CN106093742A - A kind of LED test acupuncture treatment method for correcting position and device - Google Patents
A kind of LED test acupuncture treatment method for correcting position and device Download PDFInfo
- Publication number
- CN106093742A CN106093742A CN201610394527.6A CN201610394527A CN106093742A CN 106093742 A CN106093742 A CN 106093742A CN 201610394527 A CN201610394527 A CN 201610394527A CN 106093742 A CN106093742 A CN 106093742A
- Authority
- CN
- China
- Prior art keywords
- led
- core particle
- probe
- electrodes
- led core
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
Abstract
The invention discloses a kind of LED test acupuncture treatment method for correcting position and device, the method comprises the steps: the position of two electrodes in each LED core particle on LED core particle plate is identified record;On the basis of the first LED core particle, calculate two electrodes and the position deviation of the first LED core particle of second LED core particle adjacent with the first LED core particle;The work platforms of carrying LED core particle plate is moved in the position of two electrodes according to the first LED core particle makes two electrodes of the first LED core particle be respectively aligned to a LED probe and the 2nd LED probe;Move first according to position deviation to move LED probe and second and move LED probe and make two electrodes of the second LED core particle be respectively aligned to first to move LED probe and second and move LED probe;Drive work platforms to rise along Z-direction, make two electrodes of the first LED core particle, two electrodes of the second LED core particle contact with corresponding LED probe respectively.
Description
[technical field]
The present invention relates to a kind of LED test acupuncture treatment method for correcting position and device.
[background technology]
Existing LED test acupuncture treatment position correction apparatus the most only has a pair (two) LED probe, is carrying out LED core
During grain acupuncture treatment test, a LED core particle can only be completed test every time.So inefficiency of test.
[summary of the invention]
In order to improve LED core particle testing efficiency, need to increase the LED probe of more pairs, but find to increase through research
LED probe is to rear, and there are the following problems:
As it is shown in figure 1, be ideally, LED core particle plate is the state of each core particles after cutting, and existing LED surveys
Examination acupuncture treatment position correction apparatus only has the LED probe (not having motor to drive) of a pair (two) manually regulation, the most only
One LED core particle can be carried out acupuncture treatment test, at this time can by mobile working platform 5 X and Y-direction movement (in advance
In the case of the relative position of the relative position and the two of LED core particle electrodes that regulate a pair LED probe matches) so that
Two LED probes are respectively aligned to two electrodes of LED core particle.In order to improve testing efficiency, need to increase another pair LED and visit
Pin, but, if simply increasing the LED probe (not there is motor drive) manually regulated a pair, when LED core particle plate is cut
After there is situation as shown in Figure 3, there are the position deviations such as rotation relative to adjacent LED core particle in the position of some LED core particle,
After making first pair of LED probe be respectively aligned to two electrodes of a LED core particle by regulation work platforms 5, second couple of LED
Probe cannot be directed at two electrodes of the LED core particle on side, causes substantially making first pair of LED probe and second couple of LED
Probe completes acupuncture treatment test simultaneously.
In order to overcome the deficiencies in the prior art, the invention provides a kind of LED test acupuncture treatment method for correcting position and device,
While improving LED core particle testing efficiency, it is ensured that the effectiveness of test.
A kind of LED test acupuncture treatment method for correcting position, comprises the steps:
S1, position to two electrodes in each LED core particle on LED core particle plate are identified record, wherein, described
LED core particle plate have passed through multiple LED core particle that cutting obtains being separated from each other;
S2, on the basis of the first LED core particle, calculate two electricity of second LED core particle adjacent with described first LED core particle
Pole and the position deviation of described first LED core particle;
S3, according to the position of two electrodes of described first LED core particle and a LED probe and the 2nd LED probe
Position, moves the work platforms carrying described LED core particle plate, makes two electrodes of the first LED core particle in X-direction and/or Y-direction
It is respectively aligned to a LED probe and the 2nd LED probe;
S4, move LED probe and second according to described position deviation and first and move the position of LED probe, in X side
To and/or Y-direction move first and move LED probe and second and move LED probe so that two electricity of described second LED core particle
Pole is respectively aligned to first and moves LED probe and second and move LED probe;
S5, drive described work platforms to rise along Z-direction, make two electrodes of the first LED core particle, the second LED core particle
Two electrodes contact with corresponding LED probe respectively.
In one embodiment,
Contact with corresponding LED probe respectively at two electrodes of the first LED core particle, two electrodes of the second LED core particle
After, control first is moved LED probe and is returned to the first initial point, and control second is moved LED probe and returned to the second initial point.
In one embodiment,
Utilize image-recognizing method that the position of the electrode in LED core particle is identified.
In one embodiment,
Described position deviation includes grid deviation and angular deviation.
Present invention also offers a kind of LED test acupuncture treatment position correction apparatus, including: picture sweep unit, control unit,
Work platforms, a LED probe, the 2nd LED probe, first move LED probe, second move LED probe;
Described picture sweep unit is used for,
The position of two electrodes in each LED core particle on LED core particle plate is identified record, wherein, described LED
Core particles plate have passed through multiple LED core particle that cutting obtains being separated from each other;
Described control unit is used for,
On the basis of the first LED core particle, calculate two electrodes of second LED core particle adjacent with described first LED core particle
Position deviation with described first LED core particle;
The position of two electrodes according to described first LED core particle and a LED probe and the position of the 2nd LED probe
Putting, the work platforms controlling to carry described LED core particle plate in X-direction and/or Y-direction moves, and makes two electricity of the first LED core particle
Pole is respectively aligned to a LED probe and the 2nd LED probe;
Move LED probe and second according to described position deviation and first and move the position of LED probe, in X-direction
And/or Y-direction controls first and moves LED probe and second and move LED probe and move so that two of described second LED core particle
Electrode is respectively aligned to first and moves LED probe and second and move LED probe, then controls described work platforms and rises along Z-direction,
Make two electrodes of the first LED core particle, two electrodes of the second LED core particle contact with corresponding LED probe respectively.
In one embodiment,
Described control unit is additionally operable to, in two electrodes, two electrodes difference of the second LED core particle of the first LED core particle
After contacting with corresponding LED probe,
Control first is moved LED probe and is returned to the first initial point, and control second is moved LED probe and returned to the second initial point.
In one embodiment,
Also including that first moves LED prober, described first moves LED prober includes a Y side
Motor, Y-direction Mobile base, X-direction Mobile base, described first Y-direction is driven to drive motor to driving motor, the first X-direction
Output shaft fixes described Y-direction Mobile base, and described Y-direction Mobile base is provided with X-direction chute, and described first X-direction drives electricity
The output shaft of machine fixes described X-direction Mobile base, and described X-direction Mobile base can move along described X-direction chute, and described first moves
Dynamic LED probe is fixed on described X-direction Mobile base.
In one embodiment,
Also include moving the X-direction displacement detector of LED probe X-direction displacement and for examining for detection first
Survey the first Y-direction displacement detector moving LED probe Y-direction displacement.
In one embodiment,
Also including that second moves LED prober, described second moves LED prober includes the 2nd Y side
Motor, Y-direction Mobile base, X-direction Mobile base, described second Y-direction is driven to drive motor to driving motor, the second X-direction
Output shaft fixes described Y-direction Mobile base, and described Y-direction Mobile base is provided with X-direction chute, and described second X-direction drives electricity
The output shaft of machine fixes described X-direction Mobile base, and described X-direction Mobile base can move along described X-direction chute, and described second moves
Dynamic LED probe is fixed on described X-direction Mobile base.
In one embodiment,
Also include moving the X-direction displacement detector of LED probe X-direction displacement and for examining for detection second
Survey the second Y-direction displacement detector moving LED probe Y-direction displacement.
The invention has the beneficial effects as follows:
The present invention can not only improve the efficiency of LED core particle acupuncture treatment test, also is able to ensure LED probe alignment LED simultaneously
The electrode of core particles, is precisely accomplished acupuncture treatment test.
[accompanying drawing explanation]
Fig. 1 be ideally LED core particle plate through cutting after schematic diagram
Fig. 2 is that ideally LED core particle plate carries out LED acupuncture treatment test schematic diagram after cutting
Fig. 3 be in some cases LED core particle plate through cutting after schematic diagram
Fig. 4 be in existing LED test acupuncture treatment position correction apparatus simple increase LED probe to after acupuncture treatment test show
It is intended to
Fig. 5 is that in an embodiment of the present invention, LED core particle plate carries out LED acupuncture treatment test schematic diagram after cutting
Fig. 6 is the LED test acupuncture treatment position correction apparatus of an embodiment of the present invention
Fig. 7 is the LED test acupuncture treatment position correction apparatus part-structure schematic diagram of Fig. 6
Fig. 8 is the other visual angle schematic diagram of the LED test acupuncture treatment position correction apparatus part-structure of Fig. 7
[detailed description of the invention]
Preferred embodiment to invention is described in further detail below.
If Fig. 6 is to shown in 8, a kind of LED test acupuncture treatment position correction apparatus, including: picture sweep unit 7, control unit,
Work platforms the 5, the oneth LED probe the 1, the 2nd LED probe 2, first move LED probe 41, second move LED probe 3.
Work platforms 5 is used for carrying LED core particle plate, can drive LED core particle under the driving of work platforms driving means 6
Plate moves at X, Y and Z-direction.
Described picture sweep unit 7 is used for, on the position of each core particles on LED core particle plate and each LED core particle
The position of two electrodes be identified record.Wherein, what described LED core particle plate have passed through that cutting obtains being separated from each other is multiple
LED core particle.
Oneth LED probe 1 and the 2nd LED probe 2 do not have motor driver, and both positions are usually fixing
, and first moves LED probe 41 and second and moves LED probe 3 and have corresponding motor driver, can be drive edge
X-direction and Y-direction move.
LED test acupuncture treatment position correction apparatus can include first move LED prober and second move LED visit
Needle actuating device, first move LED prober and second move the structure of LED prober can be identical.With
As a example by first moves LED prober, described first moves LED prober includes that the first Y-direction drives motor
42, the first X-direction drives motor 45, Y-direction Mobile base 47, X-direction Mobile base 46, described first Y-direction to drive motor 42
Output shaft fixes described Y-direction Mobile base 47, and described Y-direction Mobile base 47 is provided with X-direction chute, and described first X-direction is driven
The output shaft of galvanic electricity machine 45 fixes described X-direction Mobile base 46, and described X-direction Mobile base 46 can move along described X-direction chute,
Described first moves LED probe 41 is fixed on described X-direction Mobile base 46.
First moves LED prober also includes moving the X-direction of LED probe X-direction displacement for detection first
Displacement detector 48 and the Y-direction displacement detector 44 moving LED probe Y-direction displacement for detection first, its
In, X-direction displacement detector 48 can be fixed on Y-direction Mobile base 47, and Y-direction displacement detector 44 may be mounted at
In mounting seat 43.
In one embodiment, the LED test acupuncture treatment position correction side of above-mentioned LED test acupuncture treatment position correction apparatus is utilized
Method, comprises the steps:
S1, picture sweep unit 7 can utilize image-recognizing method, to two in each LED core particle on LED core particle plate
The position of individual electrode is identified record, and wherein, before this, described LED core particle plate have passed through what cutting obtained being separated from each other
Multiple LED core particle.LED core particle plate originally is a monoblock, and multiple LED core particle is distributed above, owing to needs cut into many
Individual LED core particle, after cutting LED core particle, the position of some LED core particle there will be movement, if Fig. 3 is to shown in 5, second
LED core particle L2 occurs in that a position deviation relative to the first LED core particle L1.Described position deviation includes grid deviation and angle
Deviation, so-called grid deviation refers to that the coordinate deviation relative to the first LED core particle L1 of electrode, so-called angular deviation refer to the angle of electrode
Spend the deviation relative to the first LED core particle L1.
S2, control unit, on the basis of the first LED core particle L1, calculate twoth LED adjacent with described first LED core particle L1
Two electrodes of core particles L2 and the position deviation of described first LED core particle L1.Specifically, can be with in the first LED core particle L1
On the basis of the heart, it is also possible on the basis of two electrodes of the first LED core particle L1 or certain part, calculate described position deviation.
S3, control unit are according to the position of two electrodes of described first LED core particle L1 and a LED probe 1 and
The position of two LED probes 2, the work platforms 5 controlling to carry described LED core particle plate moves in X-direction and/or Y-direction, makes first
Two electrodes of LED core particle L1 are respectively aligned to LED probe 1 and a 2nd LED probe 2.
S4, control unit move LED probe 41 and second according to described position deviation and first and move LED probe 3
Position, controls first and moves LED probe 41 and second and move LED probe 3 and move in X-direction and/or Y-direction so that described the
Two electrodes of two LED core particle L2 are respectively aligned to first and move LED probe L1 and second and move LED probe 3.
Owing to after the step of S3, the absolute position of the second LED core particle L2 also there occurs change, but due to second
LED core particle L2 and the first LED core particle L1 are all on work platforms 5, and the displacement that both move in step s3 is identical, because of
This, with the first LED core particle L1 as reference, move first further according to described position deviation and move LED probe 41 and the second shifting
Dynamic LED probe 3, so that two electrodes of described second LED core particle L2 are respectively aligned to first moves LED probe 41 and second
Mobile LED probe 3.So far, the electrode of the first LED core particle L1 and the second LED core particle L2 all targeted by X-direction and Y-direction right
The LED probe answered.
S5, drive described work platforms 5 along Z-direction rise, make two electrodes of the first LED core particle L1, the second LED core particle
Two electrodes of L2 contact with corresponding LED probe respectively, thus complete acupuncture treatment test.
S6, visit with corresponding LED respectively at two electrodes of two electrodes of the first LED core particle L1, the second LED core particle L2
After pin contact, control unit controls first and moves LED probe 41 and return to the first initial point, controls second and moves LED probe 3 and return to the
Two initial points, when two LED core particle organizing next carry out acupuncture treatment test, can drive according to the position deviation calculated
First moves LED probe 41 and second moves LED probe 3 and moves.
The X-direction displacement of the mobile LED probe 1 of X-direction displacement detector 48 detection, Y-direction displacement detector 44 is examined
Surveying mobile LED probe Y-direction displacement, the mobile LED probe of controller control, can be so that moving towards a mobile contrary displacement
Dynamic LED probe returns to initial point.
Above content is to combine concrete preferred implementation further description made for the present invention, it is impossible to assert
Being embodied as of the present invention is confined to these explanations.For general technical staff of the technical field of the invention,
On the premise of present inventive concept, it is also possible to make some simple deduction or replace, all should be considered as belonging to the present invention by
The scope of patent protection that the claims submitted to determine.
Claims (10)
1. a LED test acupuncture treatment method for correcting position, is characterized in that, comprise the steps:
S1, position to two electrodes in each LED core particle on LED core particle plate are identified record, wherein, and described LED
Core particles plate have passed through multiple LED core particle that cutting obtains being separated from each other;
S2, on the basis of the first LED core particle, calculate two electrodes of second LED core particle adjacent with described first LED core particle with
The position deviation of described first LED core particle;
S3, according to the position of two electrodes of described first LED core particle and a LED probe and the position of the 2nd LED probe
Put, move the work platforms carrying described LED core particle plate in X-direction and/or Y-direction, make two electrodes of the first LED core particle divide
Dui Zhun a LED probe and the 2nd LED probe;
S4, move LED probe and second according to described position deviation and first and move the position of LED probe, X-direction and/
Or Y-direction moves first and moves LED probe and second and move LED probe so that two electrodes of described second LED core particle are respectively
Alignment first moves LED probe and second and moves LED probe;
S5, drive described work platforms along Z-direction rise, make two electrodes of the first LED core particle, two of the second LED core particle
Electrode contacts with corresponding LED probe respectively.
2. LED test acupuncture treatment method for correcting position as claimed in claim 1, is characterized in that:
After two electrodes of the first LED core particle, two electrodes of the second LED core particle contact with corresponding LED probe respectively, control
System first moves LED probe and returns to the first initial point, and control second is moved LED probe and returned to the second initial point.
3. LED test acupuncture treatment method for correcting position as claimed in claim 1, is characterized in that:
Utilize image-recognizing method that the position of the electrode in LED core particle is identified.
4. LED test acupuncture treatment method for correcting position as claimed in claim 1, is characterized in that:
Described position deviation includes grid deviation and angular deviation.
5. a LED test acupuncture treatment position correction apparatus, is characterized in that, including: picture sweep unit, control unit, work are put down
Platform, a LED probe, the 2nd LED probe, first move LED probe, second move LED probe;
Described picture sweep unit is used for,
The position of two electrodes in each LED core particle on LED core particle plate is identified record, wherein, described LED core particle
Plate have passed through multiple LED core particle that cutting obtains being separated from each other;
Described control unit is used for,
On the basis of the first LED core particle, calculate two electrodes and the institute of second LED core particle adjacent with described first LED core particle
State the position deviation of the first LED core particle;
The position of two electrodes according to described first LED core particle and a LED probe and the position of the 2nd LED probe,
X-direction and/or Y-direction control to carry the work platforms of described LED core particle plate and move, and make two electrodes of the first LED core particle divide
Dui Zhun a LED probe and the 2nd LED probe;
Move LED probe and second according to described position deviation and first and move the position of LED probe, at X-direction and/or Y
Direction controlling first moves LED probe and second and moves LED probe and move so that two electrodes of described second LED core particle divide
First Dui Zhun not move LED probe and second and move LED probe, then control described work platforms and rise along Z-direction, make first
Two electrodes of LED core particle, two electrodes of the second LED core particle contact with corresponding LED probe respectively.
6. LED test acupuncture treatment position correction apparatus as claimed in claim 5, is characterized in that,
Described control unit is additionally operable to, two electrodes of the first LED core particle, the second LED core particle two electrodes respectively with right
After the LED probe contact answered,
Control first is moved LED probe and is returned to the first initial point, and control second is moved LED probe and returned to the second initial point.
7. LED test acupuncture treatment position correction apparatus as claimed in claim 5, is characterized in that,
Also including that first moves LED prober, described first moves LED prober includes that the first Y-direction is driven
Galvanic electricity machine, the first X-direction drive motor, Y-direction Mobile base, X-direction Mobile base, described first Y-direction to drive the output of motor
Axle fixes described Y-direction Mobile base, and described Y-direction Mobile base is provided with X-direction chute, and described first X-direction drives motor
Output shaft fixes described X-direction Mobile base, and described X-direction Mobile base can move along described X-direction chute, and described first moves
LED probe is fixed on described X-direction Mobile base.
8. LED test acupuncture treatment position correction apparatus as claimed in claim 7, is characterized in that,
Also include moving the X-direction displacement detector of LED probe X-direction displacement and for detection for detection first
The one Y-direction displacement detector moving LED probe Y-direction displacement.
9. LED test acupuncture treatment position correction apparatus as claimed in claim 5, is characterized in that,
Also including that second moves LED prober, described second moves LED prober includes that the second Y-direction is driven
Galvanic electricity machine, the second X-direction drive motor, Y-direction Mobile base, X-direction Mobile base, described second Y-direction to drive the output of motor
Axle fixes described Y-direction Mobile base, and described Y-direction Mobile base is provided with X-direction chute, and described second X-direction drives motor
Output shaft fixes described X-direction Mobile base, and described X-direction Mobile base can move along described X-direction chute, and described second moves
LED probe is fixed on described X-direction Mobile base.
10. LED test acupuncture treatment position correction apparatus as claimed in claim 9, is characterized in that,
Also include moving the X-direction displacement detector of LED probe X-direction displacement and for detection for detection second
The two Y-direction displacement detectors moving LED probe Y-direction displacement.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201610394527.6A CN106093742B (en) | 2016-06-06 | 2016-06-06 | A kind of LED test acupuncture treatment method for correcting position and device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201610394527.6A CN106093742B (en) | 2016-06-06 | 2016-06-06 | A kind of LED test acupuncture treatment method for correcting position and device |
Publications (2)
Publication Number | Publication Date |
---|---|
CN106093742A true CN106093742A (en) | 2016-11-09 |
CN106093742B CN106093742B (en) | 2019-04-26 |
Family
ID=57447800
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201610394527.6A Active CN106093742B (en) | 2016-06-06 | 2016-06-06 | A kind of LED test acupuncture treatment method for correcting position and device |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN106093742B (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109782103A (en) * | 2019-03-11 | 2019-05-21 | 潘元志 | The alignment methods and system of probe and pin of electronic device |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW429500B (en) * | 1998-12-01 | 2001-04-11 | Fujitsu Ltd | Method and apparatus for testing semiconductor devices |
CN103137531A (en) * | 2011-12-02 | 2013-06-05 | 无锡华润上华科技有限公司 | Wafer counterpoint method |
CN103185725A (en) * | 2012-12-12 | 2013-07-03 | 捷创科技股份有限公司 | LED wafer multi-chip detection method and device |
CN104267299A (en) * | 2014-10-23 | 2015-01-07 | 昆山国显光电有限公司 | Array test device and method |
-
2016
- 2016-06-06 CN CN201610394527.6A patent/CN106093742B/en active Active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW429500B (en) * | 1998-12-01 | 2001-04-11 | Fujitsu Ltd | Method and apparatus for testing semiconductor devices |
US20010043076A1 (en) * | 1998-12-01 | 2001-11-22 | Kenji Itasaka | Method and apparatus for testing semiconductor devices |
CN103137531A (en) * | 2011-12-02 | 2013-06-05 | 无锡华润上华科技有限公司 | Wafer counterpoint method |
CN103185725A (en) * | 2012-12-12 | 2013-07-03 | 捷创科技股份有限公司 | LED wafer multi-chip detection method and device |
CN104267299A (en) * | 2014-10-23 | 2015-01-07 | 昆山国显光电有限公司 | Array test device and method |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109782103A (en) * | 2019-03-11 | 2019-05-21 | 潘元志 | The alignment methods and system of probe and pin of electronic device |
CN109782103B (en) * | 2019-03-11 | 2021-07-30 | 镇江宏祥自动化科技有限公司 | Alignment method and system for probe and electronic device pin |
Also Published As
Publication number | Publication date |
---|---|
CN106093742B (en) | 2019-04-26 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US8847586B2 (en) | Inspection apparatus and inspection method of magnetic sensor | |
US7719297B2 (en) | Probe apparatus and method for measuring electrical characteristics of chips and storage medium therefor | |
JP2013137224A (en) | Multichip prober, method for correcting contact position thereof, control program, and readable recording medium | |
CN104677912B (en) | Product appearance detecting system and detection method | |
CN110328149A (en) | A kind of mobile-phone lens open defect automatic checkout equipment | |
CN103219269A (en) | Wafer pre-locating device based on machine vision and method thereof | |
KR101919808B1 (en) | Multi testing apparatus for flatpanel display having themovision unit | |
TW200811980A (en) | Repair apparatus for substrate circuit of flat display panel | |
CN104535577A (en) | Workpiece quality loss detection equipment and workpiece quality loss detection method | |
CN105609458A (en) | Wafer alignment detection method and system | |
CN106093742A (en) | A kind of LED test acupuncture treatment method for correcting position and device | |
CN103744049A (en) | Electric energy meter seal performance testing device | |
CN205607790U (en) | 3 out -phase loading test device on decking full size model | |
JP2014238371A (en) | Prober system | |
TWI605258B (en) | Array probe auto guiding teaching system and method using the same | |
CN207742120U (en) | Product appearance inspection device | |
KR101977305B1 (en) | Themal testing apparatus for flatpanel display | |
CN204013397U (en) | A kind of I-V inhomogeneities test fixture | |
CN103033719A (en) | Non-contact type probe | |
CN106940425A (en) | Mainboard detection means and detection method | |
CN108827185A (en) | A kind of three-dimensional reconstruction apparatus and three-dimensional rebuilding method of rail vehicle vehicle body | |
TW200937552A (en) | Carrier wafer position device and examination method thereof | |
CN103901235B (en) | Positioner and localization method | |
CN104392833B (en) | A kind of voltage transformer automatic detection device | |
CN203534801U (en) | Dust collector walking life detection device |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant | ||
CP01 | Change in the name or title of a patent holder | ||
CP01 | Change in the name or title of a patent holder |
Address after: Longgang District of Shenzhen City, Guangdong province 518000 city street in the center city City Industrial Park Road No. 3 building E Tefalongfei business building two floor Patentee after: Silicon electric semiconductor equipment (Shenzhen) Co., Ltd Address before: Longgang District of Shenzhen City, Guangdong province 518000 city street in the center city City Industrial Park Road No. 3 building E Tefalongfei business building two floor Patentee before: SHENZHEN SIDEA SEMICONDUCTOR EQUIPMENT Co.,Ltd. |