CN106289545B - High-resolution femtosecond laser pulse width measuring instrument - Google Patents

High-resolution femtosecond laser pulse width measuring instrument Download PDF

Info

Publication number
CN106289545B
CN106289545B CN201610757472.0A CN201610757472A CN106289545B CN 106289545 B CN106289545 B CN 106289545B CN 201610757472 A CN201610757472 A CN 201610757472A CN 106289545 B CN106289545 B CN 106289545B
Authority
CN
China
Prior art keywords
reflecting mirror
laser pulse
pulse width
femtosecond laser
measuring instrument
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201610757472.0A
Other languages
Chinese (zh)
Other versions
CN106289545A (en
Inventor
杨庆伟
谢兴龙
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shanghai Institute of Optics and Fine Mechanics of CAS
Original Assignee
Shanghai Institute of Optics and Fine Mechanics of CAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shanghai Institute of Optics and Fine Mechanics of CAS filed Critical Shanghai Institute of Optics and Fine Mechanics of CAS
Priority to CN201610757472.0A priority Critical patent/CN106289545B/en
Publication of CN106289545A publication Critical patent/CN106289545A/en
Application granted granted Critical
Publication of CN106289545B publication Critical patent/CN106289545B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J11/00Measuring the characteristics of individual optical pulses or of optical pulse trains

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)

Abstract

A kind of high-resolution femtosecond laser pulse width measuring instrument, including the reflective attenuator of disc type variable power, the first reflecting mirror and five or five spectroscopes being sequentially placed along optical path, incident light is divided into two by five or five spectroscope, the delayer and then enter related crystalline by the 4th reflecting mirror that transmitted light is formed by the second reflecting mirror and third reflecting mirror all the way;Another way reflected light likewise enters related crystalline after the 5th reflecting mirror, the 6th reflecting mirror, the 7th reflecting mirror, and coherent signal is imaged onto detector, finally by computer disposal coherent signal, obtains the width of tested femto-second laser pulse.The present invention can decay automatically to measured pulse, to guarantee the safety of related crystalline and detector and the accuracy of measurement result;The influence due to incident beam divergence to measurement result is eliminated simultaneously, has been very conveniently met the demand in ultrashort fs-laser system to femtosecond laser pulse width precise measurement.

Description

High-resolution femtosecond laser pulse width measuring instrument
Technical field
The present invention relates to ultra-short pulse laser system middle high-resolution femtosecond laser pulse width measuring instruments.
Background technique
The laser pulse width that final physical is practiced shooting in ultra-short pulse laser system is a very important technical parameter, Determine realtime power when laser pulse and matter interaction.Pulsewidth width is shorter, it is desirable that the laser pulse width measured The precision of degree is higher.
Ultra-short laser impulse width measurement classical method be correlation method, picosecond or subpicosecond ultra-short pulse width In measurement, measurement accuracy is sufficient in 50fs-100fs, at this point for measuring system due to the material dispersion of the introducings such as decaying And divergence of input light beam etc. can ignore the influence very little of measurement pulsewidth.And the laser pulse for being less than 50fs For width measurement, influence of these factors for measurement result is all very big.Assuming that being measured into femtosecond laser pulse width The femtosecond pulse of instrument is without chirp, and after the dispersion elements such as transmission-type attenuator, pulse width will be broadened, after broadening Pulse width can be calculated by following formula:
T in formulapFor the pulse width after broadening, t0For initial pulse width,For the second-order dispersion of dispersion element.
According to formula (1), for the measurement pulse width of 10fs, when using 1mm thickness transmission-type K9 glass attenuator When, the pulse width measured is:15.8fs;When using 2mm thickness transmission-type K9 glass attenuator, the pulse width that measures For:26.4fs, it is clear that measured result and actual value produce very large deviation.
In actual engineer application, every hair ultra-short laser impulse width data in order to obtain, it is necessary to according to the energy of every hair Amount size carries out appropriate decaying, and usually, in order to not influence the direction of optical path, attenuator is transmission-type, still Measurement result can be made to be distorted in this way.If using the method for calculating by transmission-type attenuator in femtosecond laser pulse width measuring instrument The dispersion of introducing is rejected, and result does not have uniqueness, because inceptive impulse may have:Positive chirp, negative chirp and without chirp, I.e. 3 Different Results can be at least calculated in a measurement result, and are difficult which judges the result is that correctly.
In addition, even if the divergence of measured pulse is minimum, can also make for the measurement of ultrashort femtosecond laser pulse width Measurement result generates large error.And these are all for hundred femto-second laser pulses and Ps Laser Pulse width measurement It is negligible.
Meanwhile in order to measure femtosecond laser pulse width, measuring instrument must also have high resolution ratio, and these Picosecond or hundred femtosecond pulses measurement in be also it is unwanted.
Summary of the invention
It is an object of the invention to overcome the deficiencies of the prior art and provide a kind of surveys of high-resolution femtosecond laser pulse width Instrument is measured, which may be implemented laser pulse width high-precision real-time measurement in ultrashort fs-laser system, overcome due to declining Subtract the influence of equal material dispersions and measured laser pulse divergence to measurement result.The measuring instrument minimum can survey laser pulse Time width is 6fs, resolution ratio 1.9fs.
The technical solution of the invention is as follows:
A kind of high-resolution femtosecond laser pulse width measuring instrument, including the reflective attenuator of disc type variable power, first Reflecting mirror, five or five spectroscopes, the delayer being made of the second reflecting mirror and third reflecting mirror, the 4th reflecting mirror, the 5th reflecting mirror, 6th reflecting mirror, the 7th reflecting mirror, related crystalline, imaging system, the 8th reflecting mirror, detector and computer, the computer point It is not connected with the detector and the reflective attenuator of disc type variable power;
The reflective attenuator of disc type variable power, the first reflecting mirror and five or five light splitting are sequentially placed along optical path Incident light is divided into transmitted light and reflected light two-way by mirror, five or five spectroscope, and the transmitted light is by the second reflecting mirror and the The delayer and then enter related crystalline later by the 4th reflecting mirror that three reflecting mirrors form;The reflected light successively passes through After 5th reflecting mirror, the 6th reflecting mirror and the 7th reflecting mirror, related crystalline is injected;It is obtained through the related crystalline Coherent signal, the coherent signal successively after imaged system, the 8th reflecting mirror, are imaged onto detector, are finally delivered to calculate Machine obtains the width of tested femto-second laser pulse by computer disposal coherent signal.
There are a non-colinear angles between reflected light and transmitted light incident in the related crystalline Reflected light and transmitted light is set to generate the delay on space at intersection location, which passes through related crystalline After obtain coherent signal.
By adjusting the position of the delayer, make the transmitted light reach the light path of related crystalline with it is described anti- Penetrate the equivalent optical path that light reaches related crystalline.
Measurand is also possible to the femtosecond laser signal of repetition rate either single femtosecond laser signal.
The reflective attenuator of disc type variable power by electronic a decaying disk and 4 differential declines multiplying powers reflection Formula attenuator composition, the reflection loss multiplying power of attenuator can be respectively:0.1%, 1%, 10%, 90% etc. any decaying Value;The rotation that can control disk of decaying in attenuator by computer, flexibly decays to measured pulse to realize, simultaneously Do not change the optical path direction into high-resolution femtosecond laser pulse width measuring instrument, and does not introduce material dispersion;
The related crystalline is nonlinear crystal, including BBO, LBO, KDP, YCOB.
The solution have the advantages that:
1) flexibly decayed using the reflective attenuator of disc type variable power to measured signal, while not changed into high The optical path direction of resolution ratio femtosecond laser pulse width measuring instrument, and material dispersion is not introduced, guarantee the accuracy of measurement result;
2) coherent signal is accurately imaged in detector using imaging system, is eliminated due to being tested luminous exitance Influence to measurement result has been very conveniently met in High Power Femtosecond Laser system and has accurately surveyed to femtosecond laser pulse width The demand of amount.
Detailed description of the invention
Fig. 1 is the structure diagram of the embodiment of the present invention 1.
In figure:The reflective attenuator of 1- disc type variable power;The first reflecting mirror of 2-;Five or five spectroscope of 3-;4- second reflects Mirror;5- third reflecting mirror;6- delayer;The 4th reflecting mirror of 7-;The 5th reflecting mirror of 8-;The 6th reflecting mirror of 9-;10- the 7th reflects Mirror;11- related crystalline;12- imaging system;The 8th reflecting mirror of 13-;14- detector;15- computer.
Specific embodiment
Below with reference to embodiment and attached drawing, the invention will be further described, but protection model of the invention should not be limited with this It encloses.
When measured laser pulse is the ultrashort femto-second laser pulse of femtosecond magnitude (6fs-0.5ps), referring to Fig. 1, Fig. 1 For the structure diagram of the embodiment of the present invention, for realizing femtosecond laser pulse width between 6fs-0.5ps precise measurement and point Analysis demand.Measured pulse passes through the reflective attenuator 1 of disc type variable power first and measured pulse is carried out to appropriate decaying, due to The attenuator is reflective decaying, so material dispersion will not be introduced.Measured pulse enters high-resolution femtosecond after overdamping Inside measurment of laser pulse width instrument, then via the first reflecting mirror 2 and five or five spectroscopes 3, which will be incident Light is divided into two, and transmitted light passes through the delayer 6 of the second reflecting mirror 4 and the composition of third reflecting mirror 5 and then by the 4th all the way Enter related crystalline 11 after reflecting mirror 7;Another way reflected light passes through the 5th reflecting mirror 8, the 6th reflecting mirror 9, the 7th reflecting mirror Related crystalline 11 is likewise entered after 10.Coherent signal is obtained after related crystalline, which passes through imaging system 12 It is imaged on detector 14, and is received by detector 14, be then communicated to computer 15 and be analyzed and processed, obtain measured pulse Width.
There are a non-colinear angles between reflected light and transmitted lightTo make reflected light intersect position with transmitted light The delay of place's generation spatially is set, i.e., generates the delay on space on related crystalline 11, which passes through related crystalline After 11, coherent signal is obtained.
Assuming that detector 14 uses CCD, the size of each pixel of the CCD is d, light velocity c, the linear phase with measured pulse Relationship number is k (such as when measured pulse is, k=1.53) for hyperbolic secant, and imaging system 12 uses 1:1 imaging, the then detection The temporal resolution of device is:
Particularly, whenThe line style of measured pulse is hyperbolic secant, i.e. k=1.532, on photodetector (CCD) Pixel cell size is that 8.3um/pixel brings the available resolution ratio at this time of formula (2) into when resolution ratio is 582 × 852 For:1.9fs/pixel, further calculates available, and the femtosecond laser pulse width range which is capable of measuring is:6fs- 1.6ps。
By above calculating as can be seen that the femto-second laser pulse measuring instrument can have high resolution ratio (1.9fs/pixel);
The high-resolution femtosecond laser pulse width measuring instrument due to use the reflective attenuator of disc type variable power, Both it can flexibly be decayed to measured pulse, and guarantee measuring instrument safety, and material dispersion will not be introduced, guarantee measurement Accuracy;
Coherent signal is accurately imaged in detector by the imaging system, is eliminated due to being tested luminous exitance Influence to measurement result has been very conveniently met in High Power Femtosecond Laser system and has accurately surveyed to femtosecond laser pulse width The demand of amount.

