such as signal source, frequency spectrograph, vector network analyzers.These instrument groups Become complicated, precise structure, in the research and development of frequency microwave product, production link, play significant role.Even to this day, middle height End RF instrumentation is almost all external minority giant monopolization, expensive, tens thousand of easily, 100,000 U.S. dollars.And for frequency microwave Enterprise, instrument is purchased and is occupied substantial amounts of fixed assets cost.With industry competition aggravation, profit is descending, how to reduce instrument Cost of investment, improves instrument service efficiency, becomes significant and urgent problem.
Content of the invention
For weak point present in above-mentioned technology, the present invention provide a kind of test instrumentation service efficiency high based on square The test instrumentation multiplexer of battle array switch.
For achieving the above object, the present invention provides a kind of test instrumentation multiplexer based on matrix switch, including connection Multiple debugging products matrix switch, more than one be used for analysis measurement debug particular product performance parameters test instrumentation, based on when The control module of division multiplexing technology and with debugging the corresponding multiple debugging station of product;One end of described control module It is connected with the communication of multiple debugging station, the other end of control module is connected with test instrumentation communication;One end of described matrix switch It is connected with test instrumentation communication, the other end is communicated with multiple products to be debugged and is connected.
Wherein, described matrix switch includes power module, communication control module, drive module and radio-frequency switch module;Institute State communication control module and radio-frequency switch module to be connected with drive module communication respectively, described power module respectively with Control on Communication Module, drive module and radio-frequency switch module electrical connection, and supply for communication control module, drive module and radio-frequency switch module Electricity.
Wherein, described communication control module includes USB RS 232 module and RS232 turns I/O module, and described USB turns RS232 module turns I/O module with RS232 and electrically connects, and described RS232 is turned I/O module and electrically connected with drive module.
Wherein, described radio-frequency switch module includes 2 input interfaces and N number of output interface, 2 input interfaces and N number of defeated Outgoing interface constitutes the complete matrix topology network architecture of 2*N, and N is >=2 natural number.
Wherein, described N is 4 or 6 or 12.
Wherein, described test instrumentation includes signal source generator, frequency spectrograph and vector network analyzer.
The invention has the beneficial effects as follows:Compared with prior art, the test instrumentation multiplexer of the present invention is provided with matrix and opens Close, it plays and for two input ports to expand to multiple effects, and product to be debugged for multiple stage can be connected with test instrumentation.With When under the control of control module, using time division multiplexing rule, new according to debugging station request signal and product to be debugged The corresponding of parameter signal resultant signal can be divided into multiplexer channel carry out signal transmission, and by the signal of each paths according to The priority of time-division is divided into some time gap signal, and control module is passed through to be switched fast, and links each debugging station of device All seem to use test instrumentation " monopolizing ".Such test instrumentation has reached the using effect of multiple stage.The multiplexing dress of this case Put, structure is simple, easy to use, substantially increases the service efficiency of test instrumentation, reduces instrument cost of investment.
Brief description
Fig. 1 is the structural representation based on the test instrumentation multiplexer of matrix switch for the present invention;
Fig. 2 is the structural representation of matrix switch of the present invention;
Fig. 3 is the schematic diagram of 2*12 complete matrix topology network architecture of the present invention.
Main element symbol description is as follows:
1st, matrix switch 2, test instrumentation
3rd, control module 4, debugging station
5th, product 10 to be debugged, built-in voltage modular converter
11st, power module 12, communication control module
13rd, drive module 14, radio-frequency switch module
15th, USB RS 232 module 16, RS232 turn I/O module
17th, main control module 18, input/output module
19th, peripheral circuit 20, external adapter.
Specific embodiment
In order to more clearly state the present invention, below in conjunction with the accompanying drawings the present invention is further described.
Refer to Fig. 1, the present invention provides a kind of test instrumentation 2 multiplexer based on matrix switch 1, multiple including connecting Debugging product matrix switch 1, more than one be used for analysis measurement debug particular product performance parameters test instrumentation 2, be based on the time-division The control module 3 of multiplexing technique and with debugging the corresponding multiple debugging station 4 of product.One end of control module 3 with many Individual debugging station 4 communication connects, and the other end of control module 3 is connected with test instrumentation 2 communication.One end of matrix switch 1 and survey Examination instrument 2 communication connects, and the other end is communicated with multiple products 5 to be debugged and is connected.
Compared with prior art, test instrumentation 2 multiplexer of the present invention is provided with matrix switch 1, and it plays defeated by two Inbound port expands to multiple effects, and product 5 to be debugged for multiple stage can be connected with test instrumentation 2.Simultaneously in control module 3 Under control, using time division multiplexing rule, according to debugging station 4 request signal and product to be debugged 5 performance parameter signal Corresponding resultant signal be divided into multiplexer channel carry out signal transmission, and by the signal of each paths according to the time-division priority It is divided into some time gap signal, control module 3 is passed through to be switched fast, each debugging station 4 linking device seems " monopolizing " uses test instrumentation 2.Such test instrumentation 2 has reached the using effect of multiple stage.The multiplexer of this case, structure Simply, easy to use, substantially increase the service efficiency of test instrumentation 2, reduce instrument cost of investment.
In the present embodiment, test instrumentation 2 includes signal source generator(Not shown), frequency spectrograph(Not shown)With vector net Network analyzer(Not shown).In frequency microwave field, test instrumentation 2 is mainly using signal source, frequency spectrograph, vector network analyzer Etc. instrument.These instrument composition is complicated, precise structure, in the research and development of frequency microwave product, production link, plays and focuses on your writing With.Even to this day, middle and high end RF instrumentation is almost all external minority giant monopolization, expensive, tens thousand of easily, 100,000 U.S.s Gold.And for frequency microwave enterprise, instrument is purchased and is occupied substantial amounts of fixed assets cost.With industry competition aggravation, profit Descending, how to reduce instrument cost of investment, improve instrument service efficiency, become significant and urgent problem.
In the following description, the present invention mainly taking vector network analyzer as a example(But this technology is not limited to apply On vector network analyzer), it is shown in detail in the principle of instrument multiplexing.Vector network analyzer is frequency microwave research and development of products, tune The important indispensable instrument of examination, test.It is widely used in the S parameter of the products such as wave filter, antenna, CA cable assembly, phase place, time domain Measurement.Vector network analyzer function is more, and usage amount is big, is referred to as " king of instrument ", is the general-purpose in frequency microwave field Table.Taking the maximum production debugging link of usage amount as a example, the waveform that adjustor mainly passes through to observe on vector network analyzer is bent Whether qualified line, to weigh debugged product.In debugging process, adjustor can constantly adjust impact property on product by rule of thumb The component locations of energy, observe the curve on instrument screen simultaneously, until all of wavy curve is in default scope, to be debugged Product 5 is as qualified.
Explain the workflow of the present invention with reference to Fig. 1:
1st, control module 3 receives the debugging request that debugging station 4 transmits, under time division multiplexing rule, by different debugging The request signal of station 4 transmission is divided into different paths, when the signal on each path being divided into some according to the time-division simultaneously Between gap;
2nd, control module 3 controls the switching of different paths, and when being adjusted in specific passageways, the product to be debugged 5 on this path can thing Vector network analyzer is accessed on reason(Can be also other test instrumentations 2), it is because matrix switch 1 has that this physics accesses N number of output interface, these interfaces can be connected from different products to be debugged 5, and each product 5 to be debugged has and specifically leads to Road, these paths are by the multiple single-pole single-throw(SPSTs in matrix switch 1, DPDT, single pole multiple throw and cable, according to one Fixed topological structure, constitutes matrixing network.In the presence of control module 3, control corresponding switch, be switched to and wait accordingly to adjust Trial product 5;
3rd, after product 5 to be debugged is switched on, vector network analyzer can test the performance parameter of product 5 to be debugged, now controls Module 3 can gather the Wave data on now vector network analyzer, and will be in data transfer to debugging station 4;So control Molding block 3 passes through to be switched fast, and each debugging station 4 linking device seems to use vector network analysis " monopolizing " Instrument, completely imperceptible difference, such vector network analyzer just in the presence of multiplexer, reach two, even The using effect of multiple stage;
4th, debugging station sends Debugging message according to the data of acquaintance to product 5 to be debugged, and this information is also by setting up passage Realize, so circulation completes the operation debugged.
Please participate in Fig. 2-Fig. 3, matrix switch 1 includes power module 11, communication control module 12, drive module 13 and radio frequency Switch module 14.Communication control module 12 and radio-frequency switch module 14 are connected with drive module 13 communication respectively, power module 11 Electrically connect with communication control module 12, drive module 13 and radio-frequency switch module 14 respectively, and be communication control module 12, drive Module 13 and radio-frequency switch module 14 are powered.
Communication control module 12 includes USB RS 232 module 15 and RS232 turns I/O module 16, USB RS 232 module 15 Turn I/O module 16 with RS232 to electrically connect, RS232 is turned I/O module 16 and electrically connected with drive module 13.Setting USB RS 232 mould Block 15 and RS232 turn I/O module 16, and matrix switch 1 can achieve and product 5 to be debugged, control module 3(Permissible in actual production Realize time-division multiplex control using the corresponding software systems of set of computers)It is connected with test instrumentation 2.
It is also seen that drive module 13 also includes main control module 17, input/output module 18 and peripheral circuit 19 from Fig. 2, Wherein one end of main control module 17 is electrically connected with radio-frequency switch module 14, and the other end and RS232 turn I/O module 16;Input and output Module 18 turns I/O module 16 with RS232 and electrically connects, and peripheral circuit 19 is also turned I/O module 16 and electrically connects with RS232.And power supply mould Block 11 includes external adapter 20 and built-in voltage modular converter 10.
Radio-frequency switch module 14 includes 2 input interfaces and N number of output interface, 2 input interfaces and N number of output interface structure Becoming the complete matrix topology network architecture of 2*N, N is >=2 natural number.N is 4 or 6 or 12.N=12 in the present embodiment.Matrix is opened Close the topological structure within 1, directly determine multiplexed form and the function of device, the number of such as ECP Extended Capabilities Port, adopt when in Fig. 3 The topology theory figure of 2*12 complete matrix, this kind of topological structure is most to support that 1 test instrumentation 2 is available for 6 debugging station 4 Concurrent multiplexing, substantially increases the service efficiency of test instrumentation.
Advantage of the invention is that:
1st, the test instrumentation multiplexer of the present invention is provided with the control module 3 based on time-division multiplex and matrix switch 1, realizes 1 The mode of operation of the corresponding multiple stage product to be debugged 5 of test instrumentation 2, structure is simple, easy to use, substantially increases test instrumentation Service efficiency, reduces instrument cost of investment;
2nd, matrix switch 1 adopts the topology theory figure of 2*12 complete matrix, and this kind of topological structure is most to support 1 test instrumentation 2 It is available for 6 debugging station 4 concurrent multiplexings, substantially increase the service efficiency of test instrumentation.
The several specific embodiments being only the present invention disclosed above, but the present invention is not limited to this, any this area Technical staff can think change all should fall into protection scope of the present invention.

Claims (6)

1. a kind of test instrumentation multiplexer based on matrix switch is it is characterised in that include connecting the square of multiple debugging products Battle array switchs, more than one is used for analysis measurement and debugs the test instrumentation of particular product performance parameters, based on time-division multiplexing (TDM) Control module and with debugging the corresponding multiple debugging station of product;One end of described control module is led to multiple debugging station News connect, and the other end of control module is connected with test instrumentation communication;One end of described matrix switch is with test instrumentation communication even Connect, the other end is communicated with multiple products to be debugged and is connected.
2. the test instrumentation multiplexer based on matrix switch according to claim 1 is it is characterised in that described matrix is opened Close and include power module, communication control module, drive module and radio-frequency switch module;Described communication control module and RF switch Module respectively with drive module communication be connected, described power module respectively with communication control module, drive module and RF switch Module electrically connects, and powers for communication control module, drive module and radio-frequency switch module.
3. the test instrumentation multiplexer based on matrix switch according to claim 2 is it is characterised in that described communication control Molding block includes USB RS 232 module and RS232 turns I/O module, and described USB RS 232 module and RS232 turn I/O module electricity Connect, described RS232 is turned I/O module and electrically connected with drive module.
4. the test instrumentation multiplexer based on matrix switch according to claim 2 is it is characterised in that described radio frequency is opened Close module and include 2 input interfaces and N number of output interface, the complete matrix of 2 input interfaces and N number of output interface composition 2*N is opened up Flutterring network structure, N is >=2 natural number.
5. the test instrumentation multiplexer based on matrix switch according to claim 4 it is characterised in that described N be 4 or 6 or 12.
6. the test instrumentation multiplexer based on matrix switch according to claim 1 is it is characterised in that described tester Table includes signal source generator, frequency spectrograph and vector network analyzer.
CN201610820758.9A 2016-09-13 2016-09-13 Matrix switcher based testing instrument multiplexing device Pending CN106443093A (en)

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110609223A (en) * 2019-06-25 2019-12-24 眸芯科技(上海)有限公司 Automatic test system and method for embedded system
CN110927489A (en) * 2019-11-27 2020-03-27 广州思泰信息技术有限公司 Distribution automation feeder terminal test system and method
CN113364532A (en) * 2020-03-02 2021-09-07 上海特普瑞通讯科技有限公司 Multi-station debugging workstation for radio frequency device

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101871973A (en) * 2010-05-14 2010-10-27 西安电子科技大学 Time sharing multiplex measurement system and method based on vector network analyzer
CN201985869U (en) * 2010-12-22 2011-09-21 中国空间技术研究院 Radio frequency channel switching device
CN103605024A (en) * 2013-11-15 2014-02-26 中国电子科技集团公司第四十一研究所 Multi-port S parameter test device based on USB interface
CN104198788A (en) * 2014-09-09 2014-12-10 南京捷希科技有限公司 VNA (Vector Network Analyzer) multiplexing instrument and method
CN205160550U (en) * 2015-12-08 2016-04-13 成都天大仪器设备有限公司 Multiport testing arrangement
CN205246774U (en) * 2015-12-08 2016-05-18 成都天大仪器设备有限公司 Multiport extension testing arrangement
CN205490550U (en) * 2016-03-28 2016-08-17 武汉奥新科技有限公司 Duplex position WDM test system

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101871973A (en) * 2010-05-14 2010-10-27 西安电子科技大学 Time sharing multiplex measurement system and method based on vector network analyzer
CN201985869U (en) * 2010-12-22 2011-09-21 中国空间技术研究院 Radio frequency channel switching device
CN103605024A (en) * 2013-11-15 2014-02-26 中国电子科技集团公司第四十一研究所 Multi-port S parameter test device based on USB interface
CN104198788A (en) * 2014-09-09 2014-12-10 南京捷希科技有限公司 VNA (Vector Network Analyzer) multiplexing instrument and method
CN205160550U (en) * 2015-12-08 2016-04-13 成都天大仪器设备有限公司 Multiport testing arrangement
CN205246774U (en) * 2015-12-08 2016-05-18 成都天大仪器设备有限公司 Multiport extension testing arrangement
CN205490550U (en) * 2016-03-28 2016-08-17 武汉奥新科技有限公司 Duplex position WDM test system

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110609223A (en) * 2019-06-25 2019-12-24 眸芯科技(上海)有限公司 Automatic test system and method for embedded system
CN110927489A (en) * 2019-11-27 2020-03-27 广州思泰信息技术有限公司 Distribution automation feeder terminal test system and method
CN113364532A (en) * 2020-03-02 2021-09-07 上海特普瑞通讯科技有限公司 Multi-station debugging workstation for radio frequency device

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Application publication date: 20170222