CN111505413A - Automatic testing arrangement of avionics department annex - Google Patents
Automatic testing arrangement of avionics department annex Download PDFInfo
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- CN111505413A CN111505413A CN202010289332.1A CN202010289332A CN111505413A CN 111505413 A CN111505413 A CN 111505413A CN 202010289332 A CN202010289332 A CN 202010289332A CN 111505413 A CN111505413 A CN 111505413A
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- 238000012360 testing method Methods 0.000 title claims abstract description 192
- 230000005284 excitation Effects 0.000 claims abstract description 6
- 239000013256 coordination polymer Substances 0.000 claims description 14
- 230000005540 biological transmission Effects 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 18
- 238000001514 detection method Methods 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 230000008569 process Effects 0.000 description 3
- 230000004044 response Effects 0.000 description 2
- 230000008054 signal transmission Effects 0.000 description 2
- 238000012546 transfer Methods 0.000 description 2
- 241000274582 Pycnanthus angolensis Species 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
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- 239000011087 paperboard Substances 0.000 description 1
- 230000008439 repair process Effects 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/005—Testing of electric installations on transport means
- G01R31/008—Testing of electric installations on transport means on air- or spacecraft, railway rolling stock or sea-going vessels
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Abstract
The invention discloses an automatic test device for accessories of an avionic part, which comprises a power supply, a control system and a test system, wherein the control system is electrically connected with the test system, sends enabling and driving commands to the test system, controls the test system to test a part to be tested and obtains a test result, the test system is externally connected with the part to be tested, receives enabling and driving commands of the control system, sends excitation signals to the part to be tested, obtains output signals of the part to be tested and sends the output signals to a control box. The automatic test device for the avionics unit accessories greatly shortens the test time, reduces the interference of human factors, and improves the test speed and the test result accuracy.
Description
Technical Field
The invention relates to the technical field of avionic equipment testing, in particular to an automatic testing device for an avionic part accessory.
Background
In the ground maintenance of avionics, it is often necessary to test and repair them. The existing testing method adopts a mode of combining manual control and multimeter measurement, and connects an electronic component to be tested into the multimeter to measure parameters such as current, resistance, voltage and the like of the electronic component. The method has the problems of serious interference of human factors, poor accuracy and reliability of test results and low test speed.
Disclosure of Invention
The invention aims to provide an automatic testing device for accessories of an avionics unit, which greatly shortens the testing time, reduces the interference of human factors and improves the testing speed and the accuracy of testing results.
In order to solve the technical problem, the invention adopts the following scheme:
an automatic test device for avionics component accessories is used for automatically testing the avionics component accessories and comprises a control system, a test system and a power supply,
the control system is electrically connected with the test system through a PCI bus and used for sending enabling and driving commands to the test box, controlling the test box to test the component to be tested and acquiring a test result;
the test system comprises a test board and a test instrument, wherein the test board is provided with a CP L D processor, is electrically connected with a control system through a PCI bus, is externally connected with a component to be tested, and sends corresponding excitation signals to the component to be tested and the test instrument according to an enabling command and a driving command sent by the control system;
the power input end is connected with an external power supply, and the output end is connected with the control system and the test system and used for converting the external power supply into a power supply matched with the working voltage and current of the control system and the test box system and then supplying power to the control system and the test box system.
Particularly, the control system comprises an industrial personal computer and a PCI board card, wherein the industrial personal computer is electrically connected with the test system through the PCI board card, and an enabling instruction and a driving instruction are sent to the test system through the PCI board card.
Particularly, the PCI board card adopts a PCI1751 card.
In particular, the test board comprises a test mother board, a test daughter board and an adapter board,
the test motherboard is electrically connected with the control system through a PCI bus, and is also electrically connected with the test daughter board and the adapter board, and is used for distributing PCI bus signals input by the control system to the test daughter board and the adapter board and controlling the test daughter board and the adapter board to work, wherein the bus signals comprise address signals and data signals;
the test daughter board is externally connected with a component to be tested and comprises a first test daughter board and a second test daughter board, wherein the first test daughter board is electrically connected with the test mother board and is also electrically connected with the test instrument and the component to be tested and is used for receiving a first enabling command sent by the test mother board and loading and accessing a signal of the component to be tested into the test instrument through logic switching; the second test daughter board is electrically connected with the test mother board, simultaneously electrically connected with the test instrument and the component to be tested, and used for receiving a second enabling command sent by the test mother board, sending the second enabling command to the component to be tested through an excitation signal and providing circuit performance for the component to be tested;
the adapter plate is electrically connected with the test motherboard, the test instrument and the control system and is used for carrying out address distribution and switching on signals of the test instrument.