Claims (6)

1. a kind of high-resolution femtosecond laser pulse width measuring instrument, which is characterized in that decline including disc type variable power is reflective Subtract device (1), the first reflecting mirror (2), five or five spectroscopes (3), the delay being made of the second reflecting mirror (4) and third reflecting mirror (5) Device (6), the 4th reflecting mirror (7), the 5th reflecting mirror (8), the 6th reflecting mirror (9), the 7th reflecting mirror (10), related crystalline (11), Imaging system (12), the 8th reflecting mirror (13), detector (14) and computer (15), the computer (15) respectively with the spy Device (14) are surveyed to be connected with the reflective attenuator of disc type variable power (1);
The reflective attenuator of disc type variable power (1), the first reflecting mirror (2) and five or five light splitting are sequentially placed along optical path Incident light is divided into transmitted light and reflected light two-way by mirror (3), five or five spectroscope (3), and the transmitted light is by the second reflection The delayer (6) and then enter related crystalline later by the 4th reflecting mirror (7) that mirror (4) and third reflecting mirror (5) form (11);The reflected light successively passes through after the 5th reflecting mirror (8), the 6th reflecting mirror (9) and the 7th reflecting mirror (10), It injects related crystalline (11);Coherent signal is obtained through the related crystalline (11), the coherent signal successively imaged system (12), it after the 8th reflecting mirror (13), is imaged onto detector (14), is finally delivered to computer (15), pass through computer (15) Coherent signal is handled, the width of tested femto-second laser pulse is obtained.
2. high-resolution femtosecond laser pulse width measuring instrument according to claim 1, which is characterized in that in the phase There are a non-colinear angles between incident reflected light and transmitted light in pass crystal (11) Make reflected light The delay on space is generated at intersection location with transmitted light, which obtains related letter after passing through related crystalline (11) Number.
3. high-resolution femtosecond laser pulse width measuring instrument according to claim 1, which is characterized in that by adjusting institute The position for the delayer (6) stated makes the light path of transmitted light arrival related crystalline (11) and the reflected light reach phase Close the equivalent optical path of crystal (11).
4. high-resolution femtosecond laser pulse width measuring instrument according to claim 1, which is characterized in that the disc type The reflective attenuator of variable power (1) is made of the reflective attenuator of an electronic decaying disk and four differential declines multiplying powers, Pass through the rotation of electronic decaying disk in computer (15) the control reflective attenuator of disc type variable power (1).
5. high-resolution femtosecond laser pulse width measuring instrument according to claim 1, which is characterized in that the correlation Crystal (11) is nonlinear crystal, including BBO, LBO, KDP or YCOB.
6. high-resolution femtosecond laser pulse width measuring instrument according to claim 1, which is characterized in that the detection Device (14) is CCD, photodiode or fast-response photoelectric tube.
CN201610757472.0A 2016-08-29 2016-08-29 High-resolution femtosecond laser pulse width measuring instrument Active CN106289545B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201610757472.0A CN106289545B (en) 2016-08-29 2016-08-29 High-resolution femtosecond laser pulse width measuring instrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201610757472.0A CN106289545B (en) 2016-08-29 2016-08-29 High-resolution femtosecond laser pulse width measuring instrument

