CN106124897A - Photoelectrical coupler can be carried out electricity aging test and the test system of parameter testing - Google Patents
Photoelectrical coupler can be carried out electricity aging test and the test system of parameter testing Download PDFInfo
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- CN106124897A CN106124897A CN201610540742.2A CN201610540742A CN106124897A CN 106124897 A CN106124897 A CN 106124897A CN 201610540742 A CN201610540742 A CN 201610540742A CN 106124897 A CN106124897 A CN 106124897A
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- aging
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
A kind of photoelectrical coupler can be carried out electricity aging test and the test system of parameter testing, be made up of PC, TCH test channel gating module, multiple aging circuit, multiple electrical parameter detection circuit and photoelectrical coupler plugboard；The method have the benefit that: providing and a kind of photoelectrical coupler can carry out electricity aging test and the test system of parameter testing, this test system can simplify test operation, improves testing efficiency.
Description
Technical field
The present invention relates to a kind of photoelectrical coupler Performance Testing Technology, particularly relating to one can carry out electricity to photoelectrical coupler
The test system of aging test and parameter testing.
Background technology
Photoelectrical coupler is a kind of to apply quite varied device, after photoelectrical coupler completes, needs light thermocouple
The performance parameter of clutch carries out quantitatively evaluating, to filter out substandard product, it is ensured that product quality；Screening process is typically by electricity
Aging test and two projects of parameter testing complete.
In prior art, the two independent devices of set are generally used to carry out electricity aging test and parameter testing respectively, specifically
During operation, the most first photoelectrical coupler is arranged on electricity ageing platform and carries out electricity aging test, after electricity aging test completes, then
Photoelectrical coupler takes off and is arranged on the test of parameter detection device enterprising line parameter；Owing to same batch needs large number of
Photoelectrical coupler test, the disassembling operations of photoelectrical coupler is cumbersome, most importantly, due to the two process
Independence, electricity aging test during, lack real-time parameter monitoring means, it is impossible to get in real time electricity aging test during
The operational factor of device.
Summary of the invention
For the problem in background technology, the present invention proposes one can carry out electricity aging test and ginseng to photoelectrical coupler
Number test test systems, its innovation is: described test system by PC, TCH test channel gating module, multiple aging circuit,
Multiple electrical parameter detection circuit and photoelectrical coupler plugboard composition；It is provided with multiple socket on described photoelectrical coupler plugboard,
Described socket is used for grafting photoelectrical coupler to be measured；The quantity of aging circuit and socket quantity Matching, the number of electrical parameter detection circuit
Measure identical with the quantity of aging circuit；
PC is connected with TCH test channel gating module, TCH test channel gating module respectively with multiple sockets, multiple aging circuit and
Multiple electrical parameter detection circuit connect；
Socket can be gated to aging circuit or electrical parameter detection circuit, the gating operation phase of each socket by TCH test channel gating module
The most independent, non-interference；PC can control the action of TCH test channel gating module by software interface；
When a certain socket gates with a certain aging circuit, the photoelectrical coupler to be measured being plugged on socket can be entered by aging circuit
Row electricity aging test, in process of the test, PC can be by TCH test channel gating module extract real-time to photoelectrical coupler to be measured
Service data；
When a certain socket gates with a certain electrical parameter detection circuit, electrical parameter detection circuit can be to the photoelectricity to be measured being plugged on socket
Bonder carries out parameter testing, and in test process, PC can be by TCH test channel gating module extract real-time to smooth thermocouple to be measured
The detection data of clutch.
The principle of the present invention is: first, and the present invention passes through TCH test channel gating module by aging circuit and parameter detecting electricity
Road combines, and in test process, can control photoelectrical coupler in electricity aging test state and parameter testing state as required
Between switch, a set of test system can be achieved with electricity aging test and the detection of two kinds of projects of parameter testing, greatly simplified
During photoelectrical coupler product inspection, installing of device operates and tests building of device, and detection efficiency is higher；Secondly, electricity is old
In refining process of the test, PC can be treated the service data of light-metering electric coupler by TCH test channel gating module and supervise in real time
Surveying, beneficially technical staff pinpoints the problems in time and carries out correlation analysis.
