CN2470954Y - Dynamic testing apparatus for large-medium scale digital circuit - Google Patents
Dynamic testing apparatus for large-medium scale digital circuit Download PDFInfo
- Publication number
- CN2470954Y CN2470954Y CN 01204706 CN01204706U CN2470954Y CN 2470954 Y CN2470954 Y CN 2470954Y CN 01204706 CN01204706 CN 01204706 CN 01204706 U CN01204706 U CN 01204706U CN 2470954 Y CN2470954 Y CN 2470954Y
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- ageing
- general
- digital circuit
- power supply
- scale digital
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Abstract
A dynamic aging test device for medium-large scale digital circuit comprises a main cabinet and a control console formed by a computer and a CRT display. The inner structure adopts modularized design; the main cabinet has a side provided with a high/low temperature test cabinet, an upper layer arranged with a set of general aging units, and a lower layer arranged with a set of general control units and a set of program-controlled direct-current regulated power supply. The utility model has high practical value, and is a special device capable of simultaneously carrying out power dynamic aging and parameter testing to medium-large scale digital circuit.
Description
The utility model belongs to metering, detects the electric equipment field, specially refers to the dynamic ageing testing equipment for middle large scale digital circuit product.
For a long time, for middle large scale digital circuit product, as all kinds of TTL, CMOS, large scale digital circuit among HTL and the ECL, carry out the test of dynamic power ageing and online functional parameter, all carry out respectively, in dynamic ageing equipment and function, divide the operation of coming on the parameter testing instrument, therefore, in the work, need repeat the loading and unloading of device on the one hand, take great amount of manpower and time, on the other hand, owing to test again when separately under high low temperature, carrying out ageing and waiting by the time normal temperature, be temperature characterisitic difference that can't discriminator circuit and main form of invalidation such as parameter drift is big, the quantity that also is difficult to diagnostic products early failure, ratio and time distribute, thereby can't estimate becoming quality of lot.Concerning enterprise, this method of separately carrying out also can't realize dynamic power ageing and the online function and the parameter testing of advanced automation, just need a kind of equipment scheme that can realize functions of the equipments compatibility and extensibility of design for this reason, with versatility and testability is target, realizes dynamic power ageing and online function and parameter testing simultaneously.
The purpose of this utility model, be in prior art, to carry out the test of dynamic ageing and functional parameter respectively and cause can't differentiate defectives such as product failure form, quantity, thereby design the special equipment that a kind of exclusive centering large scale digital circuit carries out dynamic ageing of circuit and parameter testing simultaneously in order to overcome.
The utility model relies on following technical proposals to realize, the dynamic ageing testing equipment of large scale digital circuit in a kind of, comprise a main body rack and a control desk that contains main frame and CRT monitor composition, it is characterized in that, internal structure adopts modularized design, side in the mainframe is provided with the high and low temperature test chamber, and one group of general ageing unit is arranged on the upper strata, and one group of general controls unit and one group of program control D.C. regulated power supply are arranged by lower floor; Lower bottom part is respectively isa bus, pci bus multichannel expansion slot and isa bus, pci bus expansion card, and the rack outside is provided with receiving card and the feeder line thereof that links to each other with outer control desk.
The concrete quantity of " one group " is decided according to the scale of test product, can be varying numbers such as 4,6,8.
During work, under the monitoring of computer system, or constitute dynamic power ageing loop by the computer virtual signal generator in general ageing unit, the general controls unit, supply voltage, input signal, time that follow procedure is provided with, under the temperature of regulation and load, carry out the dynamic power ageing; Or constituting online function and parameter testing loop by the digital circuit computer virtual test circuit and the main frame of general ageing unit, general controls unit, the time interval of follow procedure setting is carried out online function and parameter testing.Wherein, the computer virtual signal generator in the general controls unit has adopted electronic switch, non-volatile memory and Darlington driver, makes its waveform memory capacity with 32K, up to the driving force of 500mA, and program-controlled change frequency and amplitude.
For the structure of simplified universal ageing unit, and improve its versatility, general ageing unit has adopted composite construction, and only needing to change the jumper terminal position can carry out dynamic power ageing and online functional test to dissimilar middle large scale digital circuit.
What the general controls unit adopted is card format, and in the bus dash receiver inserts the control cabinet on the motherboard of isa bus or pci bus multichannel expansion slot.What power supply adopted also is dongle configuration, directly in the power supply cabinet in the insertion equipment.
This programme has following positive benefit
1) relative independentability of structure
A rack and a control desk have been adopted, high-temperature test chamber or low-temperature test chamber, general ageing unit, general controls unit, program control D.C. regulated power supply are installed in the rack, computer system is installed on the control desk, has kept the relative independentability of its function.