In particular, the test motherboard is provided with a CP L D controller, and bus signals input by a control system are converted into corresponding address buses and data buses through a CP L D.
In particular, the power supply converts external power to AC115V, DC24V, DC27V, and DC5V power outputs, respectively.
In particular, the industrial computer employs a porphyry P4 cabinet.
Particularly, data transmission is carried out between the test instrument and the control system through a USB3.0 port.
In particular, the test meter employs a 34461A digital multimeter.
Particularly, the automatic test device for the accessories of the avionics part further comprises a setting unit and a display unit, wherein the setting unit is electrically connected with the control system and adopts a button and a touch screen; the display unit is electrically connected with the control system and adopts a touch screen and an indicator light.
The invention has the following beneficial effects:
1. the detection speed of the accessories of the avionics unit is increased.
2. And the detection precision of the accessories of the avionics unit is improved.
3. And the detection result of the accessories of the avionics part is reduced by human factor interference.
Drawings
Fig. 1 is a schematic block diagram of an automatic testing device for avionics component accessories according to embodiment 1 of the present invention;
fig. 2 is a schematic circuit diagram of the power box according to embodiment 1 of the present invention;
fig. 3 is a schematic block diagram of an interposer according to embodiment 1 of the present invention;
fig. 4 is a schematic diagram of an interposer circuit according to embodiment 1 of the present invention;
fig. 5 is a schematic diagram of a circuit of the motherboard according to embodiment 1 of the present invention;
FIG. 6 is a schematic block diagram of the first test daughter board according to embodiment 1 of the present invention
Fig. 7 is a schematic diagram of a first test daughter board circuit according to embodiment 1 of the present invention;
fig. 8 is a schematic block diagram of a second test daughter board according to embodiment 1 of the present invention;
fig. 9 is a schematic diagram of a second test daughter board circuit according to embodiment 1 of the present invention.
Detailed Description
The present invention will be described in further detail with reference to examples and drawings, but the present invention is not limited to these examples.
Example 1
As shown in fig. 1, fig. 1 is a schematic block diagram of an automatic testing apparatus for avionics component accessories according to embodiment 1 of the present invention. The automatic test device for the avionics unit accessories comprises a power box, a control system and a test system.
The power input end is connected with an external AC220V alternating current power supply, the output end is connected with the control system and the test system, and the external power supply is converted into a power supply matched with the working voltage and current of the control system and the test system and then supplies power to the control system and the test system. As shown in fig. 2, fig. 2 is a schematic diagram of a power circuit according to embodiment 1 of the present invention, in which a power supply converts an externally input 220VAC power supply into various power supplies required by a test apparatus, including a 115VAC, 400Hz power supply, a 27VDC dc power supply, a 24VDC dc power supply (for controlling relay coils on all test boards), and a 5VDC dc power supply (for all test board internal boards) required for the operation of a test system. In order to ensure the correct response of the system, all power supplies are provided with direct current filters to ensure the accuracy of the power supplies. The secondary filtering is designed in the test box board card to ensure the normal work of the chip.
The control system is electrically connected with the test box, sends enabling and driving commands to the test system, controls the test system to test the component to be tested, and obtains a test result. The control system comprises an industrial personal computer and a PCI board card, wherein the industrial personal computer adopts a P4 machine box which is electrically connected with the test system through the PCI board card, the PCI board card adopts a PCI1751 card, and the control system sends out enabling and driving instructions to the test box through the PCI1751 board card.
The test system comprises a test board and a test instrument, wherein the test board comprises an adapter board, a test mother board, a first test daughter board and a second test daughter board.
As shown in fig. 3 and 4, fig. 3 is a schematic block diagram of an interposer according to embodiment 1 of the present invention, and fig. 4 is a schematic circuit diagram of the interposer according to embodiment 1 of the present invention, where the interposer includes a first interposer and a second interposer, both of which are plugged in slots of a test motherboard, the first interposer is provided with a 74L S245 memory, a CP L D processor and a plurality of relays, bus data output by an industrial personal computer is transmitted to the 74L S245 memory via a PCI1751 board for storage, the CP L D processor obtains data in the 74L S245 memory, and performs logic control on the relays on the first interposer, and the relays are electrically connected to a test instrument, so that address allocation and transfer of positive and negative meter pen signals of the test instrument are realized through different logic controls of the relays.
