CN109444715A - A kind of combined measuring device - Google Patents

A kind of combined measuring device Download PDF

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Publication number
CN109444715A
CN109444715A CN201811408454.7A CN201811408454A CN109444715A CN 109444715 A CN109444715 A CN 109444715A CN 201811408454 A CN201811408454 A CN 201811408454A CN 109444715 A CN109444715 A CN 109444715A
Authority
CN
China
Prior art keywords
plate
fct
ict
test
pallet
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201811408454.7A
Other languages
Chinese (zh)
Inventor
覃兆丹
余小龙
廖星庆
刘爽
胡建辉
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Gree Electric Appliances Inc of Zhuhai
Gree Wuhan Electric Appliances Co Ltd
Original Assignee
Gree Electric Appliances Inc of Zhuhai
Gree Wuhan Electric Appliances Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Gree Electric Appliances Inc of Zhuhai, Gree Wuhan Electric Appliances Co Ltd filed Critical Gree Electric Appliances Inc of Zhuhai
Priority to CN201811408454.7A priority Critical patent/CN109444715A/en
Publication of CN109444715A publication Critical patent/CN109444715A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2803Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP] by means of functional tests, e.g. logic-circuit-simulation or algorithms therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2818Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP] using test structures on, or modifications of, the card under test, made for the purpose of testing, e.g. additional components or connectors

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

The present invention relates to a kind of combined measuring devices, comprising: test bottom plate, ICT tooling and FCT tooling are oppositely arranged on the test bottom plate, and be spaced pre-determined distance;The ICT of the ICT tooling tests probe, different from the FCT of FCT tooling test probe height.Technical solution provided by the invention, by the way that ICT tooling and FCT tooling are integrated on same test bottom plate, and probe is tested using the ICT of different height test probe and FCT, guarantee pcb board different time contact different levels probe to be measured, ICT contacts low needle when testing, FCT contacts principle of readjustment, restructuring, consolidation and improvement when testing, to realize that ICT and FCT test uses the same test device, realize ICT, FCT merge test, solve ICT FCT test process isolation and interference problem.

Description

A kind of combined measuring device
Technical field
The present invention relates to test equipment technical fields, and in particular to a kind of combined measuring device.
Background technique
ICT (test of In Circuit Test automatic on-line): the test point mainly come out by test probe contact PCB To detect open lines/short circuit of PCB.For general and specific components (resistance, capacitor, diode, triode, field-effect Pipe, IC) neglected loading, misloading, parameter value deviation, solder joint even weldering, wiring board open short circuit etc. test.
FCT (Functional Circuit Test functional test): mainly can be to all relays on air-conditioning internal machine mainboard 220V voltage output, regulator block output voltage, communication function, display function, remote control reception function, swing flap etc. judge automatically survey Examination;Mainboard programmed logic is tested, refrigeration mode, anti-freeze mode, restore anti-freeze, heating mode, high temperature protection, High temperature protection restores, and the functions such as memory chip carry out detection judgement.
In the prior art, controller IC T and FCT is always discrete, and such test mode needs more manpower (wherein ICT Generally need 3 people, FCT generally needs 4-5 people), and ICT, FCT tooling be it is separated, frock cost is high, it is big to take up space.Meanwhile it is existing Have in technology, FCT uses manual pressing plate, and fixture positioning, staff labor intensity is big, and being easy to appear pcb board pressure injustice leads to element Impaired problem.
Summary of the invention
To be overcome the problems, such as present in the relevant technologies at least to a certain extent, the present invention provides a kind of combined test dress It sets, to solve in the prior art due to the discrete test of ICT and FCT, bring human input is big, the low problem of testing efficiency.
According to a first aspect of the embodiments of the present invention, a kind of combined measuring device is provided, comprising:
Bottom plate is tested,
ICT tooling and FCT tooling are oppositely arranged on the test bottom plate, and are spaced pre-determined distance;
The ICT of the ICT tooling tests probe, different from the FCT of FCT tooling test probe height.
Preferably, the test bottom plate, comprising:
Needle bed plate is visited including the ICT needle bed plate for carrying the ICT test probe, and for carrying the FCT test The FCT needle bed plate of needle;
Upper sky plate is mounted on the needle bed plate, the part contacted for pressing pcb board to be measured with test probe;
Pressure bar plate is mounted in the upper sky plate, for fixing pressure bar;
Pallet is mounted on the pressure bar plate, for protecting pcb board to be measured.
Preferably, the pallet is set according to the size and distributing position of the pin at the pcb board back side to be measured and pad Meter and installation.
Preferably, the width of the pallet be less than pcb board to be measured width, the upper and lower edge of the pallet respectively with to Survey the upper and lower edge interval pre-determined distance of pcb board.
Preferably, the width of the pressure bar plate and the pallet is of same size.
Preferably, the pressure bar plate is removably attached in the upper sky plate by screw.
Preferably, the corresponding position of the pallet and pressure bar plate is provided with the vacant area of device resigning, and the device is stepped down Vacant area is used to step down for the component on pcb board to be tested.
Preferably, the needle bed plate is equipped with multiple spring counterbores, is equipped with spring, the spring on the spring counterbore After sequentially passing through the upper sky plate, pallet, leant out from the upper surface of the pallet.
Preferably, it is provided with linear bearing through-hole on the needle bed plate, the upper sky plate, pressure bar plate are provided on pallet With the guide rod through-hole of the linear bearing through-hole concentric;
Through there is guide rod in the linear bearing through-hole, guide rod through-hole, the guide rod is leant out from the tray upper surface;Institute Guide rod is stated for supporting the test bottom plate in test.
Preferably, positioning column counterbore, positioning column in the positioning column counterbore, the positioning column are provided on the needle bed plate It is positioned for the installation site to the upper sky plate, pressure bar plate, pallet.
Preferably, the pallet is made of black fabric plate;The pressure bar plate is made of green fiber plate;
The upper sky plate is made of green fiber plate;The needle bed plate is made of green fiber plate.
The technical solution that the embodiment of the present invention provides can include the following benefits:
By the way that ICT tooling and FCT tooling to be integrated on same test bottom plate, and is tested and visited using the ICT of different height Needle and FCT test probe, guarantee that pcb board different time contact different levels probe to be measured, ICT contact low needle when testing, FCT is surveyed Principle of readjustment, restructuring, consolidation and improvement is contacted when examination, thus realize that ICT and FCT test using the same test device, realizes ICT, FCT and merges test, Solve ICT FCT test process isolation and interference problem.
It should be understood that above general description and following detailed description be only it is exemplary and explanatory, not It can the limitation present invention.
Detailed description of the invention
The drawings herein are incorporated into the specification and forms part of this specification, and shows and meets implementation of the invention Example, and be used to explain the principle of the present invention together with specification.
Fig. 1 is a kind of structural schematic diagram of combined measuring device shown according to an exemplary embodiment;
Fig. 2 is a kind of structural schematic diagram of needle bed plate shown according to an exemplary embodiment;
Fig. 3 is a kind of upper sky plate shown according to an exemplary embodiment and the structural representation that pressure bar plate is installed together Figure;
Fig. 4 is a kind of structural schematic diagram of pressure bar plate shown according to an exemplary embodiment;
Fig. 5 is a kind of structural schematic diagram of pallet shown according to an exemplary embodiment.
Specific embodiment
Example embodiments are described in detail here, and the example is illustrated in the accompanying drawings.Following description is related to When attached drawing, unless otherwise indicated, the same numbers in different drawings indicate the same or similar elements.Following exemplary embodiment Described in embodiment do not represent all embodiments consistented with the present invention.On the contrary, they be only with it is such as appended The example of device and method being described in detail in claims, some aspects of the invention are consistent.
Fig. 1 is a kind of structural schematic diagram of combined measuring device shown according to an exemplary embodiment, as shown in Figure 1, The device includes:
Bottom plate 1 is tested,
ICT tooling 2 and FCT tooling 3 are oppositely arranged on the test bottom plate, and are spaced pre-determined distance;
The ICT of the ICT tooling tests probe, different from the FCT of FCT tooling test probe height.
Technical solution provided by the invention by the way that ICT tooling and FCT tooling to be integrated on same test bottom plate, and is adopted Probe is tested with the ICT of different height and FCT tests probe, guarantees pcb board different time contact different levels probe to be measured, ICT contacts low needle when testing, FCT contacts principle of readjustment, restructuring, consolidation and improvement when testing, thus realize that ICT and FCT test uses the same test device, Realize ICT, FCT merge test, solve ICT FCT test process isolation and interference problem.
Preferably, the test bottom plate 1, comprising:
Referring to fig. 2, needle bed plate 11, including the ICT needle bed plate for carrying ICT test probe (attached to be not shown in the figure) 111, and the FCT needle bed plate 112 for carrying FCT test probe (attached to be not shown in the figure);
Referring to Fig. 3, upper sky plate 12 is mounted on the needle bed plate 11, is contacted for pressing pcb board to be measured with test probe Part;
Referring to Fig. 3 and Fig. 4, pressure bar plate 13 is mounted in the upper sky plate 12, for fixing pressure bar;
Referring to Fig. 5, pallet 14 is mounted on the pressure bar plate 13, for protecting pcb board to be measured.
Preferably, the pallet 14 is carried out according to the size and distributing position of the pin at the pcb board back side to be measured and pad Design and installation.
Preferably, the width of the pallet 14 be less than pcb board to be measured width, the upper and lower edge of the pallet respectively with The upper and lower edge interval pre-determined distance of pcb board to be measured.
Preferably, the width of the pressure bar plate 13 and the pallet 14 is of same size.
Preferably, the pressure bar plate 13 is removably attached in the upper sky plate 12 by screw.
Preferably, the corresponding position of the pallet 14 and pressure bar plate 13 is provided with the vacant area 131 of device resigning, the device Part steps down vacant area 131 for for the component resigning on pcb board to be tested.
Preferably, the needle bed plate 11 is equipped with multiple spring counterbores, is equipped with spring, the bullet on the spring counterbore After spring sequentially passes through the upper sky plate 12, pallet 14, leant out from the upper surface of the pallet 14.
It is understood that the spring-loaded effect of peace is, allowing pallet to prop up pcb board to be measured and move up and down, pallet pushes, Needle bed plate and test probe and then push.
Preferably, linear bearing through-hole, the upper sky plate 12, pressure bar plate 13, pallet 14 are provided on the needle bed plate 11 On be provided with guide rod through-hole with the linear bearing through-hole concentric;
Through there is guide rod in the linear bearing through-hole, guide rod through-hole, the guide rod is leant out from 14 upper surface of pallet; The guide rod is used to support the test bottom plate in test.
Preferably, positioning column counterbore, positioning column in the positioning column counterbore, the positioning are provided on the needle bed plate 11 Column is for positioning the installation site of the upper sky plate 12, pressure bar plate 13, pallet 14.
Preferably, the pallet 14 is made of black fabric plate;The pressure bar plate 13 is made of green fiber plate;
The upper sky plate 12 is made of green fiber plate;The needle bed plate 11 is made of green fiber plate.