Publications (2)

Publication Number Publication Date
CN106289545A CN106289545A (en) 2017-01-04
CN106289545B true CN106289545B (en) 2018-11-20

Family

ID=57674287

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201610757472.0A Active CN106289545B (en) 2016-08-29 2016-08-29 High-resolution femtosecond laser pulse width measuring instrument

Country Status (1)

Country Link
CN (1) CN106289545B (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107436197A (en) * 2017-06-17 2017-12-05 河南省启封新源光电科技有限公司 Big bandwidth, the autocorrelation function analyzer of microminiature single-shot automatic measurement femtosecond laser pulsewidth

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1858566A (en) * 2006-06-09 2006-11-08 中国科学院上海光学精密机械研究所 Super short pulse precision real time measuring device
CN104121995A (en) * 2014-07-01 2014-10-29 华南师范大学 Device and method for measuring time-domain width of femtosecond pulse

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6734976B2 (en) * 2002-03-14 2004-05-11 National Taiwan University Method and system for measuring an ultrashort optical pulse

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1858566A (en) * 2006-06-09 2006-11-08 中国科学院上海光学精密机械研究所 Super short pulse precision real time measuring device
CN104121995A (en) * 2014-07-01 2014-10-29 华南师范大学 Device and method for measuring time-domain width of femtosecond pulse

Also Published As

Publication number Publication date
CN106289545A (en) 2017-01-04

Similar Documents

Publication Publication Date Title
US8068230B2 (en) Real-time measurement of ultrashort laser pulses
Ware et al. Single-photon detector characterization using correlated photons: the march from feasibility to metrology
CN101477047B (en) Nonlinear absorption measuring method based on lens geometric optical imaging
CN104458646A (en) High-speed multi-width terahertz time-domain spectral imager
CN103063315B (en) Based on single signal-to-noise ratio measuring method and the device of chirped pulse characteristic
CN106289544A (en) The pulse measuring method of high-contrast and measurement apparatus
CN106500844A (en) A kind of clematis stem road point amplitude high speed Stokes polarimeter and its measurement method of parameters
CN101750154B (en) Detecting device for laser noise-signal ratio
CN106918310A (en) Contactless electro-optic crystal light pass surface normal deviates angle measuring device and its measuring method with Z axis
CN102508225B (en) Double-shaft laser remote sensing instrument ground detection and calibration system and detection and calibration method
CN104880258A (en) Device and method for measuring near-field correlation pulse width of ultrashort optical pulses
CN109239726A (en) A kind of noncooperative target range-measurement system based on the double comb femto-second lasers of separate unit
CN106289545B (en) High-resolution femtosecond laser pulse width measuring instrument
CN108254088A (en) A wide range of Ps Laser Pulse width of measuring device
CN202305181U (en) Device for testing sampling rate of large-caliber sampling grating
CN103033340B (en) The test device of heavy caliber sampled-grating sampling rate and method of testing
CN106769731B (en) Method and device for measuring concentration of particulate matter
CN205120243U (en) Strong laser energy real -time monitoring system device
CN104483027A (en) Automatic laser pulse width measurement autocorrelator and measurement method
CN110530533A (en) Quadravalence autocorrelation function analyzer for laser pulse contrast measurement
CN103499814B (en) A kind of high precision Doppler lidar Frequency Locking system
CN110319941A (en) Using devitrified glass as the ultrashort pulse detector based on lateral frequency multiplication of frequency multiplication medium
CN104155085B (en) Device and method for testing sampling rate of large-diameter sampling chopping board
CN101561317B (en) System for measuring the influence of object to polarization state of transmitted beams with high precision and automation
CN205607864U (en) Soil pollution laser detection device

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant