CN105974210A - Clamping tool for antenna test and test method - Google Patents

Clamping tool for antenna test and test method Download PDF

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Publication number
CN105974210A
CN105974210A CN201610397168.XA CN201610397168A CN105974210A CN 105974210 A CN105974210 A CN 105974210A CN 201610397168 A CN201610397168 A CN 201610397168A CN 105974210 A CN105974210 A CN 105974210A
Authority
CN
China
Prior art keywords
test
sample
electrical property
testing sample
limit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201610397168.XA
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Chinese (zh)
Inventor
毕晔海
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shenzhen Sunway Communication Co Ltd
Original Assignee
Shenzhen Sunway Communication Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shenzhen Sunway Communication Co Ltd filed Critical Shenzhen Sunway Communication Co Ltd
Priority to CN201610397168.XA priority Critical patent/CN105974210A/en
Publication of CN105974210A publication Critical patent/CN105974210A/en
Pending legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08Measuring electromagnetic field characteristics
    • G01R29/10Radiation diagrams of antennas
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets

Abstract

The invention provides a clamping tool for an antenna test and a test method. The clamping tool comprises a seat body, a pressing device and at least two electric performance detection main boards and at least two sets of fixing devices. The design of the clamping tool enables tests for limit samples and samples to be tested to be performed synchronously. A threshold value obtained through testing the limit samples under a same state can be used for determining whether the sample to be tested is qualified or not. The clamping tool and the test method reduce the test and determination errors which are caused by fluctuation in stability of the test clamping tool to the maximum, and improve detection precision.