On the basis of aforementioned schemes, inventor also proposed following preferred embodiment:
Described TCH test channel gating module is by main control module, decoding control circuit, main relay array, many height control module, many
Individual sub-relay array and multiple data collecting card composition；Described aging circuit or electrical parameter detection circuit are designated as testing circuit；
Described PC is connected with main control module and multiple data collecting card respectively, main control module respectively with decoding control circuit, master
Relay array and many height control module connect, and multiple data collecting cards are connected correspondingly with multiple test circuit, decoding
Control circuit is connected with multiple test circuit and multiple electric relay array respectively；Relay quantity in main relay array with
Test circuit quantity coupling；Single relay in main relay array is designated as relay one, relay one and test circuit
Power supply one_to_one corresponding, PC can be by the action of master control module controls main relay array, and main relay array can pass through relay
Device one controls the break-make testing between circuit and power supply accordingly；PC can moving by master control module controls decoding control circuit
Making, decoding control circuit can control to test circuit and the gating of electric relay array and disconnection；
Many height control module is connected correspondingly with multiple electric relay arrays, multiple electric relay arrays and multiple sockets one
One is corresponding；Relay quantity in single electric relay array and the pin jack quantity Matching on single socket；Electric relay
Single relay in array is designated as relay two, relay two and pin jack one_to_one corresponding, and PC can pass through main control module
The action of antithetical phrase control module is controlled, when decoding control circuit controls a certain test circuit and a certain electric relay array gating
After, sub-control module can control pin jack and the test circuit gating of correspondence by relay two.
After using aforesaid preferred version, it is possible not only to realize the technical purpose of the present invention, and can also be in test mode
During switching, Distributed Implementation switching action, such as, the photoelectrical coupler being plugged on a certain socket A first passes through aging circuit A and completes
Electric aging test, needs to continue it is carried out parameter testing, now, first pass through main relay array by aging circuit A and its
Power supply disconnects, and is gated the electric relay array of corresponding socket A to electrical parameter detection circuit A by decoding control circuit the most again,
The strobe state of pin jack is adjusted to the state (decoding control circuit mated with electrical parameter detection circuit A by electric relay array
Action with electric relay array synchronizes to carry out), the most again by main relay array by electrical parameter detection circuit A and corresponding electricity
Source is connected, the mode of this substep switching, power supply sudden change can be avoided to impact device, it is ensured that the accuracy of test.
Preferably, described aging circuit and photoelectrical coupler plugboard are placed in temperature control box.When carrying out electricity aging test, can
By temperature control box regulation aging circuit and the ambient temperature of photoelectrical coupler, thus realize high temperature aging test or the examination of low temperature ageing
Test.
Preferably, described main control module, decoding control circuit and main relay array are formed on same circuit board；Described
Son control module and corresponding electric relay array are formed on same circuit board；Polylith circuit board is stacked by a shelf layer and puts.
The method have the benefit that: provide one and photoelectrical coupler can be carried out electricity aging test and parameter survey
The test system of examination, this test system can simplify test operation, improves testing efficiency.
Accompanying drawing explanation
Fig. 1, the electronic schematic diagram of the present invention；
In figure title corresponding to each labelling be respectively as follows: TCH test channel gating module 1, aging circuit 2, electrical parameter detection circuit 3,
Photoelectrical coupler plugboard 4, PC PC.
Detailed description of the invention
A kind of photoelectrical coupler can be carried out electricity aging test and the test system of parameter testing, it is characterised in that: described
Test system is by PC PC, TCH test channel gating module 1, multiple aging circuit 2, multiple electrical parameter detection circuit 3 and photoelectric coupling
Device plugboard 4 forms；Being provided with multiple socket on described photoelectrical coupler plugboard 4, described socket is used for grafting photoelectricity to be measured
Bonder；The quantity of aging circuit 2 and socket quantity Matching, the quantity phase of the quantity of electrical parameter detection circuit 3 and aging circuit 2
With；
PC PC is connected with TCH test channel gating module 1, TCH test channel gating module 1 respectively with multiple sockets, multiple ageing electricity
Road 2 and multiple electrical parameter detection circuit 3 connect；
TCH test channel gating module 1 can be by socket gating to aging circuit 2 or electrical parameter detection circuit 3, the gating behaviour of each socket
Make separate, non-interference；PC PC can control the action of TCH test channel gating module 1 by software interface；
When a certain socket gates with a certain aging circuit 2, aging circuit 2 can be to the photoelectrical coupler to be measured being plugged on socket
Carrying out electricity aging test, in process of the test, PC can be by TCH test channel gating module 1 extract real-time to photoelectrical coupler to be measured
Service data；
When a certain socket gates with a certain electrical parameter detection circuit 3, electrical parameter detection circuit 3 can treat light-metering to be plugged on socket
Electric coupler carries out parameter testing, and in test process, PC PC can be by TCH test channel gating module 1 extract real-time to treating light-metering
The detection data of electric coupler.
