CN106249040B - Wide-range dynamic voltage measuring circuit and method - Google Patents
Wide-range dynamic voltage measuring circuit and method Download PDFInfo
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- CN106249040B CN106249040B CN201610695597.5A CN201610695597A CN106249040B CN 106249040 B CN106249040 B CN 106249040B CN 201610695597 A CN201610695597 A CN 201610695597A CN 106249040 B CN106249040 B CN 106249040B
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- 238000005070 sampling Methods 0.000 abstract description 4
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- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
- G01R19/257—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques using analogue/digital converters of the type with comparison of different reference values with the value of voltage or current, e.g. using step-by-step method
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Abstract
The invention discloses a wide-range dynamic voltage measuring circuit and method, which comprises a reference voltage generating circuit, a microprocessor and a comparator, wherein the microprocessor is connected with the comparator and the reference voltage generating circuit and is used for monitoring the output end output of the comparatorAnd the level is changed and the reference voltage value output by the reference voltage generating circuit is controlled until the output level of the output end of the comparator is inverted. By adopting the technical scheme of the invention, the feedback resistance ratio adjustment of the power chip is realized by programming the digital resistor, so that the control of the reference voltage value is realized. The microprocessor mainly completes the sampling of the output value of the comparator and utilizes I 2 C communicates data with the digital resistor and quickly adjusts the resistance value. The characteristic that the output voltage value of the switch voltage can achieve wide-range voltage adjustment is utilized, wide-range detection of the voltage signal to be detected is achieved, and the voltage detection device can be used for dynamically detecting voltage with a large change range without an analog-digital converter.
Description
Technical Field
The invention relates to the field of voltage measurement, in particular to a wide-range dynamic voltage measurement circuit and method.
Background
In a voltage measuring circuit, an analog-to-digital converter (a/D) is generally used, but its reference voltage is often small, it is difficult to measure some higher voltages, and if a separate a/D module is used, its cost is greatly increased. The measurement of the high voltage is usually detected by a resistor voltage division method, but the accuracy of the resistor itself may reduce the detection result, and the sampling accuracy may be reduced when the voltage is changed from the high voltage to the low voltage. Resistive voltage division detection has difficulty sampling widely varying voltages.
Therefore, it is necessary to provide a solution to the above-mentioned drawbacks in the prior art.
Disclosure of Invention
The invention aims to provide a voltage measuring circuit and a voltage measuring method for a wide range of voltages without an analog-digital converter.
In order to solve the problems in the prior art, the technical scheme of the invention is as follows: .
The wide-range dynamic voltage measuring circuit comprises a reference voltage generating circuit, a microprocessor and a comparator, wherein the input end of the reference voltage generating circuit is connected with an input power supply Vi, the output end of the reference voltage generating circuit outputs reference voltage and is connected with the first comparison input end of the comparator, the second comparison input end of the comparator is connected with a measured voltage signal V d The microprocessor is connected with the comparator and the reference voltage generating circuit and is used for monitoring the output level change of the output end of the comparator and controlling the reference voltage value output by the reference voltage generating circuit until the output level of the output end of the comparator is inverted;
the reference voltage generating circuit comprises a first capacitor, a second capacitor, a first resistor, a switching power supply chip, a digital resistor, a first inductor, a third capacitor and a fourth capacitor;
the microprocessor and the digital resistor are connected through I 2 The bus C carries out data communication, and the microprocessor controls the resistance value of the digital resistor so as to control the reference voltage value output by the reference voltage generating circuit;
the input power supply Vi port is connected with one end of a first capacitor, one end of a second capacitor and a VI pin of a switching power supply chip, and the other end of the first capacitor and the other end of the second capacitor are grounded; one end of the first resistor is connected with an FB pin of the switching power supply chip and an RL0 pin of the digital resistor, and the other end of the first resistor is grounded; a GND pin of the switching power supply chip is grounded, and an OUT pin of the switching power supply chip is connected with one end of the first inductor; the RH end of the digital resistor is connected with the other end of the first inductor, one end of the third capacitor, one end of the fourth capacitor and the first comparison input end of the comparator, the SDA pin of the digital resistor is connected with the SDA pin of the microcontroller, and the SCL pin of the digital resistor is connected with the SCL pin of the microcontroller; the other end of the third capacitor and the other end of the fourth capacitor are grounded; the output end of the comparator is connected with the I/O end of the microcontroller, and the second comparison input end of the comparator is connected with the voltage signal V to be measured d Connecting; one end of the fifth capacitor and a VCC pin of the comparator are connected with an input power supply Vi, and the other end of the fifth capacitor is grounded.
