CN106093751A - Device and method for detecting using times of probe of circuit board tester - Google Patents
Device and method for detecting using times of probe of circuit board tester Download PDFInfo
- Publication number
- CN106093751A CN106093751A CN201610452316.3A CN201610452316A CN106093751A CN 106093751 A CN106093751 A CN 106093751A CN 201610452316 A CN201610452316 A CN 201610452316A CN 106093751 A CN106093751 A CN 106093751A
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- China
- Prior art keywords
- probe
- access times
- pin
- probe access
- circuit board
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Links
- 239000000523 sample Substances 0.000 title claims abstract description 98
- 238000000034 method Methods 0.000 title claims abstract description 12
- 238000012360 testing method Methods 0.000 claims abstract description 50
- 238000001514 detection method Methods 0.000 claims abstract description 25
- 238000012423 maintenance Methods 0.000 claims abstract description 11
- 238000005096 rolling process Methods 0.000 claims 1
- 230000003647 oxidation Effects 0.000 abstract description 6
- 238000007254 oxidation reaction Methods 0.000 abstract description 6
- 238000011990 functional testing Methods 0.000 description 6
- 239000000463 material Substances 0.000 description 5
- 238000010276 construction Methods 0.000 description 3
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000000994 depressogenic effect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
- 238000010200 validation analysis Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2803—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP] by means of functional tests, e.g. logic-circuit-simulation or algorithms therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The invention discloses a device and a method for detecting the use times of a probe of a circuit board tester. The probe use number detection device comprises: the first needle is arranged on a test seat of the circuit board tester; the second needle is arranged on a pressure plate of the circuit board tester, and the first needle and the second needle are correspondingly arranged; and the counter is connected with the first needle and the second needle and used for counting when the second needle is short-circuited with the first needle so as to obtain the using times of the probe. By the technical scheme, the intelligent counting of the using times of the probe can be realized, so that an operator can perform corresponding operations such as maintenance, repair and replacement on the probe according to the using times of the probe, the problems of deformation of a needle seat, oxidation of the needle, increase of contact resistance, existence of sundries in a needle head and the like caused by long-time use of the probe on the test result and the reliability of a tool are effectively solved, and the intelligent counting device has the characteristics of simple structure and low cost.
Description
Technical field
The present invention relates to circuit board testing field, in particular to the probe access times of a kind of circuit board testing instrument
Detection apparatus and method.
Background technology
FCT (functional test) refers to provide test target plate the running environment (encourage and load) of simulation so that it is work
In various design points, thus the parameter getting each state carrys out the method for testing of function quality of validation test Target Board.
Briefly, it is simply that test target plate is loaded suitably excitation, measure whether outfan response meets the requirements.ICT (exists automatically
Line tester) it is the test equipment that produces of the indispensable printed circuit-board assembly of hyundai electronics enterprise, ICT range is wide, measures
Accuracy is high, and the problem detected can be provided clear and definite instruction.
FCT and ICT of the prior art test needle-bar, tool generally use reusable edible probe geometries to carry out signal and adopt
Collection, the life-span of general probe is at about 200,000 times.If probe uses for a long time, needle stand deformation, pin oxidation, contact electricity can be caused
Resistive is big, syringe needle exists the problems such as foreign material, thus test result and frock reliability are produced impact.But, in prior art
The actually used number of times of probe is not added up accurately, therefore test result and frock reliability can be produced disadvantageous shadow
Ring.
Summary of the invention
The embodiment of the present invention provides the probe access times detection apparatus and method of a kind of circuit board testing instrument, to solve
Use the needle stand caused deformation, pin oxidation, contact resistance to become big, syringe needle in prior art for a long time to there are foreign material etc. right because of probe
The problem that test result and frock reliability produce impact.
For achieving the above object, the probe access times detection dress of a kind of circuit board testing instrument is embodiments provided
Put, including: the first pin, it is arranged on the test bench of circuit board testing instrument；Second pin, is arranged on the pressing plate of circuit board testing instrument
On, and the first pin and the second pin be arranged in correspondence with；Enumerator, is connected with the first pin and the second pin, at the second pin and first
Carry out during pin short circuit counting to obtain probe access times.
Preferably, probe access times detection device also includes display unit, is connected with enumerator, is used for showing that probe makes
Use number of times.
Preferably, probe access times detection device also includes host computer, is connected with enumerator, secondary for using at probe
Number reaches alert during pre-determined number.
Preferably, probe access times detection device also includes host computer, is connected with enumerator, secondary for using at probe
Number reaches to send corresponding prompting message during different pre-determined numbers.
Preferably, prompting message includes overhauling probe, maintenance probe, changing probe.
Preferably, a pulse signal for flip-flop number counting is generated when the second pin and the first pin short circuit.
Present invention also offers the probe access times detection method of a kind of circuit board testing instrument, including: survey at circuit board
On the test bench of examination instrument, the first pin is set；The pressing plate of circuit board testing instrument is arranged with first for the second pin answered；?
Count when two pins and the first pin short circuit, to obtain probe access times.
Preferably, method also includes: sends when probe access times reach different pre-determined number and reminds letter accordingly
Breath.
Preferably, prompting message includes overhauling probe, maintenance probe, changing probe.
Preferably, method also includes: generate a pulse letter for flip-flop number when the second pin and the first pin short circuit
Number.
Pass through technical scheme, it is possible to achieve the Intelligent-counting to probe access times, so that operator
According to probe access times, probe can be overhauled accordingly, maintain and the operation such as replacing, to be prevented effectively from because probe is long
Time uses the needle stand caused deformation, pin oxidation, contact resistance to become big, syringe needle, and to there are foreign material etc. reliable to test result and frock
Property produce impact problem, there is the feature of simple in construction, low cost.
Accompanying drawing explanation
Fig. 1 is the top view of the test bench of the circuit board testing instrument of the embodiment of the present invention；
Fig. 2 is the upward view of Fig. 1；
Fig. 3 is the side view of Fig. 1；
Fig. 4 is the flow chart of the probe access times detection method of the embodiment of the present invention.
Description of reference numerals: 1, test bench；2, display unit；3, circuit board to be tested；4, mechanical hand.
Detailed description of the invention
With specific embodiment, the present invention is described in further detail below in conjunction with the accompanying drawings, but not as the limit to the present invention
Fixed.
Refer to Fig. 1 to 3, the test bench 1 of circuit board testing instrument is provided with circuit board 3 to be tested, mechanical hand 4 can be passed through
Operating circuit board 3 to be tested, pressing plate (not shown) is positioned at the top of test bench 1, during test pressing plate drive probe thereon to
The direction motion of circuit board 3 to be tested, to carry out corresponding functional test.
Embodiments providing the probe access times detection device of a kind of circuit board testing instrument, it is applicable to
The occasions such as FCT and ICT test needle-bar.Probe access times detection device in the present invention includes: the first pin, the second pin and counting
Device, the first pin and the second pin are different from a testing needle of probe respectively.Wherein, the first pin is arranged on the circuit shown in Fig. 1
On the test bench 1 of board test instrument, the second pin is then arranged on the pressing plate of circuit board testing instrument, and the first pin and second is for answering
Ground is arranged, and so, pressing plate moves downward so that the first pin and second is for connecing and short circuit occurring when tested.Then,
Generating a signal of telecommunication when one pin and the second pin short circuit, such as, can be pulse signal, this signal of telecommunication be supplied to enumerator, this
Sample, the number of times that this signal of telecommunication just can be produced by enumerator counts.Owing to, when pressing plate pressure is tested, will produce
Once this signal of telecommunication, therefore can realize the counting to probe access times to the counting of this signal of telecommunication.Wherein, enumerator can make
With enumerator conventional in prior art, as long as tally function can be completed.In a preferred embodiment, enumerator
Can also have the function automatically saving count results.
Visible, the Intelligent-counting to probe access times can be realized by the present invention, so that operator can root
According to probe access times, probe overhauled accordingly, maintain and the operation such as replacing, to be prevented effectively from because probe makes for a long time
With the needle stand deformation caused, pin oxidation, contact resistance becomes greatly, syringe needle exists foreign material etc. and produces test result and frock reliability
The problem of impact, has the feature of simple in construction, low cost.