Further, described TCH test channel gating module 1 is by main control module, decoding control circuit, main relay array, many
Height control module, multiple electric relay array and multiple data collecting card composition；Described aging circuit 2 or electrical parameter detection circuit 3
It is designated as testing circuit；
Described PC PC is connected with main control module and multiple data collecting card respectively, main control module respectively with decoding control circuit,
Main relay array and many height control module connect, and multiple data collecting cards are connected correspondingly with multiple test circuit, translate
Code control circuit is connected with multiple test circuit and multiple electric relay array respectively；Relay quantity in main relay array
Mate with test circuit quantity；Single relay in main relay array is designated as relay one, relay one and test circuit
Power supply one_to_one corresponding, PC can be by the action of master control module controls main relay array, and main relay array can pass through to continue
Electrical equipment one controls the break-make testing between circuit and power supply accordingly；PC can moving by master control module controls decoding control circuit
Making, decoding control circuit can control to test circuit and the gating of electric relay array and disconnection；
Many height control module is connected correspondingly with multiple electric relay arrays, multiple electric relay arrays and multiple sockets one
One is corresponding；Relay quantity in single electric relay array and the pin jack quantity Matching on single socket；Electric relay
Single relay in array is designated as relay two, relay two and pin jack one_to_one corresponding, and PC can pass through main control module
The action of antithetical phrase control module is controlled, when decoding control circuit controls a certain test circuit and a certain electric relay array gating
After, sub-control module can control pin jack and the test circuit gating of correspondence by relay two.
Further, described aging circuit 2 and photoelectrical coupler plugboard 4 are placed in temperature control box.
Further, described main control module, decoding control circuit and main relay array are formed on same circuit board；Institute
State sub-control module and corresponding electric relay array is formed on same circuit board；Polylith circuit board is stacked by a shelf layer
Put.
Claims (4)
1. one kind can carry out electricity aging test and the test system of parameter testing to photoelectrical coupler, it is characterised in that: described survey
Test system is by PC (PC), TCH test channel gating module (1), multiple aging circuit (2), multiple electrical parameter detection circuit (3) and light
Electric coupler plugboard (4) forms；Being provided with multiple socket on described photoelectrical coupler plugboard (4), described socket is used for inserting
Reception light-metering electric coupler；The quantity of aging circuit (2) and socket quantity Matching, the quantity of electrical parameter detection circuit (3) and ageing
The quantity of circuit (2) is identical；
PC (PC) is connected with TCH test channel gating module (1), TCH test channel gating module (1) respectively with multiple sockets, multiple
Aging circuit (2) and multiple electrical parameter detection circuit (3) connect；
Socket can be gated to aging circuit (2) or electrical parameter detection circuit (3) by TCH test channel gating module (1), each socket
Gating operation is separate, non-interference；PC (PC) can control the dynamic of TCH test channel gating module (1) by software interface
Make；
When a certain socket gates with a certain aging circuit (2), aging circuit (2) can be to the to be measured smooth thermocouple being plugged on socket
Clutch carries out electricity aging test, and in process of the test, PC can be by TCH test channel gating module (1) extract real-time to photoelectricity to be measured
The service data of bonder；
When a certain socket gates with a certain electrical parameter detection circuit (3), electrical parameter detection circuit (3) can be to treating of being plugged on socket
Light-metering electric coupler carries out parameter testing, and in test process, PC (PC) can pass through TCH test channel gating module (1) extract real-time
Detection data to photoelectrical coupler to be measured.
The most according to claim 1 photoelectrical coupler can be carried out electricity aging test and the test system of parameter testing, its
It is characterised by: described TCH test channel gating module (1) is by main control module, decoding control circuit, main relay array, the control of many height
Module, multiple electric relay array and multiple data collecting card composition；Described aging circuit (2) or electrical parameter detection circuit (3) note
For test circuit；
Described PC (PC) is connected with main control module and multiple data collecting card respectively, and main control module is electric with encoded control respectively
Road, main relay array and many height control module connect, and multiple data collecting cards are connected correspondingly with multiple test circuit,
Decoding control circuit is connected with multiple test circuit and multiple electric relay array respectively；Relay number in main relay array
Measure and mate with test circuit quantity；Single relay in main relay array is designated as relay one, relay one and test electricity
The power supply one_to_one corresponding on road, PC can be by the action of master control module controls main relay array, and main relay array can pass through
Relay one controls the break-make testing between circuit and power supply accordingly；PC can be by master control module controls decoding control circuit
Action, decoding control circuit can control to test circuit and the gating of electric relay array and disconnection；
Many height control module is connected correspondingly with multiple electric relay arrays, multiple electric relay arrays and multiple sockets one
One is corresponding；Relay quantity in single electric relay array and the pin jack quantity Matching on single socket；Electric relay
Single relay in array is designated as relay two, relay two and pin jack one_to_one corresponding, and PC can pass through main control module
The action of antithetical phrase control module is controlled, when decoding control circuit controls a certain test circuit and a certain electric relay array gating
After, sub-control module can control pin jack and the test circuit gating of correspondence by relay two.