Description

A kind of antenna measurement fixture and method of testing
Technical field
The present invention relates to domain of communication equipment, particularly relate to a kind of antenna measurement fixture and method of testing.
Background technology
At present, antenna production firm, when product export is checked, all can use the case detection of electrical property full procuratorial organ to produce The electrical property of product.Specifically, survey according to element designs antennas such as the profile of product, line form, performances Examination fixture, fixture is connected on test instrunment, is then placed on test fixture by product to be measured, and fixture is solid Surely, after living product to be measured, test can be started.Before test, first a limit product is tested, with it Test parameter is as test gate limit value.During test, test instrunment is connected with controlling computer, setup control computer In threshold value, compare test result and threshold value to judge the whether the most satisfied requirement of dispatching from the factory of institute's survey properties of product. Yet with machining accuracy, assembling tolerance, use the factors such as abrasion that the stability of test fixture can be caused to decline, There is fluctuation in test data.As it is shown in figure 1, threshold range determined by limit sample test first is arrow Shown in scope, product test result falls at A to A ' be then judged to certified products in interval, falling is outside interval Defective work.After test fixture stability declines, test limits sample again, it is found that limit sample Test value changes so that real threshold range becomes the interval of B to B '.But owing to threshold value sets Will not often change after Ding, still can be judged as in A to B interval if the test result of testing sample falls Certified products, falling then can be judged as defective work in A ' to B ' interval, the most real district Between have been changed to actual should being judged as defective work of the interval product of B to B ', such A to B and close Lattice product, product interval for A ' to B ' is actual should be judged as defective work for certified products.If so still Using the threshold value that records at first as criterion, it may appear that test result judges inaccurate, waste is caused to be closed Lattice product and the risk of outflow defective work.
Summary of the invention
The technical problem to be solved is: cause waste to be closed owing to antenna measurement fixture stability declines Lattice product and the phenomenon of outflow defective work.
In order to solve above-mentioned technical problem, the technical solution used in the present invention is: a kind of antenna measurement fixture, Including pedestal, press fit device, also include at least two pieces of electrical property detection mainboards and at least two sleeve fixture mechanisms.
Further, including two pieces of electrical property detection mainboards and two sleeve fixture mechanisms, it is respectively used to testing sample With limit sample test.
Further, described electrical property detection mainboard includes printed circuit board, test cable and contacts device.
Further, the performance of described at least two pieces of electrical properties detection mainboard is identical.
Further, described electrical property detection mainboard is side by side or a point discharge is put.
Further, fixing device and electrical property detection mainboard one_to_one corresponding.
The present invention also uses a kind of antenna test method based on above-mentioned antenna measurement fixture, including walking as follows Rapid:
Limit sample and testing sample are respectively placed in fixing device;
Relatively limit sample and the test result of testing sample, and determine that testing sample is the most qualified.
Further, " compare the test result of limit sample and testing sample, and determine whether testing sample closes Lattice " particularly as follows:
Using the test result of limit sample as when time threshold value of test, if the test result of testing sample surpasses Go out described threshold value, be then judged to defective work, be otherwise judged to certified products.
The beneficial effects of the present invention is: the environment of test limits sample and state and the ring of test testing sample Border is identical with state, judges the whether qualified of testing sample with testing the threshold value obtained under same state, Avoid the stability test that brings of fluctuation and the error in judgement of test fixture self, improve detection precision.
Accompanying drawing explanation
Fig. 1 is that in prior art, fixture instability causes threshold value scope fluctuation schematic diagram;
Fig. 2 is that test sample detects mainboard relative position relation figure with electrical property;
Fig. 3 is limit sample and testing sample relative position relation figure in the present invention;
Fig. 4 is electric performance test system block diagram of the present invention;
Fig. 5 is electric performance test flow chart of the present invention;
Label declaration:
1, printed circuit board;2, test cable;3, contact device;4, test sample; 10, electrical property detection mainboard;11, limit sample;12, testing sample;13, electrical property inspection Survey mainboard 1#;14, electrical property detection mainboard 2#.
Detailed description of the invention
By describing the technology contents of the present invention in detail, being realized purpose and effect, below in conjunction with embodiment also Accompanying drawing is coordinated to be explained.
The design of most critical of the present invention is: be provided with at least two pieces of electrical property detection mainboards on antenna measurement fixture At least two sleeve fixture mechanisms, this design makes the test of limit sample and testing sample to carry out simultaneously, The whether qualified of testing sample is judged, it is to avoid test fixture with testing the threshold value obtained under same state The stability test that brings of fluctuation of self and error in judgement, improve detection precision.
Refer to Fig. 2 and Fig. 3, a kind of antenna measurement fixture, including pedestal, press fit device, also include to Few two pieces of electrical properties detection mainboard and at least two sleeve fixture mechanisms.
Seen from the above description, the beneficial effects of the present invention is: threshold value is carried out real-time update, with same The threshold value that under one state, test limits sample obtains is to judge the whether qualified of testing sample, largely Reduce the stability test that brings of fluctuation and the error in judgement of test fixture self, improve detection precision.
Further, described antenna measurement fixture includes two pieces of electrical property detection mainboards and two sleeve fixture mechanisms, It is respectively used to testing sample and limit sample test.
Further, described electrical property detection mainboard includes printed circuit board, test cable and contacts device.
Further, the performance of described at least two pieces of electrical properties detection mainboard is identical.
Seen from the above description, it is ensured that the performance of electrical property detection mainboard is identical, to guarantee limit sample The same with the detection environment of testing sample, be conducive to accurately obtaining test result, judge.
Further, described electrical property detection mainboard is side by side or a point discharge is put.
Seen from the above description, under conditions of each electrical property detection main board work is independent of each other, Wo Menke With as desired to put electrical property detection mainboard.
Further, described fixing device detects mainboard one_to_one corresponding with described electrical property.
Seen from the above description, the position of fixing device, quantity are all corresponding with electrical property detection mainboard, with Fixed test sample the most in the same way, it is provided that identical test environment.
Refer to Fig. 4 and Fig. 5, the method for testing of a kind of antenna measurement fixture, comprise the steps:
Limit sample and testing sample are respectively placed in fixing device;
Relatively limit sample and the test result of testing sample, and determine that testing sample is the most qualified.
Further, " compare the test result of limit sample and testing sample, and determine whether testing sample closes Lattice " particularly as follows:
Using the test result of limit sample as when time threshold value of test, if the test result of testing sample surpasses Go out described threshold value, be then judged to defective work, be otherwise judged to certified products.
Refer to Fig. 2 to Fig. 4, embodiments of the invention one are: a kind of antenna measurement fixture, including pedestal, Press fit device, also includes two pieces of electrical property detection mainboards 10 and two sleeve fixture mechanisms, is respectively used to limit sample 11 tests and testing sample 12 are tested.
As in figure 2 it is shown, described electrical property detection mainboard 10 includes printed circuit board 1, test cable 2 and connects Touch device 3.The size of printed circuit board 1 customizes design according to the different performances of product to be tested, size difference. Test cable 2 main body is welded on printed circuit board 1, and one end is used for connecting test equipment, and the other end connects Contact device 3.One end connecting test cable 2 of contact device 3, the other end is used for engaged test sample 4.
As it is shown on figure 3, the performance of described electrical property detection mainboard 1#13 and electrical property detection mainboard 2#14 is complete Exactly the same, to guarantee that limit sample 11 is the same with the detection environment of testing sample 12, be conducive to obtaining exactly To test result, judge.The detection mainboard 1#13 of electrical property shown in Fig. 3 and electrical property detection mainboard 2#14 is arranged side by side, but discharge also can be divided to put, to meet different needs.The position of described fixing device, Quantity is all corresponding with electrical property detection mainboard 1#13 and electrical property detection mainboard 2#14, in order to same Mode fixed test sample, it is provided that identical test environment.
The method of testing of above-mentioned antenna measurement fixture is described below, and as shown in Figure 4 and Figure 5, test starts Before, first limit sample is positioned in the fixing device of correspondence, then product to be tested is positioned over the fixing dress of correspondence In putting;After fixing, tool press fit device is promoted to make testing sample and the most corresponding electricity of limit sample Performance detection mainboard contact, test instrunment is respectively by testing sample test access and limit sample test path Test performance obtains parameter;The test data of testing sample and limit sample are passed to computer respectively, and computer is surveyed The examination limit sample result that this recorded of software is set to threshold value, then by the test result of product to be tested and door Limit value compares, and makes and whether qualified judging;After having judged, unclamp fixture press fit device, keep limit sample Product are motionless, take off the testing sample this time tested, and change next product to be tested, start next round test.
In the present embodiment, one or more limit sample test path and testing sample test can be had logical Road, when there being multiple limit sample test path, the meansigma methods calculating each limit sample tests is made For threshold value;When there being multiple testing sample test access, then can multiple testing samples be closed simultaneously Whether lattice judge, improve and judge efficiency.Meanwhile, the limit sample that this method of testing uses has useful life, When front and back, twice test fluctuation more than 10% or confirms some position of limit sample because life-time service has substantially The phenomenon such as abrasion time, change limit sample, the fresh sample of replacing is together to select when selected limit sample The identical sample of performance.
In sum, a kind of antenna measurement fixture of present invention offer and method of testing, including pedestal, pressure Locking device, also includes at least two pieces of electrical property detection mainboards and at least two sleeve fixture mechanisms, and this design makes The test of limit sample and testing sample can carry out simultaneously, obtains with test limits sample under same state Threshold value judges the whether qualified of testing sample, reduces the stability of test fixture self to the full extent The test that brings of fluctuation and error in judgement, improve detection precision, and also can promote detector efficiency.
The foregoing is only embodiments of the invention, not thereby limit the scope of the claims of the present invention, every profit The equivalents made by description of the invention and accompanying drawing content, or directly or indirectly it is used in relevant technology Field, is the most in like manner included in the scope of patent protection of the present invention.

Claims (8)

1. an antenna measurement fixture, including pedestal, press fit device, it is characterised in that also include at least Two pieces of electrical property detection mainboards and at least two sleeve fixture mechanisms.
Antenna measurement fixture the most according to claim 1, it is characterised in that include two pieces of electrical properties Detection mainboard and two sleeve fixture mechanisms, be respectively used to testing sample and limit sample test.
Antenna measurement fixture the most according to claim 1, it is characterised in that described electrical property detects Mainboard includes printed circuit board, test cable and contacts device.
4. according to the antenna measurement fixture described in any one of claim 1-3, it is characterised in that described extremely The performance of few two pieces of electrical properties detection mainboard is identical.
5. according to the antenna measurement fixture described in any one of claims 1 to 3, it is characterised in that described Electrical property detection mainboard is side by side or a point discharge is put.
6. according to the antenna measurement fixture described in any one of claims 1 to 3, it is characterised in that described Fixing device and electrical property detection mainboard one_to_one corresponding.
7. an antenna test method based on the antenna measurement fixture described in any one of claim 1-6, It is characterized in that, comprise the steps:
Limit sample and testing sample are respectively placed in fixing device;
Relatively limit sample and the test result of testing sample, and determine that testing sample is the most qualified.
Antenna test method the most according to claim 7, it is characterised in that: " compare limit sample and treat The test result of test sample product, and determine that testing sample is the most qualified " particularly as follows:
Using the test result of limit sample as when time threshold value of test, if the test result of testing sample surpasses Go out described threshold value, be then judged to defective work, be otherwise judged to certified products.
CN201610397168.XA 2016-06-07 2016-06-07 Clamping tool for antenna test and test method Pending CN105974210A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201610397168.XA CN105974210A (en) 2016-06-07 2016-06-07 Clamping tool for antenna test and test method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201610397168.XA CN105974210A (en) 2016-06-07 2016-06-07 Clamping tool for antenna test and test method

Publications (1)

Publication Number Publication Date
CN105974210A true CN105974210A (en) 2016-09-28

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106249060A (en) * 2016-09-30 2016-12-21 美的智慧家居科技有限公司 Radio frequency testing device, data processing method and equipment, radio frequency test system

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07191122A (en) * 1993-12-27 1995-07-28 Nec Corp Loop probe calibrating method and its calibrating jig
JP2008089547A (en) * 2006-10-05 2008-04-17 Fujitsu Ltd Emi measuring method and emi measuring tool
CN101988938A (en) * 2009-08-07 2011-03-23 环旭电子股份有限公司 Antenna test system, test method and test tool
CN101995520A (en) * 2009-08-10 2011-03-30 深圳富泰宏精密工业有限公司 Antenna testing device and antenna testing method
CN103605033A (en) * 2013-11-29 2014-02-26 北京无线电计量测试研究所 Cross-frequency-band electromagnetic property measuring device and method of X band antennas
CN204964646U (en) * 2015-09-02 2016-01-13 深圳市信维通信股份有限公司 Antenna testing arrangement
CN105548776A (en) * 2016-01-27 2016-05-04 云南电网有限责任公司电力科学研究院 System and method for radio frequency detection and antenna detection for electric power
CN105606913A (en) * 2015-09-02 2016-05-25 深圳市信维通信股份有限公司 Antenna testing device
CN205749694U (en) * 2016-06-07 2016-11-30 深圳市信维通信股份有限公司 A kind of antenna measurement fixture

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07191122A (en) * 1993-12-27 1995-07-28 Nec Corp Loop probe calibrating method and its calibrating jig
JP2008089547A (en) * 2006-10-05 2008-04-17 Fujitsu Ltd Emi measuring method and emi measuring tool
CN101988938A (en) * 2009-08-07 2011-03-23 环旭电子股份有限公司 Antenna test system, test method and test tool
CN101995520A (en) * 2009-08-10 2011-03-30 深圳富泰宏精密工业有限公司 Antenna testing device and antenna testing method
CN103605033A (en) * 2013-11-29 2014-02-26 北京无线电计量测试研究所 Cross-frequency-band electromagnetic property measuring device and method of X band antennas
CN204964646U (en) * 2015-09-02 2016-01-13 深圳市信维通信股份有限公司 Antenna testing arrangement
CN105606913A (en) * 2015-09-02 2016-05-25 深圳市信维通信股份有限公司 Antenna testing device
CN105548776A (en) * 2016-01-27 2016-05-04 云南电网有限责任公司电力科学研究院 System and method for radio frequency detection and antenna detection for electric power
CN205749694U (en) * 2016-06-07 2016-11-30 深圳市信维通信股份有限公司 A kind of antenna measurement fixture

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106249060A (en) * 2016-09-30 2016-12-21 美的智慧家居科技有限公司 Radio frequency testing device, data processing method and equipment, radio frequency test system

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Application publication date: 20160928