CN106057112B - Circuit and liquid crystal display substrate are tested at box - Google Patents
Circuit and liquid crystal display substrate are tested at box Download PDFInfo
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- CN106057112B CN106057112B CN201610649163.1A CN201610649163A CN106057112B CN 106057112 B CN106057112 B CN 106057112B CN 201610649163 A CN201610649163 A CN 201610649163A CN 106057112 B CN106057112 B CN 106057112B
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136254—Checking; Testing
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- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Computer Hardware Design (AREA)
- Theoretical Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Mathematical Physics (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Optics & Photonics (AREA)
- Liquid Crystal (AREA)
Abstract
Circuit and liquid crystal display substrate are tested at box the invention discloses a kind of, on the basis of the existing test circuit at box, increases the line of odd data testing weld pad and even data testing weld pad and integrated circuit；Circuit working state is being tested at box, enable signal testing weld pad exports constant pressure high level signal by testing enable signal line at box, and odd number, even data testing weld pad pass through odd number, even data test signal wire outputting data signals respectively；In Integrated Circuit Working State, enable signal testing weld pad receives the constant pressure low level signal that flexible print circuit provides, and odd number, even data testing weld pad receive the test signal of integrated circuit offer respectively.It is to test circuit test transistor drain current at box caused by floating state present invention reduces odd number, even data test signal wire, crosstalk and flicker problem caused by improving the display unevenness of panel and leaking electricity because of test transistor, and the display effect that can improve panel improves the competitiveness of product.
Description
Technical field
The present invention relates to technical field of liquid crystal display, improve more particularly, to a kind of because testing panel caused by circuit at box
Show unevenness, crosstalk and flicker problem tests circuit and liquid crystal display substrate at box.
Background technique
Liquid crystal display panel develop to directions such as lightening and low-power consumption be display device in existing market development trend, with
The demand of high PPI (Pixels Per Inch, pixel density) and low-power consumption etc., corresponding product yield can have an impact.
To be promoted into box (Cell) yield afterwards, it can generally be designed to that box tests (Cell Test) circuit on panel.
With reference to Fig. 1, liquid crystal display panel composition schematic diagram.The composition of liquid crystal display panel includes: array test (Array
Test) area 11, pixel display area 12, GOA (Gate On Array, the row scanning being integrated in array substrate), are fanned out to area 13
(Fanout) area 14, at box test area 15 (Cell Test), the area 16, IC WOA (Wire On Array, array outside be routed)
(Integrated Circuit, integrated circuit) area 17 and FPC (Flexible Printed Circuit, flexible printing electricity
Road) area 18.Wherein, array test area 11 is used for after the completion of array (Array) substrate, is surveyed to the electrical property of array substrate
Examination；Pixel display area 12 is used for the display of pixel；The area GOA 13 is used to generate the gate driving letter of thin film transistor (TFT) in face (TFT)
Number；Fanout area 14 is connect for the area IC 17 with the cabling of 12 data line of pixel display area (Dataline)；It is used at box test section 15
In panel at testing after box panel display effect, process management is before IC binds (Bonding)；The area WOA 16
Connection for cabling around panel；The area IC 17 is used for the binding of IC, passes through circuit and TFT in IC drive surface；The area FPC 18 is used for
The binding of FPC passes through FPC connection electronic equipment mainboard.
With reference to Fig. 2, existing small size panel tests circuit connection diagram at box.At box test circuit work shape
State, IC no signal, at this time at filling constant pressure high level signal VGH, odd number outside the enable signal testing weld pad CT1 in box test section 15
Data-signal DATA is filled outside data test pad CT2 and even data testing weld pad CT3, at the test transistor of box test circuit
TFT is in opening working condition；After at box test circuit work, odd data tests signal wire (CTDO) and even data
Testing signal wire (CTDE) is floating (Floating) state.In IC working condition, enable signal testing weld pad CT1 connection FPC
Constant pressure low level signal VGL is received, test transistor (TFT) is in off state, and odd-numbered line and idol in pixel display area 12
Several rows of data lines are linked together by test transistor respectively；Since the electric leakage of test transistor can not be entirely 0, odd number
(even number) row data-signal can by test transistor couple, test transistor electric leakage it is bigger when or test transistor
Grid voltage when having floating, will lead to Display panel exception, crosstalk (H-Crosstalk) and flashing dramatically increase.
Therefore, it is necessary to improve to existing at box test circuit, to solve the existing test at box test circuit
There are leakage currents to lead to the problem of Display panel is abnormal, and crosstalk and flashing dramatically increase under closing for transistor.
Summary of the invention
Test circuit and liquid crystal display substrate at box the object of the present invention is to provide a kind of, with to existing at box
Test circuit is improved, and solving the existing test transistor at box test circuit, there are leakage currents to lead to panel under closing
The problem of display is abnormal, and crosstalk and flashing dramatically increase.
To achieve the above object, circuit is tested at box the present invention provides a kind of, is tested for liquid crystal display panel, it is described
Liquid crystal display panel includes integrated circuit, flexible print circuit and a plurality of extension and spaced odd number number in column direction
According to line and even data line, it is described at box test circuit include: an enable signal testing weld pad, the enable signal testing weld pad
Box test enable signal line and the flexible print circuit is electrically connected into；One odd data testing weld pad, the surprise
Odd data test signal wire and the integrated circuit is electrically connected in number data test pad；The test weldering of one even data
Even data test signal wire and the integrated circuit is electrically connected in disk, the even data testing weld pad；At least one
Odd data test transistor, the first port of the odd data test transistor are electrically connected described test at box and enable letter
Number line, second port are electrically connected the odd data and test signal wire, and third port is electrically connected the odd data line；With
And an at least even data test transistor, the first port electric connection of the even data test transistor is described to survey at box
Enable signal line is tried, second port is electrically connected the even data and tests signal wire, and third port is electrically connected the even number
Data line.
To achieve the above object, the present invention also provides a kind of liquid crystal display substrates, including at least one LCD display
Plate, the liquid crystal display panel are equipped with of the present invention at box test circuit.
It is an advantage of the current invention that the present invention, which is provided, tests circuit at box, on the basis of the existing test circuit at box, increase
Add the line of odd data testing weld pad and even data testing weld pad and integrated circuit.In integrated circuit operation, pass through collection
Signal wire is tested to odd data at circuit and even data test signal wire provides signal, is reduced odd data and is tested signal wire
It is to test circuit test transistor drain current at box caused by floating state with even data test signal wire, improves panel
Crosstalk and flicker problem caused by showing unevenness and leaking electricity because of test transistor, and the display effect of panel can be improved, it improves
The competitiveness of product.
Detailed description of the invention
Fig. 1, liquid crystal display panel composition schematic diagram；
Fig. 2, existing small size panel test circuit connection diagram at box；
Fig. 3, it is of the present invention at circuit connection diagram shown in box test circuit first embodiment；
Fig. 4 is the operation schematic diagram of circuit shown in Fig. 3；
Fig. 5, the operation principle schematic diagram of the present invention at the test transistor in box test circuit；
Fig. 6, it is of the present invention at circuit connection diagram shown in box test circuit second embodiment；
Fig. 7 is the operation schematic diagram of circuit shown in Fig. 6.
Specific embodiment
It elaborates with reference to the accompanying drawing to provided by the invention at box test circuit and liquid crystal display substrate.
It is of the present invention at circuit connection diagram shown in box test circuit first embodiment with reference to Fig. 3.The present invention
Described tests circuit for liquid crystal display panel test at box, and the liquid crystal display panel includes Integrated circuit IC, flexibility
Printed circuit FPC and a plurality of extension in column direction and spaced odd data line ODL and even data line EDL.Its
In, at box test circuit be arranged in liquid crystal display panel at box test section 35, Integrated circuit IC is arranged in liquid crystal display panel
Integrated circuit area 37, the flexible print circuit area 38 of liquid crystal display panel, a plurality of odd number number is arranged in flexible print circuit FPC
Extend in column direction according to line ODL and a plurality of even data line EDL and is arranged at intervals on the pixel display area 32 of liquid crystal display panel.
Wherein, at there are two box test sections 35, two are symmetricly set on integrated circuit area 37 on liquid crystal display panel at box test section 35
Two sides, it is each at box test section 35 be provided with one it is of the present invention at box test circuit.
It is described at box test circuit include: an enable signal testing weld pad CT1, it is an odd data testing weld pad CT2, one even
An a number data test pad CT3, at least odd data test transistor ODT and at least even data test transistor EDT.
Box test enable signal line CTEN and flexible print circuit FPC is electrically connected into enable signal testing weld pad CT1.It is described
Odd data test signal wire CTDO and Integrated circuit IC is electrically connected in odd data testing weld pad CT2；Even data
Even data test signal wire CTDE and Integrated circuit IC is electrically connected in testing weld pad CT3；Odd data tests crystal
The first port of pipe ODT, which is electrically connected, tests enable signal line CTEN at box, and second port is electrically connected odd data test letter
Number line CTDO, third port are electrically connected odd data line ODL；The first port of even data test transistor EDT electrically connects
It is connected into box test enable signal line CTEN, second port is electrically connected even data and tests signal wire CTDE, and third port is electrical
Connect even data line EDL.
Circuit working state is being tested at box, enable signal testing weld pad CT1 is by testing enable signal line CTEN at box
Output constant pressure high level signal VGH, odd data testing weld pad CT2 and even data testing weld pad CT3 pass through odd number number respectively
Signal wire CTDE outputting data signals are tested according to test signal wire CTDO and even data.In Integrated Circuit Working State, enable
Signal testing pad CT1 receives the constant pressure low level signal VGL, odd data testing weld pad CT2 that flexible print circuit FPC is provided
The test signal of Integrated circuit IC offer is provided respectively with even data testing weld pad CT3.That is, the present invention is surveyed existing at box
On the basis of trying circuit, increase the company of odd data testing weld pad CT2 and even data testing weld pad CT3 and Integrated circuit IC
Line, by Integrated circuit IC to signal is filled outside CT2, CT3, to reduce after at box test circuit work, odd data is surveyed
Trial signal line CTDO and even data test signal wire CTDE is test transistor caused by floating (Floating) state
Display panel caused by (ODT, EDT) leaks electricity is abnormal.
Particularly, divide in Integrated Circuit Working State, odd data testing weld pad and even data testing weld pad CT2, CT3
Not Jie Shou Integrated circuit IC provide opposed polarity test signal.Specifically, when integrated circuit operation, enable signal
Testing weld pad CT1 receives constant pressure the low level signal VGL, odd data testing weld pad CT2 and idol that flexible print circuit FPC is provided
Number data test pad CT3 provide the test signal of opposed polarity by Integrated circuit IC respectively；The signal that CT2, CT3 are received
Polarity changes according to the reversing of data line, so that test transistor (ODT, EDT) second port and third port signal
Polarity is identical.
It is the operation schematic diagram of circuit shown in Fig. 3 with reference to Fig. 4.In Integrated Circuit Working State, odd data test weldering
The polarity of received test signal (CT_ICDO) of disk CT2 changes with the reversing of odd data line ODL, makes odd number number
It is identical as third port signal polarity according to the second port of test transistor ODT；That is DATA signal on odd data line ODL with
CT_ICDO signal polarity is identical on odd data test signal wire CTDO, and two signal polarities are positive (+) in the present embodiment.
Even data testing weld pad CT3 it is received test signal (CT_ICDE) polarity with the reversing of even data line EDL and
Change, keeps the second port of even data test transistor EDT identical as third port signal polarity；That is even data line EDL
On DATA signal and even data test signal wire CTDE on CT_ICDE signal polarity it is identical, two signal in the present embodiment
Polarity is negative (-).
Fig. 5, the operation principle schematic diagram of the present invention at the test transistor in box test circuit.Test transistor
The first port of (ODT, EDT) inputs enable signal CTEN, second port input test signal CT_IC (CT_ICDO or CT_
ICDE), third port input data signal DATA, CT_IC is identical as DATA signal polarity.Specifically: when DATA polarity is positive
When (+), CT_IC polarity is positive (+)；When DATA polarity bears (-), CT_IC polarity is negative (-).Integrated circuit IC is supplied to letter
Data line DATA signal polarity that the test signal polarity of number line CTDE and CTDO are connected according to test transistor and become.Test is brilliant
The second port and third port (source terminal Source and drain electrode end Drain) of body pipe are all the current potential of same polarity, reduce odd number
Test transistor when data testing signals line CTDO and even data test signal wire CTDE is floating (Floating) state
Source and drain pressure difference Vds value improves the abnormal problem of the display of panel to reduce the electric leakage of test transistor.
Particularly, odd data test transistor ODT and even data test transistor EDT is thin film transistor (TFT), odd
The first port of number data test transistor ODT and even data test transistor EDT is the grid of thin film transistor (TFT).
Particularly, in the present embodiment, lead is drawn from the enable signal bottom testing weld pad CT1 be electrically connected flexible printing
Circuit FPC reduces the region OLB of chip (Chip) to reduce fanout area (Fanout) cabling.OLB(Outer
LeadBonding, outside lead connection) region refers to that liquid crystal display panel is used to bind the region of (Bonding) IC and FPC.
With reference to Fig. 6-7, wherein Fig. 6 is of the present invention into circuit connection shown in box test circuit second embodiment
Schematic diagram；Fig. 7 is the operation schematic diagram of circuit shown in Fig. 6.With first embodiment shown in Fig. 3 the difference is that, in this reality
It applies in example, draws lead from the odd data bottom testing weld pad CT2 and be electrically connected Integrated circuit IC；From even data testing weld pad
Lead electric connection Integrated circuit IC is drawn in the bottom CT3 reduces chip to be further reduced fanout area (Fanout) cabling
The region OLB.
The present invention, which is provided, tests circuit at box, on the basis of the existing test circuit at box, increases odd data test weldering
The line of disk and even data testing weld pad and integrated circuit.In integrated circuit operation, by integrated circuit to odd data
It tests signal wire and even data test signal wire provides signal, reduce odd data test signal wire and even data test is believed
Number line is to test circuit test transistor drain current at box caused by floating state, is leaked electricity caused by reducing because of the switching of positive and negative frame
Not of uniform size, crosstalk and flicker problem caused by improving the display unevenness of panel and leaking electricity because of test transistor are flowed, and can be changed
The display effect of kind panel, improves the competitiveness of product.
The present invention also provides a kind of liquid crystal display substrate, the liquid crystal display substrate includes at least one liquid crystal display
Panel, the liquid crystal display panel are equipped with of the present invention at box test circuit.It is tested using of the present invention at box
The liquid crystal display panel of circuit improves into box test circuit test electric transistor；In integrated circuit operation, by integrated
Circuit tests signal wire to odd data and even data test signal wire provides signal, reduces brilliant at box test circuit test
Under body pipe is closed, it is test transistor caused by floating state that odd data, which tests signal wire and even data test signal wire,
Leakage current, crosstalk and flicker problem caused by improving the display unevenness of panel and leaking electricity because of test transistor, and can change
The display effect of kind panel, improves the competitiveness of product.
The above is only a preferred embodiment of the present invention, it is noted that for the ordinary skill people of the art
Member, various improvements and modifications may be made without departing from the principle of the present invention, these improvements and modifications also should be regarded as
Protection scope of the present invention.
Claims (12)
1. a kind of test circuit at box, tested for liquid crystal display panel, the liquid crystal display panel includes integrated circuit, flexibility
Printed circuit and a plurality of extension in column direction and spaced odd data line and even data line, which is characterized in that institute
Stating into box test circuit includes:
One enable signal testing weld pad, the enable signal testing weld pad be electrically connected into box test enable signal line and
The flexible print circuit；
One odd data testing weld pad, the odd data testing weld pad be electrically connected odd data test signal wire and
The integrated circuit；
One even data testing weld pad, the even data testing weld pad be electrically connected even data test signal wire and
The integrated circuit；
An at least odd data test transistor, the first port of the odd data test transistor are electrically connected described at box
Enable signal line is tested, second port is electrically connected the odd data and tests signal wire, and third port is electrically connected the surprise
Number data line；And
An at least even data test transistor, the first port of the even data test transistor are electrically connected described at box
Enable signal line is tested, second port is electrically connected the even data and tests signal wire, and third port is electrically connected the idol
Number data line；Wherein,
In Integrated Circuit Working State, the enable signal testing weld pad receives the constant pressure low level letter that flexible print circuit provides
Number, the odd data testing weld pad receives the test of the opposed polarity of integrated circuit offer with even data testing weld pad respectively
Signal.
2. testing circuit at box as described in claim 1, which is characterized in that circuit working state is being tested at box, it is described to make
Energy signal testing pad tests enable signal line output constant pressure high level signal, the odd data test weldering at box by described
Disk and even data testing weld pad test signal wire and even data test signal wire output number by the odd data respectively
It is believed that number.
3. testing circuit at box as described in claim 1, which is characterized in that in Integrated Circuit Working State, the odd number number
Polarity according to the received test signal of testing weld pad changes with the reversing of the odd data line, makes the odd number number
It is identical as third port signal polarity according to the second port of test transistor；The received test letter of even data testing weld pad
Number polarity change with the reversing of the even data line, make the second port of the even data test transistor
It is identical as third port signal polarity.
4. testing circuit at box as described in claim 1, which is characterized in that the odd data test transistor and the idol
Number data test transistor is thin film transistor (TFT), the odd data test transistor and the even data test transistor
First port be the thin film transistor (TFT) grid.
5. testing circuit at box as described in claim 1, which is characterized in that
Lead, which is drawn, from enable signal testing weld pad bottom is electrically connected the flexible print circuit.
6. as claimed in claim 1 or 5 test circuit at box, which is characterized in that
Lead, which is drawn, from odd data testing weld pad bottom is electrically connected the integrated circuit；
Lead, which is drawn, from even data testing weld pad bottom is electrically connected the integrated circuit.
7. a kind of liquid crystal display substrate, which is characterized in that including at least one liquid crystal display panel, on the liquid crystal display panel
Equipped with as described in claim 1 at box test circuit.
8. liquid crystal display substrate as claimed in claim 7, which is characterized in that circuit working state is being tested at box, it is described to make
Energy signal testing pad tests enable signal line output constant pressure high level signal, the odd data test weldering at box by described
Disk and even data testing weld pad test signal wire and even data test signal wire output number by the odd data respectively
It is believed that number.
9. liquid crystal display substrate as claimed in claim 7, which is characterized in that in Integrated Circuit Working State, the odd number number
Polarity according to the received test signal of testing weld pad changes with the reversing of the odd data line, makes the odd number number
It is identical as third port signal polarity according to the second port of test transistor；The received test letter of even data testing weld pad
Number polarity change with the reversing of the even data line, make the second port of the even data test transistor
It is identical as third port signal polarity.
10. liquid crystal display substrate as claimed in claim 7, which is characterized in that the odd data test transistor with it is described
Even data test transistor is thin film transistor (TFT), and the odd data test transistor and the even data test crystal
The first port of pipe is the grid of the thin film transistor (TFT).
11. liquid crystal display substrate as claimed in claim 7, which is characterized in that
Lead, which is drawn, from enable signal testing weld pad bottom is electrically connected the flexible print circuit.
12. the liquid crystal display substrate as described in claim 7 or 11, which is characterized in that
Lead, which is drawn, from odd data testing weld pad bottom is electrically connected the integrated circuit；
Lead, which is drawn, from even data testing weld pad bottom is electrically connected the integrated circuit.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610649163.1A CN106057112B (en) | 2016-08-09 | 2016-08-09 | Circuit and liquid crystal display substrate are tested at box |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610649163.1A CN106057112B (en) | 2016-08-09 | 2016-08-09 | Circuit and liquid crystal display substrate are tested at box |
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| CN106057112B true CN106057112B (en) | 2019-04-16 |
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| CN1527104A (en) * | 2003-03-07 | 2004-09-08 | ������������ʽ���� | Image display device equipment with checking terminal |
| JP2004102260A (en) * | 2003-08-07 | 2004-04-02 | Internatl Business Mach Corp <Ibm> | Active matrix display inspection method |
| KR20070079679A (en) * | 2006-02-03 | 2007-08-08 | 삼성전자주식회사 | Method inspecting of display substrate |
| CN103345080A (en) * | 2013-07-10 | 2013-10-09 | 深圳市华星光电技术有限公司 | Rapid test switching device and corresponding TFT-LCD array substrate |
| CN103544912A (en) * | 2013-10-25 | 2014-01-29 | 深圳市华星光电技术有限公司 | Panel detection device and display panel |
| CN104062784A (en) * | 2014-06-25 | 2014-09-24 | 深圳市华星光电技术有限公司 | Panel detection circuit and display panel |
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