The most according to claim 1 photoelectrical coupler can be carried out electricity aging test and the test system of parameter testing, its
It is characterised by: described aging circuit (2) and photoelectrical coupler plugboard (4) are placed in temperature control box.
The most according to claim 2 photoelectrical coupler can be carried out electricity aging test and the test system of parameter testing, its
It is characterised by: described main control module, decoding control circuit and main relay array are formed on same circuit board；Described sub-control mould
Block and corresponding electric relay array are formed on same circuit board；Polylith circuit board is stacked by a shelf layer and puts.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610540742.2A CN106124897B (en) | 2016-07-11 | 2016-07-11 | The test macro of electric aging test and parameter testing can be carried out to photoelectrical coupler |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610540742.2A CN106124897B (en) | 2016-07-11 | 2016-07-11 | The test macro of electric aging test and parameter testing can be carried out to photoelectrical coupler |
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| Publication Number | Publication Date |
|---|---|
| CN106124897A true CN106124897A (en) | 2016-11-16 |
| CN106124897B CN106124897B (en) | 2019-01-15 |
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|---|---|---|---|
| CN201610540742.2A Active CN106124897B (en) | 2016-07-11 | 2016-07-11 | The test macro of electric aging test and parameter testing can be carried out to photoelectrical coupler |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108572285A (en) * | 2018-03-26 | 2018-09-25 | 北京航空航天大学 | A kind of high speed photo coupling screening technique based on low-frequency broadband noise |
| CN110596432A (en) * | 2019-09-09 | 2019-12-20 | 武汉电信器件有限公司 | Test system for multidirectional photoelectric device |
| CN112230121A (en) * | 2020-10-13 | 2021-01-15 | 中国电子科技集团公司第四十四研究所 | High and low temperature test system for photoelectric coupler |
| CN113533898A (en) * | 2021-07-23 | 2021-10-22 | 中国振华集团永光电子有限公司（国营第八七三厂） | Batch photoelectric coupler aging circuit |
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| CN202261234U (en) * | 2011-09-21 | 2012-05-30 | 杭州三海电子有限公司 | Constant-current and constant-power burn-in circuit for photoelectric coupler |
| CN205103337U (en) * | 2015-10-30 | 2016-03-23 | 北京交控科技股份有限公司 | Opto -coupler test circuit board |
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| US4636725A (en) * | 1982-01-04 | 1987-01-13 | Artronics Corporation | Electronic burn-in system |
| CN2470954Y (en) * | 2001-02-28 | 2002-01-09 | 赵俊芳 | Dynamic testing apparatus for large-medium scale digital circuit |
| CN201673224U (en) * | 2010-05-24 | 2010-12-15 | 北京航天光华电子技术有限公司 | Intelligent surface-mounted optical coupling tester |
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108572285A (en) * | 2018-03-26 | 2018-09-25 | 北京航空航天大学 | A kind of high speed photo coupling screening technique based on low-frequency broadband noise |
| CN108572285B (en) * | 2018-03-26 | 2019-12-31 | 北京航空航天大学 | High-speed optocoupler screening method based on low-frequency broadband noise |
| CN110596432A (en) * | 2019-09-09 | 2019-12-20 | 武汉电信器件有限公司 | Test system for multidirectional photoelectric device |
| CN112230121A (en) * | 2020-10-13 | 2021-01-15 | 中国电子科技集团公司第四十四研究所 | High and low temperature test system for photoelectric coupler |
| CN113533898A (en) * | 2021-07-23 | 2021-10-22 | 中国振华集团永光电子有限公司（国营第八七三厂） | Batch photoelectric coupler aging circuit |
| CN113533898B (en) * | 2021-07-23 | 2023-07-14 | 中国振华集团永光电子有限公司（国营第八七三厂） | Aging circuit of batch photoelectric coupler |
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| Publication number | Publication date |
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| CN106124897B (en) | 2019-01-15 |
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