2) modularized design of structure
General ageing unit, general controls unit, program control D.C. regulated power supply are the module with complete function, any one passage breaks down, can not influence dynamic power ageing and the online function and the parameter testing of other passage, and guarantee the convenience that it uses and keeps in repair.
3) reliability of structure design
General ageing unit is in Homothermal Proof Box, in order to guarantee its reliability, aspect device, has selected test/ageing private jack that the high withstand voltage 700V of plug intensity is above, insulation impedance 1000M Ω is above for use.
Further specify embodiment below in conjunction with accompanying drawing
Description of drawings
Fig. 1 is the dynamic ageing testing equipment of a middle large scale digital circuit rack inner structure schematic diagram
Fig. 2 is this equipment electrical principle block diagram
Fig. 3 is general controls unit electricity theory diagram
Fig. 4 is for being programmed ageing signal OPADD generative circuit figure
Fig. 5 is ageing, programming and programmable power supply Automatic Control Theory figure
Among the figure, 1 is rack, interior dress Homothermal Proof Box 2, general ageing unit 3, general controls unit 4, program control D.C. regulated power supply 5 and isa bus or pci bus multichannel expansion slot 6 and isa bus or pci bus multichannel expansion card 7 are provided with receiving card 8 and are connected to the feeder line of computer console at the sidewall of rack, and main frame 9 and CRT monitor 10 are housed on the control desk.
In the dynamic ageing testing equipment of large scale digital circuit new software function only need be installed or increase part hardware can realize below how new function:
The general controls plate also can be used as 40 road programmed signal sources and uses;
The general controls plate also can be used as 40 way word oscilloscopes and uses
The general controls plate also can be used as No. 40 logic analyzers and uses
Increase resistance, electric capacity, inductance, diode, triode, thyristor, Switching Power Supply, the general ageing plate of linear circuit and general controls plate and also can form the dynamic ageing testing equipment of universal elements.
Claims (4)
- The dynamic ageing testing equipment of large scale digital circuit in 1 one kinds, comprise a theme rack and a control desk that contains main frame and CRT monitor composition, it is characterized in that, internal structure adopts modularized design, side in the mainframe is provided with the high and low temperature test chamber, one group of general ageing unit is arranged on the upper strata, and one group of general controls unit and one group of program control D.C. regulated power supply are arranged by lower floor; Lower bottom part is respectively isa bus, pci bus multichannel expansion slot and isa bus, pci bus expansion card, and the rack skin is provided with receiving card and the feeder line thereof that links to each other with outer control desk.
- 2 according to the described ageing testing equipment of claim 1, it is characterized in that general ageing unit has adopted composite construction, and only needing to change the jumper terminal position can carry out ageing to different product.
- 3 according to the described ageing testing equipment of claim 1, it is characterized in that, what the general controls unit adopted is card format, and in the bus dash receiver inserts the control cabinet on the motherboard of isa bus or pci bus multichannel expansion slot.What power supply adopted also is dongle configuration, directly in the power supply cabinet in the insertion equipment.
- 4 according to the described ageing testing equipment of claim 1, it is characterized in that, has selected test/ageing private jack that the high withstand voltage 700V of plug intensity is above, insulation impedance 1000M Ω is above for use.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 01204706 CN2470954Y (en) | 2001-02-28 | 2001-02-28 | Dynamic testing apparatus for large-medium scale digital circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 01204706 CN2470954Y (en) | 2001-02-28 | 2001-02-28 | Dynamic testing apparatus for large-medium scale digital circuit |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN2470954Y true CN2470954Y (en) | 2002-01-09 |
Family
ID=33625878
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 01204706 Expired - Lifetime CN2470954Y (en) | 2001-02-28 | 2001-02-28 | Dynamic testing apparatus for large-medium scale digital circuit |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN2470954Y (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106124897A (en) * | 2016-07-11 | 2016-11-16 | 中国电子科技集团公司第四十四研究所 | Photoelectrical coupler can be carried out electricity aging test and the test system of parameter testing |
| CN112946322A (en) * | 2021-03-31 | 2021-06-11 | 四创电子股份有限公司 | Extensible microwave component aging test system |
| CN114076859A (en) * | 2020-08-18 | 2022-02-22 | 中国科学院国家空间科学中心 | Full-temperature aging test system and method for core components for aerospace |
-
2001
- 2001-02-28 CN CN 01204706 patent/CN2470954Y/en not_active Expired - Lifetime
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106124897A (en) * | 2016-07-11 | 2016-11-16 | 中国电子科技集团公司第四十四研究所 | Photoelectrical coupler can be carried out electricity aging test and the test system of parameter testing |
| CN114076859A (en) * | 2020-08-18 | 2022-02-22 | 中国科学院国家空间科学中心 | Full-temperature aging test system and method for core components for aerospace |
| CN112946322A (en) * | 2021-03-31 | 2021-06-11 | 四创电子股份有限公司 | Extensible microwave component aging test system |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |