CN103033719A - Non-contact type probe - Google Patents
Non-contact type probe Download PDFInfo
- Publication number
- CN103033719A CN103033719A CN2012103776710A CN201210377671A CN103033719A CN 103033719 A CN103033719 A CN 103033719A CN 2012103776710 A CN2012103776710 A CN 2012103776710A CN 201210377671 A CN201210377671 A CN 201210377671A CN 103033719 A CN103033719 A CN 103033719A
- Authority
- CN
- China
- Prior art keywords
- electrode
- contact type
- sensor electrode
- circuit
- pixel portion
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/07—Non contact-making probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
- G01R19/1659—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 to indicate that the value is within or outside a predetermined range of values (window)
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/303—Contactless testing of integrated circuits
Abstract
The invention discloses a non-contact type probe which is provided with a single power supply electrode and a plurality of sensor electrodes, wherein the plurality of sensor electrodes are placed respectively on a pixel portion, a circuit portion and a cable portion to inspect turnoff or short circuit portions of an image electrode on a display panel, so as to prevent occurrence of dead area, and improve the sensing accuracy and turnoff inspection performance. Defect area and other area can be separated, thereby improving the repairing performance.
Description
Technical field
The disclosure relates to a kind of non-contact type detector, relate in particular to a kind of pattern electrode in can inspection panel open circuit and short circuit and can not producing can't check out and opens circuit and the non-contact type detector in the dead band of short circuit.
Background technology
Be accompanied by the trend that the resolution of recent display panel increases day by day, the gap between the pattern electrode is more and more less, and active matrix type display panel has the longitudinally data pattern electrode that is arranged on the single substrate and vertical gate pattern electrode.
In order to check the defective of the pattern electrode in the display panel, such as open circuit, short circuit, intersection short (cross short) etc., signal is applied to an end of pattern electrode and detects this signal at other end place.If the signal magnitude that detects at other end place is unusual, then determine to have defective in the described pattern electrode.
Include the transmitting electrode that is integrated in the individual module and the non-contact type detector of sensor electrode and can be used to the check pattern electrode.In this case, can be by the single sweep operation of detector, can or not oppress contact and cause in the situation of electrode damage owing to contact deficiency, variation based on the voltage of sensing at an end place of described pattern electrode to pattern electrode supply voltage the time opening circuit and short circuit of check pattern electrode.
Background technology of the present disclosure is also at Korean patent No. 799161 (date of declaration: disclose on January 29th, 2008).
When powering and respond to so that when checking defective in the display panel in the pixel portion of display panel with the non-contact type detector, opening circuit of the section corresponding with the sensor electrode of detector can't be examined out by the scanning of non-contact type detector, thereby generation dead band, the defective that the non-contact type detector can't the check pattern electrode in this dead band, such as open circuit, short circuit etc.
Summary of the invention
The disclosure is intended to solve these problems in the correlation technique, and one side of the present disclosure is to provide a kind of non-contact type detector, and this non-contact type detector comprises that single transmitting electrode and a plurality of sensor electrode are with in order to check opening circuit and short circuit and do not produce the dead band of pattern electrode in the display panel.
According to an aspect of the present disclosure, a kind of non-contact type detector comprises: noncontact detector electrodes unit is used for sentencing cordless supply and induction power supply at an end of the target pattern electrode of display panel; Power supply unit is used for to described noncontact detector electrodes unit supply AC power supplies; And detecting unit, changing for detection of the electricity in the described noncontact detector electrodes unit, wherein said noncontact detector electrodes unit comprises: transmitting electrode is used for the pixel portion supply AC power supplies to described display panel; The pixel portion sensor electrode changes for detection of the electricity in the pixel portion of described display panel; The circuit part sensor electrode changes for detection of the electricity in the circuit part, is equipped with on the described circuit part for the circuit that drives the target pattern electrode; And the conductor part sensor electrode, be connected to described circuit part to detect the electricity variation that is used for carrying out with the external world mutual conductor part.
Described conductor part sensor electrode can be arranged with described conductor part is parallel.
Each can comprise a pair of electrode that receives described electricity variation with differential mode described pixel portion sensor electrode, described circuit part sensor electrode and described conductor part sensor electrode.
Described AC power supplies can be AC voltage.
Described electricity variation can be change in voltage.
Description of drawings
By the explanation to exemplary embodiment that provides below in conjunction with accompanying drawing, will understand above aspect of the present disclosure and other side, Characteristics and advantages, wherein:
Fig. 1 is the diagram according to the non-contact type detector of an exemplary embodiment of the present disclosure;
Fig. 2 is the diagram of displaying according to the operation of the non-contact type detector of exemplary embodiment of the present disclosure; And
Fig. 3 is for showing the diagram according to the use non-contact type detector testing circuit part of exemplary embodiment of the present disclosure.
Embodiment
Describe exemplary embodiment of the present disclosure in detail with reference to accompanying drawing.It should be noted that accompanying drawing is not according to accurate scale, and for the convenience described and clear for the purpose of exaggerative to some extent to the size of the thickness of lines or ingredient.In addition, term used herein defines by considering function of the present disclosure, and can change according to user or operator's custom or intention.Therefore, should openly come term is defined according to the integral body of stating herein.
Fig. 1 is the diagram according to the non-contact type detector of an exemplary embodiment of the present disclosure; Fig. 2 is the diagram of displaying according to the operation of the non-contact type detector of exemplary embodiment of the present disclosure; And Fig. 3 is for showing the diagram of using according to the non-contact type detector testing circuit part of exemplary embodiment of the present disclosure.
As depicted in figs. 1 and 2, the non-contact type detector according to an exemplary embodiment comprises non-contact type detector electrodes unit 10, power supply unit 20 and detecting unit 30.
Non-contact type detector electrodes unit 10 is placed corresponding to pixel portion 42, circuit part 44 and the conductor part 46 of display panel 40, to change at an end place of the target pattern electrode 50 that will check supply power supply and induced electricity.
As shown in Figure 2, display panel 40 comprises pixel portion 42, circuit part 44 and conductor part 46; The pattern electrode 50 of grid line 52 and the pattern electrode 50 of data line 51 are arranged on the pixel portion 42 to consist of pixel, the circuit (not shown) that is used for the pattern electrode 50 of driven grid line 52 is installed in circuit part 44, and conductor part 46 is connected with circuit part 44 and in order to carry out alternately with the external world.
Particularly, display panel 40 is active array type flat-panel monitor (FPD), and this FPD has the drive circuit that is contained in wherein, so circuit part 44 provides this drive circuit.
Non-contact type detector electrodes unit 10 comprises transmitting electrode 12, pixel portion sensor electrode 14, circuit part sensor electrode 16 and conductor part sensor electrode 18.
Transmitting electrode 12 is supplied the AC voltages to the target pattern electrode 50 in the pixel portion 42 of display panel 40.
Pixel portion sensor electrode 14 is made of pair of electrodes, and by this to electrode with the change in voltage in the pixel portion 42 of differential mode (ina differential manner) sensitive display panel 40.
Circuit part sensor electrode 16 is made of pair of electrodes, and by this to the change in voltage of electrode with differential mode sensor circuit part 44 (being equipped with on this circuit part 44 for the circuit that drives target pattern electrode 50).
Conductor part sensor electrode 18 is made of pair of electrodes, and is connected to circuit part 44 in the mode parallel with conductor part 46.Conductor part sensor electrode 18 by this to electrode with the change in voltage in the differential mode sensor wire part 46 (this conductor part 46 is carried out with the external world alternately).
Power supply unit 20 is 10 supply AC voltages to non-contact type detector electrodes unit.Detecting unit 30 is measured the change in voltage by pixel portion sensor electrode 14, circuit part sensor electrode 16 and 18 inductions of conductor part sensor electrode.
Correspondingly, when power supply unit 20 is supplied AC voltage to the non-contact type detector, this non-contact type detector is to transmitting electrode 12 supply AC voltages, and be output by the change in voltage that pixel portion sensor electrode 14, circuit part sensor electrode 16 and the conductor part sensor electrode 18 of non-contact type detector electrodes unit 10 detects, this detector can not only check opening circuit of target pattern electrode 50 and short circuit thus, can also check circuit part 44 and pixel portion 42 in short circuit.
Fig. 3 is for showing the diagram of using according to the non-contact type detector testing circuit part of exemplary embodiment of the present disclosure.
As shown in Figure 3, when having short circuit in the circuit part 44 of display panel 40, when applying AC voltage by transmitting electrode 12 to grid line 52, AC voltage only can be applied in the conductor part sensor electrode 18 one, the signal that is input to thus in the electrode has different sizes, causes the waveform of conductor part sensor electrode 18 to increase.
Yet, when the pattern of receiver voltage increases in the zone because of short circuit, the voltage that forces down than normal electrical is applied on the pattern of circuit part 44, in circuit part sensor electrode 16, reduce thus the difference of the size between the signal on signal and the electrode that is applied to above the pattern that is placed on receiver voltage not on the electrode be applied to above the pattern that is placed on receiver voltage, thereby permission is reduced to the waveform of circuit part sensor electrode 16 below the normal condition.
Like this, when having short circuit in the circuit part 44, the waveform of conductor part sensor electrode 18 increases, and the waveform of circuit part sensor electrode 16 reduces, thereby allows the defective in the check circuit part 44.
Employing is according to the non-contact type detector of present embodiment, can be detected by the opening circuit of the pattern electrode 50 in the zone of pixel portion sensor electrode 14 scannings by circuit part sensor electrode 16, thereby minimize the not measurable dead band of detector.
In addition, the change in voltage in the circuit part sensor electrode 16 testing circuit parts 44, this circuit part 44 has the zone larger than the pattern electrode 50 of pixel portion 42, in order to can improve the detection degree of accuracy, thereby is convenient to the short circuit in the detection display panel 40.
Further, since circuit part 44 only have that is connected and the pattern that disconnect with conductor part 46 of pattern electrode 50 with pixel portion 42 and only that be connected with conductor part 46 and with the pattern of pattern electrode 50 disconnections of pixel portion 42, so can pass through the short circuit in the conductor part sensor electrode 18 testing circuit parts 44, thereby improve the performance aspect the reparation of display panel 40.
In other words, can determine that according to the non-contact type detector of present embodiment short circuit is to occur or occur in circuit part 44 in pixel portion 42, thereby improve degree of accuracy and the processing speed that the defect area in the each several part is checked.
So, according to the disclosure, the non-contact type detector provides single transmitting electrode and with a plurality of sensor electrodes that are placed on respectively on pixel portion, circuit part and the conductor part, with in order to check opening circuit and the short circuit part of pattern electrode in the display panel, prevent thus the dead band, improving the degree of accuracy that checks provides the performance of improvement aspect opening circuit in inspection, and defect area and other area region can be separated to improve repairing performance.
Although provide some to show embodiment of the present disclosure, be to be understood that these embodiment only are used for showing, and in the situation of spirit and scope of the present disclosure, can carrying out various modifications, change and change.The scope of the present disclosure is only defined by appending claims and equivalent thereof.
Claims (5)
1. non-contact type detector comprises:
Noncontact detector electrodes unit is used for sentencing cordless supply and induction power supply at an end of the target pattern electrode of display panel; Power supply unit is used for to described noncontact detector electrodes unit supply AC power supplies; And detecting unit, change for detection of the electricity in the described noncontact detector electrodes unit,
Wherein said noncontact detector electrodes unit comprises:
Transmitting electrode is used for supplying described AC power supplies to the pixel portion of described display panel;
The pixel portion sensor electrode changes for detection of the electricity in the pixel portion of described display panel;
The circuit part sensor electrode changes for detection of the electricity in the circuit part, is equipped with on the described circuit part for the circuit that drives the target pattern electrode; And
The conductor part sensor electrode is connected to described circuit part to detect the electricity variation that is used for carrying out with the external world mutual conductor part.
2. non-contact type detector according to claim 1, wherein, described conductor part sensor electrode and described conductor part are arranged in parallel.
3. non-contact type detector according to claim 1, wherein, described pixel portion sensor electrode, described circuit part sensor electrode and described conductor part sensor electrode respectively comprise and a pair ofly receive the electrode that described electricity changes with differential mode.
4. non-contact type detector according to claim 1, wherein, described AC power supplies is AC voltage.
5. non-contact type detector according to claim 1, wherein, described electricity is changed to change in voltage.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR10-2011-0099540 | 2011-09-30 | ||
| KR1020110099540A KR101233070B1 (en) | 2011-09-30 | 2011-09-30 | Non-contact type probe |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN103033719A true CN103033719A (en) | 2013-04-10 |
Family
ID=47899510
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2012103776710A Pending CN103033719A (en) | 2011-09-30 | 2012-10-08 | Non-contact type probe |
Country Status (2)
| Country | Link |
|---|---|
| KR (1) | KR101233070B1 (en) |
| CN (1) | CN103033719A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109490933A (en) * | 2018-10-22 | 2019-03-19 | 京东方科技集团股份有限公司 | Flat panel detector, its detection method and X-ray detection device |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101537563B1 (en) * | 2013-11-06 | 2015-07-20 | 마이크로 인스펙션 주식회사 | Method for detecting defect location of pattern electrode used non contact type probe |
| KR101519556B1 (en) * | 2013-11-12 | 2015-05-14 | 마이크로 인스펙션 주식회사 | Apparatus for inspecting fan-out of panel |
| KR102120322B1 (en) | 2019-05-27 | 2020-06-16 | 김진영 | Contact probe structure for tilting driven length measurement |
Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1312911A (en) * | 1998-06-16 | 2001-09-12 | 奥伯技术有限公司 | Non-contact test method and apparatus |
| JP2003337315A (en) * | 2002-05-21 | 2003-11-28 | Rohm Co Ltd | Probe card for inspecting short circuit between surfaces of liquid crystal panel and method for roughly screening liquid crystal panel by inter-surface short circuit inspection |
| JP2007286004A (en) * | 2006-04-20 | 2007-11-01 | Nidec-Read Corp | Substrate inspection apparatus and substrate inspection method |
| CN101109782A (en) * | 2006-07-20 | 2008-01-23 | 微探测株式会社 | Noncontact type single side probe device and apparatus and method for testing open or short circuits of pattern electrodes using the same |
| CN101118271A (en) * | 2006-08-03 | 2008-02-06 | 微探测株式会社 | Contact type probe used a ball |
| CN101246267A (en) * | 2006-10-19 | 2008-08-20 | 株式会社东京阴极研究所 | Inspection apparatus for pattern |
| KR20080098088A (en) * | 2007-05-04 | 2008-11-07 | 마이크로 인스펙션 주식회사 | Non-contact type single side probe and inspection apparatus and method for open/short test of pattern electrodes used thereof |
| KR20100005638A (en) * | 2008-07-07 | 2010-01-15 | 마이크로 인스펙션 주식회사 | Non-contact type single side probe |
| KR20100095189A (en) * | 2009-02-20 | 2010-08-30 | 마이크로 인스펙션 주식회사 | Inspection apparatus of touch panel |
| CN101887098A (en) * | 2009-05-14 | 2010-11-17 | 日本电产理德株式会社 | Touch panel inspection apparatus |
| CN102129003A (en) * | 2009-12-11 | 2011-07-20 | 微探测株式会社 | Inspection apparatus of circuit substrate |
-
2011
- 2011-09-30 KR KR1020110099540A patent/KR101233070B1/en active IP Right Grant
-
2012
- 2012-10-08 CN CN2012103776710A patent/CN103033719A/en active Pending
Patent Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1312911A (en) * | 1998-06-16 | 2001-09-12 | 奥伯技术有限公司 | Non-contact test method and apparatus |
| JP2003337315A (en) * | 2002-05-21 | 2003-11-28 | Rohm Co Ltd | Probe card for inspecting short circuit between surfaces of liquid crystal panel and method for roughly screening liquid crystal panel by inter-surface short circuit inspection |
| JP2007286004A (en) * | 2006-04-20 | 2007-11-01 | Nidec-Read Corp | Substrate inspection apparatus and substrate inspection method |
| CN101109782A (en) * | 2006-07-20 | 2008-01-23 | 微探测株式会社 | Noncontact type single side probe device and apparatus and method for testing open or short circuits of pattern electrodes using the same |
| CN101118271A (en) * | 2006-08-03 | 2008-02-06 | 微探测株式会社 | Contact type probe used a ball |
| CN101246267A (en) * | 2006-10-19 | 2008-08-20 | 株式会社东京阴极研究所 | Inspection apparatus for pattern |
| KR20080098088A (en) * | 2007-05-04 | 2008-11-07 | 마이크로 인스펙션 주식회사 | Non-contact type single side probe and inspection apparatus and method for open/short test of pattern electrodes used thereof |
| KR20100005638A (en) * | 2008-07-07 | 2010-01-15 | 마이크로 인스펙션 주식회사 | Non-contact type single side probe |
| KR20100095189A (en) * | 2009-02-20 | 2010-08-30 | 마이크로 인스펙션 주식회사 | Inspection apparatus of touch panel |
| CN101887098A (en) * | 2009-05-14 | 2010-11-17 | 日本电产理德株式会社 | Touch panel inspection apparatus |
| CN102129003A (en) * | 2009-12-11 | 2011-07-20 | 微探测株式会社 | Inspection apparatus of circuit substrate |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109490933A (en) * | 2018-10-22 | 2019-03-19 | 京东方科技集团股份有限公司 | Flat panel detector, its detection method and X-ray detection device |
Also Published As
| Publication number | Publication date |
|---|---|
| KR101233070B1 (en) | 2013-02-25 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR100799161B1 (en) | Non-contact type single side probe and inspection apparatus and method for open/short test of pattern electrodes used thereof | |
| CN104714054B (en) | Probe point measurement system | |
| KR102573208B1 (en) | Display panel | |
| CN101887098B (en) | Touch panel inspection apparatus | |
| KR101091694B1 (en) | Inspection apparatus of touch panel | |
| CN104777637A (en) | Array substrate and touch-control display device and testing method thereof | |
| US9846512B2 (en) | Method for inspecting touch-panel electrode substrate | |
| CN103033719A (en) | Non-contact type probe | |
| CN104516144B (en) | The capacitance detecting device and its detection method of a kind of touch sensing | |
| US20130314373A1 (en) | Touch detecting device using sensor pad scramble | |
| TWI474012B (en) | Detecting device of conductive pattern and detecting method | |
| JP4394980B2 (en) | Substrate inspection apparatus and substrate inspection method | |
| JP2011060021A (en) | Inspection device, inspection method and inspection sheet for capacitance type touch panel | |
| CN108535617A (en) | A kind of partial discharge positioning method and positioning system of switchgear | |
| KR20080098088A (en) | Non-contact type single side probe and inspection apparatus and method for open/short test of pattern electrodes used thereof | |
| KR101933547B1 (en) | Non contact resistance inspecting apparatus | |
| CN103913667B (en) | Circuit layout checks device | |
| KR20040024250A (en) | Electric field testing device for flat panel display and method for the same | |
| US9696364B2 (en) | Apparatus and method for detecting fault in digitizer | |
| KR100948062B1 (en) | Non-contact type single side probe | |
| KR101519556B1 (en) | Apparatus for inspecting fan-out of panel | |
| TW201000930A (en) | Device and procedure for contactless forming a contact of conductive structures, in particular of thin film transistor liquid crystal displays | |
| JP5380370B2 (en) | Inspection device | |
| KR100495057B1 (en) | Electric field testing device for flat panel display and testing method for the same | |
| CN102445629A (en) | Capacitance type differential sensor module and inspection apparatus of display panel used thereof |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20130410 |