CN106160883A - A kind of RF transceiver Auto-Test System - Google Patents
A kind of RF transceiver Auto-Test System Download PDFInfo
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- CN106160883A CN106160883A CN201510140316.5A CN201510140316A CN106160883A CN 106160883 A CN106160883 A CN 106160883A CN 201510140316 A CN201510140316 A CN 201510140316A CN 106160883 A CN106160883 A CN 106160883A
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Abstract
The present invention relates to a kind of RF transceiver Auto-Test System, including radio-frequency modulator, power amplifier, frequency divider, digital/analog converter, test controller and frequency counter, the analogue signal of transceiver is input in radio-frequency modulator, the outfan of radio-frequency modulator connects power amplifier, the outfan of power amplifier and the outfan of digital/analog converter connect the input of comparator respectively, the outfan of comparator connects the input of frequency divider, the outfan rate of connections enumerator of frequency divider, test controller connects frequency divider by configurable frequency dividing depositor, test controller connects digital/analog converter by configurable threshold registers, test controller is also connected with radio-frequency modulator.The present invention has been internally embedded an extra frequency divider at device, and to process the radiofrequency signal that the emitting portion of transceiver exports, this makes the cost measuring radiofrequency signal output frequency the lowest, improves efficiency the most also to the test job of RF transceiver.
Description
Technical field
The present invention relates to test systems technology field, be specifically related to a kind of RF transceiver Auto-Test System.
Background technology
Transceiver is a kind of device of signal conversion, and its quality is directly connected to the quality of signal conversion.Therefore,
Transceiver is tested one by one, is that manufacturing enterprise must work completely.In traditional testing scheme,
When detecting single transceiver module, need to employ the multi-section instrument such as energy meter, signal source, oscillograph every time；
And owing to transceiver has different characteristics at different frequency, therefore often switch a frequency, first will be manually
Arrange, calibrate the parameter of good each instrument, after recording result, again by manually calculating the correction number of correspondence
According to, then input it can be adjusted revising the data fixed interface through transmitting-receiving subassembly.This mode
Making preliminary preparation amount big, test, trimming process are the most loaded down with trivial details.Meanwhile, the radio frequency operation of transceiver
Frequency is the highest, when analyzing test problem, can bring about the new problem that cannot quantify.
Summary of the invention
It is an object of the invention to: for above-mentioned technical problem present in prior art, it is provided that a kind of radio frequency
Transceiver Auto-Test System.
The present invention is achieved by the following technical solutions:
A kind of RF transceiver Auto-Test System, including radio-frequency modulator, power amplifier, frequency divider,
Digital/analog converter, test controller and frequency counter, be input to penetrate by the analogue signal of transceiver
In converting modulator, the outfan of radio-frequency modulator connects power amplifier, the outfan of described power amplifier
Outfan with digital/analog converter connects the input of comparator respectively, and the outfan of comparator connects
The input of frequency divider, the outfan rate of connections enumerator of frequency divider, described test controller is by joining
Putting frequency dividing depositor and connect frequency divider, test controller connects digital-to-analog by configurable threshold registers
Transducer, test controller is also connected with radio-frequency modulator.
As preferably, described test controller can with the audiofrequency spectrometer of different model, ammeter, signal source, make an uproar
Sound analyzer, energy meter connect.
As preferably, the test instrunment connected in described Auto-Test System, according to the automatic survey of transceiver
Examination information, test controller and RF transceiver are automatically performed test data collection, result judges, data are deposited
Storage, test report generate operation.
In sum, owing to have employed technique scheme, the invention has the beneficial effects as follows:
The present invention has been internally embedded an extra frequency divider, to process the emitter portion of transceiver at device
Dividing the radiofrequency signal of output, this makes the cost measuring radiofrequency signal output frequency the lowest, the most also gives radio frequency
The test job of transceiver improves efficiency.
Accompanying drawing explanation
Examples of the present invention will be described by way of reference to the accompanying drawings, wherein:
Fig. 1 is present configuration schematic diagram.
Detailed description of the invention
All features disclosed in this specification, or disclosed all methods or during step, except mutually
Beyond the feature repelled mutually and/or step, all can combine by any way.
Any feature disclosed in this specification (including any accessory claim, summary and accompanying drawing), removes
Non-specifically describes, all can be by other equivalences or have the alternative features of similar purpose and replaced.That is, unless
Narration especially, each feature is an example in a series of equivalence or similar characteristics.
As it is shown in figure 1, a kind of RF transceiver Auto-Test System, including radio-frequency modulator, power amplification
Device (PA), frequency divider, digital/analog converter (DAC), test controller and frequency counter, will
The analogue signal of transceiver is input in radio-frequency modulator, and the outfan of radio-frequency modulator connects power amplification
Device, the outfan of described power amplifier and the outfan of digital/analog converter connect comparator respectively
Input, the outfan of comparator connects the input of frequency divider, the outfan rate of connections counting of frequency divider
Device, described test controller connects frequency divider by configurable frequency dividing depositor, and test controller is by joining
Putting threshold registers and connect digital/analog converter, test controller is also connected with radio-frequency modulator.
Described test controller can with the audiofrequency spectrometer of different model, ammeter, signal source, SONOAN,
Energy meter connects, the test instrunment connected in described Auto-Test System, according to the automatic test of transceiver
Information, test controller and RF transceiver are automatically performed test data collection, result judges, data store,
Test report generates operation.
Particular embodiments described above, is entered the purpose of the present invention, technical scheme and beneficial effect
One step describes in detail, be it should be understood that the specific embodiment that the foregoing is only the present invention, not
For limiting the present invention.The present invention expands to any new feature disclosed in this manual or any new group
Close, and the arbitrary new method that discloses or the step of process or any new combination.
Claims (3)
1. a RF transceiver Auto-Test System, it is characterised in that include radio-frequency modulator, power amplification
Device, frequency divider, digital/analog converter, test controller and frequency counter, by the simulation of transceiver
Signal is input in radio-frequency modulator, and the outfan of radio-frequency modulator connects power amplifier, and described power is put
The big outfan of device and the outfan of digital/analog converter connect the input of comparator, comparator respectively
Outfan connect frequency divider input, the outfan rate of connections enumerator of frequency divider, described test control
Device processed connects frequency divider by configurable frequency dividing depositor, and test controller is by configurable threshold registers even
Connecing digital/analog converter, test controller is also connected with radio-frequency modulator.
2. a kind of RF transceiver Auto-Test System as claimed in claim 1, it is characterised in that described survey
Examination controller can be connected with the audiofrequency spectrometer of different model, ammeter, signal source, SONOAN, energy meter.
3. RF transceiver Auto-Test System as claimed in claim 1 a kind of, it is characterised in that described from
The test instrunment connected in dynamic test system, according to the information of automatically testing of transceiver, test controller and
RF transceiver is automatically performed test data collection, result judges, data store, test report generates operation.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510140316.5A CN106160883A (en) | 2015-03-27 | 2015-03-27 | A kind of RF transceiver Auto-Test System |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510140316.5A CN106160883A (en) | 2015-03-27 | 2015-03-27 | A kind of RF transceiver Auto-Test System |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN106160883A true CN106160883A (en) | 2016-11-23 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510140316.5A Pending CN106160883A (en) | 2015-03-27 | 2015-03-27 | A kind of RF transceiver Auto-Test System |
Country Status (1)
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| CN101881790A (en) * | 2010-06-25 | 2010-11-10 | 华中科技大学 | Intelligent electric power parameter tester |
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| CN102355259A (en) * | 2010-05-21 | 2012-02-15 | Nxp股份有限公司 | Integrated circuits with frequency generating circuits |
| US20120134403A1 (en) * | 2006-06-19 | 2012-05-31 | International Business Machines Corporation | Circuit and method for on-chip jitter measurement |
| CN102594451A (en) * | 2012-02-23 | 2012-07-18 | 深圳市新岸通讯技术有限公司 | Method and device for generating test signals |
| CN202818249U (en) * | 2011-10-12 | 2013-03-20 | 爱特梅尔公司 | RC oscillator apparatus and circuit |
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2015
- 2015-03-27 CN CN201510140316.5A patent/CN106160883A/en active Pending
Patent Citations (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5720046A (en) * | 1980-07-10 | 1982-02-02 | Nec Corp | Testing circuit of receiver |
| JPS62274914A (en) * | 1986-05-23 | 1987-11-28 | Fujitsu Ltd | Jitter generator |
| CN2147548Y (en) * | 1992-09-15 | 1993-11-24 | 四川大学 | Digital IC testing instrument and testing probe |
| CN1335677A (en) * | 2000-07-21 | 2002-02-13 | 日本电气株式会社 | Clock control method and electric circuit |
| CN1385692A (en) * | 2001-05-14 | 2002-12-18 | 中国石油化工股份有限公司 | Gamma ray test instrument |
| CN1399136A (en) * | 2002-08-08 | 2003-02-26 | 威盛电子股份有限公司 | Clock signal frequency verifying device and method |
| US20040148121A1 (en) * | 2003-01-17 | 2004-07-29 | Texas Instruments Incorporated | On-chip test mechanism for transceiver power amplifier and oscillator frequency |
| US20120134403A1 (en) * | 2006-06-19 | 2012-05-31 | International Business Machines Corporation | Circuit and method for on-chip jitter measurement |
| CN102317803A (en) * | 2008-07-09 | 2012-01-11 | 爱德万测试株式会社 | Testing device, testing method, and phase shifter |
| CN101640535A (en) * | 2008-07-30 | 2010-02-03 | 恩益禧电子股份有限公司 | PLL circuit, communication device, and loopback test method of communication device |
| CN101995542A (en) * | 2009-08-03 | 2011-03-30 | 瑞萨电子株式会社 | Semiconductor integrated circuit test device |
| CN102355259A (en) * | 2010-05-21 | 2012-02-15 | Nxp股份有限公司 | Integrated circuits with frequency generating circuits |
| CN101881790A (en) * | 2010-06-25 | 2010-11-10 | 华中科技大学 | Intelligent electric power parameter tester |
| CN202818249U (en) * | 2011-10-12 | 2013-03-20 | 爱特梅尔公司 | RC oscillator apparatus and circuit |
| CN102594451A (en) * | 2012-02-23 | 2012-07-18 | 深圳市新岸通讯技术有限公司 | Method and device for generating test signals |
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Application publication date: 20161123 |