Preferably, the switching power supply chip adopts a BUCK chip LM 2596-adj.
Preferably, the digital resistor is a chip X9241.
The invention also discloses a wide-range dynamic voltage measuring method, which comprises the following steps:
inputting a reference voltage generated by a reference voltage generating circuit into a first comparison input end of a comparator;
will be measured the voltage signal V d A second comparison input terminal of the input comparator;
monitoring output level change of an output end of the comparator through a microprocessor;
the microprocessor controls a digital rheostat in the reference voltage generating circuit to change the reference voltage value;
when the output level of the output end of the comparator is inverted, the microcontroller acquires the resistance value of the digital rheostat and calculates the voltage signal V to be measured according to the resistance value of the digital rheostat d The value of the voltage.
Preferably, an input end of the reference voltage generating circuit is connected to an input power Vi, an output end of the reference voltage generating circuit outputs a reference voltage and is connected to a first comparing input end of the comparator, and a second comparing input end of the comparator is connected to the voltage signal V to be measured d Are connected.
Preferably, the reference voltage generating circuit includes a first capacitor, a second capacitor, a first resistor, a switching power supply chip, a digital resistor, a first inductor, a third capacitor, and a fourth capacitor;
the input power supply Vi port is connected with one end of a first capacitor, one end of a second capacitor and a VI pin of a switching power supply chip, and the other end of the first capacitor and the other end of the second capacitor are grounded; one end of the first resistor is connected with an FB pin of the switching power supply chip and an RL0 pin of the digital resistor, and the other end of the first resistor is grounded; a GND pin of the switching power supply chip is grounded, and an OUT pin of the switching power supply chip is connected with one end of the first inductor; the RH end of the digital resistor is connected with the other end of the first inductor, one end of the third capacitor, one end of the fourth capacitor and the first comparison input end of the comparator, the SDA pin of the digital resistor is connected with the SDA pin of the microcontroller, and the SCL pin of the digital resistor is connected with the SCL pin of the microcontroller; the other end of the third capacitor and the other end of the fourth capacitor are grounded; the output end of the comparator is connected with the I/O end of the microcontroller, and the second comparison input end of the comparator is connected with the voltage signal V to be measured d Connecting; one end of the fifth capacitor and a VCC pin of the comparator are connected with an input power supply Vi, and the other end of the fifth capacitor is grounded.
By adopting the technical scheme of the invention, the feedback resistance ratio adjustment of the power supply chip is realized by programming the digital resistor, thereby realizing the reference voltageAnd (4) controlling the value. The microprocessor mainly completes the sampling of the output value of the comparator and utilizes I 2 C communicates data with the digital resistor and quickly adjusts the resistance value. The characteristic that the output voltage value of the switch voltage can be adjusted in a wide voltage range is utilized, the wide-range detection of the voltage signal to be detected is realized, the dynamic detection can be carried out on the voltage with a large change range, and an analog-digital converter is not needed.
Drawings
FIG. 1 is a schematic block diagram of a wide range dynamic voltage measurement circuit of the present invention.
FIG. 2 is a circuit schematic of the wide range dynamic voltage measurement circuit of the present invention.
FIG. 3 is a schematic diagram of a BUCK chip LM2596-adj structure adopted in the invention.
Fig. 4 is a schematic diagram of the structure of a digital resistor X9241 employed in the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and do not limit the invention.
The invention is described below with reference to the accompanying drawings and examples.
Referring to fig. 1, the schematic block diagram of the wide-range dynamic voltage measuring circuit of the present invention includes a reference voltage generating circuit, a microprocessor and a comparator, wherein an input terminal of the reference voltage generating circuit is connected to an input power Vi, an output terminal thereof outputs a reference voltage and is connected to a first comparing input terminal of the comparator, a second comparing input terminal of the comparator is connected to a measured voltage signal V d And the microprocessor is connected with the comparator and the reference voltage generating circuit and is used for monitoring the output level change of the output end of the comparator and controlling the reference voltage value output by the reference voltage generating circuit until the output level of the output end of the comparator is inverted.
