CN106289545A - High-resolution femtosecond laser pulse width measuring instrument - Google Patents
High-resolution femtosecond laser pulse width measuring instrument Download PDFInfo
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- CN106289545A CN106289545A CN201610757472.0A CN201610757472A CN106289545A CN 106289545 A CN106289545 A CN 106289545A CN 201610757472 A CN201610757472 A CN 201610757472A CN 106289545 A CN106289545 A CN 106289545A
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- reflecting mirror
- laser pulse
- pulse width
- femtosecond laser
- light
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- 230000001427 coherent effect Effects 0.000 claims abstract description 14
- 238000005286 illumination Methods 0.000 claims abstract description 3
- 230000005540 biological transmission Effects 0.000 claims description 12
- 238000003384 imaging method Methods 0.000 claims description 8
- 230000003287 optical effect Effects 0.000 claims description 6
- 239000013078 crystal Substances 0.000 claims description 5
- 230000033228 biological regulation Effects 0.000 claims description 2
- 238000001514 detection method Methods 0.000 claims description 2
- 238000000034 method Methods 0.000 claims description 2
- 230000007423 decrease Effects 0.000 claims 1
- 238000005259 measurement Methods 0.000 abstract description 16
- 239000006185 dispersion Substances 0.000 description 10
- 239000000463 material Substances 0.000 description 6
- 238000010586 diagram Methods 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 230000007812 deficiency Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
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- 239000000203 mixture Substances 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J11/00—Measuring the characteristics of individual optical pulses or of optical pulse trains
Abstract
A kind of high-resolution femtosecond laser pulse width measuring instrument, including the reflective attenuator of disc type variable power, the first reflecting mirror and five or five spectroscopes that are sequentially placed along light path, incident illumination is divided into two by this five or five spectroscope, light is penetrated after the delayer that the second reflecting mirror and the 3rd reflecting mirror form by one Reuter, then enters related crystalline through the 4th reflecting mirror；Another road reflection light likewise enters related crystalline after the 5th reflecting mirror, the 6th reflecting mirror, the 7th reflecting mirror, and is imaged onto in detector by coherent signal, finally by computer disposal coherent signal, obtains the width of tested femto-second laser pulse.Measured pulse can be decayed by the present invention automatically, thus ensures related crystalline and the safety of detector and the accuracy of measurement result；Eliminate due to the impact on measurement result of the incident beam divergence simultaneously, be very conveniently met the demand of measurement accurate to femtosecond laser pulse width in ultrashort fs-laser system.
Description
Technical field
The present invention relates to ultra-short pulse laser system middle high-resolution femtosecond laser pulse width measuring instrument.
Background technology
The laser pulse width that in ultra-short pulse laser system, final physical is practiced shooting is a very important technical parameter,
Determine laser pulse and realtime power during matter interaction.Pulsewidth width is the shortest, it is desirable to measure the laser pulse width arrived
The precision of degree is higher.
The classical way that ultra-short laser impulse width is measured is correlation method, at psec or the ultra-short pulse width of subpicosecond
In measurement, certainty of measurement is sufficient at 50fs-100fs, the material dispersion introduced due to decay etc. at this point for the system of measurement
And the divergence of input beam etc. is the least on the impact measuring pulsewidth, can ignore.And for the laser pulse less than 50fs
For width measure, these factors are the biggest for the impact of measurement result.Assume that entering femtosecond laser pulse width measures
The femtosecond pulse of instrument is that after the dispersion elements such as transmission-type attenuator, pulse width is by broadened, after broadening without warbling
Pulse width can be calculated by following formula:
T in formulapFor the pulse width after broadening, t0For initial pulse width,2nd order chromatic dispersion for dispersion element.
According to formula (1), for the measurement pulse width of 10fs, when using 1mm thickness transmission-type K9 glass attenuator
Time, the pulse width measured is: 15.8fs；When using 2mm thickness transmission-type K9 glass attenuator, measure the pulse width arrived
For: 26.4fs, it is clear that measured result and actual value create very large deviation.
In actual engineer applied, in order to obtain every ultra-short laser impulse width data, it is necessary to according to the energy of every
Amount size carries out appropriate decay, and as a rule, in order to not affect the direction of optical path, its attenuator is transmission-type, but
So can make measurement result distortion.If using the way calculated by transmission-type attenuator in femtosecond laser pulse width measuring instrument
The dispersion introduced is rejected, and its result does not have uniqueness, because inceptive impulse is likely to be of: just warbles, bear and warble and without warbling,
I.e. one measurement result at least can be calculated 3 Different Results, and is difficult to judge which result is correct.
It addition, for ultrashort femtosecond laser pulse width is measured, even if the divergence of measured pulse is minimum, also can make
Measurement result produces bigger error.And these are for hundred femto-second laser pulses and Ps Laser Pulse width measure, it is all
Negligible.
Meanwhile, in order to measure femtosecond laser pulse width, measuring instrument must also have high resolution, and these
Psec or hundred femtosecond pulses are also unwanted in measuring.
Summary of the invention
It is an object of the invention to overcome the deficiencies in the prior art, it is provided that a kind of high-resolution femtosecond laser pulse width is surveyed
Amount instrument, this instrument can realize measuring during laser pulse width high-precision real in ultrashort fs-laser system, overcome owing to declining
Material dispersion and the impact on measurement result of the measured laser pulse divergence such as subtract.This measuring instrument I surveys laser pulse
Time width is 6fs, and resolution is 1.9fs.
The technical solution of the present invention is:
A kind of high-resolution femtosecond laser pulse width measuring instrument, including the reflective attenuator of disc type variable power, first
Reflecting mirror, five or five spectroscopes, the delayer being made up of the second reflecting mirror and the 3rd reflecting mirror, the 4th reflecting mirror, the 5th reflecting mirror,
6th reflecting mirror, the 7th reflecting mirror, related crystalline, imaging system, the 8th reflecting mirror, detector and computer, this computer divides
It is not connected with described detector and the reflective attenuator of disc type variable power；
It is sequentially placed the described reflective attenuator of disc type variable power, the first reflecting mirror and five or five light splitting along light path
Mirror, incident illumination is divided into transmission light and reflection light two-way by this five or five spectroscope, and described transmission light is through the second reflecting mirror and the
After the delayer of three reflecting mirror compositions, then after the 4th reflecting mirror, enter related crystalline；Described reflection light warp successively
After described the 5th reflecting mirror, the 6th reflecting mirror and the 7th reflecting mirror, inject related crystalline；Obtain through described related crystalline
Coherent signal, after the most imaged system of this coherent signal, the 8th reflecting mirror, is imaged onto in detector, is finally delivered to calculate
Machine, by computer disposal coherent signal, obtains the width of tested femto-second laser pulse.
A non-colinear angle is there is between reflection light and transmission light incident in described related crystalline Making reflection light and transmission light produce delay spatially at intersection location, this space delay passes through related crystalline
After obtain coherent signal.
By the position of delayer described in regulation, described transmission light is made to arrive the light path of related crystalline anti-with described
Penetrate light and arrive the equivalent optical path of related crystalline.
Measurand both can be single femtosecond laser signal, it is also possible to be the femtosecond laser signal of repetition rate.
The described reflective attenuator of disc type variable power is by an electronic decay dish and the reflection of 4 differential declines multiplying powers
Formula attenuator forms, and the reflection loss multiplying power of attenuator can be respectively as follows: 0.1%, 1%, 10%, 90% etc. arbitrarily decay
Value；The rotation of decay dish in attenuator can be controlled by computer, thus realize measured pulse being decayed flexibly, simultaneously
Do not change the optical path direction entering high-resolution femtosecond laser pulse width measuring instrument, and do not introduce material dispersion；
Described related crystalline is nonlinear crystal, including BBO, LBO, KDP, YCOB.
The solution have the advantages that:
1) use disc type variable power reflective attenuator that measured signal is decayed flexibly, do not change entrance height simultaneously
The optical path direction of resolution femtosecond laser pulse width measuring instrument, and do not introduce material dispersion, it is ensured that the accuracy of measurement result；
2) use imaging system to be imaged on accurately in detector by coherent signal, eliminate due to tested luminous exitance
Impact on measurement result, has been very conveniently met survey accurate to femtosecond laser pulse width in High Power Femtosecond Laser system
The demand of amount.
Accompanying drawing explanation
Fig. 1 is the structure diagram of the embodiment of the present invention 1.
In figure: the reflective attenuator of 1-disc type variable power；2-the first reflecting mirror；3-five or five spectroscope；4-second reflects
Mirror；5-the 3rd reflecting mirror；6-delayer；7-the 4th reflecting mirror；8-the 5th reflecting mirror；9-the 6th reflecting mirror；10-the 7th reflects
Mirror；11-related crystalline；12-imaging system；13-the 8th reflecting mirror；14-detector；15-computer.
Detailed description of the invention
Below in conjunction with embodiment and accompanying drawing, the invention will be further described, but should not limit the protection model of the present invention with this
Enclose.
When the ultrashort femto-second laser pulse that measured laser pulse is femtosecond magnitude (6fs-0.5ps), refer to Fig. 1, Fig. 1
For the structure diagram of the embodiment of the present invention, measure for realizing the accurate of femtosecond laser pulse width between 6fs-0.5ps and divide
Analysis demand.Measured pulse first passes through the reflective attenuator of disc type variable power 1 and measured pulse is carried out appropriate decay, due to
This attenuator is reflective decay, so material dispersion will not be introduced.After overdamping, measured pulse enters high-resolution femtosecond
Inside measurment of laser pulse width instrument, then via the first reflecting mirror 2 and 55 spectroscope 3, this five or five spectroscope 3 is by incidence
Light is divided into two, and light is penetrated after the delayer 6 that the second reflecting mirror 4 and the 3rd reflecting mirror 5 form by a Reuter, then through the 4th
Related crystalline 11 is entered after reflecting mirror 7；Another road reflection light is through the 5th reflecting mirror the 8, the 6th reflecting mirror the 9, the 7th reflecting mirror
Related crystalline 11 is likewise entered after 10.Obtaining coherent signal after related crystalline, this coherent signal is through imaging system 12
It is imaged onto on detector 14, and is received by detector 14, be then communicated to computer 15 and be analyzed processing, obtain measured pulse
Width.
A non-colinear angle is there is between reflection light and transmission lightSo that reflection light is intersecting position with transmission light
Putting place and produce delay spatially, i.e. produce delay spatially on related crystalline 11, this space delay passes through related crystalline
After 11, obtain coherent signal.
Assuming that detector 14 uses CCD, the size of each pixel of this CCD is d, and the light velocity is c, the phase linear with measured pulse
Pass coefficient is k (such as when measured pulse is that hyperbolic secant is, k=1.53), and imaging system 12 uses 1:1 imaging, then this detection
The temporal resolution of device is:
Especially, whenThe line style of measured pulse is hyperbolic secant, i.e. k=1.532, on photodetector (CCD)
Pixel cell size is 8.3um/pixel, when resolution is 582 × 852, brings formula (2) into and can obtain resolution now
For: 1.9fs/pixel, calculate further and can obtain, the femtosecond laser pulse width scope that this detector can be measured is: 6fs-
1.6ps。
Calculated it can be seen that this femto-second laser pulse measuring instrument can have high resolution by above
(1.9fs/pixel)；
Described high-resolution femtosecond laser pulse width measuring instrument due to use the reflective attenuator of disc type variable power,
Both measured pulse can be decayed flexibly, it is ensured that measuring instrument safety, material dispersion will not be introduced again, it is ensured that measurement
Accuracy；
Coherent signal is imaged in detector by described imaging system accurately, eliminates due to tested luminous exitance
Impact on measurement result, has been very conveniently met survey accurate to femtosecond laser pulse width in High Power Femtosecond Laser system
The demand of amount.
Claims (6)
1. a high-resolution femtosecond laser pulse width measuring instrument, it is characterised in that include that disc type variable power is reflective and decline
Subtract device (1), the first reflecting mirror (2), five or five spectroscopes (3), the delay that is made up of the second reflecting mirror (4) and the 3rd reflecting mirror (5)
Device (6), the 4th reflecting mirror (7), the 5th reflecting mirror (8), the 6th reflecting mirror (9), the 7th reflecting mirror (10), related crystalline (11),
Imaging system (12), the 8th reflecting mirror (13), detector (14) and computer (15), this computer (15) respectively with described spy
Survey device (14) attenuator reflective with disc type variable power (1) to be connected；
It is sequentially placed the described reflective attenuator of disc type variable power (1), the first reflecting mirror (2) and five or five light splitting along light path
Mirror (3), incident illumination is divided into transmission light and reflection light two-way by this five or five spectroscope (3), and described transmission light is through the second reflection
After the delayer (6) that mirror (4) and the 3rd reflecting mirror (5) form, then enter related crystalline after the 4th reflecting mirror (7)
(11)；Described reflection light successively after described the 5th reflecting mirror (8), the 6th reflecting mirror (9) and the 7th reflecting mirror (10),
Inject related crystalline (11)；Coherent signal is obtained, the most imaged system of this coherent signal through described related crystalline (11)
(12), after the 8th reflecting mirror (13), it is imaged onto in detector (14), is finally delivered to computer (15), by computer (15)
Process coherent signal, obtain the width of tested femto-second laser pulse.
High-resolution femtosecond laser pulse width measuring instrument the most according to claim 1, it is characterised in that in described phase
Close and between reflection light and transmission light incident in crystal (11), there is a non-colinear angle Make reflection light
Producing delay spatially at intersection location with transmission light, this space delay is by obtaining relevant letter after related crystalline (11)
Number.
High-resolution femtosecond laser pulse width measuring instrument the most according to claim 1, it is characterised in that by regulation institute
The position of the delayer (6) stated, the light path making described transmission light arrive related crystalline (11) arrives phase with described reflection light
Close the equivalent optical path of crystal (11).
High-resolution femtosecond laser pulse width measuring instrument the most according to claim 1, it is characterised in that described disc type
The reflective attenuator of variable power (1) is made up of the reflective attenuator of an electronic decay dish and four differential declines multiplying powers,
The rotation of electronic decay dish in the reflective attenuator of disc type variable power (1) is controlled by computer (15).
High-resolution femtosecond laser pulse width measuring instrument the most according to claim 1, it is characterised in that described is relevant
Crystal (11) is nonlinear crystal, including BBO, LBO, KDP or YCOB.
High-resolution femto-second laser pulse instrument for measuring the optical pulse the most according to claim 1, it is characterised in that described detection
Device (14) is CCD, photodiode or fast-response photocell.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201610757472.0A CN106289545B (en) | 2016-08-29 | 2016-08-29 | High-resolution femtosecond laser pulse width measuring instrument |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201610757472.0A CN106289545B (en) | 2016-08-29 | 2016-08-29 | High-resolution femtosecond laser pulse width measuring instrument |
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| Publication Number | Publication Date |
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| CN106289545B CN106289545B (en) | 2018-11-20 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107436197A (en) * | 2017-06-17 | 2017-12-05 | 河南省启封新源光电科技有限公司 | Big bandwidth, the autocorrelation function analyzer of microminiature single-shot automatic measurement femtosecond laser pulsewidth |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20030174335A1 (en) * | 2002-03-14 | 2003-09-18 | Chi-Kuang Sun | Method and system for measuring an ultrashort optical pulse |
| CN1858566A (en) * | 2006-06-09 | 2006-11-08 | 中国科学院上海光学精密机械研究所 | Super short pulse precision real time measuring device |
| CN104121995A (en) * | 2014-07-01 | 2014-10-29 | 华南师范大学 | Device and method for measuring time-domain width of femtosecond pulse |
-
2016
- 2016-08-29 CN CN201610757472.0A patent/CN106289545B/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20030174335A1 (en) * | 2002-03-14 | 2003-09-18 | Chi-Kuang Sun | Method and system for measuring an ultrashort optical pulse |
| CN1858566A (en) * | 2006-06-09 | 2006-11-08 | 中国科学院上海光学精密机械研究所 | Super short pulse precision real time measuring device |
| CN104121995A (en) * | 2014-07-01 | 2014-10-29 | 华南师范大学 | Device and method for measuring time-domain width of femtosecond pulse |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107436197A (en) * | 2017-06-17 | 2017-12-05 | 河南省启封新源光电科技有限公司 | Big bandwidth, the autocorrelation function analyzer of microminiature single-shot automatic measurement femtosecond laser pulsewidth |
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| CN106289545B (en) | 2018-11-20 |
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