CN106165097A - 用于小面积数字soc的自适应标准单元架构和布局技术 - Google Patents

用于小面积数字soc的自适应标准单元架构和布局技术 Download PDF

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Publication number
CN106165097A
CN106165097A CN201580019576.5A CN201580019576A CN106165097A CN 106165097 A CN106165097 A CN 106165097A CN 201580019576 A CN201580019576 A CN 201580019576A CN 106165097 A CN106165097 A CN 106165097A
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CN
China
Prior art keywords
power rail
metal
voltage
level
interconnects
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201580019576.5A
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English (en)
Chinese (zh)
Inventor
J·M·沙阿
K·麦迪赛蒂
V·兰加纳
A·达塔
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Qualcomm Inc
Original Assignee
Qualcomm Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Qualcomm Inc filed Critical Qualcomm Inc
Publication of CN106165097A publication Critical patent/CN106165097A/zh
Pending legal-status Critical Current

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Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D89/00Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
    • H10D89/10Integrated device layouts
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/90Masterslice integrated circuits
    • H10D84/903Masterslice integrated circuits comprising field effect technology
    • H10D84/907CMOS gate arrays
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/90Masterslice integrated circuits
    • H10D84/903Masterslice integrated circuits comprising field effect technology
    • H10D84/907CMOS gate arrays
    • H10D84/968Macro-architecture
    • H10D84/974Layout specifications, i.e. inner core regions
    • H10D84/981Power supply lines
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W20/00Interconnections in chips, wafers or substrates
    • H10W20/40Interconnections external to wafers or substrates, e.g. back-end-of-line [BEOL] metallisations or vias connecting to gate electrodes
    • H10W20/41Interconnections external to wafers or substrates, e.g. back-end-of-line [BEOL] metallisations or vias connecting to gate electrodes characterised by their conductive parts
    • H10W20/427Power or ground buses

Landscapes

  • Design And Manufacture Of Integrated Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
CN201580019576.5A 2014-05-01 2015-03-16 用于小面积数字soc的自适应标准单元架构和布局技术 Pending CN106165097A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US14/267,888 2014-05-01
US14/267,888 US9070552B1 (en) 2014-05-01 2014-05-01 Adaptive standard cell architecture and layout techniques for low area digital SoC
PCT/US2015/020730 WO2015167679A1 (en) 2014-05-01 2015-03-16 Adaptive standard cell architecture and layout techniques for low area digital soc

Publications (1)

Publication Number Publication Date
CN106165097A true CN106165097A (zh) 2016-11-23

Family

ID=53268859

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201580019576.5A Pending CN106165097A (zh) 2014-05-01 2015-03-16 用于小面积数字soc的自适应标准单元架构和布局技术

Country Status (7)

Country Link
US (1) US9070552B1 (https=)
EP (1) EP3138129A1 (https=)
JP (1) JP2017517143A (https=)
KR (1) KR20170002398A (https=)
CN (1) CN106165097A (https=)
BR (1) BR112016025414A2 (https=)
WO (1) WO2015167679A1 (https=)

Cited By (1)

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CN112086432A (zh) * 2016-12-28 2020-12-15 高通股份有限公司 用于高性能标准单元的多过孔结构