Referring to fig. 2, a schematic circuit diagram of a wide-range dynamic voltage measuring circuit according to the present invention is shown, wherein the reference voltage generating circuit includes a first capacitor 1, a second capacitor 2, a first resistor 3, a switching power supply chip 5, a digital resistor 6, a first inductor 7, a third capacitor 8, and a fourth capacitor 9;
the input power supply Vi port is connected with one end of a first capacitor 1, one end of a second capacitor 2 and a VI pin of a switching power supply chip 5, and the other end of the first capacitor 1 and the other end of the second capacitor 2 are grounded; one end of the first resistor 3 is connected with an FB pin of the switching power supply chip 5 and an RL0 pin of the digital resistor 6, and the other end of the first resistor 3 is grounded; a GND pin of the switching power supply chip 5 is grounded, and an OUT pin of the switching power supply chip 5 is connected with one end of the first inductor 7; an RH end of the digital resistor 6 is connected with the other end of the first inductor 7, one end of the third capacitor 8, one end of the fourth capacitor 9 and a first comparison input end of the comparator 10, an SDA pin of the digital resistor 6 is connected with an SDA pin of the microcontroller, and an SCL pin of the digital resistor 6 is connected with an SCL pin of the microcontroller; the other end of the third capacitor 8 and the other end of the fourth capacitor 9 are grounded; the output end of the comparator 10 is connected with the I/O end of the microcontroller, and the second comparison input end of the comparator 10 is connected with the measured voltage signal V d Connecting; one end of the fifth capacitor 11 and the VCC pin of the comparator 10 are connected to the input power Vi, and the other end of the fifth capacitor 11 is grounded.
In the above circuit, the voltage signal V to be measured d Connected to the second comparison input of the comparator, a reference voltage V ref And the output end of the comparator is connected with a detection pin 1 of the microcontroller. Therefore, it can be seen that when the voltage of the output terminal of the comparator jumps, the reference voltage V is explained ref With the voltage signal V to be measured d The voltage values of (a) are similar. The reference voltage generating circuit is generated by a DC/DC switching power supply, wherein the switching power supply can adopt a BOOST type or a BUCK type, the output end of the switching power supply is connected with a pin 2 of a comparator, and the relation between a feedback resistor R1 and a digital resistor is adjusted through the fixed relation of the voltage value of a pin FB of the switching power supply, so that the output voltage value of the switching power supply, namely the reference voltage V can be changed ref The voltage value of (2).
In one example of the invention, the DC/DC switching power supply adopts a BUCK chip
LM2596-adj, its output voltage regulation range is in 1.23V-37V, so can be used for measuring the voltage in this range. The internal structure of LM2596-adj is shown in FIG. 3, the reference voltage of the internal error amplifier is 1.23V, and the output voltage value of the switching power supply is as follows:
V out ＝(1+R f /R 1 )×V ref
the resistor R1 is a fixed resistor f With a digital resistor, the function of changing the output voltage can be achieved by changing the ratio of the digital resistor to the resistance R1. The digital resistor is X9241, the structure of which is shown in figure 4, and the digital resistor is a monolithic CMOS integrated circuit with 4 digital control potentiometers, and each digital potentiometer is formed by connecting 63 resistors in series. Each digital potentiometer is controlled by 3 pins, namely RW, RL and RH, wherein RW is a slidable end of the potentiometer and is used for adjusting the resistance value of the potentiometer. By cascading 4 potentiometers, a resistance value of 4 times that of a single potentiometer can be obtained, as shown in fig. 4. The digital resistor X9241 has 4 address pins and can be used in combination with multiple digital resistors to extend the range of measurement. Through I 2 C bus protocol communicates with microcontroller I 2 The C bus rate can reach 1Mb/s at most, and the dynamic detection of general voltage can be met.
The comparator output is pull-up resistance processed and connected to the detection pin of the microprocessor, which is set to edge-triggered, in this example, to falling edge-triggered. And (4) designing software by adopting a successive incremental method. First, a reference voltage V is set ref Is set as V max Then the reference voltage V ref With the voltage signal V to be measured d Making a comparison if the reference voltage V ref Greater than the voltage signal V to be measured d Then set the reference voltage to V max If the reference voltage V ref Is still larger than the measured voltage signal V d Then set the reference voltage to V max 4, continuing the comparison if the reference voltage V is present ref Less than the voltage signal V to be measured d Then the measured voltage signal V can be obtained d Has a range of (V) max /4，V max And/2), detecting the equivalent change of the reference voltage until the equivalent change is within a reasonable range, and triggering the output end of the comparator to invert the level.
The invention also discloses a wide-range dynamic voltage measuring method, which comprises the following steps:
inputting a reference voltage generated by a reference voltage generating circuit into a first comparison input terminal of a comparator;
will be measured the voltage signal V d A second comparison input terminal of the input comparator;
monitoring output level change of an output end of the comparator through a microprocessor;
the microprocessor controls a digital rheostat in the reference voltage generating circuit to change the reference voltage value;
when the output level of the output end of the comparator is inverted, the microcontroller acquires the resistance value of the digital rheostat and calculates the voltage signal V to be measured according to the resistance value of the digital rheostat d The value of the voltage.
The invention aims to solve the technical problem of providing a wide-range dynamic voltage measurement method for an application circuit, and has the innovation point that a voltage comparator is adopted in a detection mode, and a measured voltage signal V is utilized d And a reference voltage V ref The result of the comparison between the two is known by the result of the voltage jump output by the comparator d At a voltage value of V, at this time d Is equal to V ref . The output voltage of the switching power supply is regulated in a wide range by utilizing the ratio relation of feedback resistors and the condition that the voltage of a feedback pin is fixed in a feedback loop of the switching power supply, and the output voltage value and the voltage V of the switching power supply are regulated ref Are connected. The microcontroller programs the digital resistor to change the ratio of the resistance of the digital resistor to the feedback resistance of the switching power supply, so as to realize the regulation function, and the microcontroller and the digital resistor pass through I 2 And the C bus carries out communication, thereby realizing the function of dynamic adjustment.
The above-mentioned embodiments are merely illustrative of the present invention, not restrictive, and any invention which does not depart from the spirit and scope of the present invention will fall within the protection scope of the present invention.
Claims (5)
1. The wide-range dynamic voltage measuring circuit is characterized by comprising a reference voltage generating circuit, a microprocessor and a comparator, wherein the input end of the reference voltage generating circuit is connected with an input power supply Vi, the output end of the reference voltage generating circuit outputs reference voltage and is connected with a first comparison input end of the comparator, and a second comparison input end of the comparator is connected with a measured voltage signal V d The microprocessor is connected with the comparator and the reference voltage generating circuit and is used for monitoring the output level change of the output end of the comparator and controlling the reference voltage value output by the reference voltage generating circuit until the output level of the output end of the comparator is reversed;
the reference voltage generation circuit comprises a first capacitor (1), a second capacitor (2), a first resistor (3), a switching power supply chip (5), a digital resistor (6), a first inductor (7), a third capacitor (8) and a fourth capacitor (9);
between the microprocessor and the digital resistor (6) via I 2 The bus C carries out data communication, and the microprocessor controls the resistance value of the digital resistor (6) so as to control the reference voltage value output by the reference voltage generating circuit;
the input power supply Vi port is connected with one end of a first capacitor (1), one end of a second capacitor (2) and a VI pin of a switch power supply chip (5), and the other end of the first capacitor (1) and the other end of the second capacitor (2) are grounded; one end of the first resistor (3) is connected with an FB pin of the switching power supply chip (5) and an RL0 pin of the digital resistor (6), and the other end of the first resistor (3) is grounded; a GND pin of the switching power supply chip (5) is grounded, and an OUT pin of the switching power supply chip (5) is connected with one end of the first inductor (7); the RH end of the digital resistor (6) and the other end of the first inductor (7), one end of the third capacitor (8) and one end of the fourth capacitor (9)The first comparison input end of the comparator (10) is connected, the SDA pin of the digital resistor (6) is connected with the SDA pin of the microcontroller, and the SCL pin of the digital resistor (6) is connected with the SCL pin of the microcontroller; the other end of the third capacitor (8) and the other end of the fourth capacitor (9) are grounded; the output end of the comparator (10) is connected with the I/O end of the microcontroller, and the second comparison input end of the comparator (10) is connected with the voltage signal V to be measured d Connecting; one end of a fifth capacitor (11) and a VCC pin of the comparator (10) are connected with an input power supply Vi, and the other end of the fifth capacitor (11) is grounded;
the switching power supply chip (5) adopts a BUCK chip LM 2596-adj.
2. The wide range dynamic voltage measurement circuit of claim 1, wherein the digital resistor (6) is implemented as a chip X9241.
3. A wide-range dynamic voltage measurement method, comprising the steps of:
inputting a reference voltage generated by a reference voltage generating circuit into a first comparison input end of a comparator;
will be measured the voltage signal V d A second comparison input terminal of the input comparator;
monitoring output level change of an output end of the comparator through a microprocessor;
the microprocessor controls a digital rheostat in the reference voltage generating circuit to change the reference voltage value;
when the output level of the output end of the comparator is inverted, the microcontroller acquires the resistance value of the digital rheostat and calculates the voltage signal V to be measured according to the resistance value of the digital rheostat d The value of the voltage.
4. The wide-range dynamic voltage measuring method of claim 3, wherein the reference voltage generating circuit has an input terminal connected to an input power source Vi, and an output terminal outputting a reference voltage and connected to the first comparison input terminal of the comparatorConnected with the second comparison input end of the comparator and the voltage signal V to be measured d Are connected.
5. The wide-range dynamic voltage measurement method according to claim 3, wherein the reference voltage generation circuit comprises a first capacitance (1), a second capacitance (2), a first resistance (3), a switching power supply chip (5), a digital resistor (6), a first inductance (7), a third capacitance (8), and a fourth capacitance (9);
the input power supply Vi port is connected with one end of a first capacitor (1), one end of a second capacitor (2) and a VI pin of a switching power supply chip (5), and the other end of the first capacitor (1) and the other end of the second capacitor (2) are grounded; one end of the first resistor (3) is connected with an FB pin of the switching power supply chip (5) and an RL0 pin of the digital resistor (6), and the other end of the first resistor (3) is grounded; a GND pin of the switching power supply chip (5) is grounded, and an OUT pin of the switching power supply chip (5) is connected with one end of the first inductor (7); an RH end of the digital resistor (6) is connected with the other end of the first inductor (7), one end of the third capacitor (8), one end of the fourth capacitor (9) and a first comparison input end of the comparator (10), an SDA pin of the digital resistor (6) is connected with an SDA pin of the microcontroller, and an SCL pin of the digital resistor (6) is connected with an SCL pin of the microcontroller; the other end of the third capacitor (8) and the other end of the fourth capacitor (9) are grounded; the output end of the comparator (10) is connected with the I/O end of the microcontroller, and the second comparison input end of the comparator (10) is connected with the voltage signal V to be measured d Connecting; one end of the fifth capacitor (11) and a VCC pin of the comparator (10) are connected with an input power supply Vi, and the other end of the fifth capacitor (11) is grounded.
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| CN113324651B (en) * | 2021-05-13 | 2024-03-15 | 浙江威星智能仪表股份有限公司 | Photoelectric signal sampling circuit based on digital resistor and configuration method thereof |
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| US6011992A (en) * | 1996-05-09 | 2000-01-04 | Church Of Spirtual Technology | System for measuring and indicating changes in the resistance of a living body |
| US6545613B1 (en) * | 1998-11-25 | 2003-04-08 | Kelsey-Hayes Company | Circuit for compensation of a transducer output signal |
| CN102539990A (en) * | 2010-12-28 | 2012-07-04 | 鸿富锦精密工业（深圳）有限公司 | Capacitor short circuit detecting circuit |
| US9086439B2 (en) * | 2011-02-25 | 2015-07-21 | Maxim Integrated Products, Inc. | Circuits, devices and methods having pipelined capacitance sensing |
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Effective date of registration: 20240326 Address after: No. 12 Lanxia Road, Industrial Concentration Zone, Moling Street, Jiangning District, Nanjing City, Jiangsu Province, 211100 Patentee after: Jiangsu Zhonghuo Sensing Technology Co.,Ltd. Country or region after: China Address before: 325300 No. 376 Construction Road, Dayan Town, Wencheng County, Wenzhou City, Zhejiang Province Patentee before: Wu Wenwen Country or region before: China |