As shown from the above technical solution, technical solution provided by the invention, has the advantages that
1, cut payroll to improve efficiency: ICT on-line testing and FCT functional test merged, by original every 1 line, 3 people ICT test and 4 people FCT test, be reduced to 3 people carry out global function ICT FCT on-line testing.
2, save the cost: realized on air-conditioner controller ICT, FCT merge test, solve ICT FCT test process Isolation and interference problem, reduce the quantity of tester on production line, while having saved device cost of manufacture.By two processes Merge and completed in a process, and using if press automatic plate press, not only greatly improves testing efficiency, can cut payroll to improve efficiency, And can more quality assurance, reduce staff labor intensity.
Originally every kind of controller need to make two kinds of test fixtures of ICT, FCT, and wherein ICT tooling needs 3 sets, at cost by every set It is calculated for 1500 yuan, 4500 yuan need to be put into;FCT test needs 10 sets of toolings, calculates according to 300 yuan of every set tooling, need to put into 3000 Member;The accumulative tooling investment amount of money is 7500 yuan.After introducing this test device, it is contemplated that every set frock cost is 1700 yuan, 4 sets of toolings Total value of injecting capital into is 6800 yuan, and every kind of controller tooling saves 700 yuan.It is calculated according to 100 kinds of controllers can be surveyed, work can be saved 70,000 yuan of dress infusion of financial resources.Meanwhile it saving tooling and placing occupied space.
It is understood that same or similar part can mutually refer in the various embodiments described above, in some embodiments Unspecified content may refer to the same or similar content in other embodiments.
It should be noted that in the description of the present invention, term " first ", " second " etc. are used for description purposes only, without It can be interpreted as indication or suggestion relative importance.In addition, in the description of the present invention, unless otherwise indicated, the meaning of " multiple " Refer at least two.
Any process described otherwise above or method description are construed as in flow chart or herein, and expression includes It is one or more for realizing specific logical function or process the step of executable instruction code module, segment or portion Point, and the range of the preferred embodiment of the present invention includes other realization, wherein can not press shown or discussed suitable Sequence, including according to related function by it is basic simultaneously in the way of or in the opposite order, Lai Zhihang function, this should be of the invention Embodiment person of ordinary skill in the field understood.
It should be appreciated that each section of the invention can be realized with hardware, software, firmware or their combination.Above-mentioned In embodiment, software that multiple steps or method can be executed in memory and by suitable instruction execution system with storage Or firmware is realized.It, and in another embodiment, can be under well known in the art for example, if realized with hardware Any one of column technology or their combination are realized: having a logic gates for realizing logic function to data-signal Discrete logic, with suitable combinational logic gate circuit specific integrated circuit, programmable gate array (PGA), scene Programmable gate array (FPGA) etc..
Those skilled in the art are understood that realize all or part of step that above-described embodiment method carries It suddenly is that relevant hardware can be instructed to complete by program, the program can store in a kind of computer-readable storage medium In matter, which when being executed, includes the steps that one or a combination set of embodiment of the method.
It, can also be in addition, each functional unit in each embodiment of the present invention can integrate in a processing module It is that each unit physically exists alone, can also be integrated in two or more units in a module.Above-mentioned integrated mould Block both can take the form of hardware realization, can also be realized in the form of software function module.The integrated module is such as Fruit is realized and when sold or used as an independent product in the form of software function module, also can store in a computer In read/write memory medium.
Storage medium mentioned above can be read-only memory, disk or CD etc..
In the description of this specification, reference term " one embodiment ", " some embodiments ", " example ", " specifically show The description of example " or " some examples " etc. means specific features, structure, material or spy described in conjunction with this embodiment or example Point is included at least one embodiment or example of the invention.In the present specification, schematic expression of the above terms are not Centainly refer to identical embodiment or example.Moreover, particular features, structures, materials, or characteristics described can be any One or more embodiment or examples in can be combined in any suitable manner.
Although the embodiments of the present invention has been shown and described above, it is to be understood that above-described embodiment is example Property, it is not considered as limiting the invention, those skilled in the art within the scope of the invention can be to above-mentioned Embodiment is changed, modifies, replacement and variant.