In one embodiment, observing probe access times for the ease of scene, the probe in the present invention uses
Times detecting device also includes the display unit 2 for showing probe access times, and this display unit 2 is connected with enumerator, this
Sample, operator can be directly seen access times from scene, determine whether needs overhaul accordingly, maintain and
The operations such as replacing.
Probe access times detection device in the present invention the most also includes host computer, and enumerator is connected with host computer, example
As can be by various wired or wireless connected modes of the prior art, it is also possible to connect by the way of bus, to realize
Clustered control to multiple probe access times detection device.So, host computer can synchronously obtain the counting knot of enumerator
Structure, and the alert when probe access times reach pre-determined number, to remind operator to grasp the most accordingly
Make.
In another embodiment, host computer also can send corresponding when probe access times reach different pre-determined number
Prompting message.As such, it is possible to probe is processed accordingly according to different usage degrees.Such as, this prompting message bag
Include maintenance probe, maintenance probe, change probe etc., after seeing these prompting messages, i.e. show current access times
Arrive the pre-determined number corresponding with these prompting messages.
Such as, when the stored count value of enumerator is at about 100,000 times, host computer can remind the pin to tool fixture to enter
Row maintenance；When stored count value reaches 200,000 times, host computer is then reminded and probe is carried out pressure is scrapped.
Refer to Fig. 4, present invention also offers the probe access times detection method of a kind of circuit board testing instrument, it can be fitted
For occasions such as FCT and ICT test needle-bars.
In one embodiment, the method arranges the first pin on the test bench 1 of circuit board testing instrument, and surveys at circuit board
Arrange with first for the second pin answered on the pressing plate of examination instrument.When the second pin and the first pin short circuit are depressed and made to pressing plate, to short
The number of times connect counts, thus obtains probe access times.Such as, the present invention can be to raw when the second pin and the first pin short circuit
The pulse signal become counts, to realize the counting to probe access times.
Owing to, when pressing plate pressure is tested, this signal of telecommunication, the therefore counting to this signal of telecommunication will be produced once
The counting to probe access times can be realized.Visible, the Intelligent-counting to probe access times can be realized by the present invention,
So that probe can be overhauled according to probe access times, maintain and the operation such as replacing, to have by operator accordingly
Effect is avoided using for a long time because of probe the needle stand caused deformation, pin oxidation, contact resistance to become big, syringe needle there are foreign material etc. to test
Result and frock reliability produce the problem of impact, have the feature of simple in construction, low cost.
Preferably, the method also sends corresponding prompting message when probe access times reach different pre-determined number.
Such as, these prompting messages can include overhauling probe, maintenance probe, changing probe etc..When operator see that these are reminded
After information, i.e. show that current access times have arrived at the pre-determined number corresponding with these prompting messages, and should enter in time
The corresponding operation of row.
Certainly, it is above the preferred embodiment of the present invention.It should be pointed out that, for those skilled in the art
For, on the premise of without departing from its general principles, it is also possible to make some improvements and modifications, these improvements and modifications are also
It is considered as protection scope of the present invention.
Claims (10)
1. the probe access times detection device of a circuit board testing instrument, it is characterised in that including:
First pin, is arranged on the test bench (1) of described circuit board testing instrument；
Second pin, is arranged on the pressing plate of described circuit board testing instrument, and described first pin is arranged in correspondence with described second pin；
Enumerator, is connected with described first pin and the second pin, based on carrying out when described second pin is with described first pin short circuit
Number is to obtain described probe access times.
Probe access times the most according to claim 1 detection device, it is characterised in that described probe access times detect
Device also includes display unit, is connected with described enumerator, is used for showing described probe access times.
Probe access times the most according to claim 1 detection device, it is characterised in that described probe access times detect
Device also includes host computer, is connected with described enumerator, for sending report when described probe access times reach pre-determined number
Alarming information.
Probe access times the most according to claim 1 detection device, it is characterised in that described probe access times detect
Device also includes host computer, is connected with described enumerator, for when described probe access times reach different pre-determined number
Send corresponding prompting message.
Probe access times the most according to claim 4 detection device, it is characterised in that described prompting message includes maintenance
Probe, maintenance probe, replacing probe.
Probe access times the most according to claim 1 detection device, it is characterised in that described second pin and described first
One is generated for the pulse signal triggering described rolling counters forward during pin short circuit.