As shown in fig. 5, fig. 5 is a schematic diagram of a circuit of a test motherboard according to embodiment 1 of the present invention, where the test motherboard is provided with a CP L D, and is electrically connected to an industrial personal computer through a PCI bus, and the test motherboard is provided with a plurality of sockets, and the test motherboard and a transfer board are plugged in the sockets, and the test motherboard distributes bus signals input by a control box to the daughter boards to control the daughter boards to operate, where the bus signals include address signals and data signals, and to increase the detection speed, the test motherboard converts the bus signals input by the industrial personal computer into corresponding address buses and data buses through a CP L D.
The first test daughter board is electrically connected with the test mother board, and is also electrically connected with the test instrument and the component to be tested, and is used for receiving a first enabling command sent by the test mother board and loading and accessing a signal of the component to be tested into the test instrument through logic switching, as shown in fig. 6 and 7, fig. 6 is a schematic diagram of the first test daughter board in embodiment 1 of the invention, and fig. 7 is a schematic diagram of a circuit of the first test daughter board in embodiment 1 of the invention.
Fig. 8 and 9 show that fig. 8 is a schematic diagram of a second test daughter board in embodiment 1 of the present invention, and fig. 9 is a schematic diagram of a circuit of the second test daughter board in embodiment 1 of the present invention, the second test daughter board is provided with a CP L D controller, which is mainly used for testing partial circuit performance on the rack, and after resolving signals on the bus through CP L D, the signals are sent to a corresponding relay to drive the relay to work, and the relay connects various input signals to bus bars with different functions, thereby completing signal loading (27V,115V, GND, etc.) and signal acquisition (positive and negative meter pens of the measuring instrument).
The test instrument adopts a 34461A digital multimeter which is inserted on a test motherboard and is electrically connected with a PCI1751 board card at the same time to measure an accessed component to be tested, and the obtained test data is sent to the industrial personal computer through a USB3.0 interface and comprises the voltage, the current and the resistance of the component to be tested.
The test principle of the automatic test Device for the avionics part accessory is that a tester sends test signals to an industrial personal computer through a button and a touch screen, the industrial personal computer sends logic control instructions to a test box through a PCI1751 card, a test motherboard converts the instructions into corresponding address and data buses through CP L D, the address buses declare the addresses of 24 daughter boards, the data buses control corresponding relay responses on the daughter boards, the test board is controlled by the address and the data buses at the same time and is used for switching signals of a tested product, interface signals of the product enter a test instrument through a relay and are sent to the industrial personal computer through a USB3.0 bus of the industrial personal computer for acquisition and display, a whole set of automatic test equipment (the test cabinet and cables) takes an industrial control computer as a core to control the working state of the whole test system, form the output of excitation signals required under various working states, acquire and convert feedback data of various test results, analyze, calculate, store the test results, automatically generate reports and the like in the industrial personal computer, wherein CP L D (Complex test data) are arranged on the test motherboard, the first test daughter board and the second test daughter board, the test instrument, and the test equipment can process signals at a certain transmission speed, and transmit a high-speed signal to a USB signal which can be transmitted by a USB 3.0.5-speed, and a USB-Programmable Device which can process a high-speed signal transmission Device which can process a high-speed test speed signal transmission Device which can be transmitted by adopting a USB 3.0.0.
The foregoing is only a preferred embodiment of the present invention, which is not intended to be limiting in any way, and any simple modifications, equivalent substitutions and improvements made to the above embodiments within the spirit and principle of the present invention are still within the protection scope of the present invention.
Claims (10)
1. An automatic test device for avionics component accessories is used for automatically testing the avionics component accessories and is characterized by comprising a control system, a test system and a power supply,
the control system is electrically connected with the test system through a PCI bus and used for sending enabling and driving commands to the test box, controlling the test box to test the component to be tested and acquiring a test result;
the test system comprises a test board and a test instrument, wherein the test board is provided with a CP L D processor, is electrically connected with a control system through a PCI bus, is externally connected with a component to be tested, and sends corresponding excitation signals to the component to be tested and the test instrument according to an enabling command and a driving command sent by the control system;
the power input end is connected with an external power supply, and the output end is connected with the control system and the test system and used for converting the external power supply into a power supply matched with the working voltage and current of the control system and the test box system and then supplying power to the control system and the test box system.
2. The automatic test device for the accessories of the avionics unit according to claim 1, wherein the control system comprises an industrial personal computer and a PCI board card, the industrial personal computer is electrically connected with the test system through the PCI board card, and the PCI board card is used for sending an enabling and driving instruction to the test system.
3. The automatic test device for the avionics component accessories according to claim 2, wherein the PCI board card is a PCI1751 card.
4. The automatic avionics component accessory test equipment of claim 1, wherein the test board comprises a test motherboard, a test daughter board and an adapter board,
the test motherboard is electrically connected with the control system through a PCI bus, and is also electrically connected with the test daughter board and the adapter board, and is used for distributing PCI bus signals input by the control system to the test daughter board and the adapter board and controlling the test daughter board and the adapter board to work, wherein the bus signals comprise address signals and data signals;
the test daughter board is externally connected with a component to be tested and comprises a first test daughter board and a second test daughter board, wherein the first test daughter board is electrically connected with the test mother board and is also electrically connected with the test instrument and the component to be tested and is used for receiving a first enabling command sent by the test mother board and loading and accessing a signal of the component to be tested into the test instrument through logic switching; the second test daughter board is electrically connected with the test mother board, simultaneously electrically connected with the test instrument and the component to be tested, and used for receiving a second enabling command sent by the test mother board, sending the second enabling command to the component to be tested through an excitation signal and providing circuit performance for the component to be tested;
the adapter plate is electrically connected with the test motherboard, the test instrument and the control system and is used for carrying out address distribution and switching on signals of the test instrument.
5. The automatic test device for the accessories of the avionics parts according to claim 4, characterized in that the test motherboard is provided with a CP L D controller, and bus signals input by a control system are converted into corresponding address buses and data buses through a CP L D.
6. The automatic avionics component accessory test equipment of claim 1, wherein the power supply converts external power to AC115V, DC24V, DC27V and DC5V power outputs, respectively.
7. The automatic test device for the accessories of the avionics unit according to claim 2, characterized in that the industrial personal computer adopts a porphyry P4 cabinet.
8. The automatic avionics component accessory test device according to claim 1, characterized in that data transmission is performed between the test instrument and the control system via a USB3.0 port.
9. The automatic avionics component accessory test equipment of claim 1, wherein the test meter is a 34461A digital multimeter.
10. The automatic test device for the accessories of the avionics unit according to claim 1, characterized by further comprising a setting unit and a display unit, wherein the setting unit is electrically connected with a control system and adopts a button and a touch screen; the display unit is electrically connected with the control system and adopts a touch screen and an indicator light.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910590563 | 2019-07-02 | ||
| CN2019105905633 | 2019-07-02 |
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| CN111505413A true CN111505413A (en) | 2020-08-07 |
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| CN202010289332.1A Pending CN111505413A (en) | 2019-07-02 | 2020-04-14 | Automatic testing arrangement of avionics department annex |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113741232A (en) * | 2021-06-01 | 2021-12-03 | 上海工程技术大学 | Data acquisition and control system and method for aviation simulation circuit breaker |
| CN113960442A (en) * | 2021-01-19 | 2022-01-21 | 国营芜湖机械厂 | Airborne logic and control assembly detection device and test method thereof |
| CN114019438A (en) * | 2021-09-16 | 2022-02-08 | 中国船舶重工集团公司第七0九研究所 | Direct current calibration adapter plate of integrated circuit test system and calibration method |
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2020
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Patent Citations (5)
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| CN103868525A (en) * | 2014-01-10 | 2014-06-18 | 中国人民解放军63680部队 | Index tester of inertial navigation equipment |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN113960442A (en) * | 2021-01-19 | 2022-01-21 | 国营芜湖机械厂 | Airborne logic and control assembly detection device and test method thereof |
| CN113741232A (en) * | 2021-06-01 | 2021-12-03 | 上海工程技术大学 | Data acquisition and control system and method for aviation simulation circuit breaker |
| CN114019438A (en) * | 2021-09-16 | 2022-02-08 | 中国船舶重工集团公司第七0九研究所 | Direct current calibration adapter plate of integrated circuit test system and calibration method |
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Application publication date: 20200807 |