Claims (11)

1. a kind of combined measuring device characterized by comprising
Bottom plate is tested,
ICT tooling and FCT tooling are oppositely arranged on the test bottom plate, and are spaced pre-determined distance;
The ICT of the ICT tooling tests probe, different from the FCT of FCT tooling test probe height.
2. the apparatus according to claim 1, which is characterized in that the test bottom plate, comprising:
Needle bed plate, including the ICT needle bed plate for carrying the ICT test probe, and for carrying the FCT test probe FCT needle bed plate;
Upper sky plate is mounted on the needle bed plate, the part contacted for pressing pcb board to be measured with test probe;
Pressure bar plate is mounted in the upper sky plate, for fixing pressure bar;
Pallet is mounted on the pressure bar plate, for protecting pcb board to be measured.
3. the apparatus of claim 2, which is characterized in that
The pallet is designed and installs according to the size and distributing position of the pin at the pcb board back side to be measured and pad.
4. the apparatus of claim 2, which is characterized in that
The width of the pallet be less than pcb board to be measured width, the upper and lower edge of the pallet respectively with pcb board to be measured it is upper, Lower edge interval pre-determined distance.
5. device according to claim 4, which is characterized in that
The width of the pressure bar plate is of same size with the pallet.
6. the apparatus of claim 2, which is characterized in that
The pressure bar plate is removably attached in the upper sky plate by screw.
7. the apparatus of claim 2, which is characterized in that
The corresponding position of the pallet and pressure bar plate is provided with the vacant area of device resigning, and the device steps down vacant area for being Component on pcb board to be tested is stepped down.
8. the apparatus of claim 2, which is characterized in that
The needle bed plate is equipped with multiple spring counterbores, is equipped with spring on the spring counterbore, the spring sequentially passes through institute After stating sky plate, pallet, leant out from the upper surface of the pallet.
9. the apparatus of claim 2, which is characterized in that
It is provided with linear bearing through-hole on the needle bed plate, the upper sky plate, pressure bar plate are provided with and the linear axis on pallet Hold the guide rod through-hole of through-hole concentric;
Through there is guide rod in the linear bearing through-hole, guide rod through-hole, the guide rod is leant out from the tray upper surface;It is described to lead Bar is used to support the test bottom plate in test.
10. the apparatus of claim 2, which is characterized in that
Positioning column counterbore, positioning column in the positioning column counterbore are provided on the needle bed plate, the positioning column is used for described Upper sky plate, pressure bar plate, pallet installation site positioned.
11. the apparatus of claim 2, which is characterized in that
The pallet is made of black fabric plate;The pressure bar plate is made of green fiber plate;
The upper sky plate is made of green fiber plate;The needle bed plate is made of green fiber plate.
CN201811408454.7A 2018-11-23 2018-11-23 A kind of combined measuring device Pending CN109444715A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201811408454.7A CN109444715A (en) 2018-11-23 2018-11-23 A kind of combined measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201811408454.7A CN109444715A (en) 2018-11-23 2018-11-23 A kind of combined measuring device

Publications (1)

Publication Number Publication Date
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CN201811408454.7A Pending CN109444715A (en) 2018-11-23 2018-11-23 A kind of combined measuring device

Country Status (1)

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Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102749484A (en) * 2012-07-20 2012-10-24 昆山迈致治具科技有限公司 Online test fixture
CN202649367U (en) * 2012-05-08 2013-01-02 Tcl王牌电器(惠州)有限公司 PCB testing device
CN103033738A (en) * 2012-12-20 2013-04-10 全天自动化能源科技(东莞)有限公司 Automatic test system for circuit board
CN104049201A (en) * 2014-06-26 2014-09-17 珠海格力电器股份有限公司 Testing method, device and system for printed circuit boards
CN104237765A (en) * 2013-06-14 2014-12-24 珠海格力电器股份有限公司 FCT automatic test system integrated on ICT device
CN205091435U (en) * 2015-02-14 2016-03-16 重庆汇韬电气有限公司 PCB testing arrangement
CN209560036U (en) * 2018-11-23 2019-10-29 格力电器(武汉)有限公司 A kind of combined measuring device

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN202649367U (en) * 2012-05-08 2013-01-02 Tcl王牌电器(惠州)有限公司 PCB testing device
CN102749484A (en) * 2012-07-20 2012-10-24 昆山迈致治具科技有限公司 Online test fixture
CN103033738A (en) * 2012-12-20 2013-04-10 全天自动化能源科技(东莞)有限公司 Automatic test system for circuit board
CN104237765A (en) * 2013-06-14 2014-12-24 珠海格力电器股份有限公司 FCT automatic test system integrated on ICT device
CN104049201A (en) * 2014-06-26 2014-09-17 珠海格力电器股份有限公司 Testing method, device and system for printed circuit boards
CN205091435U (en) * 2015-02-14 2016-03-16 重庆汇韬电气有限公司 PCB testing arrangement
CN209560036U (en) * 2018-11-23 2019-10-29 格力电器(武汉)有限公司 A kind of combined measuring device

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