7. the probe access times detection method of a circuit board testing instrument, it is characterised in that including:
The test bench (1) of described circuit board testing instrument arranges the first pin；
The pressing plate of described circuit board testing instrument is arranged with described first for the second pin answered；
Count when described second pin is with described first pin short circuit, to obtain described probe access times.
Probe access times detection method the most according to claim 7, it is characterised in that described method also includes: in institute
Corresponding prompting message is sent when stating the pre-determined number that probe access times reach different.
Probe access times detection method the most according to claim 8, it is characterised in that described prompting message includes maintenance
Probe, maintenance probe, replacing probe.
Probe access times detection method the most according to claim 7, it is characterised in that described method also includes: in institute
State the second pin and generate one during described first pin short circuit for triggering the pulse signal of described counting.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610452316.3A CN106093751A (en) | 2016-06-20 | 2016-06-20 | Device and method for detecting using times of probe of circuit board tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610452316.3A CN106093751A (en) | 2016-06-20 | 2016-06-20 | Device and method for detecting using times of probe of circuit board tester |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN106093751A true CN106093751A (en) | 2016-11-09 |
Family
ID=57238252
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610452316.3A Pending CN106093751A (en) | 2016-06-20 | 2016-06-20 | Device and method for detecting using times of probe of circuit board tester |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106093751A (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108469583A (en) * | 2018-05-28 | 2018-08-31 | 格力电器（郑州）有限公司 | ICT tester |
| CN109444715A (en) * | 2018-11-23 | 2019-03-08 | 格力电器（武汉）有限公司 | Combined testing device |
| CN109720660A (en) * | 2017-10-26 | 2019-05-07 | 银隆新能源股份有限公司 | Monitoring device for soft-package battery end socket |
| CN109901056A (en) * | 2019-04-09 | 2019-06-18 | 苏州通富超威半导体有限公司 | Chip test system and its method |
| CN112038253A (en) * | 2020-09-28 | 2020-12-04 | 上海华虹宏力半导体制造有限公司 | Wafer test probe card capable of life warning and test method |
| CN113419086A (en) * | 2020-10-20 | 2021-09-21 | 捷普科技（上海）有限公司 | Test fixture maintenance management system |
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| JP2004117054A (en) * | 2002-09-24 | 2004-04-15 | Ando Electric Co Ltd | Device and method for managing probe card of automatic handler for tab |
| US20050184741A1 (en) * | 2004-02-24 | 2005-08-25 | Mjc Probe Inc. | Multi-function probe card |
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| CN102707182A (en) * | 2011-04-22 | 2012-10-03 | 苏州市科林源电子有限公司 | Printed circuit board (PCB) test jig |
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2016
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| JP2004117054A (en) * | 2002-09-24 | 2004-04-15 | Ando Electric Co Ltd | Device and method for managing probe card of automatic handler for tab |
| US20050184741A1 (en) * | 2004-02-24 | 2005-08-25 | Mjc Probe Inc. | Multi-function probe card |
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Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109720660A (en) * | 2017-10-26 | 2019-05-07 | 银隆新能源股份有限公司 | Monitoring device for soft-package battery end socket |
| CN108469583A (en) * | 2018-05-28 | 2018-08-31 | 格力电器（郑州）有限公司 | ICT tester |
| CN108469583B (en) * | 2018-05-28 | 2024-03-22 | 格力电器（郑州）有限公司 | ICT tester |
| CN109444715A (en) * | 2018-11-23 | 2019-03-08 | 格力电器（武汉）有限公司 | Combined testing device |
| CN109901056A (en) * | 2019-04-09 | 2019-06-18 | 苏州通富超威半导体有限公司 | Chip test system and its method |
| CN112038253A (en) * | 2020-09-28 | 2020-12-04 | 上海华虹宏力半导体制造有限公司 | Wafer test probe card capable of life warning and test method |
| CN113419086A (en) * | 2020-10-20 | 2021-09-21 | 捷普科技（上海）有限公司 | Test fixture maintenance management system |
| CN113419086B (en) * | 2020-10-20 | 2023-10-31 | 捷普科技（上海）有限公司 | Test fixture maintenance management system |
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| C06 | Publication | ||
| PB01 | Publication | ||
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Application publication date: 20161109 |