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KR20160136715A (ko) * 2015-05-20 2016-11-30 삼성전자주식회사 반도체 장치 및 그 제조 방법
US9935100B2 (en) * 2015-11-09 2018-04-03 Qualcomm Incorporated Power rail inbound middle of line (MOL) routing
KR20170059364A (ko) * 2015-11-19 2017-05-30 삼성전자주식회사 반도체 소자 및 이의 제조 방법
US10541243B2 (en) 2015-11-19 2020-01-21 Samsung Electronics Co., Ltd. Semiconductor device including a gate electrode and a conductive structure
US9634026B1 (en) * 2016-07-13 2017-04-25 Qualcomm Incorporated Standard cell architecture for reduced leakage current and improved decoupling capacitance
US10090244B2 (en) 2016-07-27 2018-10-02 Qualcomm Incorporated Standard cell circuits employing high aspect ratio voltage rails for reduced resistance
US10605859B2 (en) * 2016-09-14 2020-03-31 Qualcomm Incorporated Visible alignment markers/landmarks for CAD-to-silicon backside image alignment
KR102678555B1 (ko) 2016-10-05 2024-06-26 삼성전자주식회사 변형 셀을 포함하는 집적 회로 및 그 설계 방법
US10784198B2 (en) * 2017-03-20 2020-09-22 Samsung Electronics Co., Ltd. Power rail for standard cell block
US10811357B2 (en) 2017-04-11 2020-10-20 Samsung Electronics Co., Ltd. Standard cell and an integrated circuit including the same
US9978682B1 (en) * 2017-04-13 2018-05-22 Qualcomm Incorporated Complementary metal oxide semiconductor (CMOS) standard cell circuits employing metal lines in a first metal layer used for routing, and related methods
US10692808B2 (en) 2017-09-18 2020-06-23 Qualcomm Incorporated High performance cell design in a technology with high density metal routing
US10867102B2 (en) * 2018-06-28 2020-12-15 Taiwan Semiconductor Manufacturing Company, Ltd. Inverted pitch IC structure, layout method, and system
JP7426547B2 (ja) * 2018-10-29 2024-02-02 東京エレクトロン株式会社 半導体素子のモノリシック3d集積を行うためのアーキテクチャ
US11710733B2 (en) * 2020-03-03 2023-07-25 Qualcomm Incorporated Vertical power grid standard cell architecture
US11290109B1 (en) * 2020-09-23 2022-03-29 Qualcomm Incorporated Multibit multi-height cell to improve pin accessibility
US11929325B2 (en) * 2021-08-18 2024-03-12 Qualcomm Incorporated Mixed pitch track pattern
US20250336824A1 (en) * 2024-04-26 2025-10-30 Samsung Electronics Co., Ltd. Semiconductor device

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US20130074029A1 (en) * 2011-09-19 2013-03-21 Texas Instruments Incorporated Method To Ensure Double Patterning Technology Compliance In Standard Cells
WO2013161249A1 (ja) * 2012-04-24 2013-10-31 パナソニック株式会社 半導体装置

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JPH06120224A (ja) * 1992-09-30 1994-04-28 Nec Ic Microcomput Syst Ltd 半導体集積回路
US6502231B1 (en) 2001-05-31 2002-12-31 Applied Micro Circuits Corporation Integrated circuit template cell system and method
JP2006196872A (ja) * 2004-12-17 2006-07-27 Matsushita Electric Ind Co Ltd 標準セル、標準セルライブラリ、半導体装置、及びその配置方法
JP2007066974A (ja) * 2005-08-29 2007-03-15 Matsushita Electric Ind Co Ltd 半導体集積回路および半導体集積回路のレイアウト方法
US7989849B2 (en) 2006-11-15 2011-08-02 Synopsys, Inc. Apparatuses and methods for efficient power rail structures for cell libraries
TWI376615B (en) * 2008-01-30 2012-11-11 Realtek Semiconductor Corp Power mesh managing method utilized in an integrated circuit
KR101394145B1 (ko) * 2008-02-26 2014-05-16 삼성전자주식회사 스탠다드 셀 라이브러리 및 집적 회로
JP5552775B2 (ja) * 2009-08-28 2014-07-16 ソニー株式会社 半導体集積回路
US8421205B2 (en) * 2010-05-06 2013-04-16 Taiwan Semiconductor Manufacturing Company, Ltd. Power layout for integrated circuits
US8742464B2 (en) * 2011-03-03 2014-06-03 Synopsys, Inc. Power routing in standard cells
US8513978B2 (en) 2011-03-30 2013-08-20 Synopsys, Inc. Power routing in standard cell designs
US8694945B2 (en) 2011-12-20 2014-04-08 Taiwan Semiconductor Manufacturing Co., Ltd. Automatic place and route method for electromigration tolerant power distribution

Patent Citations (2)

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Publication number Priority date Publication date Assignee Title
US20130074029A1 (en) * 2011-09-19 2013-03-21 Texas Instruments Incorporated Method To Ensure Double Patterning Technology Compliance In Standard Cells
WO2013161249A1 (ja) * 2012-04-24 2013-10-31 パナソニック株式会社 半導体装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112086432A (zh) * 2016-12-28 2020-12-15 高通股份有限公司 用于高性能标准单元的多过孔结构
CN112086432B (zh) * 2016-12-28 2024-10-01 高通股份有限公司 用于高性能标准单元的多过孔结构

Also Published As

Publication number Publication date
WO2015167679A1 (en) 2015-11-05
US9070552B1 (en) 2015-06-30
BR112016025414A2 (pt) 2017-08-15
EP3138129A1 (en) 2017-03-08
JP2017517143A (ja) 2017-06-22
KR20170002398A (ko) 2017-01-06

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Application publication date: 20161123

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